WO2023065194A1

WO2023065194A1 - Test system and test apparatus

Info

Publication number: WO2023065194A1
Application number: PCT/CN2021/125133
Authority: WO
Inventors: 王家琪; 刘启蒙; 钟龙平; 熊华清; 周婷婷
Original assignee: 华为技术有限公司
Priority date: 2021-10-21
Filing date: 2021-10-21
Publication date: 2023-04-27
Also published as: CN117940782A

Abstract

A test system (300, 400, 500, 600, 700) and a test apparatus. The test system (300, 400, 500, 600, 700) comprises: one or more modules to be tested; a control center, which is used for managing a control module and the one or more modules to be tested; a power supply center (320, 420, 520, 620, 720), which is used for providing a power supply for the test system (300, 400, 500, 600, 700); a signal and power supply distribution module (330, 430, 530, 630, 730), comprising a signal distribution module (331, 431, 531, 631, 731) and a power supply distribution module (332, 432, 532, 632, 732), wherein the signal distribution module (331, 431, 531, 631, 731) is used for issuing an instruction to the control module according to data of the control center, and the power supply distribution module (332, 432, 532, 632, 732) is used for providing the power supply of the power supply center (320, 420, 520, 620, 720) to the control module and the one or more modules to be tested; and the control module, which is used for receiving the instruction so as to manage the one or more modules to be tested, so that the integration level of the test system can be improved, and the test efficiency is further improved.

Description

Test Systems and Test Fixtures

technical field

The embodiments of the present application relate to the field of testing, and more specifically, to a testing system and a testing device.

Background technique

In the field of testing, system level testing (system level test, SLT) is tested from the perspective of integrated chip (IC) functional modules, which can achieve higher coverage at a lower test cost, but the interface in the test system is relatively small. There are many, various interfaces are not uniform, and the number of cables is large, which makes the integration of the test system low and affects the efficiency of the test.

Therefore, how to improve test efficiency has become a technical problem that needs to be solved.

Contents of the invention

Embodiments of the present application provide a test system and a test device, in order to improve the integration level of the test system and further improve the test efficiency.

In a first aspect, a test system is provided, including: one or more modules to be tested; a control center for managing the control module and the one or more modules to be tested; a power center for providing power for the test system Provide power supply; signal and power distribution module, the signal and power distribution module includes a signal distribution module and a power distribution module, wherein the signal distribution module is used to send instructions to the control module according to the data of the control center, the power supply The distribution module is used to provide the power of the power center to the control module and the one or more modules under test; the control module is used to receive the instructions to manage the one or more modules under test.

Based on the embodiment of the present application, the signal and power distribution module can distribute the data of the control center to the control module and the module to be tested, and provide power to the control module and the module to be tested, which is conducive to improving the integration of the test system, and further has Helps improve test efficiency.

With reference to the first aspect, in some implementation manners of the first aspect, the control center is connected to the signal and power distribution module through a first connector, and the power center is connected to the signal and power distribution module through a second connector. The control module is connected to the signal and power distribution module through a third connector, and the control module is connected to the one or more modules under test through a fourth connector.

Based on the embodiment of the present application, the various modules of the test system are connected by connectors, which can simplify the test system and greatly improve the integration of the system, so that more devices under test can be tested in the same test area to improve test efficiency. .

With reference to the first aspect, in some implementation manners of the first aspect, the control center is connected to the signal and power distribution module through a first connector, and the power center is connected to the signal and power distribution module through a second connector. The control module is connected to the signal and power distribution module through a third connector, and the module under test is connected to the signal and power distribution module through a fourth connector.

With reference to the first aspect, in some implementation manners of the first aspect, the control module includes a first power supply module and a first control module, wherein the first power supply module is configured to The control module and the module under test provide power, and the first control module is used to manage the module under test according to the instruction of the signal distribution module.

With reference to the first aspect, in some implementation manners of the first aspect, the control module is integrated in each of the one or more modules under test, and the one or more modules under test are connected with The signal and power distribution modules are respectively connected through fifth connectors.

Based on the embodiment of the present application, the control module is located in the module to be tested, so that the thickness of the test system can be reduced while improving the integration of the test system.

With reference to the first aspect, in some implementation manners of the first aspect, the control module is located in the signal and power distribution module, the signal distribution module is connected to the control module, and the control module is connected to the standby The modules under test are connected through the sixth connector, and the control module is in one-to-one correspondence with the modules under test; the modules under test also include a first power module, and the first power module is used to The power supply provides power for the module under test.

Based on the embodiment of the present application, the control module is located in the signal and power distribution module, so that the thickness of the test system can be reduced while improving the integration of the test system.

With reference to the first aspect, in some implementations of the first aspect, the control module is integrated in the signal and power distribution module, the signal distribution module is connected to the control module, and the signal and power distribution module Also includes:

A switch, the switch is connected to the control module, and the switch is used to forward the instructions of the control module to the one or more modules under test.

Based on the embodiment of the present application, the control module is integrated in the signal and power distribution module, and one control module is used to manage all the modules to be tested. This technical solution can help reduce the complexity of the test system while ensuring a high degree of system integration.

With reference to the first aspect, in some implementation manners of the first aspect, the first connector and the second connector are one of pogo pins, cables, and gold fingers; the third connector, the The fourth connector is one of connection wires, flat wires, power wires, and signal wires.

In a second aspect, a test device is provided, including: a signal and power distribution module, the signal and power distribution module includes a signal distribution module and a power distribution module, wherein the signal distribution module is used to send The control module sends instructions, and the power distribution module is used to provide power to the control module and one or more modules under test; the control module is used to receive the instructions to manage the one or more modules under test .

With reference to the second aspect, in some implementation manners of the second aspect, the control module includes a first power supply module and a first control module, wherein the first power supply module is configured to The control module and the one or more modules under test provide power, and the first control module is configured to manage the one or more modules under test according to instructions of the signal distribution module.

With reference to the second aspect, in some implementation manners of the second aspect, the control module is in one-to-one correspondence with the one or more modules to be tested.

With reference to the second aspect, in some implementation manners of the second aspect, the control module is located in the module under test.

With reference to the second aspect, in some implementation manners of the second aspect, the control module is located in the signal and power distribution module, and the signal and power distribution module further includes: a switch, and the switch is connected to the The control module is connected, and the switch is used to forward the instructions of the control module to the one or more modules under test.

With reference to the second aspect, in some implementation manners of the second aspect, the signal and power distribution module is connected to the control module through a seventh connector, and the signal and power distribution module is connected to the one or more waiting The test module is connected through the eighth connector.

With reference to the second aspect, in some implementations of the second aspect, the seventh connector is one of pogo pins, cables, and golden fingers; the eighth connector is a connecting wire, a cable, a power cord, a signal one of the lines.

Description of drawings

FIG. 1 is a schematic diagram of the architecture of an SLT testing system.

FIG. 2 is a schematic diagram of another SLT testing system.

Fig. 3 is a schematic diagram of an SLT testing system provided by an embodiment of the present application.

Fig. 4 is a schematic diagram of another SLT testing system provided by an embodiment of the present application.

Fig. 5 is a schematic diagram of another SLT testing system provided by an embodiment of the present application.

Fig. 6 is a schematic diagram of another SLT testing system provided by an embodiment of the present application.

Fig. 7 is a schematic diagram of another SLT testing system provided by an embodiment of the present application.

Detailed ways

The technical solutions in the embodiments of the present application will be described below with reference to the accompanying drawings.

In the field of testing, SLT is a functional-level test based on integrated circuits, which is different from the design for test (DFT) vector of automatic test equipment (ATE) test, dedicated load board (loadboard) and test Controlled ATE machine, during the SLT test, the IC runs the product software and function vectors, and the test board is often modified from the product single board. The SLT test process is generally run on the test master (computer or other control equipment that can execute software) Controlled by the online test management software, SLT can realize test development, introduction and mass production faster and at a lower cost.

As the scale of IC transistors continues to increase, IC malfunctions caused by defects are also increasing. Traditional DFT testing is difficult to further improve IC circuit test coverage due to test costs. SLT tests from the perspective of IC functional modules and can be used in relatively large Achieve high coverage at low test cost.

However, the SLT test board and control system generally adopt a common interface, and the SLT test board and the electrical system have low integration, which makes the efficiency of the test system low.

FIG. 1 is a schematic diagram of the architecture of an SLT testing system. As shown in Figure 1, the test system 100 may include a power supply 110, a switch 120, a first test main control 130, a debugging interface 131 and a power supply 132 of the first test main control 130, a first test board 150 and its debugging equipment 155 and the power supply 154 , the second test main control 140 , the debugging interface 141 and the power supply 142 of the second test main control 140 , the second test board 160 and its debugging equipment 165 and the power supply 164 .

Wherein, the first test master 130 may include a communication interface 134 and a communication interface 133 , the communication interface 134 is used for communicating with the switch 120 , and the communication interface 133 is used for communicating with the first test board 150 .

The second test master 140 may include a communication interface 144 and a communication interface 143 , the communication interface 144 is used for communicating with the switch 120 , and the communication interface 143 is used for communicating with the first test board 160 .

The first test board 150 may include a communication interface 151, a debugging interface 152, and a power interface 153. The communication interface 151 is used to communicate with the first test main control 130. The debugging interface 152 is used to interface with a debugging device 155. The power interface 153 is used to connect with power supply 154 to provide power for the first test board.

The second test board 160 may include a communication interface 161, a debugging interface 162 and a power interface 163, the communication interface 161 is used to communicate with the first test main control 140, the debugging interface 162 is used to dock with the debugging device 165, the power interface 163 is used to connect with the power supply 164 to provide power for the second test board.

Referring to Figure 1, each test board can constitute a test station. During the test, the test station is placed according to the position of the lower indenter of the SLT test machine. Each test station has a corresponding test master control, and the test master control The communication interface on the test board is connected to the communication interface in the test board through a cable and controls the test board. The communication interfaces on multiple test masters are connected to the switch through cables to realize the SLT test networking.

It should be understood that the embodiment of the present application uses two test boards as an example for illustration, but the present application does not limit the number of test boards. In other embodiments, there may be more test boards, such as 3 number, n number, n is an integer greater than 3, etc.

Each test station in the test system 100 has a separate power supply, debugging interface, communication interface and cable, and each test station corresponds to a test master, which is generally placed next to the test station. The main control also needs an independent power supply, maintenance interface, etc., and is connected to the switch through cables. There are many interfaces in the test system, various interfaces are not unified, and the number of cables is large, which makes the integration degree of the test system low.

FIG. 2 is a schematic diagram of another SLT testing system. As shown in FIG. 2 , the test system 200 may include a power supply 210 , a switch 220 , a test master 240 , a test board 260 and a test board 270 .

Wherein, the test main control 240 has a debugging interface 230 and a power supply 250, and the testing board 260 also includes a communication interface 261, a debugging interface 262 and a power supply interface 263, wherein the communication interface 261 is used to connect with the switch 220 to receive the test main The control data sent by the controller, etc., the debugging interface 262 is used for docking with the debugging device 265, and the power interface 263 is used for connecting with the power supply 264 to provide power for the test board 260.

The test board 270 also includes a communication interface 271, a debugging interface 272 and a power interface 273, wherein the communication interface 271 is used to connect with the switch 220, such as connecting through a communication cable to receive control data sent by the test master, etc. The debugging interface 272 is used for docking with the debugging device 275 , and the power interface 273 is used for connecting with the power supply 274 to provide power for the test board 270 .

In the test system 200, a test master is responsible for managing and controlling multiple test boards, such as managing the test process, test status, logs, etc. of the test boards. However, each test board has an independent power supply, communication interface, and debugging interface, etc., requiring a large number of cables, and the specifications of each interface are not uniform, which makes the installation and maintenance of the test system complicated and reduces the efficiency of the test system.

In view of this, the embodiments of the present application provide a test system and a test device, which can improve the integration level of the test system, thereby improving test efficiency.

The test system in the embodiment of the present application will be introduced below with reference to FIG. 3 to FIG. 7 .

Fig. 3 is a schematic diagram of a testing system provided by an embodiment of the present application. As shown in Figure 3, the test system 300 may include a remote control terminal 310, a power center 320, a signal and power distribution module 330, a first control terminal 340, a second control terminal 350, a first terminal to be tested 360, a second terminal to be tested End 370.

Wherein, the signal and power distribution module 330 includes a signal distribution module 331 and a power distribution module 332, the first control terminal 340 may include a first power module 341 and a control unit 342, and the second control terminal 350 may include a second power module 351 and control unit 352.

The first power supply module 341 can be connected to the control unit 342 through a connector, and can also be electrically connected through the wiring of a printed circuit board (PCB). The first power supply module 341 and the control unit 342 can be located at A PCB may also be located in different PCBs, which is not limited in this embodiment of the present application.

Similarly, the second power supply module 351 and the control unit 352 can be connected through a connector, and can also be electrically connected through PCB wiring. The second power supply module 351 and the control unit 352 can be located in a PCB, or can be In different PCBs, this is not limited in this embodiment of the present application.

In the embodiment of the present application, the remote control terminal 310 is responsible for running the SLT test software, and managing and controlling the first control terminal and the second control terminal. The remote control terminal 310 is connected to the signal distribution module 331 through a connector, the signal distribution module is connected to the control unit 342 in the first control terminal through a connector 344, and the signal distribution module is connected to the second control terminal through a connector 354. The control unit 352 is connected, the control unit 342 is docked with the first terminal 360 to be tested through a connector, and the control unit 352 is connected with the second terminal 370 to be tested through a connector. Therefore, the remote control terminal can manage and control all control terminals and terminals to be tested through the signal distribution module.

It should be understood that the control unit 342 and the control unit 352 can be a central processing unit (central processing unit, CPU), a micro control unit (microcontroller unit, MCU), a complex programmable logic device (complex programmable logic device, CPLD) or field programmable Gate array (field-programmable gate array, FPGA), etc.

The connectors in the embodiments of the present application may be pogo pins, cables, golden fingers, flat cables, etc., which are not limited in the embodiments of the present application.

The connection between the above-mentioned control unit 342 and the first terminal 360 to be tested can be through a connector, or through a power line, a signal line, etc.; the connection between the control unit 342 and the first terminal 360 to be tested can be through a connector, Multiple connectors are also possible.

The power center 320 is responsible for providing power for all hardware modules in the test system. The power center 320 is connected to the power distribution module 332 through the connector, the power distribution module 332 is connected to the first power module 341 through the connector 343, and the power distribution module 332 is connected to the second power module 351 through the connector 353 .

Power Distribution Module The power provided by the power center is directly distributed to each control terminal or distributed to each control terminal after stepping down. The control terminal is integrated with a power module, which is controlled by the control center to provide power for the terminal under test. The control unit also The test status of the terminal to be tested can be managed.

Based on the embodiment of the present application, the terminal to be tested can be installed above (front) the power supply and signal distribution module, the control terminal can be installed below (back) the power supply and signal distribution module, and the control terminal and the terminal to be tested pass through the power supply and signal distribution module. The distribution module is directly connected.

The modules of the test system in this technical solution can be connected with connectors of uniform specifications. The signal distribution module can send commands from the remote control terminal to each control terminal, and the power distribution module distributes the power of the power center to each control terminal. The terminal makes the test system have a high degree of integration, which can improve test efficiency.

It should be understood that the terminal to be tested is a test board. The embodiment of the present application takes two terminals to be tested as an example for illustration, but this application does not limit the number of terminals to be tested. In other embodiments, the terminal to be tested The quantity can be n, and n is an integer greater than 2.

Exemplarily, the number of the terminals to be tested is three, that is, the test system further includes a third terminal to be tested and a third control terminal, and the third control terminal may include a third power supply module and a control unit.

Fig. 4 is a schematic diagram of another test system provided by an embodiment of the present application. As shown in Figure 4, the test system 400 may include a remote control terminal 410, a power center 420, a signal and power distribution module 430, a first control terminal 440, a second control terminal 450, a first terminal to be tested 460 and a second terminal to be tested. End 470.

Wherein, the signal and power distribution module 430 includes a signal distribution module 431 and a power distribution module 432, the first control terminal 440 may include a first power module 441 and a control unit 442, and the second control terminal 450 may include a second power module 451 and control unit 452.

It should be understood that the specific functions and functions of the remote control terminal 410, the power center 420, the signal and power distribution module 430, the first power module 441, the second power module 451, the control unit 442, and the control unit 452 can be referred to in FIG. Corresponding descriptions are omitted for brevity.

Referring to FIG. 4 , the power distribution module 432 is connected to the first power module 441 through the connector 443 , and the power distribution module 432 is connected to the second power module 451 through the connector 453 . The first power module 441 is docked with the signal and power distribution module 430 through the connector 444, and the first terminal 460 to be tested is connected with the signal and power distribution module 430 through the connector 461, so that the first terminal 460 to be tested can have electric power; The second power module 451 is connected to the signal and power distribution module 430 through the connector 453 , and the second terminal 470 to be tested is connected to the signal and power distribution module 430 through the connector 463 , so that the second terminal 470 to be tested can have power.

The signal distribution module 431 is docked with the control unit 442 through the connector 445 , and the signal distribution module 431 is also connected with the control unit 452 through the connector 455 . The control unit 442 is docked with the signal and power distribution module 430 through the connector 446, and the first terminal 460 to be tested is connected with the signal and power distribution module 430 through the connector 462, so that the first terminal 460 to be tested can receive instructions from the control unit 442 The control unit 452 is docked with the signal and power distribution module 430 through the connector 456, and the second terminal 470 to be tested is connected with the signal and power distribution module 430 through the connector 464, so that the second terminal 470 to be tested can receive the signal of the control unit 452 instruction.

The connectors in this embodiment of the application may be Pogo Pins, cables, golden fingers, flat cables, etc., which are not limited in this embodiment of the application.

Fig. 5 is a schematic diagram of another test system provided by the embodiment of the present application. As shown in FIG. 5 , the test system 500 may include a remote control terminal 510 , a power center 520 , a signal and power distribution module 530 , a first terminal under test 540 and a second terminal under test 550 .

Wherein, the signal and power distribution module 530 may include a signal distribution module 531 and a power distribution module 532 . The first terminal under test 540 may include a first power module 541 , a control unit 542 and a chip under test 543 , and the second terminal under test 550 may include a second power module 551 , a control unit 552 and a chip under test 553 .

It should be understood that the specific functions and functions of the remote control terminal 510, the power center 520, the signal and power distribution module 530, the first power module 541, the second power module 551, the control unit 542, and the control unit 552 can be referred to in FIG. Corresponding descriptions are omitted for brevity.

Referring to FIG. 5 , the signal distribution module 531 is connected to the control unit 542 through the connector 534 , and the signal distribution module 531 is connected to the control unit 552 through the connector 536 .

The power distribution module 532 is docked with the first power module through the connector 533, and the power distribution module 532 is connected with the second power module 551 through the connector 535.

In the embodiment of the present application, the control unit is integrated at the terminal under test, so that the test terminal and the control terminal are designed in one. During the test, the terminal under test can be placed above the signal and power distribution module, so as to ensure high system integration. At the same time, it is beneficial to reduce the thickness of the test system.

Exemplarily, the number of the terminals under test is three, that is, the test system further includes a third terminal under test, and the third terminal under test may include a chip under test, a third power supply module and a control unit.

Fig. 6 is a schematic diagram of another testing system provided by an embodiment of the present application. As shown in FIG. 6 , the testing system 600 may include a remote control terminal 610 , a power center 620 , a signal and power distribution module 630 , a first terminal under test 640 and a second terminal under test 650 .

Wherein, the signal and power distribution module 630 may include a signal distribution module 631 , a power distribution module 632 , a first control unit 661 and a second control unit 662 .

The first terminal under test 640 may include a first power module 642 and a chip under test 641 , and the second terminal under test 650 may include a second power module 652 and a chip under test 651 .

The signal distribution module 631 can be connected to the first control unit 661 and the second control unit 662 through connectors. The first control unit 661 is connected to the first terminal under test 640 through the connector 634 , and the second control unit is connected to the second terminal under test 650 through the connector 636 .

It should be understood that the signal distribution module 631 may also be electrically connected to the first control unit 661 and the second control unit 662 through PCB wiring.

The power distribution module 632 can be connected to the first power module 642 through the connector 633 , and the power distribution module 632 can be connected to the second power module 652 through the connector 635 .

It should be understood that the specific functions and functions of the remote control terminal 610, the power center 620, the signal and power distribution module 630, the first power module 642, the second power module 652, the first control unit 661, and the second control unit 662 can be found in The corresponding description in FIG. 3 is omitted for brevity.

Based on the embodiment of the present application, the control unit is integrated in the signal and power distribution module, and this technical solution can help reduce the thickness of the test system while ensuring a high degree of integration of the system.

Exemplarily, the number of the terminals under test is three, that is, the test system further includes a third terminal under test, and the third terminal under test may include a third power module and a chip under test.

Fig. 7 is a schematic diagram of another test system provided by the embodiment of the present application. As shown in FIG. 7 , the test system 700 may include a remote control terminal 710 , a power center 720 , a signal and power distribution module 730 , a first terminal to be tested 740 and a second terminal to be tested 750 .

Wherein, the signal and power distribution module 730 may include a signal distribution module 731 , a power distribution module 732 , a control unit 761 and a switch 762 .

The signal distribution module 731 can be connected to the control unit 761 through a connector, and the control unit 761 is connected to the switch 762, and the switch 762 is used to forward the data of the control unit to the terminal under test, and the switch 762 is connected to the second terminal through the connector 734. A terminal to be tested 740 is docked, and the switch 762 is connected to the second terminal 750 to be tested through a connector 736 .

It should be understood that the signal distribution module 731 may also be electrically connected to the control unit 761 through PCB traces.

The power distribution module 732 is connected to the first power supply module 742 through the connector 733 , and connected to the second power supply module 752 through the connector 735 , so as to supply power to the first terminal under test 740 and the second terminal under test 750 .

It should be understood that the specific functions and functions of the remote control terminal 710, the power center 720, the signal and power distribution module 730, the first power module 742, the second power module 752, and the control unit 761 can refer to the corresponding description in FIG. Concise, no more details.

Based on the embodiment of the present application, the control unit is integrated in the signal and power distribution module, and one control unit is used to manage all the terminals to be tested. This technical solution can help reduce the thickness of the test system while ensuring high integration of the system.

In some other embodiments, the signal and power distribution module 730 may not include a control unit. In this case, the signal distribution module 731 may be connected to the switch 762, that is, the function of the control unit may be integrated in the signal In the distribution module 731, the signal distribution module performs the function of the control unit.

The embodiment of the present application also provides a test device, the test device may include: a signal and power distribution module, the signal and power distribution module includes a signal distribution module and a power distribution module, wherein the signal distribution module is used to The data in the center sends instructions to the control module, and the power distribution module is used to provide power to the control module and one or more modules to be tested; the control module is used to receive the instructions to manage the one or more modules to be tested.

Exemplarily, referring to FIG. 3, the signal and power distribution module may be a signal and power distribution module 330, the signal distribution module may be a signal distribution module 331, the power distribution module may be a power distribution module 332, and the control center may be The remote control terminal 310, the control module may be the first control terminal and/or the second control terminal.

In a possible design, the control module includes a first power supply module and a first control module, wherein the first power supply module is used to provide power for the control module and the one or a plurality of modules under test to provide power, and the first control module is configured to manage the one or more modules under test according to instructions of the signal distribution module.

Exemplarily, referring to FIG. 4, when the test system includes a terminal to be tested, such as the first terminal to be tested 360, the control module can be the first control terminal 340, and the first power supply module can be the first power supply module 341 , the first control module may be the control unit 342 .

In a possible design, the control module is in one-to-one correspondence with the one or more modules to be tested.

For example, referring to FIG. 3 and FIG. 4 , the control module is the control terminal, and the module to be tested is the terminal to be tested.

In a possible design, the control module is in the module under test.

Exemplarily, referring to FIG. 5 , the control module may include a first power module 541 and a control unit 542 .

In a possible design, the control module is located in the signal and power distribution module, and the signal and power distribution module further includes: a switch connected to the control module, the The switch is used to forward the instructions of the control module to the one or more modules under test.

For example, referring to FIG. 7 , the control module may be a control unit 761 , and the switch may be a switch 762 .

In a possible design, the signal and power distribution module is connected to the control module through a seventh connector, and the signal and power distribution module is connected to the one or more modules under test through an eighth connector .

Exemplarily, referring to FIG. 4, the seventh connector may be a connector 443, a connector 444, a connector 445, and a connector 446 between the first control terminal 440 and the signal and power distribution module 430. The eighth connection The connectors may be the connector 461 and the connector 462 between the first terminal under test 340 and the signal and power distribution module 430 .

In some embodiments, the connector 443 and the connector 445 may or may not be the same, and the connector 444 and the connector 446 may or may not be the same.

In some embodiments, the connector 461 and the connector 462 may or may not be the same, which is not limited in this embodiment of the present application.

The embodiment of the present application also provides a test system, which may include:

One or more modules to be tested;

a control center for managing the control module and the one or more modules to be tested;

a power center for providing power to the test system;

A signal and power distribution module, the signal and power distribution module includes a signal distribution module and a power distribution module, wherein the signal distribution module is used to send instructions to the control module according to the data of the control center, and the power distribution module uses for providing the power of the power center to the control module and the one or more modules under test;

The control module is configured to receive the instruction to manage the one or more modules under test.

In one example, referring to FIG. 3, the one or more modules to be tested can be a first terminal to be tested 360 and a second terminal to be tested 370, that is, the module to be tested is a terminal to be tested, and the control center can be a remote control terminal 310, the power center can be the power center 320, the signal and power distribution module can be the signal and power distribution module 330, the control module can be the first control terminal 340 or the second control terminal 350, that is, the control module is the above Examples of the control terminal.

In another example, referring to FIG. 6, the one or more modules to be tested can be a first terminal to be tested 640 and a second terminal to be tested 650, the control center can be a remote control terminal 610, and the power supply center can be a power supply Center 620 , the signal and power distribution module may be a signal and power distribution module 630 , and the control module may be the first control unit 340 or the second control unit 350 .

In a possible design, the control center is connected to the signal and power distribution module through a first connector, the power center is connected to the signal and power distribution module through a second connector, and the control module The signal and power distribution module is connected through a third connector, and the control module is connected with the one or more modules under test through a fourth connector.

Exemplarily, referring to FIG. 3 , the first connector may be a connector between the remote control terminal 310 and the signal and power distribution module 330 , and the second connector may be between the power center 320 and the signal and power distribution module 330 The third connector can be the connector 343 and the connector 344 between the first control terminal 340 and the signal and power distribution module 330, and the fourth connector can be the first control terminal 340 and the first A connector between the terminals 360 to be tested.

It should be understood that, in some embodiments, the first connector and the second connector may be the same connector, that is, the connector can transmit both data and power.

In some embodiments, the connector 343 and the connector 344 may or may not be the same, which is not limited in this embodiment of the present application.

In a possible design, the control center is connected to the signal and power distribution module through a first connector, the power center is connected to the signal and power distribution module through a second connector, and the control module It is connected with the signal and power distribution module through a third connector, and the module under test is connected with the signal and power distribution module through a fourth connector.

Exemplarily, referring to FIG. 4, the first connector may be a connector between the remote control terminal 410 and the signal and power distribution module 430, and the second connector may be a connection between the power center 420 and the signal and power distribution module 430. The third connector can be the connector 443, the connector 444, the connector 445 and the connector 446 between the first control terminal 440 and the signal and power distribution module 430, and the fourth connector can be The connector 461 and the connector 462 between the first terminal under test 340 and the signal and power distribution module 430 .

In a possible design, the control module includes a first power supply module and a first control module, wherein the first power supply module is used to power the control module and the module under test according to the power supply of the power distribution module Provide power supply, and the first control module is used to manage the module under test according to the instruction of the signal distribution module.

For example, referring to FIG. 3 , the control module may be a first control terminal 340 , the first power module may be a first power module 341 , and the first control module may be a control unit 342 .

In a possible design, the control module is integrated in each of the one or more modules under test, and the one or more modules under test and the signal and power distribution module are respectively Connect via the fifth connector.

Exemplarily, referring to FIG. 5, the control module may include a first power module 541 and a control unit 542, and the fifth connector may be a connector 533 and a connector 534; the control module may also be a second power module 551 and a control unit 552, the fifth connector may be the connector 535 and the connector 536.

The fifth connector may be one of pogo pins, cables, and golden fingers.

In a possible design, the control module is located in the signal and power distribution module, the signal distribution module is connected to the control module, and the control module is connected to the module under test through a sixth connector , the control module is in one-to-one correspondence with the modules under test; the module under test also includes a first power module, and the first power module is used to power the module under test according to the power supply of the power distribution module Provide power.

For example, referring to FIG. 6 , the control module may be a first control unit 661 and a second control unit 662 . The sixth connector may be one of a connection wire, a flat wire, a power wire, and a signal wire.

In a possible design, the control module is integrated in the signal and power distribution module, the signal distribution module is connected to the control module, and the signal and power distribution module further includes:

In a possible design, the first connector and the second connector are one of pogo pins, cables, and gold fingers; the third connector and the fourth connector are connecting wires , cable, power cord, signal line in one.

Those skilled in the art can appreciate that the units and algorithm steps of the examples described in conjunction with the embodiments disclosed herein can be implemented by electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are executed by hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art may use different methods to implement the described functions for each specific application, but such implementation should not be regarded as exceeding the scope of the present application.

Those skilled in the art can clearly understand that for the convenience and brevity of the description, the specific working process of the above-described system, device and unit can refer to the corresponding process in the foregoing method embodiment, which will not be repeated here.

In the several embodiments provided in this application, it should be understood that the disclosed systems, devices and methods may be implemented in other ways. For example, the device embodiments described above are only illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or May be integrated into another system, or some features may be ignored, or not implemented. In another point, the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces, and the indirect coupling or communication connection of devices or units may be in electrical, mechanical or other forms.

The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place, or may be distributed to multiple network units. Part or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, each unit may exist separately physically, or two or more units may be integrated into one unit.

If the functions described above are realized in the form of software function units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or the part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including Several instructions are used to make a computer device (which may be a personal computer, a server, or a network device, etc.) execute all or part of the steps of the methods described in the various embodiments of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (read-only memory, ROM), random access memory (random access memory, RAM), magnetic disk or optical disc and other media that can store program codes. .

The above is only a specific implementation of the application, but the scope of protection of the application is not limited thereto. Anyone familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the application. Should be covered within the protection scope of this application. Therefore, the protection scope of the present application should be determined by the protection scope of the claims.

Claims

A test system, characterized in that it comprises:

One or more modules to be tested;

a control center for managing the control module and the one or more modules to be tested;

a power center for providing power to the test system;

A signal and power distribution module, the signal and power distribution module includes a signal distribution module and a power distribution module, wherein the signal distribution module is used to send instructions to the control module according to the data of the control center, and the power distribution module uses for providing the power of the power center to the control module and the one or more modules under test;

The control module is configured to receive the instruction to manage the one or more modules under test.
The test system according to claim 1, wherein the control center is connected to the signal and power distribution module through a first connector, and the power center is connected to the signal and power distribution module through a second connector The control module is connected to the signal and power distribution module through a third connector, and the control module is connected to the one or more modules under test through a fourth connector.
The test system according to claim 1, wherein the control center is connected to the signal and power distribution module through a first connector, and the power center is connected to the signal and power distribution module through a second connector The control module is connected to the signal and power distribution module through a third connector, and the module under test is connected to the signal and power distribution module through a fourth connector.
The test system according to any one of claims 1-3, wherein the control module includes a first power supply module and a first control module, wherein the first power supply module is used to distribute The power supply of the module provides power for the control module and the module under test, and the first control module is used to manage the module under test according to the instructions of the signal distribution module.
The test system according to claim 1, wherein the control module is integrated in each of the one or more modules to be tested, and the one or more modules to be tested are connected to the The signal and power distribution modules are respectively connected through fifth connectors.
The test system according to claim 1, wherein the control module is in the signal and power distribution module, the signal distribution module is connected to the control module, and the control module is connected to the module to be tested Connected through the sixth connector, the control module corresponds to the module under test; the module under test also includes a first power supply module, and the first power supply module is used for power supply according to the power distribution module Provide power for the module under test.
The test system according to claim 1, wherein the control module is integrated in the signal and power distribution module, the signal distribution module is connected to the control module, and the test system further comprises:

A switch, the switch is in the signal and power distribution module, the switch is connected to the control module, and the switch is used to forward the instructions of the control module to the one or more modules under test .
The test system according to claim 2 or 3, wherein the first connector and the second connector are one of pogo pins, cables, and gold fingers; the third connector, the The fourth connector is one of connection wires, flat wires, power wires, and signal wires.
A testing device, characterized in that it comprises:

A signal and power distribution module, the signal and power distribution module includes a signal distribution module and a power distribution module, wherein the signal distribution module is used to send instructions to the control module according to the data of the control center, and the power distribution module is used to Power is provided to the control module and one or more modules under test;

The control module is configured to receive the instruction to manage the one or more modules under test.
The test device according to claim 9, wherein the control module comprises a first power supply module and a first control module, wherein the first power supply module is used to provide the The control module and the one or more modules under test provide power, and the first control module is used to manage the one or more modules under test according to the instructions of the signal distribution module.
The testing device according to claim 10, wherein the control module is in one-to-one correspondence with the one or more modules to be tested.
The test device according to claim 10, wherein the control module is located in the module under test.
The test device according to claim 9, wherein the control module is in the signal and power distribution module, and the signal and power distribution module further includes:

A switch, the switch is connected to the control module, and the switch is used to forward the instructions of the control module to the one or more modules under test.
The test device according to any one of claims 9-13, wherein the signal and power distribution module is connected to the control module through a seventh connector, and the signal and power distribution module is connected to the one or multiple modules to be tested are connected through the eighth connector.
The test device according to claim 14, wherein the seventh connector is one of a pogo pin, a cable, and a gold finger; the eighth connector is a connecting wire, a flat wire, a power wire, a signal one of the lines.