WO2021184083A1

WO2021184083A1 - Systems and methods for in‑line sampling of particulate matter

Info

Publication number: WO2021184083A1
Application number: PCT/AU2021/050257
Authority: WO
Inventors: John Kalitsis; Kenneth James QUAIL; Daniel Fan LI
Original assignee: Australian Export Grains Innovation Centre Limited
Priority date: 2020-03-20
Filing date: 2021-03-19
Publication date: 2021-09-23

Abstract

A system for in-line sampling of particulate matter, comprising: a frame adapted to sealingly engage with a particulate matter transport pipe, the frame comprising: a sample ledge adapted to protrude into the pipe to receive and accumulate particulate matter flowing through the pipe; a housing adapted to receive a sampling device; an inspection window located within, or adjacent to, the sample ledge; a gas inlet port adapted to receive and transport a jet of gas; a gas outlet port adapted to direct the jet of gas to flow across the sample ledge so as to clear accumulated particulate matter from the sample ledge. Also, a method for in-line sampling of particulate matter in a particulate matter flow transport pipe; and a kit for a system for in-line sampling of particulate matter.

Description

SYSTEMS AND METHODS FOR IN-LINE SAMPLING OF PARTICULATE MATTER

Field of the Invention

[0001 ] The present invention relates to systems and method for particle sampling and in particular to systems and methods for sampling and analysis of particulate matter.

[0002] The invention has been developed primarily for use in methods and systems for real-time or near-real-time in-line sampling and analysis of particulate matter flowing through a particle transport pipe and will be described hereinafter with reference to this application. However, it will be appreciated that the invention is not limited to this particular field of use.

Background

[0003] Any discussion of the background art throughout the specification should in no way be considered as an admission that such background art is prior art, nor that such background art is widely known or forms part of the common general knowledge in the field in Australia or worldwide.

[0004] All references, including any patents or patent applications, cited in this specification are hereby incorporated by reference. No admission is made that any reference constitutes prior art. The discussion of the references states what their authors assert, and the applicants reserve the right to challenge the accuracy and pertinence of the cited documents. It will be clearly understood that, although a number of prior art publications are referred to herein, this reference does not constitute an admission that any of these documents’ forms part of the common general knowledge in the art, in Australia or in any other country.

[0005] In a flour or feed mill, grain, or other materials are ground to form fine, dry, particulate matter. Once ground the particles are moved in pipes pneumatically in an air flow or using gravity. Regular and accurate sampling of the particulate matter is crucial to the operation of the mill and ensure a quality product. Quality control testing of the particulate matter is only as good as the tested sample, so the process for obtaining a true representative sample of the particles in any particular pipe throughout the mill, which can accurately measure the characteristics of the whole batch or lot travelling through the tested pipe is critical. [0006] In the case of a flour mill the dry particles may be sorted into different portions or fractions based on particle size and density. The number of portions which the dry particles are separated into will vary from operation to operation but is typically between 10 to 20 different portions. These separated portions are moved through the mill via pipes to different processing operations. Different portions of the batch typically have different properties including colour and chemical composition. The particles flowing in different pipes may subsequently be blended in varying ratios with the particles in other pipes to meet product specifications for specified attributes. Determining the quality and particular attributes of the particulate matter flowing through each pipe can also be used to identify processing issues, which include, but are not limited to, excessive grinding, insufficient grinding or faults in the sifting process.

[0007] To manage the processing of the dry materials, including blending and further processing, it is of value to understand the characteristics of each separated portion during the different stages of processing. Samples of each portion may be taken from the pipes from time to time for next-to-line or laboratory testing. In either case the ability to make processing changes to modify stream composition is time delayed and in cases of high throughput, may result in production which is out of specification.

[0008] The flow rate in each pipe can vary significantly with some pipes consistently carrying heavy flow rates with high optical density and other pipes carrying low flow rates with low levels of optical density. At any point in time during the process, the particulate flow rate in any one pipe may change as a result of adjustments to process settings or raw material differences.

[0009] A better option than next-to-line monitoring is to provide inline measurement in multiple streams across the process. This may include monitoring multiple pipes within a single milling operation. This may be to measure attributes including but not limited to: colour, moisture, protein, ash, starch damage or oil content. When the flow rate of the particles does not create adequate optical density to measure reflected light with a suitable signal to noise ratio, it is necessary under currently available procedures to extract a static sample of the particulate matter in the pipe for manual testing (either “next-to-line” or laboratory testing). As will be appreciated, the extraction of samples from the pipe for measurement is complex and slow and thus is not able to provide real-time measurement of particulate attributes. [0010] For systems with high flow throughput rates, it is possible to achieve adequate optical density, from the continuous flow of material, to measure reflected light with a suitable signal to noise ratio. There are systems available for such measurement which include installing one or more inspection windows into the pipe and irradiating the particles flowing through the pipe with an optical source such as a laser or lamp across the flow of the particles e.g. perpendicular to the flow direction. Light which is then reflected from the particles and/or transmitted through the pipe is detected for further analysis of the characteristics of the particles in the pipe. At present the commercially available optical systems designed for high flow rates are expensive and require high levels of illumination requiring management of heat which can damage and/or alter the characteristics of the particles under test and typically delivering these solutions at high cost.

[0011] Alternative systems that can be used to achieve a static sample, have used a bypass approach where a sample or a portion of the sample is diverted from the flow into a sample collection tube. The material accumulates in the sampling tube to establish a static sample of adequate optical density to make a measurement of reflected and/or transmitted light. The bypass system can be difficult to fit and operate. The sampling tubes often experience issues with cleaning as dry particles in a small diameter pipe typically become stuck due to surface friction between the particles and the wall of the pipe. This makes cleaning the pipes and maintenance of flow through the bypass path a significant draw back. Any moving parts associated with bypass tubes are problematic as the fine particles tend to interfere with these mechanisms.

[0012] The preferred option is to measure the dry particulate material in the pipe without a separate sampling tube or the need for sample diversion. The difficulty with measuring in the flow within the pipe is to avoid disruption of the flow and to adjust the pipe throughput in real-time to situations where the flow does not provide adequate optical density.

[0013] Therefore, there is a significant need to be able to take inline measurements across multiple pipes each with variable flow rates.

Summary

[0014] It is an object of the present invention to overcome or ameliorate at least one or more of the disadvantages of the prior art, or to provide a useful alternative. [0015] The key challenge of measuring particulate characteristics flowing through a pipe is to do so interfering with the particulate material flow and to manage optical measurements when there is low flow rates that do not allow adequate optical density to measure the continuous stream of the particulate matter in the pipe.

[0016] According to a first aspect of the present invention, there is provided a system for in-line sampling of particulate matter. The system may comprise a frame adapted to sealingly engage with a particulate matter transport pipe. The frame may comprise a sample ledge adapted to protrude into the pipe to receive and accumulate particulate matter flowing through the pipe. The system may further comprise a housing adapted to receive a sampling device. The system may further comprise an inspection window located within, or adjacent to, the sample ledge. The system may further comprise a gas inlet port adapted to receive and transport a jet of gas. The system may further comprise a gas outlet port adapted to direct the jet of gas to flow across the sample ledge so as to clear accumulated particulate matter from the sample ledge.

[0017] According to a particular arrangement of the first aspect, there is provided a system for in-line sampling of particulate matter, comprising: a frame adapted to sealingly engage with a particulate matter transport pipe, the frame comprising: a sample ledge adapted to protrude into the pipe to receive and accumulate particulate matter flowing through the pipe; a housing adapted to receive a sampling device; an inspection window located within, or adjacent to the sample ledge such ; a gas inlet port adapted to receive and transport a jet of gas; and a gas outlet port adapted to direct the jet of gas to flow across the sample ledge so as to clear accumulated particulate matter from the sample ledge.

[0018] The system may further comprise an optical source for emitting optical radiation through the inspection window. The optical source may be adapted to illuminate particulate matter accumulated on the sample ledge. [0019] The system may further comprise an optical detector adapted to detect optical radiation reflected from the accumulated particulate matter through the inspection window.

[0020] The optical source may be a narrow linewidth optical source; or a broadband optical source. The optical source may be a near-infrared optical source; a visible optical source; a far-infrared optical source; or an ultraviolet optical source. The optical source may be a tunable optical source.

[0021] The system may further comprise a comprise a processor and memory, wherein the processor is configured for: controlling the optical source; receiving and analysing optical signals detected by the detector; and initiating a jet of gas to clear accumulated particulate matter from the sample ledge. The processor may be configured to execute program instructions for: irradiating particulate matter accumulated on the sample ledge with optical radiation generated by the optical source; monitoring reflected optical radiation from accumulated particulate matter on the sample ledge to determine the optical density of the accumulated particulate matter; determining when the optical density of the accumulated particulate matter is the equivalent of infinite optical density; measuring one or more attributes of the accumulated particulate matter from the reflected optical radiation received by the optical detector; and activating a jet of gas to be directed from the gas outlet port across the sample ledge to clear the accumulated particulate matter from the sample ledge.

[0022] The frame may comprise upper and lower sealing lips adapted to engage with a wall of the pipe thereby to seal the pipe when the frame is installed therein.

[0023] The inspection window may comprise an optically transparent inspection window adapted to permit optical inspection using the sampling device of particulate matter accumulated on the sample ledge.

[0024] The gas inlet port may be connected to a compressed gas source. The gas may be an inert gas. The gas may be air. The compressed gas may have a pressure of between about 100 kPa to about 1000kPa. The compressed gas may have a pressure of between about 200 kPa to about 800k Pa. The compressed gas may have a pressure of about 100 kPa, 150 kPa, 200 kPa, 250 kPa, 300 kPa, 350 kPa, 400 kPa, 450 kPa, 500 kPa, 550 kPa, 600 kPa, 650 kPa, 700 kPa, 750 kPa, 800 kPa, 850 kPa, 900 kPa, 950 kPa, or about 1000 kPa.

[0025] The frame may be installed in a pipe with a slope angle of between about 0° to about 80° to the vertical. The frame may be installed in a pipe with a slope angle of between about 0° to about 80° to the vertical, or about 5° to about 75°, about 10° to about 70°, about 15° to about 65°, about 20° to about 60°, about 25° to about 55°, about 30° to about 50°, about 35° to about 45°. The frame may be installed in a pipe with a slope angle of about 0°, 5°, 10°, 15°, 20°, 25°, 30°, 35°, 40°, 45°, 50°, 55°, 60°, 65°, 70°, 75°, or about 80°. The frame may be installed in a pipe downstream of a pipe section with a slope angle of between about 0° to about 80° to the vertical.

[0026] The sample device may comprise an optical source for emitting optical radiation through the inspection window. The sample device may further comprise an optical detector adapted to detect optical radiation reflected from the accumulated particulate matter through the inspection window. The sample device may further comprise a processor. The processor may comprise program instructions for irradiating particulate matter accumulated on the sample ledge with optical radiation generated by the optical source. The processor may further comprise program instructions for monitoring reflected optical radiation from accumulated particulate matter on the sample ledge to determine the optical density of the accumulated particulate matter. The processor may further comprise program instructions for determining when the optical density of the accumulated particulate matter is the equivalent of infinite optical density. The processor may further comprise program instructions for measuring one or more attributes of the accumulated particulate matter from the reflected optical radiation received by the optical detector. The processor may further comprise program instructions for activating a jet of gas to be directed from the gas outlet port to the sample ledge to clear the accumulated particulate matter from the sample ledge. In particular arrangements the jet of gas may be directed from the gas outlet port to the ledge from on top of the ledge to clear the accumulated particulate matter from the sample ledge. Alternatively, gas may be directed across the ledge or from the bottom of the ledge to clear the accumulated particulate matter from the sample ledge. [0027] According to a second aspect of the present invention , there is provided a method for in-line sampling of particulate matter. The method may comprise the step of providing a frame adapted to sealingly engage with a particulate matter transport pipe. The frame may comprise: a sample ledge adapted to protrude into the pipe to receive and accumulate particulate matter flowing through the pipe; a housing adapted to receive a sampling device; an inspection window located within, or adjacent to the sample ledge; a gas inlet port adapted to receive and transport a jet of gas; and a gas outlet port adapted to direct the jet of gas to flow across the sample ledge so as to clear accumulated particulate matter from the sample ledge.

[0028] The method may comprise the further step of providing a sampling device comprising an optical source and an optical detector. The method may comprise the further step of irradiating particulate matter accumulated on the sample ledge with optical radiation generated by the optical source. The method may comprise the further step of monitoring reflected optical radiation from accumulated particulate matter on the sample ledge to determine the optical density of the accumulated particulate matter. The method may comprise the further step of determining when the optical density of the accumulated particulate matter is the equivalent of infinite optical density. The method may comprise the further step of measuring one or more attributes of the accumulated particulate matter from the reflected optical radiation received by the optical detector. The method may comprise the further step of activating a jet of gas to be directed from the gas outlet port across the sample ledge to clear the accumulated particulate matter from the sample ledge.

[0029] According to a particular arrangement of the second aspect, there is provided a method for in-line sampling of particulate matter, comprising the steps of: providing a frame adapted to sealingly engage with a particulate matter transport pipe, the frame comprising: a sample ledge adapted to protrude into the pipe to receive and accumulate particulate matter flowing through the pipe; a housing adapted to receive a sampling device; an inspection window located within, or adjacent to the sample ledge; a gas inlet port adapted to receive and transport a jet of gas; and a gas outlet port adapted to direct the jet of gas to flow across the sample ledge so as to clear accumulated particulate matter from the sample ledge; the method may further comprise the steps of: providing a sampling device comprising an optical source and an optical detector; irradiating particulate matter accumulated on the sample ledge with optical radiation generated by the optical source; monitoring reflected optical radiation from accumulated particulate matter on the sample ledge to determine the optical density of the accumulated particulate matter; determining when the optical density of the accumulated particulate matter is the equivalent of infinite optical density; measuring one or more attributes of the accumulated particulate matter from the reflected optical radiation received by the optical detector; and activating a jet of gas to be directed from the gas outlet port across the sample ledge to clear the accumulated particulate matter from the sample ledge.

[0030] The inspection window may comprise an optically transparent inspection window adapted to permit optical inspection using the sampling device of particulate matter accumulated on the sample ledge.

[0031 ] The sampling device may further comprise a processor and memory, wherein the processor is configured for: controlling the optical source; receiving and analysing optical signals detected by the detector; and initiating a jet of gas to clear accumulated particulate matter from the sample ledge. The processor may be configured to retrieve program instructions from the memory and execute the program instructions. The program instructions may be configured for: irradiating particulate matter accumulated on the sample ledge with optical radiation generated by the optical source; monitoring reflected optical radiation from accumulated particulate matter on the sample ledge to determine the optical density of the accumulated particulate matter; determining when the optical density of the accumulated particulate matter is the equivalent of infinite optical density; measuring one or more attributes of the accumulated particulate matter from the reflected optical radiation received by the optical detector; and activating a jet of gas to be directed from the gas outlet port across the sample ledge to clear the accumulated particulate matter from the sample ledge. [0032] The gas inlet port may be connected to a compressed gas source.

[0033] The optical density of the accumulated particulate matter on the sample ledge may be measured in real-time or near-real-time. The one or more parameters of the accumulated particulate matter on the sample ledge may be measured in real-time or near-real-time.

[0034] According to a third aspect of the present invention, there is provided a kit for a system for in-line sampling of particulate matter. The kit may comprise an electronic module. The electronic module may comprise a light source. The electronic module may further comprise an optical detector. The electronic module may further comprise a processor. The kit may further comprise a pneumatic module adapted for clearing samples of the particulate off a ledge. The kit may further comprise a curved face plate for in-line attachment of optical, electronic and pneumatic modules to a pipe wherein the curved faceplate is provided in a plurality of options suitable to attach the system to a pipe of a size matching the selected face plate. The kit may further comprise a ledge module configured to connect to the face plate such that, when connected, the ledge is located within the pipe to receive particulate matter flowing through the pipe when in use, wherein the ledge module is provided in a plurality of size and configuration options to suit the slope on the pipe in which the system is to be installed. [0035] According to a particular aspect of the third aspect of the present invention, there is provided a kit for a system for in-line sampling of particulate matter, the kit comprising: an optical module comprising: an optical source; and a optical detector; an electronic module comprising: a processor; memory; and a communication module; a pneumatic module adapted for clearing samples of the particulate off a ledge; a curved face plate for in-line attachment of the optical, electronic and pneumatic modules to a pipe wherein the curved faceplate is provided in a plurality of options suitable to attach the system to a pipe of a size matching the selected face plate; and a ledge module configured to connect to the face plate such that, when connected, the ledge is located within the pipe to receive particulate matter flowing through the pipe when in use; wherein the ledge module is provided in a plurality of size and configuration options to suit the slope on the pipe in which the system is to be installed.

[0036] It will be appreciated that particular features of each of the above aspects may be used with other aspects, embodiments and arrangements of the invention as disclosed herein.

Brief Description of the Drawings

[0037] Notwithstanding any other forms which may fall within the scope of the present invention, a preferred embodiment / preferred embodiments of the invention will now be described, by way of example only, with reference to the accompanying drawings in which: Figure 1 shows a cross-section of an in-line particulate sampling device according to the present disclosure;

Figure 2 shows the in-line particulate sampling device of Figure 1 seen in cross section when engaged with a particulate flow pipe;

Figure 3 shows the process of particulate matter flowing through a pipe and accumulating on a ledge of the in-line particulate sampling device of Figure 1 ;

Figure 4 shows a plot of incident light reflectance from a flour sample showing the wavelength variance of the reflectance amount to define infinite optical density of an accumulated particulate sample of flour;

Figure 5 shows a graph of real-time measurement of moisture content percentage of plurality of particulate matter flows measured using in-line particulate sampling devices of Figure 1 positioned at various locations and/or in various flow lines in a mill;

Figure 6 shows a graph of real-time measurement of protein content percentage of a plurality of particulate matter flows measured using in-line particulate sampling devices of Figure 1 positioned at various locations and/or in various flow lines in a mill; and

Figures 7 and 8 show graphs of real-time fault detection using in-line particulate sampling devices of Figure 1 positioned at various locations and/or in various flow lines in a mill.

Definitions

[0038] The following definitions are provided as general definitions and should in no way limit the scope of the present invention to those terms alone but are put forth for a better understanding of the following description.

[0039] Unless defined otherwise, all technical and scientific terminology used herein have the same meaning as commonly understood by those of ordinary skill in the art to which the invention belongs. It will be further understood that terms used herein should be interpreted as having a meaning that is consistent with their meaning in the context of this specification and the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein. For the purposes of the present invention, additional terms are defined below. Furthermore, all definitions, as defined and used herein, should be understood to control over dictionary definitions, definitions in documents incorporated by reference, and/or ordinary meanings of the defined terms unless there is doubt as to the meaning of a particular term, in which case the common dictionary definition and/or common usage of the term will prevail.

[0040] For the purposes of the present invention, the following terms are defined below:

[0041 ] The articles “a” and “an” are used herein to refer to one or to more than one (i.e. to at least one) of the grammatical object of the article. By way of example, “an element’ refers to one element or more than one element.

[0042] The term “about’ is used herein to refer to quantities that vary by as much as 30%, preferably by as much as 20%, and more preferably by as much as 10% to a reference quantity. The use of the word “about’ to qualify a number is merely an express indication that the number is not to be construed as a precise value.

[0043] Throughout this specification, unless the context requires otherwise, the words “comprise”, “comprises” and “comprising” will be understood in an inclusive sense, i.e. to specify or imply the inclusion of a stated feature or step or element or group of steps or elements but not the exclusion or addition of any other feature or step or element or group of steps or elements of further features in various embodiments of the invention.

[0044] Any one of the terms “including” or “which includes” or “that includes” as used herein is also an open term that also means including at least the elements/features that follow the term, but not excluding others. Thus, “including” is synonymous with and means “comprising”.

[0045] In the claims, as well as in the summary above and the description below, all transitional phrases such as “comprising”, “including”, “carrying”, “having”, “containing”, “involving”, “holding”, “composed of’, and the like are to be understood to be open-ended, i.e. to mean “including but not limited to”. Only the transitional phrases “consisting of’ and “consisting essentially of’ alone shall be closed or semi-closed transitional phrases, respectively. [0046] Although any methods and materials similar or equivalent to those described herein can be used in the practice or testing of the present invention, preferred methods and materials are described. It will be appreciated that the methods, apparatus and systems described herein may be implemented in a variety of ways and for a variety of purposes. The description here is by way of example only.

[0047] The term, “real-time”, for example “displaying real-time data”, refers to the display of the data without intentional delay, given the processing limitations of the system and the time required to accurately measure the data. Similarly, a process occurring “in real time” refers to operation of the process without intentional delay or in which some kind of operation occurs simultaneously (or nearly simultaneously) with when it is happening.

[0048] The term, “near-real-time”, for example “obtaining real-time or near-real-time data” refers to the obtaining of data either without intentional delay {“real-time”) or as close to real-time as practically possible (i.e. with a small, but minimal, amount of delay whether intentional or not within the constraints and processing limitations of the of the system for obtaining and recording or transmitting the data.

[0049] Although any methods and materials similar or equivalent to those described herein can be used in the practice or testing of the present invention, preferred methods and materials are described. It will be appreciated that the methods, apparatus and systems described herein may be implemented in a variety of ways and for a variety of purposes. The description here is by way of example only>

[0050] Also, various inventive concepts may be embodied as one or more methods, of which an example has been provided. The acts performed as part of the method may be ordered in any suitable way. Accordingly, embodiments may be constructed in which acts are performed in an order different than illustrated, which may include performing some acts simultaneously, even though shown as sequential acts in illustrative embodiments.

[0051] The phrase “ and/or ", as used herein in the specification and in the claims, should be understood to mean “either or both” of the elements so conjoined, i.e. elements that are conjunctively present in some cases and disjunctively present in other cases. Multiple elements listed with “and/oh’ should be construed in the same fashion, i.e. “one or more” of the elements so conjoined. Other elements may optionally be present other than the elements specifically identified by the “and/oh’ clause, whether related or unrelated to those elements specifically identified. Thus, as a non-limiting example, a reference to “A and/or B”, when used in conjunction with open-ended language such as “comprising” can refer, in one embodiment, to A only (optionally including elements other than B); in another embodiment, to B only (optionally including elements other than A); in yet another embodiment, to both A and B (optionally including other elements); etc.

[0052] As used herein in the specification and in the claims, “of should be understood to have the same meaning as “and/of as defined above. For example, when separating items in a list, “of or “and/of shall be interpreted as being inclusive, i.e. the inclusion of at least one, but also including more than one, of a number or list of elements, and, optionally, additional unlisted items. Only terms clearly indicated to the contrary, such as “only one of’ or “exactly one of’, or, when used in the claims, “consisting of will refer to the inclusion of exactly one element of a number or list of elements. In general, the term “of as used herein shall only be interpreted as indicating exclusive alternatives (i.e. “one or the other but not both”) when preceded by terms of exclusivity, such as “eithef, “one of’, “only one of’, or “exactly one of’. “Consisting essentially of’, when used in the claims, shall have its ordinary meaning as used in the field of patent law>.

[0053] As used herein in the specification and in the claims, the phrase “at least one”, in reference to a list of one or more elements, should be understood to mean at least one element selected from any one or more of the elements in the list of elements, but not necessarily including at least one of each and every element specifically listed within the list of elements and not excluding any combinations of elements in the list of elements. This definition also allows that elements may optionally be present other than the elements specifically identified within the list of elements to which the phrase “at least one” refers, whether related or unrelated to those elements specifically identified. Thus, as a non-limiting example, “at least one of A and B” (or, equivalently, “at least one of A or B”, or, equivalently “at least one of A and/or B”) can refer, in one embodiment, to at least one, optionally including more than one, A, with no B present (and optionally including elements other than B); in another embodiment, to at least one, optionally including more than one, B, with no A present (and optionally including elements other than A); in yet another embodiment, to at least one, optionally including more than one, A, and at least one, optionally including more than one, B (and optionally including other elements); etc.

[0054] For the purpose of this specification, where method steps are described in sequence, the sequence does not necessarily mean that the steps are to be carried out in chronological order in that sequence, unless there is no other logical manner of interpreting the sequence.

[0055] In addition, where features or aspects of the invention are described in terms of Markush groups, those skilled in the art will recognise that the invention is also thereby described in terms of any individual member or subgroup of members of the Markush group.

Detailed Description

[0056] It should be noted in the following description that like or the same reference numerals in different embodiments denote the same or similar features.

[0057] Referring to the figures, Figure 1 shows a perspective view of a cross section of an in-line particulate sampling system 100 comprising a sampling system device frame 101 adapted to engage with a particulate matter flow pipe 50 as used in, for example, a flour or grain mill, to transport particulate matter 200. The system 100 described below may also be used for sampling and analysis of a variety of particulate flow within a pipe including, for example, a range of grains including soy, oats, chickpeas feed grains etc. ; powdered foods such as powdered milk; or powdered pharmaceutical products, either as a precursor to formation of tablet form of pharmaceutical or for processing of powdered products.

[0058] Figure 2 shows a cross section of sampling system 100 adapted to be installed in-line with a pipe for particulate flow. Sampling device frame 101 is placed in the pipe and comprises a sample ledge 103 which protrudes into pipe 50 such that ledge 103 is located in the particle flow 200 of the pipe 50 without interfering with overall flow 200. Frame 101 comprises a curved face plate 104 and pipe engagement notches 102a and 102b adapted to engage with a pipe of similar diameter as curved face plate 104. In particular embodiments, frame 101 is provided in various sizes having a curved face plate 104 having a curvature of a particular diameter such that system 100 may be installed in pipes 50 of various diameters by selection of the appropriate frame 101. The sampling system 100 does not require moving parts within the pipe 50. It is also designed to minimise disruption to the flow 200 and to avoid potential damage to the sampling system 100 itself which may be caused by the particles 200 flowing through the pipe 50. This significantly reduces the risk of operational problems with the device 100. It is also designed to avoid potential damage caused by the particles 200 (hard fine particles moving at a high velocity can cause significant abrasion), therefore probes or other devices that protrude into the particulate flow, as observed in prior sampling and/or measurement solutions, can experience problems. The system 100 is also designed to be food safe and so there is no risk of contamination of the flow with physical objects of system 100 which come into contact with the particles 200 during use.

[0059] Sampling device frame 101 is configured to engage with a flow pipe 50 of a particular diameter, by first removing a section of the pipe wall and inserting sampling device frame 101 into the hole. Sampling device frame 101 comprises upper lip 101a and lower lip 101b which engage with the edges of the hole cut into the pipe to seal the pipe with sampling device 100 installed therein.

[0060] The modular embodiment of particulate sampling system 100 enables the system 100 to be installed in pipes of varied sizes and configurations in accordance with requirements.

[0061] Sampling device frame 101 further comprises a ledge 103 which protrudes into the interior of the pipe when frame 101 is installed therein. Ledge 103 is configured to be inserted into the flow of particulate matter such that a sample of particles in the particulate flow accumulates on the ledge 103. Ledge 103 comprises a sealed, optically transparent inspection window 105. Window 105 may be located either within or adjacent to the ledge 103 such that that accumulated particulate matter 201 on ledge 103 covers the inspection window 105 thereby to permit illumination of the accumulated particulate matter 201 by light 113 emitted from an optical source 111 of the system 100.

[0062] The sampling device frame 101 comprises a compartment 107 external to the pipe which is adapted to receive an optical sampling device 109 (in Figure 2) that measures when there is adequate optical density to take a measurement of reflected light that maximises the signal to noise ratio. Optical sampling device 109 further comprises an optical module 130 comprising an optical light source 111 such as a laser source or lamp source. The optical source 111 may comprise a laser source which may, for example, be an infrared laser source. The optical source 111 may be a lamp, for example a halogen lamp source, which emits light aver a broad wavelength range. An optical grating (not shown) may be located in the optical module 130 to permit tuning or scanning of the wavelength of light 113 emitted by broadband optical source 111 which is directed through window 105 onto the accumulated particulate matter 201 on sample ledge 103. Scanning or tuning the wavelength of the emitted light 113 enables measurement of spectral reflectance / absorption data of the accumulated particulate matter 201. In particular arrangements the light source may be adapted to emit light with a fixed wavelength, or equivalently, the combination of a broadband light source and a grating may be operated in a static or non-scanning mode where the light permitted to exit window 105 and illuminate the accumulated particulate matter 201 on ledge 103 is fixed at a desired wavelength and the attributes of the particulate matter 200 can be measured over time at the chosen wavelength.

[0063] The light source may be adapted to emit light at a desired wavelength or wavelength range, for example, the emitted light may be ultraviolet (with wavelengths of about 100 - 400 nm), -visible (with wavelengths of about 400-750 nm), near-infrared (with wavelengths of about 750-2500 nm), short-wavelength infrared (e.g. about 1300-1600 nm), mid-infrared light (with wavelengths of about 2,500-15,000 nm), or far- infrared light (with wavelengths of about 15,000 nm - 1 mm) to obtain spectral information of the particulate matter in the pipe.

[0064] Compartment 107 is configured to receive the sampling device such that the optical source 111 is aligned with ledge window 105 so that light 113 emitted from the optical source 111 passes through window 105 to irradiate particulate matter 200 which has accumulated over time onto ledge 103. Reflected light from accumulated sample 201 on ledge 103 is transmitted back through window 105 for detection by an optical detector 115 housed in optical module 130 within compartment 107 of the sampling system 100 to obtain absorption and/or spectral information with respect of the accumulated particulate matter 201. In particular arrangements, optical source 111 may comprise a narrow linewidth optical source 111 for measurement of absorption and/or spectral information at a selected frequency (wavelength) corresponding to the frequency (wavelength) of light emitted by optical source 111. In alternate arrangements, optical source 111 comprises either a broadband optical source, multi-frequency source (capable of emitting light at a plurality of frequencies, which may be distinct from each other) or frequency-scanning (tunable) optical source for measurement of absorption and/or spectral information of accumulated particulate matter 201 at one or more optical frequencies of light able to be emitted by source 111.

[0065] The sampling device housed in compartment 107 also comprises an optical detector 115 which continuously measures the reflected light from the particles accumulated on ledge 103. The sampling device is initially placed in a “waif mode which is designed to determine when there is sufficient accumulated particulate matter 201 on ledge 103 to be able to take as accurate and representative measurement of the properties of the accumulated particulate matter 201. In the wait mode, the sampling device 109 is continuously measuring the reflected light from the accumulated particulate matter 201 on ledge 103 with detector 115 to determine either:

• when the accumulated sample 201 provides the equivalent of infinite optical density (i.e. the accumulated sample 201 is dense enough that light 113 from the optical source 111 is not lost by transmission through the accumulated sample 201 or, alternatively,

• when there is adequate optical density in the particles 201 accumulated on ledge 103 to allow accurate and reproducible optical measurements to be made.

[0066] Compartment 107 is advantageously adapted for housing one or more sampling devices 109 or optical modules 130 interchangeably such that sampling devices may be swapped in or out of sampling system 100 e.g. for specific measurement and analysis of the accumulated particulate matter 201. For instance, a particular sampling device 109 comprising, for example, a near-infrared optical source 111 adapted for emitting light 113 having a wavelength between about 800 nm to about 2,500 nm may be housed in compartment 107 for measurement of particular parameters of the particles in particle flow 200 at a predetermine location in the particulate process whereas a different sampling device 109 or optical module 130 may be housed in a second sampling position (not shown) and having an optical source adapted for emitting light at a different wavelength (e.g. a visible wavelength between about 400 nm to about 750 nm; an ultraviolet wavelength between about 100 nm to about 400 nm; a mid-infrared wavelength between about 2,500 nm to about 15,000 nm; or a far infrared wavelength between about 15,000 nm to about 1 mm).

[0067] Sampling device 109 further includes an electronic module 110 housed within device 109 for controlling the components of system 100. Electronic module 110 comprises a processor 112 and memory 114 comprising volatile and non-volatile memory portions. Processor 112 is adapted to retrieve and execute program instructions stored in memory 114. Program instructions in a particular arrangement include instructions for: irradiating particulate matter 200 accumulated 201 on the sample ledge 103 with optical radiation 113 generated by optical source 111; monitoring reflected optical radiation 116 detected by detector 115 from accumulated particulate matter 201 on the sample ledge 103 to determine the optical density of the accumulated particulate matter 201; determining when the optical density of the accumulated particulate matter 201 is the equivalent of infinite optical density; measuring one or more attributes of the accumulated particulate matter 201 from the reflected optical radiation 116 received by the optical detector 115; and activating a jet of gas to be directed from the gas outlet port 119 across the sample ledge 130 to clear the accumulated particulate matter 201 from the sample ledge 103. The one or more attributes of the particulate matter 200 may include one or more of, for example: moisture, ash; protein, colour, ash, starch, damage and/or oil content. Other characteristics of particulate matter 200 may also be measured as would be appreciated by the skilled addressee dependent on the nature of the particulate matter 200. Measurement of the characteristics of particulate matter 200 may comprise analysis of the light 113 absorbed by particulate matter 200 and/or reflected light from particulate matter 200. The analysis may comprise one or more of spectroscopic analysis, absorption analysis, or transmission analysis.

[0068] Electronic module 110 further includes a communication module 118 for wired and/or wireless communication with system 100. Communication module may be a wired network, such as a wired Ethernet™ network, or a wireless network, such as a Bluetooth™ network, IEEE 802.11 network, or cellular network (e.g. a 3G or 4G telecommunications network). The communication module 118 may be adapted to connect to a local area network (LAN), such as a home or office computer network, or a wide area network (WAN), such as the Internet, or a private WAN.

[0069] The processor 112 may be a reduced instruction set computer (RISC) or complex instruction set computer (CISC) processor or the like. Memory 114 may be a magnetic disk hard drive or a solid-state disk drive. Computer program code instructions may be loaded into memory 114 or from a connected network using communication module 118. An operating system and one or more software applications are loaded from memory 210 into processor 112. The processor 114 decodes the instructions into machine code, executes the instructions and stores one or more intermediate results in memory 114. [0070] In this manner, the instructions stored in the memory 114, when retrieved and executed by the processor 112, may configure system 100 as a special-purpose machine that may perform the functions described herein.

[0071] Once the sampling device 109 makes the determination (from the optical density measurement) that an accurate measurement can be made, it switches into a “ measure ” mode to measure and analyse the reflected optical signals from the accumulated particulate matter 201 on ledge 103 to record spectral information of the particulate matter 201 including reflected spectra from the particulate matter 201.

[0072] In alternate arrangements, system 100 may include a second detector (not shown) positioned above sample ledge 103 and adapted to receive and detect light from the optical source 111 which has passed through window 105 and/or through any accumulated particulate matter 201 on sample ledge 103. The second detector may be adapted to measure optical transmission of light emitted by source 111 through accumulated particular matter 201 on ledge 103 to determine the optical density of the accumulated particles 201 or, in other arrangements, the second detector may be adapted to also measure spectral attributes of particulate matter 200 by detecting the wavelength dependence characteristics of light transmitted through the particles 201.

[0073] The system 100 is advantageously connected to a compressed gas source for supply of gas flow to clear the accumulated particulate matter 201 from ledge 103 after each measurement. Once the measurement is completed a jet of compressed gas, (for example, air, ambient air or an inert gas such as, for example nitrogen) is used to clear particulate matter 201 from ledge 103. In particular embodiments, the system 100 includes a pneumatic module configured to utilise compressed air from a pneumatic system 203 associated with the mill in which the system 100 is installed, since this is readily available in all mills and is cheap. However, any compressed gas can be used, including inert gases or air, the key criteria being that the gas is at sufficient pressure to clear the particulate matter 201 from ledge 103 in preparation to receive further particulate matter flowing through pipe 50 for a subsequent measurement. An example embodiment uses compressed air from pneumatic system 203 having a pressure of about 600kPa, because this is what is readily available in a typical flour mill, and this has been found to work well with prototypes of the in-line particulate sampling system 100 disclosed herein. However, typical pressures in the range of about 100 kPa to about 1000kPa, preferably about 200kPa to about 800kPa, may be used. [0074] In other embodiments, the pressurised gas used to clear the particulate matter 201 from the ledge 103 has a pressure of about or greater than 200kPa and preferably greater than about 300kPa. Referring to Figure 1 , in use, the pneumatic module receives the pressurised gas into inlet port 117 and directs it to one or more outlet ports or nozzles 119 (or an array of such outlet ports) directed at ledge 103 to blow the accumulated particulate matter 201 from ledge 103 thereby enabling system 100 to self-clean the ledge 103 on demand (initiated by a control signal from processor 112 of device 109) and make it ready to receive further particulate matter 200 from the particulate flow in the pipe 50 to conduct a further measurement. In a particular arrangement, for example, as depicted in Figure 1 , nozzle 119 is an elongate aperture extending the length of sample ledge 103 and in fluid communication with inlet port 117 to receive air flow from a connected pneumatic system 203. Once the ledge 103 is cleared with the compressed gas, the sampling device 109 switches back to the wait mode to monitor further particles 201 accumulating on ledge 103 as before until a sufficient optical density of the particles is achieved for a further measurement to occur.

[0075] The sampling rate (i.e. the time between measurements recorded by the sampling device 109) will depend on the rate of flow of particulate matter 200 within the pipe. Pipes with high particulate flow rate will accumulate particulate matter 201 on ledge 103 quickly such that the required optical density of accumulated particulate matter 201 will be achieved quickly. Thus, the sampling rate will be higher than for a system 100 installed in a pipe which has a low particulate flow rate through the pipe.

[0076] The accumulation rate of particulate matter 201 on sample ledge 103 can also be utilised to identify potential faults on the mill process. For example, a typical fault in the mill process will result in a change in the flow rate of particulate matter 201 through the pipes 50. A fault in the mill process will usually result in a reduction or complete stoppage of particulate matter flow through the pipes. This reduction in flow rate is readily recognised by system 100 as either a reduced rate of particulate matter 201 accumulation on sample ledge 103 (in event of a reduction in flow) or no particulate matter sample accumulation on sample ledge 103 as expected from past or historical sample rates. Conversely, in certain circumstances a fault in the mill process may result in an increase in the flow rate or quantity of particulate matter 201 flowing through pipes 50. In this case, an increase in the accumulation rate of particulate matter 201 on sample ledge 301 may also be identified as a fault in the mill process and appropriate alerting of mill staff or commencement of remedial actions may be undertaken by system 100.

[0077] A further example of fault detection in a working mill may include monitoring the levels of particular mill products and/or by-products, such as, for example, ash content in the particulate flow. A tear in the plansifter screen will result in contamination of bran and germ in the flour stream resulting in an increase in the ash content. When a sudden or gradual increase in ash occurs over a relatively short period of time, this is a sign that there is a tear in the screen or leakage of undesirable by-products into the flour stream. This will contaminate the end product. The system 100 can be used to not only identify that this has occurred, for example by a sudden increase in the ash level resulting from a burst screen, but also identify the zone of the mill where the fault has occurred enabling the miller to take quick corrective action.

[0078] Figure 3 shows a particular arrangement of a pipe 50 and a ledge 103 protruding into the interior of pipe 50 into the particulate flow 200 flowing through the pipe. Pipe section 51 upstream of ledge 103 is connected to a vertical section 53 of pipe 50 in which sampling system 100 comprising ledge 103 is installed. Particles 200 flowing through pipe section 51 flow onto the wall of the vertical pipe section 53 wherein the sampling system 100 is installed such that ledge 103 is located on the wall impacted by the particles 200 such that particles begin to accumulate on ledge 103 for optical measurement as described above when the optical density of the accumulated particles 201 is sufficient. System 100 may be installed in a flow pipe 50 of the mill with a slope angle 55 between 0° to about 80° to the vertical. In alternate arrangements, for example in a mill line configured for relatively low flow levels compared to flows in a typical commercial mill arrangement, the sampling system 100 may in installed in a pipe with a slope angle 55 between about 0° to about 45°, preferably between about 10° to about 20° to the vertical to ensure sufficient engagement of the particulate flow 200 through pipe 50 with the ledge 103 of the sampling system 100. In particular arrangements, the sampling system 100 is installed in a vertical section 53 in pipe 50 which is downstream of a sloping section 51 of pipe 50 wherein the sampling system 100 is advantageously installed at a distal wall 54 of pipe section 53 (as depicted in Figure 3) thereby to receive the particulate matter 200 as it falls through pipe 50 onto sample ledge 103 adjacent or protruding into pipe 50 from distal wall 54. The sloping section 51 of pipe 50 may have an angle to the vertical of between about 0° to about 80° to the vertical. [0079] The particular advantages of particulate flow system 100 described above include:

• It works in both high and low flow rate situations - only the sampling rate will be affected for pipes of different flow rates>

• It continually measures in real-time, or near-real-time, the optical density of the accumulated particles 201 on ledge 103 to automatically determine when there is enough accumulated particulate matter 201 to perform an accurate and reproducible optical measurement of the properties of the particles flowing in the pipe.

• It is self-cleaning through the use of a directed jet of air or inert gas flow over the ledge 103 to clear the accumulated particles 201 and ready the system 100 for accumulation of further particles in the flow for subsequent measurements.

[0080] In particular embodiments, the particulate sampling system 100 may be manufactured and provided in a kit form comprising:

• a module or modules including the electronic and optical systems (i.e. optical source 111 , optical detector 115, and processing (112) / memory (114) capability) and pneumatic systems for clearing the samples off the ledge - in particular embodiments, the optical, electronic systems and/or the pneumatic systems may be included with a frame 101 provided in the kit;

• a curved face plate 104 for attaching the optical, electronic and pneumatic systems to the pipe 50 in which the system 100 is to be installed wherein the curved face plate 104 is provided in a plurality of options suitable to attach the system 100 to a pipe 50 of a size matching the selected face plate 104;

• a ledge module comprising ledge 103 that is provided in a plurality of ledge options and a range of sizes to suit the slope 55 on the pipe 50 at the location in which the system 100 is to be installed.

[0081] Sample system 100 may, in some arrangements comprise a plurality of optical sources. For example, a first optical source may be adapted to monitor the optical density of the accumulated particulate matter 201 on the sample ledge 103. When the particulate matter reaches a desired optical density, a second optical source may be activated to irradiate the accumulated particulate matter 201 such that the radiation from the second optical source which is reflected from accumulated particulate matter 201 is detected by optical detector 115 for analysis of one or more properties of the accumulated particulate matter 201 .

[0082] In particular arrangements, the same detector device 115 is used to make both the optical density measurement and the final measurement as described above. During the “waif mode of the system 100, the detector 115 is advantageously used in a fast “ measure ” mode as would be appreciated by the skilled addressee (for example, with low (short) integration time or scan time e.g. of less than 10 seconds) to make a rapid determination of optical density of the particulate matter 201 as it accumulates on ledge 103. Once a desired optical density is reached, the system 100 switches to the measure mode (via the processor of sample device 109) wherein the integration time or scan time of detector 115 is increased to measure spectral information of the particulate matter 200 accumulated on ledge 103. In particular arrangements of system 100, it is configured to monitor the accumulated particulate matter 201 in the wait mode until infinite optical density at the measurement wavelength is achieved. In these arrangements, infinite optical density is a function of the measurement wavelength for a particular substance to be tested (e.g. flour particulate matter flowing in pipes in a flour mill as discussed above). At a selected measurement wavelength (i.e. the wavelength of light emitted by optical source 109), infinite optical density is defined in accordance with two criteria:

1. Zero, or near-zero transmission

[0083] Zero, or near-zero transmission (e.g. less than 3%, preferably less than 1% transmission) of the measurement wavelength through the accumulated particulate matter 201 i.e. the sample is considered to have achieved infinite optical density (the accumulated sample 201 is dense enough that light from the optical source 109 is not lost by transmission through the accumulated sample 201) when the reflectance at the measurement wavelength is greater than a defined limit for the selected wavelength.

[0084] Specifically, infinite optical density is considered to be achieved when no light from optical source 109 is transmitted through the accumulated particulate sample 201 on the ledge 103. This means that the light from source 103 is either: absorbed by the constituents comprising particulate sample 201 (e.g. moisture, starch, protein, fibre, etc); scattered by the accumulated particulate matter 201 (dependent upon the size and shape of the particles on ledge 103; or is reflected back to detector 115 housed in system 100. For example, referring to Figure 4, at a wavelength of 1350nm, the signal reflected from the accumulated sample 201 to achieve infinite optical density must be greater than 75% of the incident light. The required level of reflectance can be set for different wavelengths. At each specific wavelength, the required reflectance will be different depending upon the sample absorption at the chosen wavelength and the wavelength and particle dimension dependence on scattering of the specific chosen wavelength.

[0085] For example, at a chosen source wavelength of 1350nm from source 109, infinite optical density is achieved with a reflectance of about 75% of the source light: at 1800nm, infinite optical density occurs at a reflectance of about 50%; and at 2200nm, infinite optical density occurs at a reflectance of about 30% reflectance from the accumulated sample 201. To determine infinite optical density, reflectance at a single or at multiple wavelengths can be used.

[0086] In particular alternate arrangements, a secondary detector (not shown) may be provided above ledge 103 to measure the transmission of light from optical source 109 through the particulate matter as it accumulates 201 on ledge 103. In this arrangement for measuring the optical density, the secondary detector would only be active during the wait mode of sampling system 100 and would monitor the transmitted light from source 109 until approximately no light (for example the transmitted light detected falls to below about 1% of the peak transmitted light when no sample is present on ledge 103) is transmitted indicating that infinite optical density had been achieved, at which time system 100 switches to the measure mode to record spectral information of accumulated particulate matter 201 from reflected light from source 109 detected by detector 115 housed within system 100.

2. Zero- or near-zero change

[0087] Zero- or near-zero change (e.g. less than 3%, preferably less than 1% change) in reflected (or transmitted) light measurements, i.e. the sample is considered to have achieved infinite optical density when consecutive scans over a predetermined time (for example, between about 5s to 30s, and preferably about 10 seconds or less) result in a percentage change in the reflectance of less than about 3%, and preferably less than about 1 %.

[0088] In this method, infinite optical density is considered to have been achieved when measurement of the light reflected from accumulated sample 201 no longer changes between successive measurements by detector 115.

[0089] As noted above, infinite optical density of the accumulated particulate matter 201 is not a strict requirement for obtaining sample measurements as the optical density only needs to be sufficiently high to achieve meaningful and repeatable results, which would depend on the specific requirements of the measurement goals. However, where the application permits the additional time necessary to allow the accumulated particulate matter 201 to build up to a quantity sufficient to achieve infinite optical density, this would likely be preferred for measurement consistency.

[0090] In particular arrangements of system 100, a measurement wavelength of 1350nm is selected, however, wavelengths other than 1350nm could be used and for each wavelength the percentage of sample reflectance corresponding to infinite optical density would be different. Figure 4 shows a graph of the % reflectance (plot 41) of a sample of flour corresponding to infinite optical density of flour particulate matter as a function of wavelength. Figure 4 indicates that at longer measurement wavelengths, the sample reflectance necessary to meet the criteria of infinite optical density for flour is less than 40% or even as low as about 30% for a measurement wavelength of about 2500nm.

[0091] In further arrangements, it is possible that sample device comprises an optical source and optical detector located above ledge 103 and the monitoring of accumulating particulate matter and sample spectral measurements may be obtained in a reflectance mode from above ledge 103 (and thus potentially negating the need for window 105 on ledge 103), however, this configuration is considered to be a more difficult configuration and would provide no significant, if any, advantage over housing the optical source 109 and detector 115 below ledge 103 within sampling system 100.

[0092] Sample system 100 further comprises a processor and memory connected, at least, to the optical source(s), the optical detector and the compressed gas source. The memory comprises program instructions which are executed by the processor to autonomously perform real-time or near-real-time sample analysis of the particulate matter flowing through the pipe 50. In a particular arrangement, the program instructions are executed to perform a method comprising the steps of: irradiating particulate matter

200 accumulated 201 on the sample ledge 103 with optical radiation generated by optical source 111 ; monitoring reflected optical radiation from accumulated particulate matter

201 on the sample ledge 103 to determine the optical density of the accumulated particulate matter 201 ; determining when the optical density of the accumulated particulate matter 201 is the equivalent of infinite optical density; measuring one or more attributes of the accumulated particulate matter 201 from the reflected optical radiation received by the optical detector 115; and activating a jet of gas to be directed from the gas outlet port across the sample ledge to clear the accumulated particulate matter 201 from the sample ledge 103.

Example Operation

[0093] Sensor system 100 has been extensively tested in an experimental flour mill having a capacity of 650 kg per hour which, whilst a reduced rate from commercial mill operations, is sufficient for comparative results to commercial mills, whilst being small enough to suit training and research activities. The test mill includes 4 break passages, 7 reduction passages, pin mills and detachers, 2 purifiers and a plansifter. Thus, the test mill is able to conduct meaningful and scalable test situations for a full milling evaluation, including cumulative ash and protein curves on batch sizes as small as only 1000kg of wheat. In the operational examples described herein, system 100 was fitted with an optical source comprising a halogen lamp adapted for emitting light in the 1200 nm to 2600 nm range, in conjunction with an optical grating (not shown) to tune the wavelength range and scan the accumulated particulate matter 201 across the effective output range of the halogen lamp source 111. The optical power of light 113 permitted to illuminate the accumulated particulate matter 201 must be low enough so as to not result in heating of the accumulated particles 201 as this will change the measured properties. In the present examples, the total light output of the halogen lamp source 111 was limited to a maximum of 3 watts. As would be readily appreciated by the skilled addressee, the spot size of light 113 on sample 201 may be varied as a function of optical power to maintain an illumination fluence below the threshold of discernible heating of sample 201.

[0094] Figure 5 shows a graph of the results from the sample system 100 in operation for real-time monitoring of the %Moisture content of milled wheat initially prepared in the test mill with two conditioning levels of 15% and 18%. The data is accumulated over a time period of about 1 hour and 15 minutes.

[0095] Plotline 51 is a measure of milled wheat particles flowing in the head break stream of a mill which was originally conditioned at 18% moisture content. As can be seen in Figure 5, at the point of measurement by system 100, the moisture content has already dropped to less than 15.5%. This is attributed to loss of moisture in the pneumatics of the mill where the humidity was 65% during milling. Plotline 53 is a measure of milled wheat particles flowing in the head break stream of a mill which was originally conditioned at 15% moisture content which, at the point of sampling, has dropped by less than 1% which indicates that it is closer to the equilibrium moisture point on the mill process. Plotline 55 is the straight-run flour from the 18% conditioned wheat and, finally, plotline 57 is the straight-run flour milled from the wheat conditioned to 15%. In the present example, the multiple inline sensor system devices 100 are showing how quickly the moisture of the flour can change from the original conditioning level and just how significant the milling process is on final moisture content compared to the conditioning level. Real-time data as made possible with sensor system devices 100 enables real time or near-real-time adjustments within the mill process to maintain the milled flour with desired characteristics. With this information gathered in-line, and in in real time, it is now possible to better control the moisture content of the final processed flour to customer specifications.

[0096] Figure 6 shows a plot of the protein content of milled flour, produced from wheat with a protein content of 12.8%, over a time period of nearly 5 hours. For simplicity, only four mill streams are shown of a total of 11 streams sampled using a plurality of sensor system devices 100. Plotline 61 is the tail break flour which has a protein content of 16%. This high protein content is associated with the endosperm material scraped from the bran. Plotline 63 is the head break mill line with a protein content of 14%. Plotline 65 is the straight-run flour (all streams combined) at 12% protein content. Finally, plotline 67 is the head-reduction flour (flour from the heart of the wheat grain endosperm) with protein content of less than 10%.

[0097] As can be seen from Figure 6, the streams of particulate matter 200 in the mill have a range of 6% protein content and it can be seen that the mill is operating in a steady state. The protein values measured by sensor system devices 100 are typical of each stream operation over time. It is clear that use of a plurality of sensor system devices 100 in the present example of a flour processing mill (i.e., at least one on each mill stream of particulate matter 200 - and possibly multiple sensor devices on each stream at different locations in the milling process) to provide real-time data on the particulate matter characteristics is invaluable and can readily permit rapid detection of undesirable particulate characteristics in each stream. This has clear advantages of, for example, being able to remove a particular stream that was not performing to specification, or indeed providing the real-time ability to remove or blend streams of different characteristics to meet a desired specification such as, for example, a specific moisture or protein content percentage in the final product, which has great potential when manufacturing multiple flour products from a single wheat grist.

[0098] Figure 7 shows an example of a fault detection using a sensor system device 100. In particular, Figure 7 shows a real-time measurement of ash percentage 71 on the head break stream in the test mill.

[0099] In the test milling run depicted in Figure 7, the raw input material was being pre dampened prior to milling. Pre-dampening or conditioning is used to plasticize the bran to reduce shattering which creates fine particles of bran which are difficult to separate from endosperm. The addition of moisture prior to milling also softens the endosperm to reduce the energy required for grinding. However, a choke in the mill line developed at time 73. In response to the choke, the ash content percentage in the particulate matter 200 at the location of the sensor system device 100 experienced wild fluctuations which are shown detected in real-time in Figure 7 between times 73 and 75. Once the choke was cleared from the mill lines at time 75, the ash content percentage returned to normal levels.

[0100] A further example of fault detection and rectification is shown in Figure 8 which shows a real-time graph of the protein percentage of particulate matter in a flour milling trial for the first/second break stream (plotline 81) and A-stream (A-STR, plotline 83). Normal protein results are seen in the head break stream 81 however abnormal data was immediately noticed on the head reduction A-STR 83. The miller was able to use the lack of infinite optical density on A-STR 83 to identify that the rolls had not engaged correctly meaning that the flour flowed through the rolls without any grinding, which resulted in insufficient flour production to achieve infinite optical density at the sensor system device 100. On inspection, it was identified by the miller that the first reduction roller had not been properly engaged. As soon as the roller was engaged and the flour was ground, at time 85, the flour started to flow through to the A stream flour and infinite optical density was achieved and the protein levels immediately returned to normal levels at around 10%. In the absence of real-time sensor system devices 100, this type of fault would likely go unnoticed for an entire shift in a commercial milling operation, however, with real-time monitoring provided by sensor system devices 100 the fault was identified and rectified less than 45 minutes into the trial.

[0101] As can be seen in Figures 5 to 8, real-time monitoring of the characteristics of the particulate matter in the milling process is extremely useful in evaluating the characteristics of the particulate matter 200 for the mill process, and also for rapidly detecting and rectifying faults in the mill lines to preserve integrity of the milling process and reducing product wastage and mill downtime. It will be readily appreciated by the skilled addressee that monitoring of one or more characteristics of the particulate matter for sudden, rapid and/or unusual changes may be linked with an alarm system to the mill control center so that the mill process can be halted if necessary whilst the fault is rectified. Also, deployment of a plurality of sensor system devices 100 throughout the mill, in conjunction with alert monitoring, will aid in rapidly isolating any detected faults which, in a large mill operation may enable only an affected section to be taken off-line while the fault is rectified rather than taking the whole mill offline while a fault is located, and which likely has only been detected in a final product with potential for significant wastages. It will be readily appreciated that such a deployment of a plurality of sensor system devices 100 throughout a large commercial mill operation will provide significant benefits and maximization of process throughputs, for example in increased quality of the mill output products) and commercial profits. Real-time automatic monitoring of the mill process using a plurality of sensor system devices 100 also has the advantage of providing real-time inputs to computer control systems for mill automation and also online monitoring whereby the mill process may be monitored and controlled in real-time from a remote location.

[0102] Furthermore, real-time monitoring of the characteristics of the particulate matter 200 in the milling process as measured in real-time by one or more systems 100 can readily be integrated with artificial intelligence and/or machine learning systems to optimize the milling process. Real-time data can be used to increase milling yields which is the amount of flour produced from the incoming wheat. Modern flour mills are fitted with Supervisory Control And Data Acquisition (SCADA) systems that monitor and record mill settings. Processor 112 may be interfaced with real-time flour stream quality data with the SCADA system to facilitate machine learning as would be readily appreciated by the skilled addressee. Recording and storing historical process data information on mill and feed stock changes and how that impacts in the flour stream quality will readily facilitate the development of computational or machine learning models that will enable the mill to “learn” and adjust the mill process variables to account for variations in input feedstock characteristics and/or adjust the milling process in real-time to meet quality requirements of the output product. For example, the recorded data may be used to optimise the extraction rate, regulate production and optimise profitability of the mill process. The data will support linear programming models and machine learning to improve mill performance and automation.

[0103] Data from the sensor system devices 100 can be used for linear programming to optimise flour blending. For example, commercial flour mills may produce a range of flour products that are required to meet specific customer quality targets, with each flour product having different quality requirements and values. Examples of different flour qualities may be a white premium noodle flour with a target ash of 0.4%, instant noodle flour with a target ash of 0.55% and general-purpose flour with a target ash content of 0.65%. These different products can be produced simultaneously from a single grist by blending multiple flour streams to produce target flour quality. The use of real time flour stream quality measurements enables the mill to use linear programming, or similar techniques, to optimise the flour stream blending to ensure that target product qualities are achieved while maximising yield and reducing the production of low value by products.

[0104] Another example on how the use of the inline sensors can be used to optimise the flour milling process is through machine learning. In milling wheat into flour, the wheat is normally conditioned, which is a process of adding water to the wheat and tempering for up to 24 hours. The conditioning of wheat amplifies the structural difference in properties between the endosperm with the bran and germ, therefore improving the ability to detach the endosperm from the bran and germ in the grinding stage and separate in the separation stages of the flour mill. Normally, the miller targets a wheat moisture content between 15-18%. Carrying out milling at differing levels of conditioning in experimental trials, the inline sensor system devices 100 were able to measure the effect of conditioning level on the individual flour streams and models could therefore be developed that were able to predict flour quality, at each stream, as a result of the impact of conditioning on flour quality. The models can then be used to optimise the required conditioning level to achieve the final target flour quality.

Interpretation

In Accordance With

[0105] As described herein, ‘in accordance with’ may also mean ‘as a function of’ and is not necessarily limited to the integers specified in relation thereto.

Processes:

[0106] Unless specifically stated otherwise, as apparent from the following discussions, it is appreciated that throughout the specification discussions utilizing terms such as “processing”, “computing”, “calculating”, “determining”, “analysing” or the like, refer to the action and/or processes of a computer or computing system, or similar electronic computing device, that manipulate and/or transform data represented as physical, such as electronic, quantities into other data similarly represented as physical quantities.

Processor:

[0107] In a similar manner, the term “processor” may refer to any device or portion of a device that processes electronic data, e.g., from registers and/or memory to transform that electronic data into other electronic data that, e.g., may be stored in registers and/or memory. A “computer” or a “computing device” or a “computing machine” or a “computing platform” may include one or more processors.

[0108] The methodologies described herein are, in one embodiment, performable by one or more processors that accept computer-readable (also called machine-readable) code containing a set of instructions that when executed by one or more of the processors carry out at least one of the methods described herein. Any processor capable of executing a set of instructions (sequential or otherwise) that specify actions to be taken are included. Thus, one example is a typical processing system that includes one or more processors. The processing system further may include a memory subsystem including main RAM and/or a static RAM, and/or ROM. Wireless:

[0109] The invention may be embodied using devices conforming to other network standards and for other applications, including, for example other WLAN standards and other wireless standards. Applications that can be accommodated include IEEE 802.11 wireless LANs and links, and wireless Ethernet.

[0110] In the context of this document, the term “wireless” and its derivatives may be used to describe circuits, devices, systems, methods, techniques, communications channels, etc., that may communicate data through the use of modulated electromagnetic radiation through a non-solid medium. The term does not imply that the associated devices do not contain any wires, although in some embodiments they might not. In the context of this document, the term “wired” and its derivatives may be used to describe circuits, devices, systems, methods, techniques, communications channels, etc., that may communicate data through the use of modulated electromagnetic radiation through a solid medium. The term does not imply that the associated devices are coupled by electrically conductive wires.

Means For Carrying out a Method or Function:

[0111] Furthermore, some of the embodiments are described herein as a method or combination of elements of a method that can be implemented by a processor or a processor device, computer system, or by other means of carrying out the function. Thus, a processor with the necessary instructions for carrying out such a method or element of a method forms a means for carrying out the method or element of a method. Furthermore, an element described herein of an apparatus embodiment is an example of a means for carrying out the function performed by the element for the purpose of carrying out the invention.

Connected

[0112] Similarly, it is to be noticed that the term connected, when used in the claims, should not be interpreted as being limitative to direct connections only. Thus, the scope of the expression a device A connected to a device B should not be limited to devices or systems wherein an output of device A is directly connected to an input of device B. It means that there exists a path between an output of A and an input of B which may be a path including other devices or means. “Connected” may mean that two or more elements are either in direct physical or electrical contact, or that two or more elements are not in direct contact with each other but yet still co-operate or interact with each other.

Embodiments

[0113] Reference throughout this specification to “one embodiment, “an embodiment, “one arrangement or “an arrangement means that a particular feature, structure or characteristic described in connection with the embodiment/arrangement is included in at least one embodiment/arrangement of the present invention. Thus, appearances of the phrases “in one embodimentarrangement or “in an embodimentarrangement in various places throughout this specification are not necessarily all referring to the same embodiment/arrangement, but may. Furthermore, the particular features, structures or characteristics may be combined in any suitable manner, as would be apparent to one of ordinary skill in the art from this disclosure, in one or more embodiments/arrangements.

[0114] Similarly it should be appreciated that in the above description of example embodiments/arrangements of the invention, various features of the invention are sometimes grouped together in a single embodiment/arrangement, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various inventive aspects. This method of disclosure, however, is not to be interpreted as reflecting an intention that the claimed invention requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment/arrangement. Thus, the claims following the Detailed Description are hereby expressly incorporated into this Detailed Description, with each claim standing on its own as a separate embodiment/arrangement of this invention.

[0115] Furthermore, while some embodiments/arrangements described herein include some but not other features included in other embodiments/arrangements, combinations of features of different embodiments/arrangements are meant to be within the scope of the invention, and form different embodiments/arrangements, as would be understood by those in the art. For example, in the following claims, any of the claimed embodiments/arrangements can be used in any combination. Specific Details

[0116] In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the invention may be practiced without these specific details. In other instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.

Terminology

[0117] In describing the preferred embodiment of the invention illustrated in the drawings, specific terminology will be resorted to for the sake of clarity. However, the invention is not intended to be limited to the specific terms so selected, and it is to be understood that each specific term includes all technical equivalents which operate in a similar manner to accomplish a similar technical purpose. Terms such as “forward”, “rearward”, “radially”, “ peripherally ”, “upwardly”, “ downwardly ”, and the like are used as words of convenience to provide reference points and are not to be construed as limiting terms.

Different Instances of Objects

[0118] As used herein, unless otherwise specified the use of the ordinal adjectives “first, “second”, “third”, etc., to describe a common object, merely indicate that different instances of like objects are being referred to, and are not intended to imply that the objects so described must be in a given sequence, either temporally, spatially, in ranking, or in any other manner.

Scope of Invention

[0119] Thus, while there has been described what are believed to be the preferred arrangements of the invention, those skilled in the art will recognize that other and further modifications may be made thereto without departing from the spirit of the invention, and it is intended to claim all such changes and modifications as fall within the scope of the invention. Functionality may be added or deleted from the block diagrams and operations may be interchanged among functional blocks. Steps may be added or deleted to methods described within the scope of the present invention. [0120] Although the invention has been described with reference to specific examples, it will be appreciated by those skilled in the art that the invention may be embodied in many other forms.

Industrial Applicability

[0121] It will be appreciated that the methods/apparatus/devices/systems described/illustrated above at least substantially provide methods and systems for real-time or near-real-time in-line sampling and analysis of particulate matter flowing through a particle transport pipe.

[0122] Thus, while there has been described what are believed to be the preferred embodiments of the invention, those skilled in the art will recognise that other and further modifications may be made thereto without departing from the spirit of the invention, and it is intended to claim all such changes and modifications as fall within the scope of the invention. For example, any formulas given above are merely representative of procedures that may be used. Functionality may be added or deleted from the block diagrams and operations may be interchanged among functional blocks. Steps may be added or deleted to methods described within the scope of the present invention.

[0123] The systems and methods described herein, and/or shown in the drawings, are presented by way of example only and are not limiting as to the scope of the invention. Unless otherwise specifically stated, individual aspects and components of the systems and methods may be modified, or may have been substituted, therefore known equivalents, or as yet unknown substitutes such as may be developed in the future or such as may be found to be acceptable substitutes in the future. The systems and methods described herein may also be modified for a variety of applications while remaining within the scope and spirit of the claimed invention, since the range of potential applications is great, and since it is intended that the present systems and methods be adaptable to many such variations.

Claims

THE CLAIMS DEFINING THE INVENTION ARE AS FOLLOWS:

1. A system for in-line sampling of particulate matter, comprising: a frame adapted to sealingly engage with a particulate matter transport pipe, the frame comprising: a sample ledge adapted to protrude into the pipe to receive and accumulate particulate matter flowing through the pipe; a housing adapted to receive a sampling device; an inspection window located within, or adjacent to, the sample ledge; a gas inlet port adapted to receive and transport a jet of gas; and a gas outlet port adapted to direct the jet of gas to flow across the sample ledge so as to clear accumulated particulate matter from the sample ledge.

2. A system as claimed in Claim 1 further comprising: an optical source for emitting optical radiation through the inspection window; an optical detector adapted to detect optical radiation reflected from the accumulated particulate matter through the inspection window.

3. A system as claimed in Claim 2 wherein the optical source is a narrow linewidth optical source.

4. A system as claimed in Claim 2 wherein the optical source is a broadband optical source.

5. A system as claimed in Claim 2 wherein the optical source is a near-infrared optical source.

6. A system as claimed in Claim 2 wherein the optical source is a visible optical source.

7. A system as claimed in Claim 2 wherein the optical source is a far-infrared optical source.

8. A system as claimed in Claim 2 wherein the optical source is an ultraviolet optical source.

9. A system as claimed in any one of Claims 2 to 8, wherein the optical source is a tunable optical source.

10. A system as claimed in any one of the preceding claims further comprising a processor for controlling: the optical source; receiving and analysing optical signals detected by the detector; and initiating a jet of gas to clear accumulated particulate matter from the sample ledge.

11. A system as claimed in claim 10 wherein the processor is configured to execute program instructions for: irradiating particulate matter accumulated on the sample ledge with optical radiation generated by the optical source; monitoring reflected optical radiation from accumulated particulate matter on the sample ledge to determine the optical density of the accumulated particulate matter; determining when the optical density of the accumulated particulate matter is the equivalent of infinite optical density; measuring one or more attributes of the accumulated particulate matter from the reflected optical radiation received by the optical detector; and activating a jet of gas to be directed from the gas outlet port across the sample ledge to clear the accumulated particulate matter from the sample ledge.

12. A system as claimed in any one of the preceding claims, wherein the optical source is adapted to illuminate particulate matter accumulated on the sample ledge.

13. A system as claimed in any one of the preceding claims, wherein the detector is adapted to measure reflected light from the accumulated particulate matter.

14. A system as claimed in any one of the preceding claims, wherein the detector is adapted to measure spectral information of light reflected from the accumulated particulate matter.

15. A system as claimed in any one of the preceding claims, wherein the detector is adapted to measure absorption information of light reflected from the accumulated particulate matter.

16. A system as claimed in any one of the preceding claims, wherein the detector is adapted to measure transmission information of light reflected from the accumulated particulate matter.

17. A system as claimed in either Claim 1 or Claim 2, wherein the frame comprises upper and lower sealing lips adapted to engage with a wall of the pipe thereby to seal the pipe when the frame is installed therein.

18. A system as claimed in any one of the preceding claims, wherein the inspection window comprises an optically transparent inspection window adapted to permit optical inspection using the sampling device of particulate matter accumulated on the sample ledge.

19. A system as claimed in any one of the preceding claims, wherein the gas inlet port is connected to a compressed gas source.

20. A system as claimed in Claim 4 wherein the compressed gas is an inert gas or air.

21 . A system as claimed in Claim 4, wherein the compressed gas is air.

22. A system as claimed in either Claim 20 or Claim 21 , wherein the compressed gas has a pressure of between about 100 kPa to about 10OOkPa.

23. A system as claimed in Claim 22, wherein the compressed gas has a pressure of between about 200 kPa to about 800k Pa.

24. A system as claimed in any one of the preceding claims wherein the frame is installed in a pipe with a slope angle of between about 0° to about 80° to the vertical.

25. A system as claimed in any one of the preceding claims, wherein the sample device comprises: a processor comprising program instructions for: irradiating particulate matter accumulated on the sample ledge with optical radiation generated by the optical source; monitoring reflected optical radiation from accumulated particulate matter on the sample ledge to determine the optical density of the accumulated particulate matter; determining when the optical density of the accumulated particulate matter is the equivalent of infinite optical density; measuring one or more attributes of the accumulated particulate matter from the reflected optical radiation received by the optical detector; and activating a jet of gas to be directed from the gas outlet port across the sample ledge to clear the accumulated particulate matter from the sample ledge.

26. A method for in-line sampling of particulate matter, comprising the steps of: providing a frame adapted to sealingly engage with a particulate matter transport pipe, the frame comprising: a sample ledge adapted to protrude into the pipe to receive and accumulate particulate matter flowing through the pipe; a housing adapted to receive a sampling device; an inspection window located within, or adjacent to, the sample ledge; a gas inlet port adapted to receive and transport a jet of gas; and a gas outlet port adapted to direct the jet of gas to flow across the sample ledge so as to clear accumulated particulate matter from the sample ledge; providing a sampling device comprising an optical source and an optical detector; irradiating particulate matter accumulated on the sample ledge with optical radiation generated by the optical source; monitoring reflected optical radiation from accumulated particulate matter on the sample ledge to determine the optical density of the accumulated particulate matter; determining when the optical density of the accumulated particulate matter is the equivalent of infinite optical density; measuring one or more attributes of the accumulated particulate matter from the reflected optical radiation received by the optical detector; and activating a jet of gas to be directed from the gas outlet port across the sample ledge to clear the accumulated particulate matter from the sample ledge.

27. A method as claimed in Claim 26, wherein the inspection window comprises an optically transparent inspection window adapted to permit optical inspection using the sampling device of particulate matter accumulated on the sample ledge.

28. A method as claimed in either Claim 26 or Claim 27, wherein the gas inlet port is connected to a compressed gas source.

29. A method as claimed in any one of Claims 26 to 28, wherein the optical density of the accumulated particulate matter on the sample ledge is measured in real-time or near-real-time.

30. A method as claimed in any one of Claims 26 to 29, wherein the one or more parameters of the accumulated particulate matter on the sample ledge is measured in real-time or near-real-time.

31. A kit for a system for in-line sampling of particulate matter, the kit comprising: an electronic module comprising: an optical source; and an optical detector; an electronic module comprising: a processor; a memory; and a communication module; a pneumatic module adapted for clearing samples of the particulate off a ledge; a curved face plate for in-line attachment of the optical, electronic and pneumatic modules to a pipe wherein the curved faceplate is provided in a plurality of options suitable to attach the system to a pipe of a size matching the selected face plate; and a ledge module configured to connect to the face plate such that, when connected, the ledge is located within the pipe to receive particulate matter flowing through the pipe when in use; wherein the ledge module is provided in a plurality of size and configuration options to suit the slope on the pipe in which the system is to be installed.