TWI525325B - Elastic probe and its manufacturing method - Google Patents
Elastic probe and its manufacturing method Download PDFInfo
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- TWI525325B TWI525325B TW103114873A TW103114873A TWI525325B TW I525325 B TWI525325 B TW I525325B TW 103114873 A TW103114873 A TW 103114873A TW 103114873 A TW103114873 A TW 103114873A TW I525325 B TWI525325 B TW I525325B
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Description
本發明係與用於探針卡之探針有關,特別是關於一種適用於高頻點測用之彈性探針及其製造方法。 The present invention relates to a probe for a probe card, and more particularly to an elastic probe suitable for high frequency spot measurement and a method of manufacturing the same.
半導體晶片進行測試時,測試機係透過一探針卡而與待測物電性連接,並藉由訊號傳輸及訊號分析,以獲得待測物的測試結果。習用之探針卡通常係由一電路板及一探針裝置組成,或者更包含有一設於該電路板及該探針裝置之間的空間轉換器,該探針裝置設有多數對應待測物之電性接點而排列的探針,以藉由該等探針同時點觸該等電性接點。 When the semiconductor wafer is tested, the test machine is electrically connected to the object to be tested through a probe card, and is subjected to signal transmission and signal analysis to obtain a test result of the object to be tested. The conventional probe card usually consists of a circuit board and a probe device, or further includes a space converter disposed between the circuit board and the probe device, and the probe device is provided with a plurality of corresponding objects to be tested. Probes arranged in electrical contacts to simultaneously contact the electrical contacts by the probes.
隨著電子元件愈趨高速、高頻的運作條件,探針卡之設計亦需對應地達到有效傳輸高頻測試訊號之功能,如此方能準確地反應出測試結果。習知高頻探針卡大多著重於電路板及空間轉換器之設計,以及使探針與測試機及待測物阻抗匹配之設計。然而,探針之長度亦為影響探針卡所能有效傳輸之訊號頻率的關鍵因素,若能藉由縮短探針進而縮短訊號傳輸路徑,即可提高探針可傳輸之訊號頻率。 With the higher speed and high frequency operation conditions of electronic components, the design of the probe card also needs to correspondingly achieve the function of transmitting high frequency test signals effectively, so as to accurately reflect the test results. Conventional high-frequency probe cards mostly focus on the design of the board and space converter, as well as the design of matching the probe with the test machine and the object to be tested. However, the length of the probe is also a key factor affecting the frequency of the signal that can be effectively transmitted by the probe card. If the probe is shortened and the signal transmission path is shortened, the signal frequency that the probe can transmit can be increased.
目前市面上的探針中,薄膜式探針雖針長較短且可傳輸較高頻率之訊號,但其成本較高、製造過程複雜,且組裝時難以對位;懸臂式探針則因其應用方式而需具有相當之長度,因此難以藉由縮減其長度而提高其傳輸訊號頻率。此外,彈簧探針(POGO pin)及挫曲探針(Vertical buckling needle)為二種常用之垂直式探針,彈簧探針之特點在於其中段具有一彈簧,使得其點觸端可隨待測物之電性接點高度而上下移動,而挫曲探針則因其中段之針身可彈性彎曲,因此其點觸端亦可隨待測物之電性接點高度而上下移動。設有如前述之彈性探針的探針卡在同時對高度不同的電性接點進行測試時,該等彈性探針不但能與每一電性接點確實接觸並電性導通,更可避免接觸力過大而造成電性接點損壞或產生不當的測試針痕。 Among the probes currently on the market, the thin film probe has a short needle length and can transmit a signal with a higher frequency, but the cost is high, the manufacturing process is complicated, and it is difficult to align during assembly; the cantilever probe is because of its The application method needs to have a considerable length, so it is difficult to increase its transmission signal frequency by reducing its length. In addition, the POGO pin and the vertical buckling needle are two commonly used vertical probes. The spring probe is characterized in that the middle portion has a spring, so that the point contact end can be tested. The electrical contact of the object moves up and down, and the deflection probe can be elastically bent due to the needle body of the middle portion, so that the point end can also move up and down with the height of the electrical contact of the object to be tested. When the probe card with the elastic probe as described above is tested at the same time for different height electrical contacts, the elastic probes can not only be in contact with each electrical contact but also electrically conduct, and can avoid contact. Excessive force causes damage to electrical contacts or improper test pin marks.
然而,前述之二種彈性探針進行點測時,接觸力傳輸路徑及訊號傳輸路徑係完全相同,因此接觸力及訊號之傳輸會相互影響;而且,為了具有足夠之彈性,彈簧探針內需設有具相當長度之彈簧,挫曲探針之針身亦需具有相當之長度,因此難以藉由縮短探針而提高其可傳輸之訊號頻率。 However, when the two kinds of elastic probes are used for spot measurement, the contact force transmission path and the signal transmission path are completely the same, so the contact force and the signal transmission will affect each other; and, in order to have sufficient elasticity, the spring probe needs to be set. There are springs of considerable length, and the body of the buckling probe also needs to have a considerable length, so it is difficult to increase the frequency of the signal that can be transmitted by shortening the probe.
有鑑於上述缺失,本發明之主要目的在於提供一種彈性探針,以及其製造方法,其中,該彈性探針不但因具有彈性而可隨待測物之電性接點高度調整點觸部之位置並提供適當接觸力,且較習用之彈性探針更短,並將接觸力及訊號傳輸路徑分離,因此特別適用於高頻測試。 In view of the above-mentioned deficiencies, the main object of the present invention is to provide an elastic probe, and a manufacturing method thereof, wherein the elastic probe can adjust the position of the contact portion with the height of the electrical contact of the object to be tested due to the elasticity. It also provides suitable contact force and is shorter than the conventional elastic probe, and separates the contact force and signal transmission path, so it is especially suitable for high frequency testing.
為達成上述目的,本發明所提供之彈性探針包含有一殼體、一針體,以及一高分子彈性體。該殼體具有一頂部、一底部、一位於該頂部及該底部之間的側壁、一設於該底部的穿孔,以及一與該穿孔連通的容置空間,該殼體能定義出一通過該穿孔的假想軸線。該針體係沿該假想軸線位移地穿設於該殼體,並與該殼體接觸而相互電性導通,該針體具有一設於該穿孔的身部、一位於該身部一端且被限位於該容置空間內的擋止部,以及一位於該身部另一端且位於該殼體外的點觸部。該高分子彈性體係能受該針體壓抵而彈性變形地設於該殼體之容置空間。 In order to achieve the above object, the elastic probe provided by the present invention comprises a casing, a needle body, and a polymer elastomer. The housing has a top portion, a bottom portion, a side wall between the top portion and the bottom portion, a through hole disposed at the bottom portion, and an accommodating space communicating with the through hole, the housing defining a through hole The imaginary axis. The needle system is disposed in the housing along the imaginary axis, and is electrically connected to the housing. The needle body has a body disposed on the through hole, and is located at one end of the body and is limited a stopper located in the accommodating space, and a contact portion located at the other end of the body and located outside the casing. The polymer elastic system can be elastically deformed by the needle body to be elastically deformed in the housing space of the housing.
該殼體之頂部係用以電性連接於一電路板或一空間轉換器,該針體之點觸部係用以點觸待測物之電性接點,該針體與該殼體之電性導通關係使得待測物之電性接點能與該電路板或空間轉換器相互傳輸訊號,該高分子彈性體則使得該針體可隨待測物之電性接點高度位移而調整點觸部之位置並提供適當接觸力。此外,該彈性探針之接觸力傳輸路徑係與訊號傳輸路徑分離,且可較習用之彈性探針更短,因此特別適用於高頻測試。 The top of the housing is electrically connected to a circuit board or a space converter, and the touch portion of the needle body is used for contacting an electrical contact of the object to be tested, and the needle body and the housing are The electrical conduction relationship enables the electrical contact of the object to be tested to transmit signals to the circuit board or the space converter, and the polymer elastomer allows the needle body to be adjusted according to the height displacement of the electrical contact of the object to be tested. The location of the touch point and provide appropriate contact force. In addition, the contact force transmission path of the elastic probe is separated from the signal transmission path and can be shorter than the conventional elastic probe, and thus is particularly suitable for high frequency testing.
較佳地,該針體之身部係能滑移地接觸該殼體之穿孔的一內壁面,藉以相互電性導通。或者,該針體之擋止部的一側面係能滑移地接觸該殼體之側壁,藉以相互電性導通。或者,該針體更具有一自該擋止部延伸而出之延伸部,該延伸部係能滑移地接觸該殼體之側壁,藉以相互電性導通。前述三種電性導通方式可擇其一、擇其二,或三者兼具。 Preferably, the body of the needle body is slidably contacted with an inner wall surface of the perforation of the housing to electrically conduct each other. Alternatively, a side of the stop portion of the needle body is slidably contacting the side wall of the housing to electrically conduct each other. Alternatively, the needle body further has an extension extending from the stop portion, the extension portion being slidably contacting the side wall of the housing to electrically conduct each other. The above three electrical conduction methods may be selected one by one, two, or three.
當該針體具有如前述之該延伸部,該高分子彈性體可抵接於該延伸部並將該延伸部壓抵於該側壁,如此可使該延伸部更確實地與該側壁接觸,以確保該殼體與該針體之電性導通關係。 When the needle body has the extension portion as described above, the polymer elastic body can abut against the extension portion and press the extension portion against the side wall, so that the extension portion can be more surely contacted with the side wall to Ensure that the housing is in electrical communication with the needle.
該針體亦可具有一自該擋止部延伸而出但未接觸該側壁之延伸部,此時亦可使該高分子彈性體抵接於該延伸部並將該延伸部朝向該側壁推抵,使得該針體之身部更確實地接觸該殼體之穿孔的內壁面,且/或使得該針體之擋止部的側面更確實地接觸該殼體之側壁,以確保該殼體與該針體之電性導通關係。 The needle body may have an extending portion extending from the stopping portion but not contacting the side wall. In this case, the polymeric elastic body may be abutted against the extending portion and the extending portion may be pushed toward the side wall. Having the body of the needle more positively contact the inner wall surface of the perforation of the housing and/or such that the side of the stop of the needle body more reliably contacts the side wall of the housing to ensure the housing and the housing The electrical conduction relationship of the needle body.
本發明提供一種殼體由上殼件及下蓋組成之彈性探針的製造方法,包含有下列步驟:a.製造該上殼件、該下蓋及該針體,並將該高分子彈性體設於該上殼件之容置空間;b.將該針體穿過該下蓋之穿孔;以及c.將該上殼件與該下蓋相互固定。 The invention provides a manufacturing method of an elastic probe composed of an upper shell member and a lower cover, comprising the following steps: a. manufacturing the upper shell member, the lower cap and the needle body, and the polymer elastomer Provided in the accommodating space of the upper casing; b. passing the needle through the perforation of the lower cover; and c. fixing the upper casing and the lower cover to each other.
本發明更提供另一種如前述之彈性探針的製造方法,包含有下列步驟:a.利用微影製程及電鍍製造出該殼體之頂部;b.利用微影製程及電鍍製造出與該殼體之頂部一體連接之該側壁的一第一部分,並形成該容置空間;c.將該高分子彈性體設於該容置空間;d.利用微影製程及電鍍製造出與該側壁之第一部分一體連接之該側壁的一第二部分,以及位於該高分子彈性體上的該針體之擋止部;e.利用微影製程及電鍍製造出與該側壁之第二部分一體連接之該側壁的一第三部分,以及與該針體之擋止部一體連接之該針體之身部的一第一區段;f.利用微影製程及電鍍製造出與該側壁之第三部分一體連接之該殼體的底部,以及與該針體之身部的第一區段一體連接且位於該殼體底部之穿孔內的該針體之身部的一第二區段;以及g.利用微影製程及電鍍製造出與該針體之身部的第二區段一體連接且位於該殼體外的該針體之身部的一第三區段。 The invention further provides another method for manufacturing the elastic probe as described above, comprising the steps of: a. manufacturing the top of the shell by using a lithography process and electroplating; b. manufacturing the shell by using a lithography process and electroplating a top portion of the body is integrally connected to a first portion of the sidewall, and the receiving space is formed; c. the polymeric elastomer is disposed in the receiving space; d. is fabricated by using a lithography process and electroplating a second portion of the side wall integrally connected, and a stop portion of the needle body on the polymer elastic body; e. using a lithography process and electroplating to manufacture the body portion integrally connected with the second portion of the side wall a third portion of the side wall, and a first portion of the body of the needle body integrally connected with the stopping portion of the needle body; f. manufacturing a third portion of the side wall by using a lithography process and electroplating a bottom portion of the housing to which the housing is coupled, and a second section of the body of the needle body integrally connected to the first section of the body of the needle body and located in the perforation of the bottom of the housing; and The lithography process and electroplating are made with the body of the needle The second section integrally connected to and located outside the housing body portion of a third section of the needle.
有關本發明所提供之彈性探針及其製造方法的詳細構造、特點、組裝或使用方式,將於後續的實施方式詳細說明中予以描述。然而,在本發明領域中具有通常知識者應能瞭解,該等詳細說明以及實施本發明所列舉的特定實施例,僅係用於說明本發明,並非用以限制本發明之專利申請範圍。 Detailed construction, features, assembly or use of the elastic probe and its method of manufacture provided by the present invention will be described in the detailed description of the following embodiments. However, it should be understood by those of ordinary skill in the art that the present invention is not limited by the scope of the invention.
11~19‧‧‧彈性探針 11~19‧‧‧elastic probe
20‧‧‧殼體 20‧‧‧shell
21‧‧‧頂部 21‧‧‧ top
212‧‧‧連接端部 212‧‧‧Connecting end
22‧‧‧底部 22‧‧‧ bottom
23‧‧‧側壁 23‧‧‧ side wall
232‧‧‧階部 232‧‧‧
234‧‧‧下表面 234‧‧‧ lower surface
236‧‧‧側表面 236‧‧‧ side surface
23A‧‧‧第一部分 23A‧‧‧Part 1
23B‧‧‧第二部分 23B‧‧‧Part II
23C‧‧‧第三部分 23C‧‧‧Part III
24‧‧‧容置空間 24‧‧‧ accommodating space
25‧‧‧穿孔 25‧‧‧Perforation
252‧‧‧內壁面 252‧‧‧ inner wall
26‧‧‧上殼件 26‧‧‧Upper case
27‧‧‧下蓋 27‧‧‧Under the cover
30‧‧‧針體 30‧‧‧ needle
31‧‧‧身部 31‧‧‧ Body
31A‧‧‧第一區段 31A‧‧‧First Section
31B‧‧‧第二區段 31B‧‧‧second section
31C‧‧‧第三區段 31C‧‧‧third section
32‧‧‧擋止部 32‧‧‧stops
322‧‧‧側面 322‧‧‧ side
324‧‧‧抵接面 324‧‧‧Abutment
33‧‧‧點觸部 33‧‧‧ Touching
34‧‧‧延伸部 34‧‧‧Extension
35‧‧‧容置槽 35‧‧‧ accommodating slots
36‧‧‧彈性部 36‧‧‧Flexible Department
37‧‧‧抵接部 37‧‧‧Apartment
40‧‧‧高分子彈性體 40‧‧‧Polymer elastomer
42‧‧‧頂側 42‧‧‧ top side
44‧‧‧底側 44‧‧‧ bottom side
51‧‧‧基板 51‧‧‧Substrate
52‧‧‧凹槽 52‧‧‧ Groove
53‧‧‧種子層 53‧‧‧ seed layer
54‧‧‧光阻 54‧‧‧Light resistance
55‧‧‧通孔 55‧‧‧through hole
56‧‧‧結合層 56‧‧‧Combination layer
61‧‧‧玻璃板 61‧‧‧ glass plate
62‧‧‧基板 62‧‧‧Substrate
63‧‧‧穿孔 63‧‧‧Perforation
632‧‧‧大徑段 632‧‧‧ Large diameter section
634‧‧‧小徑段 634‧‧‧Small path
64‧‧‧種子層 64‧‧‧ seed layer
65‧‧‧光阻 65‧‧‧Light resistance
66‧‧‧通孔 66‧‧‧through hole
67‧‧‧金屬層 67‧‧‧metal layer
71‧‧‧第一基板 71‧‧‧First substrate
711‧‧‧第一表面 711‧‧‧ first surface
712‧‧‧穿孔 712‧‧‧Perforation
713‧‧‧第二表面 713‧‧‧ second surface
714‧‧‧凹槽 714‧‧‧ Groove
72‧‧‧光阻 72‧‧‧Light resistance
73‧‧‧第二基板 73‧‧‧second substrate
74‧‧‧種子層 74‧‧‧ seed layer
75‧‧‧桿體 75‧‧‧ rod body
76‧‧‧光阻 76‧‧‧Light resistance
762‧‧‧通孔 762‧‧‧through hole
77‧‧‧第三基板 77‧‧‧ Third substrate
78‧‧‧光阻 78‧‧‧Light resistance
80‧‧‧彈性探針 80‧‧‧elastic probe
81‧‧‧基板 81‧‧‧Substrate
82‧‧‧犧牲層 82‧‧‧ Sacrifice layer
83‧‧‧光阻 83‧‧‧Light resistance
832‧‧‧通孔 832‧‧‧through hole
84‧‧‧光阻 84‧‧‧Light resistance
842‧‧‧通孔 842‧‧‧through hole
85‧‧‧光阻 85‧‧‧Light resistance
852‧‧‧通孔 852‧‧‧through hole
854‧‧‧內側部 854‧‧‧ inside part
856‧‧‧外側部 856‧‧‧Outside
D1‧‧‧探針長度 D 1 ‧‧‧Probe length
D2‧‧‧彈性體長度 D 2 ‧‧‧elastomer length
L‧‧‧假想軸線 L‧‧‧ imaginary axis
第1圖為本發明一第一較佳實施例所提供之彈性探針的剖視示意圖;第2圖為本發明一第二較佳實施例所提供之彈性探針的剖視示意圖;第3圖為本發明一第三較佳實施例所提供之彈性探針的剖視示意圖;第4圖為本發明一第四較佳實施例所提供之彈性探針的剖視示意圖;第5圖為本發明一第五較佳實施例所提供之彈性探針的剖視示意圖;第6圖為本發明一第六較佳實施例所提供之彈性探針的剖視示意圖;第7圖為本發明一第七較佳實施例所提供之彈性探針的剖視示意圖;第8圖為本發明一第八較佳實施例所提供之彈性探針的剖視示意圖;第9圖為本發明一第九較佳實施例所提供之彈性探針的立體示意圖;第10圖為本發明該第九較佳實施例所提供之彈性探針的剖視組合圖;第11圖為本發明該第九較佳實施例所提供之彈性探針的剖視分解圖;第12圖至第14圖為本發明該第九較佳實施例所提供之彈性探針的製造方法之步驟a的剖視示意圖;以及第15圖至第25圖為本發明一第十較佳實施例所提供之彈性探針的製造方法之剖視示意圖。 1 is a cross-sectional view of a resilient probe according to a first preferred embodiment of the present invention; and FIG. 2 is a cross-sectional view of a flexible probe according to a second preferred embodiment of the present invention; FIG. 4 is a cross-sectional view showing a flexible probe according to a third preferred embodiment of the present invention; FIG. 4 is a cross-sectional view showing a flexible probe according to a fourth preferred embodiment of the present invention; FIG. 6 is a cross-sectional view of an elastic probe according to a fifth preferred embodiment of the present invention; FIG. 6 is a cross-sectional view of the elastic probe according to a sixth preferred embodiment of the present invention; A cross-sectional view of a resilient probe provided by a seventh preferred embodiment; FIG. 8 is a cross-sectional view of an elastic probe according to an eighth preferred embodiment of the present invention; 9 is a schematic perspective view of an elastic probe provided by the ninth preferred embodiment of the present invention; FIG. 11 is a cross-sectional view of the elastic probe provided by the ninth preferred embodiment of the present invention; A cross-sectional exploded view of the elastic probe provided by the preferred embodiment; Figs. 12 to 14 are the same FIG. 15 is a cross-sectional view showing the step a of the method for manufacturing the elastic probe provided by the ninth preferred embodiment; and FIGS. 15 to 25 are views showing the manufacture of the elastic probe according to the tenth preferred embodiment of the present invention. A schematic cross-sectional view of the method.
申請人首先在此說明,在以下將要介紹之實施例以及圖式中,相同之參考號碼,表示相同或類似之元件或其結構特徵。 The Applicant first describes the same or similar elements or structural features thereof in the embodiments and the drawings which will be described below.
請先參閱第1圖,本發明一第一較佳實施例所提供之彈性 探針11包含有一殼體20、一針體30,以及一高分子彈性體40。該殼體20及該針體30可利用金屬材料或其他可導電之材料製成,該高分子彈性體40係由不導電之高分子複合材料(例如,但不限於,高分子有機矽化合物)製成。 Please refer to FIG. 1 for the elasticity provided by a first preferred embodiment of the present invention. The probe 11 includes a housing 20, a needle 30, and a polymeric elastomer 40. The housing 20 and the needle body 30 can be made of a metal material or other electrically conductive material, and the polymer elastomer 40 is made of a non-conductive polymer composite material (for example, but not limited to, a polymer organic germanium compound). production.
該殼體20可概呈空心圓柱狀,具有一頂部21、一底部22、一位於該頂部21及該底部22之間的側壁23,該頂部21、該底部22及該側壁23定義出一容置空間24,該底部22設有一與該容置空間24連通的穿孔25,該殼體20能定義出一通過該穿孔25中心的假想軸線L。在本實施例中,該殼體20之頂部21具有一呈錐形之連接端部212,係用以電性連接一電路板或一空間轉換器(圖中未示);然而,該殼體20之連接端部212的形狀並無限制,例如亦可呈空心柱狀(如第10圖所示)或實心柱狀(如第25圖所示)。 The housing 20 can be substantially hollow cylindrical and has a top portion 21, a bottom portion 22, and a side wall 23 between the top portion 21 and the bottom portion 22. The top portion 21, the bottom portion 22 and the side wall 23 define a cavity. A space 24 is provided. The bottom portion 22 is provided with a through hole 25 communicating with the accommodating space 24, and the casing 20 defines an imaginary axis L passing through the center of the through hole 25. In this embodiment, the top portion 21 of the housing 20 has a tapered connecting end portion 212 for electrically connecting a circuit board or a space converter (not shown); however, the housing The shape of the connecting end portion 212 of the 20 is not limited, and may be, for example, a hollow column shape (as shown in Fig. 10) or a solid column shape (as shown in Fig. 25).
該針體30具有一呈直桿狀的身部31、一位於該身部31一端且截面積較該身部31大的擋止部32,以及一位於該身部31另一端且係用以點觸待測物(圖中未示)的點觸部33,該身部31係可沿著前述假想軸線L滑移地穿設於該殼體20之穿孔25,該擋止部32係被限位於該容置空間24內,該點觸部33係位於該殼體20外。該點觸部33之形狀並不限制為本實施例所提供之錐形,且不一定要具有尖端,該點觸部33亦可呈圓柱狀(如第10圖及第25圖所示),並且能以呈平面狀之末端點觸待測物。該針體30係能沿該假想軸線L而相對該殼體20位移,且該針體30之身部31係能滑移地接觸該殼體20之穿孔25的內壁面252;藉此,該針體30係與該殼體20相互電性導通,因而可使該點觸部33所點觸之待測物與該殼體20頂部21所連接之電路板或空間轉換器相互傳輸訊號。 The needle body 30 has a body portion 31 having a straight rod shape, a stopper portion 32 at one end of the body portion 31 and having a larger cross-sectional area than the body portion 31, and a distal end portion of the body portion 31 for use at the other end of the body portion 31. Touching the contact portion 33 of the object to be tested (not shown), the body portion 31 is slidably disposed along the imaginary axis L to the through hole 25 of the casing 20, and the stopper portion 32 is slid The contact portion 33 is located outside the housing 20 . The shape of the contact portion 33 is not limited to the taper provided in this embodiment, and does not necessarily have a tip end, and the contact portion 33 may also have a cylindrical shape (as shown in FIGS. 10 and 25). And the object to be tested can be touched at the end of the plane. The needle body 30 is displaceable relative to the housing 20 along the imaginary axis L, and the body portion 31 of the needle body 30 is slidably contacting the inner wall surface 252 of the through hole 25 of the housing 20; The needle body 30 is electrically connected to the housing 20, so that the object to be touched by the contact portion 33 and the circuit board or the space converter connected to the top portion 21 of the housing 20 can transmit signals to each other.
該高分子彈性體40係設於該容置空間24,可為如本實施例之橢圓體形狀,亦可為其他形狀,例如圓柱形、球形、管柱形等等。該高分子彈性體40具有實質上朝向相反方向之一頂側42及一底側44,該頂側42係抵接於該殼體20之頂部21,該底側44係抵接於該針體30之擋止部32。藉此,在該針體30未接觸待測物之狀態下,其擋止部32係受該高分子彈性體40壓抵於該殼體20之底部22,使得該針體30之縱向係沿著該假想軸線L;當該針體30之點觸部33接觸待測物之電性接點時,該針體30可 隨著該電性接點之高度而沿該假想軸線L位移,同時壓抵該高分子彈性體40而使得該高分子彈性體40彈性變形。 The polymeric elastomer 40 is disposed in the accommodating space 24, and may be in the shape of an ellipsoid as in the present embodiment, and may have other shapes such as a cylindrical shape, a spherical shape, a tubular shape, or the like. The polymeric elastomer 40 has a top side 42 and a bottom side 44 substantially opposite to each other. The top side 42 abuts against the top 21 of the housing 20, and the bottom side 44 abuts the needle body. 30 stop portion 32. Thereby, in a state where the needle body 30 is not in contact with the object to be tested, the stopper portion 32 is pressed against the bottom portion 22 of the casing 20 by the polymer elastic body 40, so that the longitudinal direction of the needle body 30 is The imaginary axis L; when the point contact portion 33 of the needle body 30 contacts the electrical contact of the object to be tested, the needle body 30 can The polymer elastic body 40 is elastically deformed by being displaced along the imaginary axis L with the height of the electrical contact while being pressed against the polymeric elastomer 40.
藉由該高分子彈性體40之彈力作用,該針體30之縱向不但能保持沿著該假想軸線L而不偏擺,且該針體30之點觸部33可隨待測物之電性接點高度調整位置,並提供待測物適當的接觸力。其次,高分子彈性體40所提供的彈性回復力,可藉由高分子彈性體之密度且/或形狀來控制,使針體30可以提供不同針壓給待測物。此外,該針體30之接觸力係由該高分子彈性體40提供,但訊號則是經由該殼體20傳輸,亦即,該彈性探針11之接觸力傳輸路徑係與訊號傳輸路徑分離,而且,相較於習用之具有前述彈性特徵及功效的彈性探針,該彈性探針11可製造得較短,因此特別適用於高頻測試。一般而言,習用之挫曲探針(Vertical buckling needle)及彈簧探針(POGO pin)長度分別大約為6mm及2.5mm,而本發明所提供之彈性探針11能定義出一探針長度D1為該殼體20之頂部21與該針體30之點觸部33的最大距離,且該探針長度D1可為2mm甚至小於2mm,因此相當適合於高頻探測之用。 By the elastic force of the polymer elastic body 40, the longitudinal direction of the needle body 30 can be maintained not along the imaginary axis L without yaw, and the point contact portion 33 of the needle body 30 can be electrically connected with the object to be tested. The height of the point is adjusted and the appropriate contact force of the object to be tested is provided. Secondly, the elastic restoring force provided by the polymeric elastomer 40 can be controlled by the density and/or shape of the polymeric elastomer, so that the needle 30 can provide different needle pressures to the analyte. In addition, the contact force of the needle body 30 is provided by the polymer elastic body 40, but the signal is transmitted through the housing 20, that is, the contact force transmission path of the elastic probe 11 is separated from the signal transmission path. Moreover, the elastic probe 11 can be made shorter than the conventional elastic probe having the aforementioned elastic characteristics and efficacy, and thus is particularly suitable for high frequency testing. In general, the length of the conventional buckling probe and the spring probe (POGO pin) are about 6 mm and 2.5 mm, respectively, and the elastic probe 11 provided by the present invention can define a probe length D. 1 is the maximum distance between the top portion 21 of the housing 20 and the contact portion 33 of the needle body 30, and the probe length D 1 may be 2 mm or even less than 2 mm, and thus is quite suitable for high frequency detection.
此外,本發明所提供之彈性探針能定義出一彈性體長度D2為該高分子彈性體40未彈性變形時的長度,亦即該高分子彈性體40未彈性變形時其頂側42與底側44的最大距離,且該彈性體長度D2係以大於或等於0.3mm且小於或等於1mm為較佳之設計。 In addition, the elastic probe provided by the present invention can define an elastic body length D 2 as the length when the polymeric elastic body 40 is not elastically deformed, that is, the top side 42 of the polymeric elastic body 40 when it is not elastically deformed. The maximum distance of the bottom side 44, and the length D 2 of the elastomer is preferably greater than or equal to 0.3 mm and less than or equal to 1 mm.
請參閱第2圖,本發明一第二較佳實施例所提供之彈性探針12與第一較佳實施例之彈性探針11之差異在於,在該彈性探針12中,該殼體20之側壁23具有一階部232,該階部232具有一下表面234及一側表面236,該針體30具有一自該擋止部32延伸而出之延伸部34,該高分子彈性體40係為空心圓柱體並設於該延伸部34與該側壁23之間,且其頂側42及底側44係分別抵接於該階部232的下表面234及該針體30的擋止部32。藉此,該高分子彈性體40亦可受沿該假想軸線L位移之該針體30壓抵而彈性變形,以達到與第一較佳實施例相同之功效。此外,該針體30之延伸部34係能滑移地接觸該階部232之側表面236,藉以相互電性導通,如此可更確保該殼體20與該針體30之電性導通關係。 Referring to FIG. 2, the elastic probe 12 provided by a second preferred embodiment of the present invention is different from the elastic probe 11 of the first preferred embodiment in that the housing 20 is in the elastic probe 12. The side wall 23 has a first step 232 having a lower surface 234 and a side surface 236. The needle body 30 has an extension 34 extending from the stop portion 32. The polymeric elastomer 40 is The hollow cylinder is disposed between the extending portion 34 and the side wall 23, and the top side 42 and the bottom side 44 thereof respectively abut against the lower surface 234 of the step portion 232 and the stopping portion 32 of the needle body 30. . Thereby, the polymeric elastomer 40 can also be elastically deformed by being pressed against the needle body 30 displaced along the imaginary axis L to achieve the same effect as the first preferred embodiment. In addition, the extension portion 34 of the needle body 30 can slidably contact the side surface 236 of the step portion 232 to electrically conduct each other, so that the electrical conduction relationship between the housing 20 and the needle body 30 can be more ensured.
請參閱第3圖,本發明一第三較佳實施例所提供之彈性探 針13中,該針體30亦具有一自該擋止部32延伸而出之延伸部34,該延伸部34雖未與該殼體20接觸,但可讓該高分子彈性體40藉由被壓縮變形時抵接於該延伸部34而提供該針體30垂直於該假想軸線L之側向力,使得該針體30之身部31更確實地接觸該穿孔25之內壁面252,進而更確保該針體30與該殼體20的電性導通關係。此外,該針體30之擋止部32的一側面322係能滑移地接觸該殼體20之側壁23,藉以相互電性導通,如此亦可更確保該殼體20與該針體30之電性導通關係。前述之第一、二較佳實施例中,該針體30亦可設計成其擋止部32之側面係能滑移地接觸該側壁23。 Please refer to FIG. 3 for an elastic probe provided by a third preferred embodiment of the present invention. In the needle 13, the needle body 30 also has an extending portion 34 extending from the stopping portion 32. Although the extending portion 34 is not in contact with the housing 20, the polymeric elastic body 40 can be made by the elastic body 40. Abutting against the extending portion 34 during compression deformation, the lateral force of the needle body 30 perpendicular to the imaginary axis L is provided, so that the body portion 31 of the needle body 30 more reliably contacts the inner wall surface 252 of the through hole 25, and thus An electrical conduction relationship between the needle body 30 and the housing 20 is ensured. In addition, a side surface 322 of the stopping portion 32 of the needle body 30 can slidably contact the side wall 23 of the housing 20 so as to be electrically connected to each other, so that the housing 20 and the needle body 30 can be more ensured. Electrical conduction relationship. In the first and second preferred embodiments described above, the needle body 30 can also be designed such that the side of the stopper portion 32 can slidably contact the side wall 23.
請參閱第4圖,本發明一第四較佳實施例所提供之彈性探針14係類同於第三較佳實施例之彈性探針13,惟該針體30之擋止部32及延伸部34形成出一容置槽35,該高分子彈性體40係設於該容置槽35內,且該延伸部34係能滑移地接觸該殼體20之側壁23,藉以相互電性導通。藉此,該高分子彈性體40藉由抵接於該延伸部34而提供該針體30垂直於該假想軸線L之側向力,該側向力不但可使該針體30之身部31更確實地與該穿孔25之內壁面252接觸,更將該延伸部34壓抵於該側壁23,如此之設計使得該針體30與該殼體20之電性導通關係更加確實。前述之第三較佳實施例中,該針體30亦可設計成其延伸部34係能滑移地接觸該側壁23,並藉由該高分子彈性體40將該延伸部34壓抵於該側壁23。 Referring to FIG. 4, an elastic probe 14 according to a fourth preferred embodiment of the present invention is similar to the elastic probe 13 of the third preferred embodiment, except that the stop portion 32 and the extension of the needle 30 are extended. The portion 34 is formed with a receiving groove 35. The polymer elastic body 40 is disposed in the receiving groove 35, and the extending portion 34 is slidably contacting the side wall 23 of the housing 20, thereby electrically conducting each other. . Thereby, the polymer elastic body 40 provides a lateral force perpendicular to the imaginary axis L of the needle body 30 by abutting against the extending portion 34, and the lateral force can not only make the body portion 31 of the needle body 30 The inner wall surface 252 of the through hole 25 is more reliably contacted, and the extending portion 34 is pressed against the side wall 23, so that the electrical conduction relationship between the needle body 30 and the housing 20 is more sure. In the third preferred embodiment, the needle body 30 can also be designed such that the extension portion 34 can slidably contact the side wall 23, and the extension portion 34 is pressed against the elastic portion 40 by the polymer elastic body 40. Side wall 23.
請參閱第5圖及第6圖,本發明第五及第六較佳實施例所提供之彈性探針15、16係分別類同於第一及第二較佳實施例之彈性探針11、12,惟該針體30之擋止部32的一側面322係能滑移地接觸該殼體20之側壁23,藉以相互電性導通,且該擋止部32之一抵接於該高分子彈性體40的抵接面324係非垂直於且非平行於該假想軸線L。藉此,該高分子彈性體40施予該抵接面324之彈性恢復力能分解出朝向該側壁23的分力,以使該身部31及該擋止部32之側面322分別更確實地接觸該內壁面252及該側壁23。如此一來,該針體30雖未設有供該高分子彈性體40推抵之延伸部,該高分子彈性體40仍可提供給該針體30垂直於該假想軸線L之側向力(亦即前述之分力),以確保該殼體20與該針體30之電性導通關係。 Referring to FIG. 5 and FIG. 6 , the elastic probes 15 and 16 of the fifth and sixth preferred embodiments of the present invention are similar to the elastic probes 11 of the first and second preferred embodiments, respectively. 12, a side surface 322 of the stopper portion 32 of the needle body 30 is slidably contacted with the side wall 23 of the casing 20, thereby electrically conducting each other, and one of the stopper portions 32 abuts against the polymer The abutment surface 324 of the elastomer 40 is non-perpendicular and non-parallel to the imaginary axis L. Thereby, the elastic restoring force applied to the abutting surface 324 by the polymer elastic body 40 can decompose the component force toward the side wall 23, so that the body portion 31 and the side surface 322 of the stopping portion 32 are more reliably The inner wall surface 252 and the side wall 23 are contacted. In this way, although the needle body 30 is not provided with an extension portion for the polymer elastic body 40 to be pushed, the polymer elastic body 40 can still provide the lateral force of the needle body 30 perpendicular to the imaginary axis L ( That is, the aforementioned component force) to ensure an electrical conduction relationship between the housing 20 and the needle body 30.
在前述之各實施例中,該殼體20係以其頂部21或側壁23之階部232直接抵接於該高分子彈性體40之頂側42,然而,該殼體20與 該高分子彈性體40之頂側42亦可間接地相互抵接,例如下述之第七、八較佳實施例所提供者。 In each of the foregoing embodiments, the housing 20 is directly abutted against the top side 42 of the polymeric elastomer 40 with the top portion 232 of the top portion 21 or the side wall 23, however, the housing 20 is The top side 42 of the polymeric elastomer 40 may also indirectly abut each other, such as those provided in the seventh and eighth preferred embodiments below.
請參閱第7圖,本發明之第七較佳實施例所提供的彈性探針17中,該針體30除了具有該身部31、該擋止部32及該點觸部33,更具有一自該擋止部32一體地延伸而出之彈性部36,以及一與該彈性部36一體連接之抵接部37,且該抵接部37係電性導通地抵接於該殼體20之頂部21,該針體30之擋止部32及抵接部37係分別抵接於該高分子彈性體40之底側44及頂側42。藉此,該針體30之彈性部36及該高分子彈性體40係能同時彈性變形,使得該針體30之點觸部33可隨待測物之電性接點高度位移並提供適當的接觸力,且該彈性部36及該高分子彈性體40更壓抵於該抵接部37而確保針體30與該殼體20之電性導通關係。 Referring to FIG. 7, in the elastic probe 17 provided by the seventh preferred embodiment of the present invention, the needle body 30 has a body portion 31, the stopping portion 32 and the point contact portion 33, and has a An elastic portion 36 integrally extending from the stopper portion 32 and an abutting portion 37 integrally connected to the elastic portion 36, and the abutting portion 37 is electrically connected to the housing 20 In the top portion 21, the stopper portion 32 and the abutting portion 37 of the needle body 30 abut against the bottom side 44 and the top side 42 of the polymer elastic body 40, respectively. Thereby, the elastic portion 36 of the needle body 30 and the polymer elastic body 40 can be elastically deformed at the same time, so that the point contact portion 33 of the needle body 30 can be displaced with the height of the electrical contact of the object to be tested and provide appropriate The elastic force portion 36 and the elastic elastic body 40 are pressed against the abutting portion 37 to ensure an electrical conduction relationship between the needle body 30 and the casing 20 .
請參閱第8圖,本發明之第八較佳實施例所提供的彈性探針18係類同於第七較佳實施例之彈性探針17,惟該針體30之擋止部32、彈性部36及抵接部37係由一軟性電路板製成(flexible printed circuit board;簡稱FPCB),如此亦可達成與第七較佳實施例相同之功效。 Referring to FIG. 8, the elastic probe 18 of the eighth preferred embodiment of the present invention is similar to the elastic probe 17 of the seventh preferred embodiment, except that the stop portion 32 of the needle 30 is elastic. The portion 36 and the abutting portion 37 are made of a flexible printed circuit board (FPCB), so that the same effects as those of the seventh preferred embodiment can be achieved.
請參閱第9圖至第11圖,本發明一第九較佳實施例所提供之彈性探針19係類同於第一較佳實施例之彈性探針11,惟該彈性探針19之殼體20係由一上殼件26及一下蓋27相互固接而成,該殼體20之頂部21、側壁23及容置空間24係位於該上殼件26,該殼體20之底部22及穿孔25係位於該下蓋27。該彈性探針19的製造方法包含有下列步驟: Referring to FIG. 9 to FIG. 11 , an elastic probe 19 according to a ninth preferred embodiment of the present invention is similar to the elastic probe 11 of the first preferred embodiment, except for the shell of the elastic probe 19 . The body 20 is fixed by an upper casing member 26 and a lower cover 27, and the top portion 21, the side wall 23 and the accommodating space 24 of the casing 20 are located on the upper casing member 26, and the bottom portion 22 of the casing 20 and A perforation 25 is located in the lower cover 27. The manufacturing method of the elastic probe 19 includes the following steps:
a.如第11圖所示,製造該上殼件26、該下蓋27及該針體30,並將該高分子彈性體40設於該上殼件26之容置空間24。 As shown in FIG. 11, the upper casing member 26, the lower cover 27 and the needle body 30 are manufactured, and the polymeric elastomer 40 is placed in the accommodating space 24 of the upper casing member 26.
此步驟a可藉由如第12圖至第14圖所示之方式達成,為了簡化圖式,第12圖至第14圖並非完全對應第9圖至第11圖所示之形狀及比例而繪製,而僅概略地繪製出各元件之特徵,以便說明。 This step a can be achieved by the manner shown in FIGS. 12 to 14 . To simplify the drawing, the 12th to 14th drawings are not completely corresponding to the shapes and proportions shown in FIGS. 9 to 11 . Only the features of each component are roughly drawn for illustration.
第12圖係顯示該上殼件26之製造過程,首先,如第12圖A所示,利用微影製程(photolithography)在一基板51(材質可為矽)上形成一對應該上殼件26之外型的凹槽52。然後,如第12圖B所示,在該基板51上覆蓋一金屬材質之種子層53,再利用微影製程在該種子層53上形成一光阻54,且該光阻54具有一對應該凹槽52之通孔55,再於該通孔55 及該凹槽52內電鍍出該上殼件26(材質可為鎳鈷合金)。然後,將高分子複合材料填充入該上殼件26之容置空間24而形成該高分子彈性體40,如第12圖C所示,此時,可利用該光阻54之通孔55在該上殼件26上沉積出一結合層56,以便後續與該下蓋27結合。最後,將該光阻54去除,再蝕刻部分之該種子層53,如第12圖D所示。 Fig. 12 is a view showing the manufacturing process of the upper case member 26. First, as shown in Fig. 12A, a pair of upper case members 26 are formed on a substrate 51 (material may be 矽) by photolithography. The outer shape of the groove 52. Then, as shown in FIG. 12B, the substrate 51 is covered with a metal seed layer 53, and a photoresist 54 is formed on the seed layer 53 by a lithography process, and the photoresist 54 has a pair of should a through hole 55 of the groove 52, and then the through hole 55 The upper casing member 26 (the material may be nickel-cobalt alloy) is plated in the groove 52. Then, the polymer composite material is filled into the accommodating space 24 of the upper casing member 26 to form the polymer elastic body 40, as shown in FIG. 12C. At this time, the through hole 55 of the photoresist 54 can be utilized. A bonding layer 56 is deposited on the upper casing member 26 for subsequent bonding with the lower cover 27. Finally, the photoresist 54 is removed and a portion of the seed layer 53 is etched as shown in FIG. 12D.
第13圖係顯示該下蓋27之製造過程,首先,如第13圖A所示,將一玻璃板61結合於一基板62(材質可為矽),並利用微影製程在該玻璃板61上形成一穿孔63,且該穿孔63具有一大徑段632及一小徑段634。然後,如第13圖B所示,在該玻璃板61上及該穿孔63內覆蓋一金屬材質之種子層64,再利用微影製程在該種子層64上形成一光阻65,且該光阻65具有一對應該穿孔63之通孔66,再藉由該通孔66而於該穿孔63內電鍍出一金屬層67(材質可為鎳鈷合金)。最後,將該光阻65去除,如第13圖C所示。 Fig. 13 is a view showing the manufacturing process of the lower cover 27. First, as shown in Fig. 13A, a glass plate 61 is bonded to a substrate 62 (material may be 矽), and a lithography process is used on the glass plate 61. A through hole 63 is formed on the hole 63, and the through hole 63 has a large diameter section 632 and a small diameter section 634. Then, as shown in FIG. 13B, a metal seed layer 64 is covered on the glass plate 61 and the through hole 63, and a photoresist 65 is formed on the seed layer 64 by a lithography process, and the light is formed. The resistor 65 has a pair of through holes 66 which are to be perforated 63, and a metal layer 67 (the material may be nickel-cobalt alloy) is electroplated in the through holes 63 through the through holes 66. Finally, the photoresist 65 is removed as shown in Fig. 13C.
第14圖係顯示同時製造四該針體30之過程,首先,如第14圖A所示,利用微影製程在一第一基板71(材質可為矽)之第一表面711形成一具有四通孔的光阻72,再利用該光阻72而於該第一基板71蝕刻出四穿孔712,再將該第一基板71及該光阻72結合於一第二基板73(材質可為矽)上的一種子層74(材質可為金屬)。然後,如第14圖B所示,利用微影製程及蝕刻在該第一基板71之第二表面713上形成分別位於該等穿孔712一端之四凹槽714,再於該等穿孔712及凹槽714內電鍍出四桿體75(材質可為鎳鈷合金),並將該等桿體75研磨成與該第二表面713齊平。或者,如第14圖C所示,利用微影製程在該第一基板71之第二表面713形成一光阻76,且該光阻76具有分別位於該等穿孔712一端之四通孔762,再於該等穿孔712及通孔762內進行電鍍,如此亦可形成如前述之四桿體75。然後,將第14圖B或第14圖C所示之結構結合於一第三基板77上的一層光阻78,再利用蝕刻方式將該第二基板73及該種子層74去除,如第14圖D所示,最後,將各該桿體75自該光阻78取下即可作為該針體30。 Fig. 14 is a view showing a process of simultaneously manufacturing four needle bodies 30. First, as shown in Fig. 14A, a first surface 711 of a first substrate 71 (material may be 矽) is formed by a lithography process having four The photoresist 72 of the via hole is further etched into the first substrate 71 by the photoresist 72, and the first substrate 71 and the photoresist 72 are bonded to a second substrate 73. A sub-layer 74 (material can be metal). Then, as shown in FIG. 14B, four recesses 714 respectively located at one ends of the through holes 712 are formed on the second surface 713 of the first substrate 71 by lithography and etching, and then the through holes 712 and the recesses are formed. A four-bar 75 (material may be nickel-cobalt alloy) is electroplated in the groove 714, and the rods 75 are ground to be flush with the second surface 713. Or, as shown in FIG. 14C, a photoresist 76 is formed on the second surface 713 of the first substrate 71 by using a lithography process, and the photoresist 76 has four through holes 762 respectively located at one ends of the through holes 712. Electroplating is performed in the through holes 712 and the through holes 762, so that the four rods 75 as described above can also be formed. Then, the structure shown in FIG. 14B or FIG. 14C is bonded to a layer of photoresist 78 on a third substrate 77, and the second substrate 73 and the seed layer 74 are removed by etching, such as the 14th. As shown in FIG. D, finally, each of the rods 75 is removed from the photoresist 78 as the needle body 30.
b.請參閱第10圖及第11圖,將該針體30穿過該下蓋27之穿孔25。 b. Referring to Figures 10 and 11, the needle 30 is passed through the perforation 25 of the lower cover 27.
c.將該上殼件26與該下蓋27相互固定,如此即完成該彈 性探針19。其中,固定的方法並無特別限制,可用黏結、燒結、外加固定套管或固定夾具等方式來達成。 c. Fixing the upper casing member 26 and the lower cover 27 to each other, thus completing the bomb Sex probe 19. Among them, the fixing method is not particularly limited, and may be achieved by bonding, sintering, adding a fixing sleeve or fixing a fixture.
本發明更提供另一種彈性探針之製造方法,係用以製造類同於前述之第一較佳實施例所提供之彈性探針,第15圖至第25圖係顯示利用該製造方法同時製造出四彈性探針80之過程,包含有下列步驟: The present invention further provides a method for manufacturing an elastic probe for manufacturing an elastic probe similar to that provided in the first preferred embodiment described above, and FIGS. 15 to 25 show simultaneous manufacturing using the manufacturing method. The process of extracting four elastic probes 80 includes the following steps:
a.利用微影製程及電鍍製造出該殼體20之頂部21。詳而言之,先在一基板81上電鍍出一犧牲層82,如第15圖所示,再利用微影製程在該犧牲層82上形成一光阻83,且該光阻83具有四通孔832,如第16圖所示,再於該等通孔832內進行電鍍而形成出該殼體20的連接端部212。然後,利用乾蝕刻方式去除該光阻83,再利用電鍍而將該犧牲層82增高,並可進行平坦化而使該犧牲層82與該等連接端部212齊平,如第17圖所示,再利用微影製程在該犧牲層82上形成一光阻84,且該光阻84具有分別位於該等連接端部212一端之四通孔842,再於該等通孔842內進行電鍍而形成出完整之殼體20頂部21。 a. The top 21 of the housing 20 is fabricated using a lithography process and electroplating. In detail, a sacrificial layer 82 is first plated on a substrate 81. As shown in FIG. 15, a photoresist 83 is formed on the sacrificial layer 82 by a lithography process, and the photoresist 83 has a cross-connection. The hole 832, as shown in Fig. 16, is plated in the through holes 832 to form the connecting end portion 212 of the casing 20. Then, the photoresist 83 is removed by dry etching, and the sacrificial layer 82 is increased by electroplating, and planarization is performed to make the sacrificial layer 82 flush with the connecting ends 212, as shown in FIG. And forming a photoresist 84 on the sacrificial layer 82 by using a lithography process, and the photoresist 84 has four via holes 842 respectively at one ends of the connection ends 212, and then plating in the via holes 842. A complete top 20 of the housing 20 is formed.
b.利用微影製程及電鍍製造出與該殼體20之頂部21一體連接之該側壁23的一第一部分23A,並形成該容置空間24。在進行此步驟b之前,先利用乾蝕刻方式去除該光阻84,再利用電鍍而將該犧牲層82增高,並可進行平坦化而使該犧牲層82與該等頂部21齊平,如第18圖所示。然後,此步驟b之進行係先利用微影製程在該犧牲層82上形成一光阻85,且該光阻85具有四環形通孔852,再於該等通孔852內進行電鍍而形成出該殼體20之側壁23的第一部分23A,此時,該光阻85可區分為分別位於該等第一部分23A內側之四內側部854,以及一位於該等第一部分23A外側之外側部856,可先在該等內側部854上分別設置一阻擋層(圖中未示),該等阻擋層亦可延伸覆蓋到該等第一部分23A,再利用乾蝕刻方式去除該光阻85之外側部856,再利用電鍍而將該犧牲層82增高,並可進行平坦化而使該犧牲層82與該等第一部分23A齊平且去除該等阻擋層,如第19圖所示,再利用乾蝕刻方式去除該光阻85之內側部854,以於該等第一部分23A內側分別形成一該容置空間24。 b. A first portion 23A of the side wall 23 integrally connected to the top portion 21 of the casing 20 is fabricated by a lithography process and electroplating, and the accommodating space 24 is formed. Before performing step b, the photoresist 84 is removed by dry etching, and the sacrificial layer 82 is raised by electroplating, and planarization is performed to make the sacrificial layer 82 flush with the top 21, as described in Figure 18 shows. Then, the step b is performed by forming a photoresist 85 on the sacrificial layer 82 by using a lithography process, and the photoresist 85 has four annular via holes 852, and then electroplating is formed in the via holes 852. The first portion 23A of the side wall 23 of the housing 20, at this time, the photoresist 85 can be divided into four inner portions 854 respectively located inside the first portions 23A, and a side portion 856 located outside the first portions 23A. A barrier layer (not shown) may be separately disposed on the inner portions 854. The barrier layers may also extend to cover the first portions 23A, and the outer portions 856 of the photoresist 85 may be removed by dry etching. The sacrificial layer 82 is further raised by electroplating, and planarization is performed to make the sacrificial layer 82 flush with the first portions 23A and remove the barrier layers, as shown in FIG. 19, and then dry etching is used. The inner portion 854 of the photoresist 85 is removed to form an accommodating space 24 on the inner side of the first portion 23A.
c.將該高分子彈性體40設於該容置空間24。如第20圖所示,可利用高分子複合材料將該容置空間24填滿,藉以形成該高分子彈性 體40。 c. The polymeric elastomer 40 is placed in the accommodating space 24. As shown in FIG. 20, the accommodating space 24 can be filled with a polymer composite material to form the polymer elastic property. Body 40.
d.利用微影製程及電鍍製造出與該側壁23之第一部分23A一體連接之該側壁23的一第二部分23B,以及位於該高分子彈性體40上的該針體30之擋止部32,如第21圖所示。詳而言之,先利用微影製程在如第20圖所示之犧牲層82上形成一光阻(圖中未示),再利用該光阻而電鍍出該等側壁23的第二部分23B及該等擋止部32,再利用乾蝕刻方式去除該光阻,再利用電鍍而將該犧牲層82增高,並可進行平坦化而使該犧牲層82與該等第二部分23B及擋止部32齊平。 d. A second portion 23B of the side wall 23 integrally connected to the first portion 23A of the side wall 23 and a stopper portion 32 of the needle body 30 on the polymer elastic body 40 are produced by a lithography process and electroplating. As shown in Figure 21. In detail, a photoresist (not shown) is formed on the sacrificial layer 82 as shown in FIG. 20 by using a lithography process, and the second portion 23B of the sidewalls 23 is electroplated by the photoresist. And the stoppers 32 are removed by dry etching, and the sacrificial layer 82 is increased by electroplating, and the sacrificial layer 82 and the second portions 23B are blocked. Part 32 is flush.
e.利用微影製程及電鍍製造出與該側壁23之第二部分23B一體連接之該側壁23的一第三部分23C,以及與該針體30之擋止部32一體連接之該針體30之身部31的一第一區段31A,如第22圖所示。詳而言之,先利用微影製程在如第21圖所示之犧牲層82上形成一光阻(圖中未示),再利用該光阻而電鍍出該等側壁23的第三部分23C及該等身部31的第一區段31A,再利用乾蝕刻方式去除該光阻,再利用電鍍而將該犧牲層82增高,並可進行平坦化而使該犧牲層82與該等第三部分23C及第一區段31A齊平。 e. A third portion 23C of the side wall 23 integrally connected to the second portion 23B of the side wall 23 and the needle body 30 integrally connected to the stopper portion 32 of the needle body 30 are manufactured by a lithography process and electroplating. A first section 31A of the body portion 31 is as shown in FIG. In detail, a photoresist (not shown) is formed on the sacrificial layer 82 as shown in FIG. 21 by using a lithography process, and the third portion 23C of the sidewalls 23 is electroplated by the photoresist. And the first segment 31A of the body portion 31 is removed by dry etching, and the sacrificial layer 82 is increased by electroplating, and the sacrificial layer 82 and the third portion are planarized. 23C and the first section 31A are flush.
f.利用微影製程及電鍍製造出與該側壁23之第三部分23C一體連接之該殼體20的底部22,以及與該針體30之身部31的第一區段31A一體連接且位於該殼體20底部22之穿孔內的該針體30之身部31的一第二區段31B,如第23圖所示。詳而言之,先利用微影製程在如第22圖所示之犧牲層82上形成一光阻(圖中未示),再利用該光阻而電鍍出該等底部22及該等身部31的第二區段31B,再利用乾蝕刻方式去除該光阻,再利用電鍍而將該犧牲層82增高,並可進行平坦化而使該犧牲層82與該等底部22及第二區段31B齊平。 f. manufacturing a bottom portion 22 of the housing 20 integrally connected to the third portion 23C of the side wall 23 by lithography and electroplating, and integrally connected to the first section 31A of the body portion 31 of the needle body 30 and located A second section 31B of the body portion 31 of the needle body 30 in the perforation of the bottom portion 22 of the housing 20 is as shown in FIG. In detail, a photoresist (not shown) is formed on the sacrificial layer 82 as shown in FIG. 22 by using a lithography process, and the bottom portion 22 and the body portions 31 are electroplated by the photoresist. The second segment 31B is removed by dry etching, and the sacrificial layer 82 is increased by electroplating, and the sacrificial layer 82 and the bottom portion 22 and the second segment 31B are planarized. Qi Ping.
g.利用微影製程及電鍍製造出與該針體30之身部31的第二區段31B一體連接且位於該殼體20外的該針體30之身部31的一第三區段31C,如第24圖所示。詳而言之,先利用微影製程在如第23圖所示之犧牲層82上形成一光阻(圖中未示),再利用該光阻而電鍍出該等身部31的第三區段31C,再利用乾蝕刻方式去除該光阻。最後,只要將該犧牲層82利用蝕刻方式去除,即可完成四該彈性探針80,如第25圖所示。在本實施 例中,該針體30之點觸部33即為該身部31位於該殼體20外之末端,因而此步驟g亦形成出該針體30之點觸部33;或者,亦可於此步驟g之後,再利用微影製程及電鍍製造出該針體30之點觸部33。 g. A third section 31C of the body 31 of the needle body 30 integrally connected to the second section 31B of the body portion 31 of the needle body 30 and located outside the housing 20 by lithography and electroplating As shown in Figure 24. In detail, a photoresist (not shown) is formed on the sacrificial layer 82 as shown in FIG. 23 by using a lithography process, and the third portion of the body 31 is electroplated by the photoresist. 31C, the photoresist is removed by dry etching. Finally, as long as the sacrificial layer 82 is removed by etching, four elastic probes 80 can be completed, as shown in FIG. In this implementation In the example, the contact portion 33 of the needle body 30 is the end portion of the body portion 31 outside the housing 20, so that the step g also forms the point contact portion 33 of the needle body 30; or, After the step g, the dot contact portion 33 of the needle body 30 is fabricated by a lithography process and electroplating.
最後,必須再次說明,本發明於前揭實施例中所揭露的構成元件,僅為舉例說明,並非用來限制本案之範圍,其他等效元件的替代或變化,亦應為本案之申請專利範圍所涵蓋。 Finally, it is to be noted that the constituent elements disclosed in the foregoing embodiments are merely illustrative and are not intended to limit the scope of the present invention, and alternative or variations of other equivalent elements should also be the scope of the patent application of the present application. Covered.
11‧‧‧彈性探針 11‧‧‧Elastic probe
20‧‧‧殼體 20‧‧‧shell
21‧‧‧頂部 21‧‧‧ top
212‧‧‧連接端部 212‧‧‧Connecting end
22‧‧‧底部 22‧‧‧ bottom
23‧‧‧側壁 23‧‧‧ side wall
24‧‧‧容置空間 24‧‧‧ accommodating space
25‧‧‧穿孔 25‧‧‧Perforation
252‧‧‧內壁面 252‧‧‧ inner wall
30‧‧‧針體 30‧‧‧ needle
31‧‧‧身部 31‧‧‧ Body
32‧‧‧擋止部 32‧‧‧stops
33‧‧‧點觸部 33‧‧‧ Touching
40‧‧‧高分子彈性體 40‧‧‧Polymer elastomer
42‧‧‧頂側 42‧‧‧ top side
44‧‧‧底側 44‧‧‧ bottom side
L‧‧‧假想軸線 L‧‧‧ imaginary axis
D1‧‧‧探針長度 D 1 ‧‧‧Probe length
D2‧‧‧彈性體長度 D 2 ‧‧‧elastomer length
Claims (17)
Priority Applications (1)
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TW103114873A TWI525325B (en) | 2014-04-24 | 2014-04-24 | Elastic probe and its manufacturing method |
Applications Claiming Priority (1)
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TW103114873A TWI525325B (en) | 2014-04-24 | 2014-04-24 | Elastic probe and its manufacturing method |
Publications (2)
Publication Number | Publication Date |
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TW201541088A TW201541088A (en) | 2015-11-01 |
TWI525325B true TWI525325B (en) | 2016-03-11 |
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TW103114873A TWI525325B (en) | 2014-04-24 | 2014-04-24 | Elastic probe and its manufacturing method |
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TW (1) | TWI525325B (en) |
Families Citing this family (2)
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CN106841999B (en) * | 2017-03-24 | 2023-05-30 | 深圳市斯纳达科技有限公司 | Integrated circuit testing device and testing probe thereof |
US10698002B2 (en) * | 2017-10-02 | 2020-06-30 | Formfactor Beaverton, Inc. | Probe systems for testing a device under test |
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2014
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TW201541088A (en) | 2015-11-01 |
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