Kundu et al., 2017 - Google Patents

Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set

Kundu et al., 2017

Document ID
14422263253170419808
Author
Kundu S
Kumar K
Kumar R
Kapur R
Publication year
Publication venue
2017 IEEE International Test Conference (ITC)

External Links

Snippet

Diagnosing chain failures is extremely important to ramp up production yield. Use of modern day low pin compressors limit the observability making chain diagnosis a difficult problem. When multiple chains fail during initial ramp up of yield, the high-resolution patterns are …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

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    • G01R31/318558—Addressing or selecting of subparts of the device under test
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    • G11C29/44—Indication or identification of errors, e.g. for repair

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