JPS57169005A - Sonde for measuring electric resistance of charging material in reduction melting furnace - Google Patents
Sonde for measuring electric resistance of charging material in reduction melting furnaceInfo
- Publication number
- JPS57169005A JPS57169005A JP4859082A JP4859082A JPS57169005A JP S57169005 A JPS57169005 A JP S57169005A JP 4859082 A JP4859082 A JP 4859082A JP 4859082 A JP4859082 A JP 4859082A JP S57169005 A JPS57169005 A JP S57169005A
- Authority
- JP
- Japan
- Prior art keywords
- sonde
- electrode
- furnace
- charging materials
- leading end
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement Of Levels Of Liquids Or Fluent Solid Materials (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Blast Furnaces (AREA)
- Vertical, Hearth, Or Arc Furnaces (AREA)
Abstract
PURPOSE: To perform stable measurement over a long period of time without damaging of a sonde for measurement owing to charging materials by disposing a central electrode curvedly from the lower side of the outer electrode of the sonde, projecting the same into a blast furnace and forming the space between both electrodes on the inner side of the furnace adequately.
CONSTITUTION: An outer electrode 10 of a sonde which measures electric resistance for charging materials is made of heat resistant and abrasion resistant stainless steel or the like and is formed to a cylindrical shape in such a way as to cover an insulating material 12. The other central electrode 11 is projected from the lower side near the leading end of the electrode 10 downward to the inside of the furnace, and further the leading end thereof is bent and is extended to the same plane as the leading end plane of the electrode 10. The space (d) of the electrodes 10, 11 on the inner side of the furnace is set at about the same as the max. particle size of the charging materials to be measured of layer thickness. Thereby, the damaging of the material 12, etc. by the charging materials is reduced, and the thickness of the deposited layer is measured stably and surely.
COPYRIGHT: (C)1982,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4859082A JPS5850290B2 (en) | 1982-03-26 | 1982-03-26 | Sonde for measuring electrical resistance of contents in reduction melting furnace |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4859082A JPS5850290B2 (en) | 1982-03-26 | 1982-03-26 | Sonde for measuring electrical resistance of contents in reduction melting furnace |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9266876A Division JPS5318409A (en) | 1976-08-03 | 1976-08-03 | Measuring probe for electric resistance of burden in reduction smelting furnace |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57169005A true JPS57169005A (en) | 1982-10-18 |
JPS5850290B2 JPS5850290B2 (en) | 1983-11-09 |
Family
ID=12807615
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4859082A Expired JPS5850290B2 (en) | 1982-03-26 | 1982-03-26 | Sonde for measuring electrical resistance of contents in reduction melting furnace |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5850290B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5583810A (en) * | 1991-01-31 | 1996-12-10 | Interuniversitair Micro-Elektronica Centrum Vzw | Method for programming a semiconductor memory device |
EP1029085A1 (en) * | 1997-08-20 | 2000-08-23 | Moskovsky Institut Stali I Splavov | Probe scanning system and built-in burden material defining sensor |
US6243293B1 (en) | 1992-01-29 | 2001-06-05 | Interuniversitair Micro-Elektronica Centrum | Contacted cell array configuration for erasable and programmable semiconductor memories |
CN102392089A (en) * | 2011-11-03 | 2012-03-28 | 江苏省沙钢钢铁研究院有限公司 | Simple measuring device and method for thickness distribution of blast furnace radial coke and ore layers |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0427289U (en) * | 1990-06-28 | 1992-03-04 |
-
1982
- 1982-03-26 JP JP4859082A patent/JPS5850290B2/en not_active Expired
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5583810A (en) * | 1991-01-31 | 1996-12-10 | Interuniversitair Micro-Elektronica Centrum Vzw | Method for programming a semiconductor memory device |
US5583811A (en) * | 1991-01-31 | 1996-12-10 | Interuniversitair Micro-Elektronica Centrum Vzw | Transistor structure for erasable and programmable semiconductor memory devices |
US6243293B1 (en) | 1992-01-29 | 2001-06-05 | Interuniversitair Micro-Elektronica Centrum | Contacted cell array configuration for erasable and programmable semiconductor memories |
EP1029085A1 (en) * | 1997-08-20 | 2000-08-23 | Moskovsky Institut Stali I Splavov | Probe scanning system and built-in burden material defining sensor |
EP1029085A4 (en) * | 1997-08-20 | 2004-06-23 | Mo I Stali I Splavov | Probe scanning system and built-in burden material defining sensor |
EP1496128A1 (en) * | 1997-08-20 | 2005-01-12 | Moscow State Institute of Steel and Alloys ( Technological University) | Sensor for defining the distribution of burden material in metallurgical units |
CN102392089A (en) * | 2011-11-03 | 2012-03-28 | 江苏省沙钢钢铁研究院有限公司 | Simple measuring device and method for thickness distribution of blast furnace radial coke and ore layers |
Also Published As
Publication number | Publication date |
---|---|
JPS5850290B2 (en) | 1983-11-09 |
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