Namazu et al., 2012 - Google Patents

Design and development of a biaxial tensile test device for a thin film specimen

Namazu et al., 2012

Document ID
13333493720296765039
Author
Namazu T
Nagai Y
Naka N
Araki N
Inoue S
Publication year

External Links

Snippet

In this article, the design and development of a biaxial tensile test device and its specimen are described. The device, which was designed for evaluating the mechanical characteristics of a thin film specimen under in-plane uniaxial and biaxial tensile stress …
Continue reading at asmedigitalcollection.asme.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0014—Type of force applied
    • G01N2203/0016—Tensile or compressive
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/0202—Control of the test
    • G01N2203/0212—Theories, calculations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on micro-regions of a specimen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress

Similar Documents

Publication Publication Date Title
Namazu et al. Design and development of a biaxial tensile test device for a thin film specimen
Lee et al. Microfabrication and mechanical properties of nanoporous gold at the nanoscale
Jaya et al. Microscale fracture behavior of single crystal silicon beams at elevated temperatures
Chang et al. A microelectromechanical system for thermomechanical testing of nanostructures
Fujii et al. Focused ion beam induced surface damage effect on the mechanical properties of silicon nanowires
Tuck et al. A study of creep in polysilicon MEMS devices
Yoshino et al. Machining of hard-brittle materials by a single point tool under external hydrostatic pressure
Abbas et al. Design and characterization of a low temperature gradient and large displacement thermal actuators for in situ mechanical testing of nanoscale materials
Ureña et al. Strain in silicon nanowire beams
Chen et al. MEMS residual stress characterization: Methodology and perspective
Ikehara et al. Crystal orientation-dependent fatigue characteristics in micrometer-sized single-crystal silicon
Vatankhah et al. Lyapunov-based boundary control of strain gradient microscale beams with exponential decay rate
Cheng et al. Study on embedding and integration of microsensors into metal structures for manufacturing applications
Iqbal et al. Design, analysis, and experimental investigation of micro-displacement amplification compliant mechanism for micro-transducers
Kamiya et al. Process temperature–dependent mechanical properties of polysilicon measured using a novel tensile test structure
Kamiya et al. Effect of humidity and temperature on the fatigue behavior of polysilicon thin film
Park et al. Tensile and high cycle fatigue test of Al–3% Ti thin films
Namazu et al. Tension–Torsion Combined Loading Test Equipment for a Minute Beam Specimen
Le Huy et al. Statistical characterization of fatigue lifetime of polysilicon thin films
Higashino et al. Self-excited vibrational cantilever-type viscometer driven by piezo-actuator
Shi et al. Design and optimization based on uncertainty analysis in electro-thermal excited MEMS resonant sensor
Overman et al. Yield and deformation in biaxially stressed multilayer metallic thin films
Xu et al. Laser bending of silicon sheet: absorption factor and mechanisms
Barrios et al. Comparison of the low and high/very high cycle fatigue behaviors in Ni microbeams under bending
Gan et al. Correlating microscale thermal conductivity of heavily-doped silicon with simultaneous measurements of stress