JPS5731173A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS5731173A
JPS5731173A JP10663980A JP10663980A JPS5731173A JP S5731173 A JPS5731173 A JP S5731173A JP 10663980 A JP10663980 A JP 10663980A JP 10663980 A JP10663980 A JP 10663980A JP S5731173 A JPS5731173 A JP S5731173A
Authority
JP
Japan
Prior art keywords
layer
emitter
substrate
emitter resistance
collector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10663980A
Other languages
Japanese (ja)
Other versions
JPH0132666B2 (en
Inventor
Tadahiko Tanaka
Tsutomu Nozaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Sanyo Electric Co Ltd
Sanyo Electric Co Ltd
Original Assignee
Tokyo Sanyo Electric Co Ltd
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Sanyo Electric Co Ltd, Sanyo Electric Co Ltd filed Critical Tokyo Sanyo Electric Co Ltd
Priority to JP10663980A priority Critical patent/JPS5731173A/en
Publication of JPS5731173A publication Critical patent/JPS5731173A/en
Publication of JPH0132666B2 publication Critical patent/JPH0132666B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/72Transistor-type devices, i.e. able to continuously respond to applied control signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Bipolar Transistors (AREA)
  • Bipolar Integrated Circuits (AREA)

Abstract

PURPOSE:To determine an arbitary and large value of an emitter resistance without being limited by the composition of an emitter, by a method wherein the emitter and the emitter resistance are made independent each other by taking the emitter electrode out of a semiconductor substrate and composing the emitter resistance with the substrate. CONSTITUTION:A P<+> layer 110 and an epitaxial layer 111, which is piled on the layer 110, compose a substrate 11. The layer 111 is utilized as an emitter resistance and its value is arbitrarily determined at a value not more than 100ohms by controlling the specific resistivity and the thickness. An N buried layer 12 is provided and an epitaxial layer 13 is piled over it. The epitaxial layer 13 is devided by a P layer 15, and a collector, layer 14 is segmented. The N<+> layer 19 are provided and connected to the buried layer 12. In the N collector 14, a P base 16 and an N emitter 17 are produced. The surface is covered by an SiO2 film 20, in which an aperture is made. Al electrodes 21, 22, the P layers 15 and a connecting conductor 18 of the N emitter 17 are connected to the N<+> layers 19 and the P base 16. The electrode 23 of the emitter resistance is connected to the main surface of the substrate and the device is completed. The transistor produced by above method has such characteristics that hFE drops rapidly in accordance with large collector current and can provide excellent current limiting function.
JP10663980A 1980-08-01 1980-08-01 Semiconductor device Granted JPS5731173A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10663980A JPS5731173A (en) 1980-08-01 1980-08-01 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10663980A JPS5731173A (en) 1980-08-01 1980-08-01 Semiconductor device

Publications (2)

Publication Number Publication Date
JPS5731173A true JPS5731173A (en) 1982-02-19
JPH0132666B2 JPH0132666B2 (en) 1989-07-10

Family

ID=14438680

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10663980A Granted JPS5731173A (en) 1980-08-01 1980-08-01 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS5731173A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63194351A (en) * 1987-02-09 1988-08-11 Mitsubishi Electric Corp Semiconductor device
JPH02137232A (en) * 1988-11-17 1990-05-25 Sanyo Electric Co Ltd Semiconductor integrated circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63194351A (en) * 1987-02-09 1988-08-11 Mitsubishi Electric Corp Semiconductor device
JPH02137232A (en) * 1988-11-17 1990-05-25 Sanyo Electric Co Ltd Semiconductor integrated circuit
JPH088261B2 (en) * 1988-11-17 1996-01-29 三洋電機株式会社 Semiconductor integrated circuit

Also Published As

Publication number Publication date
JPH0132666B2 (en) 1989-07-10

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