Han et al., 2013 - Google Patents

Sputter-deposited low loss Mg2SiO4 thin films for multilayer hybrids

Han et al., 2013

View PDF
Document ID
13841425347569844273
Author
Han C
Mohanty B
Kang C
Cho Y
Publication year
Publication venue
Thin solid films

External Links

Snippet

Mg2SiO4 (forsterite) thin films grown by rf magnetron sputtering from a ceramic target have been investigated particularly for thin film hybrids requiring a low loss dielectric layer. Understanding of the processing parameters and their correlations to dielectric properties is …
Continue reading at www.ltschem.com (PDF) (other versions)

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/08Oxides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material

Similar Documents

Publication Publication Date Title
KR101511349B1 (en) Manufacturing method of piezoelectric-body film, and piezoelectric-body film manufactured by the manufacturing method
Jin et al. Deposition of c-axis orientation aluminum nitride films on flexible polymer substrates by reactive direct-current magnetron sputtering
Kang et al. Structural and electrical characteristics of RF magnetron sputtered ZnO films
Huang et al. Effect of doped concentration on dielectric properties of Mn and Y alternately doped BST films
Wang et al. Growth of preferentially-oriented AlN films on amorphous substrate by pulsed laser deposition
Zhou et al. The microstructure and energy storage properties of Ba0. 3Sr0. 7TiO3 crystallite thin films
Wang et al. Effect of oxygen partial pressure on crystal quality and electrical properties of RF sputtered PZT thin films under the fixed Ar flow and sputtering pressure
US10032853B2 (en) Microstructural architecture to enable strain relieved non-linear complex oxide thin films
US20160076152A1 (en) Integrated composite perovskite oxide heterostructure
Kar et al. Influence of nitrogen concentration on grain growth, structural and electrical properties of sputtered aluminum nitride films
Luo et al. Effect of Rb-doping on the dielectric and tunable properties of Ba0. 6Sr0. 4TiO3 thin films prepared by sol-gel
Han et al. Sputter-deposited low loss Mg2SiO4 thin films for multilayer hybrids
Aygün et al. Hot sputtering of barium strontium titanate on nickel foils
Gao et al. The growth of bismuth-based cubic pyrochlore dielectric thin films
Zhang et al. Effect of oxygen pressure on structure and properties of Bi1. 5Zn1. 0Nb1. 5O7 pyrochlore thin films prepared by pulsed laser deposition
TWI696581B (en) Nitrogen oxide film and capacitor
Li et al. Relationship between distortion of crystal structure and dielectric properties of complex perovskite oxide ba (Co, Zn) 1/3Nb2/3O3 thin films
Yuan et al. Investigation on the growth of CaCu3Ti4O12 thin film and the origins of its dielectric relaxations
Choudhary et al. Influence of buffer layer on structural, electrical and mechanical properties of PZT/NiTi thin film heterostructures
Zhu et al. Growth control of RF magnetron sputtered SrRuO3 thin films through the thickness of LaNiO3 seed layers
Chen et al. Effects of O2/Ar mixing and annealing on the properties of MgTiO3 films prepared by RF magnetron sputtering
Qiao et al. Domain configuration and phase transition for BaTiO3 thin films on tensile Si substrates
Song et al. Growth of highly c-axis oriented (B, Al) N film on diamond for high frequency surface acoustic wave devices
Qiao et al. Effect of substrate temperature on the microstructure and transport properties of highly (1 0 0)-oriented LaNiO3− δ films by pure argon sputtering
Riekkinen et al. Influence of the seed layer on structural and electro-acoustic properties of sputter-deposited AlN resonators