USD290042S - Diagnostic slide for microscopes - Google Patents
Diagnostic slide for microscopes Download PDFInfo
- Publication number
- USD290042S USD290042S US06/660,112 US66011284F USD290042S US D290042 S USD290042 S US D290042S US 66011284 F US66011284 F US 66011284F US D290042 S USD290042 S US D290042S
- Authority
- US
- United States
- Prior art keywords
- microscopes
- diagnostic slide
- diagnostic
- slide
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Description
FIG. 1 is a perspective view of a diagnostic slide for microscopes showing my new design;
FIG. 2 is a top plan view thereof;
FIG. 3 is a bottom plan view thereof;
FIG. 4 is a right end elevational view, the left end elevational view being a mirror image thereof;
FIG. 5 is a front elevational view thereof; and
FIG. 6 is a rear elevational view thereof.
Claims (1)
- The ornamental design for a diagnostic slide for microscopes, as shown and described.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/660,112 USD290042S (en) | 1984-10-12 | 1984-10-12 | Diagnostic slide for microscopes |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/660,112 USD290042S (en) | 1984-10-12 | 1984-10-12 | Diagnostic slide for microscopes |
Publications (1)
Publication Number | Publication Date |
---|---|
USD290042S true USD290042S (en) | 1987-05-26 |
Family
ID=70169317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US06/660,112 Expired - Lifetime USD290042S (en) | 1984-10-12 | 1984-10-12 | Diagnostic slide for microscopes |
Country Status (1)
Country | Link |
---|---|
US (1) | USD290042S (en) |
Cited By (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD736403S1 (en) | 2012-02-29 | 2015-08-11 | Agilent Technologies, Inc. | Modular dried matrix spotting device |
USD843012S1 (en) * | 2017-01-25 | 2019-03-12 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD843013S1 (en) * | 2017-01-25 | 2019-03-12 | Hamamatsu Photonics K.K. | Substrates for spectroscopic analysis |
USD843011S1 (en) * | 2017-01-25 | 2019-03-12 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD843010S1 (en) * | 2017-01-25 | 2019-03-12 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD843594S1 (en) * | 2017-01-25 | 2019-03-19 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD854184S1 (en) * | 2017-01-25 | 2019-07-16 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855207S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855206S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855209S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855208S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855205S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855210S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD867612S1 (en) * | 2018-01-19 | 2019-11-19 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD867613S1 (en) * | 2018-01-19 | 2019-11-19 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD872540S1 (en) * | 2018-12-01 | 2020-01-14 | Tmul | Serving tray |
USD887576S1 (en) | 2018-01-19 | 2020-06-16 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD891635S1 (en) | 2018-01-19 | 2020-07-28 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD893746S1 (en) * | 2018-01-19 | 2020-08-18 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD893742S1 (en) | 2018-01-19 | 2020-08-18 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD894421S1 (en) | 2018-01-19 | 2020-08-25 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895143S1 (en) | 2018-01-19 | 2020-09-01 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895138S1 (en) | 2018-01-19 | 2020-09-01 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895142S1 (en) | 2018-01-19 | 2020-09-01 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895834S1 (en) | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895835S1 (en) | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895833S1 (en) * | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895836S1 (en) | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895832S1 (en) | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD898940S1 (en) | 2018-01-19 | 2020-10-13 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD901715S1 (en) | 2018-01-19 | 2020-11-10 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
-
1984
- 1984-10-12 US US06/660,112 patent/USD290042S/en not_active Expired - Lifetime
Cited By (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD736403S1 (en) | 2012-02-29 | 2015-08-11 | Agilent Technologies, Inc. | Modular dried matrix spotting device |
USD843012S1 (en) * | 2017-01-25 | 2019-03-12 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD843013S1 (en) * | 2017-01-25 | 2019-03-12 | Hamamatsu Photonics K.K. | Substrates for spectroscopic analysis |
USD843011S1 (en) * | 2017-01-25 | 2019-03-12 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD843010S1 (en) * | 2017-01-25 | 2019-03-12 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD843594S1 (en) * | 2017-01-25 | 2019-03-19 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD854184S1 (en) * | 2017-01-25 | 2019-07-16 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855207S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855206S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855209S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855208S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855205S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD855210S1 (en) * | 2017-01-25 | 2019-07-30 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD887576S1 (en) | 2018-01-19 | 2020-06-16 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895138S1 (en) | 2018-01-19 | 2020-09-01 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD936857S1 (en) | 2018-01-19 | 2021-11-23 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD867612S1 (en) * | 2018-01-19 | 2019-11-19 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD891635S1 (en) | 2018-01-19 | 2020-07-28 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD893746S1 (en) * | 2018-01-19 | 2020-08-18 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD893742S1 (en) | 2018-01-19 | 2020-08-18 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD894421S1 (en) | 2018-01-19 | 2020-08-25 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895143S1 (en) | 2018-01-19 | 2020-09-01 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD867613S1 (en) * | 2018-01-19 | 2019-11-19 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895142S1 (en) | 2018-01-19 | 2020-09-01 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895834S1 (en) | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895835S1 (en) | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895833S1 (en) * | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895836S1 (en) | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD895832S1 (en) | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD898940S1 (en) | 2018-01-19 | 2020-10-13 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD901715S1 (en) | 2018-01-19 | 2020-11-10 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD936858S1 (en) | 2018-01-19 | 2021-11-23 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
USD872540S1 (en) * | 2018-12-01 | 2020-01-14 | Tmul | Serving tray |
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