Compans, 1989 - Google Patents

Dynamic method for in situ measurement of the thermoelectric power of vapor quenched thin films

Compans, 1989

Document ID
535161067131650847
Author
Compans E
Publication year
Publication venue
Review of Scientific Instruments

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Snippet

We present an improved dynamic technique for measuring the thermoelectric power and present an apparatus designed for in situ measurement of quench‐condensed films in the temperature range between liquid helium temperature and some 400 K. The main …
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