KR100246730B1 - Chip barristor and its setting apparatus - Google Patents

Chip barristor and its setting apparatus Download PDF

Info

Publication number
KR100246730B1
KR100246730B1 KR1019970003717A KR19970003717A KR100246730B1 KR 100246730 B1 KR100246730 B1 KR 100246730B1 KR 1019970003717 A KR1019970003717 A KR 1019970003717A KR 19970003717 A KR19970003717 A KR 19970003717A KR 100246730 B1 KR100246730 B1 KR 100246730B1
Authority
KR
South Korea
Prior art keywords
chip
varistor
electrode
surge
surface electrode
Prior art date
Application number
KR1019970003717A
Other languages
Korean (ko)
Other versions
KR19980067591A (en
Inventor
안병준
홍순규
Original Assignee
오세종
주식회사쎄라텍
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오세종, 주식회사쎄라텍 filed Critical 오세종
Priority to KR1019970003717A priority Critical patent/KR100246730B1/en
Publication of KR19980067591A publication Critical patent/KR19980067591A/en
Application granted granted Critical
Publication of KR100246730B1 publication Critical patent/KR100246730B1/en

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C10/00Adjustable resistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/60Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4911Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191Disposition
    • H01L2924/19101Disposition of discrete passive components
    • H01L2924/19107Disposition of discrete passive components off-chip wires

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Thermistors And Varistors (AREA)

Abstract

본 발명은 칩 바리스터가 IC칩에 직접 접촉됨으로서 높은 신뢰성 및 우수한 써지 보호 기능을 나타내는 적층형 칩 바리스터 및 그 설치장치이다. 본원 발명의 적층형 칩 바리스터는 바리스터의 내부에 도전체를 형성하고 표면에 리드와 만나는 부분에 전극을 형성함으로서 내부전극과 표면전극간의 병렬회로를 구성함으로서 바리스터의 특징을 나타나게 한 소자이다. 표면전극은 소성전이나 소성후에 형성할 수 있으며, IC칩과 직접 연결이 가능하도록 표면전극의 상부를 처리하는데 그 특징이 있다. IC용 칩 바리스터를 IC칩을 사용함으로서 나타나는 장점으로는 다음과 같다. 첫째, IC칩의 써지보호회로를 삭제할 수 있어 IC칩의 크기를 줄일 수 있다. 그러므로, 기판의 실장 밀도를 높일 수 있고, IC칩의 가격을 낮출 수 있다. 둘째, 바리스터의 특성상 많은 양의 써지에 견딜 수 있으므로 IC칩을 효과적으로 보호할 수 있다.The present invention is a stacked chip varistor and its installation apparatus which exhibit high reliability and excellent surge protection function by the chip varistor being in direct contact with the IC chip. The stacked chip varistor according to the present invention forms a conductor inside the varistor and forms an electrode at a portion where the lead meets the surface, thereby forming a parallel circuit between the internal electrode and the surface electrode, thereby showing the characteristics of the varistor. The surface electrode can be formed before or after firing, and is characterized by treating the upper portion of the surface electrode so as to be directly connected to the IC chip. Advantages of using IC chips for IC chip varistors are as follows. First, since the surge protection circuit of the IC chip can be eliminated, the size of the IC chip can be reduced. Therefore, the mounting density of a board | substrate can be made high and the cost of an IC chip can be made low. Second, the varistor can withstand a large amount of surge, effectively protecting the IC chip.

Description

칩 바리스터(Chip Varistor) 및 그 설치장치Chip Varistor and its installation device

본 발명은 전자기기에서 외부 및 내부 써지 전류(Surge Electric)에 의해 손상될 수 있는 IC칩을 보호하기 위한 적층형 칩 바리스터(Chip Varistor) 및 칩 바리스터 설치장치를 제안하려는 것이다.The present invention is to propose a stacked chip varistor and a chip varistor mounting apparatus for protecting an IC chip which may be damaged by external and internal surge currents in an electronic device.

바리스터는 전압의 변화에 대한 전류의 변화율이 매우 큰 저항체로서 저항체의 주재료는 탄화규소(SiC)이다. 저항체는 소량의 탄소를 가하고 점토와 혼합하여 디스크 형태로 소결하여 얻는다.Varistors are resistors with a very high rate of change of current with respect to a change in voltage. The main material of the resistor is silicon carbide (SiC). The resistor is obtained by adding a small amount of carbon, mixing it with clay and sintering it in the form of a disc.

전자기기의 경박단소화 및 고기능화 추세에 따른 전자부품의 SMD화 및 소형화에 의하여 고밀도 실장이 급속히 진행되어 왔다. 그러나, IC칩의 경우 칩 내부에 외부 써지 전류로부터 내부 회로를 보호하기 위하여 써지 보호(Surge Protection)회로를 갖춰야 하기 때문에 칩의 소형화가 힘들었으며, 가격이 높아지는 문제점이 있었다. 또한 전류 용량이 낮아서 많은 양의 써지 전류가 주어졌을 때 파손되기 쉬웠다.High-density mounting has been rapidly progressed by SMD and miniaturization of electronic components according to the trend of lighter and shorter and higher functionalization of electronic devices. However, in the case of the IC chip, since the surge protection circuit must be provided to protect the internal circuit from the external surge current, it is difficult to miniaturize the chip and increase the price. In addition, the low current capacity was likely to break when a large amount of surge current was given.

그리고 종래 디스크(Disk)형 바리터스의 연결회로는 써지전류 회로선에서부터 바리스터로 연결되는 로드(Load)에 인덕턴스(Inductance)가 발생되며 바리스터의 응답시간이 늦어서 속도가 빠른 써지로부터 IC칩을 보호하기 어려웠다. 그리고, IC칩으로부터 떨어져 있으므로 해서 설치된 바리스터 이후에 발생되는 써지는 막을 수 없었다. 또한, 최근에 개발된 칩 바리스터 또한 IC칩 앞단에 위치하여 써지로부터 IC칩을 보호하였으나, 이것 또한 디스크형태와 유사한 문제점을 가지고 있다. 특히, IC칩을 써지로부터 완벽히 보호하기 위해서는 IC칩의 각 리드선에 디스크 바리스터 또는 칩 바리스터를 연결시켜야 하므로 실장면적을 대단히 많이 차지하게 되어 전자제품의 경박단소화 및 고기능화 추세에 부합할 수 없었다.In the conventional disk type varistor connection circuit, inductance occurs in the load connected from the surge current circuit line to the varistor, and the varistor's response time is slow to protect the IC chip from fast surge. It was difficult. The surge generated after the installed varistors by being separated from the IC chip could not be prevented. In addition, recently developed chip varistors are also located in front of the IC chip to protect the IC chip from surge, but this also has a problem similar to the disk type. In particular, in order to completely protect the IC chip from surge, it is necessary to connect a disk varistor or a chip varistor to each lead wire of the IC chip, thus occupying a large amount of mounting area, and thus it has not been able to meet the trend of thinning and shortening of electronic products.

이 발명의 목적은 IC칩의 써지보호회로를 삭제할 수 있으므로 IC칩의 크기를 줄일 수 있어 기판의 실장 밀도를 높일 수 있고, IC칩의 가격을 낮출 수 있으며, 바리스터의 특성이 많은 양의 써지에도 견딜 수 있도록 하여 IC칩을 효과적으로 보호할 수 있게 하는 칩 바리스터 및 바리스터 설치장치를 제안하고자 하는 것이다.The purpose of this invention is to eliminate the IC chip surge protection circuit, which can reduce the size of the IC chip, increase the mounting density of the board, reduce the price of the IC chip, and increase the surge characteristics of the varistor. It is intended to propose a chip varistor and a varistor mounting device that can withstand the IC chip effectively.

이를 위하여, 본 발명은 반도성 성질을 갖는 바리스터 재료를 테입 캐스팅(Tape Casting) 법으로 시트를 성형하고 그 위에 내부전극을 도포한다. 이때, 표면 전극을 같이 도포하거나 내부전극만으로 적층 성형하여 적층 소결후 표면전극을 도포한다. 이 두가지 방법 모두 우수한 특성을 나타내며 적용되는 IC칩에 따라 표면전극 도포방법이 선택한다. 소성후 표면전극의 상층부에 존재하는 산화막을 제거하고 리드 프레임의 IC칩 하단에 장착하게 된다. 이후의 공정은 통상의 IC칩 제조공정과 같다.To this end, the present invention forms a sheet of a varistor material having a semiconducting property by a tape casting method and applies an internal electrode thereon. At this time, the surface electrode is applied together or laminated by only internal electrodes to apply the surface electrode after lamination and sintering. Both of these methods show excellent characteristics and the surface electrode coating method is selected according to the applied IC chip. After firing, the oxide film existing on the upper layer of the surface electrode is removed and mounted on the bottom of the IC chip of the lead frame. The subsequent process is the same as a conventional IC chip manufacturing process.

특히, 본 발명에 의한 IC칩용 칩 바리스터는 IC칩 하단에 위치하여 IC칩과 리드의 연결부를 와이어 또는 땜납으로 직접 연결함으로서 높은 신뢰성을 갖을 수 있고, IC칩의 크기를 축소할 수 있으며, 높은 써지 흡수율을 갖고 있어 많은 양의 써지를 흡수할 수 있다.In particular, the chip varistor for the IC chip according to the present invention is located at the bottom of the IC chip to directly connect the connection between the IC chip and the lead with a wire or solder can have a high reliability, can reduce the size of the IC chip, high surge It has an absorption rate and can absorb a large amount of surge.

그러므로 외부 및 내부 써지로부터 IC칩을 효과적으로 보호할 수 있다.Therefore, the IC chip can be effectively protected from external and internal surges.

또한, 본 발명의 IC칩의 크기를 작게 할 수 있어 제조 단가를 낮출 수 있고 기판의 실장밀도를 높일 수 있다.In addition, the size of the IC chip of the present invention can be reduced, so that the manufacturing cost can be lowered and the mounting density of the substrate can be increased.

제1(a),(b)도는 본 발명에 칩 바리스터 적층 예를 보인 분해 사시도.1 (a) and (b) are exploded perspective views showing an example of stacking chip varistors in the present invention.

제2(a),(b)도는 제1도의 과정으로 소성한 칩 바리스의 사시도.2 (a) and 2 (b) are perspective views of the chip varnish fired by the process of FIG.

제3도는 이 발명 칩 바리스터의 단면도.3 is a cross-sectional view of this invention chip varistor.

제4도는 와이어(Wire)를 이용한 칩 바리스터 설치장치 측면도.4 is a side view of a chip varistor mounting apparatus using a wire (Wire).

제5도는 땝납(Solder)을 이용한 칩 바리스터 설치장치 측면도.5 is a side view of the chip varistor installation apparatus using a solder (Solder).

* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings

1,2,3,4,5,6,7,8,9,10 : 바리스터용 세라믹시트(Cermic sheet)1,2,3,4,5,6,7,8,9,10: Ceramic sheet for varistor

11 : 표면전극 12 : 내부전극11 surface electrode 12 internal electrode

13 : IC칩 14,14′ : 와이어13: IC chip 14,14 ′: wire

15 : 리드 프레임 V,VC,VM: 바리스터용 세라믹시트15: Lead frame V, V C , V M : Varistor ceramic sheet

이하, 본 발명을 도면에 의하여 상세히 설명하면 다음과 같다.Hereinafter, the present invention will be described in detail with reference to the drawings.

본 발명의 IC칩용 칩 바리스터는 전기적 특성을 나타내는 부분(VC)과 칩의 형상을 조성하는 부분(VM)으로 구성한다.IC chips chip varistor of the present invention consists of a part (V M) to create the shape of the part (V C) and a chip showing the electrical characteristics.

전기적 특성을 나타내는 부분(VC)은 전극(11) 및 전극(12)이 각각 도포된 세라믹 시트(1)와 세라믹 시트(2)를 적층하여 형성한다. 이 때, 표면에 도포되는 전극(11)은 제1(a)도와 같이 소성전에 전극을 도포하거나 제1(b)도와 같이 전극이 없이 소성한 후 도포하여 조성할 수 있다. 이러한 리이드 전극의 조성은 적용되는 IC칩의 필요에 따라 선택되며 내면 전극(12)은 전기적 특성을 조절하기 위해서 조정되어 진다. 칩의 형상을 조성하는 부분(VM)은 다수의 세라믹 시트(3,4,5,6,7,8,9,10)를 적층하여 형성한다. 이 때, 시트의 적층 수는 적용되는 IC칩에 따라 또는 사용자의 주문에 따라 변경이 가능하다.The portion V C exhibiting electrical characteristics is formed by stacking the ceramic sheet 1 and the ceramic sheet 2 to which the electrodes 11 and 12 are coated, respectively. In this case, the electrode 11 applied to the surface may be formed by coating the electrode before firing as shown in FIG. 1 (a) or by firing without firing as shown in FIG. 1 (b). The composition of the lead electrode is selected according to the needs of the IC chip to be applied, and the inner surface electrode 12 is adjusted to adjust the electrical characteristics. The portion V M constituting the shape of the chip is formed by stacking a plurality of ceramic sheets 3, 4, 5, 6, 7, 8, 9 and 10. At this time, the stacking number of sheets can be changed depending on the IC chip applied or according to the user's order.

제1(a)도의 과정으로 성형된 칩 바리스터 제2(a)도와 같이 제1(b)도의 과정으로 성형된 칩 바라스터는 제2(b)도와 같다. 제2(b)도와 같이 형성된 성형체는 두부분(VC,VM)을 동시소결후 제2(a)도와 같이 표면전극을 도포하여 모두 제3도와 같이 전극이 조성된다.Chip varistor formed by the process of FIG. 1 (a) As shown in FIG. 2 (a), the chip varistor formed by the process of FIG. In the molded body formed as shown in FIG. 2 (b), after co-sintering the two parts V C and V M , the surface electrodes are coated as shown in FIG.

한편, 칩 바리스터를 IC칩(13)에 장착시에는 제4도와 같이 칩 바리스터를 IC칩(13) 하단에 놓고, IC칩(13)과 칩 바리스터(V), 그리고 칩 바리스터(V)의 표면전극(11) 및 리드(15) 사이를 와이어(14, 14′)로 서로 연결하거나, 제5도와 같이 칩 바리스터(V)의 표면전극(11)과 리드(15)를 땜납(solder)(16)으로 바로 연결하고 리드와 IC칩(13)을 와이어(14)로 연결한다.On the other hand, when the chip varistor is mounted on the IC chip 13, the chip varistor is placed under the IC chip 13 as shown in Fig. 4, and the surface of the IC chip 13, the chip varistor V, and the chip varistor V are shown. The wires 11 and 14 'are connected to each other between the electrode 11 and the lead 15, or the solder 16 is connected to the surface electrode 11 and the lead 15 of the chip varistor V as shown in FIG. ) And the lead and the IC chip 13 to the wire (14).

이와 같이, 본 발명은 칩 바리스터를 IC칩 하단에 직접 접합(接合)하여 써지 흡수성의 신뢰성을 높이고 써지 흡수량을 증가시킬 수 있어, IC칩을 효과적으로 보호할 수 있게 되는 것이며, IC칩 내부에 갖고 있는 써지 보호 회로를 삭제할 수 있어 IC칩 제조단가 및 소형화를 이룰 수 있다.As described above, the present invention allows the chip varistor to be directly bonded to the lower end of the IC chip to increase the reliability of surge absorption and to increase the amount of surge absorption, thereby effectively protecting the IC chip. The surge protection circuit can be eliminated, resulting in cost reduction and miniaturization of IC chips.

이와 같이, 이 발명은 IC칩의 써지 보호 회로를 삭제할 수 있어, IC칩의 크기를 줄일 수 있게 하며, 따라서 기판의 실장 밀도를 높일 수 있고, IC칩의 가격을 낮출 수 있으며, 바리스터의 특성을 많은 양의 써지에 견딜 수 있으므로 IC칩을 효과적으로 보호할 수 있게 하는 칩 바리스터 장치를 제공하게 된 것이다.As such, the present invention can eliminate the surge protection circuit of the IC chip, thereby reducing the size of the IC chip, thereby increasing the mounting density of the substrate, reducing the price of the IC chip, and improving the characteristics of the varistor. It is able to withstand a large amount of surge, providing a chip varistor device that can effectively protect the IC chip.

Claims (2)

칩 바리스터(Chip Varistor)의 설치장치에 있어서, 세라믹 시트(1)와 전극(12)이 도포된 세라믹 시트(2)로 조성되는 전기적 특성을 나타내는 부분(VC) 및 다층의 세라믹 시트(3,4,5,6,7,8,9,10)로 조성되는 칩의 형상을 조성하는 부분(VM)을 함께 적층하여 소성하여 구성된 칩 바리스터의 표면에 전극(11)을 포함하며, 상기 칩 바리스터를 IC칩(13)에 장착시 칩 바리스터는 IC칩(13) 하단에 놓이며 IC칩(13)과 전극(11) 및 전극에 전기적으로 연결된 리드(15)사이를 와이어(14,14′)로 연결하는 것을 특징으로 하는 칩 바리스터 설치장치.In the installation device of the chip varistor, the portion (V C ) and the multilayer ceramic sheet (3) showing the electrical characteristics composed of the ceramic sheet (1) and the ceramic sheet (2) coated with the electrode (12) 4,5,6,7,8,9,10, comprising the electrode 11 on the surface of the chip varistor formed by stacking and firing together the parts (V M ) forming the shape of the chip, wherein the chip When the varistor is mounted on the IC chip 13, the chip varistor is placed at the bottom of the IC chip 13 and is connected between the IC chip 13 and the electrode 11 and the lead 15 electrically connected to the electrodes. Chip varistor mounting apparatus, characterized in that connected to). 제1항에 있어서, 칩 바리스터 전극(11)과 리드 사이에 땜납(16)을 개재하여 연결함을 특징으로 하는 칩 바리스터 설치장치.The device of claim 1, wherein the chip varistor electrode (11) is connected to the lead via solder (16).
KR1019970003717A 1997-02-06 1997-02-06 Chip barristor and its setting apparatus KR100246730B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019970003717A KR100246730B1 (en) 1997-02-06 1997-02-06 Chip barristor and its setting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019970003717A KR100246730B1 (en) 1997-02-06 1997-02-06 Chip barristor and its setting apparatus

Publications (2)

Publication Number Publication Date
KR19980067591A KR19980067591A (en) 1998-10-15
KR100246730B1 true KR100246730B1 (en) 2000-03-15

Family

ID=19496594

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019970003717A KR100246730B1 (en) 1997-02-06 1997-02-06 Chip barristor and its setting apparatus

Country Status (1)

Country Link
KR (1) KR100246730B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101282912B1 (en) * 2011-08-31 2013-07-05 익스팬테크주식회사 Varistor apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0511801A2 (en) * 1991-04-30 1992-11-04 Nec Corporation Method for manufacturing multilayer ceramic electronic parts

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0511801A2 (en) * 1991-04-30 1992-11-04 Nec Corporation Method for manufacturing multilayer ceramic electronic parts

Also Published As

Publication number Publication date
KR19980067591A (en) 1998-10-15

Similar Documents

Publication Publication Date Title
US4506285A (en) Substrate made of varistor material having a plurality of electronic components mounted thereon
US7253505B2 (en) IC substrate with over voltage protection function
US5796570A (en) Electrostatic discharge protection package
US6181008B1 (en) Integrated circuit power supply
KR20050014884A (en) Integrated device providing overcurrent and overvoltage protection and common­mode filtering to data bus interface
JP5590042B2 (en) Electronic component devices and package substrates
JPH0653078A (en) Laminated capacitor array with varistor function
WO2008069190A1 (en) Static electricity control part and process for manufacturing the same
KR100246730B1 (en) Chip barristor and its setting apparatus
EP0359513A2 (en) Semiconductor chip carrier and method of making it
US5889462A (en) Multilayer thick film surge resistor network
JP4540223B2 (en) Electronic component mounting board
JP4036932B2 (en) Composite circuit element
JPS6362339A (en) Semiconductor device
JPH04357806A (en) Surface mounting porcelain capacitor
JP2572626Y2 (en) Multilayer circuit board
JP2571389B2 (en) Stacked hybrid integrated circuit components
JP2863358B2 (en) Ceramic multilayer substrate
JPS61232692A (en) Printed wiring board
JPS6224588A (en) Surge protector
JP2003158237A (en) Ic package substrate having overvoltage protective function
KR20060106180A (en) Laminated dielectric filter
JPS60176296A (en) Method of producing glazed resistance element interal multilayer substrate
KR20000071262A (en) Electrical device
JPH0544200B2 (en)

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20061207

Year of fee payment: 8

LAPS Lapse due to unpaid annual fee