WO1997017829B1 - Variable voltage component tester - Google Patents
Variable voltage component testerInfo
- Publication number
- WO1997017829B1 WO1997017829B1 PCT/US1996/018515 US9618515W WO9717829B1 WO 1997017829 B1 WO1997017829 B1 WO 1997017829B1 US 9618515 W US9618515 W US 9618515W WO 9717829 B1 WO9717829 B1 WO 9717829B1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- component
- current
- potential
- electrical
- limiting
- Prior art date
Links
- 238000000034 method Methods 0.000 claims abstract 5
- 230000000875 corresponding Effects 0.000 claims abstract 3
- 230000003334 potential Effects 0.000 claims abstract 3
- 238000009825 accumulation Methods 0.000 claims 8
- 238000007599 discharging Methods 0.000 claims 3
- 238000009662 stress testing Methods 0.000 claims 3
- 230000003466 anti-cipated Effects 0.000 abstract 1
- 239000003985 ceramic capacitor Substances 0.000 abstract 1
- 230000001276 controlling effect Effects 0.000 abstract 1
Abstract
A plurality of electrical circuit components (22) having capacitance, e.g. ceramic capacitors, are tested simultaneously in a corresponding plurality of test channels. They are stressed by a variable voltage source (10) that can produce an electrical potential selected from a wide range from low potential to high potential. The charge current by which a component accumulates a charge is controlled to a selected linear rate by a current controller (16). Voltage sensors (28) and current sensors (18) measure accumulated charges and leakage current, respectively. The current sensor (18) can be selectively sensitized to a plurality of anticipated leakage current ranges. In addition, the selected potentials can each be applied to the components (22) in a single step or can be applied over time in ramp fashion. A processor can be used for running at least a prescribed test process on components (22), the processor being operatively coupled to, for controlling and receiving inputs from, the above elements.
Claims
1. For a component having electrical capacitance, an
apparatus for electrical stress testing the component
comprising:
(a) means for selecting an electrical potential from a range of electrical potentials,
(b) means for applying, for a predetermined time period, the selected electrical potential across the component to urge it to accumulate an electrical charge,
(c) means for limiting the accumulation of the charge to a selected rate, and
(d) means for measuring a charge acquired by the component at the end of the predetermined time .
2. The apparatus according to claim 1 further comprising means for measuring leakage current through the component.
3. The apparatus according to claim 2 wherein the means for measuring leakage current can be selectively sensitized to detect current over a plurality of ranges.
4. The apparatus according to claim 1 wherein the means for limiting the accumulation of the charge comprises:
(a) means for selecting a current level from a range of
current levels, and
(b) means for limiting current to and from the component to the selected level.
5. The apparatus according to claim 2 wherein the means for limiting the accumulation of the charge comprises:
(a) means for selecting a current level from a range of
current levels, and
(b) means for limiting current to and from the component to the selected level.
6. The apparatus according to claim 1 further comprising: (a) a processing means for running at least a prescribed test process on a component, the processing means being operatively coupled to the means for selecting an
electrical potential, the means for measuring a charge acquired by the component, and the means for limiting the accumulation of the charge, and
(b) means, operatively coupled to the processing means, for measuring leakage current in the series circuit.
7. The apparatus according to claim 6 further comprising means, operatively coupled to the processing means, for discharging the component.
8. The apparatus according to claim 1 further comprising means for selectively applying the selected potential in step fashion or in ramp fashion.
9. For a plurality of components having electrical
capacitance, an apparatus for electrical stress testing the components comprising- (a) means for selecting an electrical potential from a range of electrical potentials,
(b) means for applying, for a predetermined time period, the selected electrical potential across each component to urge said each component to accumulate a respective electrical charge,
(c) means for limiting the accumulation of the respective
charges to a selected rate, and
(d) means for measuring the respective charges acquired by the components at the end of the predetermined time.
10. The apparatus according to claim 9 further comprising a plurality of current sensors, one coupled to each component, for measuring respective leakage currents through the
components.
11. The apparatus according to claim 10 wherein the current sensors can be selectively sensitized to detect current over a plurality of ranges.
12. The apparatus according to claim 9 wherein the means for limiting the accumulation of the respective charges comprises;
(a) means for selecting a current level from a range of
current levels, and
(b) means, coupled to each component, for limiting current to and from said each component to the selected level.
13. The apparatus according to claim 10 wherein the means for limiting the accumulation of the respective charges comprises:
(a) means for selecting a current level from a range of
current levels, and
(b) means, coupled to each component, for limiting current to and from said each component to the selected level.
14. The apparatus according to claim 9 further comprising: (a) a processing means for running at least a prescribed test process on components, the processing means being
operatively coupled to the means for selecting an
electrical potential, the means for measuring charges acquired by the components, and the means for limiting the accumulation of the respective charges, and
(b) means, operatively coupled to the processing means, for measuring respective leakage currents through the
components.
15. The apparatus according to claim 14 further comprising means, operatively coupled to the processing means, for discharging the components.
16. The apparatus according to claim 9 further comprising means for selectively applying the selected potential in step fashion or in ramp fashion.
17. For a processor, a process for electrical stress testing a component having capacitance comprising the steps:
(a) selecting a current limit and programming a current controller, coupled in series with the component, to limit charge current to and from the component to the selected limit,
(b) selecting a stress potential,
(c) programming a variable voltage supply, coupled across the component, to apply the selected stress potential across the component,
(d) waiting a predetermined time,
(e) measuring leakage current through the component,
(f) measuring a charge accumulated by the component,
(g) removing the stress potential from across the component,
(h) discharging the component,
(i) applying a potential across the component sufficient to determine whether the component has been rendered
inoperative by the stress potential,
(j) measuring for any leakage current, and
(k) if there is no leakage current then providing a
corresponding error indication to the processor.
18. The process according to Claim 17 further comprising the steps:
(a) checking the stress potential being applied across the component to determine if it matches the selected stress potential, and
(b) if it is not, then providing a corresponding error indication to the processor.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9519150A JP2000500576A (en) | 1995-11-16 | 1996-11-18 | Variable voltage element test equipment |
| EP96940527A EP0861443A1 (en) | 1995-11-16 | 1996-11-18 | Variable voltage component tester |
| KR1019980703635A KR19990067608A (en) | 1995-11-16 | 1996-11-18 | Variable voltage component inspection device |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/559,547 | 1995-11-16 | ||
| US08/559,547 US5677634A (en) | 1995-11-16 | 1995-11-16 | Apparatus for stress testing capacitive components |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO1997017829A1 WO1997017829A1 (en) | 1997-05-22 |
| WO1997017829B1 true WO1997017829B1 (en) | 1997-07-31 |
Family
ID=24234010
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US1996/018515 WO1997017829A1 (en) | 1995-11-16 | 1996-11-18 | Variable voltage component tester |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5677634A (en) |
| EP (1) | EP0861443A1 (en) |
| JP (1) | JP2000500576A (en) |
| KR (1) | KR19990067608A (en) |
| TW (1) | TW305024B (en) |
| WO (1) | WO1997017829A1 (en) |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3351171B2 (en) * | 1995-04-13 | 2002-11-25 | トヨタ自動車株式会社 | Capacitor capacity diagnostic circuit |
| US6043665A (en) * | 1996-12-05 | 2000-03-28 | Murata Manufacturing Co., Ltd. | Capacitor charging current measurement method |
| JP3137060B2 (en) * | 1997-01-20 | 2001-02-19 | 株式会社村田製作所 | How to judge the quality of capacitors |
| AU6829298A (en) | 1997-03-20 | 1998-10-20 | Basf Aktiengesellschaft | Substituted 2-benz(o)ylpyridines, their preparation and their use as herbicides |
| US5828222A (en) * | 1997-06-05 | 1998-10-27 | Extech Electronics Co., Ltd. | Quick DC compressive strength test method and the related apparatus |
| US6330696B1 (en) * | 1998-08-13 | 2001-12-11 | Agere Systems Guardian Corp | Self-testing of DRAMs for multiple faults |
| US6204647B1 (en) * | 1999-06-02 | 2001-03-20 | Keithley Instruments, Inc. | Battery emulating power supply |
| JP3548887B2 (en) * | 1999-12-20 | 2004-07-28 | 株式会社村田製作所 | Method and apparatus for measuring insulation resistance |
| US6879534B2 (en) * | 2002-11-01 | 2005-04-12 | Hewlett-Packard Development Company, L.P. | Method and system for minimizing differential amplifier power supply sensitivity |
| US7132835B1 (en) * | 2003-02-07 | 2006-11-07 | Pericom Semiconductor Corp. | PLL with built-in filter-capacitor leakage-tester with current pump and comparator |
| JP4593891B2 (en) * | 2003-07-08 | 2010-12-08 | パナソニック株式会社 | Semiconductor device |
| US7327148B2 (en) * | 2005-06-29 | 2008-02-05 | Agilent Technologies, Inc. | Method for using internal semiconductor junctions to aid in non-contact testing |
| KR101319155B1 (en) * | 2006-01-27 | 2013-10-17 | 루돌프 테크놀로지스 인코퍼레이티드 | High-speed capacitor leakage measurement systems and methods |
| KR100825760B1 (en) * | 2006-06-02 | 2008-04-29 | 한국전자통신연구원 | Abrupt metal-insulator transitionMIT device, MIT sensor using the same abrupt MIT device, and alarming apparatus and secondary battery anti-explosion circuit comprising the same MIT sensor |
| US7295031B1 (en) | 2006-07-12 | 2007-11-13 | Agilent Technologies, Inc. | Method for non-contact testing of marginal integrated circuit connections |
| KR100825762B1 (en) * | 2006-08-07 | 2008-04-29 | 한국전자통신연구원 | Circuit for measuring a discontinuous metal-insulator transitionMIT continuously and MIT sensor using the same circuit |
| US20080129306A1 (en) * | 2006-11-30 | 2008-06-05 | Electro Scientific Industries, Inc. | Multi-Point, Multi-Parameter Data Acquisition For Multi-Layer Ceramic Capacitor Testing |
| US8461849B1 (en) | 2006-11-30 | 2013-06-11 | Electro Scientific Industries, Inc. | Multivariate predictive insulation resistance measurement |
| US7602192B2 (en) * | 2006-11-30 | 2009-10-13 | Electro Scientific Industries, Inc. | Passive station power distribution for cable reduction |
| US7683630B2 (en) * | 2006-11-30 | 2010-03-23 | Electro Scientific Industries, Inc. | Self test, monitoring, and diagnostics in grouped circuitry modules |
| US7443179B2 (en) * | 2006-11-30 | 2008-10-28 | Electro Scientific Industries, Inc. | Zero motion contact actuation |
| US20080246491A1 (en) * | 2007-04-06 | 2008-10-09 | Texas Instruments Incorporated | Scalable method for identifying cracks and fractures under wired or ball bonded bond pads |
| US8004288B1 (en) * | 2007-05-14 | 2011-08-23 | Cardiac Pacemakers, Inc. | Methods and apparatus for testing of high dielectric capacitors |
| US7940058B2 (en) * | 2007-05-24 | 2011-05-10 | Electro Scientific Industries, Inc. | Capacitive measurements with fast recovery current return |
| US8054085B2 (en) | 2008-03-31 | 2011-11-08 | Electro Scientific Industries, Inc. | Programmable gain trans-impedance amplifier overload recovery circuit |
| WO2013035138A1 (en) * | 2011-09-09 | 2013-03-14 | 全日空整備株式会社 | Flight simulator malfunction detection system |
| DE102014111675A1 (en) * | 2014-08-15 | 2016-02-18 | Dspace Digital Signal Processing And Control Engineering Gmbh | Simulation device and method for simulating a connectable to a control device peripheral circuitry |
| US10101175B2 (en) * | 2016-11-15 | 2018-10-16 | Industrial Technology Research Institute | Sensor interface circuit and sensor output adjusting method |
| WO2018182771A1 (en) * | 2017-03-30 | 2018-10-04 | Axon Enterprise, Inc. | Systems and methods for calibrating a tester for a conducted electrical weapon |
| WO2021179077A1 (en) * | 2020-03-10 | 2021-09-16 | Vuereal Inc. | Coupling probe for micro device inspection |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3268809A (en) * | 1964-05-20 | 1966-08-23 | Western Electric Co | Apparatus for testing capacitors for leakage current and simultaneously for indicating whether reliable electrical contact is made thereto |
| US3414792A (en) * | 1965-06-23 | 1968-12-03 | Northern Electric Co | High potential pulse test circuit for capacitors |
| DE2903893A1 (en) * | 1979-02-01 | 1980-08-07 | Siemens Ag | Measurement method for leakage current of electrolytic capacitor - charges capacitor in short time period, integrates current over subsequent period from 500 to 1000 m.s. and then disconnects voltage source |
| JPS6196475A (en) * | 1984-10-17 | 1986-05-15 | Taiyo Yuden Co Ltd | Screening method of ceramic capacitor |
| US4697151A (en) * | 1986-06-05 | 1987-09-29 | Analog Devices, Inc. | Method and apparatus for testing operational amplifier leakage current |
| JPH0627757B2 (en) * | 1990-01-11 | 1994-04-13 | ローム株式会社 | Leak tester for capacitors |
| US5202640A (en) * | 1991-06-03 | 1993-04-13 | International Business Machines Corporation | Capacitance and leakage test method and apparatus |
| JP3121455B2 (en) * | 1992-09-29 | 2000-12-25 | 太陽誘電株式会社 | Stress evaluation method for ceramic capacitors |
| JP2760263B2 (en) * | 1993-08-20 | 1998-05-28 | 株式会社村田製作所 | Screening method for early failure products of ceramic capacitors |
-
1995
- 1995-11-16 US US08/559,547 patent/US5677634A/en not_active Expired - Lifetime
-
1996
- 1996-04-30 TW TW085105251A patent/TW305024B/en active
- 1996-11-18 WO PCT/US1996/018515 patent/WO1997017829A1/en active IP Right Grant
- 1996-11-18 EP EP96940527A patent/EP0861443A1/en not_active Withdrawn
- 1996-11-18 JP JP9519150A patent/JP2000500576A/en active Pending
- 1996-11-18 KR KR1019980703635A patent/KR19990067608A/en active IP Right Grant
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