Razeghi et al., 1986 - Google Patents

Growth of GaInAs‐InP multiquantum wells on garnet (GGG= Gd3Ga5O12) substrate by metalorganic chemical vapor deposition

Razeghi et al., 1986

Document ID
13588885483757870400
Author
Razeghi M
Meunier P
Maurel P
Publication year
Publication venue
Journal of applied physics

External Links

Snippet

Ga0. 47In0. 53As‐InP multiquantum wells grown by low‐pressure metalorganic chemical vapor deposition on garnet (GGG= Gd3Ga5O12 with a= 12.383 Å) substrates are presented for the first time. The x‐ray diffraction pattern shows that the orientation of the epitaxial layer …
Continue reading at pubs.aip.org (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02538Group 13/15 materials
    • H01L21/02546Arsenides
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02538Group 13/15 materials
    • H01L21/02543Phosphides
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/0237Materials
    • H01L21/02387Group 13/15 materials
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/0262Reduction or decomposition of gaseous compounds, e.g. CVD
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/0237Materials
    • H01L21/02373Group 14 semiconducting materials
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0062Processes for devices with an active region comprising only III-V compounds

Similar Documents

Publication Publication Date Title
Stringfellow Materials issues in high-brightness light-emitting diodes
CA2120610C (en) Nitride based semiconductor device and manufacture thereof
Oshinowo et al. Highly uniform InGaAs/GaAs quantum dots (∼ 15 nm) by metalorganic chemical vapor deposition
Soga et al. Characterization of epitaxially grown GaAs on Si substrates with III‐V compounds intermediate layers by metalorganic chemical vapor deposition
Razeghi et al. Low pressure metalorganic chemical vapor deposition of InP and related compounds
Beneking et al. High quality epitaxial GaAs and InP wafers by isoelectronic doping
Koide et al. Epitaxial Growth and Properties of Al x Ga1− x N by MOVPE
Olsen et al. Crystal growth and properties of binary, ternary and quaternary (In, Ga)(As, P) alloys grown by the hydride vapor phase epitaxy technique
Razeghi et al. Growth of GaInAs‐InP multiquantum wells on garnet (GGG= Gd3Ga5O12) substrate by metalorganic chemical vapor deposition
Paisley et al. Molecular beam epitaxy of nitride thin films
Zembutsu et al. Growth of GaN single crystal films using electron cyclotron resonance plasma excited metalorganic vapor phase epitaxy
Crumbaker et al. Growth of InP on Si substrates by molecular beam epitaxy
Niebuhr et al. Electrical and optical properties of oxygen doped GaN grown by MOCVD using N 2 O
US4948751A (en) Moelcular beam epitaxy for selective epitaxial growth of III - V compound semiconductor
Polyakov et al. Growth of GaBN ternary solutions by organometallic vapor phase epitaxy
Bhat et al. The organometallic heteroepitaxy of CdTe and HgCdTe on GaAs substrates
Ruvimov et al. Microstructure of GaN layers grown on (001) GaAs by plasma assisted molecular-beam epitaxy
Norris et al. Substrate temperature limits for epitaxy of InP by MBE
Rao et al. Effect of substrate temperature on the growth rate and surface morphology of heteroepitaxial indium antimonide layers grown on (100) GaAs by metalorganic magnetron sputtering
Biefeld et al. The growth of InSb using triisopropylantimony or tertiarybutyldimethylantimony and trimethylindium
Tanahashi et al. Electrical properties of undoped and Si‐doped Al0. 48In0. 52As grown by liquid phase epitaxy
Nanishi et al. Plasma-excited MBE—Proposal and achievements through R&D of compound semiconductor materials and devices
Pashley et al. Scanning tunneling microscopy studies of the GaAs (001) surface and the nucleation of ZnSe on GaAs (001)
Ueda et al. Heteroepitaxy of InGaAs on GaAs substrate with InAlAs intermediate layer
US20060255367A1 (en) Compound semiconductor epitaxial substrate