JPS5662339A - Production of semiconductor device - Google Patents
Production of semiconductor deviceInfo
- Publication number
- JPS5662339A JPS5662339A JP13774979A JP13774979A JPS5662339A JP S5662339 A JPS5662339 A JP S5662339A JP 13774979 A JP13774979 A JP 13774979A JP 13774979 A JP13774979 A JP 13774979A JP S5662339 A JPS5662339 A JP S5662339A
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- film
- substrate
- point metal
- melting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To form a electrode wiring excellent in ohmic contact property and adhesivity by continuously applying a silicon film and a silicide film of a high- melting-point metal in such a manner that the surface of a silicon film is kept from being exposed. CONSTITUTION:A silicon is evaporated on a silicon substrate 1 having a contact hole formed therethrough for a given time. Then, a high melting-point metal is deposited on the substrate 1 continuing the silicon evaporation to form a laminated film of a silicon film 5 and silicide film 6 of a high-melting-point metal. Consequently, a silicon film 5 is interposed between the silicon substrate 1 and the silicide film 6. Though exisiting on the substrate of the silicon substrate, a silicon oxide 3 of 20- 30Angstrom is easily taken into a crystaline particle mass of the silicon film by heat treatment as it is pinched between the same kind of semiconductors like the silicon substrate 1 and the silicon film 5. Accordingly, a better ohmic contact can be obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13774979A JPS5662339A (en) | 1979-10-26 | 1979-10-26 | Production of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13774979A JPS5662339A (en) | 1979-10-26 | 1979-10-26 | Production of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5662339A true JPS5662339A (en) | 1981-05-28 |
JPH0147012B2 JPH0147012B2 (en) | 1989-10-12 |
Family
ID=15205925
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13774979A Granted JPS5662339A (en) | 1979-10-26 | 1979-10-26 | Production of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5662339A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5886761A (en) * | 1981-10-27 | 1983-05-24 | フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン | Polysilicon mutial connector for bipolar transistor flip-flop |
JPS59220919A (en) * | 1983-05-31 | 1984-12-12 | Toshiba Corp | Manufacture of semiconductor device |
JPS6057974A (en) * | 1983-09-09 | 1985-04-03 | Matsushita Electric Ind Co Ltd | Manufacture of semiconductor device |
JPS63207179A (en) * | 1987-02-24 | 1988-08-26 | Seikosha Co Ltd | Manufacture of semiconductor device |
JPH0226021A (en) * | 1988-07-14 | 1990-01-29 | Matsushita Electron Corp | Formation of multilayer interconnection |
JPH02292866A (en) * | 1989-05-02 | 1990-12-04 | Nec Corp | Manufacture of mis type semiconductor device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4944797A (en) * | 1972-06-19 | 1974-04-27 | ||
JPS5413283A (en) * | 1977-06-30 | 1979-01-31 | Ibm | Method of forming metal silicide layer on substrate |
-
1979
- 1979-10-26 JP JP13774979A patent/JPS5662339A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4944797A (en) * | 1972-06-19 | 1974-04-27 | ||
JPS5413283A (en) * | 1977-06-30 | 1979-01-31 | Ibm | Method of forming metal silicide layer on substrate |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5886761A (en) * | 1981-10-27 | 1983-05-24 | フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン | Polysilicon mutial connector for bipolar transistor flip-flop |
JPS59220919A (en) * | 1983-05-31 | 1984-12-12 | Toshiba Corp | Manufacture of semiconductor device |
JPS6057974A (en) * | 1983-09-09 | 1985-04-03 | Matsushita Electric Ind Co Ltd | Manufacture of semiconductor device |
JPS63207179A (en) * | 1987-02-24 | 1988-08-26 | Seikosha Co Ltd | Manufacture of semiconductor device |
JPH0226021A (en) * | 1988-07-14 | 1990-01-29 | Matsushita Electron Corp | Formation of multilayer interconnection |
JPH02292866A (en) * | 1989-05-02 | 1990-12-04 | Nec Corp | Manufacture of mis type semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JPH0147012B2 (en) | 1989-10-12 |
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