DE69206106D1 - Gas-Photonanograph zur Herstellung und zur optischen Analyse von Mustern im Nanometerbereich. - Google Patents

Gas-Photonanograph zur Herstellung und zur optischen Analyse von Mustern im Nanometerbereich.

Info

Publication number
DE69206106D1
DE69206106D1 DE69206106T DE69206106T DE69206106D1 DE 69206106 D1 DE69206106 D1 DE 69206106D1 DE 69206106 T DE69206106 T DE 69206106T DE 69206106 T DE69206106 T DE 69206106T DE 69206106 D1 DE69206106 D1 DE 69206106D1
Authority
DE
Germany
Prior art keywords
photonanograph
patterns
gas
production
optical analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69206106T
Other languages
English (en)
Other versions
DE69206106T2 (de
Inventor
Christian Licoppe
Marcel Bensoussan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gula Consulting LLC
Original Assignee
France Telecom SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by France Telecom SA filed Critical France Telecom SA
Publication of DE69206106D1 publication Critical patent/DE69206106D1/de
Application granted granted Critical
Publication of DE69206106T2 publication Critical patent/DE69206106T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/04—Coating on selected surface areas, e.g. using masks
    • C23C16/047—Coating on selected surface areas, e.g. using masks using irradiation by energy or particles
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/52—Controlling or regulating the coating process
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00—Applications, other than SPM, of scanning-probe techniques

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Drying Of Semiconductors (AREA)
  • ing And Chemical Polishing (AREA)
  • Lasers (AREA)
DE69206106T 1991-12-13 1992-12-08 Gas-Photonanograph zur Herstellung und zur optischen Analyse von Mustern im Nanometerbereich. Expired - Lifetime DE69206106T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9115496A FR2685127B1 (fr) 1991-12-13 1991-12-13 Photonanographe a gaz pour la fabrication et l'analyse optique de motifs a l'echelle nanometrique.

Publications (2)

Publication Number Publication Date
DE69206106D1 true DE69206106D1 (de) 1995-12-21
DE69206106T2 DE69206106T2 (de) 1996-05-30

Family

ID=9420025

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69206106T Expired - Lifetime DE69206106T2 (de) 1991-12-13 1992-12-08 Gas-Photonanograph zur Herstellung und zur optischen Analyse von Mustern im Nanometerbereich.

Country Status (5)

Country Link
US (1) US5405481A (de)
EP (1) EP0546921B1 (de)
JP (1) JP3266677B2 (de)
DE (1) DE69206106T2 (de)
FR (1) FR2685127B1 (de)

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FR2709763B1 (fr) * 1993-09-08 1995-10-13 Commissariat Energie Atomique Dispositif de traitement d'un matériau, à tête photo-ionique miniaturisée.
US6286354B1 (en) * 1996-04-03 2001-09-11 Hitachi, Ltd. Rolling mill and rolling method and rolling equipment
US6319566B1 (en) 1997-11-12 2001-11-20 John C. Polanyi Method of molecular-scale pattern imprinting at surfaces
US6156393A (en) * 1997-11-12 2000-12-05 John C. Polanyi Method of molecular-scale pattern imprinting at surfaces
US6878417B2 (en) 1997-11-12 2005-04-12 John C. Polanyi Method of molecular-scale pattern imprinting at surfaces
WO2001085368A1 (en) 2000-05-09 2001-11-15 Usf Filtration And Separations Group, Inc. Apparatus and method for drawing continuous fiber
WO2002000963A1 (en) * 2000-06-23 2002-01-03 Steven John Ouderkirk Selective beam deposition
US6944380B1 (en) 2001-01-16 2005-09-13 Japan Science And Technology Agency Optical fiber for transmitting ultraviolet ray, optical fiber probe, and method of manufacturing the optical fiber probe
JP3859543B2 (ja) * 2002-05-22 2006-12-20 レーザーフロントテクノロジーズ株式会社 レーザ加工装置
US7261779B2 (en) * 2003-06-05 2007-08-28 Lockheed Martin Corporation System, method, and apparatus for continuous synthesis of single-walled carbon nanotubes
US8617965B1 (en) 2004-02-19 2013-12-31 Partial Assignment to University of Central Florida Apparatus and method of forming high crystalline quality layer
US7618880B1 (en) * 2004-02-19 2009-11-17 Quick Nathaniel R Apparatus and method for transformation of substrate
US7268063B1 (en) * 2004-06-01 2007-09-11 University Of Central Florida Process for fabricating semiconductor component
US7419887B1 (en) * 2004-07-26 2008-09-02 Quick Nathaniel R Laser assisted nano deposition
CN100561199C (zh) * 2004-09-10 2009-11-18 鸿富锦精密工业（深圳）有限公司 反射率测量系统
US7524431B2 (en) * 2004-12-09 2009-04-28 President And Fellows Of Harvard College Lift-off patterning processing employing energetically-stimulated local removal of solid-condensed-gas layers
US7435353B2 (en) * 2004-12-09 2008-10-14 President And Fellows Of Harvard College Patterning by energetically-stimulated local removal of solid-condensed-gas layers and solid state chemical reactions produced with such layers
US7951632B1 (en) 2005-01-26 2011-05-31 University Of Central Florida Optical device and method of making
US7473912B2 (en) * 2005-11-09 2009-01-06 Yang Xiao Charles Method and apparatus for patterning micro and nano structures using a mask-less process
US8617669B1 (en) 2006-04-20 2013-12-31 Partial Assignment to University of Central Florida Laser formation of graphene
US7811914B1 (en) 2006-04-20 2010-10-12 Quick Nathaniel R Apparatus and method for increasing thermal conductivity of a substrate
US8067303B1 (en) 2006-09-12 2011-11-29 Partial Assignment University of Central Florida Solid state energy conversion device
FR2916860B1 (fr) * 2007-06-04 2010-10-01 Commissariat Energie Atomique Procede de fabrication d'element optique en silice.
US8114693B1 (en) 2007-09-18 2012-02-14 Partial Assignment University of Central Florida Method of fabricating solid state gas dissociating device by laser doping
US20090208672A1 (en) * 2008-01-30 2009-08-20 Polanyi John C Method of linear patterning at surfaces
US8828769B2 (en) * 2008-12-02 2014-09-09 University Of Central Florida Energy conversion device
WO2013163040A1 (en) * 2012-04-23 2013-10-31 Lawrence Livermore National Security, Llc Localized atmospheric laser chemical vapor deposition
JPWO2014016952A1 (ja) * 2012-07-27 2016-07-07 株式会社日立製作所 プローブ顕微鏡用ホルダ、プローブ顕微鏡および試料計測方法
US9059079B1 (en) 2012-09-26 2015-06-16 Ut-Battelle, Llc Processing of insulators and semiconductors
KR101620168B1 (ko) 2013-07-01 2016-05-12 주식회사 엘지화학 히드록시 캡핑 단량체, 이의 폴리카보네이트 및 이를 포함하는 물품
US9620667B1 (en) 2013-12-10 2017-04-11 AppliCote Associates LLC Thermal doping of materials
US9601641B1 (en) 2013-12-10 2017-03-21 AppliCote Associates, LLC Ultra-high pressure doping of materials

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4611919A (en) * 1984-03-09 1986-09-16 Tegal Corporation Process monitor and method thereof
US4564736A (en) * 1984-05-07 1986-01-14 General Electric Company Industrial hand held laser tool and laser system
JPS60260125A (ja) * 1984-06-06 1985-12-23 Hitachi Ltd 半導体基板の選択的加工方法
US4930439A (en) * 1984-06-26 1990-06-05 Seiko Instruments Inc. Mask-repairing device
EP0196346B1 (de) * 1985-04-02 1989-07-19 International Business Machines Corporation Verfahren zur Herstellung von Oberflächenstrukturen im Nanometerbereich
DE3886113T3 (de) * 1987-06-26 1999-04-01 Mori, Yuzo, Katano, Osaka Präzises spannungsfreies Nachbehandlungsverfahren durch Radikalreaktionen.
FR2623820A1 (fr) * 1987-11-30 1989-06-02 Gen Electric Depot en phase gazeuse par procede chimique a laser avec utilisation d'un faisceau a fibre optique
JPH0262039A (ja) * 1988-08-29 1990-03-01 Hitachi Ltd 多層素子の微細加工方法およびその装置
FR2639567B1 (fr) * 1988-11-25 1991-01-25 France Etat Machine a microfaisceau laser d'intervention sur des objets a couche mince, en particulier pour la gravure ou le depot de matiere par voie chimique en presence d'un gaz reactif
US5062364A (en) * 1989-03-29 1991-11-05 Presstek, Inc. Plasma-jet imaging method
FR2651332B1 (fr) * 1989-08-28 1994-05-06 Ardt Microscope en champ proche en reflexion utilisant un guide d'ondes comme sonde de ce champ.
FR2653906B1 (fr) 1989-10-31 1992-05-22 Ardt Spectroscopie discriminante du profil optique d'un objet transparent, obtenu par microscopie optique a balayage en champ evanescent frustre, et microscopes de ce type mettant en óoeuvre ledit procede.
FR2654212A1 (fr) 1989-11-03 1991-05-10 Ardt Procede d'analyse spectroscopique ponctuelle de la lumiere diffractee ou absorbee par une substance placee dans un champ proche, et microscopes optiques a balayage en champ proche mettant en óoeuvre ce procede.

Also Published As

Publication number Publication date
EP0546921A1 (de) 1993-06-16
FR2685127A1 (fr) 1993-06-18
US5405481A (en) 1995-04-11
FR2685127B1 (fr) 1994-02-04
JPH0611441A (ja) 1994-01-21
JP3266677B2 (ja) 2002-03-18
DE69206106T2 (de) 1996-05-30
EP0546921B1 (de) 1995-11-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: GROSSE, BOCKHORNI, SCHUMACHER, 81476 MUENCHEN

8327 Change in the person/name/address of the patent owner

Owner name: GULA CONSULTING LLC, DOVER, DEL., US

8328 Change in the person/name/address of the agent

Representative=s name: DENDORFER & HERRMANN PATENTANWAELTE PARTNERSCHAFT,

R071 Expiry of right

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