JPS5533679A - Measuring method of distance - Google Patents

Measuring method of distance

Info

Publication number
JPS5533679A
JPS5533679A JP10773478A JP10773478A JPS5533679A JP S5533679 A JPS5533679 A JP S5533679A JP 10773478 A JP10773478 A JP 10773478A JP 10773478 A JP10773478 A JP 10773478A JP S5533679 A JPS5533679 A JP S5533679A
Authority
JP
Japan
Prior art keywords
grating
distance
moire fringe
variation
projected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10773478A
Other languages
Japanese (ja)
Inventor
Masane Suzuki
Kiyoshi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujinon Corp
Original Assignee
Fuji Photo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Optical Co Ltd filed Critical Fuji Photo Optical Co Ltd
Priority to JP10773478A priority Critical patent/JPS5533679A/en
Publication of JPS5533679A publication Critical patent/JPS5533679A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

PURPOSE: To measure the dislocation distnace of an object from the moire fringe due to the interference betweeen the projected grating image, which is formed from a grating projecting portion upon the object to approach and leave the projecting portion, and another standard grating.
CONSTITUTION: By lighting a spot light source S, a projected image of a first grating G1 is formed through a projecting lens 3 upon the surface 0 of an object to be inspected. The projected grating image on the object surface 0 is focused through the lens 3 and a half mirror 2 upon a second grating G2 thereby to form a moire fringe. This fringe is varied with the roughness and distance K of the object 0. As a result, if the object is the same, the variation in the distance K corresponds to the variation in the moire fringe. This moire fringe is observed beofre and after the displacement of the object so that the displacement of K for the distance K of the object can be determined on accordance with the variation in the relative angle of the moire fringe or in the pitch.
COPYRIGHT: (C)1980,JPO&Japio
JP10773478A 1978-09-01 1978-09-01 Measuring method of distance Pending JPS5533679A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10773478A JPS5533679A (en) 1978-09-01 1978-09-01 Measuring method of distance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10773478A JPS5533679A (en) 1978-09-01 1978-09-01 Measuring method of distance

Publications (1)

Publication Number Publication Date
JPS5533679A true JPS5533679A (en) 1980-03-08

Family

ID=14466586

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10773478A Pending JPS5533679A (en) 1978-09-01 1978-09-01 Measuring method of distance

Country Status (1)

Country Link
JP (1) JPS5533679A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4560280A (en) * 1982-08-31 1985-12-24 Tokyo Shibaura Denki Kabushiki Kaisha Apparatus for optically measuring the distance between two grating-like structures and the size of periodic pattern elements forming one of the grating-like structures
WO1997037267A1 (en) * 1996-04-03 1997-10-09 Mrs Technology, Inc. Lens focus shift sensor
EP1345084A1 (en) * 2002-03-15 2003-09-17 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1345082A1 (en) * 2002-03-15 2003-09-17 ASML Netherlands BV Lithographic apparatus and device manufacturing method
CN110500970A (en) * 2019-08-01 2019-11-26 佛山市南海区广工大数控装备协同创新研究院 A kind of multi-frequency structural light three-dimensional measuring device and method
JP2021162390A (en) * 2020-03-31 2021-10-11 株式会社フジタ Displacement measuring device and displacement measuring method

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4560280A (en) * 1982-08-31 1985-12-24 Tokyo Shibaura Denki Kabushiki Kaisha Apparatus for optically measuring the distance between two grating-like structures and the size of periodic pattern elements forming one of the grating-like structures
WO1997037267A1 (en) * 1996-04-03 1997-10-09 Mrs Technology, Inc. Lens focus shift sensor
US5991004A (en) * 1996-04-03 1999-11-23 Mrs Technology, Inc. Lens focus shift sensor
EP1345084A1 (en) * 2002-03-15 2003-09-17 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1345082A1 (en) * 2002-03-15 2003-09-17 ASML Netherlands BV Lithographic apparatus and device manufacturing method
US6819400B2 (en) 2002-03-15 2004-11-16 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
CN110500970A (en) * 2019-08-01 2019-11-26 佛山市南海区广工大数控装备协同创新研究院 A kind of multi-frequency structural light three-dimensional measuring device and method
JP2021162390A (en) * 2020-03-31 2021-10-11 株式会社フジタ Displacement measuring device and displacement measuring method
JP2021170042A (en) * 2020-03-31 2021-10-28 株式会社フジタ Displacement measuring device

Similar Documents

Publication Publication Date Title
JPS55142254A (en) Inspecting method for pattern of printed wiring board
JPS51122483A (en) Scanner type inspection device
JPS54114264A (en) Screw inspection method
JPS5533679A (en) Measuring method of distance
FR2321123A1 (en) MEASURING THE ANISOTROPY OF THE REFLECTING POWER OF A SURFACE BY ANALYSIS OF A BEAM OF REFLECTED POLARIZED LIGHT
JPS53125865A (en) Inspection of alumite substrate
JPS52132851A (en) Optical detector of scanning type
JPS5587004A (en) Surface-property measuring method
JPS522547A (en) Optical method to measure displacement of plane
JPS5572806A (en) Contour display unit
JPS5238944A (en) Optical system for scanning
JPS5381151A (en) Surface film thickness detector
JPS51124454A (en) Surface coarseness measuring method and equipment
JPS5296045A (en) Diameter measurement of optical fibers
JPS5338347A (en) Deflection measuring method of crank-shafts
JPS527267A (en) Measurement method of a tunnel section
JPS53117465A (en) Method and apparatus of measuring surface roughness
JPS5421277A (en) Inspection method for pattern
JPS55103402A (en) Linear gauge
JPS5267663A (en) Range finding method of photoelectric type
JPS54146650A (en) Hologram reproducing device
JPS5356028A (en) Exposing and scanning for copier
JPS5517933A (en) Crt face marking
JPS5382451A (en) Method and apparatus of comparing and inspecting surface roughness
JPS51131648A (en) Optical height measuring apparatus