Klein-Wiele et al., 2006 - Google Patents
Fabrication of SiO2 phase gratings by UV laser patterning of silicon suboxide layers and subsequent oxidationKlein-Wiele et al., 2006
View PDF- Document ID
- 10441112064965037901
- Author
- Klein-Wiele J
- Békési J
- Simon P
- Ihlemann J
- Publication year
- Publication venue
- J. Laser Micro/Nanoeng
External Links
Snippet
UV transparent phase masks are used in various laser applications like fabrication of Bragg gratings in optical fibers or micro patterning by high power laser ablation. Normally they are fabricated by a costly lithographic process including e-beam writing and reactive ion etching …
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicium dioxide 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O=[Si]=O 0 title abstract description 19
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B6/00—Light guides
- G02B6/10—Light guides of the optical waveguide type
- G02B6/12—Light guides of the optical waveguide type of the integrated circuit kind
- G02B6/122—Light guides of the optical waveguide type of the integrated circuit kind basic optical elements, e.g. light-guiding paths
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B6/00—Light guides
- G02B6/10—Light guides of the optical waveguide type
- G02B6/12—Light guides of the optical waveguide type of the integrated circuit kind
- G02B6/13—Integrated optical circuits characterised by the manufacturing method
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Exposure apparatus for microlithography
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