TW490714B - Film formation apparatus and method for forming a film - Google Patents

Film formation apparatus and method for forming a film Download PDF

Info

Publication number
TW490714B
TW490714B TW089125706A TW89125706A TW490714B TW 490714 B TW490714 B TW 490714B TW 089125706 A TW089125706 A TW 089125706A TW 89125706 A TW89125706 A TW 89125706A TW 490714 B TW490714 B TW 490714B
Authority
TW
Taiwan
Prior art keywords
evaporation
chamber
evaporation source
longitudinal direction
patent application
Prior art date
Application number
TW089125706A
Other languages
Chinese (zh)
Inventor
Shunpei Yamazaki
Takeshi Fukunaga
Original Assignee
Semiconductor Energy Lab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Lab filed Critical Semiconductor Energy Lab
Application granted granted Critical
Publication of TW490714B publication Critical patent/TW490714B/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/28Vacuum evaporation by wave energy or particle radiation
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • C23C14/044Coating on selected surface areas, e.g. using masks using masks using masks to redistribute rather than totally prevent coating, e.g. producing thickness gradient
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D1/00Processes for applying liquids or other fluent materials
    • B05D1/32Processes for applying liquids or other fluent materials using means for protecting parts of a surface not to be coated, e.g. using stencils, resists
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D1/00Processes for applying liquids or other fluent materials
    • B05D1/40Distributing applied liquids or other fluent materials by members moving relatively to surface
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D5/00Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures
    • B05D5/12Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures to obtain a coating with specific electrical properties
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/243Crucibles for source material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/26Vacuum evaporation by resistance or inductive heating of the source
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/10OLEDs or polymer light-emitting diodes [PLED]
    • H10K50/11OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/16Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/16Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • H10K71/164Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/16Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • H10K71/166Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/40Thermal treatment, e.g. annealing in the presence of a solvent vapour

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Electroluminescent Light Sources (AREA)
  • Physical Vapour Deposition (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

An apparatus for forming a film having high uniformity in its film thickness distribution is provided. An evaporation source is used in which an evaporation cell, or a plurality of evaporation cells, having a longitudinal direction is formed, and by moving the evaporation source in a direction perpendicular to the longitudinal direction of the evaporation source, a thin film is deposited on a substrate. By making the evaporation source longer, the uniformity of the film thickness distribution in the longitudinal direction is increased. The evaporation source is moved, film formation is performed over the entire substrate, and therefore the uniformity of the film thickness distribution over the entire substrate can be increased.

Description

490714490714

發明背景 1·發明領域 本發明爲有關於形成用於製造E L (電致發光)元件 的薄膜之一種設備或方法,該E [元件具有由一陰極、一 陽極及夾於該陰極及該陽極之間的一發光材料組成的結構 ,該發光材料特別是一種自行發光的有機材料(以下稱爲 有機E L材料),由該材料獲得e ^ (電致發光)。 2 ·相關技藝的描述 E L顯示裝置有兩種類型:被動型(簡單矩陣型)及 主動型(主動矩陣型),該兩種類型皆受到積極硏究。特 別地,主動矩陣型E L顯示裝置是當前業界的關注焦點。 尤有進者,有機材料及無機材料皆可以被用來作爲E L材 料,其成爲E L·元件的發光層,除此之外有機材料被分爲 低分子量(單體)有機E L材料以及高分子量(高分子) 有機E L材料。兩者皆受到積極硏究,但是低分子量有機 EL材料的薄膜是主要藉由蒸發而被形成,而高分子量有 機E L材料的薄膜是主要藉由塗覆而被形成。 爲了製造彩色E L顯示裝置,必須要形成每個像素發 出不同顏色的EL材料的薄膜。然而,一般而言eL材料 相對於水及氧而言是弱的,而且不能夠以微影蝕刻來進行 圖案化。因而有必要於形成薄膜的同時形成圖案。 最普遍的方法是一種在於其上形成薄膜的基質以及蒸 發來源之間形成一由金屬板或玻璃板製成且於其中形成有 本纸張尺度適用巾國國家標準(CNS ) A4規格(210X 297公羡) (請先閲讀背面之注意事項再填寫本頁) C· 訂 經濟部智慧財產局員工消費合作社印製 -4- 490714 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明説明(2) 一開口部分的光罩的方法。於此例子中,來自該蒸發來源 的經蒸發的E L材料僅通過該開口部分,藉以選擇性地形 成薄膜,而且因此有可能形成一薄膜,於其中薄膜形成及 圖案化是被同時地進行。 以一傳統的蒸發裝置,來自一蒸發來源的E L材料以 輻射的形狀飛離而累積在一基質上形成一薄膜,而且因而 在考慮該E L材料覆蓋的距離下,一種放置基質的方式被 設計出來。例如,一種包含將基質固定在一圓錐形基質固 持件、使蒸發來源到基質的距離皆相等的方法被實施了。 然而,當使用在一大型基質上製造複數板的一種多一 斜邊方法時,如果實施上述的方法則該基質固持件變得過 大,而且此導致膜形成設備的主體變得太大。更進一步地 ,當使用單晶圓處理時該基質是平面的,因而在基質表面 內與蒸發來源的距離不等,而此現象有一問題是難以沉積 出均勻的薄膜厚度。 除此之外,當使用大型基質時如果蒸發來源與蔭像光 罩之間的距離沒有被做成大些的話,經蒸發的E L材料無 法充分地分散開來,使得難以在整個基質表面形成均句的 薄膜。維持此距離也使得裝置變大。 發明槪述 本發明是針對上述問題,且本發明的一個目標是提供 一種能夠以高產量形成具有高度均勻薄膜厚度分佈的薄膜 之膜形成設備。更進一步地,本發明的一個目標是提供一 本纸張尺度適用中國國家標準(CNS ) Α4規格(210Χ297公釐) 丨^_—*----裝----^---訂—----- (請先閲讀背面之注意事項再填寫本頁) - 5- 490714 A7 _______B7_ 五、發明説明(3) 種使用本發明的膜形成設備形成薄膜的方法。 (請先閲讀背面之注意事項再填寫本頁) 本發明使用一種蒸發來源,於其中一具有一縱方向( 一供蒸發的薄膜材料放置於其中的部分)的蒸發胞或複數 個蒸發胞被形成。藉由以一垂直於該蒸發來源的縱方向的 方向移動該蒸發來源,一薄膜被形成。注意道,”具有一縱 方向”代表一長且薄的長方形、一長且薄的橢圓形、或一線 形。因爲處理能·以單掃描進行,就本發明而言基質在縱方 向的長度較佳爲長於一邊的長度。特定言之,該長度可以 是3 0〇mm到120 0 mm (典型地是6〇0及8〇〇 m m之間)。 本發明的蒸發來源與基質之間的位置關係是顯示於圖 1 A到1 C。圖1 A是上視圖,圖1 B是圖1 A沿著線段 A — A ’的剖視圖,圖1 C是圖1 A沿著線段B — B 1勺剖視 圖。注意到圖1 A到1 C使用共用符號。 經濟部智慧財產局員工消費合作社印製 如圖1 A所示,蔭像光罩1 〇 2是被置放於基質 1 0 1之下,此外,複數個蒸發胞以直線排列於其中的一 長方形蒸發來源1 0 4被置放於該蔭像光罩1 〇 2之下。 注意到,於本說明書中,基質一詞包含一基質以及被形成’ 於該基質上的薄膜。進一步地,基質表面一詞代表薄膜被 形成於其上的基質表面。 該蒸發來源1 0 4的縱方向的長度是長於基質1 〇 1 一邊的長度,且以箭頭所示方向(垂直於蒸發來源1 〇 4 的縱方向的方向)移動該蒸發來源1 〇 4的一機構被準備 了。然後藉由移動該蒸發來源1 〇 4,一薄膜能夠被形成 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) ' 490714 A7 ___B7 五、發明説明(4) (請先閲讀背面之注意事項再填寫本頁) 在該基質的整個表面。注意到,當該縱方向的長度是短於 基質一邊的長度時,薄膜可以藉由重複掃描數次而被形成 。尤有進者,藉由重複移動該蒸發來源1 0 4可能形成一 相同薄膜的積層。 由每一個蒸發胞1 0 3蒸發的薄膜材料是以向上的方 向散播,通過形成於蔭像光罩1 〇 2中的開口部分(圖中 未顯示),且累積於該基質1 〇 1之上。該薄膜藉此而被 選擇性地沉積於該基質1 0 1之上。散播自一蒸發胞 1 0 3的薄膜材料形成一薄膜於一區域中,散播自一鄰接 黑發胞1 0 3的薄膜材料形成一薄膜於另一區域中,該兩 區域有所重疊。藉由彼此重疊薄膜沉積於其中的區域,薄 膜被形成於一長方形的區域中。 因此,藉由使用具有排列有複數蒸發胞的蒸發來源, 及藉由輻射自一排而非如傳統般地輻射自一點,本發明可 以大大地改善薄膜的厚度的均勻性。除此之外,藉由將長 方形蒸發來源移動低於基質表面,薄膜形成可以在高產量 下被進行。 經濟部智慧財產局8工消費合作社印製 除此之外,本發明不需要使蒸發來源1 〇 4與蔭像光 罩1 0 2之間的距離較長,而且蒸發可以在極爲接近的狀 態進行。這是由於複數個蒸發胞是以對齊的方式被形成, 且即使薄膜的散播距離是短的,薄膜形成可以自基質的中 央部分至邊緣部分同時地進行。隨著蒸發胞1 〇 3排列的 密度增高,此效應即增加。 自蒸發來源1 0 4到蔭像光罩1 〇 2的距離是沒有特 本紙張尺度適用中國國家標準( CNS ) A4規格(210X297公麓) 490714 A7 B7 五、發明説明(5) ιϋϋ· ^ϋϋ mil mu —La··- —.1 ϋιϋ 1^^^ i— ϋ-i (請先閲讀背面之注意事項再填寫本頁) 別地受到限制,因爲其視蒸發胞1 0 3被形成的密度而不 同。然而,如果距離太接近,將難以自中央部分至邊緣部 分形成一均勻的薄膜;而且如果距離太遠,其將與自一點 輻射的傳統蒸發沒有不同。因此,如果蒸發胞1 0 3之間 的間距是” a ”,較佳爲將蒸發來源1 0 4與蔭像光罩1 0 2 之間的距離設爲2 a到1〇〇 a (更佳爲5 a到5 0 a ) 〇 以如上述本發明結構的薄膜形成設備,藉由使用該蒸 發來源以及在該區上移動該蒸發來源,長方形、橢圓形、 或線形區中均勻薄膜厚度的分佈得以受到維持,因而有可 能在基質的整個表面上形成具有高均勻度的薄膜。尤有進 者,蒸發不是自一點上進行,因此蒸發來源與基質之間的 距離能夠被製得短一些,而且薄膜厚度的均勻度得以受到 進一步提高。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus or method for forming a thin film for manufacturing an EL (Electro Luminescence) element. The element [E element has a cathode, an anode, and sandwiched between the cathode and the anode. A structure composed of a light emitting material, which is an organic material (hereinafter referred to as an organic EL material) that emits light by itself, and e ^ (electroluminescence) is obtained from the material. 2 · Description of related technologies There are two types of EL display devices: passive type (simple matrix type) and active type (active matrix type). Both types are actively investigated. In particular, the active matrix type EL display device is the focus of attention in the current industry. In particular, organic materials and inorganic materials can be used as EL materials, which become the light emitting layer of EL elements. In addition, organic materials are divided into low molecular weight (monomer) organic EL materials and high molecular weight ( Polymer) Organic EL materials. Both have been actively investigated, but films of low molecular weight organic EL materials are mainly formed by evaporation, and films of high molecular weight organic EL materials are mainly formed by coating. In order to manufacture a color EL display device, it is necessary to form a thin film of EL material that emits a different color for each pixel. However, in general, eL materials are weak with respect to water and oxygen, and cannot be patterned by lithographic etching. Therefore, it is necessary to form a pattern while forming a thin film. The most common method is to form a thin metal plate or glass plate between the substrate on which the thin film is formed and the evaporation source, and in which a paper size applicable national national standard (CNS) A4 specification (210X 297) is formed. Public envy) (Please read the notes on the back before filling this page) C. Order printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs -4- 490714 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economy A7 B7 2) A method of opening a photomask. In this example, the evaporated EL material from the evaporation source passes through only the opening portion, thereby selectively forming a thin film, and thus it is possible to form a thin film in which thin film formation and patterning are performed simultaneously. With a conventional evaporation device, EL material from an evaporation source flies away in the shape of radiation and accumulates on a substrate to form a thin film. Therefore, considering the distance covered by the EL material, a way to place the substrate is designed. . For example, a method comprising fixing the substrate to a conical substrate holder so that the distances from the evaporation source to the substrate are equal is implemented. However, when a multiple beveled method for manufacturing a plurality of plates on a large substrate is used, if the above method is implemented, the substrate holder becomes excessively large, and this causes the body of the film forming apparatus to become too large. Furthermore, when using a single wafer process, the substrate is flat, so the distance from the evaporation source in the surface of the substrate is unequal. One problem with this phenomenon is that it is difficult to deposit a uniform film thickness. In addition, when a large substrate is used, if the distance between the evaporation source and the shadow mask is not made larger, the evaporated EL material cannot be sufficiently dispersed, making it difficult to form a uniform surface across the substrate Sentence film. Maintaining this distance also makes the device larger. SUMMARY OF THE INVENTION The present invention is directed to the above problems, and an object of the present invention is to provide a film forming apparatus capable of forming a thin film having a highly uniform thin film thickness distribution at a high yield. Furthermore, an object of the present invention is to provide a paper size applicable to the Chinese National Standard (CNS) A4 specification (210 × 297 mm) 丨 ^ _— * ---- 装 ---- ^ --- Order— ----- (Please read the precautions on the back before filling this page)-5- 490714 A7 _______B7_ V. Description of the invention (3) A method for forming a thin film using the film forming apparatus of the present invention. (Please read the precautions on the back before filling this page) The present invention uses an evaporation source, in which one or more evaporation cells with a vertical direction (a portion where the thin film material for evaporation is placed) are formed . By moving the evaporation source in a direction perpendicular to the longitudinal direction of the evaporation source, a thin film is formed. Note that "having a longitudinal direction" represents a long and thin rectangle, a long and thin ellipse, or a linear shape. Since the processing can be performed in a single scan, the length of the substrate in the longitudinal direction is preferably longer than one side in the present invention. In particular, the length may be 300 mm to 120,000 mm (typically between 600 and 800 mm). The positional relationship between the evaporation source and the substrate of the present invention is shown in Figs. 1A to 1C. Fig. 1A is a top view, Fig. 1B is a cross-sectional view of Fig. 1A along the line segment A-A ', and Fig. 1C is a cross-sectional view of Fig. 1A along the line segment B-B1. Note that Figures 1 A to 1 C use common symbols. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs, as shown in Figure 1A, the shadow image mask 102 is placed under the substrate 101, and a plurality of evaporating cells are arranged in a rectangle in a straight line. The evaporation source 104 is placed under the shadow image mask 102. It is noted that in this specification, the term substrate includes a substrate and a thin film formed on the substrate. Further, the term substrate surface represents the surface of the substrate on which the film is formed. The length of the evaporation source 104 is longer than the length of one side of the substrate 100, and one of the evaporation sources 104 is moved in the direction shown by the arrow (a direction perpendicular to the longitudinal direction of the evaporation source 104). The agency was prepared. Then by moving the evaporation source 104, a thin film can be formed. The paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X 297 mm) '490714 A7 ___B7 V. Description of the invention (4) (Please read the back first (Please fill in this page again) on the entire surface of the substrate. Note that when the length in the longitudinal direction is shorter than the length of one side of the substrate, the thin film can be formed by repeating the scanning several times. In particular, it is possible to form a laminate of the same thin film by repeatedly moving the evaporation source 104. The thin film material evaporated by each evaporation cell 103 is spread in an upward direction, passes through an opening portion (not shown in the figure) formed in the shadow image mask 102, and accumulates on the substrate 101. . The thin film is thereby selectively deposited on the substrate 101. The thin film material spread from a vapor cell 103 forms a thin film in a region, and the thin film material spread from an adjacent black cell 103 forms a thin film in another region, and the two regions overlap. The thin film is formed in a rectangular area by overlapping the area in which the thin film is deposited on each other. Therefore, the present invention can greatly improve the uniformity of the thickness of the film by using an evaporation source having a plurality of evaporating cells arranged, and by radiating from a row rather than a point as conventionally. In addition, by moving the rectangular evaporation source below the surface of the substrate, film formation can be performed at high yields. Printed by the Industrial Property Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. In addition, the present invention does not require a longer distance between the evaporation source 104 and the shadow image mask 102, and evaporation can be performed in a very close state. . This is because a plurality of evaporation cells are formed in an aligned manner, and even if the spreading distance of the film is short, the film formation can be performed simultaneously from the central portion to the edge portion of the substrate. This effect increases as the density of the evaporating cells 103 increases. The distance from the evaporation source 104 to the shadow image mask 102 is no special paper. The Chinese paper standard (CNS) A4 specification (210X297 male foot) 490714 A7 B7 is used. 5. Description of the invention (5) ιϋϋ · ^ ϋϋ mil mu —La ··-—.1 ϋιϋ 1 ^^^ i— ϋ-i (Please read the precautions on the back before filling this page) It is restricted in other places because of its density of apparent evaporation cells 1 0 3 But different. However, if the distance is too close, it will be difficult to form a uniform film from the central portion to the edge portion; and if the distance is too far, it will be no different from the traditional evaporation from a point of radiation. Therefore, if the distance between the evaporation cells 103 is "a", it is preferable to set the distance between the evaporation source 104 and the shadow image mask 102 to 2a to 100a (more preferably 5 a to 50 a) With the thin film forming apparatus of the present invention structured as described above, by using the evaporation source and moving the evaporation source over the area, a uniform film thickness distribution in a rectangular, oval, or linear area Being maintained, it is possible to form a thin film having high uniformity over the entire surface of the substrate. In particular, evaporation does not occur from one point, so the distance between the evaporation source and the substrate can be made shorter, and the uniformity of the film thickness can be further improved.

LP 經濟部智慧財產局員工消費合作社印製 更進一步地,在本發明的膜形成設備中的一室內增加 電漿產生裝置是有效的。藉由實施一依照氧氣的電漿程序 或依照含氯氣體的電漿程序,沉積在室壁上的薄膜得以被 移除,而室內部的淸潔得以被進行。平行板電極可能在室 內形成,且電漿可能在板間被產生以當作產生該電漿的裝 置。 圖示槪述 於附圖中: 圖1 A到1 C是顯示一蒸發來源的結構的圖示; 本紙張尺度適用中國國家標準(CNS ) A4規格(21〇>< 297公釐) -8- 490714 A7 B7 五、發明説明(6) 圖2 A及2 B是顯示一蒸發室的結構的圖示; 圖3是顯示一蒸發室的結構的圖示; 圖4是顯示一膜形成設備的結構的圖示; 圖5是顯示一膜形成設備的結構的圖示; 圖6是顯示一膜形成設備的結構的圖示; 圖7是顯示一膜形成設備的結構的圖示; 圖8是顯示一膜形成設備的結構的圖示。 主要元件對照表 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慈財產局員工消費合作社印製 1 〇 1 基 質 1 〇 2 蔭 像 光 罩 1 〇 3 蒸 發 胞 1 〇 4 蒸 發 來 源 2 〇 1 室 2 〇 2 基 質 輸 送 器 開口 2 〇 3 基 質 2 〇 4 基 質 固 持件 2 〇 5 a 輸 送 器 軌 道 2 〇 5 b 冃丨j 頭 2 0 6 薄 膜 形成 部 分 2 〇 了 光 罩 固 持 件 2 〇 8 蔭 像 光 罩 2 〇 9 開 □ 部 分 210 電磁鐵 本紙張尺度適用中國國家標準(CNS ) A4規格(21〇Χ 297公釐) -9- 490714 A7 B7 五、發明説明(7) 211 蒸發胞 (請先閲讀背面之注意事項再填寫本頁) 212 蒸發來源 2 13 箭頭 3〇1 突起 4 0 1 突起 500a 閘門. 500b 閘門 500c 閘門 5〇〇d 閘門 5 0 0 e 閘門 5 0 1 輸送器室 502 輸送器機制 5 0 3 基質 504 裝載室 505 處理室 506 蒸發室 508 準備室 經濟部智慧財產局員工消費合作社印製 509 蒸發室 510 薄膜形成部分 511 密合室 512 紫外光輻射機制 513 輸送室 514 輸送器機制 600a 閘門 本纸張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) -10 - 490714 A7 B7 五、發明説明(8) 6 〇 〇 b 閘 門 6 〇 〇 C 閘 門 6 〇 0 d 閘 門 6 〇 〇 e 閘 門 6 〇 1 輸 送 器 室 6 〇 2 輸 送 器 機 制 6 〇 3 基 質 6 〇 4 裝 載 室 6 〇 5 預 處 理 室 6 〇 6 蒸 發 室 6 〇 7 薄 膜 形成 部 分 6 〇 8 蒸 發 室 6 〇 9 薄 膜 形 成 部 分 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 -11 - 490714 A7 B7 五、發明説明(9) 72 渦輪分子幫浦 7 3 閥 (請先閲讀背面之注意事項再填寫本頁) 7 4 旋轉幫浦 702 預處理室 7 0 0 b 排出系統 7 0 3 蒸發室 700c 排出系統 7 0 6 蒸發室 7 0 7 蒸發室 7 0 8 蒸發室 7〇9 蒸發室 710 密合室 711 卸載室 8〇1 裝載室 8〇0 a 排出系統 8 1 閥 8 2 渦輪分子幫浦 經濟部智慧財產局員工消費合作社印製 8 3 閥 84 旋轉幫浦 802 預處理室 8〇0 b 排出系統 803 蒸發室 800c 排出系統 806 儲備室 本纸張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) -12 - 490714 A7 B7 五、發明説明(1() 807 密合室 808 卸載室 (請先閱讀背面之注意事項再填寫本頁) 較佳實施例的詳細描述 實施例模式 圖2 A及2 B顯示製備於本發明的膜形成設備中的蒸 發室的結構。圖2 A是蒸發室的上視圖,且圖2 B是剖視 圖。注意到通用的部分使用通用的符號。此外,形成當作 薄膜的E L (電致發光)薄膜的一個實施例被顯示於實施 例模式中。 於圖2A中,參考數字201代表一室,而參考數字 2 0 2代表一基質輸送器開口,基質被從該開口輸送到室 2 0 1的內部。經輸送的基質2 〇 3被設定在基質固持件 2 0 4中,而且藉由輸送器軌道2 0 5 a被輸送到薄膜形 成部分2 0 6中,如箭頭2 0 5b所示。 經濟部智慧財產局員工消費合作社印製 當基質2 0 3被輸送到薄膜形成部分2 0 6時,被固 定到光罩固持件2 0 7的蔭像光罩2 〇 8接近基質2 〇 3 。注意到,於本實施例模式中一金屬板被用作爲蔭像光罩 2 0 8的材料。(見圖2 B )此外,於本實施例模式中在 蔭像光罩2 〇 8中的開口部分2 〇 9是被形成具有長方形 、橢圓形、或線形。當然,該些開口部分的形狀是不受限 制的,而且矩陣形或網狀形也可能被形成。 於本實施例模式中之此處,這是一個結構於其中一電 石放鐵2 1 0接近基質2 0 3,如圖2 B所示。當電磁鐵 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) "" -- -13- 490714 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明説明(11) 2 1 0形成一磁場時,蔭像光罩2 0 8被帶到基質2〇3 ,而且被維持在一預定的間距。此間距是藉由形成於蔭像 光罩208中的複數突起301而被固定,如圖3所示。 當基質2 0 3是超過3 0 0mm的大型基質時,此類 型的結構是特別有效的。如果基質2 0 3是大尺寸時,則 歪曲(彎曲)是由於基質本身的重量所引起。然而,基質 2 0 3也能夠被拉向電磁鐵2 1 0,而且只要蔭像光罩 2 0 8是被電磁鐵2 1 0拉向基質2 0 3側則彎曲可以被 抵消。注意到,如圖4所示,較佳爲在電磁鐵2 1 0中形 成突起4 0 1,而且保持基質2 0 3與電磁鐵2 1 0之間 的間距。 當基質2 0 3與蔭像光罩2 0 8之間的間距被固定時 ,其上形成具有縱方向的蒸發胞2 1 1的一蒸發來源 2 1 2即被以箭頭2 1 3的方向移動.+。藉由被移動時受到 加熱,形成在蒸發胞內部中的E L材料受到蒸發,而且被 散佈在薄膜形成部分2 0 6的室中。注意到於本發明的例 子中,蒸發來源2 1 2與基質2 0 3之間的距離可以被維 持在十分的短,因而E L材料對於室內的驅動部分(驅動 蒸發來源、基質固持件或光罩固持件的部分)的吸附能夠 被最小化。 蒸發來源2 1 2被自基質2 0 3的一端掃描至其另一 端。如圖2 A所示,於本發明的例子中,蒸發來源2 1 2 的縱方向的長度是足夠長,因而其能夠藉由一次掃描而被 移動經過基質2 0 3的整個表面。 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) I.— K--------^裝----„---訂------ (請先閲讀背面之注意事項再填寫本頁) -14- 490714 A7 B7 五、發明説明(1匀 在一薄膜如上述般形成自一紅、綠或藍色E L材料( 於此處是紅色)之後,電磁鐵2 1 0的磁場被關掉,光胃 固持件2 0 7被放下,且基質2 0 3與蔭像光罩2 〇 82 間的距離增加。接著基質固持件2 0 4被移動一個像_ @ 分,光罩固持件207被再次提高,且蔭像光罩208¾ 基質2 0 3被移動互相接近。此外,電磁鐵2 1 0形成^ 磁場,且蔭像光罩2 0 8及基質2 0 3的歪曲.(彎曲)令皮 免除了。接著蒸發胞受到改變,且紅、綠或藍色E L材料 (於此處是綠色)的薄膜形成被進行。 注意到,此處顯示基質固持件2 0 4被移動一個像素 部分的結構,但是光罩固持件2 0 4也能夠被移動一個像 素部分。 在以此類型重複形成所有紅、綠及藍色E L材料的薄 膜之後,基質2 0 3最後被移動至基質輸送器開口 2 0 2 ,且被一機械臂(未顯示於圖中)移離室2 0 1。因而使 用本發明完成E L薄膜的薄膜形成。 實施例1 使用圖5本發明的一種膜形成設備受到解釋。於圖5 中,參考數字5 0 1代表一輸送器室。一輸送器機制 5〇2被製備於輸送器室5 0 1中,且基質5 0 3的運輸 被進行。輸送器室5 0 1具有一低壓環境,且藉由一閘門 被連接至每一處理室。當閘門被打開時,輸送器機制 5〇2將基質輸送至每一處理室。此外,有可能使用例如 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (請先閲讀背面之注意事項再填寫本頁} •裝·Printed by the Consumer Cooperative of the Intellectual Property Bureau of the LP Ministry of Economic Affairs Further, it is effective to add a plasma generating device to a room in the film forming equipment of the present invention. By performing a plasma procedure in accordance with oxygen or a plasma procedure in accordance with chlorine-containing gas, the film deposited on the wall of the chamber can be removed, and cleaning of the interior of the chamber can be performed. Parallel plate electrodes may be formed in the chamber, and a plasma may be generated between the plates as a means for generating the plasma. The diagram is described in the drawings: Figures 1 A to 1 C are diagrams showing the structure of an evaporation source; this paper size applies the Chinese National Standard (CNS) A4 specification (21〇 > < 297 mm)- 8- 490714 A7 B7 V. Description of the invention (6) Figures 2 A and 2 B are diagrams showing the structure of an evaporation chamber; Figure 3 is a diagram showing the structure of an evaporation chamber; Figure 4 is a film forming equipment FIG. 5 is a diagram showing the structure of a film forming apparatus; FIG. 6 is a diagram showing the structure of a film forming apparatus; FIG. 7 is a diagram showing the structure of a film forming apparatus; FIG. 8 It is a diagram showing the structure of a film forming apparatus. Comparison table of main components (please read the notes on the back before filling this page) Printed by the Consumer Cooperative of Intellectual Property Bureau of the Ministry of Economic Affairs 1 〇1 Substrate 1 〇2 Shadow image mask 1 〇3 Evaporation cell 1 〇4 Evaporation source 2 〇1 Chamber 2 〇2 Matrix conveyor opening 2 〇3 Matrix 2 〇4 Matrix holder 2 〇5 a Conveyor track 2 〇5 b 冃 丨 j Head 2 0 6 Film forming section 2 〇Photomask holder 2 〇 8 Shade image mask 2 〇9 open □ part 210 electromagnet This paper size applies to Chinese National Standard (CNS) A4 specification (21〇 × 297 mm) -9- 490714 A7 B7 V. Description of the invention (7) 211 Evaporation cell (Please read the precautions on the back before filling in this page) 212 Evaporation source 2 13 Arrow 3〇1 Protrusion 4 0 1 Protrusion 500a Gate. 500b Gate 500c Gate 500 ° Gate 5 0 0 e Gate 5 0 1 Conveyor room 502 Conveyor mechanism 5 0 3 Substrate 504 Loading chamber 505 Processing chamber 506 Evaporation chamber 508 Preparation room Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs Employee Cooperative 509 Evaporation chamber 51 0 Film forming part 511 Adhering chamber 512 UV radiation mechanism 513 Conveying chamber 514 Conveyor mechanism 600a Gate This paper size is applicable to China National Standard (CNS) A4 (210X 297 mm) -10-490714 A7 B7 V. Invention Explanation (8) 6 〇〇b gate 6 〇〇 C gate 6 〇 0 d gate 6 〇e gate 6 〇 1 conveyor chamber 6 〇 2 conveyor mechanism 6 〇 3 matrix 6 〇 4 loading chamber 6 〇 5 pretreatment Room 6 〇6 Evaporation chamber 6 〇7 Thin film forming part 6 〇8 Evaporation chamber 6 〇9 Thin film forming part (Please read the precautions on the back before filling this page) Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs and Consumer Cooperatives -11-490714 A7 B7 V. Description of the invention (9) 72 Turbo molecular pump 7 3 valve (please read the precautions on the back before filling this page) 7 4 Rotary pump 702 Pretreatment chamber 7 0 0 b Exhaust system 7 0 3 Evaporation chamber 700c Evacuation system 7 0 6 Evaporation chamber 7 0 7 Evaporation chamber 7 0 8 Evaporation chamber 7009 Evaporation chamber 710 Closet chamber 711 Unloading chamber 8〇1 Loading chamber 800a System 8 1 Valve 8 2 Turbomolecular Pump Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs Employee Consumption Cooperatives 8 3 Valve 84 Rotary Pump 802 Pretreatment Chamber 800 b Discharge System 803 Evaporation Chamber 800c Discharge System 806 Storage Room Paper Size Applicable to China National Standard (CNS) A4 specification (210X 297mm) -12-490714 A7 B7 V. Description of the invention (1 () 807 Closet room 808 Unloading room (Please read the precautions on the back before filling this page) DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiment Mode FIGS. 2A and 2B show the structure of an evaporation chamber prepared in a film forming apparatus of the present invention. Fig. 2A is a top view of the evaporation chamber, and Fig. 2B is a sectional view. Note that common parts use common symbols. Further, an example of forming an EL (electroluminescence) film as a film is shown in the embodiment mode. In FIG. 2A, reference numeral 201 denotes a chamber, and reference numeral 202 denotes a substrate conveyer opening from which the substrate is transported to the inside of the chamber 201. The transported substrate 2 03 is set in the substrate holder 2 0 4 and is transported into the film forming portion 2 6 by the conveyor rail 2 5 a as shown by the arrow 2 5b. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. When the substrate 203 is transported to the film forming portion 206, the shadow image mask 208 fixed to the mask holder 207 is close to the substrate 203. Note that, in this embodiment mode, a metal plate is used as a material of the shadow image mask 208. (See FIG. 2B) In addition, the opening portion 209 in the shadow image mask 208 in this embodiment mode is formed to have a rectangular shape, an oval shape, or a linear shape. Of course, the shape of the openings is not limited, and a matrix shape or a net shape may be formed. Here in this embodiment mode, this is a structure in which a calcium carbide 2 1 0 is placed close to the substrate 2 3, as shown in FIG. 2B. When the paper size of the electromagnet is in accordance with Chinese National Standard (CNS) A4 (210X297 mm) " " When a magnetic field is formed at 10, the shadow image mask 208 is brought to the substrate 203 and is maintained at a predetermined distance. This pitch is fixed by a plurality of protrusions 301 formed in the shadow image mask 208, as shown in FIG. This type of structure is particularly effective when the substrate 203 is a large substrate exceeding 300 mm. If the substrate 203 is of a large size, the distortion (bending) is caused by the weight of the substrate itself. However, the substrate 2 03 can also be pulled toward the electromagnet 2 10, and as long as the shadow image mask 2 8 is pulled by the electromagnet 2 1 0 toward the substrate 2 3 side, the bending can be offset. Note that, as shown in FIG. 4, it is preferable to form the protrusion 4 01 in the electromagnet 2 10, and to maintain the distance between the substrate 2 03 and the electromagnet 2 10. When the distance between the substrate 2 3 and the shadow image mask 2 8 is fixed, an evaporation source 2 1 2 having a vertical evaporation cell 2 1 1 formed thereon is moved in the direction of the arrow 2 1 3 . +. By being heated while being moved, the EL material formed in the interior of the evaporation cell is evaporated, and is dispersed in the chamber of the film forming portion 206. Note that in the example of the present invention, the distance between the evaporation source 2 1 2 and the substrate 2 0 3 can be kept very short, so the driving part of the EL material for the indoor driving part (driving evaporation source, substrate holder or photomask) Adsorption of part of the holder can be minimized. The evaporation source 2 1 2 is scanned from one end of the substrate 2 03 to the other end. As shown in FIG. 2A, in the example of the present invention, the length of the evaporation source 2 1 2 in the longitudinal direction is sufficiently long, so that it can be moved across the entire surface of the substrate 2 0 by one scan. The size of this paper is applicable to China National Standard (CNS) A4 (210X 297 mm) I.— K -------- ^ Installation ---- „--- Order ------ (please first Read the notes on the back and fill in this page) -14- 490714 A7 B7 V. Description of the invention (1 uniformly formed in a thin film as described above from a red, green or blue EL material (here red), electromagnetic The magnetic field of iron 2 10 is turned off, the photogastric holder 2 07 is lowered, and the distance between the substrate 2 03 and the shadow image mask 2 082 is increased. Then the substrate holder 2 0 4 is moved by an image_ @ 分, the mask holding member 207 is raised again, and the shadow image mask 208¾ and the substrate 2 0 3 are moved close to each other. In addition, the electromagnet 2 1 0 forms a magnetic field, and the shadow image mask 2 0 8 and the substrate 2 0 Distortion of 3 (bending) eliminates the skin. Then the evaporation cells are altered and thin film formation of red, green or blue EL material (green here) is performed. Note that the matrix holder 2 is shown here 0 4 is moved by one pixel portion, but the mask holder 2 0 4 can also be moved by one pixel portion. In this type, all red and green colors are repeatedly formed. After the blue EL material film, the substrate 2 03 is finally moved to the substrate conveyor opening 2 2, and is removed from the chamber 2 1 by a robotic arm (not shown in the figure). Therefore, the EL is completed using the present invention Film formation of a thin film. Example 1 A film forming apparatus of the present invention is explained using FIG. 5. In FIG. 5, reference numeral 50 1 represents a conveyor chamber. A conveyor mechanism 502 is prepared in the conveyor chamber. 5 0 1 and transportation of the substrate 5 0 3 is carried out. The conveyor chamber 5 0 1 has a low-pressure environment and is connected to each processing chamber by a gate. When the gate is opened, the conveyor mechanism 5 0 2Transfer the substrate to each processing chamber. In addition, it is possible to use, for example, this paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) (Please read the precautions on the back before filling this page}

、1T 經濟部智慧財產局員工消費合作社印製 -15- 490714 A7 B7 五、發明説明( 是油封旋轉幫浦、機械式增壓幫浦、渦輪分子幫浦、及低 溫幫浦的排出幫浦來降低輸送器室5 0 1的壓力,但是有 效於移除水分的低溫幫浦是較佳的。 (請先閲讀背面之注意事項再填寫本頁) 有關於每一處理室的解釋被敘述如下。注意到輸送器 室5 0 1具有一低壓環境,因而一排出幫浦(未顯示於圖 中)被安裝於每一處理室中以直接地被連接到輸送器室 5 0 1。上述的油封旋轉幫浦、機械式增壓幫浦、渦輪分 子幫浦、及低溫幫浦是被用來當作排出幫浦。 首先,爹考數字5 0 4代表一進行基質安裝的裝載室 ,且它也是一卸載室。裝載室5 0 4是藉由一閘門 5 0 0 a而被連接到輸送器室5 0 1,且其上放置基質 5〇3的一托架(未顯示於圖中)被安裝於此處。注意到 裝載室5 0 4也可能被分離成一基質裝載室及一基質卸載 室。此外,上述排出幫浦及供用於導入高純度氮氣或惰性 氣體的沖洗管線被安裝以供裝載室5 0 4。 經濟部智慈財產局8工消費合作社印製 注意到,其上進行形成成爲E L元件的陰極的透明導 電性溥膜的製程之基質是被用來當作實施例1中的基質 5 0 3。基質5 0 3被安裝於托架中,其上形成薄膜的基 質表面朝下。這是爲了當藉由蒸發以雷射進行薄膜形成時 ,使面朝下的方法(亦被稱爲沉積朝上的方法)較易進行 。該面朝下的方法代表一種方法,於其中薄膜將形成於其 •上的基質表面朝下,且藉由此方法,廢物(灰麈)或其類 似物的附著能夠被抑制。 接著,參考數字5 0 5代表一用於處理E L元件的陰 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公楚) -16- 490714 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明説明(Μ) 極或陽極(於實施例1中,陰極)的表面的處理室,且處 理室5 0 5是藉由閘門5 0 0 b而被連接到輸送器室 5 〇 1。該處理室能夠視E L元件的製程而受到各種不同 的改變,於實施例1中製造自透明導電性薄膜的陰極的表 面之熱處理可以在氧氣中在1 〇 〇及1 2 0°C之間進行同 時輻射紫外線光。當處理E L元件的陰極表面時,此類型 的前處理是有效的。 接著,參考數字5 0 6代表一用於藉著蒸發進行有機 E L材料的薄膜沉積的蒸發室,且被稱爲蒸發室(a )。 蒸發室(A ) 5 0 6是經由閘門5 0 0 c被連接到輸送器 室5 0 1。於實施例1中,具有顯示於圖2 A及2 B的結 構的蒸發室被用來當作蒸發室(A) 5 0 6。 於蒸發室(A ) 5 0 6的薄膜形成部分5 0 7·中,首 先一孔注射層被沉積在整個基質表面上,然後用於發射紅 色光的一光發射層被形成,且最後用於發射藍色光的一光 發射層被形成。注意到任何已知的材料能夠被用來當作孔 注射層、紅色光發射層、綠色光發射層、及藍色光發射層 0 蒸發室(A ) 5 0 6具有一種能夠依照薄膜形成蒸發 來源的有機材料的類型而切換的結構。即,用於儲存複數 類型的蒸發來源的準備室5 0 8被連接到蒸發室(A ) 5〇6,且蒸發來源切換是以一內部輸送器機制來進行。 因此當用於薄膜形成的有機E L材料改變時,蒸發來源即 改變。此外,每當用於薄膜形成的有機E L材料被切換時 本紙張尺度適用中國國家標準(CNS ) A4規格(210 X 297公釐) I - „ 批衣 „ 訂 . (請先閱讀背面之注意事項再填寫本頁) -17 - 490714 A7 B7 五、發明説明(15) ,蔭像光罩的同樣光罩即移動一個像素部分。 注意到有關於在蒸發室(A ) 5 〇 6內部發生的薄膜 形成程序,可以參照圖2 A及2. B。 (請先閱讀背面之注意事項再填寫本頁) 其次,參考數字509代表一用於藉著蒸發進行成爲 E L元件的陰極或陽極的電導性薄膜(一種成爲陽極的金 屬薄膜被使用於實施例1 )的薄膜形成的蒸發室,且被稱 爲蒸發室(B )。蒸發室(B ) 5 0 9是經由閘門 5 0 〇 d被連接到輸送器室5 〇 1。於實施例1中,具有 顯示於圖2 A及2 B的結構的蒸發室被用來當作蒸發室( B ) 5 0 9。於蒸發室(B ) 5 0 9內的薄膜形成部分 5 1 0中,一 A 1 - L i合金薄膜(鋁及鋰的合金)被沉 積當作電導性薄膜,其成爲E L元件陽極。 注葸到有可能共蒸發一種週期表中族1或族2裡的元 素以及鋁。共蒸發代表胞受到同時加熱且不同材料在薄膜 形成的階段被結合在一起的蒸發。 經濟部智慧財產局員工消費合作社印製 接著,參考數字5 1 1代表一密合室(亦被稱爲密閉 室或球盒),且其經由閘門5 0 0 e被連接到裝載室 5〇4。一種E L元件的最後氣密密合的程序在密合室 5 1 1中被貫施。此程序是一種使經形成的E L元件受到 保護而免於接觸氧及濕氣,且其使用以密封材料機械式密 合的裝置、或以熱硬化樹脂或紫外光硬化樹脂密合的裝置 〇 一種供用於輻射紫外光的機制(以下稱爲紫外光輻射 機制)5 1 2被形成在密合室5 1 1的內部中,且圖5所 本紙張尺度適用中國國家標準(CNS ) A4規格(210>< 297公釐1 ~~' -18- 490714 A7 B7 五、發明説明(16) (請先閱讀背面之注意事項再填寫本頁) 示的膜形成設備具有一種結構,於其中一紫外光硬化性樹 脂被發射自紫外光輻射機制5 1 2的紫外光所硬化。此外 ,有可能藉由附接一排出幫浦而降低密合室5 1 1的內部 之壓力。當藉由使用機器人操作而機械地進行上述密合程 序時,藉由在降低的壓力下進行該些程序,氧氣及水分能 夠被避免混入。更進一步地,也是有可能加壓密合室 5 1 1的內部。於此例子中加壓是在排氣的同時以高純度 的氮氣或惰性氣體加壓,且來自大氣例如氧氣的污染物的 倂入得以被避免。 接著,輸送室(流通盒)5 1 3被連接到密合室 5 1 1。輸送器機制(B ) 5 1 4被形成於輸送室5 1 3 中,且於其上E L元件已經在密合室5 1 1中被完全密封 .的基質被輸送至輸送室5 1 3。也有可能藉由附接一排出 幫浦而降低輸送室5 1 3之壓力。輸送室5 1 3是裝備被 用來使密合室511是不會直接地暴露至大氣,且基質是 移離自此處。 經濟部智慧財產局員工消費合作社印製 因爲處理能夠在點上完成,於該處E L元件被完全密 封於一不透氣的空間中,所以有可能使用圖5所示的膜形 成設備製造具有高可靠度的E L顯示裝置。 實施例2 使用圖6本發明的一種膜形成設備使用於一多室方法 (亦稱爲簇工具方法)中的例子受到解釋。於圖6中,參 考數字6 0 1代表一輸送器室。一輸送器機制(A ) 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) -19- 490714 A7 B7__ 五、發明説明(17) (請先閱讀背面之注意事項再填寫本育) 6 0 2被製備於輸送器室6 0 1中,且基質6 0 3的運輸 被進行。輸送器室6 0 1具有一受到降低的壓力環境,且 經由閘門被連接到每一處理室。當該些閘門被打開時,藉 由輸送器機制(A ) 6 0 2基質被輸送到每一處理室。此 外,有可能使用例如是油封旋轉幫浦、機械式增壓幫浦、 渦輪分子幫浦、及低溫幫浦的排出幫浦來降低輸送器室 6 0 1的壓力,但是有效於移除水分的低溫幫浦是較佳的 〇 有關於每一處理室的解釋被敘述如下。注意到輸送器 室6 0 1具有一低壓環境,因而一排出幫浦(未顯示於圖 中)被安裝於每一處理室中以直接地被連接到輸送器室 6 0 1。上述的油封旋轉幫浦、機械式增壓幫浦、渦輪分 子幫浦、及低溫幫浦是被用來當作排出幫浦。 經濟部智慧財產局員工消費合作社印紫 首先,參考數字6 0 4代表一進行基質安裝的裝載室 ,且它也是一卸載室。裝載室6 0 4是藉由一閘門 6〇0 a而被連接到輸送器室6 0 1,且其上放置基質 6〇3的一托架(未顯示於圖中)被安裝於此處。注意到 裝載室6 0 4也可能被分離成一基質裝載室及一基質卸載 室。此外,上述排出幫浦及供用於導入高純度氮氣或惰性 氣體的沖洗管線被安裝以供裝載室6 0 4。 接著,參考數字605代表一用於處理EL元件的陰 極或陽極(於貫施例2中,陰極)的表面的預處理室,且 預處理室6 0 5是藉由閘門6 0 0 b而被連接到輸送器室 6〇1。該處理室能夠視E L元件的製程而受到各種不同 本纸張尺度適用中國國家標準(CNS ) A4規格(210X297公酱) "" ' ^ -20 - 490714 A7 B7 五、發明説明(is) (請先閱讀背面之注意事項再填寫本頁) 的改:變,於實施例2中製造自透明導電性薄膜的陰極的表 面之熱處理可以在氧氣中在1 〇 〇及1 2 〇。(:之間進行同 胃胃射紫外線光。當處理E L元件的陰極表面時,此類型 的則處理是有效的。 接著,參考數字6 0 6代表一用於藉著蒸發進行有機 ε L材料的薄膜沉積的蒸發室,.且被稱爲蒸發室(A )。 蒸發室(A ) 6 0 6是經由閘門6 0 0 c被連接到輸送器 室6 0 1。於實施例2中,具有顯示於圖2 a及2 B的結 構的蒸發室被用來當作蒸發室(A) 6 0 6。 於蒸發室(A ) 6 0 6的薄膜形成部分6 0 7中,首 先-?L注射層被沉積在整個基質表面上,然後用於發射紅 fe光的一光發射層被形成。因此,相對於該孔注射層及該 紅色光發射層的有機材料,每個蒸發來源及蔭像光罩皆被 提供有兩種類型的材料,且其被結構成能夠切換。注意到 已知的材料能夠被用來當作孔注射層、及紅色光發射層。 經濟部智慧財產局員工消費合作社印製 接著,參考數字608代表一用於藉著蒸發進行有機 EL材料的薄膜沉積的蒸發室,且被稱爲蒸發室(b)。 蒸發室(B ) 6 0 8是經由閘門6 0 0 d被連接到輸送器 室6 0 1。於實施例2中,具有顯示於圖2 A及2 B的結 構的蒸發室被用來當作蒸發室(B ) 6 0 8。於實施例2 中於蒸發室(B ) 6 0 8的薄膜形成部分6 0 9中,一用 於發射綠色光的光發射層被沉積。注意到已知的材料能夠 被用來於實施例2中當作用於發射綠色光的光發射層。 接著,參考數字610代表一用於藉著蒸發進行有機 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) -21 - 490714 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明説明(19) E L材料的薄膜沉積的蒸發室,且被稱爲蒸發室(c )。 蒸發室(C ) 6 1 0是經由閘門6 0 〇 e被連接到輸送器 室6 0 1。於實施例2中,具有顯示於圖2 A及2 B的結 構的蒸發室被用來當作蒸發室(C ) 6 1 0。於實施例2 中於蒸發室(C) 6 1 0的薄膜形成部分6 1 1中,一用 於發射藍色光的光發射層被沉積。注意到已知的材料能夠 被用來於實施例2中當作用於發射藍色光的光發射層。 其次,參考數字6 1 2代表一用於藉著蒸發進行成爲 E L元件的陰極或陽極的電導性薄膜(一種成爲陽極的金 屬薄膜被使用於實施例2 )的薄膜形成的蒸發室,且被稱 爲蒸發室(D )。蒸發室(D ) 6 1 2是經由閘門 6 0 0 f被連接到輸送器室6 0 1。於實施例2中,具有 顯示於圖2 A及2 B的結構的蒸發室被用來當作蒸發室( D ) 6 1 2。於蒸發室(D ) 6 1 2內的薄膜形成部分 6 1 3中,一 A 1 - L i合金薄膜(鋁及鋰的合金)被沉 積當作電導性薄膜,其成爲E L元件陽極。注意到有可能 共蒸發一種週期表中族1或族2裡的元素以及鋁。 接著,參考數字6 1 4代表一密合室,且其經由閘門 6 0 0 g被連接到裝載室6 0 4。密合室6 1 4的解釋請 參照實施例1。此外,類似於實施例1,一種紫外光輻射 機制6 1 2被形成在密合室6 1 4的內部中。此外,輸送 室6 1 6被連接到密合室6 1 5。輸送器機制(B) 6 1 7被形成於輸送室6 1 6中,且於其上E L元件已經 在密合室6 1 4中被完全密封的基質被輸送至輸送室 本纸張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) --------,----0^----r--1T------ (請先閲讀背面之注意事項再填寫本頁) -22- 490714 A7 B7 五、發明説明(20) 6 1 6。實施例1可能被參考以解釋輸送室6 1 6。 因爲處理能夠在點上完成,於該處E L元件被完全密 封於一不透氣的空間中,所以有可能使用圖6所示的膜形 成設備製造具有高可靠度的E L顯示裝置。 實施例3 使用圖7本發明的一種膜形成設備使用於一線內方法 中的例子受到解釋。於圖7中,參考數字7 0 1代表一裝 載室,且基質的運輸在此處被進行。裝載室701中裝備 有排出系統7 0 0 a,且該排出系統7 〇 〇 a具有一含 有第一閥7 1.、渦輪分子幫浦7 2、第二閥7 3、及旋轉 幫浦(油封旋轉幫浦)7 4的結構。 第一閥7 1是主閥,有一些例子中其亦與一傳·導閥結 合,也有一些例子中蝶形閥被使用。第二閥7 3是在前面 的閥,且第二閥7 3是首先被打開,且裝載室7 0 1是大 約被旋轉幫浦7 4減壓。第一閥7 1接著被打開,且壓力 被渦輪分子幫浦7 2降低直到達到高真空。注意到有可能 使用機械式增壓幫浦、或低溫幫浦來取代渦輪分子幫浦, 但是低溫幫浦是特別有效於移除水分。 接著,參考數字7 0 2代表一用於處理e L元件的陰 極或陽極(於實施例3中,陰極)的表面的預處理室,且 預處理室7 0 2是裝備有排出系統7 〇 〇 b。此外,其藉 由圖中未顯示的閘門氣密地與裝載室7 〇 1相分隔開來。 預處理室7 0 2能夠視E L元件的製程而受到各種不同的 本紙張尺度適用中國國家標準(CNS ) Α4規格(210Χ297公酱) (請先閱讀背面之注意事項再填寫本頁) -裝-Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs -15- 490714 A7 B7 V. Description of the invention Reduce the pressure in the conveyor chamber by 501, but a low-temperature pump that is effective in removing moisture is preferred. (Please read the precautions on the back before filling this page.) The explanations for each processing chamber are described below. Note that the conveyor chamber 501 has a low-pressure environment, so a discharge pump (not shown) is installed in each processing chamber to be directly connected to the conveyor chamber 501. The above-mentioned oil seal rotates Pumps, mechanical booster pumps, turbomolecular pumps, and cryogenic pumps are used as exhaust pumps. First of all, the number 504 represents a loading chamber for matrix installation, and it is also a Unloading chamber. Loading chamber 504 is connected to the conveyor chamber 501 by a gate 501a, and a bracket (not shown in the figure) on which the substrate 503 is placed is installed on Here, note that the loading chamber 5 0 4 may also be separated into a base Loading chamber and a substrate unloading chamber. In addition, the above-mentioned discharge pump and flushing line for introducing high-purity nitrogen or inert gas are installed for the loading chamber 504. Printed by the 8th Industrial Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs It is to be noted that the substrate on which the process of forming a transparent conductive ytterbium film that becomes the cathode of the EL element is performed is used as the substrate 503 in Example 1. The substrate 503 is installed in a bracket, which The surface of the substrate on which the thin film is formed faces downward. This is to make it easier to make the face-down method (also referred to as the deposition-up method) when the thin film is formed by laser by evaporation. The face-down The method represents a method in which the surface of the substrate on which the film is to be formed is facing downward, and by this method, the adhesion of waste (grey dust) or the like can be suppressed. Then, reference numeral 5 0 5 represents a The size of the negative paper used to process the EL element is applicable to the Chinese National Standard (CNS) A4 specification (210X297). -16- 490714 Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 5. Invention Description (M) The processing chamber on the surface of the electrode (cathode in Example 1), and the processing chamber 505 is connected to the conveyor chamber 501 by a gate 5 0 b. The processing chamber can be viewed according to the manufacturing process of the EL element However, subject to various changes, the heat treatment of the surface of the cathode fabricated from the transparent conductive film in Example 1 can simultaneously irradiate ultraviolet light between 100 and 120 ° C in oxygen. When the EL element is processed, This type of pretreatment is effective when the surface of the cathode is used. Next, reference numeral 506 represents an evaporation chamber for thin film deposition of organic EL materials by evaporation, and is called an evaporation chamber (a). The evaporation chamber (A) 5 0 6 is connected to the conveyor chamber 50 1 via a gate 5 0 0 c. In Example 1, an evaporation chamber having a structure shown in Figs. 2A and 2B was used as the evaporation chamber (A) 506. In the thin film forming portion 5 0 ·· of the evaporation chamber (A) 5 0 6, a hole injection layer is first deposited on the entire substrate surface, and then a light emitting layer for emitting red light is formed, and finally used for A light-emitting layer that emits blue light is formed. It is noted that any known material can be used as the hole injection layer, the red light emitting layer, the green light emitting layer, and the blue light emitting layer. 0 The evaporation chamber (A) 5 0 6 has an Structure that switches with the type of organic material. That is, the preparation chamber 508 for storing plural types of evaporation sources is connected to the evaporation chamber (A) 506, and the evaporation source switching is performed by an internal conveyor mechanism. Therefore, when the organic EL material used for film formation is changed, the evaporation source is changed. In addition, whenever the organic EL material used for film formation is switched, this paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) I-«Approved clothes» Order. (Please read the precautions on the back first (Fill in this page again) -17-490714 A7 B7 5. Description of the invention (15), the same mask as the shadow mask is moved by one pixel. It is noted that regarding the thin film formation procedure that occurs inside the evaporation chamber (A) 5 06, reference can be made to FIGS. 2A and 2B. (Please read the precautions on the back before filling in this page.) Second, reference numeral 509 denotes a conductive film (a metal film that becomes an anode is used in Example 1 to become a cathode or anode of an EL element by evaporation.) ), And is called an evaporation chamber (B). The evaporation chamber (B) 509 is connected to the conveyor chamber 501 via a gate 500 d. In Example 1, an evaporation chamber having a structure shown in FIGS. 2A and 2B is used as an evaporation chamber (B) 509. In the thin film forming portion 5 10 in the evaporation chamber (B) 509, an A 1-Li alloy thin film (aluminum and lithium alloy) is deposited as a conductive thin film, which becomes the anode of the EL element. Note that it is possible to co-evaporate elements from Group 1 or Group 2 of the Periodic Table and aluminum. Co-evaporation represents evaporation where the cells are heated simultaneously and different materials are bound together during the film formation stage. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Next, the reference number 5 1 1 represents a closet (also known as a closed room or a ball box), and it is connected to the loading room 504 via a gate 5 0 e. . A final airtight sealing procedure for EL elements is performed in the sealing chamber 5 1 1. This procedure is a device that protects the formed EL element from oxygen and moisture, and uses a device that is mechanically adhered with a sealing material, or a device that is adhered with a thermosetting resin or an ultraviolet light curing resin. A mechanism for radiating ultraviolet light (hereinafter referred to as the ultraviolet radiation mechanism) 5 1 2 is formed in the interior of the close chamber 5 1 1, and the paper size shown in Figure 5 applies the Chinese National Standard (CNS) A4 specification ( 210 > < 297 mm 1 ~~ '-18- 490714 A7 B7 V. Description of the invention (16) (Please read the precautions on the back before filling this page) The film forming equipment shown has a structure in which one of the UV The photocurable resin is hardened by the ultraviolet light emitted from the ultraviolet radiation mechanism 5 1 2. In addition, it is possible to reduce the pressure inside the close chamber 5 1 1 by attaching a discharge pump. When using a robot When the above-mentioned sealing procedures are performed mechanically, the oxygen and moisture can be prevented from being mixed by performing these procedures under reduced pressure. Furthermore, it is possible to pressurize the inside of the sealing chamber 5 1 1. Add in this example It is pressurized with high-purity nitrogen or inert gas while venting, and the intrusion of pollutants from the atmosphere such as oxygen is prevented. Next, the transfer chamber (flow box) 5 1 3 is connected to the close chamber 5 1 1. Conveyor mechanism (B) 5 1 4 is formed in the conveying chamber 5 1 3, and the EL element thereon has been completely sealed in the close chamber 5 1 1. The substrate is conveyed to the conveying chamber 5 1 3. It is also possible to reduce the pressure of the transfer chamber 5 1 3 by attaching a discharge pump. The transfer chamber 5 1 3 is equipped so that the closet chamber 511 is not directly exposed to the atmosphere and the substrate is moved. From here. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. Because the processing can be done at a point where the EL element is completely sealed in an air tight space, it is possible to use the film shown in Figure 5. The device manufactures an EL display device with high reliability. Example 2 Using FIG. 6 An example in which a film forming apparatus of the present invention is used in a multi-chamber method (also referred to as a cluster tool method) is explained. In FIG. 6, reference is made to The number 6 0 1 represents a conveyor room. One lose Feeder mechanism (A) This paper size applies Chinese National Standard (CNS) A4 specification (210X 297 mm) -19- 490714 A7 B7__ V. Description of the invention (17) (Please read the notes on the back before filling in this education) 6 0 2 is prepared in the conveyor chamber 6 0 1 and the transport of the substrate 6 0 3 is carried out. The conveyor chamber 6 0 1 has a reduced pressure environment and is connected to each processing chamber via a gate. When When the gates are opened, the substrate is transported to each processing chamber by a conveyor mechanism (A). In addition, it is possible to use, for example, oil-sealed rotary pumps, mechanical booster pumps, and turbo molecular pumps. And low-temperature pump discharge pump to reduce the pressure in the conveyor chamber 601, but low-temperature pump effective in removing moisture is better. An explanation of each processing chamber is described below. Note that the conveyor chamber 601 has a low-pressure environment, so an exhaust pump (not shown) is installed in each processing chamber to be directly connected to the conveyor chamber 601. The above-mentioned oil-sealed rotary pump, mechanical booster pump, turbo-molecular pump, and low-temperature pump are used as discharge pumps. First, the reference number 604 represents a loading room for substrate installation, and it is also an unloading room. The loading chamber 604 is connected to the conveyor chamber 601 by a gate 600 a, and a bracket (not shown) on which the substrate 603 is placed is installed here. Note that the loading chamber 604 may also be separated into a substrate loading chamber and a substrate unloading chamber. In addition, the above-mentioned discharge pump and a flushing line for introducing high-purity nitrogen or inert gas are installed for the loading chamber 604. Next, reference numeral 605 denotes a pre-treatment chamber for processing the surface of the cathode or anode (cathode in the second embodiment) of the EL element, and the pre-treatment chamber 6 0 5 is closed by a gate 6 0 0 b. Connected to the conveyor chamber 601. The processing room can be subjected to various different depending on the manufacturing process of the EL element. This paper size applies Chinese National Standard (CNS) A4 specification (210X297 male sauce) " " '^ -20-490714 A7 B7 V. Description of the invention (is) (Please read the precautions on the back before filling this page). Change: Change, the heat treatment on the surface of the cathode fabricated from the transparent conductive film in Example 2 can be performed in oxygen at 1000 and 12 °. (: UV light is emitted between the stomach and the stomach. This type of treatment is effective when the cathode surface of the EL element is treated. Next, reference numeral 6 0 6 represents an organic? L material for evaporation by evaporation. The evaporation chamber for thin film deposition is also referred to as the evaporation chamber (A). The evaporation chamber (A) 6 0 6 is connected to the conveyor chamber 6 0 1 via a gate 6 0 0 c. In Example 2, it has a display The evaporation chamber of the structure shown in Figs. 2a and 2B is used as the evaporation chamber (A) 6 0. In the thin film forming portion 6 0 7 of the evaporation chamber (A) 6 0, first-? L injection layer Is deposited on the entire surface of the substrate, and then a light emitting layer for emitting red light is formed. Therefore, with respect to the hole injection layer and the organic material of the red light emitting layer, each evaporation source and shadow image mask Both are provided with two types of materials and are structured to be switchable. Note that known materials can be used as the hole injection layer and the red light emitting layer. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs Next, reference numeral 608 denotes an organic EL material for evaporation by evaporation. The evaporation chamber for thin film deposition is called the evaporation chamber (b). The evaporation chamber (B) 6 0 8 is connected to the conveyor chamber 6 0 1 through a gate 60 0 d. In Example 2, there is a display The evaporation chamber of the structure shown in FIGS. 2A and 2B is used as the evaporation chamber (B) 6 0. In Example 2, the thin film forming portion 6 0 9 of the evaporation chamber (B) 6 0 8 A light-emitting layer for emitting green light is deposited. It is noted that a known material can be used as the light-emitting layer for emitting green light in Example 2. Next, reference numeral 610 denotes a layer for evaporation by evaporation. Organic paper size applies Chinese National Standard (CNS) A4 specification (210X 297 mm) -21-490714 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention (19) Evaporation of thin film deposition of EL materials And is referred to as an evaporation chamber (c). The evaporation chamber (C) 6 1 0 is connected to the conveyor chamber 6 0 1 through a gate 60 0e. In Example 2, there is shown in FIG. 2A and The evaporation chamber of the structure 2 B is used as the evaporation chamber (C) 6 1 0. In the second embodiment, the evaporation chamber (C) 6 In the thin film forming portion 6 10 of 10, a light emitting layer for emitting blue light is deposited. It is noted that a known material can be used as the light emitting layer for emitting blue light in Example 2. Next, reference numeral 6 1 2 represents an evaporation chamber formed by a thin film of a conductive thin film (a metal thin film serving as an anode is used in Example 2) which becomes a cathode or an anode of an EL element by evaporation, and is called Is the evaporation chamber (D). The evaporation chamber (D) 6 1 2 is connected to the conveyor chamber 6 0 1 via a gate 60 0 f. In Example 2, an evaporation chamber having a structure shown in Figs. 2A and 2B is used as an evaporation chamber (D) 6 1 2. In the thin film forming portion 6 1 3 in the evaporation chamber (D) 6 1 2, an A 1-Li alloy thin film (aluminum and lithium alloy) is deposited as a conductive thin film, which becomes the anode of the EL element. It is noted that it is possible to co-evaporate an element from group 1 or group 2 of the periodic table and aluminum. Next, reference numeral 6 1 4 represents a closet chamber, and it is connected to the loading chamber 6 0 4 through a gate 600 g. Please refer to Example 1 for explanation of the close chamber 6 1 4. Further, similar to Example 1, an ultraviolet light radiating mechanism 6 1 2 is formed in the inside of the close chamber 6 1 4. In addition, the transfer chamber 6 1 6 is connected to the close chamber 6 1 5. Conveyor mechanism (B) 6 1 7 is formed in the conveying chamber 6 1 6 and the substrate on which the EL element has been completely sealed in the closet chamber 6 1 4 is conveyed to the conveying chamber. This paper is suitable for China National Standard (CNS) A4 specification (210X297 mm) --------, ---- 0 ^ ---- r--1T ------ (Please read the precautions on the back first (Fill in this page) -22- 490714 A7 B7 V. Description of the invention (20) 6 1 6 Example 1 may be referenced to explain the transfer chamber 6 1 6. Since the processing can be completed at a point where the EL element is completely sealed in an air-impermeable space, it is possible to manufacture a highly reliable EL display device using the film forming apparatus shown in Fig. 6. Embodiment 3 An example in which a film forming apparatus of the present invention is used in a one-line method using Fig. 7 is explained. In Fig. 7, reference numeral 701 represents a loading chamber, and the transportation of the substrate is performed here. The loading chamber 701 is equipped with a discharge system 700a, and the discharge system 70a has a first valve 71, a turbo molecular pump 7, a second valve 73, and a rotary pump (oil seal Rotary pump) 7 4 structure. The first valve 71 is a main valve. In some cases, it is also combined with a pilot valve, and in some cases, a butterfly valve is used. The second valve 73 is a valve in front, and the second valve 73 is opened first, and the loading chamber 7 01 is approximately decompressed by the rotary pump 74. The first valve 7 1 is then opened and the pressure is reduced by the turbo molecular pump 7 2 until a high vacuum is reached. Note that it is possible to use turbocharged or cryogenic pumps instead of turbo molecular pumps, but cryogenic pumps are particularly effective at removing water. Next, reference numeral 7 02 represents a pre-treatment chamber for processing the surface of the cathode or anode (cathode in Example 3) of the EL element, and the pre-treatment chamber 7 0 2 is equipped with a discharge system 7 0. b. In addition, it is hermetically separated from the loading chamber 701 by a gate not shown in the figure. The pre-treatment chamber 7 0 2 can be subjected to various kinds depending on the manufacturing process of EL components. This paper size applies the Chinese National Standard (CNS) A4 specification (210 × 297 male sauce) (Please read the precautions on the back before filling this page)

、1T 經濟部智慧財產局員工消費合作社印製 -23- 490714 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明説明(21) 改變,於實施例3中製造自透明導電性薄膜的陰極的表面 之熱處理可以在氧氣中在1 〇 〇及1 2 〇°c之間進行同時 輻射紫外線光。 接著,參考數字7 0 3代表一用於藉著蒸發進行有機 EL材料的薄膜沉積的蒸發室,且被稱爲蒸發室(a)。 此外,其藉由圖中未顯示的閘門氣密地與裝載室7 〇 2相 分隔開來。蒸發室(A ) 7 〇 3是裝備有排出系統 7 0 0 c。於實施例3中,具有顯示於圖2 A及2 B的結 構的黑發室被用來當作蒸發室(A ) 7 〇 3。 被輸送至蒸發室(A) 7 0 3的基質7 0 4以及被裝 備於蒸發室(A ) 7 〇 3中的蒸發來源7 0 5被分別地以 箭頭所示的方向移動,且薄膜形成被進行。注意到有關於 蒸發室(A ) 7 0 3的詳細操作可能可以參考圖2 · a及 2 B。於實施例3中一孔注射層被沉積於蒸發室(a ) 7 0 3中。已知的材料能夠被用來當作孔注射層。 接著,參考數字7 0 6代表一用於藉著蒸發進行有機 E L·材料的薄膜沉積的蒸發室,且被稱爲蒸發室(b )。 蒸發室(B) 7 06是裝備有排出系統700d。此外, 其藉由圖中未顯示的閘門氣密地與排出室7 〇 3相分隔開 來。於實施例3中,具有顯示於圖2 A及2 B的結構的蒸 發室被用來當作蒸發室(B) 7 0 6。因此有關於蒸發室 (B ) 7 0 6的詳細操作可能可以參考圖2 A及2 B。此 外,一用於發射紅色光的光發射層被沉積於蒸發室(B ) 7 0 6中。已知的材料能夠被用來當作發射紅色光的光發 本紙張尺度適用中國國家標準(CNS ) A4規格(210父297公釐) I —·---.----裝----^---訂------ (請先閲讀背面之注意事項再填寫本頁) -24- 490714 A7 _____B7___ 五、發明説明(22) 射層。 (請先閱讀背面之注意事項再填寫本頁) 接著,參考數字7 0 7代表一用於藉著蒸發進行有機 E L材料的薄膜沉積的蒸發室,且被稱爲蒸發室(C )。 蒸發室(C) 707是裝備有排出系統700 e。此外, 其藉由圖中未顯示的閘門氣密地與排出室(B ) 7 0 6相 分隔開來。於實施例3中,具有顯示於圖2 A及2 B的結 構的蒸發室被用來當作蒸發室(C ) 7 0 7。因此有關於 蒸發室(C ) 7 0 7的詳細操作可能可以參考圖2 A及 2 B。此外,一用於發射綠色光的光發射層被沉積於蒸發 室(C ) 7 0 7中。已知的材料能夠被用來當作發射綠色 光的光發射層。 經濟部智慧財產局員工消費合作社印製 接著,參考數字7 0 8代表一用於藉著蒸發進行有機 E L·材料的薄膜沉積的蒸發室,且被稱爲蒸發室(· d )。 黑發室(D) 7 0 8是裝備有排出系統7 〇 〇 f。此外, 其藉由圖中未顯示的閘門氣密地與排出室(C ) 7 0 7相 分隔開來。於實施例3中,具有顯示於圖2 a及2 B的結 構的蒸發室被用來當作蒸發室(D ) 7 〇 8。因此有關於 黑發室(D ) 7 0 8的詳細操作可能可以參考圖2 a及 2 B。此外,一用於發射藍色光的光發射層被沉積於蒸發 室(D ) 7 0 8中。已知的材料能夠被用來當作發射藍色 光的光發射層。 其次,參考數字7 0 9代表一用於藉著蒸發進行成爲 E L元件的陰極或陽極的電導性薄膜(一種成爲陽極的金 屬薄膜被使用於實施例3 )的薄膜形成的蒸發室,且被稱Printed by 1T Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs -23- 490714 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention (21) Modified, the cathode made from transparent conductive film in Example The heat treatment of the surface can be performed in the oxygen at a temperature between 1000 and 120 ° C while radiating ultraviolet light. Next, reference numeral 7 0 denotes an evaporation chamber for thin film deposition of an organic EL material by evaporation, and is referred to as an evaporation chamber (a). In addition, it is hermetically separated from the loading chamber 702 by a gate not shown in the figure. The evaporation chamber (A) 7 03 is equipped with a discharge system 7 0 c. In Example 3, a dark-haired room having a structure shown in Figs. 2A and 2B was used as an evaporation room (A) 703. The substrate 7 0 4 transported to the evaporation chamber (A) 7 0 3 and the evaporation source 7 0 5 equipped in the evaporation chamber (A) 7 0 3 were respectively moved in the directions shown by the arrows, and the thin film formation was get on. It is noted that the detailed operation of the evaporation chamber (A) 7 0 3 may be referred to Fig. 2 · a and 2 B. In Example 3, a hole injection layer was deposited in the evaporation chamber (a) 703. Known materials can be used as the hole injection layer. Next, reference numeral 7 06 represents an evaporation chamber for thin film deposition of organic EL materials by evaporation, and is referred to as an evaporation chamber (b). The evaporation chamber (B) 7 06 is equipped with a discharge system 700d. In addition, it is hermetically separated from the discharge chamber 703 by a gate not shown in the figure. In Example 3, the evaporation chamber having the structure shown in Figs. 2A and 2B was used as the evaporation chamber (B) 7 0 6. Therefore, the detailed operation of the evaporation chamber (B) 7 0 6 may refer to FIGS. 2A and 2B. In addition, a light emitting layer for emitting red light is deposited in the evaporation chamber (B) 7 0 6. Known materials can be used as light emitting red light. The paper size applies the Chinese National Standard (CNS) A4 specification (210 father 297 mm). I — · ---.---- pack --- -^ --- Order ------ (Please read the precautions on the back before filling out this page) -24- 490714 A7 _____B7___ V. Description of the invention (22) Shooting layer. (Please read the notes on the back before filling this page.) Next, reference numeral 7 0 7 represents an evaporation chamber for thin film deposition of organic EL materials by evaporation, and is called an evaporation chamber (C). The evaporation chamber (C) 707 is equipped with a discharge system 700 e. In addition, it is hermetically separated from the discharge chamber (B) 7 0 6 by a gate not shown in the figure. In Example 3, the evaporation chamber having the structure shown in FIGS. 2A and 2B is used as the evaporation chamber (C) 7 0 7. Therefore, the detailed operation of the evaporation chamber (C) 7 0 7 may refer to Figs. 2A and 2B. In addition, a light emitting layer for emitting green light is deposited in the evaporation chamber (C) 7 0 7. Known materials can be used as light emitting layers that emit green light. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Next, reference numeral 7 0 denotes an evaporation chamber for thin film deposition of organic EL materials by evaporation, and is called an evaporation chamber (· d). The black hair room (D) 7 0 8 is equipped with an exhaust system 70 f. In addition, it is hermetically separated from the discharge chamber (C) 7 0 7 by a gate not shown in the figure. In Example 3, the evaporation chamber having the structure shown in Figs. 2a and 2B was used as the evaporation chamber (D) 708. Therefore, the detailed operation of the dark room (D) 7 0 8 may refer to Figs. 2a and 2B. In addition, a light emitting layer for emitting blue light is deposited in the evaporation chamber (D) 708. Known materials can be used as light emitting layers that emit blue light. Next, reference numeral 7 09 represents an evaporation chamber formed by a thin film of an electrically conductive thin film (a metal thin film that becomes an anode is used in Example 3) for becoming a cathode or an anode of an EL element by evaporation, and is called

-25- 490714 A7 B7 五、發明説明(Z3) 爲蒸發室(E )。蒸發室(e ) 7 0 9是裝備有排出系統 7〇〇 g。此外,其藉由圖中未顯不的閘門氣密地與排出 室(D ) 7 0 8相分隔開來。於實施例3中,具有顯示於 圖2A及2 B的結構的蒸發室被用來當作蒸發室(e ) 7 0 9。因此有關於蒸發室(D ) 7 0 8的詳細操作可能 可以參考圖2A及2B。 於蒸發室(E) 709中,一 Al— Li合金薄膜( 銘及鋰的合金)被沉積當作電導性薄膜,其成爲E L元件 陽極。注意到有可能共蒸發一種週期表中族1或族2裡的 元素以及鋁。 接著,參考數字7 1 0代表一密合室,且其被裝備有 排出系統7 0 0 h。此外,其藉由圖中未顯示的閘門氣密 地與排出室(E ) 7 0 9相分隔開來。密合室7 1 0的解 釋請參照實施例1。此外,類似於實施例1,一種紫外光 輻射機制被形成在密合室7 1 0的內部中。 最後,爹考數子711代表一卸載室,且其被裝備有 排出系統7 0 〇 i 。其上被形成有E L元件的基質被自此 處移離。 因爲處理能夠在點上完成,於該處E L元件被完全密 封於一不透氣的空間中而沒有暴露於大氣中,所以有可肯g 使用圖7所示的膜形成設備製造具有高可靠度的E l顯示 裝置。依照該線內方法,進一步地能夠以高產量製造E L 顯示裝置。 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 裝· 、11 經濟部智慧財產局員工消費合作社印製 -26- 490714 A7 ____B7_______ 五、發明説明(24) 實施例4 使用圖8本發明的一種膜形成設備使用於一線內方法 中的例子受到解釋。於圖8中,參考數字8 0 1代表一裝 載室,且基質的運輸在此處被進行。裝載室8 0 1中裝備 有~排出系統8 0 0 a,且該排出系統8 0 0 a具有一含 有第一閥8 1、渦輪分子幫浦8 2、第二閥8 3、及旋轉 幫浦(油封旋轉幫浦)8 4的結構。 接著,參考數字8 0 2代表一用於處理E L元件的陰 極或陽極(於實施例4中,陰極)的表面的預處理室,且 預處理室8 0 2是裝備有排出系統8 0 0 b。此外,其藉 由圖中未顯示的閘門氣密地與裝載室8 〇 1相分隔開來。‘ 預處理室8 0 2能夠視E L元件的製程而受到各種不同的 改變,於實施例4中製造自透明導電性薄膜的陰極的表面 之熱處理可以在氧氣中在1 0 0及1 2 0 °C之間進行同時 輻射紫外線光。 接著,參考數字8 0 3代表一用於藉著蒸發進行有機 EL材料的薄膜沉積的蒸發室,且蒸發室803是裝備有 排出系統8 0 0 c。於實施例4中,具有顯示於圖2 A及 2 B的結構的蒸發室被用來當作蒸發室8 0 3。被輸送至 蒸發室8 0 3的基質8 0 4以及被裝備於蒸發室8 0 3中 的蒸發來源8 0 5被分別地以箭頭所示的方向移動,且薄 膜形成被進行。 於實施例4中,較佳爲在蒸發室8 0 3中進行薄膜沉 積的時候切換蒸發來源8 0 3或蔭像光罩8 0 3 (未顯示 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (請先閎讀背面之注意事項再填寫本頁) 裝* -線 經濟部智慧財產局8工消費合作社印製 -27- 490714 經濟部智慈財產局員工消費合作社印製 A7 B7 五、發明説明(25) ),以形成電導性薄膜以當作孔注射層、紅色光發射層、 綠色光發射層、藍色光發射層或陽極。於實施例4中,蒸 發室8 0 3被連接到儲備室8 0 6,蒸發來源及蔭像%罩 被儲存於其中以供適當地切換。 接著,參考數字807代表一密合室,且其被裝備有 排出系統8 0 0 d。此外,其藉由圖中未顯示的閘門氣密 地與排出室8 0 3相分隔開來。密合室8 0 7的解釋請參 照實施例1。此外,類似於實施例1,一種紫外光輻射機 制(未顯示於圖中)被形成在密合室8 0 7的內部中。 最後,參考數字808代表一卸載室,且其被裝備有 排出系統8 0 0 e。其上被形成有E L元件的基質被自此 處移離。 因爲處理能夠在點上完成,於該處E L元件被完全密 封於一不透氣的空間中而沒有暴露於大氣中,所以有可能 使用圖8所示的膜形成設備製造具有高可靠度的e L顯示 裝置。依照該線內方法,進一步地能夠以高產量製造E L 顯示裝置。 藉由使用本發明的膜形成設備,以高產量在基質表面 上幵彡成具有尚度均句薄膜厚度分佈的薄膜變得成爲可能。 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公慶) !,——-----#·^----Ί-I ^-----费 (請先閱讀背面之注意事項再填寫本頁) -28 --25- 490714 A7 B7 V. Description of the invention (Z3) is the evaporation chamber (E). The evaporation chamber (e) 709 is equipped with an exhaust system 700 g. In addition, it is hermetically separated from the discharge chamber (D) 708 by a gate not shown in the figure. In Example 3, the evaporation chamber having the structure shown in Figs. 2A and 2B is used as the evaporation chamber (e) 7 0 9. Therefore, the detailed operation of the evaporation chamber (D) 7 0 8 may be referred to FIGS. 2A and 2B. In the evaporation chamber (E) 709, an Al-Li alloy thin film (Ming and lithium alloy) is deposited as a conductive thin film, which becomes the anode of the EL element. It was noted that it is possible to co-evaporate elements from Group 1 or Group 2 of the Periodic Table as well as aluminum. Next, reference numeral 7 1 0 represents a closet, and it is equipped with an exhaust system 7 00 h. In addition, it is hermetically separated from the discharge chamber (E) 709 by a gate not shown in the figure. Please refer to Example 1 for the explanation of the close chamber 7 1 0. Further, similar to Example 1, an ultraviolet light radiation mechanism is formed in the inside of the close chamber 7 1 0. Finally, the number 711 represents a unloading chamber, and it is equipped with an exhaust system 700i. The matrix on which the EL element was formed was removed therefrom. Since the processing can be done at a point where the EL element is completely sealed in an air-impermeable space without being exposed to the atmosphere, it is possible to manufacture a high-reliability device using the film forming apparatus shown in FIG. 7 E l display device. According to this in-line method, it is possible to further manufacture an EL display device with a high yield. This paper size applies to China National Standard (CNS) A4 (210X 297 mm) (Please read the precautions on the back before filling this page). · 11, Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Consumer Cooperatives 26-490714 A7 ____B7_______ V. Description of the Invention (24) Example 4 An example in which a film forming apparatus of the present invention is used in an in-line method using FIG. 8 is explained. In Fig. 8, reference numeral 801 represents a loading chamber, and the transportation of the substrate is performed here. The loading chamber 8 0 1 is equipped with a ~ exhaust system 8 0 a, and the exhaust system 8 0 a has a first valve 8 1, a turbo molecular pump 8 2, a second valve 8 3, and a rotary pump. (Oil seal rotary pump) 8 4 structure. Next, reference numeral 8 02 represents a pretreatment chamber for treating the surface of a cathode or an anode (cathode in Example 4) of an EL element, and the pretreatment chamber 8 0 2 is equipped with a discharge system 8 0 0 b . In addition, it is hermetically separated from the loading chamber 801 by a gate not shown in the figure. '' The pre-treatment chamber 8 0 2 can be subjected to various changes depending on the manufacturing process of the EL element. The heat treatment of the surface of the cathode fabricated from the transparent conductive film in Example 4 can be performed in oxygen at 1 0 0 and 1 2 0 ° Simultaneous irradiation of ultraviolet light between C. Next, reference numeral 803 represents an evaporation chamber for thin film deposition of an organic EL material by evaporation, and the evaporation chamber 803 is equipped with an exhaust system 80c. In Example 4, an evaporation chamber having the structure shown in FIGS. 2A and 2B is used as the evaporation chamber 803. The substrate 8 0 4 sent to the evaporation chamber 8 0 3 and the evaporation source 8 0 5 equipped in the evaporation chamber 8 0 3 were moved in the directions shown by the arrows, respectively, and the film formation was performed. In Example 4, it is preferable to switch the evaporation source 8 0 3 or the shadow image mask 8 0 3 when thin film deposition is performed in the evaporation chamber 8 0 3 (not shown in this paper. The Chinese National Standard (CNS) A4 specification applies) (210X297 mm) (Please read the precautions on the back before filling out this page) Packing *-Printed by the 8th Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs -27- 490714 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs B7 V. Description of the invention (25)) to form a conductive thin film as a hole injection layer, a red light emitting layer, a green light emitting layer, a blue light emitting layer or an anode. In Example 4, the evaporation chamber 803 is connected to the storage chamber 806, and the evaporation source and the shadow image% cover are stored therein for proper switching. Next, reference numeral 807 represents a closet, and it is equipped with an exhaust system 800d. In addition, it is hermetically separated from the discharge chamber 803 by a gate not shown in the figure. For the explanation of the close chamber 8 0 7, refer to Example 1. Further, similar to Example 1, an ultraviolet light radiating mechanism (not shown in the figure) is formed in the inside of the close chamber 807. Finally, reference numeral 808 represents an unloading chamber, and it is equipped with an exhaust system 800 e. The matrix on which the EL element was formed was removed therefrom. Since the processing can be done at a point where the EL element is completely sealed in an air-impermeable space without being exposed to the atmosphere, it is possible to manufacture a highly reliable e L using the film forming apparatus shown in FIG. 8 Display device. According to this in-line method, it is possible to further manufacture an EL display device with a high yield. By using the film forming apparatus of the present invention, it becomes possible to form a thin film having a uniform mean film thickness distribution on a substrate surface at a high yield. This paper size applies to China National Standard (CNS) A4 specification (210X297 public holiday)!, ——----- # · ^ ---- Ί-I ^ ----- Fees (Please read the note on the back first (Please fill in this page again) -28-

Claims (1)

490714 A8 B8 C8 D8 六、申請專利範圍 1 . 一種膜形成設備,包含: 一具有縱方向的蒸發來源;及 (請先閎讀背面之注意事項再填寫本頁) 一以一垂直於該蒸發來源的縱方向移動該蒸發來源的機 制。 2 ·如申i靑專利範圍第1項的設備,其中該蒸發來源被 提供有具有一縱方向的蒸發胞。 3 .如申請專利範圍第1項的設備,其中該蒸發來源被 提供有複數個蒸發胞。 4 . 一種膜形成設備,包含: - 一具有縱方向的蒸發來源; 一以一垂直於該蒸發來源的縱方向移動該蒸發來源的機 制;及 一形成於該機制上方的電磁鐵。 5 .如申請專利範圍第4項的設備,其中該蒸發來源被· 提供有具有一縱方向的蒸發胞。 6 .如申請專利範圍第4項的設備,其中該蒸發來源被 提供有複數個蒸發胞。 經濟部智慧財產局員工消費合作社印製 7 · —種膜形成設備,包含: 一裝載室;. 一連接到該裝載室的輸送器室;及 一連接到該輸送器室的蒸發室, 其中該蒸發室含有一具有縱方向的蒸發來源,及一以一 垂直於該蒸發來源的縱方向移動該蒸發來源的機制。 8 .如申請專利範圍第7項的設備,其中該蒸發來源被 本纸張尺度適用中國國家標隼(CNS ) A4現格(210X297公釐) 490714 A8 B8 C8 D8 ^、申請專利範圍 提供有具有一縱方向的蒸發胞。 (請先閱讀背面之注意事項再填寫本頁) 9 .如申請專利範圍第7項的設備,其中該蒸發來源被 提供有複數個蒸發胞。 1 0 . —種膜形成設備,包含: 一裝載室;. 一連接到該裝載室的輸送器室;及 一連接到該輸送器室的蒸發室, 其中該蒸發室含有一具有縱方向的蒸發來源,及一以一 垂直於該蒸發來源的縱方向移動該蒸發來源的機制,及一形 成於該機制上方的電磁鐵。 1 1 ·如申請專利範圍第1 〇項的設備,其中該蒸發來 源被提供有具有一縱方向的蒸發胞。 1 2 .如申請專利範圍第1 0項的設備,其中該蒸發來 源被提供有複數個蒸發胞。 1 3 . —種膜形成設備,包含: 一裝載室; 經濟部智慧財產局員工消費合作社印製 一卸載室;及 一蒸發室, 其中該裝載室、該卸載室、該蒸發室串聯在一起,及 其中,該蒸發室含有一具有縱方向的蒸發來源,及一以 一垂直於該蒸發來源的縱方向移動該蒸發來源的機制。 1 4 .如申請專利範圍第1 3項的設備,其中該蒸發來 源被提供有具有一縱方向的蒸發胞。 i 5 .如申請專利範圍第1 3項的設備,其中該蒸發來 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) -30- 490714 Α8 Β8 C8 D8 六、申請專利範圍 源被提供有複數個蒸發胞。 1 6 · —種膜形成設備,包含: (請先閲讀背面之注意事項再填寫本頁) 一裝載室; 一卸載室;及 一蒸發室, 其中該裝載室、該卸載室、該蒸發室串聯在一起,及 其中,該蒸發室含有一具有縱方向的蒸發來源,及一以 一垂直於該蒸發來源的縱方向移動該蒸發來源的機制,及一 形成於該機制上方的電磁鐵。 ‘ 1 7 .如申請專利範圍第1 6項的設備,其中該蒸發來 .源被提供有具有一縱方向的蒸發胞。 1 8 .如申請專利範圍第1 6項的設備,其中該蒸發來 源被提供有複數個蒸發胞。 1 9 . 一種在一基質上形成薄膜之方法,其特徵在於將 具有一縱方向的蒸發來源以垂直於該蒸發來源之縱方向之方 向而移動。 經濟部智慧財產局員工消費合作社印製 2 0 . —種在一基質上形成薄膜之方法,其特徵在於將 具有一縱方向的蒸發來源以垂直於該蒸發來源之縱方向之方 向而移動,其中該基質以及由金屬所構成之蔭像光罩係根據 電磁鐵而爲接觸狀態。 本纸張尺度逋用中國國家樣準(CNS ) A4規格(210Χ297公釐)490714 A8 B8 C8 D8 6. Scope of Patent Application 1. A film-forming equipment, including: a vertical evaporation source; and (please read the precautions on the back before filling out this page) one perpendicular to the evaporation source The mechanism of vertical movement of this evaporation source. 2. The device according to item 1 of the patent application, wherein the evaporation source is provided with an evaporation cell having a vertical direction. 3. The device according to item 1 of the patent application scope, wherein the evaporation source is provided with a plurality of evaporation cells. 4. A film forming apparatus comprising:-an evaporation source having a longitudinal direction;-a mechanism for moving the evaporation source in a longitudinal direction perpendicular to the evaporation source; and an electromagnet formed above the mechanism. 5. The device according to item 4 of the scope of patent application, wherein the evaporation source is provided with an evaporation cell having a longitudinal direction. 6. The device according to item 4 of the patent application scope, wherein the evaporation source is provided with a plurality of evaporation cells. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 7-Seed film forming equipment including: a loading chamber; a conveyor chamber connected to the loading chamber; and an evaporation chamber connected to the conveyor chamber, wherein the The evaporation chamber contains an evaporation source having a longitudinal direction, and a mechanism for moving the evaporation source in a longitudinal direction perpendicular to the evaporation source. 8. If the equipment in the scope of patent application item 7, where the evaporation source is applicable to the Chinese paper standard (CNS) A4 (210X297 mm) 490714 A8 B8 C8 D8 ^, the scope of the patent application provides A vertical evaporation cell. (Please read the precautions on the back before filling out this page) 9. For the equipment in the scope of patent application item 7, the evaporation source is provided with a plurality of evaporation cells. 1.. — Seed film forming equipment, comprising: a loading chamber; a conveyor chamber connected to the loading chamber; and an evaporation chamber connected to the conveyor chamber, wherein the evaporation chamber contains an evaporation having a longitudinal direction A source, and a mechanism that moves the evaporation source in a longitudinal direction perpendicular to the evaporation source, and an electromagnet formed above the mechanism. 1 1 · The device according to item 10 of the patent application scope, wherein the evaporation source is provided with an evaporation cell having a longitudinal direction. 12. The device according to item 10 of the patent application scope, wherein the evaporation source is provided with a plurality of evaporation cells. 1 3. — Seed film forming equipment, including: a loading chamber; an unloading chamber printed by an employee consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs; and an evaporation chamber in which the loading chamber, the unloading chamber, and the evaporation chamber are connected in series, Moreover, the evaporation chamber contains an evaporation source having a longitudinal direction, and a mechanism for moving the evaporation source in a longitudinal direction perpendicular to the evaporation source. 14. The device according to item 13 of the patent application scope, wherein the evaporation source is provided with an evaporation cell having a longitudinal direction. i 5. If the equipment in the scope of patent application No. 13 is used, the paper size of this paper applies the Chinese National Standard (CNS) A4 specification (210X297 mm) -30- 490714 Α8 Β8 C8 D8 A plurality of evaporating cells are provided. 1 6 · — Seed film forming equipment, including: (Please read the precautions on the back before filling out this page) a loading chamber; an unloading chamber; and an evaporation chamber, where the loading chamber, the unloading chamber, and the evaporation chamber are connected in series Together, and therein, the evaporation chamber contains an evaporation source having a longitudinal direction, and a mechanism for moving the evaporation source in a longitudinal direction perpendicular to the evaporation source, and an electromagnet formed above the mechanism. ‘17. The device according to item 16 of the patent application scope, wherein the evaporation source is provided with an evaporation cell having a longitudinal direction. 18. The device according to item 16 of the patent application scope, wherein the evaporation source is provided with a plurality of evaporation cells. 19. A method for forming a thin film on a substrate, characterized in that an evaporation source having a longitudinal direction is moved in a direction perpendicular to the longitudinal direction of the evaporation source. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 20 — A method for forming a thin film on a substrate, which is characterized by moving an evaporation source having a longitudinal direction in a direction perpendicular to the longitudinal direction of the evaporation source, wherein The substrate and the shadow image mask made of metal are brought into contact with each other by the electromagnet. This paper uses China National Standard (CNS) A4 (210 × 297 mm)
TW089125706A 1999-12-27 2000-12-02 Film formation apparatus and method for forming a film TW490714B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP37134999 1999-12-27

Publications (1)

Publication Number Publication Date
TW490714B true TW490714B (en) 2002-06-11

Family

ID=18498560

Family Applications (1)

Application Number Title Priority Date Filing Date
TW089125706A TW490714B (en) 1999-12-27 2000-12-02 Film formation apparatus and method for forming a film

Country Status (6)

Country Link
US (4) US8119189B2 (en)
EP (1) EP1113087B1 (en)
JP (9) JP3833066B2 (en)
KR (2) KR100827760B1 (en)
CN (2) CN1240250C (en)
TW (1) TW490714B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI409349B (en) * 2003-06-27 2013-09-21 Semiconductor Energy Lab Manufacturing apparatus
TWI563106B (en) * 2012-02-17 2016-12-21 Samsung Display Co Ltd Organic layer deposition apparatus, and method of manufacturing organic light emitting display apparatus using the same

Families Citing this family (188)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100330748A1 (en) 1999-10-25 2010-12-30 Xi Chu Method of encapsulating an environmentally sensitive device
TW490714B (en) * 1999-12-27 2002-06-11 Semiconductor Energy Lab Film formation apparatus and method for forming a film
JP4608172B2 (en) * 2000-03-22 2011-01-05 出光興産株式会社 Organic EL display device manufacturing method and organic EL display device manufacturing method using the same
TW484238B (en) * 2000-03-27 2002-04-21 Semiconductor Energy Lab Light emitting device and a method of manufacturing the same
US20020011205A1 (en) * 2000-05-02 2002-01-31 Shunpei Yamazaki Film-forming apparatus, method of cleaning the same, and method of manufacturing a light-emitting device
US7517551B2 (en) * 2000-05-12 2009-04-14 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a light-emitting device
JP2002175878A (en) * 2000-09-28 2002-06-21 Sanyo Electric Co Ltd Forming method of layer, and manufacturing method of color luminous device
JP4906018B2 (en) * 2001-03-12 2012-03-28 株式会社半導体エネルギー研究所 Film forming method, light emitting device manufacturing method, and film forming apparatus
DE10128091C1 (en) 2001-06-11 2002-10-02 Applied Films Gmbh & Co Kg Device for coating a flat substrate used in the production of flat TV screens with organic illuminating diodes comprises a fixed vaporizer source for vaporizing materials
JP4078813B2 (en) * 2001-06-12 2008-04-23 ソニー株式会社 Film forming apparatus and film forming method
JP4707271B2 (en) * 2001-06-29 2011-06-22 三洋電機株式会社 Method for manufacturing electroluminescence element
JP2003017254A (en) * 2001-06-29 2003-01-17 Sanyo Electric Co Ltd Manufacturing method of electroluminescent display
JP2003017255A (en) * 2001-06-29 2003-01-17 Sanyo Electric Co Ltd Manufacturing method of electroluminescent display
JP4865165B2 (en) 2001-08-29 2012-02-01 株式会社半導体エネルギー研究所 Method for manufacturing light emitting device
TW529317B (en) 2001-10-16 2003-04-21 Chi Mei Electronic Corp Method of evaporating film used in an organic electro-luminescent display
US20030101937A1 (en) * 2001-11-28 2003-06-05 Eastman Kodak Company Thermal physical vapor deposition source for making an organic light-emitting device
KR100422487B1 (en) * 2001-12-10 2004-03-11 에이엔 에스 주식회사 Evaporation Apparatus for Manufacturing Organic Electro-Luminescent Display Device using Electromagnet and Evaporation Method using the same
SG149680A1 (en) * 2001-12-12 2009-02-27 Semiconductor Energy Lab Film formation apparatus and film formation method and cleaning method
KR100637127B1 (en) * 2002-01-10 2006-10-20 삼성에스디아이 주식회사 Method of vacuum evaporation and apparatus the same
TWI262034B (en) * 2002-02-05 2006-09-11 Semiconductor Energy Lab Manufacturing system, manufacturing method, method of operating a manufacturing apparatus, and light emitting device
TWI285515B (en) * 2002-02-22 2007-08-11 Semiconductor Energy Lab Light-emitting device and method of manufacturing the same, and method of operating manufacturing apparatus
SG113448A1 (en) * 2002-02-25 2005-08-29 Semiconductor Energy Lab Fabrication system and a fabrication method of a light emitting device
JP3877613B2 (en) * 2002-03-05 2007-02-07 三洋電機株式会社 Method for manufacturing organic electroluminescence display device
TW589919B (en) * 2002-03-29 2004-06-01 Sanyo Electric Co Method for vapor deposition and method for making display device
US8808457B2 (en) 2002-04-15 2014-08-19 Samsung Display Co., Ltd. Apparatus for depositing a multilayer coating on discrete sheets
US8900366B2 (en) 2002-04-15 2014-12-02 Samsung Display Co., Ltd. Apparatus for depositing a multilayer coating on discrete sheets
US7309269B2 (en) * 2002-04-15 2007-12-18 Semiconductor Energy Laboratory Co., Ltd. Method of fabricating light-emitting device and apparatus for manufacturing light-emitting device
JP2004006311A (en) * 2002-04-15 2004-01-08 Semiconductor Energy Lab Co Ltd Method and apparatus for manufacturing light-emitting device
US6749906B2 (en) * 2002-04-25 2004-06-15 Eastman Kodak Company Thermal physical vapor deposition apparatus with detachable vapor source(s) and method
JP4634698B2 (en) * 2002-05-17 2011-02-16 株式会社半導体エネルギー研究所 Vapor deposition equipment
US20040035360A1 (en) * 2002-05-17 2004-02-26 Semiconductor Energy Laboratory Co., Ltd. Manufacturing apparatus
TWI336905B (en) * 2002-05-17 2011-02-01 Semiconductor Energy Lab Evaporation method, evaporation device and method of fabricating light emitting device
JP4954434B2 (en) * 2002-05-17 2012-06-13 株式会社半導体エネルギー研究所 Manufacturing equipment
KR100468792B1 (en) * 2002-05-28 2005-01-29 주식회사 야스 Apparatus for holding substrates and shadow masks
US20030221620A1 (en) * 2002-06-03 2003-12-04 Semiconductor Energy Laboratory Co., Ltd. Vapor deposition device
US6943066B2 (en) * 2002-06-05 2005-09-13 Advantech Global, Ltd Active matrix backplane for controlling controlled elements and method of manufacture thereof
US20040007183A1 (en) * 2002-07-11 2004-01-15 Ulvac, Inc. Apparatus and method for the formation of thin films
KR100471358B1 (en) * 2002-07-19 2005-03-15 엘지전자 주식회사 Device for depositing electroluminescent layer
DE60305246T2 (en) * 2002-07-19 2006-09-14 Lg Electronics Inc. Thermal PVD coating source for organic electroluminescent layers
US20040040504A1 (en) * 2002-08-01 2004-03-04 Semiconductor Energy Laboratory Co., Ltd. Manufacturing apparatus
JP3690380B2 (en) * 2002-08-02 2005-08-31 セイコーエプソン株式会社 Material arrangement method, electronic device manufacturing method, electro-optical device manufacturing method
JP4515060B2 (en) * 2002-08-30 2010-07-28 株式会社半導体エネルギー研究所 Manufacturing apparatus and method for producing layer containing organic compound
TWI277363B (en) 2002-08-30 2007-03-21 Semiconductor Energy Lab Fabrication system, light-emitting device and fabricating method of organic compound-containing layer
US20040123804A1 (en) * 2002-09-20 2004-07-01 Semiconductor Energy Laboratory Co., Ltd. Fabrication system and manufacturing method of light emitting device
JP2004146369A (en) * 2002-09-20 2004-05-20 Semiconductor Energy Lab Co Ltd Manufacturing method of manufacturing device and light emitting device
US7067170B2 (en) * 2002-09-23 2006-06-27 Eastman Kodak Company Depositing layers in OLED devices using viscous flow
JP4139186B2 (en) * 2002-10-21 2008-08-27 東北パイオニア株式会社 Vacuum deposition equipment
WO2004054325A1 (en) * 2002-12-12 2004-06-24 Semiconductor Energy Laboratory Co., Ltd. Light-emitting device, manufacturing apparatus, film-forming method, and cleaning method
US20040144321A1 (en) * 2003-01-28 2004-07-29 Eastman Kodak Company Method of designing a thermal physical vapor deposition system
US7211461B2 (en) * 2003-02-14 2007-05-01 Semiconductor Energy Laboratory Co., Ltd. Manufacturing apparatus
DE10312641B4 (en) * 2003-03-21 2009-11-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Method and device for producing an OLED display
JP4346336B2 (en) * 2003-04-02 2009-10-21 三洋電機株式会社 Manufacturing method of organic EL display device
JP4463492B2 (en) * 2003-04-10 2010-05-19 株式会社半導体エネルギー研究所 Manufacturing equipment
US20040206307A1 (en) * 2003-04-16 2004-10-21 Eastman Kodak Company Method and system having at least one thermal transfer station for making OLED displays
JP4493926B2 (en) 2003-04-25 2010-06-30 株式会社半導体エネルギー研究所 Manufacturing equipment
JP2004353084A (en) 2003-05-08 2004-12-16 Sanyo Electric Co Ltd Evaporator fixation member
JP2004353082A (en) 2003-05-08 2004-12-16 Sanyo Electric Co Ltd Evaporator
JP2004353083A (en) 2003-05-08 2004-12-16 Sanyo Electric Co Ltd Evaporation apparatus
JP3915734B2 (en) * 2003-05-12 2007-05-16 ソニー株式会社 Vapor deposition mask, display device manufacturing method using the same, and display device
JP4015064B2 (en) * 2003-05-28 2007-11-28 トッキ株式会社 Vapor deposition equipment
JP4522777B2 (en) * 2003-07-25 2010-08-11 株式会社半導体エネルギー研究所 Method for manufacturing light emitting device
US7211454B2 (en) * 2003-07-25 2007-05-01 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of a light emitting device including moving the source of the vapor deposition parallel to the substrate
US20050022743A1 (en) * 2003-07-31 2005-02-03 Semiconductor Energy Laboratory Co., Ltd. Evaporation container and vapor deposition apparatus
US8123862B2 (en) * 2003-08-15 2012-02-28 Semiconductor Energy Laboratory Co., Ltd. Deposition apparatus and manufacturing apparatus
JP4685404B2 (en) * 2003-10-15 2011-05-18 三星モバイルディスプレイ株式會社 Organic electroluminescent element vertical vapor deposition method, apparatus thereof, and vapor deposition source used in organic electroluminescent element vertical vapor deposition apparatus
US20050244580A1 (en) * 2004-04-30 2005-11-03 Eastman Kodak Company Deposition apparatus for temperature sensitive materials
JP4545504B2 (en) * 2004-07-15 2010-09-15 株式会社半導体エネルギー研究所 Film forming method and light emitting device manufacturing method
WO2006016669A1 (en) * 2004-08-13 2006-02-16 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
KR20060018746A (en) * 2004-08-25 2006-03-02 삼성에스디아이 주식회사 Apparatus for depositing organic material
KR100700840B1 (en) 2005-01-05 2007-03-27 삼성에스디아이 주식회사 Welding method for shadow-mask
US9530968B2 (en) * 2005-02-15 2016-12-27 Semiconductor Energy Laboratory Co., Ltd. Light emitting element and light emitting device
US7948171B2 (en) * 2005-02-18 2011-05-24 Semiconductor Energy Laboratory Co., Ltd. Light emitting device
EP1715075B1 (en) * 2005-04-20 2008-04-16 Applied Materials GmbH & Co. KG Magnetic mask holder
JP4789551B2 (en) * 2005-09-06 2011-10-12 株式会社半導体エネルギー研究所 Organic EL film forming equipment
US7485580B2 (en) * 2005-09-20 2009-02-03 Air Products And Chemicals, Inc. Method for removing organic electroluminescent residues from a substrate
US7531470B2 (en) * 2005-09-27 2009-05-12 Advantech Global, Ltd Method and apparatus for electronic device manufacture using shadow masks
JP4974504B2 (en) * 2005-10-13 2012-07-11 株式会社半導体エネルギー研究所 Film forming apparatus and light emitting apparatus manufacturing method
KR20070043541A (en) * 2005-10-21 2007-04-25 삼성에스디아이 주식회사 Apparatus of thin film evaporation and method for thin film evaporation using the same
JP5064810B2 (en) * 2006-01-27 2012-10-31 キヤノン株式会社 Vapor deposition apparatus and vapor deposition method
KR100836471B1 (en) * 2006-10-27 2008-06-09 삼성에스디아이 주식회사 Mask and deposition apparatus using the same
KR100842183B1 (en) * 2006-12-29 2008-06-30 두산메카텍 주식회사 Vapordeposition source scaning appauatus
JP2008221532A (en) * 2007-03-09 2008-09-25 Oshima Denki Seisakusho:Kk Film deposition system
KR100977971B1 (en) * 2007-06-27 2010-08-24 두산메카텍 주식회사 Evaporation equipment
KR100830839B1 (en) 2008-02-12 2008-05-20 문대규 Evaporator
KR100964224B1 (en) 2008-02-28 2010-06-17 삼성모바일디스플레이주식회사 Evaporating apparatus and method for forming thin film
US20090218219A1 (en) * 2008-02-29 2009-09-03 Semiconductor Energy Laboratory Co., Ltd. Manufacturing Apparatus
JP5416987B2 (en) 2008-02-29 2014-02-12 株式会社半導体エネルギー研究所 Film forming method and light emitting device manufacturing method
JP5238544B2 (en) * 2008-03-07 2013-07-17 株式会社半導体エネルギー研究所 Film forming method and light emitting device manufacturing method
US8409672B2 (en) * 2008-04-24 2013-04-02 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing evaporation donor substrate and method of manufacturing light-emitting device
KR101517020B1 (en) * 2008-05-15 2015-05-04 삼성디스플레이 주식회사 Apparatus and method for fabricating Organic Light Emitting Diode Display Device
EP2135970A1 (en) * 2008-06-20 2009-12-23 Applied Materials, Inc. Processing system and method for processing a substrate
JP2010111916A (en) * 2008-11-06 2010-05-20 Ulvac Japan Ltd Vacuum deposition system, vapor deposition source, film deposition chamber and method for exchanging vapor deposition vessel
TWI475124B (en) * 2009-05-22 2015-03-01 Samsung Display Co Ltd Thin film deposition apparatus
JP5620146B2 (en) 2009-05-22 2014-11-05 三星ディスプレイ株式會社Samsung Display Co.,Ltd. Thin film deposition equipment
US8882920B2 (en) * 2009-06-05 2014-11-11 Samsung Display Co., Ltd. Thin film deposition apparatus
US8882921B2 (en) * 2009-06-08 2014-11-11 Samsung Display Co., Ltd. Thin film deposition apparatus
US9174250B2 (en) 2009-06-09 2015-11-03 Samsung Display Co., Ltd. Method and apparatus for cleaning organic deposition materials
US8802200B2 (en) 2009-06-09 2014-08-12 Samsung Display Co., Ltd. Method and apparatus for cleaning organic deposition materials
KR101074792B1 (en) * 2009-06-12 2011-10-19 삼성모바일디스플레이주식회사 Apparatus for thin layer deposition
KR101117719B1 (en) * 2009-06-24 2012-03-08 삼성모바일디스플레이주식회사 Apparatus for thin layer deposition
KR101097311B1 (en) * 2009-06-24 2011-12-21 삼성모바일디스플레이주식회사 Organic light emitting display apparatus and apparatus for thin layer deposition for manufacturing the same
KR101117720B1 (en) * 2009-06-25 2012-03-08 삼성모바일디스플레이주식회사 Apparatus for thin layer deposition and method of manufacturing organic light emitting device using the same
JP5244725B2 (en) * 2009-07-21 2013-07-24 株式会社日立ハイテクノロジーズ Deposition equipment
CN101962750B (en) * 2009-07-24 2013-07-03 株式会社日立高新技术 Vacuum evaporation method and device
KR20110014442A (en) * 2009-08-05 2011-02-11 삼성모바일디스플레이주식회사 Apparatus for thin layer deposition and method for manufacturing of organic light emitting display apparatus using the same
KR101127575B1 (en) * 2009-08-10 2012-03-23 삼성모바일디스플레이주식회사 Apparatus for thin film deposition having a deposition blade
US20110033621A1 (en) * 2009-08-10 2011-02-10 Samsung Mobile Display Co., Ltd. Thin film deposition apparatus including deposition blade
JP5676175B2 (en) 2009-08-24 2015-02-25 三星ディスプレイ株式會社Samsung Display Co.,Ltd. Thin film deposition apparatus and organic light emitting display device manufacturing method using the same
KR101127578B1 (en) * 2009-08-24 2012-03-23 삼성모바일디스플레이주식회사 Apparatus for thin layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
JP5328726B2 (en) 2009-08-25 2013-10-30 三星ディスプレイ株式會社 Thin film deposition apparatus and organic light emitting display device manufacturing method using the same
US8486737B2 (en) * 2009-08-25 2013-07-16 Samsung Display Co., Ltd. Thin film deposition apparatus and method of manufacturing organic light-emitting display device by using the same
JP5677785B2 (en) * 2009-08-27 2015-02-25 三星ディスプレイ株式會社Samsung Display Co.,Ltd. Thin film deposition apparatus and organic light emitting display device manufacturing method using the same
JP5611718B2 (en) * 2009-08-27 2014-10-22 三星ディスプレイ株式會社Samsung Display Co.,Ltd. Thin film deposition apparatus and organic light emitting display device manufacturing method using the same
US20110052795A1 (en) * 2009-09-01 2011-03-03 Samsung Mobile Display Co., Ltd. Thin film deposition apparatus and method of manufacturing organic light-emitting display device by using the same
US8696815B2 (en) 2009-09-01 2014-04-15 Samsung Display Co., Ltd. Thin film deposition apparatus
KR20120071393A (en) * 2009-09-24 2012-07-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 Semiconductor device and manufacturing method thereof
US8876975B2 (en) * 2009-10-19 2014-11-04 Samsung Display Co., Ltd. Thin film deposition apparatus
KR101146982B1 (en) 2009-11-20 2012-05-22 삼성모바일디스플레이주식회사 Aapparatus for thin layer deposition and method of manufacturing organic light emitting display apparatus
US8590338B2 (en) 2009-12-31 2013-11-26 Samsung Mobile Display Co., Ltd. Evaporator with internal restriction
KR101084184B1 (en) 2010-01-11 2011-11-17 삼성모바일디스플레이주식회사 Apparatus for thin layer deposition
KR101174875B1 (en) * 2010-01-14 2012-08-17 삼성디스플레이 주식회사 Apparatus for thin layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
KR101193186B1 (en) * 2010-02-01 2012-10-19 삼성디스플레이 주식회사 Apparatus for thin layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
KR101156441B1 (en) 2010-03-11 2012-06-18 삼성모바일디스플레이주식회사 Apparatus for thin layer deposition
KR101202348B1 (en) 2010-04-06 2012-11-16 삼성디스플레이 주식회사 Apparatus for thin layer deposition and method for manufacturing of organic light emitting display apparatus using the same
US8894458B2 (en) 2010-04-28 2014-11-25 Samsung Display Co., Ltd. Thin film deposition apparatus, method of manufacturing organic light-emitting display device by using the apparatus, and organic light-emitting display device manufactured by using the method
KR101223723B1 (en) 2010-07-07 2013-01-18 삼성디스플레이 주식회사 Apparatus for thin layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
KR101673017B1 (en) 2010-07-30 2016-11-07 삼성디스플레이 주식회사 Apparatus for thin layer deposition and method for manufacturing of organic light emitting display apparatus using the same
KR20120012638A (en) 2010-08-02 2012-02-10 삼성모바일디스플레이주식회사 Apparatus for forming thin film
JP5607470B2 (en) * 2010-09-14 2014-10-15 公益財団法人かずさDna研究所 Substrate surface hydrophilization treatment method and workpiece manufacturing apparatus
KR20120029166A (en) 2010-09-16 2012-03-26 삼성모바일디스플레이주식회사 Apparatus for thin layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
KR101678056B1 (en) 2010-09-16 2016-11-22 삼성디스플레이 주식회사 Apparatus for thin layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
KR20120039944A (en) * 2010-10-18 2012-04-26 삼성모바일디스플레이주식회사 Depositing system for substrate and dspoiting method for the same
JP5298244B2 (en) 2010-10-19 2013-09-25 シャープ株式会社 Vapor deposition equipment
KR101723506B1 (en) 2010-10-22 2017-04-19 삼성디스플레이 주식회사 Apparatus for organic layer deposition and method for manufacturing of organic light emitting display apparatus using the same
KR101738531B1 (en) 2010-10-22 2017-05-23 삼성디스플레이 주식회사 Method for manufacturing of organic light emitting display apparatus, and organic light emitting display apparatus manufactured by the method
KR20120045865A (en) 2010-11-01 2012-05-09 삼성모바일디스플레이주식회사 Apparatus for organic layer deposition
KR20120065789A (en) 2010-12-13 2012-06-21 삼성모바일디스플레이주식회사 Apparatus for organic layer deposition
JP2012140671A (en) * 2010-12-28 2012-07-26 Canon Tokki Corp Film-forming apparatus
KR101760897B1 (en) 2011-01-12 2017-07-25 삼성디스플레이 주식회사 Deposition source and apparatus for organic layer deposition having the same
JP2012186158A (en) * 2011-02-14 2012-09-27 Semiconductor Energy Lab Co Ltd Method for manufacturing lighting system and light emitting device, and device for manufacturing the same
JP2012178278A (en) * 2011-02-25 2012-09-13 Ulvac Japan Ltd Method for forming light transmissive metal oxide film
JP5902515B2 (en) 2011-03-14 2016-04-13 株式会社半導体エネルギー研究所 Continuous film forming apparatus and continuous film forming method
WO2012126016A2 (en) * 2011-03-17 2012-09-20 Kateeva, Inc. Apparatus and methods for depositing one or more organic materials on a substrate
KR101923174B1 (en) 2011-05-11 2018-11-29 삼성디스플레이 주식회사 ESC, apparatus for thin layer deposition therewith, and method for manufacturing of organic light emitting display apparatus using the same
KR101840654B1 (en) 2011-05-25 2018-03-22 삼성디스플레이 주식회사 Apparatus for organic layer deposition and method for manufacturing of organic light emitting display apparatus using the same
KR101852517B1 (en) 2011-05-25 2018-04-27 삼성디스플레이 주식회사 Apparatus for organic layer deposition and method for manufacturing of organic light emitting display apparatus using the same
KR101857992B1 (en) 2011-05-25 2018-05-16 삼성디스플레이 주식회사 Patterning slit sheet assembly, apparatus for organic layer deposition, method for manufacturing organic light emitting display apparatus and organic light emitting display apparatus
KR101857249B1 (en) 2011-05-27 2018-05-14 삼성디스플레이 주식회사 Patterning slit sheet assembly, apparatus for organic layer deposition, method for manufacturing organic light emitting display apparatus and organic light emitting display apparatus
KR20130004830A (en) 2011-07-04 2013-01-14 삼성디스플레이 주식회사 Apparatus for thin layer deposition and method for manufacturing of organic light emitting display apparatus using the same
KR101826068B1 (en) 2011-07-04 2018-02-07 삼성디스플레이 주식회사 Apparatus for thin layer deposition
KR20130010730A (en) 2011-07-19 2013-01-29 삼성디스플레이 주식회사 Deposition source and deposition apparatus with the same
KR20130015144A (en) 2011-08-02 2013-02-13 삼성디스플레이 주식회사 Deposition source, apparatus for organic layer deposition and method for manufacturing of organic light emitting display apparatus using the same
JP5812753B2 (en) * 2011-08-11 2015-11-17 株式会社アルバック Film forming apparatus and film forming method
KR20130069037A (en) 2011-12-16 2013-06-26 삼성디스플레이 주식회사 Apparatus for thin layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus
US9055654B2 (en) 2011-12-22 2015-06-09 Semiconductor Energy Laboratory Co., Ltd. Film formation apparatus and film formation method
JP2013216955A (en) * 2012-04-11 2013-10-24 Hitachi High-Technologies Corp Vacuum vapor deposition apparatus
KR102015872B1 (en) 2012-06-22 2019-10-22 삼성디스플레이 주식회사 Apparatus for organic layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
KR101959974B1 (en) 2012-07-10 2019-07-16 삼성디스플레이 주식회사 Apparatus for organic layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
KR102013315B1 (en) 2012-07-10 2019-08-23 삼성디스플레이 주식회사 Method for manufacturing of organic light emitting display apparatus and organic light emitting display apparatus manufactured by the method
CN103545460B (en) 2012-07-10 2017-04-12 三星显示有限公司 Organic light-emitting display device, organic light-emitting display apparatus, and method of manufacturing organic light-emitting display apparatus
US9461277B2 (en) 2012-07-10 2016-10-04 Samsung Display Co., Ltd. Organic light emitting display apparatus
KR101632298B1 (en) 2012-07-16 2016-06-22 삼성디스플레이 주식회사 Flat panel display device and manufacturing method thereof
KR101968664B1 (en) * 2012-08-06 2019-08-14 삼성디스플레이 주식회사 Device for forming thin layer and manufacturing method of organic light emitting diode display using the same
KR102013318B1 (en) 2012-09-20 2019-08-23 삼성디스플레이 주식회사 Apparatus for thin layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus
KR101994838B1 (en) 2012-09-24 2019-10-01 삼성디스플레이 주식회사 Apparatus for organic layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
KR20140050994A (en) 2012-10-22 2014-04-30 삼성디스플레이 주식회사 Organic light emitting display apparatus and method for manufacturing the same
KR102052069B1 (en) 2012-11-09 2019-12-05 삼성디스플레이 주식회사 Apparatus for organic layer deposition, method for manufacturing of organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
KR102075525B1 (en) 2013-03-20 2020-02-11 삼성디스플레이 주식회사 Deposition apparatus for organic layer, method for manufacturing organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the method
KR20140118551A (en) 2013-03-29 2014-10-08 삼성디스플레이 주식회사 Deposition apparatus, method for manufacturing organic light emitting display apparatus and organic light emitting display apparatus
KR102073765B1 (en) * 2013-04-04 2020-02-26 삼성디스플레이 주식회사 Method for manufacturing display and deposition apparatus for the same
KR102037376B1 (en) 2013-04-18 2019-10-29 삼성디스플레이 주식회사 Patterning slit sheet, deposition apparatus comprising the same, method for manufacturing organic light emitting display apparatus using the same, organic light emitting display apparatus manufacture by the method
KR102081284B1 (en) 2013-04-18 2020-02-26 삼성디스플레이 주식회사 Deposition apparatus, method for manufacturing organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the same
KR102086550B1 (en) * 2013-05-31 2020-03-10 삼성디스플레이 주식회사 Deposition apparatus, method for manufacturing organic light emitting display apparatus using the same, and organic light emitting display apparatus manufactured by the same
KR102107104B1 (en) 2013-06-17 2020-05-07 삼성디스플레이 주식회사 Apparatus for organic layer deposition, and method for manufacturing of organic light emitting display apparatus using the same
KR102108361B1 (en) 2013-06-24 2020-05-11 삼성디스플레이 주식회사 Apparatus for monitoring deposition rate, apparatus for organic layer deposition using the same, method for monitoring deposition rate, and method for manufacturing of organic light emitting display apparatus using the same
CN103726019B (en) * 2013-12-13 2015-10-28 中国科学院上海光学精密机械研究所 Improve the method for design of the baffle plate of spherical optics element plated film homogeneity
KR102162797B1 (en) 2013-12-23 2020-10-08 삼성디스플레이 주식회사 Method for manufacturing of organic light emitting display apparatus
US20170198384A1 (en) * 2014-05-30 2017-07-13 Sharp Kabushiki Kaisha Deposition apparatus and deposition method
EP2975155A1 (en) * 2014-07-15 2016-01-20 Essilor International (Compagnie Generale D'optique) A process for physical vapor deposition of a material layer on surfaces of a plurality of substrates
CN104593731B (en) * 2015-02-04 2017-05-03 深圳市华星光电技术有限公司 Vapor deposition-replacement integrated apparatus and application method thereof
CN105154832B (en) * 2015-10-15 2018-06-08 京东方科技集团股份有限公司 Evaporated device and evaporation coating method
CN105177510B (en) * 2015-10-21 2018-04-03 京东方科技集团股份有限公司 Evaporated device and evaporation coating method
US10892415B2 (en) 2016-03-10 2021-01-12 Hon Hai Precision Industry Co., Ltd. Deposition mask, vapor deposition apparatus, vapor deposition method, and method for manufacturing organic EL display apparatus
JP2017036512A (en) * 2016-11-07 2017-02-16 株式会社半導体エネルギー研究所 Deposition device
JP6580105B2 (en) * 2017-10-26 2019-09-25 キヤノントッキ株式会社 measuring device
CN109881179B (en) * 2019-04-19 2023-07-25 江苏可润光电科技有限公司 Full-wrapping parylene coating process and coating device
CN114583060A (en) * 2020-12-01 2022-06-03 杭州纤纳光电科技有限公司 Perovskite film rhythmic deposition production method and equipment
JP7362693B2 (en) * 2021-06-01 2023-10-17 キヤノントッキ株式会社 Film deposition equipment and electronic device manufacturing equipment

Family Cites Families (167)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2351536A (en) * 1941-04-25 1944-06-13 Spencer Lens Co Method of treating surfaces
US2435997A (en) * 1943-11-06 1948-02-17 American Optical Corp Apparatus for vapor coating of large surfaces
US3110620A (en) * 1960-06-28 1963-11-12 Ibm Method of making plural layer thin film devices
US3235647A (en) 1963-06-06 1966-02-15 Temescal Metallurgical Corp Electron bombardment heating with adjustable impact pattern
US3312190A (en) * 1964-02-25 1967-04-04 Burroughs Corp Mask and substrate alignment apparatus
US3420977A (en) 1965-06-18 1969-01-07 Air Reduction Electron beam apparatus
US3391490A (en) * 1966-02-23 1968-07-09 David H. Evans Remotely controlled vehicle system
US3543717A (en) * 1968-04-25 1970-12-01 Itek Corp Means to adjust collimator and crucible location in a vapor deposition apparatus
US3636305A (en) * 1971-03-10 1972-01-18 Gte Sylvania Inc Apparatus for metal vaporization comprising a heater and a refractory vessel
US3710072A (en) 1971-05-10 1973-01-09 Airco Inc Vapor source assembly
US3756193A (en) * 1972-05-01 1973-09-04 Battelle Memorial Institute Coating apparatus
JPS5315466B2 (en) * 1973-04-28 1978-05-25
FR2244014B1 (en) * 1973-09-17 1976-10-08 Bosch Gmbh Robert
US3971334A (en) * 1975-03-04 1976-07-27 Xerox Corporation Coating device
US4023523A (en) * 1975-04-23 1977-05-17 Xerox Corporation Coater hardware and method for obtaining uniform photoconductive layers on a xerographic photoreceptor
US4187801A (en) * 1977-12-12 1980-02-12 Commonwealth Scientific Corporation Method and apparatus for transporting workpieces
JPS5828812Y2 (en) 1978-02-26 1983-06-23 ナショナル住宅産業株式会社 Anti-warp device
JPS54127877A (en) 1978-03-28 1979-10-04 Ricoh Co Ltd Preparation of thin film
US4233937A (en) * 1978-07-20 1980-11-18 Mcdonnell Douglas Corporation Vapor deposition coating machine
DE2834806A1 (en) 1978-08-09 1980-02-14 Leybold Heraeus Gmbh & Co Kg Vacuum vapour deposition of thin films esp. aluminium on TV tubes - using evaporator boat fitted on cardan mounting so that evaporator can be tilted
US4225805A (en) * 1978-12-22 1980-09-30 Gte Products Corporation Cathode ray tube getter sealing structure
JPS6032361Y2 (en) 1980-03-17 1985-09-27 三国工業株式会社 Starter operation mechanism of multiple carburetor
JPS57123973A (en) 1981-01-22 1982-08-02 Fuji Electric Co Ltd Container for vacuum-depositing material
JPS6214379Y2 (en) 1981-01-27 1987-04-13
JPS57172060A (en) 1981-04-17 1982-10-22 Mitsui Keikinzoku Kako Upstair
JPS57172060U (en) * 1981-04-20 1982-10-29
US4446357A (en) * 1981-10-30 1984-05-01 Kennecott Corporation Resistance-heated boat for metal vaporization
US4469719A (en) * 1981-12-21 1984-09-04 Applied Magnetics-Magnetic Head Divison Corporation Method for controlling the edge gradient of a layer of deposition material
JPS58177463A (en) 1982-04-12 1983-10-18 Hitachi Ltd Method and device for formation of thin film
US4405487A (en) * 1982-04-29 1983-09-20 Harrah Larry A Combination moisture and hydrogen getter
JPS58177463U (en) 1982-05-21 1983-11-28 株式会社日本ロツク Electronic lock chain lock
CH651592A5 (en) * 1982-10-26 1985-09-30 Balzers Hochvakuum STEAM SOURCE FOR VACUUM STEAMING SYSTEMS.
DE3480243D1 (en) * 1983-03-31 1989-11-23 Matsushita Electric Ind Co Ltd Method of manufacturing thin-film integrated devices
JPS59203238A (en) * 1983-04-30 1984-11-17 Tdk Corp Magnetic recording medium and its production
JPS6032361A (en) 1983-08-03 1985-02-19 Hitachi Ltd Manufacture of electrode wiring for semiconductor device
DE3330092A1 (en) * 1983-08-20 1985-03-07 Leybold-Heraeus GmbH, 5000 Köln METHOD FOR ADJUSTING THE LOCAL EVAPORATION PERFORMANCE ON EVAPORATORS IN VACUUM EVAPORATION PROCESSES
GB8332394D0 (en) * 1983-12-05 1984-01-11 Pilkington Brothers Plc Coating apparatus
JPS60121616A (en) 1983-12-06 1985-06-29 セイコーエプソン株式会社 Method of forming transparent conductive film
JPS60121616U (en) 1984-01-25 1985-08-16 三菱電機株式会社 Tap switching device under load
US5259881A (en) * 1991-05-17 1993-11-09 Materials Research Corporation Wafer processing cluster tool batch preheating and degassing apparatus
US4672265A (en) * 1984-07-31 1987-06-09 Canon Kabushiki Kaisha Electroluminescent device
US4600160A (en) 1984-09-20 1986-07-15 Oscar Mayer Foods Corporation Chopper blade assembly
JPH0246667B2 (en) 1986-09-20 1990-10-16 Anelva Corp HAKUMAKUJOCHAKUSOCHI
US4897290A (en) * 1986-09-26 1990-01-30 Konishiroku Photo Industry Co., Ltd. Method for manufacturing the substrate for liquid crystal display
JPS6379959U (en) 1986-11-14 1988-05-26
US4951601A (en) * 1986-12-19 1990-08-28 Applied Materials, Inc. Multi-chamber integrated process system
US4885211A (en) * 1987-02-11 1989-12-05 Eastman Kodak Company Electroluminescent device with improved cathode
JPS63186763U (en) * 1987-02-16 1988-11-30
US4769292A (en) * 1987-03-02 1988-09-06 Eastman Kodak Company Electroluminescent device with modified thin film luminescent zone
JPS63297549A (en) 1987-05-29 1988-12-05 Komatsu Ltd Vacuum deposition device
JPS6442392A (en) 1987-08-07 1989-02-14 Nec Corp Apparatus for molecular beam epitaxy
JPS6442392U (en) 1987-09-03 1989-03-14
JP2832836B2 (en) * 1988-12-26 1998-12-09 株式会社小松製作所 Vacuum deposition equipment
US5111022A (en) 1989-08-23 1992-05-05 Tfi Telemark Cooling system for electron beam gun and method
JP2672680B2 (en) * 1990-02-09 1997-11-05 沖電気工業株式会社 Method for producing thin film and evaporation source used therefor
US5310410A (en) * 1990-04-06 1994-05-10 Sputtered Films, Inc. Method for processing semi-conductor wafers in a multiple vacuum and non-vacuum chamber apparatus
JP2913745B2 (en) * 1990-04-10 1999-06-28 松下電器産業株式会社 Vacuum deposition equipment
JPH0423523A (en) * 1990-05-17 1992-01-27 Matsushita Electric Ind Co Ltd Satellite receiving tuner
JPH04116169A (en) 1990-09-05 1992-04-16 Shin Meiwa Ind Co Ltd Vacuum vapor deposition device for forming multilayered films
US5167984A (en) 1990-12-06 1992-12-01 Xerox Corporation Vacuum deposition process
US5258325A (en) * 1990-12-31 1993-11-02 Kopin Corporation Method for manufacturing a semiconductor device using a circuit transfer film
JP3181611B2 (en) 1991-02-22 2001-07-03 コニカ株式会社 Vapor deposition equipment
JP3125279B2 (en) * 1991-02-25 2001-01-15 東海カーボン株式会社 Graphite crucible for vacuum evaporation
JPH04116169U (en) 1991-03-28 1992-10-16 株式会社島津製作所 laser equipment
JP2784615B2 (en) * 1991-10-16 1998-08-06 株式会社半導体エネルギー研究所 Electro-optical display device and driving method thereof
US5429884A (en) * 1992-01-17 1995-07-04 Pioneer Electronic Corporation Organic electroluminescent element
JP2688555B2 (en) 1992-04-27 1997-12-10 株式会社日立製作所 Multi-chamber system
JP3257056B2 (en) 1992-09-04 2002-02-18 石川島播磨重工業株式会社 Vacuum deposition equipment
JP3482969B2 (en) * 1993-01-19 2004-01-06 石川島播磨重工業株式会社 Continuous vacuum deposition equipment
DE69304038T2 (en) * 1993-01-28 1996-12-19 Applied Materials Inc Device for a vacuum process with improved throughput
JP3059972B2 (en) 1993-03-12 2000-07-04 工業技術院長 Manufacturing method of organic optical thin film and its equipment
JP2821347B2 (en) * 1993-10-12 1998-11-05 日本電気株式会社 Current control type light emitting element array
JP2770299B2 (en) * 1993-10-26 1998-06-25 富士ゼロックス株式会社 Thin-film EL element, method of manufacturing the same, and sputtering target used therefor
KR100291971B1 (en) 1993-10-26 2001-10-24 야마자끼 순페이 Substrate processing apparatus and method and thin film semiconductor device manufacturing method
JP2734965B2 (en) 1993-12-20 1998-04-02 双葉電子工業株式会社 Field emission device and method of manufacturing the same
JPH07192866A (en) 1993-12-26 1995-07-28 Ricoh Co Ltd Organic thin film type electroluminescent element
JPH07216539A (en) 1994-01-28 1995-08-15 Toray Ind Inc Film forming device and production of thin film using the same
JP2599569B2 (en) 1994-03-09 1997-04-09 工業技術院長 Method and apparatus for manufacturing composite optical thin film
US5701055A (en) * 1994-03-13 1997-12-23 Pioneer Electronic Corporation Organic electoluminescent display panel and method for manufacturing the same
DE4422697C1 (en) 1994-06-29 1996-01-25 Zsw Vapour coating device for prodn. of thin filmed solar cells
US5534314A (en) * 1994-08-31 1996-07-09 University Of Virginia Patent Foundation Directed vapor deposition of electron beam evaporant
JPH08111285A (en) 1994-10-07 1996-04-30 Tdk Corp Manufacture of organic electroluminescent element and its device
US5972183A (en) * 1994-10-31 1999-10-26 Saes Getter S.P.A Getter pump module and system
US5550066A (en) * 1994-12-14 1996-08-27 Eastman Kodak Company Method of fabricating a TFT-EL pixel
US5945967A (en) * 1995-01-18 1999-08-31 I-O Display Systems, Llc Speckle depixelator
EP0732731A3 (en) * 1995-03-13 1997-10-08 Applied Materials Inc Treatment of a titanium nitride layer to improve resistance to elevated temperatures
JPH0916960A (en) * 1995-06-30 1997-01-17 Hitachi Maxell Ltd Manufacturing device for information recording medium
US5935395A (en) * 1995-11-08 1999-08-10 Mitel Corporation Substrate processing apparatus with non-evaporable getter pump
JPH09209127A (en) 1996-02-05 1997-08-12 Idemitsu Kosan Co Ltd Vacuum vapor deposition apparatus and production of organic electroluminescence element by using this vacuum vapor deposition apparatus
JPH09256142A (en) 1996-03-15 1997-09-30 Sony Corp Film forming device
TW320687B (en) * 1996-04-01 1997-11-21 Toray Industries
JP3539125B2 (en) 1996-04-18 2004-07-07 東レ株式会社 Manufacturing method of organic electroluminescent device
JPH1050478A (en) * 1996-04-19 1998-02-20 Toray Ind Inc Organic field emission element and manufacture thereof
JP3113212B2 (en) * 1996-05-09 2000-11-27 富士通株式会社 Plasma display panel phosphor layer forming apparatus and phosphor coating method
WO1997046054A1 (en) * 1996-05-29 1997-12-04 Idemitsu Kosan Co., Ltd. Organic el device
US5902688A (en) * 1996-07-16 1999-05-11 Hewlett-Packard Company Electroluminescent display device
US5817366A (en) * 1996-07-29 1998-10-06 Tdk Corporation Method for manufacturing organic electroluminescent element and apparatus therefor
US5844363A (en) * 1997-01-23 1998-12-01 The Trustees Of Princeton Univ. Vacuum deposited, non-polymeric flexible organic light emitting devices
JPH10162954A (en) 1996-11-29 1998-06-19 Hokuriku Electric Ind Co Ltd Manufacture of organic el element
JP4059946B2 (en) 1996-12-06 2008-03-12 株式会社アルバック Organic thin film forming apparatus and organic material recycling method
JP3483719B2 (en) 1997-01-09 2004-01-06 株式会社アルバック Evaporation source for organic material and organic thin film forming apparatus using the same
JP3162313B2 (en) * 1997-01-20 2001-04-25 工業技術院長 Thin film manufacturing method and thin film manufacturing apparatus
US5904961A (en) * 1997-01-24 1999-05-18 Eastman Kodak Company Method of depositing organic layers in organic light emitting devices
JPH10214682A (en) 1997-01-30 1998-08-11 Mitsubishi Chem Corp Manufacturing device and manufacture of organic electroluminescent element
US6049167A (en) * 1997-02-17 2000-04-11 Tdk Corporation Organic electroluminescent display device, and method and system for making the same
JP2848371B2 (en) * 1997-02-21 1999-01-20 日本電気株式会社 Organic EL display device and manufacturing method thereof
JP2845856B2 (en) * 1997-03-10 1999-01-13 出光興産株式会社 Method for manufacturing organic electroluminescence device
JPH10270164A (en) 1997-03-26 1998-10-09 Idemitsu Kosan Co Ltd Manufacture of organic electroluminescent element and its manufacturing device
DE29707686U1 (en) * 1997-04-28 1997-06-26 Balzers Prozess Systeme Vertriebs- und Service GmbH, 81245 München Magnetic holder for foil masks
TW411458B (en) * 1997-05-08 2000-11-11 Matsushita Electric Ind Co Ltd Apparatus and process for production of optical recording medium
US5906857A (en) * 1997-05-13 1999-05-25 Ultratherm, Inc. Apparatus, system and method for controlling emission parameters attending vaporized in a HV environment
AUPO712097A0 (en) * 1997-05-30 1997-06-26 Lintek Pty Ltd Vacuum deposition system
JPH10335062A (en) 1997-05-30 1998-12-18 Tdk Corp Device and method for manufacturing organic el element
US6011904A (en) * 1997-06-10 2000-01-04 Board Of Regents, University Of Texas Molecular beam epitaxy effusion cell
JP3508484B2 (en) * 1997-07-14 2004-03-22 松下電器産業株式会社 Method and apparatus for forming functional thin film
JPH1145779A (en) * 1997-07-25 1999-02-16 Tdk Corp Method and device for manufacturing organic el element
JPH1161386A (en) * 1997-08-22 1999-03-05 Fuji Electric Co Ltd Film forming device of organic thin film light emitting element
US6124215A (en) * 1997-10-06 2000-09-26 Chartered Semiconductor Manufacturing Ltd. Apparatus and method for planarization of spin-on materials
DE69734113T2 (en) 1997-10-15 2006-07-13 Toray Industries, Inc. METHOD FOR PRODUCING AN ORGANIC ELECTROLUMINESCENT DEVICE
IT1295340B1 (en) * 1997-10-15 1999-05-12 Getters Spa HIGH SPEED GAS ABSORPTION GETTER PUMP
JP4058149B2 (en) * 1997-12-01 2008-03-05 キヤノンアネルバ株式会社 Mask alignment method for vacuum deposition system
TW466266B (en) 1997-12-18 2001-12-01 Central Glass Co Ltd Gas for removing deposit and removal method using same
JP3014368B2 (en) 1997-12-18 2000-02-28 セントラル硝子株式会社 Cleaning gas
IT1297013B1 (en) * 1997-12-23 1999-08-03 Getters Spa GETTER SYSTEM FOR THE PURIFICATION OF THE WORKING ATMOSPHERE IN PHYSICAL STEAM DEPOSITION PROCESSES
JP3453290B2 (en) * 1997-12-26 2003-10-06 松下電器産業株式会社 Electrode structure for vapor deposition, vapor deposition apparatus, vapor deposition method, and method for manufacturing organic light emitting device
JPH11229123A (en) 1998-02-12 1999-08-24 Casio Comput Co Ltd Vapor deposition device
US6251233B1 (en) * 1998-08-03 2001-06-26 The Coca-Cola Company Plasma-enhanced vacuum vapor deposition system including systems for evaporation of a solid, producing an electric arc discharge and measuring ionization and evaporation
US6284052B2 (en) 1998-08-19 2001-09-04 Sharp Laboratories Of America, Inc. In-situ method of cleaning a metal-organic chemical vapor deposition chamber
JP2000068055A (en) * 1998-08-26 2000-03-03 Tdk Corp Evaporation source for organic el element, manufacturing device for organic el element using the same and manufacture thereof
US6132805A (en) * 1998-10-20 2000-10-17 Cvc Products, Inc. Shutter for thin-film processing equipment
JP3782245B2 (en) 1998-10-28 2006-06-07 Tdk株式会社 Manufacturing apparatus and manufacturing method of organic EL display device
US6214631B1 (en) * 1998-10-30 2001-04-10 The Trustees Of Princeton University Method for patterning light emitting devices incorporating a movable mask
WO2000027802A1 (en) * 1998-11-12 2000-05-18 Ariad Pharmaceuticals, Inc. Bicyclic signal transduction inhibitors, compositions containing them & uses thereof
JP3019095B1 (en) * 1998-12-22 2000-03-13 日本電気株式会社 Manufacturing method of organic thin film EL device
US6328815B1 (en) * 1999-02-19 2001-12-11 Taiwan Semiconductor Manufacturing Company Multiple chamber vacuum processing system configuration for improving the stability of mark shielding process
JP2000348859A (en) 1999-06-03 2000-12-15 Chisso Corp Organic electroluminescent element
US6469439B2 (en) * 1999-06-15 2002-10-22 Toray Industries, Inc. Process for producing an organic electroluminescent device
JP4472056B2 (en) * 1999-07-23 2010-06-02 株式会社半導体エネルギー研究所 Electroluminescence display device and manufacturing method thereof
TW504941B (en) * 1999-07-23 2002-10-01 Semiconductor Energy Lab Method of fabricating an EL display device, and apparatus for forming a thin film
US6660409B1 (en) * 1999-09-16 2003-12-09 Panasonic Communications Co., Ltd Electronic device and process for producing the same
JP4140674B2 (en) * 1999-09-27 2008-08-27 東京エレクトロン株式会社 Method and apparatus for observing porous amorphous film
JP4187367B2 (en) 1999-09-28 2008-11-26 三洋電機株式会社 ORGANIC LIGHT EMITTING ELEMENT, ITS MANUFACTURING DEVICE, AND ITS MANUFACTURING METHOD
TW574396B (en) 1999-10-22 2004-02-01 Kurt J Lesker Company Method and apparatus for coating a substrate in a vacuum
KR20010047128A (en) * 1999-11-18 2001-06-15 이경수 Method of vaporizing a liquid source and apparatus used therefor
US6537607B1 (en) * 1999-12-17 2003-03-25 Texas Instruments Incorporated Selective deposition of emissive layer in electroluminescent displays
TW490714B (en) * 1999-12-27 2002-06-11 Semiconductor Energy Lab Film formation apparatus and method for forming a film
US6244212B1 (en) * 1999-12-30 2001-06-12 Genvac Aerospace Corporation Electron beam evaporation assembly for high uniform thin film
US6633121B2 (en) * 2000-01-31 2003-10-14 Idemitsu Kosan Co., Ltd. Organic electroluminescence display device and method of manufacturing same
US6237529B1 (en) * 2000-03-03 2001-05-29 Eastman Kodak Company Source for thermal physical vapor deposition of organic electroluminescent layers
JP2001279429A (en) * 2000-03-30 2001-10-10 Idemitsu Kosan Co Ltd Method for depositing thin film layer for element and organic electroluminescence element
US20020011205A1 (en) 2000-05-02 2002-01-31 Shunpei Yamazaki Film-forming apparatus, method of cleaning the same, and method of manufacturing a light-emitting device
US7517551B2 (en) * 2000-05-12 2009-04-14 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a light-emitting device
EP1167566B1 (en) * 2000-06-22 2011-01-26 Panasonic Electric Works Co., Ltd. Apparatus for and method of vacuum vapor deposition
JP2002075638A (en) 2000-08-29 2002-03-15 Nec Corp Vapor deposition method of mask and vapor deposition device
JP2002175878A (en) * 2000-09-28 2002-06-21 Sanyo Electric Co Ltd Forming method of layer, and manufacturing method of color luminous device
JP2002105622A (en) 2000-10-04 2002-04-10 Sony Corp Vapor deposition tool and vapor deposition method
TW463522B (en) * 2000-11-07 2001-11-11 Helix Technology Inc Manufacturing method for organic light emitting diode
US6641674B2 (en) * 2000-11-10 2003-11-04 Helix Technology Inc. Movable evaporation device
US7432116B2 (en) * 2001-02-21 2008-10-07 Semiconductor Energy Laboratory Co., Ltd. Method and apparatus for film deposition
US20030015140A1 (en) * 2001-04-26 2003-01-23 Eastman Kodak Company Physical vapor deposition of organic layers using tubular sources for making organic light-emitting devices
JP4704605B2 (en) * 2001-05-23 2011-06-15 淳二 城戸 Continuous vapor deposition apparatus, vapor deposition apparatus and vapor deposition method
JP2003002778A (en) * 2001-06-26 2003-01-08 International Manufacturing & Engineering Services Co Ltd Molecular beam cell for depositing thin film
JP4707271B2 (en) * 2001-06-29 2011-06-22 三洋電機株式会社 Method for manufacturing electroluminescence element
JP2003113466A (en) * 2001-07-31 2003-04-18 Fuji Photo Film Co Ltd Vacuum deposition apparatus
US20030101937A1 (en) * 2001-11-28 2003-06-05 Eastman Kodak Company Thermal physical vapor deposition source for making an organic light-emitting device
US7655397B2 (en) * 2002-04-25 2010-02-02 The United States Of America As Represented By The Department Of Health And Human Services Selections of genes and methods of using the same for diagnosis and for targeting the therapy of select cancers
KR100490537B1 (en) * 2002-07-23 2005-05-17 삼성에스디아이 주식회사 Heating crucible and deposit apparatus utilizing the same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI409349B (en) * 2003-06-27 2013-09-21 Semiconductor Energy Lab Manufacturing apparatus
TWI424075B (en) * 2003-06-27 2014-01-21 Semiconductor Energy Lab Method of manufacturing light emitting device
TWI563106B (en) * 2012-02-17 2016-12-21 Samsung Display Co Ltd Organic layer deposition apparatus, and method of manufacturing organic light emitting display apparatus using the same

Also Published As

Publication number Publication date
US20170137930A1 (en) 2017-05-18
JP2018066066A (en) 2018-04-26
US9559302B2 (en) 2017-01-31
KR20070029770A (en) 2007-03-14
JP2017045728A (en) 2017-03-02
JP6371820B2 (en) 2018-08-08
US20150171329A1 (en) 2015-06-18
US8968823B2 (en) 2015-03-03
CN1790773A (en) 2006-06-21
EP1113087A2 (en) 2001-07-04
JP2013253323A (en) 2013-12-19
US20010006827A1 (en) 2001-07-05
KR100827760B1 (en) 2008-05-07
JP2003293122A (en) 2003-10-15
KR100794292B1 (en) 2008-01-11
JP5315361B2 (en) 2013-10-16
JP4782978B2 (en) 2011-09-28
KR20010062735A (en) 2001-07-07
JP5589115B2 (en) 2014-09-10
JP3833066B2 (en) 2006-10-11
JP2016000859A (en) 2016-01-07
US8119189B2 (en) 2012-02-21
JP2013147754A (en) 2013-08-01
CN1302173A (en) 2001-07-04
CN1240250C (en) 2006-02-01
CN100517798C (en) 2009-07-22
US20100021624A1 (en) 2010-01-28
EP1113087B1 (en) 2016-08-31
EP1113087A3 (en) 2003-11-19
JP2001247959A (en) 2001-09-14
JP2011117083A (en) 2011-06-16
JP2013249543A (en) 2013-12-12
JP5856110B2 (en) 2016-02-09

Similar Documents

Publication Publication Date Title
TW490714B (en) Film formation apparatus and method for forming a film
TWI275319B (en) Manufacturing method and method of operating a manufacturing apparatus
TWI330382B (en) Manufacturing apparatus
JP2002367781A (en) Film-forming device and film-forming method
JP2014520371A (en) Mask management system and method for OLED encapsulation
US20140166989A1 (en) Manufacturing flexible organic electronic devices
US20090156084A1 (en) Light emitting device and method for manufacturing light emitting device
WO2017132907A1 (en) A shadow mask with tapered openings formed by double electroforming
US20040043525A1 (en) Method of forming protection film for covering electronic component and electronic device having protection film
JP2008038224A (en) Film deposition apparatus, film deposition system, and film deposition method
JP2000353593A (en) Manufacturing device for and manufacture of organic electroluminescence display panel
JP6556802B2 (en) Vacuum equipment, vapor deposition equipment and gate valve
JP2004288463A5 (en) Evaporation apparatus and method
TW200818969A (en) Manufacturing device of light-emitting element, and manufacturing method of light-emitting element
JP2024098615A (en) Substrate processing method and substrate processing apparatus
JP2006221911A (en) Mask for film formation, method to prepare the same, and device and method for manufacturing light-emitting element
JP2007328999A (en) Apparatus and method for manufacturing light emitting element

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees