Ta et al., 2018 - Google Patents

Fully digital background calibration technique for channel mismatches in TIADCs

Ta et al., 2018

View PDF
Document ID
5418643629008674371
Author
Ta V
Thi Y
Le Duc H
Hoang V
Publication year
Publication venue
2018 5th NAFOSTED conference on information and computer science (NICS)

External Links

Snippet

Time-interleaved analog-to-digital converter (TIADC) is a promising approach to meet the requirement of very high speed wireless communication systems. However, mismatches between the channels in a TIADC cause the spurious images in the output spectrum, thus …
Continue reading at eprints.lqdtu.edu.vn (PDF) (other versions)

Classifications

    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0626—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by filtering
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0836—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of phase error, e.g. jitter
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H—ELECTRICITY
    • H03—BASIC ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated

Similar Documents

Publication Publication Date Title
CN108471313B (en) Digital-analog mixed signal-based TIADC system calibration method
CN102857225B (en) Mismatch error calibration method for multi-channel high-speed parallel alternate sampling system
Jin et al. A digital-background calibration technique for minimizing timing-error effects in time-interleaved ADCs
US8094050B2 (en) Bandwidth mismatch estimation in time-interleaved analog-to-digital converters
US20170117914A1 (en) Method and apparatus for providing digital background calibration for mismatches in m-channel time-interleved adcs (ti-adcs)
Le Duc et al. Fully digital feedforward background calibration of clock skews for sub-sampling TIADCs using the polyphase decomposition
WO2015197010A1 (en) Multi-channel time-interleaved analog-to-digital converter
US20120326902A1 (en) Background calibration of offsets in interleaved analog to digital converters
CN106341132B (en) The error blind correction method of time-interleaved sampling ADC
Le Duc et al. A fully digital background calibration of timing skew in undersampling TI-ADC
CN108055039B (en) All-digital calibration module for TIADC sampling time error and calibration method thereof
Chen et al. All-digital background calibration technique for timing mismatch of time-interleaved ADCs
Zou et al. Timing mismatch compensation in time-interleaved ADCs based on multichannel Lagrange polynomial interpolation
Ta et al. Fully digital background calibration technique for channel mismatches in TIADCs
Li et al. A background correlation-based timing skew estimation method for time-interleaved ADCs
CN115776299A (en) Low-complexity time mismatch error calibration method for TIADC
Han et al. An All-Digital Background Calibration Technique for M-Channel Downsampling Time-Interleaved ADCs Based on Interpolation
WO2011039859A1 (en) Analog/digital converter and semiconductor integrated circuit device using the same
Harpe et al. Analog calibration of channel mismatches in time‐interleaved ADCs
Divi et al. Scalable blind calibration of timing skew in high-resolution time-interleaved ADCs
TW202110100A (en) Analog to digital converter device and method for calibrating clock skew
Xie et al. All-digital calibration algorithm based on channel multiplexing for TI-ADCs
Cao et al. An efficient background timing skew calibration technique for time-interleaving analog-to-digital converters
Ta et al. All-Digital Background Calibration Technique for Offset, Gain and Timing Mismatches in Time-Interleaved ADCs
KR101691367B1 (en) METHOD OF PROVIDING DIGITAL BACKGROUND CALIBRATION FOR MISMATCHES IN M-CHANNEL TI-ADCs AND THE APPARATUS THEREOF