JPS58141536A - Attracting head of semiconductor wafer - Google Patents

Attracting head of semiconductor wafer

Info

Publication number
JPS58141536A
JPS58141536A JP2513082A JP2513082A JPS58141536A JP S58141536 A JPS58141536 A JP S58141536A JP 2513082 A JP2513082 A JP 2513082A JP 2513082 A JP2513082 A JP 2513082A JP S58141536 A JPS58141536 A JP S58141536A
Authority
JP
Japan
Prior art keywords
semiconductor wafer
hole
shutter
wafer
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2513082A
Other languages
Japanese (ja)
Other versions
JPS6240853B2 (en
Inventor
Hideaki Shirokura
白倉 英明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Sanyo Electric Co Ltd
Sanyo Electric Co Ltd
Sanyo Denki Co Ltd
Original Assignee
Tokyo Sanyo Electric Co Ltd
Sanyo Electric Co Ltd
Sanyo Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Sanyo Electric Co Ltd, Sanyo Electric Co Ltd, Sanyo Denki Co Ltd filed Critical Tokyo Sanyo Electric Co Ltd
Priority to JP2513082A priority Critical patent/JPS58141536A/en
Publication of JPS58141536A publication Critical patent/JPS58141536A/en
Publication of JPS6240853B2 publication Critical patent/JPS6240853B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Sheets, Magazines, And Separation Thereof (AREA)
  • Manipulator (AREA)

Abstract

PURPOSE:To realize perfect automatic operation of semiconductor wafer carrier by perfectly collecting gas from the sucking hole and thereby eliminating necessity of moving other semiconductor wafers placed on the support with gas flow. CONSTITUTION:A semiconductor wafer 16 is attracted, on the basis of the Bernoulli's theorem, by stable N<2> gas flow which blows gradiently toward the circumference from a blowing hole 11 through a gas introducing hole 18 and is collected from a sucking hole 12 through a vacuumed exhausting hole 19 after passing a groove 15. The attracting head moves carrying a semiconductor wafer 16 up to the support. Moreover, the attracting head moves downward, a self weight shutter 14 abuts on the support, a forcible shutter 13 moves downward isolating the wafer 16 from a sucking force. At this time, the semiconductor wafer 16 tries to move like a leaf of tree owing to an air resistance at the lower part, but since it is surrounded by the self weight shutter 14 and thereby an air resistance is unified and the wafer is placed to the desired position accurately under the restriction of the forcible shutter 13.

Description

【発明の詳細な説明】 本発明は半導体ウェハーの吸着ヘッドの改良に関する。[Detailed description of the invention] The present invention relates to improvements in suction heads for semiconductor wafers.

最近半導体製造工程の自動化が推進きれ、ウェハーをエ
ピタキシャル成長装置等へ妃列する場合に無接触でウェ
ハーを搬送で六る吸着ヘッドを用いる。斯る吸着ヘッド
は第1図に示T 様に、ヘッド(1)面に放射状(二設
けた吹出孔(2)から外周方向に斜め5二天印の如(N
2ガスを吹出し°C,ベルY(の原理により半導体ウェ
ハー(3)Y非接触で吸着する。
Recently, automation of the semiconductor manufacturing process has been promoted, and when wafers are transferred to an epitaxial growth apparatus, etc., a suction head is used to transfer the wafers without contact. As shown in Fig. 1, such a suction head has two air outlet holes (2) arranged radially on the surface of the head (1) diagonally in the direction of the outer periphery like a five-point mark (N).
2 gas is blown out at °C, and the semiconductor wafer (3) is adsorbed without contact with the semiconductor wafer (3) based on the principle of Bell Y.

斯る吸着ヘッドでは吹出孔(2)からのN2ガスがヘッ
ド周辺に吹出されるので、′「で1=配列シた半導体ウ
ェハーに3)等を移動させる欠点があり自動化の利点が
失なわれる。また半導体ウェハー(31(−は必ず位置
合わせのためにファセットと呼ばれる切入き部があり、
これ(二起因し°C半導体ウェハー(31がゆらいだり
1回転し“Cしまうので、位置がづれる欠点がありこれ
も自動化の利点を失う。
In such a suction head, N2 gas is blown out from the blow-off hole (2) around the head, so there is a disadvantage that ``3), etc. must be moved to the semiconductor wafers arranged in ``'', and the advantage of automation is lost. Also, the semiconductor wafer (31 (-) always has a cutout called a facet for alignment.
This is due to the fact that the semiconductor wafer (31) sways or rotates once, causing the position to shift, which also loses the advantage of automation.

本発明は断る欠点に鑑みてなされ、従来の欠点を完全に
除去した半導体ウェハーの吸着ヘッドを提供するもので
あ、る。以−トに第2図8よび1ト5図を参照し゛C本
発明の一実施例を詳述する。
The present invention has been made in view of the above drawbacks, and it is an object of the present invention to provide a suction head for semiconductor wafers that completely eliminates the conventional drawbacks. An embodiment of the present invention will now be described in detail with reference to FIGS. 2-8 and 1-5.

本発明に依る半導体ワエへ〜の吸着ヘッドは−、ラド本
体(1G、ヘッド本体f+01の吸着面に設けた杓数の
ガスの吹出孔旧)、本体(1αの周端に投けた複数のガ
スの吸込孔1121.ヘッド本体(1αの周辺に設けた
強制シャッターt131gよび口重シャッターf+41
.1’:すwt1戊されている。
The suction head for semiconductor work according to the present invention includes -, a rad body (1G, a ladle number of gas blow-off holes provided on the suction surface of the head body f+01), and a plurality of gases thrown onto the circumferential edge of the main body (1α). Suction hole 1121. Forced shutter t131g and heavy shutter f+41 provided around the head body (1α)
.. 1': wt1 has been removed.

ヘッド本体(1(bは表面をテフ〔Jン加工し、吸着面
に中心から少り、[7またどこ7)に複数のガスの吹出
fいl1lyall−敢射状に護゛ける。なS吹出孔(
11)はljスを外周方向に吹き出す様に傾斜し7′C
いる。
The head body (1 (b) has a Teflon finish on the surface, and the suction surface is slightly from the center, and multiple gases are blown out from the center to the [7 and where 7). Air outlet (
11) is inclined so that the lj space is blown out in the direction of the outer circumference, and is 7'C.
There is.

ガスの吸込孔1121は吹出孔1団の半径の延長−1,
に設けられ、対応する吹出孔口]との間g1吸着面に溝
051を設け”CノJス流を安定させる。
The gas suction hole 1121 is an extension of the radius of one group of blowout holes -1,
A groove 051 is provided on the g1 suction surface between the g1 and the corresponding blowout hole to stabilize the flow.

強制シャッター1’131は吸着された半導体ワエへ−
(16)の周端が当接し、吸着面との高さとの脆整を行
い吸着力をm整Tる働きと、半導体ウェハー1161の
離脱時【二強制的に下降させ“〔吸着力から分離し所足
の位置に導く働きを−「る。
Forced shutter 1'131 to the attracted semiconductor wire-
The peripheral edge of (16) comes into contact with the suction surface to adjust the height of the suction surface, thereby adjusting the suction force. The work that leads you to the right position.

自重シャッター旧1はI」体の獣さじより上下Tるも0
)で、ウニへ−(16(の搬送時(二は自重シャッター
(141は一ト降しガスを′回収し易クシ、ワエへ−釉
の離脱時i−は自重シャッター旧)は載置台(図示せず
)は当接し−Cなじみながら1−屓し%隣接ウニ2、−
0θ・\のガスの彫りをl!# I「’fる。
The dead weight shutter old 1 is 0 up and down from the beast spoon of I' body.
), when transporting the sea urchin (16) (2 is a dead weight shutter (141 is a comb that makes it easy to collect the gas after dropping it), and when the glaze is removed, the old dead weight shutter is used) is a mounting table ( (not shown) is in contact with -C while 1- falls % adjacent sea urchin 2, -
Carving the gas at 0θ・\! #I "'fru.

な8吸着曲の中心にはウェハー(161の吸着を検出す
る発光受電センザー(17)を設け゛(いる。
A light-emitting power receiving sensor (17) is installed at the center of the eight suction tracks to detect the suction of the wafer (161).

断る本発明の吸呑ヘッドに依れば、第3因の如(矢印の
如(、ガス廊人口(181を経°C吹出孔(11)がら
N2ガスを外周方向に傾斜し〔吹き出し%溝11 !i
lを経°C吸込孔112から真空に引いた排出rJl!
1を介し゛にのN ガスを回収する安定したJJス流C
二よりペルヌイの原理で半導体ウコハーfl filを
吸着°[る。この際半導体ワエハー旺の周端な強制シイ
ツタ−(131頭部のテーパー而と接触させ′Cウノー
ハーflf+lのJu1転を防止し”Cいる。次に吸着
ヘッド嘔・移動さ、0−“(半導体ウェハー(1(9を
搬送I7、載置台−1−までり1く。中に吸着ヘッドを
下降させて前述のl1lij (自重シ・Yツタ−04
1を載置台に当接させて強制シャッターi+31を下降
し゛Cワエハ・−(161を吸着力よりlJf )41
に−fる。このとき半導体ウェハー・(1引まその下部
の空気抵抗によつ°〔木の葉の如く移動しようとするが
、自重シャッター旧1で囲むことにより空気抵抗が均一
となり強制シャッター(1創二より規11i11され“
(正確に所望の位置に載置される。
According to the suction head of the present invention, the third factor (as shown by the arrow) is that the N2 gas is slanted toward the outer periphery through the gas outlet (181) and the outlet (11). 11!i
l is evacuated from the °C suction hole 112 to discharge rJl!
Stable JJ flow C to recover N gas through 1
From the second point, the semiconductor substrate is adsorbed using Pernoulli's principle. At this time, the forced shifter (131) at the peripheral end of the semiconductor wafer is brought into contact with the taper of the head to prevent the roll of the wafer flf+l from turning.Next, the suction head is moved, and the Transfer the wafer (1 (9) to the mounting table -1-1.
1 in contact with the mounting table and lower the forced shutter i+31.
ni-furu. At this time, the semiconductor wafer (1°) tries to move like a leaf due to the air resistance at the bottom of the wafer, but by surrounding it with the self-weight shutter (1), the air resistance becomes uniform and the forced shutter (1 “
(It is placed exactly in the desired position.

以上に詳述した如く本発明に依れば、吸込孔でプJスを
完全に回収−4−るためζ二%丁でに載置台に載置した
他の半導体ウェハー1ガス流で移動さ・じることがない
利点を自する。また強制シャッターXよび自重シャッタ
ーにより半導体ワエハー!従米のη11<回転すること
なく吸着でさ、且つIF確(1載置台11に載置できる
ので、半導体ウェハーの搬送装置が完全i二目動化でき
る。
As detailed above, according to the present invention, in order to completely recover the gas through the suction hole, another semiconductor wafer placed on the mounting table is moved by the gas flow at a rate of ζ2%.・Have the advantage of not having to worry about it. In addition, the forced shutter X and self-weight shutter allow semiconductor wafers! Since the wafer can be placed on the mounting table 11, the semiconductor wafer transfer device can be fully operated with two movements.

【図面の簡単な説明】[Brief explanation of drawings]

弔1図は従来の吸イ4〜ツドン説明する断i1n図、第
2図Rよび第3図は本発明の吸着ヘッドを説明イ゛る上
面1.”Klzoよび1枦…1図である。 主な図番の説明 +1(Di ヘ2ド本拝、It II ハIIJ出札、
TI2ハ吸込孔、031は強制シャッター、1141は
自重シャッター、(161は半鴫体ワエハーである。 出願人 三洋電機株式会社 外1名 代理人 弁理1丁 佐 野 静 夫
Figure 1 is a cross-sectional view illustrating the conventional suction head 4 to 3, and Figures 2R and 3 are top views 1 and 3 illustrating the suction head of the present invention. "Klzo and 1...1 drawing. Explanation of main drawing numbers + 1 (Di He 2 Do Honhai, It II Ha II J tender,
TI2 is a suction hole, 031 is a forced shutter, 1141 is a dead weight shutter, (161 is a half-body wafer. Applicant: Sanyo Electric Co., Ltd. and 1 other attorney, 1 patent attorney: Shizuo Sano

Claims (1)

【特許請求の範囲】 1、 ヘッド表面【二放射状C二設けた複数の吹出孔と
該吹出孔の延長上に設けた吸込孔とを風備し。 前記吹出孔からのガス流により半導体ウェハーを吸着し
巨つ前記ガス流を吸込孔に回収Tることを特徴とする半
導体ウェハーの吸着ヘッド。 2、特許請求の範囲第1項に於い゛C1前記吹出孔から
吸込孔まで溝を設はガス流の経路苓・−・定としたこと
t特徴と下る半導体ウェハーの吸着ヘッド。
[Claims] 1. A head surface [equipped with a plurality of radial C2 air outlet holes and a suction hole provided on an extension of the air outlet holes. A suction head for a semiconductor wafer, characterized in that a semiconductor wafer is suctioned by a gas flow from the blow-off hole, and the large gas flow is collected into a suction hole. 2. Claim 1 provides that the groove is provided from the blow-off hole to the suction hole to define a path for the gas flow, and a downward suction head for a semiconductor wafer.
JP2513082A 1982-02-17 1982-02-17 Attracting head of semiconductor wafer Granted JPS58141536A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2513082A JPS58141536A (en) 1982-02-17 1982-02-17 Attracting head of semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2513082A JPS58141536A (en) 1982-02-17 1982-02-17 Attracting head of semiconductor wafer

Publications (2)

Publication Number Publication Date
JPS58141536A true JPS58141536A (en) 1983-08-22
JPS6240853B2 JPS6240853B2 (en) 1987-08-31

Family

ID=12157369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2513082A Granted JPS58141536A (en) 1982-02-17 1982-02-17 Attracting head of semiconductor wafer

Country Status (1)

Country Link
JP (1) JPS58141536A (en)

Cited By (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58189535U (en) * 1982-06-11 1983-12-16 日本電気株式会社 Wafer suction device
JPS5992545A (en) * 1982-11-16 1984-05-28 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション Heat for lifting sheet-shaped material
JPS6080876A (en) * 1983-10-11 1985-05-08 Fuji Xerox Co Ltd Non-magnetic one-component developing device
JPS61140432A (en) * 1984-12-11 1986-06-27 Shinko Denki Kk Holder of wafer or the like
JPS6216924A (en) * 1985-05-04 1987-01-26 Seibu Giken:Kk Method for suspensorily floating platelike body by means of fluid in noncontact state
JPS62255335A (en) * 1986-04-25 1987-11-07 Hitachi Ltd Transfer device for laminar product
US4735449A (en) * 1985-05-04 1988-04-05 Kabushiki Kaisha Seibu Giken Method of supporting and/or conveying a plate with fluid without physical contact
JPH02156651A (en) * 1988-12-09 1990-06-15 Kyushu Electron Metal Co Ltd Wafer handling device
US6379103B1 (en) * 1999-12-22 2002-04-30 Orc Manufacturing Co., Ltd. Substrate transfer apparatus
JP2003324090A (en) * 2002-04-26 2003-11-14 Dainippon Screen Mfg Co Ltd Substrate processor
KR100420983B1 (en) * 2001-05-04 2004-03-02 주식회사 신성이엔지 Hand of robot for transferring wafer
JP2006339234A (en) * 2005-05-31 2006-12-14 Murata Mach Ltd Non-contact holding device
JP2008177239A (en) * 2007-01-16 2008-07-31 Tokyo Electron Ltd Substrate conveyor and vertical heat treatment apparatus
JP2009147148A (en) * 2007-12-14 2009-07-02 Tokyo Electron Ltd Substrate-treating device and substrate treatment method
JP2009147146A (en) * 2007-12-14 2009-07-02 Tokyo Electron Ltd Substrate-treating device and substrate treatment method
JP2010146927A (en) * 2008-12-22 2010-07-01 Hitachi High-Technologies Corp Sample conveying mechanism and scanning electron microscope having the same
ITUD20090042A1 (en) * 2009-02-23 2010-08-24 Applied Materials Inc PINZA DI BERNOULLI
CN102332420A (en) * 2011-05-25 2012-01-25 湖南红太阳光电科技有限公司 Ultrathin umbrella-flow-type non-contact silicon wafer sucking disc
WO2012176629A1 (en) * 2011-06-20 2012-12-27 東京エレクトロン株式会社 Detachment system, detachment method, and computer storage medium
JP2013136111A (en) * 2011-12-28 2013-07-11 Ngk Spark Plug Co Ltd Noncontact conveying device and method for manufacturing wiring board
DE102012215798A1 (en) * 2012-09-06 2014-03-06 J. Schmalz Gmbh Surface suction gripper for gripping and holding flat workpieces, has exhaust opening in workpiece that is opened towards exhaust duct opened to spacer of discharged air
CN103811386A (en) * 2012-11-13 2014-05-21 Ap系统股份有限公司 Apparatus for transferring substrate and processing substrate
JP2014123501A (en) * 2012-12-21 2014-07-03 Nissan Motor Co Ltd Adsorption device of separator for fuel cell
DE102017115738A1 (en) * 2017-07-13 2019-01-17 J. Schmalz Gmbh Bernoulli grippers
CN109461691A (en) * 2017-09-06 2019-03-12 富士迈半导体精密工业(上海)有限公司 Wafer support device
CN110697418A (en) * 2019-10-29 2020-01-17 田韬 Non-contact sucking disc based on fluid pressure
GB2584069A (en) * 2019-03-27 2020-11-25 Millitec Food Systems Ltd Flow gripper
WO2021048069A1 (en) * 2019-09-10 2021-03-18 A O Ideas Gmbh Suction unit and suction device
EP3655352A4 (en) * 2017-07-21 2021-04-21 Electro Scientific Industries, Inc. Non-contact handler and method of handling workpieces using the same

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JP4629765B2 (en) * 2008-10-17 2011-02-09 日本特殊陶業株式会社 Wiring board non-contact transfer device and method, and resin wiring board manufacturing method

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Publication number Priority date Publication date Assignee Title
JPS51112463U (en) * 1975-03-06 1976-09-11
JPS5638454U (en) * 1979-08-31 1981-04-11

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JPS536187A (en) * 1976-07-06 1978-01-20 Kubota Ltd Process for applying bag on end of long size material assembly

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JPS51112463U (en) * 1975-03-06 1976-09-11
JPS5638454U (en) * 1979-08-31 1981-04-11

Cited By (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58189535U (en) * 1982-06-11 1983-12-16 日本電気株式会社 Wafer suction device
JPS5992545A (en) * 1982-11-16 1984-05-28 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション Heat for lifting sheet-shaped material
JPH0353777B2 (en) * 1982-11-16 1991-08-16
JPS6080876A (en) * 1983-10-11 1985-05-08 Fuji Xerox Co Ltd Non-magnetic one-component developing device
JPS61140432A (en) * 1984-12-11 1986-06-27 Shinko Denki Kk Holder of wafer or the like
US4735449A (en) * 1985-05-04 1988-04-05 Kabushiki Kaisha Seibu Giken Method of supporting and/or conveying a plate with fluid without physical contact
JPS6216924A (en) * 1985-05-04 1987-01-26 Seibu Giken:Kk Method for suspensorily floating platelike body by means of fluid in noncontact state
JPH0411342B2 (en) * 1985-05-04 1992-02-28
JPS62255335A (en) * 1986-04-25 1987-11-07 Hitachi Ltd Transfer device for laminar product
JPH02156651A (en) * 1988-12-09 1990-06-15 Kyushu Electron Metal Co Ltd Wafer handling device
US6379103B1 (en) * 1999-12-22 2002-04-30 Orc Manufacturing Co., Ltd. Substrate transfer apparatus
KR100420983B1 (en) * 2001-05-04 2004-03-02 주식회사 신성이엔지 Hand of robot for transferring wafer
JP2003324090A (en) * 2002-04-26 2003-11-14 Dainippon Screen Mfg Co Ltd Substrate processor
JP4538849B2 (en) * 2005-05-31 2010-09-08 村田機械株式会社 Non-contact holding device
JP2006339234A (en) * 2005-05-31 2006-12-14 Murata Mach Ltd Non-contact holding device
JP2008177239A (en) * 2007-01-16 2008-07-31 Tokyo Electron Ltd Substrate conveyor and vertical heat treatment apparatus
JP4564022B2 (en) * 2007-01-16 2010-10-20 東京エレクトロン株式会社 Substrate transfer device and vertical heat treatment device
JP2009147148A (en) * 2007-12-14 2009-07-02 Tokyo Electron Ltd Substrate-treating device and substrate treatment method
JP2009147146A (en) * 2007-12-14 2009-07-02 Tokyo Electron Ltd Substrate-treating device and substrate treatment method
JP2010146927A (en) * 2008-12-22 2010-07-01 Hitachi High-Technologies Corp Sample conveying mechanism and scanning electron microscope having the same
WO2010094343A1 (en) * 2009-02-23 2010-08-26 Applied Materials, Inc. Bernoulli gripper
ITUD20090042A1 (en) * 2009-02-23 2010-08-24 Applied Materials Inc PINZA DI BERNOULLI
CN102332420A (en) * 2011-05-25 2012-01-25 湖南红太阳光电科技有限公司 Ultrathin umbrella-flow-type non-contact silicon wafer sucking disc
WO2012176629A1 (en) * 2011-06-20 2012-12-27 東京エレクトロン株式会社 Detachment system, detachment method, and computer storage medium
JP2013004845A (en) * 2011-06-20 2013-01-07 Tokyo Electron Ltd Separation system, separation method, program and computer storage medium
JP2013136111A (en) * 2011-12-28 2013-07-11 Ngk Spark Plug Co Ltd Noncontact conveying device and method for manufacturing wiring board
DE102012215798A1 (en) * 2012-09-06 2014-03-06 J. Schmalz Gmbh Surface suction gripper for gripping and holding flat workpieces, has exhaust opening in workpiece that is opened towards exhaust duct opened to spacer of discharged air
DE102012215798B4 (en) * 2012-09-06 2016-08-11 J. Schmalz Gmbh area vacuum
JP2014099607A (en) * 2012-11-13 2014-05-29 Ap Systems Inc Substrate transfer apparatus and substrate processing apparatus
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