Ferragina et al., 2004 - Google Patents
Gain and offset mismatch calibration in time-interleaved multipath A/D sigma-delta modulatorsFerragina et al., 2004
View PDF- Document ID
- 16737132716011387977
- Author
- Ferragina V
- Fornasari A
- Gatti U
- Malcovati P
- Maloberti F
- Publication year
- Publication venue
- IEEE Transactions on Circuits and Systems I: Regular Papers
External Links
Snippet
We propose a digital background adaptive calibration technique for correcting offset and gain mismatches in time-interleaved multipath analog-digital (A/D) sigma-delta (/spl Sigma//spl Delta/) modulators. The proposed technique allows us to cancel the spurious …
- 230000000051 modifying 0 title abstract description 52
Classifications
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
- H03M1/0656—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain
- H03M1/066—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain by continuously permuting the elements used, i.e. dynamic element matching
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0626—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by filtering
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
- H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0614—Continuously compensating for, or preventing, undesired influence of physical parameters of harmonic distortion
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/39—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators
- H03M3/412—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the number of quantisers and their type and resolution
- H03M3/422—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the number of quantisers and their type and resolution having one quantiser only
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
- H03M1/0836—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of phase error, e.g. jitter
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/74—Simultaneous conversion
- H03M1/80—Simultaneous conversion using weighted impedances
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
- H03M1/0863—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of switching transients, e.g. glitches
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/50—Digital/analogue converters using delta-sigma modulation as an intermediate step
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Ferragina et al. | Gain and offset mismatch calibration in time-interleaved multipath A/D sigma-delta modulators | |
Jamal et al. | A 10-b 120-Msample/s time-interleaved analog-to-digital converter with digital background calibration | |
Harpe | A compact 10-b SAR ADC with unit-length capacitors and a passive FIR filter | |
Siragusa et al. | A digitally enhanced 1.8-V 15-bit 40-MSample/s CMOS pipelined ADC | |
Kull et al. | Implementation of low-power 6–8 b 30–90 GS/s time-interleaved ADCs with optimized input bandwidth in 32 nm CMOS | |
Kramer et al. | A 14 b 35 MS/s SAR ADC achieving 75 dB SNDR and 99 dB SFDR with loop-embedded input buffer in 40 nm CMOS | |
Fu et al. | A digital background calibration technique for time-interleaved analog-to-digital converters | |
CN106888018B (en) | Digital measurement of DAC timing mismatch error | |
Jin et al. | A digital-background calibration technique for minimizing timing-error effects in time-interleaved ADCs | |
Dyer et al. | An analog background calibration technique for time-interleaved analog-to-digital converters | |
Panigada et al. | A 130 mW 100 MS/s pipelined ADC with 69 dB SNDR enabled by digital harmonic distortion correction | |
Doris et al. | A 480 mW 2.6 GS/s 10b time-interleaved ADC with 48.5 dB SNDR up to Nyquist in 65 nm CMOS | |
Nagaraj et al. | A 250-mW, 8-b, 52-Msamples/s parallel-pipelined A/D converter with reduced number of amplifiers | |
Maloberti | Data converters specifications | |
US9838031B2 (en) | Dither injection for continuous-time MASH ADCS | |
Zhu et al. | Split-SAR ADCs: Improved linearity with power and speed optimization | |
Law et al. | A four-channel time-interleaved ADC with digital calibration of interchannel timing and memory errors | |
Ghosh et al. | Linearization through dithering: A 50 MHz bandwidth, 10-b ENOB, 8.2 mW VCO-based ADC | |
Rapuano et al. | ADC parameters and characteristics | |
Venca et al. | A 0.076 mm2 12 b 26.5 mW 600 MS/s 4-Way Interleaved Subranging SAR-$\Delta\Sigma $ ADC With On-Chip Buffer in 28 nm CMOS | |
Murmann | Digitally assisted data converter design | |
Falakshahi et al. | A 14-bit, 10-Msamples/s D/A converter using multibit/spl Sigma//spl Delta/modulation | |
Yu et al. | A low-power multi-bit/spl sigma//spl delta/modulator in 90-nm digital cmos without dem | |
Kong et al. | A 600-MS/s DAC with over 87-dB SFDR and 77-dB peak SNDR enabled by adaptive cancellation of static and dynamic mismatch error | |
Niu et al. | An efficient spur-aliasing-free spectral calibration technique in time-interleaved ADCs |