TWI837980B - Scalable transmission line detection system and method thereof - Google Patents

Scalable transmission line detection system and method thereof Download PDF

Info

Publication number
TWI837980B
TWI837980B TW111146121A TW111146121A TWI837980B TW I837980 B TWI837980 B TW I837980B TW 111146121 A TW111146121 A TW 111146121A TW 111146121 A TW111146121 A TW 111146121A TW I837980 B TWI837980 B TW I837980B
Authority
TW
Taiwan
Prior art keywords
connection interface
plug
transmission line
control device
signal
Prior art date
Application number
TW111146121A
Other languages
Chinese (zh)
Other versions
TW202424505A (en
Inventor
鄒凱
Original Assignee
英業達股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 英業達股份有限公司 filed Critical 英業達股份有限公司
Priority to TW111146121A priority Critical patent/TWI837980B/en
Application granted granted Critical
Publication of TWI837980B publication Critical patent/TWI837980B/en
Publication of TW202424505A publication Critical patent/TW202424505A/en

Links

Landscapes

  • Arrangements For Transmission Of Measured Signals (AREA)
  • Communication Control (AREA)

Abstract

A Scalable transmission line detection system and a method thereof are provided. Plug signal is triggered by shrapnel switch when connection interface of first dummy riser card and second dummy riser card are plugged through transmission line to provide to control device by JTAG connection interface of first dummy riser card and second dummy riser card and TAP controller. Detection data is generated by control device to transfer to first dummy riser card and feedback data is received by control device from second dummy riser card. Transmission line is detected according to detection data and feedback data by control device. Therefore, the efficiency of transmission line detection with scalability may be achieved.

Description

具擴展性的傳輸線檢測系統及其方法Scalable transmission line detection system and method thereof

一種檢測系統及其方法,尤其是指一種具擴展性的傳輸線檢測系統及其方法。 A detection system and method thereof, in particular, a scalable transmission line detection system and method thereof.

電路板彼此之間的連接一般是透過傳輸線相連,而傳輸線的品質差異即會直接影響到電路板是否正常工作,對於傳輸線的檢測一般是採用傳輸線檢測儀對傳輸線的導通、錯位、短路、斷路…等故障與否進行檢測。 Circuit boards are usually connected to each other through transmission lines, and the quality of the transmission lines will directly affect whether the circuit boards work properly. Transmission line testing is usually done by using transmission line testers to test whether the transmission lines are conducting, misaligned, short-circuited, or open-circuited.

然而傳輸線檢測儀只能適用於常用規格的傳輸線檢測,若是設計出新的連接界面及其對應的傳輸線,現有的傳輸線檢測儀將無法對新設計出的傳輸線進行檢測,只能依靠人工對新設計出的傳輸線進行檢測。 However, transmission line testers can only be used to test transmission lines of commonly used specifications. If a new connection interface and its corresponding transmission line are designed, the existing transmission line testers will not be able to test the newly designed transmission line, and the newly designed transmission line can only be tested manually.

綜上所述,可知先前技術中長期以來一直存在現有使用傳輸線檢測儀對傳輸線進行檢測擴展性不足的問題,因此有必要提出改進的技術手段,來解決此一問題。 In summary, it can be seen that the existing technology of using transmission line detectors to detect transmission lines has long had the problem of insufficient scalability, so it is necessary to propose improved technical means to solve this problem.

有鑒於先前技術存在現有使用傳輸線檢測儀對傳輸線進行檢測擴展性不足的問題,本發明遂揭露一種具擴展性的傳輸線檢測系統及其方法,其中:本發明所揭露的具擴展性的傳輸線檢測系統,其包含:第一虛擬化轉卡、第二虛擬化轉卡、測試存取埠(Test Access Port,TAP)控制器以及控制裝置,第一虛擬化轉卡更包含:第一聯合測試工作群組(Joint Test Action Group,JTAG)連接介面、第一快捷外設互聯標準(Peripheral Component Interconnect Express,PCIE)連接介面、第一連接介面以及第二連接介面;第二虛擬化轉卡更包含:第二JTAG連接介面、第二PCIE連接介面、第三連接介面以及第四連接介面。 In view of the problem that the existing transmission line tester used in the prior art is insufficiently scalable for testing the transmission line, the present invention discloses an expandable transmission line testing system and method thereof, wherein: the expandable transmission line testing system disclosed in the present invention comprises: a first virtualization adapter, a second virtualization adapter, a test access port (TAP) controller and a control device, the first virtualization adapter further comprises: a first Joint Test Action Group (JTAG) connection interface, a first Peripheral Component Interconnect Express (PCIE) connection interface, a first connection interface and a second connection interface; the second virtualization adapter further comprises: a second JTAG connection interface, a second PCIE connection interface, a third connection interface and a fourth connection interface.

第一虛擬化轉卡的第一PCIE連接介面與第一JTAG連接介面形成電性連接;第一虛擬化轉卡的第一連接介面透過第一邊界掃描(Boundary Scan,BS)輸入輸出(Input/Output,IO)線路群組與第一PCIE連接介面形成電性連接,第一連接介面具有第一彈片開關;及第一虛擬化轉卡的第二連接介面透過第二BS_IO線路群組與第一PCIE連接介面形成電性連接,第二連接介面具有第二彈片開關。 The first PCIE connection interface of the first virtualization adapter is electrically connected to the first JTAG connection interface; the first connection interface of the first virtualization adapter is electrically connected to the first PCIE connection interface through a first boundary scan (BS) input/output (IO) line group, and the first connection interface has a first spring switch; and the second connection interface of the first virtualization adapter is electrically connected to the first PCIE connection interface through a second BS_IO line group, and the second connection interface has a second spring switch.

第二虛擬化轉卡的第二PCIE連接介面與第二JTAG連接介面形成電性連接;第二虛擬化轉卡的第三連接介面透過第三BS_IO線路群組與第二PCIE連接介面形成電性連接,第三連接介面具有第三彈片開關;及第二虛擬化轉卡的第四連接介面透過第四BS_IO線路群組與第二PCIE連接介面形成電性連接,第四連接介面具有第四彈片開關。 The second PCIE connection interface of the second virtualization adapter is electrically connected to the second JTAG connection interface; the third connection interface of the second virtualization adapter is electrically connected to the second PCIE connection interface through the third BS_IO line group, and the third connection interface has a third spring switch; and the fourth connection interface of the second virtualization adapter is electrically connected to the second PCIE connection interface through the fourth BS_IO line group, and the fourth connection interface has a fourth spring switch.

測試存取埠(Test Access Port,TAP)控制器與第一JTAG連接介面以及第二JTAG連接介面形成電性連接;及控制裝置與TAP控制器形成電性連接。 The test access port (TAP) controller is electrically connected to the first JTAG connection interface and the second JTAG connection interface; and the control device is electrically connected to the TAP controller.

其中,第一連接介面或是第二連接介面被傳輸線插接,第一彈片開關觸發第一插接訊號或是第二彈片開關觸發第二插接訊號;第一插接訊號或是第二插接訊號透過第一JTAG連接介面以及TAP控制器提供至控制裝置;第三連接介面或是第四連接介面被傳輸線插接,第三彈片開關觸發第三插接訊號或是第四彈片開關觸發第四插接訊號;第三插接訊號或是第四插接訊號透過第二JTAG連接介面以及TAP控制器提供至控制裝置;控制裝置生成檢測數據以傳送至第一連接介面或是第二連接介面,並自第三連接介面或是第四連接介面接收反饋數據;及控制裝置比對檢測數據以及反饋數據以進行傳輸線的檢測。 Wherein, the first connection interface or the second connection interface is plugged by the transmission line, the first spring switch triggers the first plug signal or the second spring switch triggers the second plug signal; the first plug signal or the second plug signal is provided to the control device through the first JTAG connection interface and the TAP controller; the third connection interface or the fourth connection interface is plugged by the transmission line, the third spring switch triggers the third plug signal or the fourth spring switch triggers the fourth plug signal; the third plug signal or the fourth plug signal is provided to the control device through the second JTAG connection interface and the TAP controller; the control device generates detection data to be transmitted to the first connection interface or the second connection interface, and receives feedback data from the third connection interface or the fourth connection interface; and the control device compares the detection data and the feedback data to perform transmission line detection.

本發明所揭露的具擴展性的傳輸線檢測方法,其包含下列步驟:首先,第一虛擬化轉卡具有第一JTAG連接介面、第一PCIE連接介面、第一連接介面以及第二連接介面;接著,第一PCIE連接介面與第一JTAG連接介面形成電性連接;接著,第一連接介面透過第一BS_IO線路群組與第一PCIE連接介面形成電性連接,第一連接介面具有第一彈片開關;接著,第二連接介面透過第二BS_IO線路群組與第一PCIE連接介面形成電性連接,第二連接介面具有第二彈片開關;接著,第二虛擬化轉卡具有第二JTAG連接介面、第二PCIE連接介面、第三連接介面以及第四連接介面;接著,第二PCIE連接介面與第二JTAG連接介面形成電性連接;接著,第三連接介面透過第三BS_IO線路群組與第二PCIE連接介面形成電性連接,第三連接介面具有第三彈片開關;接著,第四連接介面透過第四BS_IO線路群組與第二PCIE連接介面形成電 性連接,第四連接介面具有第四彈片開關;接著,TAP控制器與第一JTAG連接介面以及第二JTAG連接介面形成電性連接;接著,控制裝置與TAP控制器形成電性連接;接著,第一連接介面或是第二連接介面被傳輸線插接,第一彈片開關觸發第一插接訊號或是第二彈片開關觸發第二插接訊號;接著,第一插接訊號或是第二插接訊號透過第一JTAG連接介面以及TAP控制器提供至控制裝置;接著,第三連接介面或是第四連接介面被傳輸線插接,第三彈片開關觸發第三插接訊號或是第四彈片開關觸發第四插接訊號;接著,第三插接訊號或是第四插接訊號透過第二JTAG連接介面以及TAP控制器提供至控制裝置;接著,控制裝置生成檢測數據以傳送至第一連接介面或是第二連接介面,並自第三連接介面或是第四連接介面接收反饋數據;最後,控制裝置比對檢測數據以及反饋數據以進行傳輸線的檢測。 The scalable transmission line detection method disclosed in the present invention includes the following steps: first, a first virtualization adapter card has a first JTAG connection interface, a first PCIE connection interface, a first connection interface and a second connection interface; then, the first PCIE connection interface is electrically connected to the first JTAG connection interface; then, the first connection interface is electrically connected to the first PCIE connection interface through a first BS_IO line group, and the first connection interface has a first spring switch; then, the second connection interface is electrically connected to the first PCIE connection interface through a second BS_IO line group. The second PCIE connection interface is electrically connected, and the second connection interface has a second spring switch; then, the second virtualization adapter card has a second JTAG connection interface, a second PCIE connection interface, a third connection interface, and a fourth connection interface; then, the second PCIE connection interface is electrically connected to the second JTAG connection interface; then, the third connection interface is electrically connected to the second PCIE connection interface through a third BS_IO line group, and the third connection interface has a third spring switch; then, the fourth connection interface is electrically connected to the fourth BS_IO line group through the fourth BS_IO line group. The second PCIE connection interface forms an electrical connection, and the fourth connection interface has a fourth spring switch; then, the TAP controller forms an electrical connection with the first JTAG connection interface and the second JTAG connection interface; then, the control device forms an electrical connection with the TAP controller; then, the first connection interface or the second connection interface is plugged into the transmission line, and the first spring switch triggers the first plug signal or the second spring switch triggers the second plug signal; then, the first plug signal or the second plug signal is provided to the control device through the first JTAG connection interface and the TAP controller. Then, the third connection interface or the fourth connection interface is plugged by the transmission line, and the third spring switch triggers the third plug signal or the fourth spring switch triggers the fourth plug signal; Then, the third plug signal or the fourth plug signal is provided to the control device through the second JTAG connection interface and the TAP controller; Then, the control device generates detection data to be transmitted to the first connection interface or the second connection interface, and receives feedback data from the third connection interface or the fourth connection interface; Finally, the control device compares the detection data and the feedback data to perform transmission line detection.

本發明所揭露的系統及方法如上,與先前技術之間的差異在於第一虛擬化轉卡以及第二虛擬化轉卡的連接介面被傳輸線插接時彈片開關觸發插接訊號透過第一虛擬化轉卡以及第二虛擬化轉卡的JTAG連接介面以及TAP控制器提供至控制裝置,控制裝置生成檢測數據以傳送至第一虛擬化轉卡再自第二虛擬化轉卡接收反饋數據以進行傳輸線的檢測。 The system and method disclosed in the present invention are as described above. The difference between the system and the prior art is that when the connection interface of the first virtualization adapter and the second virtualization adapter is plugged by the transmission line, the spring switch triggers the plug-in signal to be provided to the control device through the JTAG connection interface and TAP controller of the first virtualization adapter and the second virtualization adapter. The control device generates detection data to be transmitted to the first virtualization adapter and then receives feedback data from the second virtualization adapter to perform transmission line detection.

透過上述的技術手段,本發明可以達成提供具擴展性的傳輸線檢測的技術功效。 Through the above-mentioned technical means, the present invention can achieve the technical effect of providing scalable transmission line detection.

10:第一虛擬化轉卡 10: The first virtualization card conversion

11:第一JTAG連接介面 11: First JTAG connection interface

12:第一PCIE連接介面 12: First PCIE connection interface

13:第一連接介面 13: First connection interface

14:第二連接介面 14: Second connection interface

151:第一彈片開關 151: First spring switch

152:第二彈片開關 152: Second spring switch

161:第一BS_IO線路群組 161: First BS_IO line group

162:第二BS_IO線路群組 162: Second BS_IO line group

20:第二虛擬化轉卡 20: Second virtualization card conversion

21:第二JTAG連接介面 21: Second JTAG connection interface

22:第二PCIE連接介面 22: Second PCIE connection interface

23:第三連接介面 23: Third connection interface

24:第四連接介面 24: Fourth connection interface

251:第三彈片開關 251: Third spring switch

252:第四彈片開關 252: The fourth spring switch

261:第三BS_IO線路群組 261: Third BS_IO line group

262:第四BS_IO線路群組 262: Fourth BS_IO line group

30:TAP控制器 30:TAP controller

40:控制裝置 40: Control device

50:傳輸線 50: Transmission line

60:插腳輸出圖 60: Pin output diagram

步驟701:第一虛擬化轉卡具有第一JTAG連接介面、第一PCIE連接介面、第一連接介面以及第二連接介面 Step 701: The first virtualization adapter card has a first JTAG connection interface, a first PCIE connection interface, a first connection interface, and a second connection interface

步驟702:第一PCIE連接介面與第一JTAG連接介面形成電性連接 Step 702: The first PCIE connection interface forms an electrical connection with the first JTAG connection interface

步驟703:第一連接介面透過第一BS_IO線路群組與第一PCIE連接介面形成電性連接,第一連接介面具有第一彈片開關 Step 703: The first connection interface forms an electrical connection with the first PCIE connection interface through the first BS_IO line group, and the first connection interface has a first spring switch

步驟704:第二連接介面透過第二BS_IO線路群組與第一PCIE連接介面形成電性連接,第二連接介面具有第二彈片開關 Step 704: The second connection interface is electrically connected to the first PCIE connection interface through the second BS_IO line group, and the second connection interface has a second spring switch

步驟705:第二虛擬化轉卡具有第二JTAG連接介面、第二PCIE連接介面、第三連接介面以及第四連接介面 Step 705: The second virtualization adapter card has a second JTAG connection interface, a second PCIE connection interface, a third connection interface, and a fourth connection interface

步驟706:第二PCIE連接介面與第二JTAG連接介面形成電性連接 Step 706: The second PCIE connection interface forms an electrical connection with the second JTAG connection interface

步驟707:第三連接介面透過第三BS_IO線路群組與第二PCIE連接介面形成電性連接,第三連接介面具有第三彈片開關 Step 707: The third connection interface is electrically connected to the second PCIE connection interface through the third BS_IO line group, and the third connection interface has a third spring switch

步驟708:第四連接介面透過第四BS_IO線路群組與第二PCIE連接介面形成電性連接,第四連接介面具有第四彈片開關 Step 708: The fourth connection interface is electrically connected to the second PCIE connection interface through the fourth BS_IO line group, and the fourth connection interface has a fourth spring switch

步驟709:TAP控制器與第一JTAG連接介面以及第二JTAG連接介面形成電性連接 Step 709: The TAP controller forms an electrical connection with the first JTAG connection interface and the second JTAG connection interface

步驟710:控制裝置與TAP控制器形成電性連接 Step 710: The control device forms an electrical connection with the TAP controller

步驟711:第一連接介面或是第二連接介面被傳輸線插接,第一彈片開關觸發第一插接訊號或是第二彈片開關觸發第二插接訊號 Step 711: The first connection interface or the second connection interface is plugged into the transmission line, and the first spring switch triggers the first plug signal or the second spring switch triggers the second plug signal

步驟712:第一插接訊號或是第二插接訊號透過第一JTAG連接介面以及TAP控制器提供至控制裝置 Step 712: The first plug signal or the second plug signal is provided to the control device via the first JTAG connection interface and the TAP controller

步驟713:第三連接介面或是第四連接介面被傳輸線插接,第三彈片開關觸發第三插接訊號或是第四彈片開關觸發第四插接訊號 Step 713: The third connection interface or the fourth connection interface is plugged into the transmission line, and the third spring switch triggers the third plug signal or the fourth spring switch triggers the fourth plug signal

步驟714:第三插接訊號或是第四插接訊號透過第二JTAG連接介面以及TAP控制器提供至控制裝置 Step 714: The third plug signal or the fourth plug signal is provided to the control device via the second JTAG connection interface and the TAP controller.

步驟715:控制裝置生成檢測數據以傳送至第一連接介面或是第二連接介面,並自第三連接介面或是第四連接介面接收反饋數據 Step 715: The control device generates detection data to be transmitted to the first connection interface or the second connection interface, and receives feedback data from the third connection interface or the fourth connection interface

步驟716:控制裝置比對檢測數據以及反饋數據以進行傳輸線的檢測 Step 716: The control device compares the detection data and feedback data to perform transmission line detection

第1圖繪示為本發明具擴展性的傳輸線檢測系統的系統方塊圖。 Figure 1 shows a system block diagram of the scalable transmission line detection system of the present invention.

第2A圖至第2D圖繪示為本發明具擴展性的傳輸線檢測的傳輸線連接示意圖。 Figures 2A to 2D are schematic diagrams of transmission line connections for the scalable transmission line detection of the present invention.

第3圖繪示為本發明具擴展性的傳輸線檢測的插腳輸出圖示意圖。 Figure 3 is a schematic diagram of the pin output diagram of the scalable transmission line detection of the present invention.

第4A圖至第4C圖繪示為本發明具擴展性的傳輸線檢測方法的方法流程圖。 Figures 4A to 4C show the flow chart of the scalable transmission line detection method of the present invention.

以下將配合圖式及實施例來詳細說明本發明的實施方式,藉此對本發明如何應用技術手段來解決技術問題並達成技術功效的實現過程能充分理解並據以實施。 The following will be used in conjunction with diagrams and examples to explain in detail the implementation of the present invention, so that the process of how the present invention applies technical means to solve technical problems and achieve technical effects can be fully understood and implemented accordingly.

以下首先要說明本發明所揭露的具擴展性的傳輸線檢測系統,並請參考「第1圖」所示,「第1圖」繪示為本發明具擴展性的傳輸線檢測系統的系統方塊圖。 The following first describes the scalable transmission line detection system disclosed in the present invention, and please refer to "Figure 1", which shows a system block diagram of the scalable transmission line detection system of the present invention.

本發明所揭露的具擴展性的傳輸線檢測系統,其包含:第一虛擬化轉卡10、第二虛擬化轉卡20、TAP控制器30以及控制裝置40,第一虛擬化轉卡10更包含:第一JTAG連接介面11、第一PCIE連接介面12、第一連接介面13以及第二連接介面14;第二虛擬化轉卡20更包含:第二JTAG連接介面21、第二PCIE連接介面22、第三連接介面23以及第四連接介面24,值得注意的是,第一連接介面13、第二連接介面14、第三連接介面23以及第四連接介面24包含細型序列小型電腦系統介面(Slim Serial Attached Small Computer System Interface,SlimSAS)連接介面、迷你(Mini)連接介面、迷你邊緣輸入輸出(Mini Cool edge IO,MCIO)連接介面以及序列先進技術附件(Serial Advanced Technology Attachment,SATA)連接介面,在此僅為舉例說明之,並不以此 侷限本發明的應用範疇,第一連接介面13、第二連接介面14、第三連接介面23以及第四連接介面24亦可擴展適用於未來提出的連接界面。 The scalable transmission line detection system disclosed in the present invention includes: a first virtualization adapter card 10, a second virtualization adapter card 20, a TAP controller 30 and a control device 40. The first virtualization adapter card 10 further includes: a first JTAG connection interface 11, a first PCIE connection interface 12, a first connection interface 13 and a second connection interface 14; the second virtualization adapter card 20 further includes: a second JTAG connection interface 21, a second PCIE connection interface 22, a third connection interface 23 and a fourth connection interface 24. It is worth noting that the first connection interface 13, the second connection interface 14, the third connection interface 23 and the fourth connection interface 24 include Slim Serial Attached Small Computer System interfaces (SSAS). The first connection interface 13, the second connection interface 14, the third connection interface 23 and the fourth connection interface 24 can also be expanded to be applicable to connection interfaces proposed in the future.

第一虛擬化轉卡10的第一PCIE連接介面12與第一JTAG連接介面11形成電性連接,第一虛擬化轉卡10的第一連接介面13透過第一BS_IO線路群組161與第一PCIE連接介面12形成電性連接,第一連接介面13具有第一彈片開關151,第一虛擬化轉卡10的第二連接介面14透過第二BS_IO線路群組162與第一PCIE連接介面12形成電性連接,第二連接介面14具有第二彈片開關152。 The first PCIE connection interface 12 of the first virtualization adapter card 10 is electrically connected to the first JTAG connection interface 11. The first connection interface 13 of the first virtualization adapter card 10 is electrically connected to the first PCIE connection interface 12 through the first BS_IO line group 161. The first connection interface 13 has a first spring switch 151. The second connection interface 14 of the first virtualization adapter card 10 is electrically connected to the first PCIE connection interface 12 through the second BS_IO line group 162. The second connection interface 14 has a second spring switch 152.

第二虛擬化轉卡20的第二PCIE連接介面22與第二JTAG連接介面21形成電性連接,第二虛擬化轉卡20的第三連接介面23透過第三BS_IO線路群組261與第二PCIE連接介面22形成電性連接,第三連接介面23具有第三彈片開關251,第二虛擬化轉卡20的第四連接介面24透過第四BS_IO線路群組262與第二PCIE連接介面22形成電性連接,第四連接介面24具有第四彈片開關252。 The second PCIE connection interface 22 of the second virtualization adapter card 20 is electrically connected to the second JTAG connection interface 21. The third connection interface 23 of the second virtualization adapter card 20 is electrically connected to the second PCIE connection interface 22 through the third BS_IO line group 261. The third connection interface 23 has a third spring switch 251. The fourth connection interface 24 of the second virtualization adapter card 20 is electrically connected to the second PCIE connection interface 22 through the fourth BS_IO line group 262. The fourth connection interface 24 has a fourth spring switch 252.

TAP控制器30與第一JTAG連接介面11以及第二JTAG連接介面21形成電性連接,控制裝置40與TAP控制器30形成電性連接。 The TAP controller 30 is electrically connected to the first JTAG connection interface 11 and the second JTAG connection interface 21, and the control device 40 is electrically connected to the TAP controller 30.

請參考「第2A圖」所示,「第2A圖」繪示為本發明具擴展性的傳輸線檢測的傳輸線連接示意圖。 Please refer to "Figure 2A", which is a schematic diagram of the transmission line connection of the scalable transmission line detection of the present invention.

第一連接介面13被傳輸線50插接,第一彈片開關151觸發第一插接訊號,第一插接訊號透過第一JTAG連接介面11以及TAP控制器30提供至控制裝置40。 The first connection interface 13 is plugged into the transmission line 50, and the first spring switch 151 triggers the first plug signal, which is provided to the control device 40 through the first JTAG connection interface 11 and the TAP controller 30.

第三連接介面23被傳輸線50插接,第三彈片開關251觸發第三插接訊號,第三插接訊號透過第二JTAG連接介面21以及TAP控制器30提供至控制裝置40。 The third connection interface 23 is plugged into the transmission line 50, and the third spring switch 251 triggers the third plug signal, which is provided to the control device 40 through the second JTAG connection interface 21 and the TAP controller 30.

控制裝置40生成檢測數據以傳送至第一連接介面13,並自第三連接介面23接收反饋數據,控制裝置40比對檢測數據以及反饋數據以進行傳輸線50的檢測。 The control device 40 generates detection data to be transmitted to the first connection interface 13, and receives feedback data from the third connection interface 23. The control device 40 compares the detection data and the feedback data to perform detection of the transmission line 50.

請參考「第2B圖」所示,「第2B圖」繪示為本發明具擴展性的傳輸線檢測的傳輸線連接示意圖。 Please refer to "Figure 2B", which is a schematic diagram of the transmission line connection of the scalable transmission line detection of the present invention.

第一連接介面13被傳輸線50插接,第一彈片開關151觸發第一插接訊號,第一插接訊號透過第一JTAG連接介面11以及TAP控制器30提供至控制裝置40。 The first connection interface 13 is plugged into the transmission line 50, and the first spring switch 151 triggers the first plug signal, which is provided to the control device 40 through the first JTAG connection interface 11 and the TAP controller 30.

第四連接介面24被傳輸線50插接,第四彈片開關252觸發第四插接訊號,第四插接訊號透過第二JTAG連接介面21以及TAP控制器30提供至控制裝置40。 The fourth connection interface 24 is plugged into the transmission line 50, and the fourth spring switch 252 triggers the fourth plug signal, which is provided to the control device 40 through the second JTAG connection interface 21 and the TAP controller 30.

控制裝置40生成檢測數據以傳送至第一連接介面13,並自第四連接介面24接收反饋數據,控制裝置40比對檢測數據以及反饋數據以進行傳輸線50的檢測。 The control device 40 generates detection data to be transmitted to the first connection interface 13, and receives feedback data from the fourth connection interface 24. The control device 40 compares the detection data and the feedback data to perform detection of the transmission line 50.

請參考「第2C圖」所示,「第2C圖」繪示為本發明具擴展性的傳輸線檢測的傳輸線連接示意圖。 Please refer to "Figure 2C", which is a schematic diagram of the transmission line connection of the scalable transmission line detection of the present invention.

第二連接介面14被傳輸線50插接,第二彈片開關152觸發第二插接訊號,第二插接訊號透過第一JTAG連接介面11以及TAP控制器30提供至控制裝置40。 The second connection interface 14 is plugged into the transmission line 50, and the second spring switch 152 triggers the second plug signal, which is provided to the control device 40 through the first JTAG connection interface 11 and the TAP controller 30.

第三連接介面23被傳輸線50插接,第三彈片開關251觸發第三插接訊號,第三插接訊號透過第二JTAG連接介面21以及TAP控制器30提供至控制裝置40。 The third connection interface 23 is plugged into the transmission line 50, and the third spring switch 251 triggers the third plug signal, which is provided to the control device 40 through the second JTAG connection interface 21 and the TAP controller 30.

控制裝置40生成檢測數據以傳送至第二連接介面14,並自第三連接介面23接收反饋數據,控制裝置40比對檢測數據以及反饋數據以進行傳輸線50的檢測。 The control device 40 generates detection data to be transmitted to the second connection interface 14, and receives feedback data from the third connection interface 23. The control device 40 compares the detection data and the feedback data to perform detection of the transmission line 50.

請參考「第2D圖」所示,「第2D圖」繪示為本發明具擴展性的傳輸線檢測的傳輸線連接示意圖。 Please refer to "Figure 2D", which is a schematic diagram of the transmission line connection of the scalable transmission line detection of the present invention.

第二連接介面14被傳輸線50插接,第二彈片開關152觸發第二插接訊號,第二插接訊號透過第一JTAG連接介面11以及TAP控制器30提供至控制裝置40。 The second connection interface 14 is plugged into the transmission line 50, and the second spring switch 152 triggers the second plug signal, which is provided to the control device 40 through the first JTAG connection interface 11 and the TAP controller 30.

第四連接介面24被傳輸線50插接,第四彈片開關252觸發第四插接訊號,第四插接訊號透過第二JTAG連接介面21以及TAP控制器30提供至控制裝置40。 The fourth connection interface 24 is plugged into the transmission line 50, and the fourth spring switch 252 triggers the fourth plug signal, which is provided to the control device 40 through the second JTAG connection interface 21 and the TAP controller 30.

控制裝置40生成檢測數據以傳送至第二連接介面14,並自第四連接介面24接收反饋數據,控制裝置40比對檢測數據以及反饋數據以進行傳輸線50的檢測。 The control device 40 generates detection data to be transmitted to the second connection interface 14, and receives feedback data from the fourth connection interface 24. The control device 40 compares the detection data and the feedback data to perform detection of the transmission line 50.

值得注意的是,控制裝置40依據接收到傳輸線50的插腳輸出圖60(pinout diagram)以生成所述檢測數據,插腳輸出圖60的示意請參考「第3圖」所示,「第3圖」繪示為本發明具擴展性的傳輸線檢測的插腳輸出圖示意圖,插腳輸出圖60中的P1表示傳輸線50一端的腳位類型以及腳位編號,插腳輸出圖60中的P2表示傳輸線50另一端的腳位類型以及腳位編號。 It is worth noting that the control device 40 generates the detection data according to the pinout diagram 60 (pinout diagram) received from the transmission line 50. Please refer to "Figure 3" for the schematic diagram of the pinout diagram 60. "Figure 3" is a schematic diagram of the pinout diagram of the expanded transmission line detection of the present invention. P1 in the pinout diagram 60 represents the pin type and pin number at one end of the transmission line 50, and P2 in the pinout diagram 60 represents the pin type and pin number at the other end of the transmission line 50.

更進一步,控制裝置40接收傳輸線50的插接訊息,插接訊息例如是第一插接訊號以及第四插接訊號,在此僅為舉例說明之,並不以此侷限本發明的應用範疇。 Furthermore, the control device 40 receives the plug-in information of the transmission line 50, and the plug-in information is, for example, a first plug-in signal and a fourth plug-in signal. This is only used as an example to illustrate, and does not limit the scope of application of the present invention.

當控制裝置40接收到第一插接訊號以及第三插接訊號,控制裝置40即可判斷出接收到的第一插接訊號以及第三插接訊號與傳輸線50的插接訊息為第一插接訊號以及第四插接訊號不一致,控制裝置40即觸發警示以提示傳輸線50插接錯誤,傳輸線50插接錯誤即是未依照傳輸線50的插接訊息插接於第一連接介面13以及第四連接介面24。 When the control device 40 receives the first plug signal and the third plug signal, the control device 40 can determine that the received first plug signal and the third plug signal are inconsistent with the plug message of the transmission line 50, which is the first plug signal and the fourth plug signal. The control device 40 triggers an alarm to prompt that the transmission line 50 is plugged incorrectly. The transmission line 50 is plugged incorrectly when it is not plugged into the first connection interface 13 and the fourth connection interface 24 according to the plug message of the transmission line 50.

當控制裝置40先接收到第一插接訊號並且控制裝置40再接收到第二插接訊號,即控制裝置40判斷出第一插接訊號以及第二插接訊號先後觸發,控制裝置40即觸發警示以提示傳輸線50插接錯誤,傳輸線50插接錯誤即是傳輸線50同時插接於第一連接介面13以及第二連接介面14或是使用二個傳輸線50同時插接於第一連接介面13以及第二連接介面14。 When the control device 40 first receives the first plug signal and then receives the second plug signal, that is, the control device 40 determines that the first plug signal and the second plug signal are triggered successively, the control device 40 triggers an alarm to prompt that the transmission line 50 is plugged incorrectly. The transmission line 50 plugging error means that the transmission line 50 is plugged into the first connection interface 13 and the second connection interface 14 at the same time, or two transmission lines 50 are used to be plugged into the first connection interface 13 and the second connection interface 14 at the same time.

值得注意的是,前述控制裝置40所觸發的警示可以是以音效、燈號閃爍、發送訊息…等方式作為警示,在此僅為舉例說明之,並不以此侷限本發明的應用範疇。 It is worth noting that the warning triggered by the aforementioned control device 40 can be a warning in the form of sound effects, flashing lights, sending messages, etc. This is only used as an example to illustrate, and does not limit the scope of application of the present invention.

接著,以下將說明本發明的運作方法,並請同時參考「第4A圖」至「第4C圖」所示,「第4A圖」至「第4C圖」繪示為本發明具擴展性的傳輸線檢測方法的方法流程圖。 Next, the operation method of the present invention will be described below, and please refer to "Figure 4A" to "Figure 4C" at the same time. "Figure 4A" to "Figure 4C" are method flow charts of the scalable transmission line detection method of the present invention.

本發明所揭露的具擴展性的傳輸線檢測方法,其包含下列步驟:首先,第一虛擬化轉卡具有第一JTAG連接介面、第一PCIE連接介面、第一連接介面以及第二連接介面(步驟701);接著,第一PCIE連接介面與第一JTAG連接介面形成電性連接(步驟702);接著,第一連接介面透過第一BS_IO線路群組與第一PCIE連接介面形成電性連接,第一連接介面具有第一彈片開關(步驟703);接著,第二連接介面透過第二BS_IO線路群組與第一 PCIE連接介面形成電性連接,第二連接介面具有第二彈片開關(步驟704);接著,第二虛擬化轉卡具有第二JTAG連接介面、第二PCIE連接介面、第三連接介面以及第四連接介面(步驟705);接著,第二PCIE連接介面與第二JTAG連接介面形成電性連接(步驟706);接著,第三連接介面透過第三BS_IO線路群組與第二PCIE連接介面形成電性連接,第三連接介面具有第三彈片開關(步驟707);接著,第四連接介面透過第四BS_IO線路群組與第二PCIE連接介面形成電性連接,第四連接介面具有第四彈片開關(步驟708);接著,TAP控制器與第一JTAG連接介面以及第二JTAG連接介面形成電性連接(步驟709);接著,控制裝置與TAP控制器形成電性連接(步驟710);接著,第一連接介面或是第二連接介面被傳輸線插接,第一彈片開關觸發第一插接訊號或是第二彈片開關觸發第二插接訊號(步驟711);接著,第一插接訊號或是第二插接訊號透過第一JTAG連接介面以及TAP控制器提供至控制裝置(步驟712);接著,第三連接介面或是第四連接介面被傳輸線插接,第三彈片開關觸發第三插接訊號或是第四彈片開關觸發第四插接訊號(步驟713);接著,第三插接訊號或是第四插接訊號透過第二JTAG連接介面以及TAP控制器提供至控制裝置(步驟714);接著,控制裝置生成檢測數據以傳送至第一連接介面或是第二連接介面,並自第三連接介面或是第四連接介面接收反饋數據(步驟715);最後,控制裝置比對檢測數據以及反饋數據以進行傳輸線的檢測(步驟716)。 The scalable transmission line detection method disclosed in the present invention includes the following steps: first, the first virtualization adapter card has a first JTAG connection interface, a first PCIE connection interface, a first connection interface and a second connection interface (step 701); then, the first PCIE connection interface is electrically connected to the first JTAG connection interface (step 702); then, the first connection interface is electrically connected to the first PCIE connection interface through a first BS_IO line group, and the first connection interface has a first spring switch (step 703); then, the second connection interface is electrically connected to the first PCIE connection interface through a second BS_IO line group. The second connection interface is electrically connected to the second PCIE connection interface, and the second connection interface has a second spring switch (step 704); then, the second virtualization adapter card has a second JTAG connection interface, a second PCIE connection interface, a third connection interface, and a fourth connection interface (step 705); then, the second PCIE connection interface is electrically connected to the second JTAG connection interface (step 706); then, the third connection interface is electrically connected to the second PCIE connection interface through the third BS_IO line group, and the third connection interface has a third spring switch (step 707); then, the fourth connection interface is electrically connected to the second PCIE connection interface through the fourth BS_IO line group. The first and second JTAG interfaces are electrically connected, and the fourth connection interface has a fourth spring switch (step 708); then, the TAP controller is electrically connected to the first JTAG connection interface and the second JTAG connection interface (step 709); then, the control device is electrically connected to the TAP controller (step 710); then, the first connection interface or the second connection interface is plugged into the transmission line, and the first spring switch triggers the first plug signal or the second spring switch triggers the second plug signal (step 711); then, the first plug signal or the second plug signal is provided to the control device through the first JTAG connection interface and the TAP controller (step 712). 12); then, the third connection interface or the fourth connection interface is plugged into the transmission line, and the third spring switch triggers the third plug signal or the fourth spring switch triggers the fourth plug signal (step 713); then, the third plug signal or the fourth plug signal is provided to the control device through the second JTAG connection interface and the TAP controller (step 714); then, the control device generates detection data to be transmitted to the first connection interface or the second connection interface, and receives feedback data from the third connection interface or the fourth connection interface (step 715); finally, the control device compares the detection data and the feedback data to perform transmission line detection (step 716).

綜上所述,可知本發明與先前技術之間的差異在於第一虛擬化轉卡以及第二虛擬化轉卡的連接介面被傳輸線插接時彈片開關觸發插接訊號透過第一虛擬化轉卡以及第二虛擬化轉卡的JTAG連接介面以及TAP控制器提供 至控制裝置,控制裝置生成檢測數據以傳送至第一虛擬化轉卡再自第二虛擬化轉卡接收反饋數據以進行傳輸線的檢測。 In summary, the difference between the present invention and the prior art is that when the connection interface of the first virtualization adapter and the second virtualization adapter is plugged into the transmission line, the spring switch triggers the plug-in signal, which is provided to the control device through the JTAG connection interface and TAP controller of the first virtualization adapter and the second virtualization adapter. The control device generates detection data to be transmitted to the first virtualization adapter and then receives feedback data from the second virtualization adapter to perform transmission line detection.

藉由此一技術手段可以來解決先前技術所存在現有使用傳輸線檢測儀對傳輸線進行檢測擴展性不足的問題,進而達成具擴展性的傳輸線檢測的技術功效。 This technical means can solve the problem of insufficient scalability of the existing transmission line detection using transmission line detectors in the previous technology, thereby achieving the technical effect of scalable transmission line detection.

雖然本發明所揭露的實施方式如上,惟所述的內容並非用以直接限定本發明的專利保護範圍。任何本發明所屬技術領域中具有通常知識者,在不脫離本發明所揭露的精神和範圍的前提下,可以在實施的形式上及細節上作些許的更動。本發明的專利保護範圍,仍須以所附的申請專利範圍所界定者為準。 Although the implementation method disclosed by the present invention is as above, the content described is not used to directly limit the scope of patent protection of the present invention. Anyone with common knowledge in the technical field to which the present invention belongs can make slight changes in the form and details of implementation without departing from the spirit and scope disclosed by the present invention. The scope of patent protection of the present invention shall still be defined by the scope of the attached patent application.

10:第一虛擬化轉卡 10: The first virtualization card conversion

11:第一JTAG連接介面 11: First JTAG connection interface

12:第一PCIE連接介面 12: First PCIE connection interface

13:第一連接介面 13: First connection interface

14:第二連接介面 14: Second connection interface

151:第一彈片開關 151: First spring switch

152:第二彈片開關 152: Second spring switch

161:第一BS_IO線路群組 161: First BS_IO line group

162:第二BS_IO線路群組 162: Second BS_IO line group

20:第二虛擬化轉卡 20: Second virtualization card conversion

21:第二JTAG連接介面 21: Second JTAG connection interface

22:第二PCIE連接介面 22: Second PCIE connection interface

23:第三連接介面 23: Third connection interface

24:第四連接介面 24: Fourth connection interface

251:第三彈片開關 251: Third spring switch

252:第四彈片開關 252: The fourth spring switch

261:第三BS_IO線路群組 261: Third BS_IO line group

262:第四BS_IO線路群組 262: Fourth BS_IO line group

30:TAP控制器 30:TAP controller

40:控制裝置 40: Control device

Claims (10)

一種具擴展性的傳輸線檢測系統,其包含:一第一虛擬化轉卡,所述第一虛擬化轉卡更包含:一第一聯合測試工作群組(Joint Test Action Group,JTAG)連接介面;一第一快捷外設互聯標準(Peripheral Component Interconnect Express,PCIE)連接介面,與所述第一JTAG連接介面形成電性連接;一第一連接介面,透過第一邊界掃描(Boundary Scan,BS)輸入輸出(Input/Output,IO)線路群組與所述第一PCIE連接介面形成電性連接,所述第一連接介面具有一第一彈片開關;及一第二連接介面,透過第二BS_IO線路群組與所述第一PCIE連接介面形成電性連接,所述第二連接介面具有一第二彈片開關;一第二虛擬化轉卡,所述第二虛擬化轉卡更包含:一第二JTAG連接介面;一第二PCIE連接介面,與所述第二JTAG連接介面形成電性連接;一第三連接介面,透過第三BS_IO線路群組與所述第二PCIE連接介面形成電性連接,所述第三連接介面具有一第三彈片開關;及 一第四連接介面,透過第四BS_IO線路群組與所述第二PCIE連接介面形成電性連接,所述第四連接介面具有一第四彈片開關;一測試存取埠(Test Access Port,TAP)控制器,與所述第一JTAG連接介面以及所述第二JTAG連接介面形成電性連接;及一控制裝置,與所述TAP控制器形成電性連接;其中,所述第一連接介面或是所述第二連接介面被一傳輸線插接,所述第一彈片開關觸發一第一插接訊號或是所述第二彈片開關觸發一第二插接訊號;所述第一插接訊號或是所述第二插接訊號透過所述第一JTAG連接介面以及所述TAP控制器提供至所述控制裝置;所述第三連接介面或是所述第四連接介面被所述傳輸線插接,所述第三彈片開關觸發一第三插接訊號或是所述第四彈片開關觸發一第四插接訊號;所述第三插接訊號或是所述第四插接訊號透過所述第二JTAG連接介面以及所述TAP控制器提供至所述控制裝置;所述控制裝置生成一檢測數據以傳送至所述第一連接介面或是所述第二連接介面,並自所述第三連接介面或是所述第四連接介面接收一反饋數據;及所述控制裝置比對所述檢測數據以及所述反饋數據以進行所述傳輸線的檢測。 A scalable transmission line detection system includes: a first virtualization adapter card, wherein the first virtualization adapter card further includes: a first Joint Test Action Group (JTAG) connection interface; a first Peripheral Component Interconnect Express (PCIE) connection interface, which is electrically connected to the first JTAG connection interface; a first connection interface, which is electrically connected to the first JTAG connection interface through a first boundary scan (Boundary Scan) A first BS_IO line group electrically connected to the first PCIE connection interface, the first connection interface having a first spring switch; and a second connection interface electrically connected to the first PCIE connection interface through a second BS_IO line group, the second connection interface having a second spring switch; a second virtualization adapter card, the second virtualization adapter card further comprising: a second JTAG connection interface ; a second PCIE connection interface, electrically connected to the second JTAG connection interface; a third connection interface, electrically connected to the second PCIE connection interface through a third BS_IO line group, the third connection interface having a third spring switch; and a fourth connection interface, electrically connected to the second PCIE connection interface through a fourth BS_IO line group, the fourth connection interface having a fourth spring switch; a test access port (Test Access Port The invention relates to a JTAG port (TAP) controller, which is electrically connected to the first JTAG connection interface and the second JTAG connection interface; and a control device, which is electrically connected to the TAP controller; wherein the first connection interface or the second connection interface is plugged into a transmission line, the first spring switch triggers a first plug signal or the second spring switch triggers a second plug signal; the first plug signal or the second plug signal is provided to the control device through the first JTAG connection interface and the TAP controller; the third connection interface or the fourth connection interface is connected to the control device; The connection interface is plugged by the transmission line, the third spring switch triggers a third plug signal or the fourth spring switch triggers a fourth plug signal; the third plug signal or the fourth plug signal is provided to the control device through the second JTAG connection interface and the TAP controller; the control device generates a detection data to be transmitted to the first connection interface or the second connection interface, and receives a feedback data from the third connection interface or the fourth connection interface; and the control device compares the detection data and the feedback data to perform detection of the transmission line. 如請求項1所述的具擴展性的傳輸線檢測系統,其中所述控制裝置接收所述傳輸線的插接訊息,當所述控制裝置判斷接收到的所述第一插接訊號或是所述第二插接訊號以及所述第三插接訊號或是所述第四插接訊號與所述傳輸線的插接訊息不一致時,所述控制裝置觸發警示。 As described in claim 1, the expandable transmission line detection system, wherein the control device receives the plug-in information of the transmission line, and when the control device determines that the received first plug-in signal or the second plug-in signal and the third plug-in signal or the fourth plug-in signal are inconsistent with the plug-in information of the transmission line, the control device triggers an alarm. 如請求項1所述的具擴展性的傳輸線檢測系統,其中所述控制裝置接收所述傳輸線的插接訊息,當所述控制裝置判斷所述第一插接訊號以及所述第二插接訊號或是所述第三插接訊號以及所述第四插接訊號先後觸發時,所述控制裝置觸發警示。 As described in claim 1, the expandable transmission line detection system, wherein the control device receives the plug-in information of the transmission line, and when the control device determines that the first plug-in signal and the second plug-in signal or the third plug-in signal and the fourth plug-in signal are triggered successively, the control device triggers an alarm. 如請求項1所述的具擴展性的傳輸線檢測系統,其中所述控制裝置依據接收到所述傳輸線的插腳輸出圖(pinout diagram)以生成所述檢測數據。 An expandable transmission line detection system as described in claim 1, wherein the control device generates the detection data based on a pinout diagram received from the transmission line. 如請求項1所述的具擴展性的傳輸線檢測系統,其中所述第一連接介面、所述第二連接介面、所述第三連接介面以及所述第四連接介面包含細型序列小型電腦系統介面(Slim Serial Attached Small Computer System Interface,SlimSAS)連接介面、迷你(Mini)連接介面、迷你邊緣輸入輸出(Mini Cool edge IO,MCIO)連接介面以及序列先進技術附件(Serial Advanced Technology Attachment,SATA)連接介面。 The expandable transmission line detection system as described in claim 1, wherein the first connection interface, the second connection interface, the third connection interface and the fourth connection interface include a Slim Serial Attached Small Computer System Interface (SlimSAS) connection interface, a Mini connection interface, a Mini Cool edge IO (MCIO) connection interface and a Serial Advanced Technology Attachment (SATA) connection interface. 一種具擴展性的傳輸線檢測方法,其包含下列步驟:一第一虛擬化轉卡具有一第一聯合測試工作群組(Joint Test Action Group,JTAG)連接介面、一第一快捷外設互聯標準(Peripheral Component Interconnect Express,PCIE)連接介面、一第一連接介面以及一第二連接介面; 所述第一PCIE連接介面與所述第一JTAG連接介面形成電性連接;所述第一連接介面透過第一邊界掃描(Boundary Scan,BS)輸入輸出(Input/Output,IO)線路群組與所述第一PCIE連接介面形成電性連接,所述第一連接介面具有一第一彈片開關;所述第二連接介面透過第二BS_IO線路群組與所述第一PCIE連接介面形成電性連接,所述第二連接介面具有一第二彈片開關;一第二虛擬化轉卡具有一第二JTAG連接介面、一第二PCIE連接介面、一第三連接介面以及一第四連接介面;所述第二PCIE連接介面與所述第二JTAG連接介面形成電性連接;所述第三連接介面透過第三BS_IO線路群組與所述第二PCIE連接介面形成電性連接,所述第三連接介面具有一第三彈片開關;所述第四連接介面透過第四BS_IO線路群組與所述第二PCIE連接介面形成電性連接,所述第四連接介面具有一第四彈片開關;一測試存取埠(Test Access Port,TAP)控制器與所述第一JTAG連接介面以及所述第二JTAG連接介面形成電性連接;一控制裝置與所述TAP控制器形成電性連接; 所述第一連接介面或是所述第二連接介面被一傳輸線插接,所述第一彈片開關觸發一第一插接訊號或是所述第二彈片開關觸發一第二插接訊號;所述第一插接訊號或是所述第二插接訊號透過所述第一JTAG連接介面以及所述TAP控制器提供至所述控制裝置;所述第三連接介面或是所述第四連接介面被所述傳輸線插接,所述第三彈片開關觸發一第三插接訊號或是所述第四彈片開關觸發一第四插接訊號;所述第三插接訊號或是所述第四插接訊號透過所述第二JTAG連接介面以及所述TAP控制器提供至所述控制裝置;所述控制裝置生成一檢測數據以傳送至所述第一連接介面或是所述第二連接介面,並自所述第三連接介面或是所述第四連接介面接收一反饋數據;及所述控制裝置比對所述檢測數據以及所述反饋數據以進行所述傳輸線的檢測。 A scalable transmission line detection method includes the following steps: a first virtualization adapter card has a first Joint Test Action Group (JTAG) connection interface, a first Peripheral Component Interconnect Express (PCIE) connection interface, a first connection interface and a second connection interface; the first PCIE connection interface is electrically connected to the first JTAG connection interface; the first connection interface is electrically connected to the first JTAG connection interface through a first boundary scan (Boundary Scan) A BS_Scan (BS) input/output (IO) line group is electrically connected to the first PCIE connection interface, and the first connection interface has a first spring switch; the second connection interface is electrically connected to the first PCIE connection interface through a second BS_IO line group, and the second connection interface has a second spring switch; a second virtualization adapter card has a second JTAG connection interface, a second PCIE connection interface, and a third connection interface and a fourth connection interface; the second PCIE connection interface is electrically connected to the second JTAG connection interface; the third connection interface is electrically connected to the second PCIE connection interface through a third BS_IO line group, and the third connection interface has a third spring switch; the fourth connection interface is electrically connected to the second PCIE connection interface through a fourth BS_IO line group, and the fourth connection interface has a fourth spring switch; a test access port (Test Access Port A JTAG port (TAP) controller is electrically connected to the first JTAG connection interface and the second JTAG connection interface; a control device is electrically connected to the TAP controller; the first connection interface or the second connection interface is plugged into a transmission line, the first spring switch triggers a first plug signal or the second spring switch triggers a second plug signal; the first plug signal or the second plug signal is provided to the control device through the first JTAG connection interface and the TAP controller; the third connection interface or the fourth connection interface is connected to the control device; The interface is plugged by the transmission line, the third spring switch triggers a third plug signal or the fourth spring switch triggers a fourth plug signal; the third plug signal or the fourth plug signal is provided to the control device through the second JTAG connection interface and the TAP controller; the control device generates a detection data to be transmitted to the first connection interface or the second connection interface, and receives a feedback data from the third connection interface or the fourth connection interface; and the control device compares the detection data and the feedback data to perform detection of the transmission line. 如請求項6所述的具擴展性的傳輸線檢測方法,其中所述具擴展性的傳輸線檢測方法更包含所述控制裝置接收所述傳輸線的插接訊息,當所述控制裝置判斷接收到的所述第一插接訊號或是所述第二插接訊號以及所述第三插接訊號或是所述第四插接訊號與所述傳輸線的插接訊息不一致時,所述控制裝置觸發警示的步驟。 As described in claim 6, the scalable transmission line detection method further includes the step of the control device receiving the plug-in information of the transmission line, and when the control device determines that the received first plug-in signal or the second plug-in signal and the third plug-in signal or the fourth plug-in signal are inconsistent with the plug-in information of the transmission line, the control device triggers an alarm. 如請求項6所述的具擴展性的傳輸線檢測方法,其中所述具擴展性的傳輸線檢測方法更包含所述控制裝置接收所述傳輸線的插接訊息,當所述 控制裝置判斷所述第一插接訊號以及所述第二插接訊號或是所述第三插接訊號以及所述第四插接訊號先後觸發時,所述控制裝置觸發警示。 As described in claim 6, the scalable transmission line detection method further includes the control device receiving the plug-in information of the transmission line, and when the control device determines that the first plug-in signal and the second plug-in signal or the third plug-in signal and the fourth plug-in signal are triggered successively, the control device triggers an alarm. 如請求項6所述的具擴展性的傳輸線檢測方法,其中所述控制裝置生成所述檢測數據以傳送至所述第一連接介面或是所述第二連接介面的步驟是所述控制裝置依據接收到所述傳輸線的插腳輸出圖(pinout diagram)以生成所述檢測數據。 As described in claim 6, the control device generates the detection data to transmit to the first connection interface or the second connection interface in an expandable transmission line detection method, wherein the control device generates the detection data based on the pinout diagram received from the transmission line. 如請求項6所述的具擴展性的傳輸線檢測方法,其中所述第一連接介面、所述第二連接介面、所述第三連接介面以及所述第四連接介面包含細型序列小型電腦系統介面(Slim Serial Attached Small Computer System Interface,SlimSAS)連接介面、迷你(Mini)連接介面、迷你邊緣輸入輸出(Mini Cool edge IO,MCIO)連接介面以及序列先進技術附件(Serial Advanced Technology Attachment,SATA)連接介面。 The scalable transmission line detection method as described in claim 6, wherein the first connection interface, the second connection interface, the third connection interface and the fourth connection interface include a Slim Serial Attached Small Computer System Interface (SlimSAS) connection interface, a Mini connection interface, a Mini Cool edge IO (MCIO) connection interface and a Serial Advanced Technology Attachment (SATA) connection interface.
TW111146121A 2022-12-01 2022-12-01 Scalable transmission line detection system and method thereof TWI837980B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW111146121A TWI837980B (en) 2022-12-01 2022-12-01 Scalable transmission line detection system and method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW111146121A TWI837980B (en) 2022-12-01 2022-12-01 Scalable transmission line detection system and method thereof

Publications (2)

Publication Number Publication Date
TWI837980B true TWI837980B (en) 2024-04-01
TW202424505A TW202424505A (en) 2024-06-16

Family

ID=91618880

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111146121A TWI837980B (en) 2022-12-01 2022-12-01 Scalable transmission line detection system and method thereof

Country Status (1)

Country Link
TW (1) TWI837980B (en)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005052612A2 (en) * 2003-11-24 2005-06-09 Infineon Technologies Ag Input and output circuit for an integrated switching circuit, method for testing an integrated switching circuit and an integrated switching circuit provided with said input and output circuit
TW200629056A (en) * 2005-02-09 2006-08-16 Fujitsu Ltd Device and method for JTAG test
TW200807427A (en) * 2006-06-13 2008-02-01 Formfactor Inc Method of designing an application specific probe card test system
US20080040636A1 (en) * 2006-04-06 2008-02-14 Infineon Technologies Ag Integrated circuit having a subordinate test interface
TW201009369A (en) * 2008-07-11 2010-03-01 Advantest Corp Test apparatus and semiconductor device
US20130135004A1 (en) * 2011-06-09 2013-05-30 Takashi Hashimoto Three-dimensional integrated circuit and testing method for the same
WO2017125440A1 (en) * 2016-01-19 2017-07-27 Elmos Semiconductor Aktiengesellschaft Jtag interfaces for controlling the actuation device of lighting means or a lighting chain
TW201913931A (en) * 2017-09-04 2019-04-01 韓商愛思開海力士有限公司 Packaging module and method of testing the operation of a wafer included in a package module
TW202116915A (en) * 2019-08-21 2021-05-01 美商堤康那責任有限公司 Polymer composition for laser direct structuring
TW202223425A (en) * 2020-11-25 2022-06-16 日商愛德萬測試股份有限公司 An automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005052612A2 (en) * 2003-11-24 2005-06-09 Infineon Technologies Ag Input and output circuit for an integrated switching circuit, method for testing an integrated switching circuit and an integrated switching circuit provided with said input and output circuit
TW200629056A (en) * 2005-02-09 2006-08-16 Fujitsu Ltd Device and method for JTAG test
US20080040636A1 (en) * 2006-04-06 2008-02-14 Infineon Technologies Ag Integrated circuit having a subordinate test interface
TW200807427A (en) * 2006-06-13 2008-02-01 Formfactor Inc Method of designing an application specific probe card test system
TW201009369A (en) * 2008-07-11 2010-03-01 Advantest Corp Test apparatus and semiconductor device
US20130135004A1 (en) * 2011-06-09 2013-05-30 Takashi Hashimoto Three-dimensional integrated circuit and testing method for the same
WO2017125440A1 (en) * 2016-01-19 2017-07-27 Elmos Semiconductor Aktiengesellschaft Jtag interfaces for controlling the actuation device of lighting means or a lighting chain
TW201913931A (en) * 2017-09-04 2019-04-01 韓商愛思開海力士有限公司 Packaging module and method of testing the operation of a wafer included in a package module
TW202116915A (en) * 2019-08-21 2021-05-01 美商堤康那責任有限公司 Polymer composition for laser direct structuring
TW202223425A (en) * 2020-11-25 2022-06-16 日商愛德萬測試股份有限公司 An automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback

Also Published As

Publication number Publication date
TW202424505A (en) 2024-06-16

Similar Documents

Publication Publication Date Title
US7069477B2 (en) Methods and arrangements to enhance a bus
WO2018201763A1 (en) Test method for connector, device and storage medium
US20140009179A1 (en) Testing device
CN102053898A (en) Method for testing bus interface on PCIE (Peripheral Component Interface Express) slot of host and read-write test method thereof
TWM577498U (en) Electronic apparatus
TWI837980B (en) Scalable transmission line detection system and method thereof
TWI759380B (en) Pin of connector slot of circuit board conduction detection system and method thereof
CN115729872A (en) Computing device and detection method for PCIE cable connection
CN110907857B (en) Automatic connector detection method based on FPGA
US20040153891A1 (en) Method and apparatus for generating CRC/parity error in network environment
TWI847391B (en) Detection system for slimsas slot and method thereof
TW202314504A (en) Self-test system for pcie and method thereof
CN112596983A (en) Monitoring method for connector in server
CN118091493A (en) Transmission line detection system with expansibility and method thereof
CN102479129B (en) Detecting device for states of peripheral components
US11953549B1 (en) Detection system for SlimSAS slot and method thereof
CN114138540B (en) Distinguishing structure and method for sharing multiple same boards
TWI812467B (en) Pin detection system for providing circuit switching by circuit conversion card and method thereof
TWI783549B (en) Improving test coverage rate system for pin of tested circuit board and method thereof
TWI807502B (en) Protective circuite and server system
CN115801540B (en) PCIe equipment degradation detection method, device, terminal and storage medium
TWI828439B (en) Dimm slot test system without test board series connection through jtag and method thereof
TW201024756A (en) Testing apparatus
CN202067256U (en) Connecting structure of Debug card
CN114661546A (en) Detection system of server cable and communication method thereof