TW432561B - Multi-chip module packaging structure - Google Patents
Multi-chip module packaging structure Download PDFInfo
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- TW432561B TW432561B TW89100690A TW89100690A TW432561B TW 432561 B TW432561 B TW 432561B TW 89100690 A TW89100690 A TW 89100690A TW 89100690 A TW89100690 A TW 89100690A TW 432561 B TW432561 B TW 432561B
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- package structure
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- lead frame
- chip package
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/4826—Connecting between the body and an opposite side of the item with respect to the body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49175—Parallel arrangements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73215—Layer and wire connectors
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- Wire Bonding (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
Description
-^4 32 5 6 1 ____ 五、發明説明(l) 發明領域: 本發明係有關於一種多晶片封裝構 module, MCM),特別有關於一種具有呉方性導電膠層 (anisotropic conductive adhesive)之多晶片封裝構 造0 先前技術: 由於電子產品越來越輕薄短小,使得用以保護半導體晶 片以及提供外部電路連接的封裝構造也同樣需要輕薄短小 化》薄小輪廓封裝構造(thin smau outline package, TSOP)即為一具代表性之薄形化封裝構造。 薄小輪廓封裝構造之主要訴求即為較薄之封裝厚度 'package thickness),薄小輪廓封裝構造之厚度約為1毫 采’而傳統之薄小輪廓封裝構造(small 〇utHne package,SOP)或薄小輪廓腳封裝構造(smaU 〇utUne Jjlead, S0J)封裝構造之厚度則約為2, 5至3. 5毫 薄:輪麻封裝構造已發展成為主流技術之一,且相關:: Hi Ϊ也已發展成熟,所以其極具成本優勢,且也易為 此外,隨著微小化以及高 封裝構造在許多電子裝置g 可藉由將兩個以上之晶片组 統運作速度之限制最小化。 晶片間連接線路之長度而降 最常見的多晶片封裝構造^ 運作速度需求的增加,多晶片 來越吸引人。多晶片封裝構造 合在單一封裝構造中,來使系 此外’多晶片封裝構造可減少 低訊號延遲以及存取時間。 並排式(side-by-side)多晶-^ 4 32 5 6 1 ____ V. Description of the invention (l) Field of the invention: The present invention relates to a multi-chip package structure module (MCM), and more particularly to an anisotropic conductive adhesive layer. Multi-chip package structure 0 Prior technology: As electronic products become thinner and shorter, the package structures used to protect semiconductor wafers and provide external circuit connections also need to be thinner and thinner. Thin thin outline package structures (TSOP ) Is a representative thin package structure. The main requirement of thin and small outline package structure is thin package thickness (package thickness), the thickness of thin and small outline package structure is about 1 millimeter, and the traditional thin small outline package structure (SOP) or The thickness of the thin small outline package structure (smaU 〇utUne Jjlead (S0J)) is about 2.5 to 3.5 millimeters: the hemp package structure has developed into one of the mainstream technologies, and related :: Hi Hi 也It has matured, so it has a cost advantage, and it is easy to be more. With the miniaturization and high package structure in many electronic devices, the limitation of the operation speed of two or more chip sets can be minimized. The length of the inter-chip connection lines decreases. The most common multi-chip package structure ^ With the increase in operating speed requirements, multi-chips are becoming more attractive. The multi-chip package structure is combined into a single package structure, so that the system's multi-chip package structure can reduce low signal delay and access time. Side-by-side polycrystalline
爾4 32 5 6 1_ 五、發明說明(2) 片封裝構造,其係將兩個以上之晶片彼此並排地安裝於一 共同基板之主要安裝面。晶片與共同基板上導電線路間之 連接一般係藉由線銲法(wire bonding)。然而該並排式多 晶片封裝構造之缺點為封裝效率太低,因為可用之晶片安 裝區域只限於該共同基板之一面。 因此半導體業界發展出將晶片分別安裝於一共同基板兩 面的多晶片封裝構造1 0 0 (參見第一圖)。然而該兩面式 (two-sided)多晶片封裝構造100之缺點為封裝厚度無法降 低,因為該封膠體1 1 0必須騰出空間以容納連接線 (bonding wire)120、130。若晶>ΐ與共同基板上導電線路 間之連接採用覆晶(f 1 i p ch i ρ)的方式,其雖可降低封裝 厚度,然而該晶片與共同基板間較佳需填入一底層填料 (u n d e r f i 1 1 )用以密封該晶片與共同基板間之空隙並且減 輕在錫球連接上的應力(其係由於該晶片與共同基板間的 熱膨脹係數不一所致)。由於該底層填料步驟 (underfilling step)費時且該底層填料價昂,因此將增 加製造成本。 發明概要: 本發明之主要目的係提供一種多晶片封裝構造,其厚度 可降低至大約一毫米,藉此可利用習用薄小輪廓封裝構造 之製程技術製造,因而降低製造成本。 根據本發明較佳實施例之多晶片封裝構造,其主要包含 兩半導體晶片分別利用一異方性導電膠層安裝於一基板之 上表面以及下表面,該多晶片封裝構造係藉由一導線架與Seoul 4 32 5 6 1_ V. Description of the invention (2) The chip package structure is to mount two or more wafers side by side on the main mounting surface of a common substrate. The connection between the chip and the conductive lines on the common substrate is generally by wire bonding. However, the disadvantage of the side-by-side multi-chip package structure is that the packaging efficiency is too low, because the available chip mounting area is limited to only one side of the common substrate. Therefore, the semiconductor industry has developed a multi-chip package structure 100 (see the first figure) in which chips are mounted on both sides of a common substrate, respectively. However, a disadvantage of the two-sided multi-chip package structure 100 is that the package thickness cannot be reduced because the sealing compound 110 must free up space to accommodate bonding wires 120 and 130. If the connection between the crystal > ΐ and the conductive lines on the common substrate is flip-chip (f 1 ip ch i ρ), although it can reduce the package thickness, it is better to fill an underfill between the wafer and the common substrate. (underfi 1 1) is used to seal the gap between the wafer and the common substrate and reduce the stress on the solder ball connection (this is due to the different thermal expansion coefficients between the wafer and the common substrate). Since the underfilling step is time consuming and the underfill is expensive, it will increase manufacturing costs. Summary of the invention: The main object of the present invention is to provide a multi-chip package structure whose thickness can be reduced to about one millimeter, thereby being able to be manufactured by a manufacturing process using a conventional thin and small-profile package structure, thereby reducing manufacturing costs. A multi-chip package structure according to a preferred embodiment of the present invention mainly includes two semiconductor wafers mounted on an upper surface and a lower surface of a substrate by using an anisotropic conductive adhesive layer, respectively. versus
^4 32 5 6 1 五、發明說明(3) 外界連接。該基板之上表面以及下表面各設有複數個晶片 連接墊(chip bonding pad),該基板設有複數個基板銲墊 (contact pad)電性連接至相對應的複數個晶片連接墊-該導線架係固設於該基板並且電性連接至相對應的基板銲^ 墊。該兩半導體晶片各具有複數個金屬突塊位於該兩半導 體晶片正面。該每一半導體晶片之複數個金屬突塊係經由 該異方性導電膠層電性連接至相對應的複數個晶片連接 墊。該基板、導線架以及兩半導體晶片係為一封膠體包 覆’其申該導線架之部分係自該封膠體向外延伸用以與外 界電性溝通。 根據本發明較佳實施例之多晶片封裝構造,由於該晶片 與基板上晶片連接墊間之連接係藉由該異方性導電膠層, 因此該多晶片封裝構造之厚度可降低至大約一毫米,藉此 其可利用習用薄小輪廓封裝構造之製程技術製造,因而 低製造成本。 囷示說明: 為了讓本發明之上述和其他目的、特徵、和優點能 顯特徵,下文特舉本發明較佳實施例,並配合所附 _ 作詳細說明如下。 岡不’ 第1圊: 第2圖: 移除封膠體 第3圖: 之剖面示圊 習知多晶片 根據本發明 後之上視圖 根據本發明 封裝構造之 第一較佳實 第一較佳實 剖面示圖; 施例之多晶 施例之多晶 片封裝構造 片封裝構造^ 4 32 5 6 1 V. Description of the invention (3) External connection. A plurality of chip bonding pads are provided on the upper surface and the lower surface of the substrate, and the substrate is provided with a plurality of substrate contact pads electrically connected to the corresponding plurality of chip bonding pads-the wire The frame is fixed on the substrate and is electrically connected to the corresponding substrate pad. The two semiconductor wafers each have a plurality of metal bumps on the front side of the two semiconductor wafers. The plurality of metal bumps of each semiconductor wafer are electrically connected to the corresponding plurality of wafer connection pads through the anisotropic conductive adhesive layer. The substrate, the lead frame, and the two semiconductor wafers are covered with a colloid, and a portion of the lead frame is extended from the encapsulant for electrical communication with the outside world. According to the multi-chip package structure of the preferred embodiment of the present invention, since the connection between the wafer and the wafer connection pad on the substrate is through the anisotropic conductive adhesive layer, the thickness of the multi-chip package structure can be reduced to about one millimeter. Therefore, it can be manufactured by using the conventional thin and small outline package construction process technology, and thus the manufacturing cost is low. Illustrative description: In order to make the above and other objects, features, and advantages of the present invention obvious, the following describes the preferred embodiments of the present invention in detail with the attached _ as follows. Gangbu 'Figure 1: Figure 2: Removing the sealant Figure 3: Sectional cross-section showing the conventional multi-chip according to the present invention Top view of the first preferred embodiment of the package structure according to the present invention Diagram; polycrystalline package structure of the embodiment; chip package structure of the embodiment;
432561 五、發明說明(4) 第 4 圖 根 據 本 發 明 第一 較佳實施例之, 局部放 大剖 面 示 圖; 及 第 5 圖 - 根 據 本 發 明 第二 較佳實施例之 多晶片 封裝 構 造 移除 封 膠 體 後 之 上 視 圖 0 圖號 說 明 • 100 多 晶 片 封 裝 構 造 110 封 膠 體 120 連接線 130 連接 線 200 多 晶 片 封 裝 構 造 210 基 板 2 12 晶片連 接墊 214 基板 銲 墊 220 導 線 架 222 導線 224 金線 230 半 導 體 晶 片 232 金屬突 塊 234 異 方 性 導 電 膠 層 240 半 導 體 晶 片 242 金屬突 塊 244 異 方 性 導 電 膠 層 246 導 電 粒 子 250 封膠體 300 多 晶 片 封 裝 構 造 330 晶 片 332 晶片 340 晶片 342 晶 片 發明 說 明 請 參 昭 第 二 圖 以 及 第 一~固 ,其係根據本發明第 一較 佳 實 施例 之 多 晶 片 封 裝 構造2 0 0, 其主要 包含一 基板210、 — 導 線架220、兩半導體晶片230、240以及一封膠體250。該基 板2 10之上表面以及下表面各設有複數個晶片連接墊2 12 (請參照第四圖)。該基板2 1 0之上表面設有複數個基板432561 V. Description of the invention (4) FIG. 4 is a partially enlarged cross-sectional view of the first preferred embodiment of the present invention; and FIG. 5 is a multi-chip package structure with the seal removed according to the second preferred embodiment of the present invention. Top view after the colloid 0 Drawing number description • 100 multi-chip package structure 110 sealing compound 120 connection line 130 connection line 200 multi-chip package structure 210 substrate 2 12 chip connection pad 214 substrate pad 220 lead frame 222 lead 224 gold wire 230 semiconductor Wafer 232 Metal bump 234 Anisotropic conductive adhesive layer 240 Semiconductor wafer 242 Metal bump 244 Anisotropic conductive adhesive layer 246 Conductive particles 250 Sealing compound 300 Multi-chip package structure 330 Chip 332 Chip 340 Chip 342 The second figure and the first ~ solid, which are according to the first preferred embodiment of the present invention The polycrystalline wafer packaging structure 2000 of the embodiment mainly includes a substrate 210, a lead frame 220, two semiconductor wafers 230, 240, and a colloid 250. A plurality of wafer connection pads 2 12 are provided on the upper surface and the lower surface of the substrate 2 10 (see the fourth figure). A plurality of substrates are provided on the upper surface of the substrate 2 1 0
第7頁 'βά325β 1 五、發明說明(5) 銲墊2 14電性連接至相對應的複數個晶片連接墊212 »該導 線架220包含複數條導線222具有内腳部分(inner lead portion)以及外腳部分(outer lead portion),該複數條 導線2 22之内腳部分係以一絕緣層固設於該基板2i〇之上表 面。可以理解的是,該複數條導線2 2 2之内腳部分亦可以 不導電膠例如環氧樹脂(epoxy)固設於該基板210之上表 面。該每一條導線2 2 2之内腳部分係以連接線(例如金線 224)連接至相對應的基板銲墊214。該兩半導體晶片 230、240 ’具有複數個金屬突塊232、242 (請參照第四圖 )位於該兩半導體晶片230、240之正面。該兩半導體晶片 230、240之複數個金屬突塊232、242係經由異方性導電膠 層234、244電性連接至該基板210上表面以及下表面的複 數個晶片連接墊212 (請參照第四圖)。該基板210、導線 架220以及兩半導體晶片230、240係為一封膠體250包覆, 其中該導線架2 20之複數條導線22 2之外腳部分係自該封膠 體2 5 0向外延伸用以與外界電性溝通。 請再參照第二圊及第三圖,該基板2 1 0係以不導電材質 [例如FR-4玻璃環氧樹脂(glass-epoxy)或聚醢亞胺 (polyimide)]製成。該導線架220較佳係由銅、鐵、鎳或 其合金製成。此外該複數條導線222可以鍍上一層高導電 物質例如銀、銅、金或鈀。該封膠體2 5 0之材質係為絕緣 材料,較佳之塑料(molding compound)為Hitachi Chemical Company 提供之CEL-9200XU 塑料。 請再參照第四圖,該兩半導體晶片2 3 0、2 4 0之複數個金Page 7'βά325β 1 V. Description of the invention (5) Solder pads 2 14 Electrically connected to the corresponding plurality of chip connection pads 212 »The lead frame 220 includes a plurality of wires 222 with inner lead portions and An outer lead portion. The inner leg portions of the plurality of wires 22 are fixed on an upper surface of the substrate 2i with an insulating layer. It can be understood that the inner leg portions of the plurality of wires 2 2 2 may also be fixed on the surface of the substrate 210 with a non-conductive adhesive such as epoxy. The inner leg portion of each of the wires 2 2 2 is connected to the corresponding substrate pad 214 by a connecting wire (such as a gold wire 224). The two semiconductor wafers 230, 240 'have a plurality of metal bumps 232, 242 (refer to the fourth figure) on the front sides of the two semiconductor wafers 230, 240. The plurality of metal bumps 232 and 242 of the two semiconductor wafers 230 and 240 are electrically connected to the upper and lower surfaces of the substrate 210 through a plurality of wafer connection pads 212 via anisotropic conductive adhesive layers 234 and 244 (refer to Four pictures). The substrate 210, the lead frame 220, and the two semiconductor wafers 230 and 240 are covered with a gel 250, wherein the outer legs of the plurality of leads 22 2 of the lead frame 2 20 extend outward from the sealing gel 2 50 Used for electrical communication with the outside world. Please refer to the second and third drawings again. The substrate 2 10 is made of a non-conductive material [such as FR-4 glass-epoxy or polyimide]. The lead frame 220 is preferably made of copper, iron, nickel or an alloy thereof. In addition, the plurality of wires 222 may be plated with a highly conductive material such as silver, copper, gold or palladium. The material of the sealing compound 250 is an insulating material, and a preferred molding compound is CEL-9200XU plastic provided by Hitachi Chemical Company. Please refer to the fourth figure again, the two semiconductor wafers 2 3 0, 2 4 0
P43256 1 五、發明說明(6) 屬突塊232、242係設在該之晶片銲墊(未示於囷中)上用 以連接其内部電路。該金屬突塊232、2 42可利用習知的C4 (Controlled Collapse Chip Connection)製程形成。該 金屬突塊232、242較佳為利用習知的打線技術(wire bonding technique)形成之柱狀突塊(stud bump)。P43256 1 V. Description of the invention (6) The bumps 232 and 242 are provided on the wafer pads (not shown in the figure) to connect the internal circuits. The metal bumps 232 and 2 42 can be formed by a conventional C4 (Controlled Collapse Chip Connection) process. The metal bumps 232 and 242 are preferably stud bumps formed by a conventional wire bonding technique.
已知適合用以形成該異方性導電膠層234、244的異方性 膠為一「z軸異方性膠」,其係被填入低濃度之導電粒子 2 4 6 (請參照第四圊),並且使得其在X y平面不會彼此接 觸。因此,在z方向壓縮該物質將建立一導電路徑。「z軸 異方性膠」可以是一黏稠糊狀物或是一膜。該兩種(糊狀 物或膜)「z轴異方性膠」可以是熱塑性或熱固性。熱塑 性異方性膠係先被加熱軟化使用後再冷卻固化。熱固性異 方性膠則需加熱1 0 0 - 3 0 0 °C,數分鐘至一小時或以上使其 固化D 對所使用之晶片330、340以 第五圖係為根據本發明第二較佳實施例之多晶片封裝構 造300移除封膠體後之上視圖。該多晶片封裝構造3〇〇除了 以兩對晶片33 0、34 0以及3 32、342取代該晶片23 0、240 外’其係相同於第二圖以及第三圖中之多晶片封裝構造 100。可以理解的是,該多晶片封裝構造3〇〇所使用之基 板,其包含之電路佈局必須針 及332、342設計 根據本發明之多晶片封裝構造,由於該晶片與基板上晶 片連接墊間之連接係藉由該異方性導電膠層,因此封裝厚It is known that the anisotropic adhesive suitable for forming the anisotropic conductive adhesive layers 234 and 244 is a "z-axis anisotropic adhesive", which is filled with low-concentration conductive particles 2 4 6 (refer to the fourth圊) and make them not contact each other in the X y plane. Therefore, compressing the substance in the z direction will establish a conductive path. The "z-axis anisotropic glue" can be a sticky paste or a film. The two (paste or film) "z-axis anisotropic adhesives" can be thermoplastic or thermoset. Thermoplastic anisotropic rubber is heated and softened before being used for cooling and solidification. The thermosetting anisotropic adhesive needs to be heated at 100-300 ° C for several minutes to one hour or more to cure it. D The wafers 330 and 340 used are the second best according to the present invention. Top view of the multi-chip package structure 300 of the embodiment after the sealing compound is removed. The multi-chip package structure 300 is the same as the multi-chip package structure 100 in the second and third diagrams except that the two wafers 33 0, 3 40, and 3 32, 342 replace the chips 23 0, 240. . It can be understood that the substrate used in the multi-chip package structure 300 includes a circuit layout including pins and 332, 342. The multi-chip package structure according to the present invention is designed. The connection is through the anisotropic conductive adhesive layer, so the package is thick
432561 五、發明說明(7) 度可降低至大約一毫米,藉此其可利用習用薄小輪廓封裝 構造之製程技術製造,因而降低製造成本。此外根據本發 明之多晶片封裝構造不需價昂之底層填料(u n d e r ί i 1 1), 因此可降低製造成本β 雖然本發明已以前述較佳實施例揭示,然其並非用以限 定本發明,任何熟習此技藝者,在不脫離本發明之精神和 範圍内,當可作各種之更動與修改。例如根據本發明之多 晶片封裝構造,其雖然以包含兩個或四個半導體晶片之多 晶片封裝構造為較佳實施例,然而可以理解的是根據本發 明之多晶片封裝構造其也可包含四個以上之半導體晶片。 因此本發明之保護範圍當視後附之申請專利範圍所界定者 為準。432561 V. Description of the invention (7) The degree can be reduced to about one millimeter, so that it can be manufactured by the process technology of the conventional thin and small outline package structure, thereby reducing the manufacturing cost. In addition, the multi-chip package structure according to the present invention does not require an expensive underfill (under ί i 1 1), so the manufacturing cost can be reduced. Β Although the present invention has been disclosed in the foregoing preferred embodiments, it is not intended to limit the present invention. Anyone skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. For example, according to the multi-chip package structure of the present invention, although a multi-chip package structure including two or four semiconductor wafers is a preferred embodiment, it is understood that the multi-chip package structure according to the present invention may also include More than one semiconductor wafer. Therefore, the protection scope of the present invention shall be determined by the scope of the attached patent application.
第10頁Page 10
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