JPH03187735A - Selective permeable membrane - Google Patents
Selective permeable membraneInfo
- Publication number
- JPH03187735A JPH03187735A JP2047135A JP4713590A JPH03187735A JP H03187735 A JPH03187735 A JP H03187735A JP 2047135 A JP2047135 A JP 2047135A JP 4713590 A JP4713590 A JP 4713590A JP H03187735 A JPH03187735 A JP H03187735A
- Authority
- JP
- Japan
- Prior art keywords
- film
- membrane
- selectively permeable
- tin
- amorphous
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000012528 membrane Substances 0.000 title claims abstract description 48
- 230000001681 protective effect Effects 0.000 claims abstract description 26
- 229910052796 boron Inorganic materials 0.000 claims abstract description 14
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 14
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims abstract description 13
- 239000010703 silicon Substances 0.000 claims abstract description 13
- 239000000758 substrate Substances 0.000 claims abstract description 13
- 229910052718 tin Inorganic materials 0.000 claims abstract description 12
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims abstract description 11
- 239000010936 titanium Substances 0.000 claims abstract description 11
- 229910052735 hafnium Inorganic materials 0.000 claims abstract description 10
- 229910052715 tantalum Inorganic materials 0.000 claims abstract description 10
- 229910052719 titanium Inorganic materials 0.000 claims abstract description 10
- 229910052726 zirconium Inorganic materials 0.000 claims abstract description 10
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims abstract description 9
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims abstract description 9
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 claims abstract description 9
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims abstract description 9
- 229910003437 indium oxide Inorganic materials 0.000 claims abstract description 6
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 claims abstract description 6
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims abstract description 4
- 229910001887 tin oxide Inorganic materials 0.000 claims abstract description 4
- 239000010408 film Substances 0.000 claims description 141
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 9
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 6
- 229910052709 silver Inorganic materials 0.000 claims description 6
- 239000004332 silver Substances 0.000 claims description 6
- 229910052737 gold Inorganic materials 0.000 claims description 5
- 239000010931 gold Substances 0.000 claims description 5
- 229910052697 platinum Inorganic materials 0.000 claims description 5
- 230000005540 biological transmission Effects 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 4
- 239000010409 thin film Substances 0.000 claims description 3
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims 1
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
- ZVWKZXLXHLZXLS-UHFFFAOYSA-N zirconium nitride Chemical compound [Zr]#N ZVWKZXLXHLZXLS-UHFFFAOYSA-N 0.000 claims 1
- 239000011521 glass Substances 0.000 abstract description 21
- 150000004767 nitrides Chemical class 0.000 abstract description 8
- 229910052751 metal Inorganic materials 0.000 abstract description 7
- 239000002184 metal Substances 0.000 abstract description 7
- 239000013078 crystal Substances 0.000 abstract description 2
- 239000002075 main ingredient Substances 0.000 abstract 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 12
- 238000002834 transmittance Methods 0.000 description 10
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 7
- 239000003513 alkali Substances 0.000 description 7
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- 239000002253 acid Substances 0.000 description 6
- 229910052786 argon Inorganic materials 0.000 description 6
- 230000007423 decrease Effects 0.000 description 6
- 239000007789 gas Substances 0.000 description 6
- 238000005299 abrasion Methods 0.000 description 5
- 238000007654 immersion Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 229910052760 oxygen Inorganic materials 0.000 description 5
- 238000003860 storage Methods 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- 238000005546 reactive sputtering Methods 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 229910052845 zircon Inorganic materials 0.000 description 4
- 239000003989 dielectric material Substances 0.000 description 3
- 239000005340 laminated glass Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000004576 sand Substances 0.000 description 3
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 150000007513 acids Chemical class 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910006501 ZrSiO Inorganic materials 0.000 description 1
- 238000005422 blasting Methods 0.000 description 1
- 229910052810 boron oxide Inorganic materials 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 210000004709 eyebrow Anatomy 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 235000013305 food Nutrition 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 230000008595 infiltration Effects 0.000 description 1
- 238000001764 infiltration Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- VRIVJOXICYMTAG-IYEMJOQQSA-L iron(ii) gluconate Chemical compound [Fe+2].OC[C@@H](O)[C@@H](O)[C@H](O)[C@@H](O)C([O-])=O.OC[C@@H](O)[C@@H](O)[C@H](O)[C@@H](O)C([O-])=O VRIVJOXICYMTAG-IYEMJOQQSA-L 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000012788 optical film Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- -1 sulfuric acid Chemical class 0.000 description 1
- 238000002233 thin-film X-ray diffraction Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Landscapes
- Optical Filters (AREA)
- Laminated Bodies (AREA)
- Surface Treatment Of Glass (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、光(電磁波)の一部を選択的に透過あるいは
反射して、流入するあるいは流出する光エネルギーを制
御する選択透過膜に関するものである。Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a selectively transmitting film that selectively transmits or reflects a portion of light (electromagnetic waves) to control incoming or outgoing light energy. It is.
[従来の技術]
従来より、選択透過膜として建設用熱線、反射ガラスな
どのヒートミラー 建築用Low−Eガラス、太陽熱温
水器の前面ガラス又はオーブンなどの覗き窓ガラスなど
のヒートミラー そして生鮮食料品のランプに使われる
コールドミラーなどい(つかのものが知られている。[Prior art] Conventionally, selective transmission films have been used as heat mirrors for construction heat rays, reflective glass, etc., heat mirrors for construction low-E glass, front glass of solar water heaters, or viewing window glass for ovens, etc., and fresh foods. There are some known cold mirrors used in lamps.
ヒートミラーと呼ばれるものは、熱線は反射して可視光
線を通すものであり、Low−E呼ばれることもある。What is called a heat mirror reflects heat rays and passes visible light, and is sometimes called Low-E.
これらのものとしては、代表的なものに誘電体/銀/誘
電体(Aタイプ)、導電性の酸化インジウム、酸化錫な
どのドーピングした金属酸化物(Bタイプ)及び金属の
100Å以下の薄膜、窒化膜(Cタイプ)などがある、
これらの材料は高い導電性を有し、電子のプラズマ振動
による赤外線領域の反射性能を利用している。このうち
Aタイプのものは近赤外領域でも充分高い反射性能を有
するためベアガラスや、合せガラスとして太陽光に対す
る熱線反射ガラスとして用いることもできる。Typical examples of these include dielectric/silver/dielectric (A type), conductive metal oxides doped with indium oxide, tin oxide, etc. (B type), and metal thin films of 100 Å or less. There are nitride films (C type), etc.
These materials have high electrical conductivity and utilize the ability to reflect in the infrared region due to plasma vibration of electrons. Among these, type A has sufficiently high reflective performance even in the near-infrared region, so it can be used as bare glass or laminated glass as heat ray reflective glass for sunlight.
[発明の解決しようとする課題J
Aタイプのものは誘電体としてTies、ZnO1Sn
O□など比較的屈折率の高い酸化膜を用い、干渉を利用
して可視域の反射を下げている。また、一方でこの酸化
膜は、耐久性のないAg膜の保護も兼ねている。[Problem to be solved by the invention J The A type uses Ties, ZnO1Sn as a dielectric material.
An oxide film with a relatively high refractive index, such as O□, is used to reduce reflection in the visible range by utilizing interference. On the other hand, this oxide film also serves to protect the Ag film, which is not durable.
Ag膜は、このように誘電体膜で挟まれ保護されている
にもかかわらず、成膜からベア又は合せガラスまでの保
存状態、取り扱いの不注意による傷、または時としてペ
ア又は合せガラス化後に周辺エツジからの水分の侵入な
どにより銀の酸化による白濁が発生し問題となることも
あった。Despite being sandwiched and protected by dielectric films in this way, Ag films are susceptible to damage during storage from deposition to bare or laminated glass, from scratches due to careless handling, or sometimes after being paired or laminated glass. Moisture infiltration from the peripheral edges sometimes caused cloudiness due to silver oxidation, which caused problems.
Bタイプのものは、元々酸化膜であるので酸化に対して
は強いのでCタイプも含めて使用環境によっては単板で
使用可能である。しかし化学薬品、特に硫酸などの酸に
は溶解すること、更に耐擦傷性も充分でないなどの問題
があった。Since type B is originally an oxide film, it is resistant to oxidation, so it can be used as a single plate depending on the usage environment, including type C. However, there were problems such as dissolution in chemicals, especially acids such as sulfuric acid, and insufficient scratch resistance.
[課題を解決するための手段]
本発明は、従来技術が有していた前述の問題点を解決し
ようとするものであり、基体側から選択透過機能膜、保
護膜の少なくとも2層よりなる薄膜を形成してなる選択
透過膜に於いて、保護膜がチタン、ジルコニウム、ハフ
ニウム、錫及びタンタルの群から選ばれる少なくとも1
種と、硼素、珪素のうち少なくとも1種とを含む酸化物
を主成分とする非晶質膜であることを特徴とする選択透
過膜を提供するものである。[Means for Solving the Problems] The present invention attempts to solve the above-mentioned problems that the prior art had, and includes a thin film consisting of at least two layers, a selectively permeable functional film and a protective film from the substrate side. In the selectively permeable membrane formed by forming a protective film, at least one selected from the group of titanium, zirconium, hafnium, tin, and tantalum.
The present invention provides a selectively permeable membrane characterized in that it is an amorphous membrane whose main component is an oxide containing a seed and at least one of boron and silicon.
第1図に本発明の選択透過膜の1例の断面図を示す0本
発明の選択透過膜を形成する基板lとしでは、ガラス、
プラスチック等が使用できる。FIG. 1 shows a cross-sectional view of one example of the selectively permeable membrane of the present invention. The substrate l on which the selectively permeable membrane of the present invention is formed includes glass,
Plastic etc. can be used.
選択透過機能膜2としては、金属、窒化膜、導電性酸化
インジウム、導電性酸化錫、Cdx5nO<誘電体/A
g又は窒化膜/誘電体などがある。金属としてはCr、
AI、 SUS、 Au、 Ptなどが、窒化膜とし
てはTiN、ZrNなどとが使われる。またAgのかわ
りに前述の金属又は窒化膜でも良い0選択透過機能膜の
膜厚は求める性能により、調節すれば良い。As the selective permeation functional film 2, metal, nitride film, conductive indium oxide, conductive tin oxide, Cdx5nO<dielectric/A
g or nitride film/dielectric material. Cr as a metal,
AI, SUS, Au, Pt, etc. are used, and TiN, ZrN, etc. are used as the nitride film. Further, the film thickness of the 0 selective permselective functional film, which may be the metal or nitride film mentioned above instead of Ag, may be adjusted depending on the desired performance.
第3図は本発明の選択透過膜(Aタイプ)の別の一例の
断面図である。 11はZr0g、Ties等の誘電体
膜、12は金、銀、白金のうち少なくとも1種を含む選
択透過機能膜、13は保護膜である。FIG. 3 is a sectional view of another example of the permselective membrane (A type) of the present invention. 11 is a dielectric film such as Zr0g or Ties; 12 is a permselective functional film containing at least one of gold, silver, and platinum; and 13 is a protective film.
保護膜3としては、チタン、ジルコニウム、ハフニウム
、錫及びタンタルの群から選ばれた少なくとも1種と硼
素、珪素の群から選ばれた少なくとも1種からなる酸化
膜である。保護膜3は選択透過膜が誘電体/Ag/誘電
体(Aタイプ)などの多層膜構成の場合、最外層の誘電
体の役割をかねそなえてもくい。また、この多層膜は3
層だけに限られるものではなく、光学性能調節又は、眉
間や基板との付着力向上などのため、3層以上にしても
良いことは云うまでもないことである。保護膜3の厚み
としては、あまり薄いと効果が充分でなくなるので10
0Å以上、好ましくは150Å以上、特に2n0Å以上
が良い、厚い方は特に制限はないが、保護膜の屈折率、
及びこの干渉による外観変化、生産性等を考慮して決め
れば良い。The protective film 3 is an oxide film made of at least one member selected from the group consisting of titanium, zirconium, hafnium, tin, and tantalum, and at least one member selected from the group consisting of boron and silicon. When the selectively permeable film has a multilayer structure such as dielectric/Ag/dielectric (type A), the protective film 3 may also serve as the outermost dielectric layer. In addition, this multilayer film has 3
It goes without saying that the number of layers is not limited to just one, and that three or more layers may be used in order to adjust optical performance or improve adhesion between the eyebrows and the substrate. The thickness of the protective film 3 should be set at 10 because if it is too thin, the effect will not be sufficient.
The refractive index of the protective film is 0 Å or more, preferably 150 Å or more, especially 2n0 Å or more, although there is no particular restriction on the thickness.
It may be determined by taking into consideration changes in appearance due to this interference, productivity, etc.
保護膜3の組成は特に限定は7ないが、膜が非晶質化し
て耐擦傷性や信頼性向上のためには、チタン、ジルコニ
ウム、ハフニウム、錫、タンタル、硼素、珪素の酸化膜
をそれぞれTiO□、ZrO。The composition of the protective film 3 is not particularly limited7, but in order to make the film amorphous and improve scratch resistance and reliability, oxide films of titanium, zirconium, hafnium, tin, tantalum, boron, and silicon may be used. TiO□, ZrO.
Hf0i、5nOa、Ta*Os、B1Os、Stem
と表わすとき、Ti0a、 Zr0i、 Hfol、
5nOi及びTa5ksから選ばれた酸化物の合計10
0部に対して、B、0.、 SiO□から選ばれた酸化
物の合計がモル比で5部以上、好ましくは10部以上、
特に2n部以上あるのが良い。またB2n.の場合、あ
まり多いと信頼性が低下するので、用途によっては、T
i1t、 ZrOs、 Hf0m。Hf0i, 5nOa, Ta*Os, B1Os, Stem
When expressed as, Ti0a, Zr0i, Hfol,
A total of 10 oxides selected from 5nOi and Ta5ks
For 0 parts, B, 0. , the total molar ratio of oxides selected from SiO□ is 5 parts or more, preferably 10 parts or more,
In particular, it is good to have 2n parts or more. Also B2n. In the case of T, reliability decreases if there are too many T
ilt, ZrOs, Hf0m.
5nOs及びTa*Osから選ばれた酸化物の合計10
0部に対してモル比で2n0部以下好ましくは100部
以下、特に50部以下が良い。Stemの場合は、あま
り多いとアルカリに対する耐久性が低下するので、Ti
e、 ZrO,HfOllSnow及びTa5kgから
選ばれた酸化物の合計100部に対してモル比で190
0部以下、好ましくは900部以下、特に400部以下
が良い。A total of 10 oxides selected from 5nOs and Ta*Os
The molar ratio to 0 parts is 2n0 parts or less, preferably 100 parts or less, particularly 50 parts or less. In the case of Stem, if too much Ti is used, the durability against alkali will decrease.
e, ZrO, HfOllSnow and 5 kg of Ta in a molar ratio of 190 parts to a total of 100 parts of oxides.
It is preferably 0 parts or less, preferably 900 parts or less, particularly 400 parts or less.
表1は、具体的に本発明の保護膜に最適な各種非晶質酸
化物膜の性質を示したものである。Table 1 specifically shows the properties of various amorphous oxide films most suitable for the protective film of the present invention.
それぞれ表に挙げた組成のターゲットを用いて、反応性
スパッタリングにより製膜したものである。結晶性は、
薄膜X線回折により観測した。又、耐擦傷性は、砂消し
ゴムによる擦り試験の結果で、Oは傷が殆どつかなかっ
たもの、Xは容易に傷が生じたものである。Films were formed by reactive sputtering using targets with the compositions listed in the table. Crystallinity is
Observation was made by thin film X-ray diffraction. Furthermore, the scratch resistance is the result of a rubbing test using a sand eraser, where O indicates that there were almost no scratches, and X indicates that scratches occurred easily.
耐摩耗性は、テーパー試験(摩耗輪C5−10F、加重
500 g、 1000回転)の結果、ヘイズ4%以内
のものをO、ヘイ14%超のものを×とした。耐酸性は
0.1N HオS04中に240時間浸漬した結果、
Tv (可視光透過率)、Rv(可視光反射率)の浸
漬前に対する変化率が1%以内のものを011〜4%の
ものをΔ、膜が溶解して消滅してしまったものを×とし
た。耐アルカリ性は0.IN NaOH中に240時間
浸漬した結果、Tv、Rvの浸漬前に対する変化率が1
%以内のものを○、2%以内のものを△、膜が溶解して
しまったものをXとした。煮沸テストは、1気圧下、1
00℃の水に2時間浸漬した後、Tv、Rvの浸漬前に
対する変化率が1%以内であるとき○、1層超のとき×
とした。As for wear resistance, as a result of a taper test (wearing wheel C5-10F, load 500 g, 1000 rotations), a haze within 4% was rated O, and a haze exceeding 14% was rated x. Acid resistance was determined by immersion in 0.1N HSO4 for 240 hours.
If the change rate of Tv (visible light transmittance) and Rv (visible light reflectance) is within 1% compared to before immersion, 0 is 011~4%, Δ is, and if the film has dissolved and disappeared is × And so. Alkali resistance is 0. As a result of immersion in IN NaOH for 240 hours, the rate of change in Tv and Rv from before immersion was 1.
% or less, △ if the film was within 2%, and X if the film was dissolved. The boiling test is 1 atm.
After being immersed in water at 00°C for 2 hours, when the change rate of Tv and Rv from before immersion is within 1%, ○, when more than 1 layer is ×
And so.
ZrBxOy膜に関しては、表1から明らかなように、
膜中のBが少ないと結晶性の膜ができ、Bが多いと非晶
質の膜ができる傾向があることがわかる。そして、結晶
性の膜は耐擦傷性及び耐摩耗性が劣るのに対して非晶質
の膜は優れていることがわかる。これは非晶質の膜は、
表面が平滑である為であると考えられる。従って、Zr
BヨOy膜(膜中のZrに対するBの原子比Xが0.1
0< x )の膜は耐擦傷性、耐摩耗性に優れている−
Bias膜は吸湿性で空気中の水分を吸収して溶けて
しまうので、ZrBxOy膜においてx<3程度が好ま
しい。Regarding the ZrBxOy film, as is clear from Table 1,
It can be seen that when the amount of B in the film is small, a crystalline film tends to be formed, and when the amount of B is large, an amorphous film tends to be formed. It can be seen that the crystalline film has poor scratch resistance and abrasion resistance, whereas the amorphous film has excellent scratch resistance and abrasion resistance. This is an amorphous film.
This is thought to be due to the smooth surface. Therefore, Zr
ByoOy film (atomic ratio X of B to Zr in the film is 0.1
0 < x) has excellent scratch resistance and abrasion resistance.
Since the Bias film is hygroscopic and dissolves by absorbing moisture in the air, it is preferable that x<3 for the ZrBxOy film.
ZrBxOy膜中のZrに対する0(酸素)の原子比は
特に限定されないが、多すぎると膜構造が粗になりボッ
ボッの膜になってしまうこと、又、あまり少ないと膜が
金属的になり透過率が低下したり膜の耐擦傷性が低下す
る傾向があることなどの理由によりZr0mとB2O3
の複合系となる量程度であることが好ましい、即ち、複
合酸化物をZrO*+ XBO+、sと表すと、BがZ
rに対して原子比でX含まれる時に、y=2+1.5x
程度であることが好ましい。There is no particular limit to the atomic ratio of 0 (oxygen) to Zr in the ZrBxOy film, but if it is too high, the film structure will become rough and uneven, and if it is too low, the film will become metallic and the transmittance will decrease. Zr0m and B2O3
It is preferable that the amount is such that a composite system of ZrO*+XBO+,s is obtained.
When X is included in atomic ratio to r, y=2+1.5x
It is preferable that the degree of
又、表1より、ZrBxOy膜中のBの量が増えるにつ
れ、膜の屈折率が低下する傾向があることがわかる。膜
の組成と屈折率nとの関係を第2図(a)に示す、膜中
のBを増やすことにより、屈折率nは2.1ぐらいから
1.5程度まで低下する。Furthermore, from Table 1, it can be seen that as the amount of B in the ZrBxOy film increases, the refractive index of the film tends to decrease. The relationship between the composition of the film and the refractive index n is shown in FIG. 2(a). By increasing the amount of B in the film, the refractive index n decreases from about 2.1 to about 1.5.
従って0.10<x<4.2<y< 8のZrBxOy
膜は良好な耐擦傷性及び耐摩耗性を有し、かつ、Bの量
によって自由に屈折率を選択できる本発明の目的に好適
な非晶質酸化物膜である。Therefore, ZrBxOy with 0.10<x<4.2<y<8
The film is an amorphous oxide film suitable for the purpose of the present invention, which has good scratch resistance and abrasion resistance, and whose refractive index can be freely selected depending on the amount of B.
さらに、表1に示したように、膜中のBの含有量が増え
るにつれ、耐酸性、耐アルカリ性が劣化する傾向がある
。X≧2.3で耐酸性が悪くなり、x>4で耐アルカリ
性の低下及び煮沸テストで劣化を示すようになる。従っ
て、空気中で露出した状態で使用される用途には、Zr
BxOy(x<2.3)の保護膜が好ましい。Furthermore, as shown in Table 1, as the content of B in the film increases, the acid resistance and alkali resistance tend to deteriorate. When X≧2.3, the acid resistance deteriorates, and when x>4, the alkali resistance decreases and deterioration occurs in the boiling test. Therefore, Zr
A protective film of BxOy (x<2.3) is preferred.
以上のように、ZrO*膜に酸化硼素B2O3を加えた
ことにより、膜が非晶質化し、表面が平滑化し、これが
耐摩耗性及び耐擦傷性の向上に寄与していると考えられ
る。又、Bの量で屈折率の調節が可能となり、さらに、
ZrO□膜と比べて、内部応力が小さいため、接する膜
との密着性の点で有利である。これは特に厚い膜を形成
する場合に有利である。As described above, by adding boron oxide B2O3 to the ZrO* film, the film becomes amorphous and the surface becomes smooth, which is thought to contribute to the improvement of wear resistance and scratch resistance. In addition, the refractive index can be adjusted by adjusting the amount of B, and furthermore,
Compared to the ZrO□ film, the internal stress is smaller, so it is advantageous in terms of adhesion with the adjacent film. This is especially advantageous when forming thick films.
次に、ZrStmOy膜に関しては、やはリアモルファ
スであり、耐擦傷性、耐摩耗性の高い膜が得られる。Next, regarding the ZrStmOy film, it is real amorphous and has high scratch resistance and wear resistance.
屈折率については、ZrO* (n = 2.14)と
5ift(n = 1.46)の間でその組成割合によ
って上下する(第2図(b)参照)、さらに詳しくは、
Zr5iaOy膜において、0.05≦2(膜中のZr
に対するSLの原子比)<19であることが好ましい。The refractive index varies depending on the composition ratio between ZrO* (n = 2.14) and 5ift (n = 1.46) (see Figure 2 (b)).
In the Zr5iaOy film, 0.05≦2 (Zr in the film
It is preferable that the atomic ratio of SL to SL is <19.
z<0.05だと、膜が非晶質化せず、十分な物理的耐
久性が得られない。又、2≧19だと、耐アルカリ性が
悪くなる。又、y (ZrSxxOy膜中のZrに対す
るOの原子比)は、ZrBxOy膜について述べたのと
同様の理由により、SLがZrに対して原子比で2含ま
れる時に、y=2+2z程度であることが好ましい。If z<0.05, the film will not become amorphous and sufficient physical durability will not be obtained. Moreover, when 2≧19, alkali resistance deteriorates. In addition, y (atomic ratio of O to Zr in the ZrSxxOy film) is approximately y=2+2z when the atomic ratio of SL to Zr is 2 for the same reason as described for the ZrBxOy film. is preferred.
又、ZrBxSixO,膜も本発明の目的に合った膜で
ある。かかる膜中のZrに対するBの原子比x、SLの
原子比2%Oの原子比yは、X+Z≧0.05であれば
膜が非晶質化し、耐擦傷性及び耐摩耗性の高い膜となる
ので好ましい。Further, a ZrBxSixO film is also suitable for the purpose of the present invention. If the atomic ratio x of B to Zr in such a film and the atomic ratio y of 2% O in SL are X+Z≧0.05, the film becomes amorphous and has high scratch resistance and wear resistance. This is preferable.
又、x+z<19であれば耐アルカリ性も良好であるの
で、Z r B x S 1 m Oy膜においては、
0.05≦x+z<19であるのが好ましい。ただし、
上述のように、B2O3は吸湿性で空気中の水分を吸収
して溶けてしまうため、ZrBxSixOy膜中にあま
り多く含有されない方がよい、具体的には、膜中におい
て、0(酸素)以外のZ、 B、 Siの合計に対して
、Zr<25原子%、かつSL< 25原子%で残りが
Bとなる程Bが含まれていると化学的耐久性が不十分と
なる。即ち、ZrBxSxxOy膜中のZr:B:St
(原子比)をl:x:zとすると、1/ (1+x+z
)<0.25かつZ/(1+x+z) <0.25.即
ち、x+z−3>Oかつx−32+1>0の組成は化学
的耐久性が好ましくない。yは、ZrBxOyの場合に
述べたのと同様の理由によりこの膜をZrO* + B
tus + 5iftの複合系と考えて、yは2+1.
5 x+ 2z程度であることが好ましい、よってほぼ
2<y<40程度であることが好ましい、BやSiの含
有量が多い程ZrBxSixOy膜の屈折率は低下する
* ZrB+5iaOy膜の例を第2図(c)に示す。In addition, if x+z<19, the alkali resistance is also good, so in the Z r B x S 1 m Oy film,
It is preferable that 0.05≦x+z<19. however,
As mentioned above, B2O3 is hygroscopic and dissolves by absorbing moisture in the air, so it is better not to contain too much in the ZrBxSixOy film. If B is included to the extent that Zr<25 atomic % and SL<25 atomic % and the remainder is B with respect to the total of Z, B, and Si, the chemical durability will be insufficient. That is, Zr:B:St in the ZrBxSxxOy film
If (atomic ratio) is l:x:z, then 1/(1+x+z
)<0.25 and Z/(1+x+z)<0.25. That is, a composition in which x+z-3>O and x-32+1>0 is unfavorable in terms of chemical durability. y is ZrO* + B for the same reason as mentioned in the case of ZrBxOy.
Considering it as a composite system of tus + 5ift, y is 2+1.
It is preferable that it is about 5 Shown in (c).
Zr以外の金属、即ち、Ti、 Hf、 Sn、 Ta
、 In と、BとSLのうち少なくとも1種とを含
む酸化物も同様に非晶質となり、十分な耐擦傷性、及び
耐摩耗性が得られる。 Ti5izOy膜を表1のサン
プル28に一例として示した。Metals other than Zr, i.e. Ti, Hf, Sn, Ta
, In, and at least one of B and SL also becomes amorphous, providing sufficient scratch resistance and abrasion resistance. A Ti5izOy film is shown as sample 28 in Table 1 as an example.
以上、ZrBxOy系、Zr5izOy系、ZrB、l
51m0y系等の膜において、上述の保護膜として必要
な屈折率を有するように、BやSLの添加量を調節すれ
ば良い。Above, ZrBxOy system, Zr5izOy system, ZrB, l
The amount of B or SL added may be adjusted so that the 51m0y-based film has a refractive index necessary as the above-mentioned protective film.
本発明の選択透過膜3の形成法も特に限定はなく、蒸着
法、イオンブレーティング法、スパッタリング法等いず
れも可能である。大面積の用途にはスパッタリング法が
膜分布の均一性から有利である。The method for forming the selectively permeable membrane 3 of the present invention is not particularly limited, and any of the methods such as vapor deposition, ion blasting, and sputtering are possible. For large-area applications, sputtering is advantageous because of the uniformity of the film distribution.
[作用]
本発明の特徴は、透明基板上の空気側最外層に耐久性の
優れた非晶質膜な形成することに特徴がある。[Function] The present invention is characterized in that an amorphous film with excellent durability is formed as the outermost air-side layer on the transparent substrate.
一般に、T x O* + Zr O*は化学的に安定
な材料であるが結晶性の膜になりやす(、表面が凹凸に
なり耐擦傷性が充分でない。また結晶粒界ができるため
粒界から水分、酸、アルカリなどが浸透し、下側に形成
されているメタル、窒化膜、又は導電性酸化インジウム
などが酸化あるいは溶解し、選択透過膜としての性能が
劣化することがある。本発明は硼素、珪素などのガラス
構成元素を混合することにより膜を非晶質化し、耐擦傷
性能を向上させる。更に結晶粒界が消失することにより
化学的な耐久性も向上する。In general, T x O * + Zr O * is a chemically stable material, but it tends to form a crystalline film (the surface becomes uneven and does not have sufficient scratch resistance. Also, since grain boundaries are formed, Moisture, acid, alkali, etc. permeate through the membrane, oxidizing or dissolving the metal, nitride film, or conductive indium oxide formed on the lower side, which may deteriorate the performance as a selectively permeable membrane.This invention By mixing glass constituent elements such as boron and silicon, the film is made amorphous and scratch resistance is improved.Furthermore, chemical durability is also improved by eliminating crystal grain boundaries.
Aタイプの構成では、誘電体として屈折率の高いZrO
,、TiO□などが用いられる。本発明の保護膜は、硼
素あるいは珪素の含有割合を調節することで屈折率をか
なり自由に選択できる。従って、誘電体膜として、Zn
O,Ti0zの代わりに本発明の保護膜と同じ膜を用い
ることもできる。In the A-type configuration, ZrO, which has a high refractive index, is used as the dielectric material.
, , TiO□, etc. are used. The refractive index of the protective film of the present invention can be selected quite freely by adjusting the boron or silicon content. Therefore, as a dielectric film, Zn
The same film as the protective film of the present invention can also be used instead of O, Ti0z.
これにより一層の信頼性の向上を図ることができる。This makes it possible to further improve reliability.
[実施例1]
ガラス基板に約4000人のITO(錫を含んだ酸化イ
ンジウム)を形成した選択透過機能膜2を真空槽にセッ
トしI X 10−’Torr以下′に排気した。これ
にZr5iiターゲツトを2 X 10−”Torrの
アルゴンと酸素の混合ガス中で反応性スパッタリングし
てZr51m、 ops、 o膜(屈折率約1.7 )
3約400人形成した。この選択透過膜の耐久性を調
べるために0.1規定のH,SO,及び同NaOH液に
24時間浸漬した。テスト後の外観変化は全く認められ
ず、その光学性能もテスト前に比較してその変化1%以
内であった。また砂消しゴムによる耐擦傷性試験でも傷
は殆ど付かず優れた性能を示した。[Example 1] A selectively permeable membrane 2 in which about 4,000 ITO (indium oxide containing tin) was formed on a glass substrate was set in a vacuum chamber and evacuated to I.times.10-'Torr or less. A Zr5ii target was then reactively sputtered in a mixed gas of argon and oxygen at 2 x 10-'' Torr to form a Zr51m, ops, o film (refractive index of about 1.7).
3 Approximately 400 people formed. In order to examine the durability of this permselective membrane, it was immersed in 0.1N H, SO, and NaOH solutions for 24 hours. No change in appearance was observed after the test, and the change in optical performance was within 1% compared to before the test. Furthermore, in the scratch resistance test using a sand eraser, there were almost no scratches, showing excellent performance.
[実施例2]
実施例1と同じようにITO(4000人)上にZr−
Bターゲット(原子比70−30)からのZrBo、
4srs、 s膜(屈折率約2.05 )を約400人
形成した。実施例1と同様に優れた耐久性、擦傷性能を
示した。[Example 2] As in Example 1, Zr- was deposited on ITO (4000 people).
ZrBo from B target (atomic ratio 70-30),
About 400 people formed 4srs, s films (refractive index of about 2.05). Similar to Example 1, it exhibited excellent durability and scratch resistance.
[実施例3]
実施例1と同様にしてITOを約282n人、次いでZ
r−5iターゲツト(原子比2n〜80)をスパッタリ
ングしてZr5i40+o膜(屈折率1.57)を10
0人形成した。この選択透過膜付ガラスのTV(可視光
線透過率)、TE(太陽光線透過率)、Rvr(膜面可
視光反射率)、REF(膜面太陽光線反射率)はそれぞ
れ86.71.11.15 (%)であった。耐久性は
実施例1と同様であった。[Example 3] In the same manner as in Example 1, about 282n people of ITO and then Z
A Zr5i40+o film (refractive index 1.57) was sputtered using an r-5i target (atomic ratio 2n to 80).
0 people formed. The TV (visible light transmittance), TE (sunlight transmittance), Rvr (film surface visible light reflectance), and REF (film surface solar ray reflectance) of this glass with a selective transmission film are 86.71.11. It was 15 (%). Durability was similar to Example 1.
[実施例4]
ガラス基板を真空槽にセットし、I X 10−’To
rr以下に排気した。2 X 10−”Torrのアル
ゴンと酸素の混合ガス中でZr−5iターゲツト(原子
比1:1)を反応性スパッタリングしてZrSiO4膜
(屈折率約1.75)を約690人形成した。次にアル
ゴンガス中でAgをスパッタリングしてAg膜を約70
人形成したのち、第1層と同じZrSiO4膜を約60
0人形成して選択透過膜をつくった。かかる選択透過膜
付ガラスのTV(可視光線透過率)、T、(太陽光線透
過率)、RvF(膜面可視光反射率)、REF(膜面太
陽光線反射率)、Rva(ガラス面可視光反射率)、R
EO(ガラス面太陽光線反射率)はそれぞれ、82.5
.68.3゜12.6,19.7,12.6,19.7
(%)であった、これの保存安定性を調べるために
50℃95%RH中に24時間放置した。試験後の外観
は部分的に若干のヘーズ発生は観測されたが、問題とな
るレベルではなかった。[Example 4] A glass substrate was set in a vacuum chamber, and I
Exhausted to below rr. Approximately 690 ZrSiO4 films (refractive index approximately 1.75) were formed by reactive sputtering of a Zr-5i target (atomic ratio 1:1) in a mixed gas of argon and oxygen at 2 x 10-'' Torr.Next Sputtering Ag in argon gas to form an Ag film with a thickness of about 70%
After forming the layer, approximately 60 layers of the same ZrSiO4 film as the first layer was added.
0 people were formed to create a selectively permeable membrane. The TV (visible light transmittance), T, (sunlight transmittance), RvF (film surface visible light reflectance), REF (film surface solar ray reflectance), and Rva (glass surface visible light reflectance) of such glass with a selective transmission film are reflectance), R
EO (glass surface solar reflectance) is 82.5 respectively.
.. 68.3°12.6, 19.7, 12.6, 19.7
(%).In order to examine its storage stability, it was left at 50° C. and 95% RH for 24 hours. After the test, some haze was observed in some areas, but it was not at a problematic level.
[実施例5J
ガラス基板を真空槽にセットし、I X 10−”To
rr以下に排気した* 2 X 10−”Torrのア
ルゴンと酸素の混合ガス中でZr−5tターゲツト(原
子比1:2)を反応性スパッタリングしてZr5iO<
膜(屈折率約1.7)を約650人形成した0次にアル
ゴンガス中でAgをスパッタリングしてAg膜を約7O
A形成したのち、第1層と同じZr5iO,膜を約57
5人形成して選択透過膜をっ(った。かかる選択透過膜
付ガラスのTV(可視光線透過率)、T、(太陽光線透
過率)、RVF(膜面可視光反射率)、REF(膜面太
陽光線反射率)、Rva(ガラス面可視光反射率)、R
to(ガラス面太陽光線反射率)はそれぞれ、82.1
.67、0゜13.0.2n.9,12.9.21.0
(%)であった、これの保存安定性を調べるために
50℃95%RH中に24時間放置した。試験後の外観
は部分的に若干のヘーズ発生は観測されたが、問題とな
るレベルではなかった。[Example 5J A glass substrate was set in a vacuum chamber, and
Zr5iO<
A film (refractive index of about 1.7) was formed by sputtering Ag in 0-order argon gas to form an Ag film of about 7O
After forming A, the same Zr5iO film as the first layer was deposited at about 57 cm.
Five people formed a selectively transmitting film and measured the TV (visible light transmittance), T, (sunlight transmittance), RVF (film surface visible light reflectance), and REF (of the glass with the selectively transmitting film). Film surface sunlight reflectance), Rva (glass surface visible light reflectance), R
to (glass surface sunlight reflectance) is 82.1, respectively.
.. 67, 0°13.0.2n. 9,12.9.21.0
(%).In order to examine its storage stability, it was left at 50° C. and 95% RH for 24 hours. After the test, some haze was observed in some areas, but it was not at a problematic level.
[実施例6]
ガラス基板を真空槽にセットし、I X 10−’To
rr以下に排気したe 2 X 10−”Torrのア
ルゴンと酸素の混合ガス中でZr−5tターゲツト(原
子比l:1)を反応性スパッタリングしてZrSiO4
膜(屈折率的1.75)を約775人形成した。次にア
ルゴンガス中でAgをスパッタリングしてAg膜を約7
0人(第2層)形成したのち、第1層と同じZrSiO
4膜を約875人(第3層)形成し、次いで第2層と同
様にしてAg膜を約70人(第4層)、次いで第1.3
層と同様にしてZrSiO4膜を約490人(第5層)
形成して、5層からなる選択透過膜をつ(った。かかる
選択透過膜付ガラスのTV(可視光線透過率)、T、(
太陽光線透過率)、R,F(膜面可視光反射率)、RE
F(膜面太陽光線反射率)、Rv、(ガラス面可視光反
射率)、REa(ガラス面太陽光線反射率)はそれぞれ
、83.0.55.1,10.0.31.6,9.9,
31.6(%)であった。これの保存安定性を調べるた
めに50℃95%RH中に24時間放置した。試験後の
外観は部分的に若干のヘーズ発生は観測されたが、問題
となるレベルではなかった。[Example 6] A glass substrate was set in a vacuum chamber, and I
ZrSiO4 was formed by reactive sputtering of a Zr-5t target (atomic ratio 1:1) in a mixed gas of argon and oxygen at e 2
Approximately 775 films (refractive index: 1.75) were formed. Next, sputter Ag in argon gas to form an Ag film of about 7
After forming 0 people (second layer), the same ZrSiO as the first layer
4 films were formed by approximately 875 people (3rd layer), then Ag films were formed by approximately 70 people (4th layer) in the same manner as the 2nd layer, and then 1.3 layers were formed by approximately 70 people (4th layer).
Approximately 490 ZrSiO4 films (5th layer)
A selectively transmitting membrane consisting of five layers was formed.The TV (visible light transmittance), T, (
(sunlight transmittance), R, F (film surface visible light reflectance), RE
F (film surface solar ray reflectance), Rv, (glass surface visible light reflectance), REa (glass surface solar ray reflectance) are 83.0.55.1, 10.0.31.6, 9, respectively. .9,
It was 31.6 (%). In order to examine its storage stability, it was left at 50° C. and 95% RH for 24 hours. After the test, some haze was observed in some areas, but it was not at a problematic level.
[比較例1]
実施例1で用いたITO付きの基板に、保護膜としてZ
rを反応性スパッタリングしてZrO*膜を約400人
形成した。この選択透過膜を実施例1と同様な耐久性試
験をし、外観変化を調べたところヘーズがかなり発生し
ていた。また、砂消しゴムテストでもところどころ大き
な擦り傷が付き問題となるレベルであった。[Comparative Example 1] Z was added as a protective film to the ITO substrate used in Example 1.
About 400 ZrO* films were formed by reactive sputtering of r. This selectively permeable membrane was subjected to the same durability test as in Example 1, and when changes in appearance were examined, it was found that a considerable amount of haze had occurred. Also, in the sand eraser test, there were large scratches in some places, which was problematic.
[比較例2]
第1層と第3層(’)ZrSxO4膜を約400人(7
)ZnOに変更した他は実施例3と同様な選択透過膜を
作った。これの保存安定性を調べるために、5゜”C9
5%RH中に24時間放置したところ、全面にわたりか
なりのヘーズが発生した。[Comparative Example 2] Approximately 400 people (7
) A selectively permeable membrane similar to that of Example 3 was made except that ZnO was used. In order to investigate the storage stability of this, 5゜”C9
When left in 5% RH for 24 hours, considerable haze occurred over the entire surface.
[発明の効果]
以上のように本発明においては、硼素、珪素を含む非晶
質酸化物層をオーバーコートすることにより、表面平滑
性が向上し、耐擦傷性が向上する。更に粒界消失により
水分や酸、アルカリなどが内部に浸透するのを抑制し、
又Ag等のようにマイグレーションし易いものの場合に
は、それが粒界を通して逆に表面に拡散し劣化するのを
防いでいる。これにより耐久性の優れた選択透過膜は得
ることができるものである。[Effects of the Invention] As described above, in the present invention, by overcoating with an amorphous oxide layer containing boron and silicon, surface smoothness and scratch resistance are improved. In addition, the disappearance of grain boundaries prevents moisture, acids, alkalis, etc. from penetrating into the interior.
Furthermore, in the case of materials that migrate easily, such as Ag, it is prevented from diffusing to the surface through grain boundaries and deteriorating. As a result, a selectively permeable membrane with excellent durability can be obtained.
硼素、あるいは珪素、又は両者の合せた量を適切に選ぶ
ことにより屈折率を1.5〜2.1と広い範囲で調節で
きるので保護膜に光学膜の機能を併せ持たせることが可
能である。これにより光学設計の自由度が増大し、又膜
構成の簡素化につながるため生産性向上面での寄与も大
きい。By appropriately selecting the amount of boron, silicon, or a combination of both, the refractive index can be adjusted over a wide range of 1.5 to 2.1, making it possible for the protective film to also have the function of an optical film. . This increases the degree of freedom in optical design and also simplifies the film configuration, making a large contribution to improving productivity.
第1図は本発明の選択透過膜の一例の断面図である。
第2図(a)はZrB+tOy膜中のBσ′答有量と膜
の屈折率nとの関係を示した図である。第2図(b)は
Zr5ixOy膜中のSLの含有量とnとの関係を、第
2図(c)はZrB+51i0y膜中のSiの含有量と
nとの関係を示した図、第2図(d)はTi51m0y
膜中のStの含有量とnとの関係図である。第3図(a
) 、 (b)は本発明の選択透過膜の他の一例の断面
図である。
に基 体
2:選択透過機能膜
3:保護膜
4:選択透過膜
11:誘電体膜
12:選択透過機能膜
13:保護膜
14:選択透過膜
l
第
図
第
図
(a)
第
図
(F))
’i!、rSiHChRN中の2rQ2+5tOz”し
γ・ノ第2図(b)
B□03
1r Bx C’Bxi中の Cモル≠〕’1
irox+Ba Os
第
図
(a)
2r 61 S: 10り東市の
S’=(h
HrOx−+ 5jOz
(モIしγ・)
第
図
(C)FIG. 1 is a sectional view of an example of a selectively permeable membrane of the present invention. FIG. 2(a) is a diagram showing the relationship between the amount of Bσ' in the ZrB+tOy film and the refractive index n of the film. Figure 2(b) shows the relationship between the SL content in the Zr5ixOy film and n, and Figure 2(c) shows the relationship between the Si content in the ZrB+51i0y film and n. (d) is Ti51m0y
FIG. 2 is a diagram showing the relationship between the St content in the film and n. Figure 3 (a
) and (b) are cross-sectional views of another example of the selectively permeable membrane of the present invention. Substrate 2: Permselective function membrane 3: Protective membrane 4: Permselective membrane 11: Dielectric film 12: Permselective function membrane 13: Protective membrane 14: Permselective membrane Figure 1 (a) Figure (F) )) 'i! , 2rQ2+5tOz'' in rSiHChRN
irox+Ba Os Diagram (a) 2r 61 S: 10 Rito City's S'=(h HrOx-+ 5jOz (MoIshiγ・) Diagram (C)
Claims (5)
2層よりなる薄膜を形成してなる選択透過膜に於いて、
保護膜がチタン、ジルコニウム、ハフニウム、錫及びタ
ンタルの群から選ばれる少なくとも1種と、硼素、珪素
のうち少なくとも1種とを含む酸化物を主成分とする非
晶質膜であることを特徴とする選択透過膜。(1) In a permselective membrane formed by forming a thin film consisting of at least two layers of a permselective functional membrane and a protective film from the substrate side,
The protective film is an amorphous film mainly composed of an oxide containing at least one member selected from the group of titanium, zirconium, hafnium, tin, and tantalum, and at least one member of boron and silicon. selectively permeable membrane.
化チタン、窒化ジルコニウム、導電性酸化インジウム又
は導電性酸化錫のうちから選ばれた1種を含むことを特
徴とする請求項1記載の選択透過膜。(2) The permselective functional membrane contains at least one selected from silver, gold, platinum, titanium nitride, zirconium nitride, conductive indium oxide, or conductive tin oxide. selectively permeable membrane.
少なくとも1種を含む選択透過機能 膜、次いで保護膜を積層した少なくとも3層からなる選
択透過膜であって、上記保護膜がチタン、ジルコニウム
、ハフニウム、錫及びタンタルの群から選ばれる少なく
とも1種 と、硼素、珪素のうち少なくとも1種とを含む酸化物を
主成分とする非晶質膜であることを特徴とする選択透過
膜。(3) A selectively permeable film consisting of at least three layers, in which a dielectric film is laminated from the base side, a selectively permeable functional film containing at least one of silver, gold, and platinum, and then a protective film, wherein the protective film is laminated. A selective transmission film characterized by being an amorphous film mainly composed of an oxide containing at least one member selected from the group of titanium, zirconium, hafnium, tin, and tantalum, and at least one member of boron and silicon. film.
体膜、第2n層目(n≧1)に銀、 金、白金のうち少なくとも1種を含む選択透過機能膜を
積層した合計2n層からなるコーティング上に保護膜を
形成した合計(2n+1)層からなる選択透過膜であっ
て、上記保護膜がチタン、ジルコニウム、ハフニウム、
錫及びタンタルの群から選ばれる少なくとも1種と、硼
素、珪素のうち少なくとも1種とを含む酸化物を主成分
とする非晶質膜であることを特徴とする選択透過膜。(4) A dielectric film is laminated on the (2n+1)th layer (n≧0) from the substrate side, and a permselective functional film containing at least one of silver, gold, and platinum is laminated on the second nth layer (n≧1). A selectively permeable membrane consisting of a total of (2n+1) layers in which a protective film is formed on a coating consisting of a total of 2n layers, the protective film comprising titanium, zirconium, hafnium,
A selectively permeable membrane characterized in that it is an amorphous membrane whose main component is an oxide containing at least one selected from the group of tin and tantalum and at least one of boron and silicon.
、錫及びタンタルの群から選ばれる少なくとも1種と、
硼素、珪素のうち少なくとも1種とを含む酸化物を主成
分とする膜であることを特徴とする請求項3又は4記載
の選択透過膜。(5) the dielectric film includes at least one member selected from the group of titanium, zirconium, hafnium, tin, and tantalum;
5. The selectively permeable membrane according to claim 3, wherein the membrane is mainly composed of an oxide containing at least one of boron and silicon.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1-53009 | 1989-03-07 | ||
JP5300989 | 1989-03-07 | ||
JP22449089 | 1989-09-01 | ||
JP1-224490 | 1989-09-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH03187735A true JPH03187735A (en) | 1991-08-15 |
JP2950886B2 JP2950886B2 (en) | 1999-09-20 |
Family
ID=26393697
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2047133A Expired - Fee Related JP2720919B2 (en) | 1989-03-07 | 1990-03-01 | target |
JP2047135A Expired - Fee Related JP2950886B2 (en) | 1989-03-07 | 1990-03-01 | Method for manufacturing glass with permselective membrane |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2047133A Expired - Fee Related JP2720919B2 (en) | 1989-03-07 | 1990-03-01 | target |
Country Status (1)
Country | Link |
---|---|
JP (2) | JP2720919B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
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US5513038A (en) * | 1992-07-24 | 1996-04-30 | Nikon Corporation | Antireflective film and optical elements having the same |
JP2002309366A (en) * | 2001-04-13 | 2002-10-23 | Nikko Materials Co Ltd | Target material for sputtering and production method therefor |
JP2006284912A (en) * | 2005-03-31 | 2006-10-19 | Sony Corp | Screen and its manufacturing method |
CN105895184A (en) * | 2016-06-16 | 2016-08-24 | 华北电力大学 | Particle remover with supercritical carbon dioxide as working medium |
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JP2008266794A (en) * | 1997-09-10 | 2008-11-06 | Sony Corp | Device for controlling amount of gas to be sprayed in vacuum tank |
JP4033286B2 (en) | 2001-03-19 | 2008-01-16 | 日本板硝子株式会社 | High refractive index dielectric film and manufacturing method thereof |
JP4417341B2 (en) * | 2005-07-27 | 2010-02-17 | 株式会社大阪チタニウムテクノロジーズ | Sputtering target |
JP5082857B2 (en) | 2005-12-12 | 2012-11-28 | 旭硝子株式会社 | Reflective mask blank for EUV lithography, and substrate with conductive film for the mask blank |
US20100279124A1 (en) | 2008-10-31 | 2010-11-04 | Leybold Optics Gmbh | Hafnium or zirconium oxide Coating |
WO2010048975A1 (en) * | 2008-10-31 | 2010-05-06 | Leybold Optics Gmbh | Hafnium oxide coating |
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Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52138512A (en) * | 1976-05-14 | 1977-11-18 | Kogyo Gijutsuin | Glass having excellent alkali resistance and production thereof |
JPS5466385A (en) * | 1977-11-08 | 1979-05-28 | Seiko Epson Corp | Outer parts for pocket watch |
JPS565345A (en) * | 1979-06-28 | 1981-01-20 | Nippon Kogaku Kk <Nikon> | Optical glass |
IT1146892B (en) * | 1980-09-09 | 1986-11-19 | Westinghouse Electric Corp | PROCESS FOR COATING ELEMENTS, SUCH AS GOLD-PLATED JEWELRY AND WRISTWATCH COMPONENTS, AND COATED ELEMENTS OBTAINED |
DE3417732A1 (en) * | 1984-05-12 | 1986-07-10 | Leybold-Heraeus GmbH, 5000 Köln | METHOD FOR APPLYING SILICON-CONTAINING LAYERS TO SUBSTRATES BY CATODIZING AND SPRAYING CATODE FOR CARRYING OUT THE METHOD |
JPS6151333A (en) * | 1984-08-20 | 1986-03-13 | 積水化学工業株式会社 | Transparent synrhetic resin body having permeability resistance |
JPH0682163B2 (en) * | 1988-03-03 | 1994-10-19 | 旭硝子株式会社 | Optical body with excellent durability |
-
1990
- 1990-03-01 JP JP2047133A patent/JP2720919B2/en not_active Expired - Fee Related
- 1990-03-01 JP JP2047135A patent/JP2950886B2/en not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5513038A (en) * | 1992-07-24 | 1996-04-30 | Nikon Corporation | Antireflective film and optical elements having the same |
JP2002309366A (en) * | 2001-04-13 | 2002-10-23 | Nikko Materials Co Ltd | Target material for sputtering and production method therefor |
JP4717247B2 (en) * | 2001-04-13 | 2011-07-06 | Jx日鉱日石金属株式会社 | Sputtering target and manufacturing method thereof |
JP2006284912A (en) * | 2005-03-31 | 2006-10-19 | Sony Corp | Screen and its manufacturing method |
JP4552733B2 (en) * | 2005-03-31 | 2010-09-29 | ソニー株式会社 | Screen and manufacturing method thereof |
CN105895184A (en) * | 2016-06-16 | 2016-08-24 | 华北电力大学 | Particle remover with supercritical carbon dioxide as working medium |
Also Published As
Publication number | Publication date |
---|---|
JPH03187733A (en) | 1991-08-15 |
JP2720919B2 (en) | 1998-03-04 |
JP2950886B2 (en) | 1999-09-20 |
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