Soga et al., 1985 - Google Patents

Characterization of epitaxially grown GaAs on Si substrates with III‐V compounds intermediate layers by metalorganic chemical vapor deposition

Soga et al., 1985

View PDF
Document ID
12882377198021573911
Author
Soga T
Hattori S
Sakai S
Takeyasu M
Umeno M
Publication year
Publication venue
Journal of applied physics

External Links

Snippet

GaAs grown on Si substrate with AlP, AlGaP, GaP/GaAs0. 5P0. 5 superlattice, and GaAs0. 5P0. 5/GaAs superlattice was investigated by varying the structure of the intermediate layers between GaAs and Si by metalorganic chemical vapor deposition. It was found that (1) the …
Continue reading at nitech.repo.nii.ac.jp (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/0237Materials
    • H01L21/02373Group 14 semiconducting materials
    • H01L21/02381Silicon, silicon germanium, germanium
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02538Group 13/15 materials
    • H01L21/02546Arsenides
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02538Group 13/15 materials
    • H01L21/02543Phosphides
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/0237Materials
    • H01L21/02387Group 13/15 materials
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/0262Reduction or decomposition of gaseous compounds, e.g. CVD
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02436Intermediate layers between substrates and deposited layers
    • H01L21/02439Materials
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL-GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L31/00Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof

Similar Documents

Publication Publication Date Title
Soga et al. Characterization of epitaxially grown GaAs on Si substrates with III‐V compounds intermediate layers by metalorganic chemical vapor deposition
US5759908A (en) Method for forming SiC-SOI structures
Ren et al. Wide energy bandgap electronic devices
CA1317857C (en) Homoepitaxial growth of alpha-sic thin films and semiconductor devices fabricated thereon
KR100626625B1 (en) Method for producing a gallium nitride epitaxial layer
US5728623A (en) Method of bonding a III-V group compound semiconductor layer on a silicon substrate
CA1292550C (en) Epitaxial gallium arsenide semiconductor wafer and method of producing the same
Olsen et al. Crystal growth and properties of binary, ternary and quaternary (In, Ga)(As, P) alloys grown by the hydride vapor phase epitaxy technique
Yang et al. Approach to obtain high quality GaN on Si and SiC‐on‐silicon‐on‐insulator compliant substrate by molecular‐beam epitaxy
Yamaguchi et al. Misfit stress dependence of dislocation density reduction in GaAs films on Si substrates grown by strained‐layer superlattices
US5011550A (en) Laminated structure of compound semiconductors
Bedair et al. Laser selective deposition of GaAs on Si
Takigawa et al. Hetero-Epitaxial Growth of Boron Monophosphide on Silicon Substrate Using B2H6-PH3-H2 System
Huang et al. InAsSbBi alloys grown by organometallic vapor‐phase epitaxy
US4789421A (en) Gallium arsenide superlattice crystal grown on silicon substrate and method of growing such crystal
Kohama et al. Quality improvement of metalorganic chemical vapor deposition grown GaP on Si by AsH3 preflow
US6339014B1 (en) Method for growing nitride compound semiconductor
Razeghi et al. Growth of GaInAs‐InP multiquantum wells on garnet (GGG= Gd3Ga5O12) substrate by metalorganic chemical vapor deposition
Matsumoto et al. Selective MOVPE growth of GaInAs/InP MQW on directly‐bonded InP/Si substrate
Freundlich et al. Evidence by Raman spectroscopy and x‐ray diffraction of a strong influence of H2O traces on the metalorganic vapor phase epitaxy of GaAs on Si
etsuo Soga et al. Characterization of epitaxJaUy grown GaAs on 5i substrates with~ nv compounds intermediate layers by meta. forganic chemical vapor deposition
Suzuki et al. Selective growth of GaAs on GaAs (111) B substrates by migration-enhanced epitaxy
Böttcher Heteroepitaxy of group-III-nitrides for the application in laser diodes
Gong et al. Low temperature growth of AIGaP and GaP on si substrates by atomic layer epitaxy
Ohshita Low Temperature P‐Doped SiC Growth by Chemical Vapor Deposition Using CH 3SiH3/PH 3 Gas