CN112639450B - 包装体的制造装置及包装体的制造方法 - Google Patents
包装体的制造装置及包装体的制造方法 Download PDFInfo
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Abstract
提供可更加正确地检查密封状态的包装体的制造装置等。在规定的工件通过树脂制的片体(3)包装的状态,通过对已重叠的片体(3)热熔接,形成密封部分(6)。热熔接以密封部分(6)的厚度小于构成热熔接对象的已重叠的片体(3)的热熔接前的总厚度的方式进行。在密封部分(6)的检查中,获得与密封部分(6)的厚度相对应的厚度信息,根据已获得的厚度信息,判定密封部分(6)的密封状态是否良好。由于以密封部分(6)的厚度与密封状态的是否良好相关的方式进行热熔接,故可通过进行基于厚度信息的是否良好的判断,更加正确地判断密封状态的是否良好。
Description
技术领域
本发明涉及用于获得包装体的制造装置及制造方法,该包装体以规定的工件通过规定的片体包装而得到。
背景技术
比如,在利用通过聚乙烯等的树脂构成的片体而包装规定的工件(例如,日用品、食品、机械部件等)的基础上,通过对上述片体进行热熔接,可获得通过上述片体包装上述工件而得到的包装体。包装体可以通过具有对片体进行热熔接的密封手段等的包装装置(包装体的制造装置)而制造。
然而,在通过热熔接而形成的密封部分,具有产生片体彼此未充分地熔接等的密封不良的情况。在现有技术中,作为用于这样的检查密封缺陷的检查装置,已知有一种装置,其包括:激光光源,其用激光束而照射密封部分;光检测器,其检测透过密封部分的光量;遮光板,其设置在密封部分和光检测器之间,形成有可使激光束通过的孔(例如,参见专利文献1等)。
在于专利文献1中记载的检查装置中,根据由光检测器检测出的光量,判定密封部分的密封状态是否良好。更具体地说,当密封状态良好时,构成密封部分的多个片体处于紧密接触状态,因此,照射的激光束几乎直接通过密封部分。于是,在通过遮光板的上述孔而入射到光检测器的光的光量较大的场合,判定密封状态良好。另一方面,在密封状态不好的场合,由于在构成密封部分的多个片体之间存在间隙,故当激光束从片体射出或进入片体时,激光束的照射光发生反射、折射和散射,其结果是,处于通过密封部分的光在很宽的范围内发生散射的状态。因此,在通过遮光板的上述孔入射到光检测器的光的光量比较小的场合,判定密封状态不良。
专利文献
专利文献1:JP特开昭62-276444号公报
发明内容
发明要解决的课题
但是,在上述检查装置中,在片体之间未形成用于产生折射和散射等的足够的间隙的场合,向光检测器入射的光的光量变得比较大。因此,例如,如果片体彼此接触但是没有充分地熔接,则具有光量相对较大,将本来应该判断为缺陷的密封状态判断为良好的担心。
本发明是鉴于上述情况而作出的,本发明的目的在于,提供一种可更正确地检查密封状态是否良好的包装体的制造装置和包装体的制造方法。
用于解决课题的技术方案
以下,分项说明适于解决上述目的的各技术方案。另外,根据需要,在相应的方案中,附记特有的作用效果。
技术方案1.涉及一种包装体的制造装置,该包装体以规定的工件通过树脂制的片体包装而得到,其特征在于,该包装体的制造装置包括:
密封手段,该密封手段将已重叠的上述片体热熔接;
检查手段,该检查手段对上述片体中的通过上述密封手段而热熔接的密封部分,进行密封状态是否良好的检查;
上述密封手段按照下述的方式构成,该方式为:以上述密封部分的厚度小于构成热熔接的对象的已重叠的上述片体的热熔接前的总厚度的方式进行热熔接;
上述检查手段包括:
厚度信息获得手段,该厚度信息获得手段用于获得与上述密封部分的厚度相对应的厚度信息;
是否良好判断手段,该是否良好判断手段根据通过该厚度信息获得手段获得的厚度信息,判定上述密封部分的密封状态是否良好。
另外,“厚度信息”可以是厚度本身,也可以是根据厚度的增减而变化的各种信息。
按照上述技术方案1,密封手段以密封部分的厚度小于对应于该密封部分的热熔接前的片体的总厚度的方式进行热熔接。因此,适当地熔接而密封状态良好的密封部分的厚度小于上述总厚度。另一方面,未充分地熔接而密封状态不良的密封部分的厚度与上述总厚度相同或在其以上(例如,片体间存在间隙的情况)。这样,密封手段以处于密封部分的厚度与密封状态的是否良好相关的状态的方式进行热熔接。
然后,在检查手段中,通过厚度信息获得手段而获得与密封部分的厚度相对应的厚度信息,并通过是否良好判断手段,基于该厚度信息而判断密封状态的是否良好。例如,在构成密封部分的片体之间不存在间隙等,并且片体充分地熔接的场合,密封部分比较薄,因此,是否良好否判断手段判定密封状态良好。另一方面,比如,在构成密封部分的片体之间存在间隙等,或片体之间未充分地熔接的场合,由于密封部分较厚,故是否良好判断手段判断密封状态不良。像上述那样,由于密封部分的厚度与密封状态的是否良好相关,故通过根据厚度信息而进行是否良好的判定,可更正确地判定密封状态的是否良好。
另外,密封手段也可以密封部分的厚度小于构成热熔接对象的已重叠的片体的热熔接前的总厚度小,且大于规定的极限厚度的方式进行热熔接。在该场合,是否良好判断手段也可以按照在密封部分过薄时,判定为不良的方式构成。通过像这样构成,例如,可检测出密封部分的破损所导致的密封不良等,可进一步提高检查精度。
技术方案2涉及技术方案1所述的包装体的制造装置,其特征在于,上述厚度信息获得手段包括:
照射手段,该照射手段对上述片体照射紫外光;
摄像手段,该摄像手段在通过上述照射手段对包含上述密封部分的上述片体照射了紫外光的状态下,对透过了上述片体的紫外光进行摄像;
同时,上述厚度信息获得手段按照下述的方式构成,该方式为:获得作为上述厚度信息且与基于通过上述摄像手段获得的图像数据的上述密封部分的透射光量相关的信息;
上述是否良好判断手段根据与上述透射光量相关的信息,判断上述密封部分的密封状态的是否良好。
按照上述技术方案2,作为厚度信息,获得与基于通过上述摄像手段获得的图像数据的上述密封部分的透射光量相关的信息(例如,图像数据中的密封部分的亮度值等)。在这里,通常,当对片体照射紫外光时,紫外光透过率的对数值与片体的厚度成比例,并且紫外光透过率与片体的厚度的若干次幂成反比。即,透过片体的紫外光的光量(透过光量)的大小取决于片体的厚度。因此,通过获得与透射光量相关的信息作为厚度信息,可更准确地掌握片体的厚度。由此,可更准确地判定密封状态的是否良好。
另外,通过使用图像数据,可掌握密封部分的整个区域的厚度。因此,可以发现密封部分的极小部分产生的密封不良,可以进一步提高检查精度。
技术方案3.涉及一种包装体的制造方法,该包装体以规定的工件通过树脂制的片体包装而得到,其特征在于,该包装体的制造方法包括:
将已重叠的上述片体热熔接的密封步骤;
检查步骤,在该检查步骤中,对上述片体中的通过上述密封步骤而热熔接的密封部分,进行密封状态是否良好的检查;
在上述密封步骤中,以上述密封部分的厚度小于构成热熔接对对象的已重叠的上述片体的热熔接前的总厚度的方式进行热熔接;
在上述检查步骤中进行如下操作:
厚度信息获得步骤,该厚度信息获得步骤用于获得与上述密封部分的厚度相对应的厚度信息;
是否良好判断步骤,在该是否良好判断步骤中,根据通过该厚度信息获得步骤获得的厚度信息,判定上述密封部分的密封状态是否良好。
按照上述技术方案3,实现与上述技术方案1同样的作用效果。
技术方案4.涉及根据技术方案3所述的包装体的制造方法,其特征在于,上述厚度信息获得步骤中进行如下操作,
进行摄像步骤,在该摄像步骤中,在对包含上述密封部分的上述片体照射了紫外光的状态下,对透过了上述片体的紫外光进行摄像;
获得作为上述厚度信息且与基于通过上述摄像步骤获得的图像数据的上述密封部分的透射光量相关的信息,
在上述是否良好判断步骤中,根据与上述透射光量相关的信息,判断上述密封部分的密封状态的是否良好。
按照上述技术方案4,实现与上述技术方案2同样的作用效果。
附图说明
图1为表示包装体的立体图;
图2为表示位于包装体的上部的片体的放大图;
图3为表示包装装置的概略结构的方框图;
图4为表示包装机构的概略结构的方框图;
图5为表示检查装置的电气结构的方框图;
图6为表示检查装置的概略结构的示意图;
图7为表示图像数据的一个例子的示意图;
图8为表示包装步骤的流程图。
具体实施方式
下面参照附图而对一实施方式进行说明。首先,对通过包装装置制造的包装体1进行说明。
像图1及图2所示的那样,包装体1具有用于包装多个工件8(在本实施方式中为卷筒纸)的包装袋2。包装袋2通过将筒状的片体3的两端部热熔接而形成,在其上部和下部处具有熔接部4、5。片体3由透明或半透明的热塑性树脂(例如聚乙烯等)形成。
另外,熔接部4、5具有密封部分6。密封部分6通过将构成包装袋2的前面、背面及两侧面的各片体3中的至少两片体在重叠的状态下进行热熔接而形成。
而且,在位于包装袋2上部的熔接部4处,设有多个密封部分6,并且分别从正面看呈矩形,而且,在上下左右具有规则性地形成。在本实施方式中,熔接部4中的各密封部分6构成沿左右方向排列的2个左右方向密封列和沿上下方向排列的5个上下方向密封列,上下方向密封列以沿左右方向隔开间隔的状态配置在左右方向密封列之间。另外,熔接部4的各密封部分6处于相互分离的状态,其结果是,包装袋2的上端部可通气。
此外,在包装袋2的上部,在位于中央处的上述上下方向密封列的左右,设有用于使用者勾挂手指的一对搭指部7。在各搭指部7上形成有大致长圆形状的切缝,当使用者在该切缝处切断片体3时,在包装袋2的上部形成贯通孔。使用者可以将手指插入该贯通孔来搬运工件8。
另一方面,在位于包装袋2下部的熔接部5,密封部分6呈沿左右方向连续延伸的直线状。
接着,对用于制造上述包装体1的包装装置10的概略结构进行说明。像图3所示的那样,包装装置10具有包装机构20和检查装置30。在本实施方式中,包装装置10构成包装体的制造装置,检查装置30构成检查手段。
像图4所示的那样,包装机构20包括片体供给机构21、制袋机构22、填充机构23和密封机构24。在本实施方式中,制袋机构22和密封机构24分别相当于密封手段。
片体供给机构21可旋转地支承预先呈筒状的卷绕有片体3的片体卷料。片体供给机构21在利用压缩空气等的方式而使筒状的片体3膨胀的基础上,使筒状的片体3中的相对置的两个部位成为折入该片体3的内侧的状态,进而,利用一对辊(在图中没有示出)而将该片体3一边夹持一边送出。由此,片体3以在宽度方向两端部具有角撑板的带状的方式形成。将带状的片体3供给制袋机构22。
制袋机构22将从片体供给机构21供给的带状片体3的前端部热熔接,并且将该片体3切断为规定长度。由此,形成位于包装袋2下部的熔接部5(密封部分6),片体3呈袋状。另外,上述规定长度可根据收纳于包装袋2的工件8的数量或工件8的尺寸而适当变更。
填充机构23具有在使规定个数的工件8以排列的状态填充到由制袋机构22制造的袋状的片体3上的功能。填充机构23例如由以倒立状态集聚预定个数的工件8的集聚机构、以开口状态保持袋状的座位3的料斗、以及将倒立状态的工件8压入由该料斗以开口状态保持的袋状的座位3的推动器(分别未图示)等构成。
密封机构24将包装了工件8的(填充有工件8的)袋状的片体3的开口部角撑板折叠,在使片体3成为重叠的状态的基础上,通过规定的密封器(未图示)将重叠的片体3夹入,由此进行热熔接。通过密封机构24形成位于包装袋2的上部的熔接部4(密封部分6)。
另外,在本实施方式中,制袋机构22和密封机构24按照下述的方式进行动作设定,该方式为:以使形成的密封部分6的厚度小于作为热熔接对象的已重叠的片体3在热熔接前的总厚度的方式进行热熔接。因此,适当熔接而密封状态良好的密封部分6的厚度与上述总厚度相比足够小。另一方面,未充分熔接而密封状态不良的密封部分6的厚度与上述总厚度为相同程度或其以上(例如,在片体3间存在间隙的情况)。制袋机构22和密封机构24按照密封部分6的厚度与密封状态的是否良好相关的方式进行热焊接。
在由密封机构24进行热熔接后,通过规定的无用部切断装置(在图中未示出)而将片体3的多余部分切断,并且通过规定的切缝形成装置(未图示)而形成搭指部7,从而得到包装体1。另外,也可按照在通过密封机构24而进行热熔接时进行搭指部7的形成的方式形成。
接着,对检查装置30进行说明。检查装置30检查密封部分6的密封状态是否良好,该密封部分6是通过制袋机构22和密封机构24在片体3中热熔接而得到的。
像图5和图6所示的那样,检查装置30具有厚度信息获得部40和处理执行装置50。在本实施方式中,厚度信息获得部40相当于厚度信息获得手段,处理执行装置50相当于是否良好判断手段。
厚度信息获得部40用于获得与密封部分6的厚度相对应的厚度信息,其包括照明装置41和摄像装置42。在本实施方式中,照明装置41相当于照射手段,摄像装置42相当于摄像手段。
照明装置41配置在包含成为检查对象的密封部分6的片体3的下方,具有通过可照射紫外光(例如,波长200~380nm的光)的LED等构成的光源41A、和介于光源41A及片体3之间的例如由毛玻璃等构成的扩散板41B。通过照明装置41,可向包含密封部分6的片体3照射扩散的紫外光。
摄像装置42隔着片体3设置在照明装置41的相反侧。在本实施方式中,作为摄像装置42,采用至少对紫外光具有灵敏度的CCD照相机。当然,不限于此,也可以采用CMOS照相机。
当从照明装置41发射的紫外光照射包括密封部分6的片体3时,摄像装置42对透过片体3的紫外光进行二维成像。通过摄像装置42拍摄到的图像数据(亮度图像数据)在摄像装置42内部,转换成数字信号(图像信号),然后以数字信号的形式输入到处理执行装置50中。在图像数据中,作为上述厚度信息,包含与密封部分6的透射光量的相关信息(在本实施方式中,为密封部分6的亮度值)。另外,将摄像装置42的摄像范围设定为至少可收纳熔接部4、5的整个区域的范围。另外,在本实施方式中,摄像装置42分别摄像熔接部4和熔接部5,作为图像数据,分别获得与熔接部4有关的图像数据和与熔接部5有关的图像数据。
处理执行装置50根据通过摄像装置42而得到的图像数据(更具体地说,根据从该图像数据而获得的作为上述厚度信息的与密封部分6的透射光量相关的信息),判定密封部分6是否良好。处理执行装置50构成所谓的计算机系统,该计算机系统具有作为运算手段的CPU、存储各种程序的ROM、暂时存储运算数据和输入输出数据等各种数据的RAM等。处理执行装置50具有图像存储器51、检查结果存储装置52、判定用存储器53、图像、检查条件存储装置54、照相时刻控制装置55以及CPU与输入输出接口56。
图像存储器51存储通过摄像装置42得到的图像数据。根据存储在该图像存储器51中的图像数据进行检查。当然,在执行检查时,也可以对图像数据进行加工处理。例如,可以考虑进行诸如掩蔽处理或阴影校正等的处理。由于用来自照明装置41的光均匀地照射整个摄像范围在技术上是有限的,因此阴影校正用于校正由于位置的差异而产生的光的亮度的变化。另外,通过对图像数据进行二值化处理而得到的二值化图像数据、通过进行屏蔽处理而得到的屏蔽图像数据等也存储在图像存储器51中。
检查结果存储装置52存储是否良好的判断结果的数据、对该数据进行概率统计处理的统计数据等。
判定用存储器53用于存储检查所使用的各种信息。在各种信息中,包括用于判断是否良好的判断基准(阈值等)、用于划定检查对象范围的数据(比如,用于指定图像数据中的片体3所占的区域的信息等)。在本实施方式中,存储有亮度阈值、面积基准值等作为上述判定基准。亮度阈值是在对图像数据进行二值化处理时使用的值,面积基准值是在进行密封状态的是否良好的判断时使用的值。在本实施方式中,作为亮度阈值和面积基准值,分别存储预先计算出的适当的数值。
图像、检查条件存储装置54例如由硬盘装置等构成,存储不良判定的日期时间、检查所使用的检查条件等。
照相时刻控制器55控制摄像装置42的摄像时刻。该摄像时刻根据设置在包装装置10上且可检测包装体1的传感器(未图示)的信号而进行控制,每当包装体1被设置在规定的检查位置时,通过摄像装置42而进行摄像。
CPU与输入输出接口56负责检查装置30中的各种控制。CPU与输入输出接口56可在与包装装置10的构成装置之间收发信号。CPU与输入输出接口56还具有将各种数据发送至诸如显示器的预定显示手段(未示出)的功能。通过该功能,可将各种图像、检查结果等显示在上述显示手段上。
此外,处理执行装置50基于由摄像装置42获得的图像数据,一边使用判断存储器53的存储内容等,一边进行关于密封状态的是否良好的判断。更具体地说,处理执行装置50首先设定所得到的图像数据中的检查对象范围。例如,通过对已获得的图像数据,进行规定的掩蔽处理,将图像数据中的片体3所占的区域设定为检查对象范围。另外,也可将片体3所占的区域中的除搭指部7以外的区域设定为检查对象范围。
接着,处理执行装置50使用存储在判定用存储器53中的所述亮度阈值,对图像数据实施二值化处理,由此得到用“0(暗)”或“1(亮)”来表示各像素的亮度的二值化图像数据。
在此,如上所述,制袋机构22和密封机构24以密封部分6的厚度小于与该密封部分6对应的热熔接前的片体3的总厚度的方式进行热熔接。因此,适当熔接而密封状态良好的密封部分6的厚度小于上述总厚度,像图7(图7中表示熔接部4的密封部分6等)所示的那样,在图像数据中,该密封部分6的透过光量(亮度值)较大。另一方面,未充分熔接而密封状态不良的密封部分6(以下称为“不良密封部分6X”)的厚度与上述总厚度相同或在其以上。因此,在图像数据中,不良密封部分6X的透射光量(亮度值)变得比较小(参照图7)。像这样,由于密封状态良好的密封部分6和不良密封部分6X的透射光量不同,故在得到的二值化图像数据中,与密封状态良好的密封部分6对应的像素的亮度为“1(亮)”,与不良密封部分6X对应的像素的亮度为“0(暗)”。
接着,处理执行装置50以所设定的检查对象范围为对象而进行块处理。在块处理中,进行指定二值化图像数据中的“1(亮)”的像素(即与密封状态良好的密封部分6对应的像素)的连结成分的处理,并且计算已指定的连结成分(块部分)的面积(在本实施方式中为像素数)。然后,根据块部分的面积和存储在判定用存储器53中的上述面积基准值,判定密封部分6中的密封状态良好的部位的面积是否充分。在本实施方式中,在各块部分的面积大于上述面积基准值的场合,判定为各密封部分6的密封状态良好,在并非如此的场合,判定至少一个密封部分6的密封状态不良。
另外,关于是否良好的判定方法,可以根据各种条件适当变更。例如,也可以在密封状态良好的密封部分6的数量为预先设定的基准数以上时判定为良好,否则判定为不良。另外,也可以在基于面积的判定处理的基础上或者代替基于面积的判定处理,进行基于连结成分的形状的判定处理。
下面参照图8的流程图,对包括片体3的密封步骤、密封部分6的检查步骤等的包装步骤(包装方法)进行描述。
首先,在步骤S1的片体供给步骤中,通过片体供给机构21而将片体3制成在宽度方向两端部形成有角撑板的带状,并且将该带状的片体3向制袋机构22供给。
接着,在步骤S2的制袋步骤中,通过制袋机构22,通过对从片体供给机构21供给的带状片体3的前端部进行热熔接而形成熔接部5,并且将片体3切断成规定长度而形成袋状。如果正常地形成熔接部5的密封部分6,则该密封部分6的厚度与对应于该密封部分6的热熔接前的片体3的总厚度相比足够小。之后,在步骤S3的填充步骤中,通过填充机构23而在袋状的片体3中收容预定个数的工件8。
接着,在步骤S4的密封步骤中,通过密封机构24,将收容有工件8的袋状的片体3的开口部折成角撑板,然后通过热熔接而形成熔接部4。如果正常地形成了熔接部4的密封部分6,则该密封部分6的厚度与对应于该密封部分6的热熔接前的片体3的总厚度相比足够小。在密封步骤S4之后,通过切断片体3中的多余部分,并且形成搭指部7,从而得到包装体1。在本实施方式中,制袋步骤S2和密封步骤S4分别相当于密封步骤。
然后,以已得到的包装体1为对象,进行步骤S5的检查步骤。检查步骤S5包括步骤S51的厚度信息获得步骤以及步骤S52的是否良好判断步骤。
在步骤S51的厚度信息获得步骤中,一边进行步骤S511的照射步骤,一边进行步骤S512的摄像步骤。即,在从照明装置41向包装体1中的包含密封部分6的片体3照射了扩散的紫外光的状态下,通过摄像装置42对透过片体3的紫外光进行摄像。由此,获得包含作为厚度信息的与密封部分6的透射光量相关的信息(密封部分6的亮度值)的图像数据。在本实施方式中,作为图像数据,分别获得与熔接部4有关的图像数据和与熔接部5有关的图像数据。
然后,在步骤S52的是否良好判断步骤中,基于已获得的图像数据来判定密封部分6的是否良好,从而完成包装步骤。在是否良好判断步骤中,分别检查熔接部4、5的各密封部分6。
像上面具体描述的那样,按照本实施方式,通过厚度信息获得部40而获得与密封部分6的厚度相对应的厚度信息,并且通过处理执行装置50根据所述厚度信息,判断密封状态是否良好。像上述那样,制袋机构22和密封机构24以密封部分6的厚度与密封状态的是否良好相关的方式进行热焊接,从而通过基于厚度信息而进行是否良好的判断,可以更精确地判定密封状态的是否良好。
另外,作为厚度信息,获得与基于由摄像装置42而得到的图像数据的密封部分6的透射光量的相关信息。在此,通常,在对片体3照射紫外光时,紫外光透过率的对数值与片体3的厚度成正比,紫外光透过率与片体3的厚度的多少次方成反比。即,透过了膜3的紫外光的光量(透过光量)的大小取决于片体3的厚度。因此,通过获得与透射光量相关的信息作为厚度信息,可更准确地掌握片体3的厚度。由此,可更准确地判定密封状态的是否良好。
进而,通过使用图像数据,可掌握密封部分6的整个区域的厚度。因此,可发现密封部分6的极小部分产生的密封不良,可进一步提高检查精度。
另外,并不限于上述实施方式的记载内容,例如也可以如下实施。当然,也可以是在下面没有列举的其他应用例、变更例。
(a)在上述实施方式中,以获得作为厚度信息且与密封部分6的透射光量相关的信息的方式构成。与此相对,作为厚度信息,也可以获得密封部分6的厚度本身。密封部分6的厚度例如可以通过夹入密封部分6来测定,也可以利用超声波等来测定。
(b)在上述实施方式中,制袋机构22和密封机构24以密封部分6的厚度小于作为热熔接对象的重叠的片体3的热熔接前的总厚度的方式进行热熔接。与此相对,也可按照密封部分6的厚度小于上述总厚度,且大于规定的极限厚度的方式进行热熔接,以此构成制袋机构22和密封机构24。在该场合,处理执行装置50也可按照下述的方式构成,该方式为:将使用比上述亮度阈值大的值,即第二亮度阈值对图像数据实施二值化处理,并基于得到的二值化图像数据,判定是否存在过薄的密封部分6的方式构成。通过这样的结构,可检测出例如密封部分6的破损所导致的密封不良等,可进一步提高检查精度。
(c)在上述实施方式中,作为工件8,列举了卷筒纸,但工件并不限定于此。例如,工件可以是食品、机械部件、电子器件等的各种物品。另外,工件可以是半固体或液体,也可以是粉末状。
(d)包装体中的密封部分的形状、面积、数量、位置、密封部分彼此的配置位置关系等没有特别限定。因此,例如,密封部分也可以呈弯曲状而连续地形成。另外,密封部分也可以是用于通过包装袋密封工件的部分。
(e)在上述实施方式中,作为片体3的构成材料,列举了聚乙烯,但也可以通过聚乙烯以外的热塑性树脂来构成片体3。
(f)在上述实施方式中,在将工件8收容到袋状的工件3中之后,进行关于密封部分6的密封状态是否良好的检查,但也可以在将工件8收容到袋状的片体3中之前,进行关于密封部分6的密封状态是否良好的检查。
另外,在上述实施方式中,以熔接部4、5中的各密封部分6作为检查对象,但也可以仅以各密封部分6中的一者作为检查对象。
(g)在上述实施方式中,使用预先形成为筒状的片体3,但也可以使用非筒状的一张片体,进行伴随中心密封的所谓枕式包装。
标号的说明:
标号3表示片体;
标号6表示密封部分;
标号8表示工件;
标号10表示包装装置(包装体的制造装置);
标号22表示制袋机构(密封手段);
标号24表示密封机构(密封手段);
标号30表示检查装置(检查手段)
标号40表示厚度信息获得部(厚度信息获得手段)
标号41表示照明装置(照射手段);
标号42表示摄像装置(摄像手段);
标号50表示处理执行装置(是否良好判断手段)。
Claims (2)
1.一种包装体的制造装置,该包装体以规定的工件通过树脂制的片体包装而得到,其特征在于,该包装体的制造装置包括:
密封手段,该密封手段将已重叠的上述片体热熔接;
检查手段,该检查手段对上述片体中的通过上述密封手段而热熔接的密封部分,进行密封状态是否良好的检查;
上述密封手段按照下述的方式构成,该方式为:以上述密封部分的厚度小于构成热熔接对象的已重叠的上述片体的热熔接前的总厚度的方式进行热熔接;
上述检查手段包括:
厚度信息获得手段,该厚度信息获得手段用于获得与上述密封部分的厚度相对应的厚度信息;
是否良好判断手段,该是否良好判断手段根据通过该厚度信息获得手段获得的厚度信息,判定上述密封部分的密封状态是否良好,
上述厚度信息获得手段包括:
照射手段,该照射手段对上述片体照射紫外光;
摄像手段,该摄像手段在通过上述照射手段对包含上述密封部分的上述片体照射了紫外光的状态下,对透过了上述片体的紫外光进行摄像;
同时,上述厚度信息获得手段按照下述的方式构成,该方式为:获得作为上述厚度信息且与基于通过上述摄像手段获得的图像数据的上述密封部分的透射光量相关的信息;
上述是否良好判断手段根据与上述透射光量相关的信息,判断上述密封部分的密封状态的是否良好,此时,良好的密封部分的透射光量至少比已重叠的上述片体的非密封部分大。
2.一种包装体的制造方法,该包装体以规定的工件通过树脂制的片体包装而得到,其特征在于,该包装体的制造方法包括:
将已重叠的上述片体热熔接的密封步骤;
检查步骤,在该检查步骤中,对上述片体中的通过上述密封步骤热熔接而得到的密封部分,进行密封状态是否良好的检查;
在上述密封步骤中,以上述密封部分的厚度小于构成热熔接的对象的已重叠的上述片体的热熔接前的总厚度的方式进行热熔接;
在上述检查步骤中进行如下操作:
厚度信息获得步骤,该厚度信息获得步骤用于获得与上述密封部分的厚度相对应的厚度信息;
是否良好判断步骤,在该是否良好判断步骤中,根据通过该厚度信息获得步骤获得的厚度信息,判定上述密封部分的密封状态是否良好,
在上述厚度信息获得步骤中进行如下操作,
进行摄像步骤,在该摄像步骤中,在对包含上述密封部分的上述片体照射了紫外光的状态下,对透过了上述片体的紫外光进行摄像;
获得作为上述厚度信息且与基于通过上述摄像步骤获得的图像数据的上述密封部分的透射光量相关的信息,
在上述是否良好判断步骤中,根据与上述透射光量相关的信息,判断上述密封部分的密封状态的是否良好,此时,良好的密封部分的透射光量至少比已重叠的上述片体的非密封部分大。
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JP2016176813A (ja) * | 2015-03-20 | 2016-10-06 | 株式会社イシダ | 検査装置及び検査方法 |
US10046874B2 (en) * | 2015-11-30 | 2018-08-14 | Sonics & Materials, Inc. | Sealing system and method for gusseted and zippered bags |
FR3055409B1 (fr) * | 2016-08-26 | 2020-06-12 | Pierre Fabre Dermo-Cosmetique | Procede et dispositif pour le controle en continu de l’etancheite d’une soudure a l’extremite d’un tube contenant un produit |
JP6616339B2 (ja) * | 2017-01-13 | 2019-12-04 | Ckd株式会社 | 検査装置及び巻回装置 |
WO2019241578A1 (en) * | 2018-06-13 | 2019-12-19 | Dukane Ias, Llc | Methods for determining a melt layer thickness associated with a predetermined weld strength based on a correlation therebetween |
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2018
- 2018-09-27 JP JP2018181603A patent/JP6679686B2/ja active Active
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2019
- 2019-07-29 EP EP19867217.2A patent/EP3859319A4/en active Pending
- 2019-07-29 WO PCT/JP2019/029698 patent/WO2020066274A1/ja unknown
- 2019-07-29 CN CN201980056224.5A patent/CN112639450B/zh active Active
- 2019-07-29 KR KR1020217012264A patent/KR102594612B1/ko active IP Right Grant
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JPH02297007A (ja) * | 1989-05-11 | 1990-12-07 | Musashino Kikai Sekkei Jimusho:Kk | 被験体の厚さ測定方法 |
JPH06345062A (ja) * | 1993-06-14 | 1994-12-20 | Nakano Vinegar Co Ltd | レトルトパウチ包装材のシール不良検出方法及び装置 |
WO2016088713A1 (ja) * | 2014-12-01 | 2016-06-09 | 大森機械工業 株式会社 | チューブ容器検査装置 |
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EP3859319A1 (en) | 2021-08-04 |
EP3859319A4 (en) | 2022-07-13 |
WO2020066274A1 (ja) | 2020-04-02 |
JP6679686B2 (ja) | 2020-04-15 |
KR20210065988A (ko) | 2021-06-04 |
JP2020051899A (ja) | 2020-04-02 |
KR102594612B1 (ko) | 2023-10-25 |
US11660825B2 (en) | 2023-05-30 |
CN112639450A (zh) | 2021-04-09 |
US20210154946A1 (en) | 2021-05-27 |
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