Solanki et al., 2010 - Google Patents
Tuning mechanical modes and influence of charge screening in nanowire resonatorsSolanki et al., 2010
View PDF- Document ID
- 157263958887675719
- Author
- Solanki H
- Sengupta S
- Dhara S
- Singh V
- Patil S
- Dhall R
- Parpia J
- Bhattacharya A
- Deshmukh M
- Publication year
- Publication venue
- Physical Review B—Condensed Matter and Materials Physics
External Links
Snippet
We probe electromechanical properties of InAs nanowire (diameter∼ 100 nm) resonators where the suspended nanowire is also the active channel of a field-effect transistor. We observe and explain the nonmonotonic dispersion of the resonant frequency with dc gate …
- 239000002070 nanowire 0 title abstract description 33
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/028—Electrodynamic magnetometers
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