FR1504977A - Procédé pour faire pénétrer par diffusion, dans un cristal semi-conducteur, une substance de dopage en phase gazeuse - Google Patents
Procédé pour faire pénétrer par diffusion, dans un cristal semi-conducteur, une substance de dopage en phase gazeuseInfo
- Publication number
- FR1504977A FR1504977A FR87056A FR87056A FR1504977A FR 1504977 A FR1504977 A FR 1504977A FR 87056 A FR87056 A FR 87056A FR 87056 A FR87056 A FR 87056A FR 1504977 A FR1504977 A FR 1504977A
- Authority
- FR
- France
- Prior art keywords
- diffusing
- gas phase
- semiconductor crystal
- doping substance
- doping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000013078 crystal Substances 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000126 substance Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
- H01L21/28525—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table the conductive layers comprising semiconducting material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/225—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
- H01L21/2251—Diffusion into or out of group IV semiconductors
- H01L21/2254—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides
- H01L21/2257—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides the applied layer being silicon or silicide or SIPOS, e.g. polysilicon, porous silicon
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/043—Dual dielectric
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/122—Polycrystalline
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DES0100933 | 1965-12-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
FR1504977A true FR1504977A (fr) | 1967-12-08 |
Family
ID=7523384
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR87056A Expired FR1504977A (fr) | 1965-12-13 | 1966-12-12 | Procédé pour faire pénétrer par diffusion, dans un cristal semi-conducteur, une substance de dopage en phase gazeuse |
Country Status (9)
Country | Link |
---|---|
US (1) | US3502517A (fr) |
JP (1) | JPS4830703B1 (fr) |
AT (1) | AT264591B (fr) |
CH (1) | CH489906A (fr) |
DE (1) | DE1544273A1 (fr) |
FR (1) | FR1504977A (fr) |
GB (1) | GB1100780A (fr) |
NL (1) | NL6614433A (fr) |
SE (1) | SE331719B (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2018358A1 (fr) * | 1968-09-18 | 1970-05-29 | Gen Electric |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3601888A (en) * | 1969-04-25 | 1971-08-31 | Gen Electric | Semiconductor fabrication technique and devices formed thereby utilizing a doped metal conductor |
US3717514A (en) * | 1970-10-06 | 1973-02-20 | Motorola Inc | Single crystal silicon contact for integrated circuits and method for making same |
US3699646A (en) * | 1970-12-28 | 1972-10-24 | Intel Corp | Integrated circuit structure and method for making integrated circuit structure |
US3940288A (en) * | 1973-05-16 | 1976-02-24 | Fujitsu Limited | Method of making a semiconductor device |
US3880676A (en) * | 1973-10-29 | 1975-04-29 | Rca Corp | Method of making a semiconductor device |
JPS5950113B2 (ja) * | 1975-11-05 | 1984-12-06 | 株式会社東芝 | 半導体装置 |
US4063973A (en) * | 1975-11-10 | 1977-12-20 | Tokyo Shibaura Electric Co., Ltd. | Method of making a semiconductor device |
JPS5317081A (en) * | 1976-07-30 | 1978-02-16 | Sharp Corp | Production of i2l device |
GB1548520A (en) * | 1976-08-27 | 1979-07-18 | Tokyo Shibaura Electric Co | Method of manufacturing a semiconductor device |
US4050967A (en) * | 1976-12-09 | 1977-09-27 | Rca Corporation | Method of selective aluminum diffusion |
US4157926A (en) * | 1977-02-24 | 1979-06-12 | The United States Of America As Represented By The Secretary Of The Navy | Method of fabricating a high electrical frequency infrared detector by vacuum deposition |
US4274892A (en) * | 1978-12-14 | 1981-06-23 | Trw Inc. | Dopant diffusion method of making semiconductor products |
EP0101737A4 (fr) * | 1982-02-26 | 1984-08-20 | Western Electric Co | Diffusion de regions peu profondes. |
US4472212A (en) * | 1982-02-26 | 1984-09-18 | At&T Bell Laboratories | Method for fabricating a semiconductor device |
US4698104A (en) * | 1984-12-06 | 1987-10-06 | Xerox Corporation | Controlled isotropic doping of semiconductor materials |
EP0410390A3 (en) * | 1989-07-27 | 1993-02-24 | Seiko Instruments Inc. | Method of producing semiconductor device |
WO2012170087A1 (fr) * | 2011-06-10 | 2012-12-13 | Massachusetts Institute Of Technology | Dopage actif à haute concentration dans des semi-conducteurs, et dispositifs à semi-conducteur produits au moyen d'un tel dopage |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3089794A (en) * | 1959-06-30 | 1963-05-14 | Ibm | Fabrication of pn junctions by deposition followed by diffusion |
NL268758A (fr) * | 1960-09-20 | |||
US3189973A (en) * | 1961-11-27 | 1965-06-22 | Bell Telephone Labor Inc | Method of fabricating a semiconductor device |
BE636316A (fr) * | 1962-08-23 | 1900-01-01 | ||
US3275910A (en) * | 1963-01-18 | 1966-09-27 | Motorola Inc | Planar transistor with a relative higher-resistivity base region |
US3326729A (en) * | 1963-08-20 | 1967-06-20 | Hughes Aircraft Co | Epitaxial method for the production of microcircuit components |
DE1514807B2 (de) * | 1964-04-15 | 1971-09-02 | Texas Instruments Inc., Dallas. Tex. (V.St.A.) | Verfahren zum herstellen einer planaren halbleiteranordnung |
-
1965
- 1965-12-13 DE DE19651544273 patent/DE1544273A1/de active Pending
-
1966
- 1966-10-13 NL NL6614433A patent/NL6614433A/xx unknown
- 1966-12-05 US US598986A patent/US3502517A/en not_active Expired - Lifetime
- 1966-12-09 CH CH1760266A patent/CH489906A/de not_active IP Right Cessation
- 1966-12-12 SE SE17035/66A patent/SE331719B/xx unknown
- 1966-12-12 FR FR87056A patent/FR1504977A/fr not_active Expired
- 1966-12-12 AT AT1145766A patent/AT264591B/de active
- 1966-12-12 GB GB55471/66A patent/GB1100780A/en not_active Expired
- 1966-12-13 JP JP41081285A patent/JPS4830703B1/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2018358A1 (fr) * | 1968-09-18 | 1970-05-29 | Gen Electric |
Also Published As
Publication number | Publication date |
---|---|
US3502517A (en) | 1970-03-24 |
NL6614433A (fr) | 1967-06-14 |
JPS4830703B1 (fr) | 1973-09-22 |
CH489906A (de) | 1970-04-30 |
SE331719B (fr) | 1971-01-11 |
DE1544273A1 (de) | 1969-09-04 |
AT264591B (de) | 1968-09-10 |
GB1100780A (en) | 1968-01-24 |
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