TW429346B - Multi-level memory device having an ECC circuit - Google Patents

Multi-level memory device having an ECC circuit

Info

Publication number
TW429346B
TW429346B TW088108483A TW88108483A TW429346B TW 429346 B TW429346 B TW 429346B TW 088108483 A TW088108483 A TW 088108483A TW 88108483 A TW88108483 A TW 88108483A TW 429346 B TW429346 B TW 429346B
Authority
TW
Taiwan
Prior art keywords
read
data
memory device
memory cells
level memory
Prior art date
Application number
TW088108483A
Other languages
Chinese (zh)
Inventor
Hiroyuki Matsubara
Original Assignee
Nippon Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co filed Critical Nippon Electric Co
Application granted granted Critical
Publication of TW429346B publication Critical patent/TW429346B/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Detection And Correction Of Errors (AREA)

Abstract

A read-only, multi-level memory device includes a block of memory cells including memory cells storing read-only data and memory cells storing parity data for correcting 1-bit of the read-only data. Each memory cell includes a cell transistor having a threshold voltage selected from a plurality of levels. Two read data read from the cell transistors having adjacent levels of the threshold voltage differ only in a single bit with the remaining bits being the same. The read data can be effectively corrected by using the parity bits.
TW088108483A 1998-05-22 1999-05-21 Multi-level memory device having an ECC circuit TW429346B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10158561A JPH11339496A (en) 1998-05-22 1998-05-22 Ecc circuit for multivalued cell

Publications (1)

Publication Number Publication Date
TW429346B true TW429346B (en) 2001-04-11

Family

ID=15674402

Family Applications (1)

Application Number Title Priority Date Filing Date
TW088108483A TW429346B (en) 1998-05-22 1999-05-21 Multi-level memory device having an ECC circuit

Country Status (3)

Country Link
JP (1) JPH11339496A (en)
KR (1) KR100293066B1 (en)
TW (1) TW429346B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6990623B2 (en) 2001-05-16 2006-01-24 Fujitsu Limited Method for error detection/correction of multilevel cell memory and multilevel cell memory having error detection/correction function
JP4437519B2 (en) * 2001-08-23 2010-03-24 スパンション エルエルシー Memory controller for multilevel cell memory
US7966547B2 (en) * 2007-07-02 2011-06-21 International Business Machines Corporation Multi-bit error correction scheme in multi-level memory storage system
KR101506655B1 (en) 2008-05-15 2015-03-30 삼성전자주식회사 Memory device and method of managing memory data error
CN103473146B (en) 2012-06-06 2017-04-19 慧荣科技股份有限公司 Memory control method, memory controller and electronic device
CN104794019B (en) * 2015-04-17 2017-12-05 深圳市江波龙电子有限公司 The data guard method and device of a kind of in-line memory

Also Published As

Publication number Publication date
KR100293066B1 (en) 2001-06-15
JPH11339496A (en) 1999-12-10
KR19990088497A (en) 1999-12-27

Similar Documents

Publication Publication Date Title
TW200802404A (en) Volatile memory cell two-pass writing method
TW345660B (en) Stabilization circuits and techniques for storage and retrieval of single or multiple digital bits per memory cell
TW200506957A (en) Error recovery for nonvolatile memory
EP1952290A4 (en) Probabilistic error correction in multi-bit-per-cell flash memory
WO2003100786A3 (en) Serially sensing the output of multilevel cell arrays
HK1001481A1 (en) Eeprom system with bit error detecting function
MY126674A (en) Programming non-volatile memory devices
WO2007098044A3 (en) Multi-bit memory cell having electrically floating body transistor, and method of programming and reading same
TW328179B (en) Non-volatile semiconductor memory device
AU2003262675A1 (en) Techniques for reducing effects of coupling between storage elements of adjacent rows of memory cells
EP1825475A4 (en) Apparatus and method for memory operations using address-dependent conditions
ATE370498T1 (en) WRITABLE TRACKING CELLS
JP2001067884A5 (en)
DE60001587D1 (en) CIRCUIT VERSION TO REDUCE THE BIT LINE LEAKAGE CURRENT IN PROGRAMMING AND ERASING CORRECTION MODE IN A FLASH EEPROM
TW200620301A (en) Latched programming of memory and method
EP0305987A3 (en) Self-correcting semiconductor memory device and microcomputer incorporating the same
TW200501160A (en) Multi-level memory device and methods for programming and reading the same
TW332292B (en) Method and apparatus for programming memory devices
GB9910278D0 (en) A semiconductor memory device with an on-chip error correction circuit and a method of correcting a data error therein
TW200629295A (en) Memory bit line segment isolation
ATE365967T1 (en) MEMORY WITH VARIABLE LEVELS
FR2688328B1 (en) ROW REDUNDANCY CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE FOR REPAIRING OR REPLACING A DEFECTIVE CELL OF A MEMORY CELL ARRAY.
NO20041357L (en) Parallel architecture for MAP (maximum posterior) decoders
KR20140048033A (en) Accelerated soft read for multi-level cell nonvolatile memories
EP1376607A3 (en) Content addressable memory device and method of operating same

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees