WO2021082919A1 - Defect detecting method and equipment for screen region of electronic equipment - Google Patents
Defect detecting method and equipment for screen region of electronic equipment Download PDFInfo
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- WO2021082919A1 WO2021082919A1 PCT/CN2020/120875 CN2020120875W WO2021082919A1 WO 2021082919 A1 WO2021082919 A1 WO 2021082919A1 CN 2020120875 W CN2020120875 W CN 2020120875W WO 2021082919 A1 WO2021082919 A1 WO 2021082919A1
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- 238000000034 method Methods 0.000 title claims abstract description 26
- 238000001514 detection method Methods 0.000 claims description 70
- 238000004364 calculation method Methods 0.000 claims description 6
- 230000006870 function Effects 0.000 claims description 6
- 238000013136 deep learning model Methods 0.000 description 2
- 230000032798 delamination Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000010606 normalization Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 238000003672 processing method Methods 0.000 description 2
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/23—Clustering techniques
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
- G06N3/045—Combinations of networks
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/90—Determination of colour characteristics
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20081—Training; Learning
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30121—CRT, LCD or plasma display
Definitions
- This application relates to the field of computer technology, and in particular to a method and equipment for detecting defects in the screen area of an electronic device.
- the traditional image processing method is based on the selection of the threshold to a large extent, and the screen area of second-hand electronic equipment such as mobile phones has different degrees of difference in various aspects such as color, appearance, aging, etc., it is difficult to give The determined threshold is therefore not applicable to the detection of defects in this screen area based on traditional image processing methods.
- the purpose of this application is to provide a method and device for detecting defects in the screen area of an electronic device.
- a method for detecting defects in a screen area of an electronic device including:
- the defect detection result of the screen area image of the electronic device is received from the FPN network combined with the backbone network model.
- the defect detection result includes: the defect type of the screen area of the electronic device and the position of the defect in the screen area of the electronic device And the confidence level of the defect detection result.
- the first two layers of the backbone network adopt a res structure
- the last two layers of the network adopt an inception structure
- the method further includes:
- output result information including the defect type of the screen area of the electronic device and the position of the defect in the screen area of the electronic device.
- the method further includes:
- Step one preset the FPN network combined with the backbone network model and its initial model parameters
- Step 2 Input the screen area image of the sample electronic device into the FPN network with current model parameters combined with the backbone network model to obtain the defect prediction result of the screen area of the sample electronic device.
- the defect prediction result includes: The type of defects in the screen area, the position of the defects in the screen area of the sample electronic device, and the confidence level of the defect detection results;
- Step 3 Calculate the difference between the defect prediction result and the actual defect result of the screen area of the sample electronic device based on a preset objective function, and identify whether the difference is greater than a second preset threshold,
- step 4 after updating the model parameters of the FPN network combined with the backbone network based on the difference, restart execution from step 2;
- step 5 the FPN network combined with the backbone network model with the current model parameters is used as the model of the FPN network combined with the backbone network after the training.
- the normalized parameters are updated iteratively after each convolution calculation is completed.
- an electronic device screen area defect detection device comprising:
- the first device is used to input the screen area image of the electronic device into the model of the FPN network combined with the backbone network after the training;
- the second device is used to receive and output the defect detection result of the screen area image of the electronic device from the model of the FPN network combined with the backbone network.
- the defect detection result includes: the defect type of the screen area of the electronic device and the defect in the electronic device The position in the screen area and the confidence level of the defect detection result.
- the first two layers of the backbone network adopt a res structure
- the last two layers of the network adopt an inception structure
- the second device is also used to identify whether the confidence level of the defect detection result is greater than a first preset threshold, and if it is greater than the first preset threshold, output the defect category including the screen area of the electronic device, Result information on the location of the defect in the screen area of the electronic device.
- a third device including:
- the third device is used to preset the FPN network combined with the backbone network model and its initial model parameters
- the third and second device is used to input the screen area image of the sample electronic device into the FPN network with current model parameters combined with the backbone network model to obtain the defect prediction result of the screen area of the sample electronic device, and the defect prediction result includes: The type of defect in the screen area of the sample electronic device, the position of the defect in the screen area of the sample electronic device, and the confidence level of the defect detection result;
- the third and third device is used to calculate the difference between the defect prediction result and the real defect result of the sample electronic device based on a preset objective function, and to identify whether the difference is greater than a second preset threshold, and if the difference is If it is greater than the second preset threshold, execute the third and fourth device for updating the model parameters of the FPN network combined with the backbone network based on the difference, and then restart execution from the third and second device;
- the third device is executed to use the FPN network combined with the backbone network model with the current model parameters as the model of the FPN network combined with the backbone network after the training.
- the normalized parameters are updated iteratively after each convolution calculation is completed.
- Computer-readable instructions are stored thereon, and computer-executable instructions are stored thereon.
- the processor causes the processor:
- Step S1 input the screen area image of the electronic device into the model of the FPN network combined with the backbone network after the training;
- Step S2 the defect detection result of the screen area image of the electronic device is received from the model of the FPN network combined with the backbone network.
- the defect detection result includes: the defect type of the screen area of the electronic device and the defect in the screen area of the electronic device The position and the confidence level of the defect detection result.
- the present invention also provides a device for detecting defects in the screen area of an electronic device, which includes:
- a memory arranged to store computer-executable instructions which, when executed, cause the processor to:
- Step S1 input the screen area image of the electronic device into the model of the FPN network combined with the backbone network after the training;
- Step S2 the defect detection result of the screen area image of the electronic device is received from the model of the FPN network combined with the backbone network.
- the defect detection result includes: the defect type of the screen area of the electronic device and the defect in the screen area of the electronic device The position and the confidence level of the defect detection result.
- the present invention inputs the image of the screen area of the electronic device into the model of the FPN network combined with the backbone network after the training; and receives the output of the screen area image of the electronic device from the model of the FPN network combined with the backbone network.
- the defect detection result includes: the type of defect in the screen area of the electronic device, the position of the defect in the screen area of the electronic device, and the confidence level of the defect detection result, which can accurately identify the screen area of a second-hand electronic device such as a mobile phone The difference in blemishes.
- FIG. 1 shows a flowchart of a method for detecting defects in a screen area according to an embodiment of the present invention
- FIG. 2 shows a schematic diagram of a screen area defect detection result according to an embodiment of the present invention
- FIG. 3 shows a schematic diagram of a model of an FPN network combined with a backbone network according to an embodiment of the present invention.
- each module and trusted party of the system includes one or more processors (CPU), input/output interfaces, network interfaces, and memory.
- processors CPU
- input/output interfaces network interfaces
- memory volatile and non-volatile memory
- Memory may include non-permanent memory in computer-readable media, random access memory (RAM) and/or non-volatile memory, such as read-only memory (ROM), programmable read-only memory (PROM), Erase programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM) or flash memory (flash RAM).
- RAM random access memory
- ROM read-only memory
- PROM programmable read-only memory
- EPROM Erase programmable read-only memory
- EEPROM electrically erasable programmable read-only memory
- flash RAM flash RAM
- Memory is an example of computer readable media.
- Computer-readable media includes permanent and non-permanent, removable and non-removable media, and information storage can be realized by any method or technology.
- the information can be computer-readable instructions, data structures, program modules, or other data.
- Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, CD-ROM, digital versatile disc (DVD) or other optical storage, Magnetic cassettes, magnetic tape disk storage or other magnetic storage devices or any other non-transmission media can be used to store information that can be accessed by computing devices.
- computer-readable media does not include non-transitory computer-readable media (transitory media), such as modulated data signals and carrier waves.
- Fig. 1 shows a method for detecting defects in the screen area of an electronic device provided by one aspect of the present application, wherein the method includes:
- S11 inputs the screen area image of the electronic device into the model of the FPN network after the training and the backbone network;
- the defect detection result includes: the defect type of the screen area of the electronic device, and the defect in the screen area of the electronic device Confidence of location and defect detection results.
- the types of defects include, but are not limited to, delamination, penetrating, leaking, broken lines, bright spots (bright spots), and stains (yellow and blue).
- the model of the FPN network combined with the backbone network can be shown in FIG. 3.
- the FPN network combined with the backbone network model iteratively updates the normalized parameters after each convolution calculation is completed, where the normalized parameters include the mean and variance, and normalization ensures that each input is reasonable Changes within the range, here, the normalized parameters are continuously updated with the update of the input data.
- each defect detection result includes cls, x1, y1, x2, y2, score, Among them, cls is the defect type, x1, y1, x2, y2 are the 4 coordinates of the position of the defect in the image of the screen area area, and score is the confidence level of this defect.
- the present invention mainly utilizes the improved feature pyramid (FPN) network combined with the deep learning model of the backbone network, and can accurately identify the difference in the defects of the screen area of the second-hand electronic equipment such as the mobile phone.
- FPN improved feature pyramid
- the first two layers of the backbone network adopt a res structure
- the last two layers of the network adopt an inception structure
- step S12 after receiving the output defect detection result of the screen area of the electronic device from the FPN network combined with the backbone network model, further includes:
- the method before inputting the screen area image into the FPN network combined with the backbone network model, the method further includes:
- Step one preset the FPN network combined with the backbone network model and its initial model parameters
- Step 2 Input the screen area image of the sample electronic device into the FPN network with the current model parameters combined with the backbone network model to obtain the defect prediction result of the screen of the sample electronic device, and the defect prediction result includes: the screen of the sample electronic device The type of defect in the area, the position of the defect in the screen area of the sample electronic device, and the confidence level of the defect detection result;
- Step 3 Calculate the difference between the defect prediction result and the real defect result of the sample electronic device based on a preset objective function, and identify whether the difference is greater than a second preset threshold,
- step 4 after updating the model parameters of the FPN network combined with the backbone network based on the difference, restart execution from step 2;
- step 5 the FPN network combined with the backbone network model with the current model parameters is used as the model of the FPN network combined with the backbone network after the training.
- the model of the FPN network combined with the backbone network is cyclically trained to obtain a reliable model.
- the present invention also provides a device for detecting defects in the screen area of an electronic device, the device comprising:
- the first device is used to input the screen area image of the electronic device into the model of the FPN network combined with the backbone network after the training;
- the second device is used to receive and output the defect detection result of the screen area image of the electronic device from the model of the FPN network combined with the backbone network.
- the defect detection result includes: the defect type of the screen area of the electronic device and the defect in the electronic device The position in the screen area and the confidence level of the defect detection result.
- the types of defects include, but are not limited to, delamination, penetrating characters, leakage, broken lines, bright spots (bright spots), and stains (yellow and blue).
- each defect detection result of the screen area of the electronic device received and output from the FPN network combined with the backbone network model
- each defect detection result includes cls, x1, y1, x2, y2, score, where cls is the defect type , X1, y1, x2, y2 are the 4 coordinates of the position of the defect in the image of the screen area area, and score is the confidence level of this defect.
- the FPN network combined with the backbone network model iteratively updates the normalized parameters after each convolution calculation is completed, where the normalized parameters include the mean and variance, and normalization ensures that each input is reasonable Changes within the range, here, the normalized parameters are continuously updated with the update of the input data.
- the present invention mainly utilizes the improved feature pyramid (FPN) network combined with the deep learning model of the backbone network, which can accurately identify the difference in the screen area of second-hand electronic devices such as mobile phones.
- FPN improved feature pyramid
- the first two layers of the backbone network adopt a res structure
- the last two layers of the network adopt an inception structure
- the second device is also used to identify whether the confidence level of the defect detection result is greater than a first preset threshold, and if it is greater than the first preset
- the threshold value outputs result information including the defect type of the screen area of the electronic device and the position of the defect on the screen of the electronic device.
- the screen area defect detection device of the electronic device of the present invention further includes a third device, including:
- the third device is used to preset the FPN network combined with the backbone network model and its initial model parameters
- the third and second device is used to input the screen area image of the sample electronic device into the FPN network combined with the backbone network model with the current model parameters to obtain the defect prediction result of the screen area of the sample electronic device, and the defect prediction result includes: The type of defects in the screen area of the sample electronic device, the position of the defect in the screen area of the sample electronic device, and the confidence level of the defect detection result;
- the third and third device is used to calculate the difference between the defect prediction result and the real defect result of the sample electronic device based on a preset objective function, and to identify whether the difference is greater than a second preset threshold, and if the difference is If it is greater than the second preset threshold, execute the third and fourth device for updating the model parameters of the FPN network combined with the backbone network based on the difference, and then restart execution from the third and second device;
- the third device is executed to use the FPN network combined with the backbone network model with the current model parameters as the model of the FPN network combined with the backbone network after the training.
- the model of the FPN network combined with the backbone network is cyclically trained to obtain a reliable model.
- Computer-readable instructions are stored thereon, and computer-executable instructions are stored thereon.
- the processor causes the processor:
- Step S1 input the screen area image of the electronic device into the model of the FPN network combined with the backbone network after the training;
- Step S2 the defect detection result of the screen area image of the electronic device is received from the model of the FPN network combined with the backbone network.
- the defect detection result includes: the defect type of the screen area of the electronic device and the defect in the screen area of the electronic device The position and the confidence level of the defect detection result.
- the present invention also provides a device for detecting defects in the screen area of an electronic device, which includes:
- a memory arranged to store computer-executable instructions which, when executed, cause the processor to:
- Step S1 input the screen area image of the electronic device into the model of the FPN network combined with the backbone network after the training;
- Step S2 the defect detection result of the screen area image of the electronic device is received from the model of the FPN network combined with the backbone network.
- the defect detection result includes: the defect type of the screen area of the electronic device and the defect in the screen area of the electronic device The position and the confidence level of the defect detection result.
- the present invention inputs the image of the screen area of the electronic device into the model of the FPN network combined with the backbone network after the training; and receives the output of the screen area image of the electronic device from the model of the FPN network combined with the backbone network.
- the defect detection result includes: the type of defect in the screen area of the electronic device, the position of the defect in the screen area of the electronic device, and the confidence level of the defect detection result, which can accurately identify the screen area of a second-hand electronic device such as a mobile phone The difference in blemishes.
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Claims (12)
- 一种电子设备屏幕区域瑕疵检测方法,所述方法包括:A method for detecting defects in the screen area of an electronic device, the method comprising:将电子设备的屏幕区域图像输入训练结束后的FPN网络结合backbone网络的模型;Input the screen area image of the electronic device into the model of the FPN network after the training and the backbone network;从所述FPN网络结合backbone网络的模型接收输出的电子设备的屏幕区域图像的瑕疵检测结果,所述瑕疵检测结果包括:电子设备的屏幕区域的瑕疵种类、瑕疵在电子设备的屏幕区域中的位置和瑕疵检测结果的置信度。The defect detection result of the screen area image of the electronic device is received from the FPN network combined with the backbone network model. The defect detection result includes: the defect type of the screen area of the electronic device and the position of the defect in the screen area of the electronic device And the confidence level of the defect detection result.
- 根据权利要求1所述的方法,其中,所述backbone网络的前2层采用res结构,网络的后2层采用inception结构。The method according to claim 1, wherein the first two layers of the backbone network adopt a res structure, and the last two layers of the network adopt an inception structure.
- 根据权利要求1所述的方法,其中,从所述FPN网络结合backbone网络的模型接收输出的电子设备的屏幕区域的瑕疵检测结果之后,还包括:The method according to claim 1, wherein after receiving the output defect detection result of the screen area of the electronic device from the model of the FPN network combined with the backbone network, the method further comprises:识别所述瑕疵检测结果的置信度是否大于第一预设阈值,Identifying whether the confidence level of the defect detection result is greater than a first preset threshold,若大于所述第一预设阈值,则输出包括电子设备的屏幕区域的瑕疵种类、瑕疵在电子设备的屏幕区域中的位置的结果信息。If it is greater than the first preset threshold, output result information including the defect type of the screen area of the electronic device and the position of the defect in the screen area of the electronic device.
- 根据权利要求1所述的方法,其中,将所述电子设备的屏幕区域图像输入FPN网络结合backbone网络的模型之前,还包括:The method according to claim 1, wherein before inputting the screen area image of the electronic device into the FPN network combined with the backbone network model, the method further comprises:步骤一,预设FPN网络结合backbone网络的模型及其初始的模型参数;Step one, preset the FPN network combined with the backbone network model and its initial model parameters;步骤二,将样本电子设备的屏幕区域图像输入带有当前的模型参数的FPN网络结合backbone网络的模型,得到样本电子设备的屏幕区域的瑕疵预测结果,所述瑕疵预测结果包括:样本电子设备的屏幕区域的瑕疵种类、瑕疵在样本电子设备的屏幕区域中的位置和瑕疵检测结果的置信度;Step 2: Input the screen area image of the sample electronic device into the FPN network with current model parameters combined with the backbone network model to obtain the defect prediction result of the screen area of the sample electronic device. The defect prediction result includes: The type of flaws in the screen area, the position of the flaws in the screen area of the sample electronic device, and the confidence level of the flaw detection results;步骤三,基于预设目标函数计算所述瑕疵预测结果与样本电子设备的屏幕区域的真实瑕疵结果之间的差值,识别所述差值是否大于第二预设阈,Step 3: Calculate the difference between the defect prediction result and the actual defect result of the screen area of the sample electronic device based on a preset objective function, and identify whether the difference is greater than a second preset threshold,若所述差值大于第二预设阈值,则步骤四,基于所述差值更新所述FPN网络结合backbone网络的模型参数后,重新从步骤二开始执行;If the difference is greater than the second preset threshold, step 4, after updating the model parameters of the FPN network combined with the backbone network based on the difference, restart execution from step 2;若所述差值小于等于第二预设阈值,则步骤五,将带有当前的模型参数的FPN网络结合backbone网络的模型作为训练结束后的FPN网络结合backbone网络的模型。If the difference is less than or equal to the second preset threshold, step 5, the FPN network combined with the backbone network model with the current model parameters is used as the model of the FPN network combined with the backbone network after the training.
- 根据权利要求1所述的方法,其中,所述FPN网络结合backbone网络的模型中每一次卷积计算完成后迭代更新归一化的参数。The method according to claim 1, wherein the FPN network combined with the backbone network model iteratively updates the normalized parameters after each convolution calculation is completed.
- 一种电子设备屏幕区域瑕疵检测设备,所述设备包括:A defect detection device for a screen area of an electronic device, the device comprising:第一装置,用于将电子设备的屏幕区域图像输入训练结束后的FPN网络结合backbone网络的模型;The first device is used to input the screen area image of the electronic device into the model of the FPN network combined with the backbone network after the training;第二装置,用于从所述FPN网络结合backbone网络的模型接收输出的电子设备的屏幕区域图像的瑕疵检测结果,所述瑕疵检测结果包括:电子设备的屏幕区域的瑕疵种类、瑕疵在电子设备的屏幕区域中的位置和瑕疵检测结果的置信度。The second device is used to receive and output the defect detection result of the screen area image of the electronic device from the model of the FPN network combined with the backbone network. The defect detection result includes: the defect type of the screen area of the electronic device and the defect in the electronic device The position in the screen area and the confidence level of the defect detection result.
- 根据权利要求6所述的设备,其中,所述backbone网络的前2层采用res结构,网络的后2层采用inception结构。The device according to claim 6, wherein the first two layers of the backbone network adopt a res structure, and the last two layers of the network adopt an inception structure.
- 根据权利要求6所述的设备,其中,第二装置还用于识别所述瑕疵检测结果的置信度是否大于第一预设阈值,若大于所述第一预设阈值,则输出包括电子设备的屏幕区域的瑕疵种类、瑕疵在电子设备的屏幕区域中的位置的结果信息。7. The device according to claim 6, wherein the second device is further configured to identify whether the confidence level of the defect detection result is greater than a first preset threshold, and if it is greater than the first preset threshold, outputting information including electronic equipment The result information of the defect type of the screen area and the position of the defect in the screen area of the electronic device.
- 根据权利要求6所述的设备,其中,还包括第三装置,包括:The device according to claim 6, further comprising a third device, comprising:第三一装置,用于预设FPN网络结合backbone网络的模型及其初始的模型参数;The third device is used to preset the FPN network combined with the backbone network model and its initial model parameters;第三二装置,用于将样本电子设备的屏幕区域图像输入带有当前的模型参数的FPN网络结合backbone网络的模型,得到样本电子设备的屏幕区域的瑕疵预测结果,所述瑕疵预测结果包括:样本电子设备的屏幕区域的瑕疵种类、瑕疵在样本电子设备的屏幕区域中的位置和瑕疵检测结果的置信度;The third and second device is used to input the screen area image of the sample electronic device into the FPN network combined with the backbone network model with the current model parameters to obtain the defect prediction result of the screen area of the sample electronic device, and the defect prediction result includes: The type of defects in the screen area of the sample electronic device, the position of the defect in the screen area of the sample electronic device, and the confidence level of the defect detection result;第三三装置,用于基于预设目标函数计算所述瑕疵预测结果与样本电子设备的真实瑕疵结果之间的差值,识别所述差值是否大于第二预设阈,若所述差值大于第二预设阈值,则执行第三四装置,用于基于所述差值更新所述FPN网络结合backbone网络的模型参数后,重新从第三二装置开始执行;The third and third device is used to calculate the difference between the defect prediction result and the real defect result of the sample electronic device based on a preset objective function, and to identify whether the difference is greater than a second preset threshold, if the difference is If it is greater than the second preset threshold, execute the third and fourth device for updating the model parameters of the FPN network combined with the backbone network based on the difference, and then restart execution from the third and second device;若所述差值小于等于第二预设阈值,则执行第三五装置,将带有当前的模型参数的FPN网络结合backbone网络的模型作为训练结束后的FPN网络结合backbone网络的模型。If the difference is less than or equal to the second preset threshold, the third and fifth device is executed to use the FPN network combined with the backbone network model with the current model parameters as the model of the FPN network combined with the backbone network after the training.
- 根据权利要求6所述的设备,其中,所述FPN网络结合backbone网络的模型中每一次卷积计算完成后迭代更新归一化的参数。7. The device according to claim 6, wherein the FPN network combined with the backbone network model iteratively updates the normalized parameters after each convolution calculation is completed.
- 一种计算机可读介质,其中,A computer readable medium in which,其上存储有计算机可读指令,所述计算机可读指令可被处理器执行以实现如权利要求1至5任一项所述的方法。There are computer-readable instructions stored thereon, and the computer-readable instructions can be executed by a processor to implement the method according to any one of claims 1 to 5.
- 一种电子设备屏幕区域瑕疵检测设备,其中,所述设备包括:An electronic device screen area defect detection device, wherein the device includes:一个或多个处理器;以及One or more processors; and存储有计算机可读指令的存储器,所述计算机可读指令在被执行时使所述处理器执行如权利要求1至5中任一项所述方法的操作。A memory storing computer-readable instructions, which when executed, cause the processor to perform the operation of the method according to any one of claims 1 to 5.
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