Schneider et al., 1998 - Google Patents

Local electronic structure at steps on Au (111) investigated by the thermovoltage in scanning tunneling microscopy.

Schneider et al., 1998

Document ID
6321709919890547541
Author
Schneider A
Wenderoth M
Engel K
Rosentreter M
Heinrich A
Ulbrich R
Publication year
Publication venue
Applied Physics A: Materials Science & Processing

External Links

Snippet

Abstract. We present a study of the local electronic structure at steps on Au (111) through the method of mapping the thermovoltage of a scanning tunneling microscope. This spectroscopy mode exploits the thermoelectric properties of the vacuum tunneling contact …
Continue reading at search.ebscohost.com (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/30—Scanning potential microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/038—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating magnetic variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/002—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the work function voltage
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe

Similar Documents

Publication Publication Date Title
Nonnenmacher et al. Scanning probe microscopy of thermal conductivity and subsurface properties
Hölscher et al. Measurement of three-dimensional force fields with atomic resolution using dynamic force spectroscopy
Hug et al. Quantitative magnetic force microscopy on perpendicularly magnetized samples
Stroscio et al. Tunneling spectroscopy of bcc (001) surface states
Bürgi et al. Imaging of electron potential landscapes on Au (111)
Meyer et al. Novel optical approach to atomic force microscopy
Giambattista et al. Scanning tunneling microscopy of atoms and charge-density waves in 1T-TaS 2, 1T-TaSe 2, and 1T-VSe 2
Tanaka et al. Scanning nonlinear dielectric microscopy nano-science and technology for next generation high density ferroelectric data storage
Schwarz et al. Dynamic-mode scanning force microscopy study of n-InAs (110)-(1× 1) at low temperatures
Niu et al. Double-tip scanning tunneling microscope for surface analysis
Gómez-Moñivas et al. Theory of electrostatic probe microscopy: A simple perturbative approach
Schneider et al. Local electronic structure at steps on Au (111) investigated by the thermovoltage in scanning tunneling microscopy.
Neddermeyer Scanning tunneling microscopy
Prins et al. Photoelectrical properties of semiconductor tips in scanning tunneling microscopy
Lu et al. Characterization of local electric properties of oxide materials using scanning probe microscopy techniques: A review
Rettenberger et al. Variation of the thermovoltage across a vacuum tunneling barrier: Copper islands on Ag (111)
Cretin et al. Scanning thermal microscopy
Gordon et al. Amplitude-mode electrostatic force microscopy in UHV: Quantification of nanocrystal charge storage
Green et al. Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces
Gomez et al. Magnetic field imaging by using magnetic force scanning tunneling microscopy
Sulania et al. Atomic and magnetic force studies of co thin films and nanoparticles: understanding the surface correlation using fractal studies
Putilov et al. Nonuniform quantum-confined states and visualization of hidden defects in Pb (111) films
Engel et al. Thermovoltage mapping of standing electron waves on Au (111) surfaces at low temperatures
Balk et al. Characterization of electronic materials and devices by scanning near-field microscopy
JP3085960B2 (en) Scanning tunneling potential spectroscopy microscope and scanning tunneling potential spectroscopy information detection method