Park et al., 2016 - Google Patents

Ambiguous surface defect image classification of AMOLED displays in smartphones

Park et al., 2016

Document ID
15299827616679365283
Author
Park Y
Kweon I
Publication year
Publication venue
IEEE Transactions on Industrial Informatics

External Links

Snippet

In this paper, we propose a classification approach for ambiguously shaped defects found on the surface of a type of display panel module that is widely used in the field of mobile displays. These types of surface defects are difficult to properly distinguish due to defect …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62—Methods or arrangements for recognition using electronic means
    • G06K9/6267—Classification techniques
    • G06K9/6268—Classification techniques relating to the classification paradigm, e.g. parametric or non-parametric approaches
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/36—Image preprocessing, i.e. processing the image information without deciding about the identity of the image
    • G06K9/46—Extraction of features or characteristics of the image
    • G06K9/4604—Detecting partial patterns, e.g. edges or contours, or configurations, e.g. loops, corners, strokes, intersections
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62—Methods or arrangements for recognition using electronic means
    • G06K9/6217—Design or setup of recognition systems and techniques; Extraction of features in feature space; Clustering techniques; Blind source separation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62—Methods or arrangements for recognition using electronic means
    • G06K9/6201—Matching; Proximity measures
    • G06K9/6202—Comparing pixel values or logical combinations thereof, or feature values having positional relevance, e.g. template matching
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62—Methods or arrangements for recognition using electronic means
    • G06K9/68—Methods or arrangements for recognition using electronic means using sequential comparisons of the image signals with a plurality of references in which the sequence of the image signals or the references is relevant, e.g. addressable memory
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/00221—Acquiring or recognising human faces, facial parts, facial sketches, facial expressions
    • G06K9/00268—Feature extraction; Face representation
    • G06K9/00281—Local features and components; Facial parts ; Occluding parts, e.g. glasses; Geometrical relationships
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/00127—Acquiring and recognising microscopic objects, e.g. biological cells and cellular parts
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/00624—Recognising scenes, i.e. recognition of a whole field of perception; recognising scene-specific objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/20—Image acquisition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20112—Image segmentation details
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K2209/00—Indexing scheme relating to methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K2209/19—Recognition of objects for industrial automation

Similar Documents

Publication Publication Date Title
Park et al. Ambiguous surface defect image classification of AMOLED displays in smartphones
Ali et al. Structural crack detection using deep convolutional neural networks
Deitsch et al. Automatic classification of defective photovoltaic module cells in electroluminescence images
Zheng et al. Recent advances in surface defect inspection of industrial products using deep learning techniques
Chen et al. Solar cell surface defect inspection based on multispectral convolutional neural network
Xue-Wu et al. A vision inspection system for the surface defects of strongly reflected metal based on multi-class SVM
Shang et al. Defect-aware transformer network for intelligent visual surface defect detection
Huang et al. Automated visual inspection in the semiconductor industry: A survey
Racki et al. A compact convolutional neural network for textured surface anomaly detection
Li et al. A novel algorithm for defect extraction and classification of mobile phone screen based on machine vision
Wu et al. An inspection and classification method for chip solder joints using color grads and Boolean rules
Üzen et al. Depth-wise Squeeze and Excitation Block-based Efficient-Unet model for surface defect detection
Yang et al. A deep learning-based surface defect inspection system using multiscale and channel-compressed features
Tsai et al. Defect detection in multi-crystal solar cells using clustering with uniformity measures
Chen et al. Manufacturing intelligence for reducing false alarm of defect classification by integrating similarity matching approach in CMOS image sensor manufacturing
CN109932370B (en) System and method for white spot detection with improved preprocessing
Xie et al. A novel defect detection and identification method in optical inspection
Mushtaq et al. Nuts&bolts: YOLO-v5 and image processing based component identification system
JP2016181098A (en) Area detection device and area detection method
Voronin et al. Automated visual inspection of fabric image using deep learning approach for defect detection
Kim et al. A vision-based system for monitoring block assembly in shipbuilding
KR20140120716A (en) Defect detection method in heterogeneously textured surface
Wu et al. An end-to-end learning method for industrial defect detection
Ghosh et al. Counterfeit IC detection by image texture analysis
Sun et al. Cascaded detection method for surface defects of lead frame based on high-resolution detection images