WO2005086538A1 - 有機エレクトロルミネッセンス素子及び有機エレクトロルミネッセンス表示装置 - Google Patents
有機エレクトロルミネッセンス素子及び有機エレクトロルミネッセンス表示装置 Download PDFInfo
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- WO2005086538A1 WO2005086538A1 PCT/JP2005/000862 JP2005000862W WO2005086538A1 WO 2005086538 A1 WO2005086538 A1 WO 2005086538A1 JP 2005000862 W JP2005000862 W JP 2005000862W WO 2005086538 A1 WO2005086538 A1 WO 2005086538A1
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- BITYAPCSNKJESK-UHFFFAOYSA-N potassiosodium Chemical compound [Na].[K] BITYAPCSNKJESK-UHFFFAOYSA-N 0.000 description 1
- JEXVQSWXXUJEMA-UHFFFAOYSA-N pyrazol-3-one Chemical class O=C1C=CN=N1 JEXVQSWXXUJEMA-UHFFFAOYSA-N 0.000 description 1
- 150000003219 pyrazolines Chemical class 0.000 description 1
- 125000005548 pyrenylene group Chemical group 0.000 description 1
- 125000002098 pyridazinyl group Chemical group 0.000 description 1
- 125000000714 pyrimidinyl group Chemical group 0.000 description 1
- 125000000719 pyrrolidinyl group Chemical group 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- PMZDQRJGMBOQBF-UHFFFAOYSA-N quinolin-4-ol Chemical compound C1=CC=C2C(O)=CC=NC2=C1 PMZDQRJGMBOQBF-UHFFFAOYSA-N 0.000 description 1
- 229910001404 rare earth metal oxide Inorganic materials 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 125000004469 siloxy group Chemical group [SiH3]O* 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000010944 silver (metal) Substances 0.000 description 1
- 125000003808 silyl group Chemical group [H][Si]([H])([H])[*] 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 239000011780 sodium chloride Substances 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- PJANXHGTPQOBST-UHFFFAOYSA-N stilbene Chemical class C=1C=CC=CC=1C=CC1=CC=CC=C1 PJANXHGTPQOBST-UHFFFAOYSA-N 0.000 description 1
- 125000000475 sulfinyl group Chemical group [*:2]S([*:1])=O 0.000 description 1
- 125000000542 sulfonic acid group Chemical group 0.000 description 1
- 229940042055 systemic antimycotics triazole derivative Drugs 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- KTQYWNARBMKMCX-UHFFFAOYSA-N tetraphenylene Chemical group C1=CC=C2C3=CC=CC=C3C3=CC=CC=C3C3=CC=CC=C3C2=C1 KTQYWNARBMKMCX-UHFFFAOYSA-N 0.000 description 1
- 125000001113 thiadiazolyl group Chemical group 0.000 description 1
- 125000000335 thiazolyl group Chemical group 0.000 description 1
- 125000001544 thienyl group Chemical group 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 125000003944 tolyl group Chemical group 0.000 description 1
- 125000004306 triazinyl group Chemical group 0.000 description 1
- 125000001425 triazolyl group Chemical group 0.000 description 1
- 125000003866 trichloromethyl group Chemical group ClC(Cl)(Cl)* 0.000 description 1
- 125000005034 trifluormethylthio group Chemical group FC(S*)(F)F 0.000 description 1
- ODHXBMXNKOYIBV-UHFFFAOYSA-N triphenylamine Chemical compound C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 ODHXBMXNKOYIBV-UHFFFAOYSA-N 0.000 description 1
- 125000006617 triphenylamine group Chemical group 0.000 description 1
- 125000005580 triphenylene group Chemical group 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/17—Carrier injection layers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/14—Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of the electroluminescent material, or by the simultaneous addition of the electroluminescent material in or onto the light source
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
- H10K2102/301—Details of OLEDs
- H10K2102/321—Inverted OLED, i.e. having cathode between substrate and anode
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/805—Electrodes
- H10K50/81—Anodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/805—Electrodes
- H10K50/81—Anodes
- H10K50/816—Multilayers, e.g. transparent multilayers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/805—Electrodes
- H10K50/82—Cathodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
Definitions
- Organic electroluminescent device and organic electroluminescent display device are organic electroluminescent display device
- the present invention relates to an organic EL (elect-opening luminescence) element and display suitable for displays for consumer and industrial use, specifically, displays such as mobile phones, PDAs, power navigation systems, monitors, and TVs. Equipment related.
- An organic EL display device has an organic EL element structure in which a light emitting layer is sandwiched between opposing electrodes.
- a voltage is applied between both electrodes of the organic EL element, electrons injected from one electrode and holes injected from the other electrode recombine in the light emitting layer.
- the organic light-emitting molecules in the light-emitting layer are temporarily excited by the recombination energy, and then return to the excited state and the ground state.
- the organic EL element emits light by extracting the energy released at this time as light.
- Organic EL elements are formed on a substrate, and are roughly classified into two types depending on the light extraction side. That is, a top emission type that extracts light from the opposite side of the substrate and a bottom emission type that extracts light from the substrate side.
- a top emission type is preferable in the bottom emission type, since the TFT prevents light extraction.
- ITO is often used as a transparent electrode in an organic EL device, but the work function of ITO is as high as 4.5 eV or more, which is a large difference from the work function preferable for a cathode (4 eV or less).
- an organic EL device in which the substrate / TFT / cathode / light-emitting layer / anode are laminated in this order and ITO is used as the anode can be considered.
- ITO in order to form ITO, it is necessary to perform sputtering at a substrate temperature of 200 ° C. or higher. For this reason, when the anode is made of an ITO film, the light emitting layer is damaged or the layer structure of the organic EL element is changed, which causes problems such as a decrease in luminous efficiency, generation of a leak current, and a reduction in the life of the element. There was something to do.
- a metal thin film is formed as a protective film on the hole injection layer, and is formed on the protective film. It has been proposed to form a transparent anode on the substrate (for example, Japanese Patent Application Laid-Open No. 06-290873).
- Japanese Patent Application Laid-Open No. 08-185984 a metal thin film and a transparent electrode layer are used.
- a metal thin film and an amorphous transparent electrode layer are used.
- Japanese Patent Application Laid-Open No. 2000-048966 discloses a film, an amorphous transparent electrode layer, and a metal.
- An object of the present invention is to provide an organic EL device and an organic EL display device having high stability and a long life.
- the inventors of the present invention have conducted intensive studies and found that a layer containing a metal oxide, specifically, a region containing a metal oxide was formed in a region (hole injection / transport region) between the anode and the light emitting layer of the organic EL device.
- the present invention was completed by finding that a long-life organic EL device can be manufactured by forming a metal oxide-containing (doping) layer in a hole injection layer or a metal oxide layer for protecting a light emitting layer. I let it.
- the following organic EL element and organic EL display device can be provided.
- An organic EL device in which at least a cathode, a light emitting layer, a hole injection layer, and an anode are laminated on a substrate in this order, and the hole injection layer contains a metal oxide.
- the metal oxide is one or more metal oxides selected from the group consisting of molybdenum oxide, vanadium oxide, hafnium oxide, yttrium oxide, zinc oxide, and aluminum oxide.
- An organic EL device according to any one of the above.
- the organic EL device according to any one of items 1 to 4 wherein the hole injection layer contains 0.01 to 50 atm% of a metal oxide. 6. The organic EL device according to any one of items 1 to 5, wherein a protective layer is provided between the hole injection layer and the anode.
- An organic EL device in which at least a cathode, a light emitting layer, a metal oxide layer, and an anode are laminated in this order on a substrate.
- the metal oxide layer comprises at least one selected from the group consisting of molybdenum oxide, vanadium oxide, rhenium oxide, ruthenium oxide, tungsten oxide, zinc oxide, titanium oxide, and copper oxide.
- EL element comprises at least one selected from the group consisting of molybdenum oxide, vanadium oxide, rhenium oxide, ruthenium oxide, tungsten oxide, zinc oxide, titanium oxide, and copper oxide.
- the protective film is made of an oxide, nitride or oxynitride of at least one element selected from the group consisting of Si, Ge, Mg, Ta, Ti, Zn, Sn, In, Pb and Bi. 16.
- the organic EL device according to 15, comprising an oxide, nitride, or oxynitride of at least one element selected from the group consisting of Eu, Gd, Tb, Dy, Er, and Yb.
- the cathode comprises at least one metal selected from an alkali metal and an alkaline earth metal, and a metal oxide.
- the metal oxide contained in the cathode is Li Ti O, Li V ⁇ , Er NbO, La Ti ⁇ x 24 x 24 x 3 x 3.
- a display device comprising the organic EL device according to any one of the above items 125.
- an organic EL device having high stability and a long life is provided.
- An organic EL display device can be provided.
- the metal oxide can prevent a voltage increase due to the thicker hole injection layer.
- FIG. 1 is a view showing a first embodiment of the organic EL device of the present invention.
- FIG. 2 is a view showing a second embodiment of the organic EL device of the present invention.
- FIG. 1 is a diagram showing a first embodiment of the organic EL device of the present invention.
- the hole injection layer contains a metal oxide.
- a metal oxide By including a metal oxide, an increase in driving voltage can be controlled even when the hole injection layer is thickened.
- This embodiment is an organic EL device 1 in which at least a cathode 3, a light emitting layer 4, a hole injection layer 5, and an anode 6 are laminated in this order on a substrate 2, as shown in FIG. ,If necessary
- An intervening layer can be provided.
- a protective layer 7 is provided between the hole injection layer 5 and the anode 6 to prevent sputtering damage to the hole injection layer at the time of forming the anode. be able to.
- an insulating layer 9 and an electron injecting property are provided between the cathode 3 and the light emitting layer 4, to improve the adhesion between the cathode and the organic compound and prevent leakage current.
- An electron injection layer 8 can be provided to increase the height.
- a hole injection layer is formed by adding a metal oxide to a hole injection material described later.
- a metal oxide is added to a hole injection material described later.
- at least one of the hole injection layers only needs to contain a metal oxide.
- the metal oxide is preferably an oxide of a metal element belonging to Group 313 of the long-term periodic table.
- molybdenum oxide, vanadium oxide, hafnium oxide, yttrium oxide, zinc oxide, and aluminum oxide are preferred.
- the addition amount of the metal oxide to the hole injection layer is preferably 0.0150atm%. More preferably, it is 0.05 to 30 atm%, and still more preferably 0.1 to 10 atm%.
- the thickness of the hole injection layer is preferably 40 nm—100 nm to avoid damage during the formation of the anode. More preferably 60-300 nm, even more preferably 100-
- a known method used for manufacturing an organic EL device can be used. For example, there are vapor deposition, spin coating, sputtering, and ink jet.
- molybdenum trioxide When formed by a vapor deposition method, molybdenum trioxide, vanadium pentoxide, or the like is suitably used.
- cathode / electron injection layer / emission layer / hole injection layer / protective layer / anode cathode / electron injection layer / emission layer / hole transport layer / hole injection layer / protective layer / anode
- FIG. 2 is a diagram showing a second embodiment of the organic EL device of the present invention.
- the feature of this embodiment is that a metal oxide layer is formed between one anode and one light emitting layer.
- an organic EL device 1 in which at least a cathode 3, a light emitting layer 4, a metal oxide layer 5 ', and an anode 6 are laminated on a substrate 2 in this order. '.
- the organic EL device 1 since the anode 6 can be formed on the metal oxide layer 5 ′ on the light emitting layer 4, it is possible to prevent the light emitting layer 4 from being damaged when the anode 6 is formed by sputtering or the like. Can be prevented.
- an intervening layer can be provided as necessary.
- a metal layer 10 can be provided between the metal oxide layer 5 ′ and the anode 6 in order to improve luminous efficiency.
- the anode 6 may be composed of a conductive film 6a and a protective film 6b.
- the metal oxide forming the metal oxide layer is preferably an oxide of a metal element belonging to Group 313 of the long-term periodic table.
- metal oxides of at least one selected from the group consisting of molybdenum oxide, vanadium oxide, rhenium oxide, ruthenium oxide, tungsten oxide, zinc oxide, titanium oxide and copper oxide are preferred.
- the metal oxide layer As a method for forming the metal oxide layer, it is preferable to use a method that does not damage the light emitting layer by a known method used for manufacturing an organic EL device. For example, vapor deposition, spin coating, inkjet, and the like.
- molybdenum trioxide or the like is suitably used.
- the film thickness is not particularly limited, but is preferably from 0.1 nm to 10 ⁇ , more preferably from 1 nm to 100 nm.
- the organic EL element may be a top emission type for extracting light from the side opposite to the substrate 2 or a bottom emission type for extracting light from the substrate 2 side.
- the anode is a transparent electrode and the cathode is a reflective electrode.
- the anode is a reflective electrode and the cathode is a transparent electrode.
- the organic EL device of the present invention is manufactured on a substrate.
- a glass plate, a polymer plate or the like is preferably used as the substrate.
- the glass plate soda-lime glass, barium-strontium-containing glass, lead glass, aluminosilicate glass, borosilicate glass, norium borosilicate glass, quartz and the like are particularly preferable.
- the polymer plate polycarbonate, acrylic, polyethylene terephthalate, polyether sulfide, polysulfone and the like are preferable.
- the anode preferably has a work function of 4.5 eV or more.
- the anode include indium tin oxide (ITO), indium zinc oxide (IZO), tin oxide (NESA), gold, silver, platinum, and copper.
- ITO indium tin oxide
- IZO indium zinc oxide
- NESA tin oxide
- gold gold
- silver platinum
- copper copper
- indium zinc oxide (IZO) is particularly preferable because it can be formed at room temperature and because the amorphous property is high, peeling of the anode and the like hardly occur.
- the sheet resistance of the anode is preferably 1000 ⁇ / port or less. More preferably, it is 800 ⁇ / port, and even more preferably, it is 500 ⁇ / port.
- anode Force In the case of taking out light emission, it is preferable to make the transmittance of the anode to light emission greater than 10%. It is more preferably at least 30%, further preferably at least 50%.
- the conductive film can be appropriately selected from materials used for the anode.
- the protective film is preferably formed from an oxide, nitride or oxynitride of at least one element selected from the group consisting of Si, Ge, Mg, Ta, Ti, Zn, Sn, In, Pb and Bi. Is done.
- a group force consisting of Mo, V, Cr, W, Ni, Co, Mn, Ir, Pt, Pd, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Er and Yb force It is formed from an oxide, nitride or oxynitride of at least one selected element.
- the protective film is light transmissive. Specifically, it is preferable that the transmittance for light emission is larger than 10%. More preferably, it is 30% or more, further preferably 50% or more.
- the thickness of the anode is different from the optimum value depending on the material.
- the thickness is usually selected in the range of 10 nm 1 ⁇ m, preferably 10-200 nm.
- the film formation of the anode is not particularly limited as long as it is a known film formation method.
- a vapor deposition method Or a sputtering method or a coating method is a known film formation method.
- a method for forming the light emitting layer As a method for forming the light emitting layer, a known method such as an evaporation method, a spin coating method, and an LB method can be applied. Further, as disclosed in Japanese Patent Application Laid-Open No. 57-51781, a binder such as a resin and a material conjugate are dissolved in a solvent to form a solution, which is then subjected to a spin coating method.
- the light emitting layer can also be formed by performing thin film formation by the method described above.
- a material used for the light emitting layer a material known as a long-lived light emitting material can be used, but it is preferable to use a material represented by the formula (1) as the light emitting material.
- Ar 1 is an aromatic ring having 6 to 50 nuclear carbon atoms
- X is a substituent
- 1 is an integer of 1 to 5
- m is an integer of 0 to 6.
- Ar 1 is specifically a phenyl ring, a naphthyl ring, an anthracene ring, a biphenylene ring, an azulene ring, an acenaphthylene ring, a fluorene ring, a phenanthrene ring, a fluoranthene ring, an acephenanthrylene ring, a triphenyl Diene ring, pyrene ring, thalicene ring, naphthacene ring, picene ring, perylene ring, pentaphene ring, pentacene ring, tetraphenylene ring, hexaphene ring, hexacene ring, rubycene ring, coronene ring, trinaphthylene ring, etc. .
- Preferable examples include a phenyl ring, a naphthyl ring, an anthracene ring, an acenaphthylene ring, a fluorene ring, a phenanthrene ring, a fluoranthene ring, a triphenylene ring, a pyrene ring, a tarisene ring, a perylene ring, and a trinaphthylene ring.
- a phenyl ring, a naphthyl ring, an anthracene ring, a fluorene ring, a phenanthrene ring, a fluoranthene ring, a pyrene ring, a thalicene ring, a perylene ring and the like are mentioned.
- X is specifically a substituted or unsubstituted aromatic group having 6 to 50 nuclear carbon atoms, a substituted or unsubstituted aromatic heterocyclic group having 5 to 50 nuclear atoms, a substituted or unsubstituted Substituted C1-C50 alkyl group, substituted or unsubstituted C1-C50 alkoxy group, substituted or unsubstituted C1-C50 aralkyl group, substituted or unsubstituted nuclear atom 5- 50 aryloxy groups, substituted or unsubstituted 5-50 arylthio groups, substituted or unsubstituted And an unsubstituted carboxyl group having 150 carbon atoms, a substituted or unsubstituted styryl group, a halogen group, a cyano group, a nitro group, a hydroxy group, and the like.
- Examples of the substituted or unsubstituted aromatic group having 6 to 50 nuclear carbon atoms include phenyl, 1-naphthyl, 2_naphthyl, 1_anthryl, 2_anthryl, and 9_anthryl.
- a phenyl group 1_naphthyl group, 2naphthyl group, 9_phenanthryl group, 1-naphthacenyl group, 2_naphthacenyl group, 9_naphthacenyl group, 1-pyrenyl group, 2-pyrenyl group, 4-pyrenyl Group, 2-biphenylyl group, 3-biphenylyl group, 4-biphenylyl group, o-tolyl group, m-tolyl group, ⁇ -tolyl group, p_t_butylphenyl group, 2_fluorenyl group, 9,9_dimethyl-2-fluorenyl Group, 3_fluoranthenyl group and the like.
- Examples of the substituted or unsubstituted aromatic heterocyclic group having 5 to 50 nuclear atoms include 1 pyrrolyl group, 2 pyrrolyl group, 3 pyrrolyl group, pyrazur group, 2 pyridinyl group, 3 pyridinyl group, and 4 _Pyridininole group, 1_indolyl group, 2_indolyl group, 3_indolyl group, 4_indolyl group, 5_indolyl group, 6_indolyl group, 7_indolyl group, 1_isoindolyl group, 2_isoindolyl group, 3_isoindolyl, 4_isoindolyl, 5_isoindolyl, 6_isoindolyl, 7_isoindolyl, 2-furinole, 3-furinole, 2_benzofuranyl, 3_benzofuranyl,
- Examples of a substituted or unsubstituted alkyl group having 1 to 50 carbon atoms include a methynole group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an s-butyl group, an isobutyl group, a t-butyl group, and an n-alkyl group.
- Examples of ⁇ include a methynole group, a 1-norbornyl group, and a 2_norbornyl group.
- Examples of the substituted or unsubstituted aralkyl group having 1 to 50 carbon atoms include a benzyl group, a 1-phenylethyl group, a 2-phenylethyl group, a 1-phenylisopropyl group, a 2-phenylisopropyl group, and a phenyl group.
- a substituted or unsubstituted aryloxy group having 5 to 50 nuclear atoms is represented by -OY ', and examples of Y' include phenyl, 1_naphthyl, 2_naphthyl, 1_anthryl, and 2 —Anthryl, 9-anthryl, 1-phenanthryl, 2-phenanthryl, 3-phenanthryl, 4-phenanthryl, 9-phenanthryl, 1_naphthacenyl, 2_naphthacenyl, 9_naphthacenyl, 1-pyrenyl group, 2-pyrenyl group, 4-pyrenyl group, 2-biphenylenyl group, 3_biphenylyl group, 4_biphenylyl group, p_terfenolyl_4-yl group, p— Ta-Feninole_3-yl group, p-Tafeninole_2-y
- 10-Fuenanthroline-2-yl group 1, 10-Fuenanthroline-3-yl group, 1,10-Fuena Nthroline-1-yl, 1,10-Fenanslorin-5-yl, 2,9-Fenanslorin-1-inole, 2,9_Fenanslorin-3-yl, 2,9_Fenanslorin-14-yl 2,9-Fenanslorin-1-yl group, 2,9-Fenanslorin-1-6-yl group, 2,9-Fenanslorin-7-yl group, 2,9-Fenanslorin_8-yl group, 2,9-phenanthroline-10-inole group, 2,8-phenanthroline-1-yl group, 2,8-phenanthroline-3-yl group, 2,8-phenanthroline-4-yl group, 2, 8_Fuenanthroline-5-yl group, 2,8_Fuenanthroline-6-yl group, 2,8_Fuenanthroline_7-yl group, 2,8_F
- a substituted or unsubstituted aryloxy group having 5 to 50 nuclear atoms is represented by -SY ", and examples of Y" include phenyl, 1_naphthyl, 2_naphthyl, 1_anthryl, and 2-anthryl.
- 9_anthryl 1-phenanthryl, 2-phenanthryl, 3-phenanthryl, 4-phenanthryl, 9-phenanthryl, 1_naphthacenyl, 2_naphthacenyl, 9-naphthacenyl, 1-pyrenyl , 2-pyrenyl group, 4-pyrenyl group, 2-biphenylyl Group, 3-biphenylyl group, 4-biphenylyl group, p-terphenyl-2-yl group, p-terphenyl-3-yl group, p-terphenyl-2-yl group, m-terfeyl 2-ru 4-yl, m_ terphenylinole 3-yl, m-terphenylinyl 2-yl, o tolyl, m-tolyl, p-tolyl, p_t_butylphenyl, p_ (2-phenyl Propynole) phenyl,
- 10-phenanthroline-2-yl group 1,10-phenanthroline-3-yl group, 1,10-phenanthroline-4-yl group, 1,10-phenanthroline-5-yl group, 2, 9 —Fuenanthroline— 1—Inole group, 2,9—Fuenanthroline—3-yl group, 2,9—Fuenanthroline—4—yl group, 2,9—Fuenanthroline—5—yl group, 2,9—Fuenanthroline— 6-yl group, 2,9-phenanthine Mouth phosphorus-7-yl group, 2,9-phenanthroline_8-yl group, 2,9-phenanthroline-10-yl group, 2,8-phenanthroline-1 —Yl group, 2,8-phenanthroline—3-yl group, 2,8-phenanthroline—4-yl group, 2,8_phenanthroline—5-yl group, 2,8_phenanthroline—6— 2,8_Fenanthroline_7-yl
- a substituted or unsubstituted carboxyl group having 1 to 50 carbon atoms is represented by 1 COOZ.
- T include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group and an s-butyl group.
- substituted or unsubstituted styryl groups examples include 2-phenyl 1-butyl group, 2,2-diphenyl_1-butyl group, 1,2,2-triphenyl 1-butyl group and the like. Is mentioned.
- halogen group examples include fluorine, chlorine, bromine, iodine and the like.
- n 1 is an integer of 115, preferably 112.
- m is an integer of 0-6, preferably 0-4.
- one Ar 1 may be the same or different.
- the m Xs may be the same or different. Specific examples of the compound represented by the formula (1) are shown below.
- the light emitting performance can be improved.
- the dopant it is possible to use a material known as a punt material having a long life, but it is preferable to use a material represented by the formula (2) as a dopant material of the light emitting material.
- Ar 2 —Ar 4 is a substituted or unsubstituted aromatic group having 650 carbon atoms, a substituted or unsubstituted styryl group, and p is an integer of 1-4.
- Examples of the substituted or unsubstituted aromatic group having 6 to 50 nuclear carbon atoms include phenyl, 1_naphthyl, 2_naphthyl, 1_anthryl, 2_anthryl, 9_anthryl, 1—F Phenanthryl, 2-phenanthryl, 3_phenanthryl, 4-phenanthryl, 9-phenanthryl, 1 naphthacenyl, 2-naphthacenyl, 9 naphthacenyl, 1-pyrenyl, 2-pyrenyl, 4-pyrenyl Group, 2-biphenylyl group, 3-biphenylyl group, 4_biphenylyl group, p_terfeninole_4-yl group, p_terfeninole_3-yl group, p_terfeninole_2 —Yl group, m—terfeninole_4—yl group, m—terfeninole_2
- a phenyl group 1_naphthyl group, 2_naphthyl group, 9-phenanthryl group, 1-naphthacenyl group, 2_naphthacenyl group, 9_naphthacenyl group, 1-pyrenyl group, 2-pyrenyl group, 4 -Pyrenyl group, 2-biphenylyl group, 3-biphenylyl group, 4-biphenylyl group, o-tolyl group, m-tolyl group, ⁇ -tolyl group, p_t_butylphenyl group, 2_fluorenyl group, 9,9_dimethyl-2_ A fluorenyl group and a 3_fluoranthenyl group.
- substituted or unsubstituted styryl groups examples include 2-phenyl 1-vinyl group, 2,2-diphenyl-1-vinyl group, 1,2,2-triphenyl 1-vier group and the like. Is mentioned.
- p is an integer of 1 to 4.
- p Ar 3 and Ar 4 may be the same or different.
- a hole transport layer can be provided between the light emitting layer and the hole injection layer.
- the hole transport layer is preferably made of a material that transports holes to the light emitting layer at a lower electric field intensity. That is, it is preferable that the mobility of holes be 10 4 cm 2 / V 'second or more when an electric field of 10 4 to 10 6 V / cm is applied.
- Materials for forming the hole transport layer include those commonly used as charge transport materials for holes in photoconductive materials, and those known for use in the hole transport layer of EL devices. Any of them can be selected and used.
- Conductive polymer oligomers (particularly thiophene) disclosed in orchids (JP-A-2-204996), aniline-based copolymers (JP-A-2-282263), and JP-A-11-121399. Oligomer) and the like.
- the hole transport layer can be formed from the above-described compound by a known method such as a vacuum evaporation method, a spin coating method, a casting method, and an LB method.
- the thickness of the hole transport layer is not particularly limited, but is preferably 5 nm 5 x m, and particularly preferably 540 nm.
- the hole transport layer may be composed of one or more of the above-mentioned materials. Further, a layer in which a hole transport layer made of a different kind of compound is laminated may be used.
- the same materials as those for the hole transporting layer can be used, but porphyrin compounds (those disclosed in JP-A-63-2956965, etc.), aromatic tertiary Amine compounds and styrylamine derivatives (US Pat. No. 4,127,412, JP-A-53-27033, JP-A-54-58445, JP-A-54-149634, JP-A-54-64299).
- NPD N- (3-methylphen) in which three triphenylamine units described in JP-A-4-308688 are connected in a starburst form.
- Nyl N_phenylamino triphenylamine
- inorganic compounds such as p-type Si and p-type SiC can also be used as the material for the hole injection layer.
- the organic semiconductor layer is also part of the hole injection layer. However, this is a layer that assists hole injection or electron injection into the light-emitting layer, and preferably has a conductivity of 10-1 QS / cm or more.
- Examples of the material for such an organic semiconductor layer include thiophene-containing oligomers, conductive oligomers such as arylamine-containing oligomers disclosed in JP-A-8-193191, and conductive dendrimers such as arylamine-containing dendrimers. Etc. can be used.
- the hole injection layer of the organic EL device according to the first embodiment of the present invention can be formed by adding the above-described metal oxide to these hole injection layer materials.
- the hole injection layer can be formed from the above-mentioned compound by a known method such as a vacuum evaporation method, a spin coating method, a casting method, and an LB method.
- the thickness of the hole injection layer is preferably 40 nm—100 nm to avoid damage during the formation of the anode. More preferably, it is 60 300 nm, more preferably 100 200 nm.
- the hole injection layer may be composed of one or more of the above-mentioned materials.
- a layer obtained by laminating a hole injection layer made of a compound different from the hole injection layer may be used.
- an electron transport layer can be provided between the cathode and the light emitting layer.
- Electron-transporting layer is not more electron mobility when the force 10 4 -10 / ⁇ 11 the application of the electric field that is suitably selected in a film thickness of several nm- number / im is 10- 5 cm 2 / Vs or more.
- a metal complex of 8-hydroxyquinoline or a derivative thereof is preferable.
- metal complex of 8-hydroxyquinoline or a derivative thereof include a metal chelate oxinoid conjugate containing a chelate of oxine (generally, 8_quinolinol or 8-hydroxyquinoline).
- Alq described in the section of the light emitting material can be used as the electron injection layer.
- examples of the oxadiazole derivative include an electron transfer compound represented by the following formula.
- Ar 5 , Ar 6 , Ar 7 , Ar 9 , Ar 10 , and Ar 13 each represent a substituted or unsubstituted aryl group, which may be the same or different from each other.
- Ar 11 and Ar 12 each represent a substituted or unsubstituted arylene group, which may be the same or different.
- the aryl group is a phenyl group, a biphenyl group, an anthranyl group, a perylenyl group. And pyrenyl groups.
- Examples of the arylene group include a phenylene group, a naphthylene group, a biphenylene group, an anthranylene group, a peryleneylene group, and a pyrenylene group.
- examples of the substituent include an alkanol group having 110 carbon atoms, an alkoxy group or a cyano group having 110 carbon atoms, and the like.
- the electron transfer conjugate is preferably a thin film-forming compound.
- electron transfer compound include the following.
- a 1 to A 3 are a nitrogen atom or a carbon atom.
- R is an aryl group having 6 to 60 carbon atoms which may have a substituent; a heteroaryl group having 360 carbon atoms which may have a substituent; an alkyl group having 1 to 20 carbon atoms; 120 haloalkyl groups, alkoxy groups having 120 carbon atoms, n is an integer of 0 to 5, and when n is an integer of 2 or more, a plurality of Rs may be the same or different from each other, You can.
- a plurality of adjacent R groups may be bonded to each other to form a substituted or unsubstituted carbocyclic aliphatic ring or a substituted or unsubstituted carbocyclic aromatic ring.
- Ar 14 is an aryl group having 6 to 60 carbon atoms which may have a substituent, or a heteroaryl group having 3 to 60 carbon atoms which may have a substituent.
- Ar 15 is a hydrogen atom, an alkyl group having 1 to 20 carbon atoms, a haloalkyl group having 112 carbon atoms, an alkoxy group having 112 carbon atoms, an aryl group having 660 carbon atoms which may have a substituent. And a heteroaryl group having 3 to 60 carbon atoms which may have a substituent.
- one of Ar M and Ar 15 is a condensed cyclic group having 10 to 60 carbon atoms which may have a substituent, or a hetero condensed ring having 3 to 60 carbon atoms which may have a substituent. Group.
- L 2 is a single bond, a condensed ring having 6 to 60 carbon atoms which may have a substituent, a heterocyclic ring having 3 to 60 carbon atoms which may have a substituent, Or a fluorenylene group which may have a substituent.
- HAr is a nitrogen-containing heterocyclic ring having 3 to 40 carbon atoms which may have a substituent
- L 3 has a single bond, an arylene group having 6 to 60 carbon atoms which may have a substituent, a heteroarylene group having 360 carbon atoms which may have a substituent or a substituent.
- Ar 16 is a divalent aromatic hydrocarbon group having 6 to 60 carbon atoms having a substituent
- Ar 17 is a substituted or unsubstituted aryl group having 6 to 60 carbon atoms, or
- Japanese Patent Application Laid-Open No. 09-087616 discloses an electroluminescent device using a silacyclopentadiene derivative represented by the following formula:
- Q 1 and Q 2 each independently represent a saturated or unsaturated hydrocarbon group having 1 to 6 carbon atoms, alkoxy group, alkenyloxy group, alkynyloxy group, hydroxy group, substituted or unsubstituted And a substituted or unsubstituted heterocyclic ring or a structure in which Q 1 and Q 2 are combined to form a saturated or unsaturated ring.
- R 1 — R 4 are each independently hydrogen, halogen, Substituted or unsubstituted alkyl group having 1 to 6 carbon atoms, alkoxy group, aryloxy group, perfluoroalkyl group, perfluoroalkoxy group, amino group, alkylcarbonyl group, arylcarbonyl group, alkoxycarbonyl group , Aryloxycarbonyl, azo, alkylcarbonyloxy, arylcarbonyl, alkoxycarbonyl, aryloxy Carbonyloxy group, sulfinyl group, sulfonyl group, sulfanyl group, silinole group, sorbamoyl group, aryl group, heterocyclic group, alkenyl group, alkynyl group, nitro group, forminole group, nitroso group, formyloxy group, isocyano group , A cyanate group, an isocyanate group, a thiosinate group,
- Q 3 and Q 4 are each independently a saturated or unsaturated hydrocarbon group having 1 to 6 carbon atoms, an alkoxy group, an alkenyloxy group, an alkynyloxy group, a substituted or unsubstituted aryl group.
- R 5 — R 8 are each independently hydrogen, halogen, Or an unsubstituted alkyl group having 1 to 6 carbon atoms, an alkoxy group, an aryloxy group, a perfluoroalkyl group, a perfluoroalkoxy group, an amino group, an alkyl group, a carbonyl group, an arylcarbonyl group, or an alkoxycarbonyl group.
- R 6 and R 7 are not simultaneously filled with an aliphatic group forming a ring, and when R 5 and are silyl groups, R 6 and Q 3 and Q 4 are each independently, in the structure where a benzene ring is fused with R 5 and R 6 which Nag 1 -C 6 monovalent hydrocarbon group or a hydrogen atom, Q 3 and Q 4 is alkyl And phenyl.)
- R 9 R 16 and Q 8 are each independently a hydrogen atom, a saturated or unsaturated hydrocarbon group, an aromatic group, a heterocyclic group, a substituted amino group, a substituted boryl group, an alkoxy group or an aryl group.
- Q 5 , Q 6 and Q 7 each independently represent a saturated or unsaturated hydrocarbon group, an aromatic group, a heterocyclic group, a substituted amino group, an alkoxy group or an aryloxy group;
- the substituents of Q 7 and Q 8 may be bonded to each other to form a condensed ring.
- R represents an integer of 13 and when r is 2 or more, Q 7 may be different. Wherein r is 1, Q 5 , Q 6 and R 1 are a methyl group, R 16 is a hydrogen atom or a substituted boryl group, and r is 3 and Q 7 is a methyl group.
- Q 9 and Q 1Q each independently represent a ligand represented by the following formula (3), and L 4 represents a halogen atom, a substituted or unsubstituted alkyl group, a substituted or unsubstituted A cycloalkyl group, a substituted or unsubstituted aryl group, a substituted or unsubstituted heterocyclic group, -OR 17 (R 17 is a hydrogen atom, a substituted or unsubstituted alkyl group, a substituted or unsubstituted cycloalkyl group, a substituted or unsubstituted Unsubstituted aryl group, substituted or unsubstituted heterocyclic group.) Or — ⁇ —Ga-Q 11 ⁇ 12 ) (Q 11 and Q 12 have the same meanings as Q 9 and Q 1Q ). Represents the ligand shown. ) [Formula 12]
- rings 4 and 5 are 6-membered aryl ring structures which may have a substituent and are fused together.
- This metal complex has a strong electron-injecting ability with a strong property as an n-type semiconductor. Furthermore, since the energy generated during complex formation is low, the bond between the metal and the ligand of the formed metal complex is strengthened, and the fluorescent quantum efficiency as a light emitting material is also increased.
- substituents on the ring A 4 and A 5 to form a ligand of the above formula chlorine, bromine, iodine, halogen atom such as fluorine, Mechinore group, Echiru group, propyl group, butyl group, substituted or unsubstituted alkyl groups such as sec-butyl group, tert-butyl group, pentyl group, hexyl group, heptyl group, octyl group, stearyl group, trichloromethyl group, phenyl group, naphthyl group, 3-methylphenyl group, Substituted or unsubstituted aryl groups such as 3-methoxyphenyl group, 3_fluorophenyl group, 3_trichloromethylphenyl group, 3_trifluoromethylphenyl group, 3_nitrophenyl group, methoxy group, n- Butoxy, tert-butoxy, trich
- an electron injection layer made of an insulator or a semiconductor can be provided between the cathode and the electron injection layer or between the cathode and the light emitting layer.
- the insulator examples include an alkali metal chalcogenide, an alkaline earth metal chalcogenide, a halide of an alkali metal and a halide of an alkaline earth metal, aluminum oxide, aluminum nitride, titanium oxide, silicon oxide, germanium oxide, silicon nitride, and boron nitride. It is preferable to use metal compounds such as silicon, molybdenum oxide, ruthenium oxide, and vanadium oxide alone or in combination. Among these metal compounds, alkali metal chalcogenides and alkaline earth metal chalcogenides are preferred in view of electron injection properties. Preferred alkali metal chalcogenides include Li ⁇ , Li ⁇ , Na S, Na Se and Na ⁇ .
- No. Preferred alkaline earth metal chalcogenides include CaO, BaO, Sr ⁇ , Be ⁇ , BaS, and CaSe.
- Examples of the alkali metal halide include LiF, NaF, KF, LiCl, KC1, and NaCl.
- Examples of the alkaline earth metal halide include fluorides such as CaF, BaF, SrF, MgF and BeF, and fluorides.
- the semiconductor constituting the electron transport layer is at least selected from the group consisting of Ba, Ca, Sr, Yb, Al, Ga, In, Li, Na, Cd, Mg, Si, Ta, Sb and Zn.
- One kind or a combination of two or more kinds of oxides, nitrides, oxynitrides, and the like containing one element can be given.
- the electron injection layer is preferably microcrystalline or amorphous. This is because a uniform thin film is formed, so that pixel defects such as dark spots can be reduced.
- two or more kinds of electron injection layers may be laminated and used.
- a reducing dopant can be contained in the region for transporting electrons or the interface region between the cathode and the organic layer.
- the reducing dopant is a substance capable of reducing an electron transporting compound. Therefore, various substances having a reducing property can be used.
- alkali metals, alkaline earth metals, rare earth metals, alkali metal oxides, alkali metal halides, alkaline earth metal oxides, alkaline earth metal halides, rare earth metal oxides or rare earth metals An alkali metal organic complex, an alkaline earth metal organic complex, a rare earth metal organic complex and the like can be suitably used.
- Preferred reducing dopants include alkalis such as Na (work function: 2.36 eV), K (work function: 2.28 eV), Rb (work function: 2.16 eV) and Cs (work function: 1.95 eV).
- alkalis such as Na (work function: 2.36 eV), K (work function: 2.28 eV), Rb (work function: 2.16 eV) and Cs (work function: 1.95 eV).
- metals include ruthenium earth metals such as metals, Ca (work function: 2.9 eV), Sr (work function: 2.0-2.5 eV), and Ba (work function: 2.52 eV).
- K, Rb and Cs are more preferably Rb or Cs, and even more preferably Cs.
- a combination containing Cs which also favors a combination of these two or more kinds of alkali metals, such as a combination of Cs and Na, a combination of Cs and Rb, or a combination of Cs and Na and K is particularly preferable.
- a metal having a small work function (4 eV or less), an alloy, an electrically conductive compound, and a mixture thereof are preferably used as an electrode material.
- Specific examples include sodium, sodium potassium alloy, magnesium, lithium, magnesium'silver alloy, aluminum / anoremium oxide, aluminum'lithium alloy, indium, rare earth metals and the like.
- the cathode preferably contains a metal oxide.
- Li Ti O, Li V ⁇ , Er Nb ⁇ , La TiO, Sr VO, Ca CrO x 24 x 24 x 3 x 3 x 3 and Sr CrO (x 0. )
- a Mo ⁇ (A K, Cs, Rb, Sr, Na, Li, Ca x 3
- At least one metal oxide selected from the group consisting of:
- the cathode further preferably includes at least one metal selected from alkali metals and alkaline earth metals in order to improve the electric injection property.
- Suitable metals include Na, K, Cs, Mg.
- the cathode can be manufactured by forming a thin film from these electrode substances by a method such as evaporation or sputtering.
- the transmittance of the cathode to the emitted light be greater than 10%. More preferably, it is at least 30%, further preferably at least 50%.
- the cathode sheet resistance is preferably 1000 ⁇ / port or less. More preferably, 800 ⁇ / port, and even more preferably, 600 ⁇ / port.
- the film thickness is not particularly limited, but is preferably 10 11 111-1 / 1/111, more preferably 50-200 nm.
- the cathode is preferably a reflective electrode.
- an organic EL applies an electric field to an ultrathin film, pixel defects due to leaks and short circuits are likely to occur. In order to prevent this, it is preferable to insert an insulating thin film layer between the cathode and the organic material layer.
- Examples of the material used for the insulating layer include aluminum oxide, lithium fluoride, and lithium oxide.
- Aluminum, cesium fluoride, cesium oxide, magnesium oxide, magnesium fluoride, calcium oxide, calcium fluoride, aluminum nitride, titanium oxide, silicon oxide, germanium oxide, silicon nitride, boron nitride, molybdenum oxide, ruthenium oxide, Vanadium oxide and the like can be mentioned.
- the protective layer is formed to protect the organic layer when forming the anode.
- metals such as Ag and Au or alloys thereof having high light transmittance are used.
- a semiconductor or an absolute green body may be used to achieve the above object.
- materials exemplified for the absolutely green layer and materials exemplified for the metal oxide are preferably used.
- a series of semiconductors include CdSe, CdS, ZnS, and ZnSe force S.
- these materials may be used alone, or a mixture of these materials may be used. These materials may be mixed with materials used for other purposes.
- the protective layer is usually formed to have a thickness of several nm to several tens nm in order to increase the light transmittance, but it is particularly preferably 11 to 11 Onm.
- a metal layer can be provided between the conductive film forming the anode and the protective film, between the metal oxide layer and the anode, or between the light-emitting layer and the metal oxide layer.
- the metal layer is formed of, for example, an alloy containing at least one selected from Mg, Ag, and Zr.
- the film thickness is not particularly limited, but is preferably 0.1 nm to ⁇ , more preferably 1 nm to 15 nm.
- a production example of the organic EL device according to the first embodiment of the present invention which has a configuration in which a cathode, an electron transport layer, a light emitting layer, a hole injection layer, a protective layer, and an anode are sequentially provided on a substrate, will be described. I'll give it.
- a thin film made of a cathode material is formed on a substrate by a method such as evaporation or sputtering so as to have a thickness of 1 ⁇ m or less, preferably 10 to 200 nm, to produce a cathode.
- An electron transport layer is provided on the cathode.
- the electron transport layer can be formed by methods such as vacuum evaporation, spin coating, casting, and LB, because it is easy to obtain a uniform film and hardly generates pinholes.
- it is formed by a vacuum deposition method.
- the deposition conditions vary depending on the compound used (electron transport layer material), the crystal structure and the recombination structure of the intended electron transport layer, etc. 50- 450 ° C, vacuum degree of 10- 7 10- 3 t OTr, deposition rate 0.01 one 50nmZ sec, substrate temperature - 50- 300 ° C, and suitably selected child thickness in the range of 5nm- 5 ⁇ m Is preferred.
- a light-emitting layer in which a light-emitting layer is provided on the electron transport layer is also formed by thinning the organic light-emitting material using a desired organic light-emitting material by a method such as vacuum evaporation, sputtering, spin coating, or casting.
- a vacuum deposition method which can provide a uniform film quickly and hardly cause pinholes.
- the evaporation conditions vary depending on the compound used, but generally a neutral force in the same condition range as the electron transport layer can be selected.
- a hole injection layer is provided on the light emitting layer. Necessary force for obtaining a uniform film, similar to the electron transporting layer and the light emitting layer.
- the deposition conditions can be selected from the same condition ranges as those of the electron transport layer and the light emitting layer.
- a protective layer of several nm to several tens of nm is formed on the hole injection material.
- This protective layer can be formed by various methods, and specific examples thereof include vacuum evaporation, sputtering, and electron beam evaporation.
- the protective layer is formed by a vacuum deposition method, the deposition conditions vary depending on the compound to be used (the material of the hole injection layer), the crystal structure and the recombination structure of the target protective layer, etc. ° C, vacuum degree of 10- 7 10- 3 torr, vapor deposition rate 0. 01- 50 NMZ sec, substrate temperature - 50- 300 ° C, it is preferable to appropriately select the range of thickness of lnm 20 nm.
- an anode can be laminated to obtain an organic EL device.
- the anode is made of a metal, and an evaporation method or sputtering can be used. In order to protect the organic layer underlying the substrate from damage during film formation, a vacuum deposition method is preferable.
- the cathode / electron transport on the substrate which is the organic EL device of the second embodiment of the present invention.
- An example of manufacturing an organic EL device having a structure in which a layer, a light emitting layer, a hole injection layer, a metal oxide layer, and an anode are sequentially provided will be described.
- a metal oxide layer having a thickness of several hundred nm is formed on the hole injection layer.
- This metal oxide layer can be formed by various methods, and specific examples thereof include vacuum evaporation, sputtering, and electron beam evaporation. Vacuum deposition is preferred because damage to the hole injection layer is small.
- the evaporation conditions vary depending on the compound used, the crystal structure and the recombination structure of the target metal oxide layer, etc., but generally the evaporation source temperature is 50 to 500.
- C vacuum degree of 10- 7 - 10- 3 torr
- vapor deposition rate 0. 01 50 nm / sec
- substrate temperature one 50 300 ° C it is preferable to appropriately select the range of thickness lnm- 20nm.
- An anode is formed on the metal oxide layer in the same manner as in the above-described manufacturing example.
- the method for forming each layer of the organic EL device of the present invention is not particularly limited.
- a conventionally known forming method such as a vacuum evaporation method and a spin coating method can be used.
- the organic thin film layer used in the organic EL device of the present invention may be formed by a vacuum evaporation method, a molecular beam evaporation method (MBE method) or a dipping method of a solution dissolved in a solvent, a spin coating method, a casting method, a bar coating method, It can be formed by a known method using a coating method such as a roll coating method.
- each organic layer of the organic EL device of the present invention is not particularly limited. Generally, when the thickness is too small, defects such as pinholes occur, and when it is too large, a high applied voltage is required. In general, the range from several nm to lxm is preferable because the efficiency is lowered.
- a 25 mm ⁇ 75 mm ⁇ 1.1 mm thick glass substrate (manufactured by Geomatic) was subjected to ultrasonic cleaning in isopropyl alcohol for 5 minutes, and then to UV ozone cleaning for 30 minutes.
- the cleaned glass substrate was mounted on a substrate holder of a vacuum evaporation apparatus, placed in the vacuum evaporation apparatus, and metal A1 was evaporated to a thickness of 150 nm to form a metal cathode. Next, on this cathode, 1 nm of LiF was deposited as an electron injection layer.
- Alq having a thickness of 20 nm was deposited to form a film. This functions as an electron transport layer.
- the following HI having a film thickness of 40 nm was deposited on the electron transport layer to form a film.
- the following dopant D1 was co-evaporated as a light emitting molecule.
- TBDB layer a 20 nm-thick N, N, N ′, N′-tetra (4-biphenyl) -diaminobiphenylene layer (hereinafter referred to as “TBDB layer”) was formed on the light emitting layer.
- This film functions as a hole transport layer.
- a layer formed by depositing molybdenum trioxide on TBDB at 60 nm was formed at a deposition rate ratio of 3 nm.
- the thickness of the film was 60 nm. This film functions as a hole injection layer.
- molybdenum trioxide was heated using a resistance heating boat to form a 5 nm film.
- This film corresponds to a protective layer.
- IZO was sputtered at room temperature to deposit 150 nm on the protective film to form a transparent anode to form an organic EL light emitting device.
- Table 1 shows the voltage required when 10 mA / cm 2 is supplied to the organic EL element and the half life of the element such as the initial luminance and the OOOnit power.
- An organic EL device was fabricated in exactly the same manner as in Example 1, except that the protective layer was not formed and the thickness of the hole injection layer was set to 120 nm.
- Table 1 shows the voltage required when applying 10 mA / cm 2 to this organic EL device and the half-life from the initial luminance of 1, OOOnit.
- An organic EL device was manufactured in exactly the same manner as in Example 1 except that the metal oxide of the hole injection layer was not co-evaporated.
- Table 1 shows the voltage required to flow 10 mA / cm 2 through this organic EL device and the half-life from the initial luminance of 1, OOOnit.
- 25mm X 75mm X 1mm thick Ag (20nm thick) and ITO (130nm thick) glass substrate with electrodes (manufactured by Geomatic) is ultrasonically cleaned in isopropyl alcohol for 5 minutes, then electrical resistance After ultrasonic cleaning with distilled water of 20 ⁇ ⁇ ⁇ ⁇ for 5 minutes and further in isopropyl alcohol for 5 minutes, the glass substrate with electrodes was taken out and dried. Immediately thereafter, UV ozone cleaning was performed for 30 minutes using a UV ozone apparatus manufactured by Samco International Laboratories.
- the electrode-attached glass substrate after cleaning was mounted on a substrate holder of a vacuum deposition apparatus and allowed to reach 1 X 10- 5 Pa make-out vacuum pull.
- Alq and Li were deposited as an electron injection layer at an evaporation rate of 0.1 nm / sec and 0.1 Olnm / In sec, a film was formed to a thickness of 20 nm.
- a 40 nm-thick host (HI) was deposited on this film at a deposition rate of 0.2 nmZsec by vapor deposition.
- a dopant (D1) was vapor-deposited at the same time as a light-emitting molecule at a vapor deposition rate of 0.1 Olnm / sec. This film functions as a light emitting layer.
- an N, N, N ,, N, -tetra (4-biphenyl) diaminobiphenylene (TBDB) layer having a thickness of 20 nm was formed at a deposition rate of 0.1 InmZsec. This film functions as a hole transport layer.
- TPD 232 film One 1, 1'—bihue A Nil (TPD 232) film was formed. This TPD232 film functions as a hole injection layer.
- Vapor deposition was performed at a rate of 10 nm / sec to form a layer having a thickness of 10 nm.
- IT ⁇ was formed by sputtering at a deposition rate of 0.4 nm / s to a thickness of 100 nm.
- the light reflection electrode side of this organic EL element was used as a cathode, and the initial performance was measured at a current density of 1 mA / cm 2 .
- the leakage current was measured by applying a voltage of 5 V with a reverse bias and measuring the current value at that time.
- Leakage current was 2 X 10- 9 A / cm 2 .
- the life was measured at room temperature, and the constant current DC drive was applied to the current value when the initial luminance was initially 3000 nit, and the continuous energization was evaluated.
- the half life is the elapsed time when the initial luminance is reduced to half.
- the half life was 2000 hours.
- Table 2 shows the evaluation results.
- Example 3 instead of MoO, Au was deposited at a deposition rate of 0.05 nm / sec at a film thickness of 5 nm.
- An organic EL device was produced in the same manner as above except for vapor deposition.
- Example 3 after the deposition of MoO, the deposition rate was 1 using Mg and Ag, respectively.
- An organic EL device was manufactured in the same manner as above except that a layer having a thickness of 1.5 nm was formed by co-evaporation at 5 nm / sec and 0.1 nm / sec.
- Leakage current was 5 X 10- 9 AZ cm 2.
- the half life was 2000 hours.
- Rie leakage current was 3 X 10- 9 AZ cm 2.
- the half life was 2000 hours.
- the organic EL element and the organic EL display device of the present invention can be used for consumer and industrial displays, specifically, mobile phones, PDAs, car navigation systems, monitors, TVs, and the like.
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Also Published As
Publication number | Publication date |
---|---|
TW200531589A (en) | 2005-09-16 |
US20070170843A1 (en) | 2007-07-26 |
KR20060135801A (ko) | 2006-12-29 |
EP1722602A1 (en) | 2006-11-15 |
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