JP5514806B2 - 研磨パッド組成物およびその製造方法ならびに使用 - Google Patents
研磨パッド組成物およびその製造方法ならびに使用 Download PDFInfo
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- JP5514806B2 JP5514806B2 JP2011507575A JP2011507575A JP5514806B2 JP 5514806 B2 JP5514806 B2 JP 5514806B2 JP 2011507575 A JP2011507575 A JP 2011507575A JP 2011507575 A JP2011507575 A JP 2011507575A JP 5514806 B2 JP5514806 B2 JP 5514806B2
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- polishing pad
- polyurethane
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- polymer
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- 238000005498 polishing Methods 0.000 title claims description 111
- 239000000203 mixture Substances 0.000 title claims description 14
- 238000004519 manufacturing process Methods 0.000 title description 9
- 239000000463 material Substances 0.000 claims description 107
- 229920002635 polyurethane Polymers 0.000 claims description 81
- 239000004814 polyurethane Substances 0.000 claims description 81
- 229920000098 polyolefin Polymers 0.000 claims description 65
- -1 polyethylene Polymers 0.000 claims description 62
- 239000004698 Polyethylene Substances 0.000 claims description 55
- 229920000573 polyethylene Polymers 0.000 claims description 55
- 229920000642 polymer Polymers 0.000 claims description 52
- 239000004743 Polypropylene Substances 0.000 claims description 7
- 229920001155 polypropylene Polymers 0.000 claims description 7
- 239000000126 substance Substances 0.000 claims description 5
- 230000003993 interaction Effects 0.000 claims description 2
- 239000000155 melt Substances 0.000 description 49
- 239000011159 matrix material Substances 0.000 description 30
- 239000002245 particle Substances 0.000 description 23
- 230000003750 conditioning effect Effects 0.000 description 14
- 239000011148 porous material Substances 0.000 description 13
- 238000001746 injection moulding Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 12
- 238000007517 polishing process Methods 0.000 description 11
- 239000002002 slurry Substances 0.000 description 11
- 229920002959 polymer blend Polymers 0.000 description 9
- 239000010432 diamond Substances 0.000 description 8
- 238000002156 mixing Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 229910003460 diamond Inorganic materials 0.000 description 7
- 238000007689 inspection Methods 0.000 description 7
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 5
- 238000009826 distribution Methods 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000001125 extrusion Methods 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- 239000012948 isocyanate Substances 0.000 description 2
- 150000002513 isocyanates Chemical class 0.000 description 2
- 229920001684 low density polyethylene Polymers 0.000 description 2
- 239000004702 low-density polyethylene Substances 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920005862 polyol Polymers 0.000 description 2
- 150000003077 polyols Chemical class 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 2
- 229920003169 water-soluble polymer Polymers 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- VAALVBPLSFRYMJ-XXMNONFOSA-N O=C1OC(=O)[C@@H]([C@@H](C23)C4)[C@H]1[C@@H]4C3[C@@H]1C[C@H]2[C@H]2C(=O)OC(=O)[C@@H]12 Chemical compound O=C1OC(=O)[C@@H]([C@@H](C23)C4)[C@H]1[C@@H]4C3[C@@H]1C[C@H]2[C@H]2C(=O)OC(=O)[C@@H]12 VAALVBPLSFRYMJ-XXMNONFOSA-N 0.000 description 1
- 239000004433 Thermoplastic polyurethane Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000011258 core-shell material Substances 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000010128 melt processing Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 238000010107 reaction injection moulding Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229920001862 ultra low molecular weight polyethylene Polymers 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/0013—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor using fillers dispersed in the moulding material, e.g. metal particles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29L—INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
- B29L2031/00—Other particular articles
- B29L2031/736—Grinding or polishing equipment
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Description
本出願は、米国仮特許出願第61/048,818号(2008年4月29日出願)、第61/111,290号(2008年11月4日出願)、および第61/111,337号(2008年11月5日出願)の正規出願に関し、これらの正規出願である。これらの出願は、本発明の譲受人に譲渡されており、その全体について参照により本明細書に組み込まれている。
本発明は、化学的機械研磨による平坦化(CMP)の分野に関し、具体的には、CMPで使用される、不混和性ポリマーで作られた研磨パッドに関する。
(1)ポリオレフィンの粘度とポリウレタンの粘度の比は3未満であり、
(2)ポリウレタンの引張強さは1000ポンド毎平方インチ(psi)(6894.76kPa)を超え、
(3)ポリウレタンの曲げ弾性率は2000psi(13789.52kPa)を超え、
(4)ポリウレタンのショアD硬度は25を超え、および/または
(5)分散したポリオレフィン相のドメイン・サイズは200マイクロメートル以下である。
ある場合には、研磨パッドのポリオレフィン含有量は1〜35体積%とすることができる。さらに、ある場合には、ポリオレフィンはポリエチレンでもよく、ポリプロピレンでもよい。例えばパッドの上面を機械加工することにより、多種類の表面フィーチャーをパッドの上面に(例えば、パッドの形成中または形成後に)形成することができる。
Ca = RnmY’/a
式中、Rは特有の小滴サイズであり、nmはマトリックスの粘度であり、Y’はマトリックスの変形速度であり、aは界面張力である。Caが限界値を超えると、小滴は分解する。所与の系について、剪断力が高くなるとマトリックスの変形速度が大きくなり、結果的に、小滴はより小さなサイズへ分解する。界面張力、構成成分の絶対的メルト・インデックス、および構成成分のメルト・インデックスの比などの系特有のパラメータと、(射出成形機または押出機などの)混合装置の剪断速度とが組み合わさって、分散相の粒度分布に影響を及ぼす。
Claims (6)
- バルク相である第1ポリマーと、
前記第1ポリマーに不混和性であり、かつ研磨中に前記研磨パッドから放出可能であり、これによって前記研磨パッドの露出面上に微細孔の領域をもたらす、分散相である第2ポリマーと、
を含み、
前記2種のポリマーは、異なる界面相互作用、異なるメルト・インデックス、および前記2つのポリマー相間のメルト・インデックスの比を有し、
前記第1ポリマーはポリウレタン材料であり、前記第2ポリマーはポリオレフィン材料である化学的機械研磨による平坦化(CMP)で使用される研磨パッド。 - 前記ポリオレフィン材料は、ポリエチレン材料とポリプロピレン材料の少なくとも1種であることを特徴とする請求項1に記載の研磨パッド。
- 前記ポリオレフィン材料は、2種の異なるポリエチレン材料のブレンドから作られることを特徴とする請求項1に記載の研磨パッド。
- 前記ポリオレフィンの粘度と前記ポリウレタンの粘度の比は33未満であり、
前記ポリウレタン材料の引張強さは1000ポンド毎平方インチ(psi)(6894.76kPa)を超え、
前記ポリウレタン材料の曲げ弾性率は2000psi(13789.52kPa)を超え、
前記ポリウレタン材料のショアD硬度は25を超え、
前記分散ポリオレフィン相のドメイン・サイズは200マイクロメートル以下である、ことを特徴とする請求項1に記載の研磨パッド。 - 前記研磨パッドは1〜35体積%のポリオレフィン材料を含むことを特徴とする請求項1に記載の研磨パッド。
- 前記研磨パッドの露出面は表面フィーチャーを含むことを特徴とする請求項1に記載の研磨パッド。
Applications Claiming Priority (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US4881808P | 2008-04-29 | 2008-04-29 | |
US61/048,818 | 2008-04-29 | ||
US11129008P | 2008-11-04 | 2008-11-04 | |
US61/111,290 | 2008-11-04 | ||
US11133708P | 2008-11-05 | 2008-11-05 | |
US61/111,337 | 2008-11-05 | ||
PCT/US2009/041944 WO2009134775A1 (en) | 2008-04-29 | 2009-04-28 | Polishing pad composition and method of manufacture and use |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2011530158A JP2011530158A (ja) | 2011-12-15 |
JP2011530158A5 JP2011530158A5 (ja) | 2012-06-21 |
JP5514806B2 true JP5514806B2 (ja) | 2014-06-04 |
Family
ID=41215482
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011507575A Expired - Fee Related JP5514806B2 (ja) | 2008-04-29 | 2009-04-28 | 研磨パッド組成物およびその製造方法ならびに使用 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8177603B2 (ja) |
JP (1) | JP5514806B2 (ja) |
KR (1) | KR101618273B1 (ja) |
CN (1) | CN102083586B (ja) |
WO (1) | WO2009134775A1 (ja) |
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US9162340B2 (en) * | 2009-12-30 | 2015-10-20 | 3M Innovative Properties Company | Polishing pads including phase-separated polymer blend and method of making and using the same |
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-
2009
- 2009-04-28 US US12/431,515 patent/US8177603B2/en active Active
- 2009-04-28 CN CN200980115576.XA patent/CN102083586B/zh not_active Expired - Fee Related
- 2009-04-28 JP JP2011507575A patent/JP5514806B2/ja not_active Expired - Fee Related
- 2009-04-28 WO PCT/US2009/041944 patent/WO2009134775A1/en active Application Filing
- 2009-04-28 KR KR1020107026820A patent/KR101618273B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
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CN102083586B (zh) | 2015-08-12 |
JP2011530158A (ja) | 2011-12-15 |
US8177603B2 (en) | 2012-05-15 |
KR101618273B1 (ko) | 2016-05-04 |
CN102083586A (zh) | 2011-06-01 |
WO2009134775A1 (en) | 2009-11-05 |
KR20110005295A (ko) | 2011-01-17 |
US20090270019A1 (en) | 2009-10-29 |
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