JPS62106102U - - Google Patents
Info
- Publication number
- JPS62106102U JPS62106102U JP19887585U JP19887585U JPS62106102U JP S62106102 U JPS62106102 U JP S62106102U JP 19887585 U JP19887585 U JP 19887585U JP 19887585 U JP19887585 U JP 19887585U JP S62106102 U JPS62106102 U JP S62106102U
- Authority
- JP
- Japan
- Prior art keywords
- focus state
- state detector
- output
- focus
- reflective film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Optical Recording Or Reproduction (AREA)
Description
第１図は本考案の厚さ測定装置の一実施例を示
す構成図、第２図〜第５図は第１図の厚さ測定装
置の測定動作を示す説明図、第６図は一般的な光
デイスクの構造を示す構成図、第７図は従来の厚
さ測定装置の一例を示す構成図、第８図および第
９図は第７図の厚さ測定装置の測定動作を示す説
明図である。
１……光デイスク、２……スピンドルモータ、
３……集光レンズ、４……変位検出器、５……レ
ーザ光源、６……光アイソレータ、７，１０……
合焦状態検出器、８……サーボアンプ、９……ハ
ーフミラー、１１……切換えスイツチ。
Fig. 1 is a configuration diagram showing an embodiment of the thickness measuring device of the present invention, Figs. 2 to 5 are explanatory diagrams showing the measurement operation of the thickness measuring device of Fig. 1, and Fig. 6 is a general diagram. FIG. 7 is a configuration diagram showing an example of a conventional thickness measuring device, and FIGS. 8 and 9 are explanatory diagrams showing the measurement operation of the thickness measuring device shown in FIG. 7. It is. 1... Optical disk, 2... Spindle motor,
3... Condensing lens, 4... Displacement detector, 5... Laser light source, 6... Optical isolator, 7, 10...
Focus state detector, 8... Servo amplifier, 9... Half mirror, 11... Changeover switch.
Claims (1)
否かを検出する合焦状態検出器とこの合焦状態検
出器の出力を受けその出力が零（合焦状態）とな
るように集光レンズの位置を制御するサーボアン
プとを有する厚さ測定装置において、前記第１の
合焦状態検出器と共通の反射光を受ける第２の合
焦状態検出器と、前記第１および第２の合焦状態
検出器の出力を選択的に前記サーボアンプに供給
する切換えスイツチとを具備するとともに、前記
第２の合焦状態検出器を屈折率および厚さが既知
の光デイスクの反射膜面上に焦点を合わせた状態
においてこの光デイスクにおける透明デイスク側
表面からの反射光のみに感度を持ちその出力が零
となるように構成してなる厚さ測定装置。 A focus state detector detects whether the focus is on the reflective film surface of the optical disc, and a condenser lens receives the output of this focus state detector so that the output becomes zero (in focus state). a servo amplifier that controls the position of the first focus state detector, a second focus state detector that receives reflected light common to the first focus state detector; and a changeover switch that selectively supplies the output of the focus state detector to the servo amplifier, and the second focus state detector is placed on a reflective film surface of an optical disk having a known refractive index and thickness. This thickness measuring device is configured to be sensitive only to the light reflected from the surface of the transparent disk side of the optical disk in a focused state, and its output is zero.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19887585U JPH04246Y2 (en) | 1985-12-24 | 1985-12-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19887585U JPH04246Y2 (en) | 1985-12-24 | 1985-12-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62106102U true JPS62106102U (en) | 1987-07-07 |
| JPH04246Y2 JPH04246Y2 (en) | 1992-01-07 |
Family
ID=31159972
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19887585U Expired JPH04246Y2 (en) | 1985-12-24 | 1985-12-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04246Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006153851A (en) * | 2004-11-08 | 2006-06-15 | Matsushita Electric Ind Co Ltd | Confocal optical device and spherical aberration correcting method |
-
1985
- 1985-12-24 JP JP19887585U patent/JPH04246Y2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006153851A (en) * | 2004-11-08 | 2006-06-15 | Matsushita Electric Ind Co Ltd | Confocal optical device and spherical aberration correcting method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH04246Y2 (en) | 1992-01-07 |