CN113566804A - Four-mass optical-electromechanical three-axis gyroscope of three-dimensional photonic crystal and processing method thereof - Google Patents

Four-mass optical-electromechanical three-axis gyroscope of three-dimensional photonic crystal and processing method thereof Download PDF

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CN113566804A
CN113566804A CN202110638234.9A CN202110638234A CN113566804A CN 113566804 A CN113566804 A CN 113566804A CN 202110638234 A CN202110638234 A CN 202110638234A CN 113566804 A CN113566804 A CN 113566804A
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axis
mass
angular velocity
dimensional photonic
photonic crystal
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CN113566804B (en
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王辛望
崔颖
孙秀英
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Wuxi Institute of Technology
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    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/56Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
    • G01C19/567Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using the phase shift of a vibration node or antinode
    • G01C19/5691Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using the phase shift of a vibration node or antinode of essentially three-dimensional vibrators, e.g. wine glass-type vibrators

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Abstract

The invention discloses a four-mass optical-electromechanical three-axis gyroscope of a three-dimensional photonic crystal and a processing method thereof, wherein the gyroscope sequentially comprises a glass cap, a device layer and a glass substrate from top to bottom, and the glass cap and the glass substrate are bonded with the device layer through an anode; the device layer comprises a supporting outer frame, a central mass block positioned in the center of the supporting outer frame, four public mass blocks and a driving beam for connecting the four public mass blocks with the supporting outer frame, driving comb teeth are respectively arranged on the periphery of the central driving mass block and the upper parts and the lower parts of the four public mass blocks, the periphery of the four public mass blocks and the driving comb teeth are pulled through resonant beams, two sides of one side, close to the supporting outer frame, of the four public mass blocks are respectively connected with a Z-axis mechanical structure detection module comb tooth structure through the resonant beams, and the upper parts and the lower parts of the four public mass blocks are respectively covered with a three-dimensional photonic crystal structure layer; the invention realizes the measurement of the angular velocity of three axes in a single device and has simple structure.

Description

Four-mass optical-electromechanical three-axis gyroscope of three-dimensional photonic crystal and processing method thereof
Technical Field
The invention relates to the fields of micro-electromechanical and inertial navigation, in particular to a four-mass optical-electromechanical three-axis gyroscope based on a three-dimensional photonic crystal and a processing method thereof.
Background
The Micro Electro Mechanical System (MEMS) gyroscope is a key device which is manufactured by adopting an MEMS processing technology and is used for measuring the angular velocity of the motion of an object, has the characteristics of small size, low power consumption, low cost, convenience for batch production and the like compared with the traditional inertial device, and has wide application prospects in various fields of space technology, geodetic survey, geological exploration, tunnel engineering, oil exploration, mine exploitation, ocean development, automobile industry, national defense industry and the like, so that great amounts of manpower and material resources are put into research in colleges and universities, research institutes and commercial institutions at home and abroad. At present, in the multi-flow micromechanical gyroscope on the market, the micromechanical gyroscope has poor precision and is obviously influenced by temperature and humidity, and the micromechanical gyroscope is difficult to be applied to a high-precision measurement system.
To this end, researchers have integrated various MEMS structures with micro-optical devices, and designed micro-opto-electro-mechanical (MOEMS) gyroscopes. Compared with an MEMS gyroscope for capacitance detection, the novel gyroscope inherits the advantages of small size, light weight, low cost, easy realization of system integration and batch production and the like of the MEMS gyroscope; meanwhile, an optical detection method is adopted to replace capacitance detection, so that the contradiction that the precision and the dynamic performance are difficult to be considered is avoided, and the detection precision is higher; in addition, optical signals are adopted to replace electric signals for detection, photoelectric separation can be achieved, and the adaptability of the MOEMS inertial device to radiation, high temperature, strong electromagnetic interference and other environments is greatly improved.
Disclosure of Invention
The purpose of the invention is as follows: in order to overcome the defects of the prior art, the invention aims to provide a four-mass optical-electromechanical three-axis gyroscope based on a three-dimensional photonic crystal and a processing method thereof.
The technical scheme is as follows: in order to realize the purpose, the invention adopts the following technical scheme:
a four-mass optical-electromechanical three-axis gyroscope based on three-dimensional photonic crystals comprises a glass cap, a device layer and a glass substrate from top to bottom in sequence, wherein the glass cap and the glass substrate are bonded with the device layer through an anode;
the device layer comprises a supporting outer frame, a central mass block positioned in the center of the supporting outer frame, four public mass blocks respectively positioned in a 0-degree position, a 90-degree position, a 180-degree position and a 270-degree position of the whole structure, and driving beams for connecting the four public mass blocks with the supporting outer frame, wherein driving comb teeth are respectively arranged on the periphery of the central driving mass block and the upper parts and the lower parts of the four public mass blocks, the periphery of the four public mass blocks and the driving comb teeth are pulled through resonant beams, two sides of one side, close to the supporting outer frame, of the four public mass blocks are respectively connected with a Z-axis mechanical structure detection module comb tooth structure through the resonant beams, and the upper parts and the lower parts of the four public mass blocks are respectively covered with a three-dimensional photonic crystal structure layer;
the glass cap is positioned right above the device layer, and light guide holes are formed in the positions, corresponding to the three-dimensional photonic crystal structure layers of the public mass blocks of the device layer, of the glass cap and used for detecting light;
the glass substrate is located under the device layer, and light guide holes are formed in the positions, corresponding to the three-dimensional photonic crystal structure layers of the public mass blocks of the device layer, of the glass substrate and used for detecting light.
Further, the outer side of each common mass block is connected with the mass block outer frame through a detection beam.
The invention also provides a method for measuring the angular velocity by using the four-mass optical-electromechanical three-axis gyroscope based on the three-dimensional photonic crystal, which comprises the following steps:
when the four-mass optical-electromechanical three-axis gyroscope of the three-dimensional photonic crystal is stabilized in a driving mode, the four public mass blocks are driven by the driving beam to perform 'push-pull' motion, so that the capacitance in the driving comb teeth is changed, the capacitance is converted into voltage through an external circuit, and the angular velocity can be conveniently measured at any time;
when the X axis receives the angular velocity, the public mass block at the 0-degree position and the 180-degree position performs up-and-down resonant motion along the surface, and the measurement of the X axis angular velocity is realized by detecting the change of light intensity at one side of the light through hole;
when the Y axis receives the angular velocity, the public mass blocks at the 90-degree position and the 270-degree position perform up-and-down resonant motion along the surface, and the measurement of the Y axis angular velocity is realized by detecting the change of light intensity at one side of the light through hole;
when the Z axis receives the angular velocity, the four public mass blocks perform resonant motion in the plane, so that the comb tooth structure of the eight Z axis mechanical structure detection modules changes, and the angular velocity of the Z axis is obtained through measurement.
Further, the specific algorithm of the magnitude of the angular velocity is as follows:
let the angular velocity of the X-axis be omegaxAngular velocity of Y-axis is ΩyThus, the respective coriolis forces experienced by the X and Y axes are:
Fcx=2m1Ωxx'+2m2Ωxx' (1)
Fcy=2m3Ωyy'+2m4Ωyy' (2)
wherein m is1Mass of a common mass block at 0 DEG, m1Mass of a common mass block located at 180 DEG, m3Mass of a common mass at 90 DEG, m4Is the mass of the common mass at a position of 270 deg., x 'is the first derivative of the vector in the x direction and y' is the first derivative of the vector in the y direction;
according to the kinetic equation:
(m1+m3)x”+cxx'+kxx=Fcx (3)
(m2+m4)y”+cyy'+kyy=Fcy (4)
wherein, cxDamping coefficient, k, for the X-axisxElastic coefficient of X-axis, cyDamping coefficient, k, for the Y-axisyThe elastic coefficient of the Y axis is shown, x 'is the second derivative of the vector in the x direction, and Y' is the second derivative of the vector in the Y direction;
can be obtained from the equations (3) and (4)
Figure BDA0003106044410000031
Figure BDA0003106044410000032
Figure BDA0003106044410000033
Figure BDA0003106044410000034
Figure BDA0003106044410000035
Figure BDA0003106044410000036
Wherein B isxIs the amplitude of the X-axis and,
Figure BDA0003106044410000037
is the phase of the X axis, ByAmplitude of Y-axis
Figure BDA0003106044410000038
Is the phase of the Y axis, wxIs the vibration frequency of the X axis, wyIs the vibration frequency of the Y axis, wdXi X is the damping coefficient of the X axis, xi Y is the damping coefficient of the Y axis, t is the corresponding time, Ax is the coefficient of the X axis amplitude, Ay is the coefficient of the Y axis amplitude,
by simplification, the expression of the Coriolis force of the X axis and the Y axis can be obtained
Figure BDA0003106044410000039
Figure BDA00031060444100000310
Where Ω X is the angular velocity received on the X axis, Ω Y is the angular velocity received on the Y axis,
further, an expression of the acceleration of the Coriolis force can be obtained
Figure BDA00031060444100000311
Figure BDA00031060444100000312
By using the above formula and combining with the internal structure of the gyroscope, the relational expression of Coriolis acceleration, input angular velocity and transmittance is obtained:
Figure BDA00031060444100000313
Figure BDA00031060444100000314
Figure BDA0003106044410000041
Figure BDA0003106044410000042
wherein T is the transmittance, b0Is a node, E is the Young's modulus of the material, bxWidth of the X-axis resonance beam, byWidth of the Y-axis resonance beam, hxIs the height h of the X-axis resonant beamyIs the height of the Y-axis resonance beam, and rho is the mesoscopic press polish coefficient and is LxLength of the X-axis resonant beam, LyThe length of the Y-axis resonance beam;
because the transmissivity and the angular velocity have a certain proportional relation, the magnitude of the input angular velocity can be obtained through the change of the transmissivity by substituting each parameter through the designed gyroscope.
The invention also provides a processing method of the four-mass optical-electromechanical three-axis gyroscope based on the three-dimensional photonic crystal, which comprises the following steps:
(1) cleaning a silicon wafer, drying, uniformly coating photoresist on the upper surface of the silicon wafer, and photoetching an anchor point position by using a No. 1 mask after curing;
(2) processing anchor points on the upper surface of the silicon wafer (1) by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(3) cleaning the silicon wafer (1), drying, uniformly coating photoresist on the lower surface of the silicon wafer (1), and photoetching a mechanical structure by using a No. 2 mask after curing;
(4) processing a mechanical structure on the lower surface of the silicon wafer (1) by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(5) depositing silicon nitride on the lower surface of the silicon wafer, uniformly coating photoresist on the lower surface of the silicon wafer (1), and photoetching a mechanical structure by using a No. 3 mask after curing;
(6) processing a three-dimensional photonic crystal structure on a silicon nitride structure by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(7) depositing silicon nitride on the upper surface of the silicon chip, uniformly coating photoresist on the upper surface of the silicon chip, and photoetching the three-dimensional photonic crystal structure by using a No. 4 mask after curing;
(8) processing a three-dimensional photonic crystal structure on a silicon nitride structure by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(9) taking a clean glass substrate, uniformly coating photoresist on the surface of the glass substrate, and photoetching the substrate structure by using a No. 5 mask;
(10) carrying out anodic bonding on the glass substrate in the step (9) and the lower surface of the silicon wafer (1) in the step (6);
(11) taking clean glass, uniformly coating photoresist on the surface of the glass, and photoetching a cap structure by using a No. 6 mask;
(12) and (3) carrying out anodic bonding on the glass substrate in the step (11) and the upper surface of the silicon wafer (1) in the step (4) to obtain the four-mass optical-electro-mechanical triaxial gyroscope based on the three-dimensional photonic crystal.
Has the advantages that: compared with the prior art, the invention provides a novel three-axis gyroscope by utilizing the form of combining the three-dimensional photonic crystal and the mechanical structure, and the gyroscope adopts a brand-new detection mode and a single-chip integration mode and has the characteristics of small volume, high precision, wide application range and the like.
Drawings
FIG. 1 is an exploded view of a four-mass opto-electro-mechanical triaxial gyroscope based on a three-dimensional photonic crystal;
FIG. 2 is a top view of a mechanical structure of a four-mass opto-electro-mechanical triaxial gyroscope based on a three-dimensional photonic crystal;
FIG. 3 is an overall structure diagram of a four-mass opto-electro-mechanical triaxial gyroscope device layer based on three-dimensional photonic crystals;
FIG. 4 is a glass cap of a four-mass opto-electro-mechanical triaxial gyroscope based on a three-dimensional photonic crystal;
FIG. 5 is a glass substrate structure diagram of a four-mass opto-electro-mechanical triaxial gyroscope based on three-dimensional photonic crystals;
FIG. 6 is a three-dimensional photonic crystal structure diagram of a four-mass photo-electro-mechanical triaxial gyroscope based on a three-dimensional photonic crystal;
FIG. 7 is a four-mass photo-electro-mechanical triaxial gyroscope light detection method based on three-dimensional photonic crystals;
FIG. 8 is a flow chart of a four-mass opto-electro-mechanical triaxial gyroscope processing based on three-dimensional photonic crystals;
the device comprises a substrate, a substrate layer and a substrate, wherein 1, the substrate comprises a glass cap, 2, the device layer and 3, and the substrate layer comprises a glass substrate; 201. the system comprises a supporting outer frame, 202, a central mass block, 203, a common mass block, 204, driving beams, 205, driving combs, 206, resonant beams, 207, a Z-axis mechanical structure detection module comb structure, 208, a three-dimensional photonic crystal structure layer, 209, a mass block outer frame, 210, detection beams, 101, 301 and light guide holes.
Detailed Description
For better understanding of the present invention, the following embodiments are provided to further explain the technical solutions of the present invention in conjunction with the accompanying drawings, but the present invention is not limited to the following embodiments. The following are only preferred embodiments of the invention, it being noted that: it will be apparent to those skilled in the art that the location of each facility can be adjusted without departing from the principles of the invention, and such adjustments should be considered within the scope of the invention.
A four-mass optical-mechanical-electrical three-axis gyroscope based on three-dimensional photonic crystals comprises a glass cap 1, a device layer 2 and a glass substrate 3 from top to bottom in sequence, wherein the glass cap and the glass substrate are bonded with the device layer through an anode;
the device layer comprises a supporting outer frame 201, a central mass block 202 located in the center of the supporting outer frame, four public mass blocks 203 located in 0-degree position, 90-degree position, 180-degree position and 270-degree position of the whole structure respectively, and a driving beam 204 connecting the four public mass blocks with the supporting outer frame, wherein driving comb teeth 205 are arranged on the periphery of the central driving mass block and on the upper portions and the lower portions of the four public mass blocks respectively, the periphery of the four public mass blocks and the driving comb teeth are pulled through a resonance beam 206, two sides of one side, close to the supporting outer frame, of the four public mass blocks are connected with a Z-axis mechanical structure detection module comb tooth structure 207 through the resonance beam respectively, and the upper portions and the lower portions of the four public mass blocks are covered with three-dimensional photonic crystal structure layers 208 respectively;
the glass cap is positioned right above the device layer, and light guide holes 101 are formed in the positions, corresponding to the three-dimensional photonic crystal structure layers of the public mass blocks of the device layer, of the glass cap and used for detecting light;
the glass substrate is located under the device layer, and light guide holes 301 are formed in the positions, corresponding to the three-dimensional photonic crystal structure layers of the public mass blocks of the device layer, of the glass substrate and used for detecting light.
Further, the outer side of each of said common masses is connected to the outer mass frame 209 via sensing beams 210.
The invention also provides a method for measuring the angular velocity by using the four-mass optical-electromechanical three-axis gyroscope based on the three-dimensional photonic crystal, which comprises the following steps:
when the four-mass optical-electromechanical three-axis gyroscope of the three-dimensional photonic crystal is stabilized in a driving mode, the four public mass blocks are driven by the driving beam to perform 'push-pull' motion, so that the capacitance in the driving comb teeth is changed, the capacitance is converted into voltage through an external circuit, and the angular velocity can be conveniently measured at any time; in an initial state, the three-dimensional photonic crystal structures are arranged horizontally and vertically, the distances among the spherical photonic crystals are kept consistent, the path of a light path is shown in fig. 7(a), when an angular velocity is generated on an X axis or a Y axis, the distances among the spherical photonic crystals of the three-dimensional photonic crystal structures are changed as shown in fig. 7(b), so that the initial light path is changed, and the angular velocity can be obtained through the change of the light path.
When the X axis receives the angular velocity, the public mass block at the 0-degree position and the 180-degree position performs up-and-down resonant motion along the surface, and the measurement of the X axis angular velocity is realized by detecting the change of light intensity at one side of the light through hole;
when the Y axis receives the angular velocity, the public mass blocks at the 90-degree position and the 270-degree position perform up-and-down resonant motion along the surface, and the measurement of the Y axis angular velocity is realized by detecting the change of light intensity at one side of the light through hole;
when the Z axis receives the angular velocity, the four public mass blocks perform resonant motion in the plane, so that the comb tooth structure of the eight Z axis mechanical structure detection modules changes, and the angular velocity of the Z axis is obtained through measurement.
Further, the specific algorithm of the magnitude of the angular velocity is as follows:
let the angular velocity of the X-axis be omegaxAngular velocity of Y-axis is ΩyThus, the respective coriolis forces experienced by the X and Y axes are:
Fcx=2m1Ωxx'+2m2Ωxx' (1)
Fcy=2m3Ωyy'+2m4Ωyy' (2)
wherein m is1Mass of a common mass block at 0 DEG, m1Mass of a common mass block located at 180 DEG, m3Mass of a common mass at 90 DEG, m4Is the mass of the common mass at a position of 270 deg., x 'is the first derivative of the vector in the x direction and y' is the first derivative of the vector in the y direction;
according to the kinetic equation:
(m1+m3)y”+cyy'+kyy=Fcy (3)
(m2+m4)y”+cyy'+kyy=Fcy (4)
wherein, cxDamping coefficient, k, for the X-axisxElastic coefficient of X-axis, cyDamping coefficient, k, for the Y-axisyIs the elastic coefficient of the Y axis, x "is the second derivative of the vector in the x direction, and Y" is the second derivative of the vector in the Y direction;
can be obtained from the equations (3) and (4)
Figure BDA0003106044410000071
Figure BDA0003106044410000072
Figure BDA0003106044410000073
Figure BDA0003106044410000074
Figure BDA0003106044410000075
Figure BDA0003106044410000076
Wherein B isxIs the amplitude of the X-axis and,
Figure BDA0003106044410000077
is the phase of the X axis, ByAmplitude of Y-axis
Figure BDA0003106044410000078
Is the phase of the Y axis, wxIs the vibration frequency of the X axis, wyIs the vibration frequency of the Y axis, wdXi X is the damping coefficient of the X axis, xi Y is the damping coefficient of the Y axis, t is the corresponding time, Ax is the coefficient of the X axis amplitude, Ay is the coefficient of the Y axis amplitude,
by simplification, the expression of the Coriolis force of the X axis and the Y axis can be obtained
Figure BDA0003106044410000079
Figure BDA00031060444100000710
Where Ω X is the angular velocity received on the X axis, Ω Y is the angular velocity received on the Y axis,
further, an expression of the acceleration of the Coriolis force can be obtained
Figure BDA00031060444100000711
Figure BDA00031060444100000712
By using the above formula and combining with the internal structure of the gyroscope, the relational expression of Coriolis acceleration, input angular velocity and transmittance is obtained:
Figure BDA00031060444100000713
Figure BDA0003106044410000081
Figure BDA0003106044410000082
Figure BDA0003106044410000083
wherein T is the transmittance, b0Is a node, E is the Young's modulus of the material, bxWidth of the X-axis resonance beam, byWidth of the Y-axis resonance beam, hxIs the height h of the X-axis resonant beamyIs the height of the Y-axis resonance beam, and rho is the mesoscopic press polish coefficient and is LxLength of the X-axis resonant beam, LyThe length of the Y-axis resonance beam;
because the transmissivity and the angular velocity have a certain proportional relation, the magnitude of the input angular velocity can be obtained through the change of the transmissivity by substituting each parameter through the designed gyroscope.
The invention also provides a processing method of the four-mass optical-electromechanical three-axis gyroscope based on the three-dimensional photonic crystal, which comprises the following steps:
(1) cleaning a silicon wafer, drying, uniformly coating photoresist on the upper surface of the silicon wafer, and photoetching an anchor point position by using a No. 1 mask after curing;
(2) processing anchor points on the upper surface of the silicon wafer (1) by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(3) cleaning the silicon wafer (1), drying, uniformly coating photoresist on the lower surface of the silicon wafer (1), and photoetching a mechanical structure by using a No. 2 mask after curing;
(4) processing a mechanical structure on the lower surface of the silicon wafer (1) by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(5) depositing silicon nitride on the lower surface of the silicon wafer, uniformly coating photoresist on the lower surface of the silicon wafer (1), and photoetching a mechanical structure by using a No. 3 mask after curing;
(6) processing a three-dimensional photonic crystal structure on a silicon nitride structure by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(7) depositing silicon nitride on the upper surface of the silicon chip, uniformly coating photoresist on the upper surface of the silicon chip, and photoetching the three-dimensional photonic crystal structure by using a No. 4 mask after curing;
(8) processing a three-dimensional photonic crystal structure on a silicon nitride structure by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(9) taking a clean glass substrate, uniformly coating photoresist on the surface of the glass substrate, and photoetching the substrate structure by using a No. 5 mask;
(10) carrying out anodic bonding on the glass substrate in the step (9) and the lower surface of the silicon wafer (1) in the step (6);
(11) taking clean glass, uniformly coating photoresist on the surface of the glass, and photoetching a cap structure by using a No. 6 mask;
(12) and (3) carrying out anodic bonding on the glass substrate in the step (11) and the upper surface of the silicon wafer (1) in the step (4) to obtain the four-mass optical-electro-mechanical triaxial gyroscope based on the three-dimensional photonic crystal.

Claims (5)

1. A four-mass optical-electromechanical three-axis gyroscope based on three-dimensional photonic crystals is characterized in that: the device comprises a glass cap, a device layer and a glass substrate from top to bottom in sequence, wherein the glass cap and the glass substrate are bonded with the device layer through an anode;
the device layer comprises a supporting outer frame, a central mass block positioned in the center of the supporting outer frame, four public mass blocks respectively positioned in a 0-degree position, a 90-degree position, a 180-degree position and a 270-degree position of the whole structure, and driving beams for connecting the four public mass blocks with the supporting outer frame, wherein driving comb teeth are respectively arranged on the periphery of the central driving mass block and the upper parts and the lower parts of the four public mass blocks, the periphery of the four public mass blocks and the driving comb teeth are pulled through resonant beams, two sides of one side, close to the supporting outer frame, of the four public mass blocks are respectively connected with a Z-axis mechanical structure detection module comb tooth structure through the resonant beams, and the upper parts and the lower parts of the four public mass blocks are respectively covered with a three-dimensional photonic crystal structure layer;
the glass cap is positioned right above the device layer, and light guide holes are formed in the positions, corresponding to the three-dimensional photonic crystal structure layers of the public mass blocks of the device layer, of the glass cap and used for detecting light;
the glass substrate is located under the device layer, and light guide holes are formed in the positions, corresponding to the three-dimensional photonic crystal structure layers of the public mass blocks of the device layer, of the glass substrate and used for detecting light.
2. The four-mass opto-electro-mechanical triaxial gyroscope based on a three-dimensional photonic crystal according to claim 1, wherein: the outer side of each public mass block is connected with the mass block outer frame through a detection beam.
3. The method for measuring the angular velocity by using the four-mass optical-electromechanical three-axis gyroscope based on the three-dimensional photonic crystal is characterized by comprising the following steps of: the method comprises the following steps:
when the four-mass optical-electromechanical three-axis gyroscope of the three-dimensional photonic crystal is stabilized in a driving mode, the four public mass blocks are driven by the driving beam to perform 'push-pull' motion, so that the capacitance in the driving comb teeth is changed, the capacitance is converted into voltage through an external circuit, and the angular velocity can be conveniently measured at any time;
when the X axis receives the angular velocity, the public mass block at the 0-degree position and the 180-degree position performs up-and-down resonant motion along the surface, and the measurement of the X axis angular velocity is realized by detecting the change of light intensity at one side of the light through hole;
when the Y axis receives the angular velocity, the public mass blocks at the 90-degree position and the 270-degree position perform up-and-down resonant motion along the surface, and the measurement of the Y axis angular velocity is realized by detecting the change of light intensity at one side of the light through hole;
when the Z axis receives the angular velocity, the four public mass blocks perform resonant motion in the plane, so that the comb tooth structure of the eight Z axis mechanical structure detection modules changes, and the angular velocity of the Z axis is obtained through measurement.
4. The method of angular velocity measurement of a four-mass opto-electro-mechanical tri-axial gyroscope based on three-dimensional photonic crystals as claimed in claim 3, wherein: the specific algorithm of the magnitude of the angular velocity is as follows:
let the angular velocity of the X-axis be omegaxAngular velocity of Y-axis is ΩyThus, the respective coriolis forces experienced by the X and Y axes are:
Fcx=2m1Ωxx'+2m2Ωxx' (1)
Fcy=2m3Ωyy'+2m4Ωyy' (2)
wherein m is1Mass of a common mass block at 0 DEG, m1Mass of a common mass block located at 180 DEG, m3Mass of a common mass at 90 DEG, m4Is the mass of the common mass at 270 deg. 'is the first derivative of the x-direction vector, and y' is the first derivative of the y-direction vector;
according to the kinetic equation:
(m1+m3)x”+cxx'+kxx=Fcx (3)
(m2+m4)y”+cyy'+kyy=Fcy (4)
wherein, cxDamping coefficient, k, for the X-axisxElastic coefficient of X-axis, cyDamping coefficient, k, for the Y-axisyThe elastic coefficient of the Y axis is shown, x 'is the second derivative of the vector in the x direction, and Y' is the second derivative of the vector in the Y direction;
can be obtained from the equations (3) and (4)
Figure FDA0003106044400000021
Figure FDA0003106044400000022
Figure FDA0003106044400000023
Figure FDA0003106044400000024
Figure FDA0003106044400000025
Figure FDA0003106044400000026
Wherein B isxIs the amplitude of the X-axis and,
Figure FDA0003106044400000027
is the phase of the X axis, ByIs the amplitude of the Y-axis and,
Figure FDA0003106044400000028
is the phase of the Y axis, wxIs the vibration frequency of the X axis, wyIs the vibration frequency of the Y axis, wdXi X is the damping coefficient of the X axis, xi Y is the damping coefficient of the Y axis, t is the corresponding time, Ax is the coefficient of the X axis amplitude, Ay is the coefficient of the Y axis amplitude,
by simplification, the expression of the Coriolis force of the X axis and the Y axis can be obtained
Figure FDA0003106044400000031
Figure FDA0003106044400000032
Where Ω X is the angular velocity received on the X axis, Ω Y is the angular velocity received on the Y axis,
further, an expression of the acceleration of the Coriolis force can be obtained
Figure FDA0003106044400000033
Figure FDA0003106044400000034
By using the above formula and combining with the internal structure of the gyroscope, the relational expression of Coriolis acceleration, input angular velocity and transmittance is obtained:
Figure FDA0003106044400000035
Figure FDA0003106044400000036
Figure FDA0003106044400000037
Figure FDA0003106044400000038
wherein T is the transmittance, b0Is a node, E is the Young's modulus of the material, bxWidth of the X-axis resonance beam, byWidth of the Y-axis resonance beam, hxIs the height h of the X-axis resonant beamyIs the height of the Y-axis resonance beam, and rho is the mesoscopic press polish coefficient and is LxLength of the X-axis resonant beam, LyThe length of the Y-axis resonance beam;
because the transmissivity and the angular velocity have a certain proportional relation, the magnitude of the input angular velocity can be obtained through the change of the transmissivity by substituting each parameter through the designed gyroscope.
5. The method for processing the four-mass optical-electromechanical three-axis gyroscope based on the three-dimensional photonic crystal as claimed in any one of claims 1 to 2, wherein the method comprises the following steps:
(1) cleaning a silicon wafer, drying, uniformly coating photoresist on the upper surface of the silicon wafer, and photoetching an anchor point position by using a No. 1 mask after curing;
(2) processing anchor points on the upper surface of the silicon wafer (1) by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(3) cleaning the silicon wafer (1), drying, uniformly coating photoresist on the lower surface of the silicon wafer (1), and photoetching a mechanical structure by using a No. 2 mask after curing;
(4) processing a mechanical structure on the lower surface of the silicon wafer (1) by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(5) depositing silicon nitride on the lower surface of the silicon wafer, uniformly coating photoresist on the lower surface of the silicon wafer (1), and photoetching a mechanical structure by using a No. 3 mask after curing;
(6) processing a three-dimensional photonic crystal structure on a silicon nitride structure by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(7) depositing silicon nitride on the upper surface of the silicon chip, uniformly coating photoresist on the upper surface of the silicon chip, and photoetching the three-dimensional photonic crystal structure by using a No. 4 mask after curing;
(8) processing a three-dimensional photonic crystal structure on a silicon nitride structure by Reactive Ion Etching (RIE), and washing off residual photoresist by using an acetone solution for development;
(9) taking a clean glass substrate, uniformly coating photoresist on the surface of the glass substrate, and photoetching the substrate structure by using a No. 5 mask;
(10) carrying out anodic bonding on the glass substrate in the step (9) and the lower surface of the silicon wafer (1) in the step (6);
(11) taking clean glass, uniformly coating photoresist on the surface of the glass, and photoetching a cap structure by using a No. 6 mask;
(12) and (3) carrying out anodic bonding on the glass substrate in the step (11) and the upper surface of the silicon wafer (1) in the step (4) to obtain the four-mass optical-electro-mechanical triaxial gyroscope based on the three-dimensional photonic crystal.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114459450A (en) * 2022-02-21 2022-05-10 东南大学 Novel MOEMS gyroscope based on electrostatic driving and processing method thereof
CN116907463A (en) * 2023-09-08 2023-10-20 华芯拓远(天津)科技有限公司 High-precision full-decoupling triaxial MEMS gyroscope

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202793402U (en) * 2012-07-19 2013-03-13 水木智芯科技(北京)有限公司 Full-decoupling capacitive uniaxial micromechanical gyroscope with four mass blocks
DE102016208926A1 (en) * 2016-05-24 2017-11-30 Robert Bosch Gmbh MOEMS device and corresponding manufacturing method
CN108716914A (en) * 2018-05-29 2018-10-30 东南大学 A kind of MOEMS gyroscopes and its processing method based on nanometer grating
CN110308306A (en) * 2019-06-28 2019-10-08 东南大学 A kind of MOEMS accelerometer and its processing method based on fully differential 2 D photon crystal cavity body structure
CN110342453A (en) * 2019-06-20 2019-10-18 东南大学 A kind of micro-electro-mechanical gyroscope and its processing packaging method based on double grating detection
CN110631568A (en) * 2019-09-10 2019-12-31 东南大学 Novel MOEMS (metal oxide semiconductor energy management system) double-shaft gyroscope based on two-dimensional photonic crystal cavity structure and processing method thereof
CN111623762A (en) * 2020-05-25 2020-09-04 东南大学 Annular array type four-mass coupling six-axis micro-inertial sensor and processing method thereof
CN112747731A (en) * 2020-12-28 2021-05-04 北京航空航天大学 Five-mass-block double-axis detection silicon micro-resonant gyroscope based on out-of-plane vibration

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202793402U (en) * 2012-07-19 2013-03-13 水木智芯科技(北京)有限公司 Full-decoupling capacitive uniaxial micromechanical gyroscope with four mass blocks
DE102016208926A1 (en) * 2016-05-24 2017-11-30 Robert Bosch Gmbh MOEMS device and corresponding manufacturing method
CN108716914A (en) * 2018-05-29 2018-10-30 东南大学 A kind of MOEMS gyroscopes and its processing method based on nanometer grating
CN110342453A (en) * 2019-06-20 2019-10-18 东南大学 A kind of micro-electro-mechanical gyroscope and its processing packaging method based on double grating detection
CN110308306A (en) * 2019-06-28 2019-10-08 东南大学 A kind of MOEMS accelerometer and its processing method based on fully differential 2 D photon crystal cavity body structure
CN110631568A (en) * 2019-09-10 2019-12-31 东南大学 Novel MOEMS (metal oxide semiconductor energy management system) double-shaft gyroscope based on two-dimensional photonic crystal cavity structure and processing method thereof
CN111623762A (en) * 2020-05-25 2020-09-04 东南大学 Annular array type four-mass coupling six-axis micro-inertial sensor and processing method thereof
CN112747731A (en) * 2020-12-28 2021-05-04 北京航空航天大学 Five-mass-block double-axis detection silicon micro-resonant gyroscope based on out-of-plane vibration

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114459450A (en) * 2022-02-21 2022-05-10 东南大学 Novel MOEMS gyroscope based on electrostatic driving and processing method thereof
CN114459450B (en) * 2022-02-21 2024-02-23 东南大学 Novel MOEMS gyroscope based on electrostatic drive and processing method thereof
CN116907463A (en) * 2023-09-08 2023-10-20 华芯拓远(天津)科技有限公司 High-precision full-decoupling triaxial MEMS gyroscope
CN116907463B (en) * 2023-09-08 2023-12-15 华芯拓远(天津)科技有限公司 High-precision full-decoupling triaxial MEMS gyroscope

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