CH611016A5 - - Google Patents

Info

Publication number
CH611016A5
CH611016A5 CH1084176A CH1084176A CH611016A5 CH 611016 A5 CH611016 A5 CH 611016A5 CH 1084176 A CH1084176 A CH 1084176A CH 1084176 A CH1084176 A CH 1084176A CH 611016 A5 CH611016 A5 CH 611016A5
Authority
CH
Switzerland
Application number
CH1084176A
Inventor
Paul L Dimatteo
Joseph A Ross
Howard K Stern
Original Assignee
Dynell Elec
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dynell Elec filed Critical Dynell Elec
Publication of CH611016A5 publication Critical patent/CH611016A5/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/02Picture taking arrangements specially adapted for photogrammetry or photographic surveying, e.g. controlling overlapping of pictures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2536Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
CH1084176A 1975-08-27 1976-08-26 CH611016A5 (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/608,265 US4175862A (en) 1975-08-27 1975-08-27 Arrangement for sensing the geometric characteristics of an object

Publications (1)

Publication Number Publication Date
CH611016A5 true CH611016A5 (xx) 1979-05-15

Family

ID=24435735

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1084176A CH611016A5 (xx) 1975-08-27 1976-08-26

Country Status (13)

Country Link
US (2) US4175862A (xx)
JP (1) JPS5229252A (xx)
BE (1) BE845465A (xx)
CA (1) CA1079965A (xx)
CH (1) CH611016A5 (xx)
DE (1) DE2637905A1 (xx)
DK (1) DK386576A (xx)
ES (1) ES451007A1 (xx)
FR (1) FR2322358A1 (xx)
GB (1) GB1570091A (xx)
IT (1) IT1073688B (xx)
NL (1) NL7609498A (xx)
SE (2) SE432021B (xx)

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JP4953589B2 (ja) * 2005-05-25 2012-06-13 株式会社ミツトヨ エンコーダの原点信号生成方法及び装置
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US8646689B2 (en) 2007-12-28 2014-02-11 Cognex Corporation Deformable light pattern for machine vision system
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US8908016B2 (en) * 2008-10-06 2014-12-09 Mantivision Ltd. Method and system for providing three-dimensional and range inter-planar estimation
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JP6104662B2 (ja) * 2013-03-25 2017-03-29 株式会社東芝 計測装置、方法及びプログラム
US10620709B2 (en) 2013-04-05 2020-04-14 Ultrahaptics IP Two Limited Customized gesture interpretation
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US10281987B1 (en) 2013-08-09 2019-05-07 Leap Motion, Inc. Systems and methods of free-space gestural interaction
US10846942B1 (en) 2013-08-29 2020-11-24 Ultrahaptics IP Two Limited Predictive information for free space gesture control and communication
US9632572B2 (en) 2013-10-03 2017-04-25 Leap Motion, Inc. Enhanced field of view to augment three-dimensional (3D) sensory space for free-space gesture interpretation
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US9996638B1 (en) 2013-10-31 2018-06-12 Leap Motion, Inc. Predictive information for free space gesture control and communication
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US11875012B2 (en) 2018-05-25 2024-01-16 Ultrahaptics IP Two Limited Throwable interface for augmented reality and virtual reality environments
CN111489382B (zh) * 2019-01-28 2023-03-31 合肥美亚光电技术股份有限公司 编码条纹图的获取以及基于结构光的重构的方法和装置
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Also Published As

Publication number Publication date
DE2637905A1 (de) 1977-03-10
DK386576A (da) 1977-02-28
SE7609326L (sv) 1977-02-28
FR2322358B1 (xx) 1981-11-27
IT1073688B (it) 1985-04-17
FR2322358A1 (fr) 1977-03-25
SE8204577D0 (sv) 1982-08-04
JPS5229252A (en) 1977-03-04
US4145991A (en) 1979-03-27
US4175862A (en) 1979-11-27
GB1570091A (en) 1980-06-25
ES451007A1 (es) 1977-08-16
CA1079965A (en) 1980-06-24
SE8204577L (sv) 1982-08-04
NL7609498A (nl) 1977-03-01
JPS6232406B2 (xx) 1987-07-14
SE432021B (sv) 1984-03-12
BE845465A (fr) 1976-12-16

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Legal Events

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PL Patent ceased