Jiang et al., 2011 - Google Patents

A modified layer-removal method for residual stress measurement in electrodeposited nickel films

Jiang et al., 2011

View PDF
Document ID
9412483283139854326
Author
Jiang L
Peng J
Liao Y
Zhou Y
Liang J
Hao H
Lu C
Publication year
Publication venue
Thin Solid Films

External Links

Snippet

Combining the traditional layer-removal method with a cantilever beam model, a modified layer-removal method is developed and used to measure residual stress in single and multi- layer electrodeposited nickel films with thickness of 2.5 μm. The out-of-plane displacement …
Continue reading at espace.curtin.edu.au (PDF) (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/026Specifications of the specimen
    • G01N2203/0262Shape of the specimen
    • G01N2203/0278Thin specimens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/025Geometry of the test
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/0202Control of the test
    • G01N2203/0212Theories, calculations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40Investigating hardness or rebound hardness
    • G01N3/42Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058Kind of property studied
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/20Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0014Type of force applied

Similar Documents

Publication Publication Date Title
Ast et al. Size-dependent fracture toughness of tungsten
Pan et al. History-independent cyclic response of nanotwinned metals
Balk et al. Tensile and compressive microspecimen testing of bulk nanoporous gold
Bull Nanoindentation of coatings
Zhang et al. Toughness evaluation of hard coatings and thin films
Mara et al. Tensile behavior of 40 nm Cu/Nb nanoscale multilayers
Shiri et al. Evaluation of Stoney equation for determining the internal stress of DLC thin films using an optical profiler
Jiang et al. A modified layer-removal method for residual stress measurement in electrodeposited nickel films
Baczmanski et al. Multi-reflection method and grazing incidence geometry used for stress measurement by X-ray diffraction
Yang et al. On the strength-hardness relationships in a Zr-Nb alloy plate with bimodal basal texture microstructure
Chen et al. Small scale, grain size and substrate effects in nano-indentation experiment of film–substrate systems
Chen et al. Residual stress analysis of electrodeposited thick CoMnP monolayers and CoMnP/Cu multilayers
Tang et al. The role of rough surface in the size-dependent behavior upon nano-indentation
Chen et al. Tensile testing of thin films supported on compliant substrates
Jin et al. In situ study of cracking and buckling of chromium films on PET substrates
Humphrey et al. Strain-rate sensitivity of strength in macro-to-micro-to-nano crystalline nickel
Mueller et al. Mechanical properties of electrodeposited amorphous/crystalline multilayer structures in the Fe-P system
Ye et al. Determination of fatigue mesoscopic mechanical properties of an austenitic stainless steel using depth-sensing indentation (DSI) technique
Pantelakis et al. Surface hardness increase of 2024 aluminum alloy subjected to cyclic loading
Sebastiani et al. On the influence of residual stress on nano-mechanical characterization of thin coatings
Kim et al. Fracture toughness of free-standing nanocrystalline copper–chromium composite thin films
Demir et al. A numerical methodology for monitoring stress distributions and experimental proof of the concept on metal embedded thin polymer-matrix composites using X-ray Diffraction
Gdoutos et al. Indentation testing
Wei et al. Determination of the residual stress in texture Cu-Ni-Si-Co alloy with HEXRD
Ko et al. Mechanical properties and residual stress measurements in anodic aluminium oxide structures using nanoindentation