TWI807784B - Load board providing apparatus and load board providing method thereof - Google Patents

Load board providing apparatus and load board providing method thereof Download PDF

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TWI807784B
TWI807784B TW111114654A TW111114654A TWI807784B TW I807784 B TWI807784 B TW I807784B TW 111114654 A TW111114654 A TW 111114654A TW 111114654 A TW111114654 A TW 111114654A TW I807784 B TWI807784 B TW I807784B
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carrier
pick
carrier board
sensor
arm
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TW111114654A
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TW202342348A (en
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梁化鵬
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福懋科技股份有限公司
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Abstract

A load board providing apparatus includes a device main body and a board- moving device. The device main body includes an entry, an exit and a containing space, in which the entry used to contain a conveying device, the exit is nearly connected to a chip picking-placing device, and the containing space is disposed between the entry and the exit. The board-moving device includes a bearing platform, an object-taking arm, a first sensor and a second sensor. The object-taking arm is disposed on the bearing platform. The first sensor is fixed on one end of the object-taking arm, and the second sensor is fixed on the bearing platform. When the conveying device is disposed at the entry, the first sensor detects the position of the load board, and the object-taking arm hooks the load board for detecting the barcode by the second sensor. After the second sensor detects the barcode on the load board, the object-taking arm hooks the load board to the chip picking-placing device.

Description

載板供應設備及其載板供應方法 Carrier supplying device and carrier supplying method thereof

本發明是有關於一種載板供應設備及其供應方法,特別是有關於一種能夠自動將運送裝置上的載板勾取至晶片取放裝置的載板供應設備及其供應方法。 The present invention relates to a carrier supply device and its supply method, in particular to a carrier supply device and its supply method capable of automatically hooking a carrier on a transport device to a wafer pick-and-place device.

崩應(Burn-in)測試是積體電路在後半段的測試過程中用於測試晶片是否有瑕疵,有瑕疵的晶片在崩應測試的過程中會提早顯現出其生命週期較短的特性。現有的崩應測試方法主要是將待測試的晶片放置於特定的載板上,再將載板送往崩應測試爐,以特定的時間、溫度對晶片加熱並進行電性測試。 The burn-in test is used in the second half of the test process of the integrated circuit to test whether the chip is flawed, and the defective chip will show its short life cycle characteristics early in the process of the burn-in test. The existing avalanche test method is mainly to place the wafer to be tested on a specific carrier, and then send the carrier to the avalanche test furnace, heat the wafer at a specific time and temperature, and conduct an electrical test.

在進行崩應測試之前,由於待測試晶片的數量相當龐大,並且不同產品使用的晶片所需要的測試條件也不盡相同,因此目前是以晶片取放裝置輔助將待測試的晶片放置於載板上。然而將載板移動至晶片取放裝置與移出放置完晶片的載板等工作目前仍須仰賴人力,除了容易造成人員疲勞之外,在更換不同批號、種類的晶片進行取放時也有可能因人員失誤造成載板或晶片取放錯誤。因此,目前仍需要一種載板移動設備來解決現有技術遇到的問題。 Before the crash test, due to the large number of wafers to be tested and the different test conditions required for wafers used in different products, the wafer pick-and-place device is currently used to assist in placing the wafers to be tested on the carrier. However, the work of moving the carrier board to the wafer pick-and-place device and removing the wafer-placed carrier board still requires manpower. In addition to easily causing fatigue, human errors may also cause carrier board or wafer pick-and-place errors when replacing different batches and types of wafers for pick-and-place. Therefore, there is still a need for a carrier mobile device to solve the problems encountered in the prior art.

根據現有技術所面臨的問題,本發明的目的是提供一種載板供應設備,能夠自動將運送裝置上的載板移取至晶片取放裝置,減少人力的消耗。 According to the problems faced by the prior art, the object of the present invention is to provide a carrier board supply device, which can automatically transfer the carrier board on the transport device to the wafer pick-and-place device, reducing the consumption of manpower.

本發明的另一目的在於提供一種透過載板供應設備的載板供應方法,能夠避免因人員操作造成的誤差。 Another object of the present invention is to provide a carrier plate supply method through the carrier plate supply equipment, which can avoid errors caused by human operation.

為達上述目的,本發明提供一種載板供應設備,用以自運送裝置移送載板至晶片取放裝置,載板供應設備包括設備本體與載板移取裝置。設備本體包括入口、出口與容置空間,入口用以容置運送裝置,出口鄰接晶片取放裝置,以及容置空間位於入口與出口之間。載板移取裝置配置該容置空間內,用以自運送裝置通過入口勾取載板,並通過出口勾取載板至晶片取放裝置。載板移取裝置包括承載平台、取物臂、第一感測器與第二感測器。承載平台固定於容置空間內。取物臂設置於承載平台上並可在入口與出口之間來回移動。第一感測器固設於取物臂朝向入口的一端,用以感測載板於運送裝置上的位置。第二感測器固設於承載平台上,用以感測載板上的條碼。其中取物臂、第一感測器與第二感測器電性連接於處理器,當運送裝置容置於入口時,第一感測器感測載板於運送裝置的位置並傳送第一訊號至處理器,處理器再根據第一訊號控制取物臂勾取載板至承載平台以供第二感測器感測載板上的條碼,第二感測器感測條碼並傳送第二訊號至處理器,以及處理器控制取物臂並通過出口勾取載板至晶片取放裝置,並同時傳送第二訊號至晶片取放裝置。 In order to achieve the above purpose, the present invention provides a carrier board supply device for transferring the carrier board from the transport device to the wafer pick-and-place device. The carrier board supply device includes a device body and a carrier board removal device. The equipment body includes an entrance, an exit and an accommodating space. The entrance is used to accommodate the conveying device, the exit is adjacent to the wafer pick-and-place device, and the accommodating space is located between the entrance and the exit. The carrier board removal device is arranged in the accommodating space, and is used for picking up the carrier board from the conveying device through the inlet, and hooking the carrier board through the outlet to the wafer pick-and-place device. The carrier removing device includes a carrying platform, an object picking arm, a first sensor and a second sensor. The bearing platform is fixed in the accommodation space. The pick-up arm is arranged on the carrying platform and can move back and forth between the entrance and the exit. The first sensor is fixed at one end of the pick-up arm facing the entrance, and is used for sensing the position of the carrier on the conveying device. The second sensor is fixed on the carrying platform and is used for sensing the barcode on the carrying plate. Wherein the picking arm, the first sensor and the second sensor are electrically connected to the processor. When the transporting device is accommodated at the entrance, the first sensor senses the position of the carrier on the transporting device and sends a first signal to the processor. The processor then controls the picking arm to hook the carrier to the loading platform according to the first signal so that the second sensor senses the barcode on the carrier. The second sensor senses the barcode and sends a second signal to the processor. Wafer pick and place device.

在一較佳實施例中,當晶片取放裝置對載板完成晶片取放作業後,處理器控制取物臂通過出口勾取載板至承載平台,以及處理器再根據第一訊號控制取物臂通過入口勾取載板至運送裝置上此載板的原始位置。 In a preferred embodiment, after the wafer pick-and-place device completes the wafer pick-and-place operation on the carrier, the processor controls the pick-up arm to hook the carrier through the outlet to the loading platform, and the processor controls the pick-up arm to hook the carrier through the inlet to the original position of the carrier on the transport device according to the first signal.

在一較佳實施例中,取物臂可帶動第一感測器於垂直於承載平台的承載面的方向移動以感測載板的位置。 In a preferred embodiment, the pick-up arm can drive the first sensor to move in a direction perpendicular to the loading surface of the loading platform to sense the position of the loading plate.

在一較佳實施例中,第一訊號包括載板於運送裝置上的位置資料,以及第二訊號包括載板上晶片排序資料的儲存路徑。 In a preferred embodiment, the first signal includes the location data of the carrier on the transport device, and the second signal includes the storage path of the chip sorting data on the carrier.

為達上述目的,本發明提供一種使用上述載板移動設備的載板供應方法,包括以下步驟:提供具有至少一載板的運送裝置並容置於入口,以及設置出口鄰近晶片取放裝置;透過第一感測器感測運送裝置內的載板;通過入口勾取載板至承載平台;透過第二感測器感測載板上的條碼;以及通過出口勾取載板至晶片取放裝置。 To achieve the above object, the present invention provides a method for supplying a carrier using the above-mentioned carrier moving device, comprising the following steps: providing a conveying device having at least one carrier and accommodating it at the entrance, and setting an outlet adjacent to the wafer pick-and-place device; sensing the carrier in the conveying device through the first sensor; picking the carrier through the entrance to the loading platform; sensing the barcode on the carrier through the second sensor; and picking the carrier through the outlet to the wafer pick-and-place device.

在一較佳實施例中,載板供應方法還包括以下步驟。當晶片取放裝置對載板完成晶片放置作業時,通過出口勾取載板至承載平台;以及通過入口勾取載板至運送裝置。 In a preferred embodiment, the carrier board supply method further includes the following steps. When the chip pick-and-place device completes the chip placement operation on the carrier board, it hooks the carrier board through the exit to the carrying platform; and hooks the carrier board through the entrance to the delivery device.

在一較佳實施例中,處理器根據第一訊號控制取物臂將載板勾取至運送裝置上載板的原始位置。 In a preferred embodiment, the processor controls the pick-up arm to hook the carrier board to the original position of the carrier board on the conveying device according to the first signal.

在一較佳實施例中,其中透過第一感測器以感測運送裝置內的載板的步驟中,如果沒有感測到載板,則控制取物臂帶動第一感測器移動,以及實施透過第一感測器以感測運送裝置內的載板的步驟直到第一感測器感測到載板。 In a preferred embodiment, in the step of sensing the carrier in the conveying device through the first sensor, if no carrier is sensed, then controlling the pick-up arm to drive the first sensor to move, and implementing the step of sensing the carrier in the conveying device through the first sensor until the first sensor senses the carrier.

根據上述,載板供應設備上具有第一感測器以感測運送裝置中載板的位置並傳送第一訊號給處理器,載板被勾取至承載平台上時由第二感測器感測載板上的條碼並傳送第二訊號至處理器,載板被勾取至晶片取放裝置時,處理器同時將第二訊號傳送至晶片取放裝置。如此一來,操作人員只需要將裝載多片空載板的運送裝置對接至載板供應設備的入口,載板的移動即可自動由載板供應設備完成,因此能減少人力消耗。此外,由於載板的移動由載板供應設備自動進行,因此也能夠避免操作人員造成的載板移動錯誤,並大幅提高晶片取放裝置的晶片取放精確度以提高作業效率。 According to the above, the carrier board supply device has a first sensor to sense the position of the carrier board in the transport device and send a first signal to the processor. When the carrier board is hooked onto the carrier platform, the second sensor senses the barcode on the carrier board and sends the second signal to the processor. When the carrier board is hooked to the wafer pick-and-place device, the processor simultaneously sends the second signal to the wafer pick-and-place device. In this way, the operator only needs to dock the conveying device loaded with multiple empty boards to the entrance of the board supply equipment, and the movement of the boards can be automatically completed by the board supply equipment, thus reducing manpower consumption. In addition, since the movement of the carrier is automatically performed by the carrier supply equipment, it is also possible to avoid carrier movement errors caused by operators, and greatly improve the accuracy of wafer pick-and-place of the wafer pick-and-place device to improve work efficiency.

10:載板供應設備 10: Carrier board supply equipment

11:設備本體 11: Equipment body

111:入口 111: Entrance

112:出口 112: export

113:容置空間 113:Accommodating space

12:載板移取裝置 12: Carrier removal device

121:取物臂 121: Retrieval arm

1211:勾爪 1211: hook claw

122:承載平台 122: Bearing platform

123:第一感測器 123: The first sensor

124:第二感測器 124: Second sensor

13:處理器 13: Processor

20:運送裝置 20: Transport device

21:載板 21: carrier board

211:條碼 211: barcode

212:晶片插槽 212: chip slot

213:凹槽 213: Groove

30:晶片取放裝置 30: Wafer pick-and-place device

40:資料庫 40: Database

D1:方向 D1: Direction

S101~S107、S201~S202:步驟 S101~S107, S201~S202: steps

圖1是根據本發明的一實施例,表示載板供應設備的立體示意圖;圖2是根據圖1的實施例,表示載板供應設備的剖面示意圖;圖3是根據圖2的實施例,表示載板的部分俯視示意圖;圖4是根據圖2的實施例,表示載板供應設備中各元件電性連接關係的系統方塊示意圖;圖5是根據本發明的另一實施例,表示使用本發明載板供應設備的載板移動流程圖;圖6A至圖6C是根據圖5的實施例,表示載板供應設備的載板勾取過程;以及圖7是根據圖6的實施例,表示使用本發明載板供應設備的載板移動流程圖。 1 is a schematic perspective view of a carrier supply device according to an embodiment of the present invention; FIG. 2 is a schematic cross-sectional view of a carrier supply device according to the embodiment of FIG. 1; FIG. 3 is a partial top view of a carrier according to the embodiment of FIG. 2; FIG. The embodiment of FIG. 5 shows the carrier board picking process of the carrier board supply device; and FIG. 7 is the embodiment according to FIG. 6 , showing the flow chart of carrier board movement using the carrier board supply device of the present invention.

有關本發明之前述及其他技術內容、特點與功效,在以下配合參考圖式之一較佳實施例的詳細說明中,將可清楚的呈現。以下實施例中所提到的方向用語,例如:上、下、左、右、前或後等,僅是參考附加圖式的方向。因此,使用的方向用語是用來說明並非用來限制本發明。此外,圖式中的XYZ座標軸僅用於說明本發明的實施例,而非用於限制本發明的申請專利範圍。 The aforementioned and other technical contents, features and effects of the present invention will be clearly presented in the following detailed description of a preferred embodiment with reference to the drawings. The directional terms mentioned in the following embodiments, such as: up, down, left, right, front or back, etc., are only directions referring to the attached drawings. Accordingly, the directional terms used are for the purpose of illustration and not for the purpose of limiting the invention. In addition, the XYZ coordinate axes in the drawings are only used to illustrate the embodiments of the present invention, and are not used to limit the patent scope of the present invention.

圖1是根據本發明的一實施例,表示載板供應設備的立體示意圖,圖2是根據圖1的實施例,表示載板供應設備的剖面示意圖。請參考圖1與圖2,載板供應設備10包括設備本體11與載板移取裝置12。載板供應設備10用以將運送裝置20上的載板21移動至晶片取放裝置30,其中設備本體11包括入口111、出口112與容置空間113,入口111用以容置運送裝置20,出口112鄰接晶片取放裝置30,以及容置空間113位於入口111與出口112之間。本實施例中,運送裝置20可為台車或其他適合的運送裝置,載板21可為崩應板、高溫低溫測試板或其他合適的測試用板。晶片取放裝置30可將待測試的晶片放置到載板21上,其中晶片取放裝置30例如是使用真空吸盤或其他合適的機構將待測試晶片放置於載板21上。 FIG. 1 is a schematic perspective view showing a carrier board supplying device according to an embodiment of the present invention, and FIG. 2 is a cross-sectional schematic view showing a carrier board supplying device according to the embodiment of FIG. 1 . Please refer to FIG. 1 and FIG. 2 , the carrier supply device 10 includes a device body 11 and a carrier removal device 12 . The carrier board supply device 10 is used to move the carrier board 21 on the transport device 20 to the wafer pick-and-place device 30 , wherein the device body 11 includes an inlet 111 , an outlet 112 and an accommodating space 113 . In this embodiment, the conveying device 20 can be a trolley or other suitable conveying device, and the carrier board 21 can be a crash-response board, a high-temperature and low-temperature test board, or other suitable test boards. The wafer pick-and-place device 30 can place the wafer to be tested on the carrier 21 , wherein the wafer pick-and-place device 30 places the wafer to be tested on the carrier 21 by using a vacuum chuck or other suitable mechanism, for example.

請繼續參考圖1與圖2,載板供應設備10中,載板移取裝置12配置於容置空間113內,用以自運送裝置20通過入口111勾取載板21,並通過出口112勾取載板21至晶片取放裝置30。載板移取裝置12包括取物臂121、承載平台122、第一感測器123與第二感測器124。詳細而言,取物臂121可為機械臂與勾爪的組合、機械臂與真空吸盤的組合或是其他適合移動載板的機械裝置,承載平台122固定於容置空間113內,承載平台122可為金屬製的平台且具有承載 面,例如不鏽鋼製,其中承載平台122的承載面設置為平行於XY平面。取物臂121設置於承載平台122上,並可在入口111與出口112之間來回移動。 Please continue to refer to FIG. 1 and FIG. 2 , in the carrier board supply equipment 10 , the carrier board removal device 12 is disposed in the accommodating space 113 for picking up the carrier board 21 from the transport device 20 through the inlet 111 , and hooking up the carrier board 21 through the outlet 112 to the wafer pick-and-place device 30 . The carrier removing device 12 includes a picking arm 121 , a carrying platform 122 , a first sensor 123 and a second sensor 124 . In detail, the pick-up arm 121 can be a combination of a mechanical arm and a hook, a combination of a mechanical arm and a vacuum chuck, or other mechanical devices suitable for moving the carrier. The carrying platform 122 is fixed in the accommodating space 113. The carrying platform 122 can be a metal platform and has a carrying capacity. surface, such as made of stainless steel, wherein the carrying surface of the carrying platform 122 is set parallel to the XY plane. The pick-up arm 121 is disposed on the carrying platform 122 and can move back and forth between the entrance 111 and the exit 112 .

請繼續參考圖1與圖2,第一感測器123用於感測載板21於運送裝置20上的位置,第一感測器123固設於取物臂121朝向入口111的一端。第二感測器124固設於承載平台122上,用以感測載板21上的條碼。本實施例中,第一感測器123可為紅外線感測器或其他能夠感測物體位置的感測裝置,第二感測器124為可見光條碼感測器、紅外光條碼感測器或其他合適的條碼感測器。圖3是根據圖2的實施例,表示載板的部分俯視示意圖,請參考圖3載板21包括條碼211與多個晶片插槽212,條碼211可供第二感測器124感測其所包含的資訊,其中條碼211為一維條碼、二維條碼或是其他可包含資訊的條碼。本實施例中,條碼211包含屬於此載板21本身晶片排序資訊的儲存路徑,例如是儲存於資料庫40(繪示於圖4)的儲存路徑,晶片插槽212則作為晶片取放裝置30放置晶片的位置。 Please continue to refer to FIG. 1 and FIG. 2 , the first sensor 123 is used to sense the position of the carrier 21 on the conveying device 20 , and the first sensor 123 is fixed at one end of the pick-up arm 121 facing the entrance 111 . The second sensor 124 is fixed on the carrying platform 122 for sensing the barcode on the carrying plate 21 . In this embodiment, the first sensor 123 can be an infrared sensor or other sensing device capable of sensing the position of an object, and the second sensor 124 can be a visible light barcode sensor, an infrared light barcode sensor or other suitable barcode sensors. 3 is a partial top view of the carrier board according to the embodiment of FIG. 2. Please refer to FIG. 3. The carrier board 21 includes a barcode 211 and a plurality of chip slots 212. The barcode 211 can be used by the second sensor 124 to sense the information contained therein. The barcode 211 is a one-dimensional barcode, a two-dimensional barcode or other barcodes that can contain information. In this embodiment, the barcode 211 includes the storage path of the chip sorting information of the carrier board 21 itself, such as the storage path stored in the database 40 (shown in FIG. 4 ), and the chip slot 212 is used as a position for the chip pick-and-place device 30 to place the chip.

圖4是根據圖2的實施例,表示載板供應設備中各元件電性連接關係的系統方塊示意圖。請參考圖2與圖4,取板設備121中的取物臂121第一感測器123與第二感測器124電性連接於處理器13,其中處理器13可用已知的有線或無線方式電性連接上述元件,處理器13可為PC、平板電腦等設備,也可以是單核心或多核心的中央處理單元(CPU)、數位訊號處理器(DSP)、可程式化控制器或其他合適的資料處理裝置。因此,本發明不限定處理器13的可用種類,也不限定處理器13是否需設置於設備本體11的容置空間113內。 FIG. 4 is a system block diagram showing the electrical connections of components in the carrier board supply device according to the embodiment of FIG. 2 . Please refer to FIG. 2 and FIG. 4 , the first sensor 123 and the second sensor 124 of the picking arm 121 in the board picking device 121 are electrically connected to the processor 13, wherein the processor 13 can be electrically connected to the above-mentioned components in a known wired or wireless manner, and the processor 13 can be a PC, a tablet computer or other equipment, and can also be a single-core or multi-core central processing unit (CPU), digital signal processor (DSP), programmable controller or other suitable data processing devices. Therefore, the present invention does not limit the available types of the processor 13 , nor does it limit whether the processor 13 needs to be disposed in the accommodating space 113 of the device body 11 .

請繼續參考圖1至圖4,當操作人員推送運送裝置20至本發明的載板供應設備10並且容置於入口111時,處理器13控制取物臂121向入口111移 動,此時第一感測器123即可感測運送裝置20中載板21的位置並傳送第一訊號至處理器13。在此,第一訊號包括載板21於運送裝置20上的位置資料。處理器13接著根據第一訊號控制取物臂121勾取其中一片載板21至承載平台122,第二感測器124即可感測此載板21上的條碼211並回傳對應此載板21的第二訊號至處理器13。在此,第二訊號為此載板21上晶片排序資料的儲存路徑,例如是資料庫40內的儲存路徑。處理器13在接收到第二訊號後,即控制取物臂121勾取此載板21至晶片取放裝置30並同時傳送第二訊號至晶片取放裝置30,以供晶片取放裝置30進行後續的晶片取放作業。本實施例中,晶片取放裝置30還電性連接於資料庫40,因此晶片取放裝置30可根據第二訊號的內容從資料庫下載對應此載板21的晶片排序資料,並根據此晶片排序資料將晶片放置於載板21對應的晶片插槽212上。如此一來,由於載板21的移動作業可由本發明的載板供應裝置10自動進行,因此能夠大幅減少人力消耗。此外,由於晶片取放裝置30的晶片取放作業是依據上述第二訊號所得到的資料庫路徑而從資料庫下載對應此載板21的晶片排序資料,因此也能夠大幅提高晶片取放裝置30的晶片取放精確度,進而能夠大幅提高整體的作業效率。 Please continue to refer to FIG. 1 to FIG. 4, when the operator pushes the delivery device 20 to the carrier plate supply device 10 of the present invention and is accommodated in the entrance 111, the processor 13 controls the pick-up arm 121 to move toward the entrance 111. At this moment, the first sensor 123 can sense the position of the carrier board 21 in the transport device 20 and send a first signal to the processor 13 . Here, the first signal includes position data of the carrier board 21 on the conveying device 20 . The processor 13 then controls the picking arm 121 to pick one of the carrier boards 21 to the carrier platform 122 according to the first signal, and the second sensor 124 can sense the barcode 211 on the carrier board 21 and return a second signal corresponding to the carrier board 21 to the processor 13 . Here, the second signal is the storage path of the chip sorting data on the carrier board 21 , for example, the storage path in the database 40 . After receiving the second signal, the processor 13 controls the pick-up arm 121 to hook the carrier 21 to the wafer pick-and-place device 30 and simultaneously transmits the second signal to the wafer pick-and-place device 30 for the wafer pick-and-place device 30 to perform subsequent wafer pick-and-place operations. In this embodiment, the chip pick-and-place device 30 is also electrically connected to the database 40, so the chip pick-and-place device 30 can download the chip sorting data corresponding to the carrier board 21 from the database according to the content of the second signal, and place the chip on the chip slot 212 corresponding to the carrier board 21 according to the chip sorting data. In this way, since the moving operation of the carrier board 21 can be automatically performed by the carrier board supply device 10 of the present invention, manpower consumption can be greatly reduced. In addition, since the wafer pick-and-place operation of the wafer pick-and-place device 30 downloads the wafer sorting data corresponding to the carrier 21 from the database according to the database path obtained by the above-mentioned second signal, the wafer pick-and-place accuracy of the wafer pick-and-place device 30 can be greatly improved, and the overall operation efficiency can be greatly improved.

請繼續參考圖1至圖4。運送裝置20上通常裝載多片載板21(如圖2所示),由於每片載板21能夠容置的晶片種類不盡相同,而且載板21在運送裝置20上的放置位置可能與晶片測試後的製程站點有關聯,因此每片載板21的位置不一定能夠隨意更動。本實施例的載板供應裝置10中,取物臂121也可帶動第一感測器123在垂直於承載平台122的承載面的方向上來回移動,因此第一感測器123能夠感測每片載板21在運送裝置20上的位置。當其中一個載板21被第一感測器123感測到時,第一感測器123即會傳送第一訊號至處理器13,處 理器13會根據第一訊號判斷第一感測器123的所在位置有載板21存在並控制取物臂121勾取載板21。如此一來,由於操作人員不需再以手動搬運的方式移動載板21至晶片取放裝置30,因此可減少人力消耗,相較於以人力搬運載板21或是使用習知彎折式的機械手臂移動載板21,能夠進一步縮短載板21的移動時間。此外,也能夠避免操作人員不慎放入錯誤載板21至晶片取放裝置30,導致晶片取放裝置30隨後放入錯誤晶片的狀況發生。 Please continue to refer to Figures 1 to 4. The carrier 20 is usually loaded with a plurality of carrier boards 21 (as shown in FIG. 2 ). Since each carrier board 21 can accommodate different types of wafers, and the placement position of the carrier board 21 on the carrier device 20 may be related to the process station after the wafer test, the position of each carrier board 21 may not be able to be changed arbitrarily. In the carrier plate supply device 10 of this embodiment, the pick-up arm 121 can also drive the first sensor 123 to move back and forth in a direction perpendicular to the carrying surface of the carrying platform 122, so the first sensor 123 can sense the position of each carrier plate 21 on the conveying device 20. When one of the carrier boards 21 is sensed by the first sensor 123, the first sensor 123 will send a first signal to the processor 13 for processing The processor 13 judges that there is a carrier board 21 at the position of the first sensor 123 according to the first signal, and controls the picking arm 121 to pick up the carrier board 21 . In this way, since the operator no longer needs to manually move the carrier 21 to the wafer pick-and-place device 30, manpower consumption can be reduced. Compared with moving the carrier 21 manually or using a conventional bending robot arm to move the carrier 21, the moving time of the carrier 21 can be further shortened. In addition, it is also possible to prevent the operator from accidentally putting the wrong carrier 21 into the wafer pick-and-place device 30 , causing the wafer pick-and-place device 30 to subsequently place wrong wafers.

圖5是根據本發明另一實施例,表示使用本發明載板供應設備的載板供應方法的流程圖,以及圖6A至圖6C是根據圖5的實施例,表示載板供應設備的載板取放過程,其中圖6A至圖6C的實施例使用與圖1至圖4相同的載板供應設備10。為清楚表達本發明的載板供應方法,圖6A至圖6C有省略部分元件的繪製,相同的元件也以相同的標號表示,在此不再贅述。請先參考圖1、圖2與圖5,步驟S101:提供具有至少一載板的運送裝置並容置於入口,設置出口鄰接於晶片取放裝置。在此步驟中,運送裝置20具有至少一載板21,運送裝置20容置於設備本體11的入口111,以供取物臂121勾取載板21至承載平台122。此外,載板供應設備10的出口112鄰接晶片取放裝置30,以供取物臂121勾取載板21至晶片取放裝置30。 5 is a flow chart showing a carrier board supply method using the carrier board supply device of the present invention according to another embodiment of the present invention, and FIGS. 6A to 6C are according to the embodiment of FIG. 5 , showing the carrier board pick-and-place process of the carrier board supply device, wherein the embodiment of FIGS. 6A to 6C uses the same carrier board supply device 10 as that of FIGS. In order to clearly express the carrier board supply method of the present invention, some components are omitted in FIGS. 6A to 6C , and the same components are denoted by the same reference numerals, which will not be repeated here. Please refer to FIG. 1 , FIG. 2 and FIG. 5 , step S101 : provide a conveying device having at least one carrier plate and accommodate it at the inlet, and set the outlet adjacent to the wafer pick-and-place device. In this step, the conveying device 20 has at least one carrier 21 , and the conveying device 20 is accommodated in the entrance 111 of the device body 11 for the pick-up arm 121 to hook the carrier 21 to the carrying platform 122 . In addition, the outlet 112 of the carrier supply device 10 is adjacent to the wafer pick-and-place device 30 for the pick-up arm 121 to hook the carrier 21 to the wafer pick-and-place device 30 .

請參考圖5與圖6A,步驟S102:透過第一感測器感測載板運送裝置內的載板。在此步驟中,第一感測器123固設於取物臂121朝向入口111的一端,因此第一感測器123能夠隨著取物臂121移動以感測運送裝置20上的載板21。如圖6A所示,本實施例中,取物臂121可在入口111與出口112之間移動,例如是沿一個平行於XY平面的方向D1移動,其中取物臂121上設有勾爪1211, 載板21的底面具有凹槽213。當取物臂121沿方向D1移動並接近運送裝置20時,第一感測器123即可感測運送裝置20上的載板21。 Please refer to FIG. 5 and FIG. 6A , step S102 : sensing the carrier in the carrier conveying device through the first sensor. In this step, the first sensor 123 is fixed at one end of the pick-up arm 121 facing the entrance 111 , so the first sensor 123 can move along with the pick-up arm 121 to sense the carrier plate 21 on the delivery device 20 . As shown in FIG. 6A , in this embodiment, the pick-up arm 121 can move between the entrance 111 and the exit 112 , for example, along a direction D1 parallel to the XY plane, wherein the pick-up arm 121 is provided with a claw 1211 , The bottom surface of the carrier board 21 has a groove 213 . When the pick-up arm 121 moves along the direction D1 and approaches the conveying device 20 , the first sensor 123 can sense the carrier board 21 on the conveying device 20 .

請參考圖5、圖6A與圖6B,步驟S103:傳送第一訊號至處理器。在此步驟中,當第一感測器123感測到運送裝置20內有載板21存在時,第一感測器123即發出第一訊號至處理器13,其中第一訊號包括載板21於運送裝置20的原始位置資料,處理器13可將此載板21的位置資料暫存於與處理器13電性連接的記憶模組(未繪示)內。 Please refer to FIG. 5 , FIG. 6A and FIG. 6B , step S103 : sending the first signal to the processor. In this step, when the first sensor 123 senses the presence of the carrier board 21 in the transport device 20, the first sensor 123 sends a first signal to the processor 13, wherein the first signal includes the original position data of the carrier board 21 in the transport device 20, and the processor 13 can temporarily store the position data of the carrier board 21 in a memory module (not shown) electrically connected to the processor 13.

請參考圖5、圖6A與圖6B,步驟S104:透過取物臂並通過入口勾取載板至承載平台。在此步驟中,處理器13收到此第一訊號後會控制取物臂121上的勾爪自運送裝置20通過入口111移動載板21,並將載板21移動至承載平台122上第二感測器124的感測範圍。本實施例中,處理器13例如是控制取物臂121上的勾爪1211勾入載板21底面的凹槽213,並控制取物臂121移動以使載板21上的條碼211能夠進入第二感測器124的感測範圍。 Please refer to FIG. 5 , FIG. 6A and FIG. 6B , step S104 : through the pick-up arm and through the entrance, pick up the carrier plate to the carrier platform. In this step, after receiving the first signal, the processor 13 will control the claw on the pick-up arm 121 to move the carrier 21 from the transport device 20 through the entrance 111 , and move the carrier 21 to the sensing range of the second sensor 124 on the carrier platform 122 . In this embodiment, the processor 13, for example, controls the claw 1211 on the picking arm 121 to hook into the groove 213 on the bottom surface of the carrier 21, and controls the moving of the picking arm 121 so that the barcode 211 on the carrier 21 can enter the sensing range of the second sensor 124.

此外,請參考圖2、圖5與圖6A,步驟S107:透過取物臂帶動第一感測器移動。如圖2所示,運送裝置20上可能會裝載多片載板21,每片載板21之間會有高低的落差,並且運送裝置20的每層支架上也不一定有裝載載板21。因此,在此步驟中,若第一感測器123沒有感測到載板21,例如是在一預設的時間內處理器13沒有接收到第一訊號,則處理器13可控制取物臂121往其他不同於D1的方向移動或轉動,直到處理器13接收到第一感測器123回傳的第一訊號為止。 In addition, please refer to FIG. 2 , FIG. 5 and FIG. 6A , step S107 : drive the first sensor to move through the pick-up arm. As shown in FIG. 2 , multiple carrier boards 21 may be loaded on the conveying device 20 , and there may be a height difference between each carrier board 21 , and each carrier of the conveying device 20 may not necessarily have a carrier board 21 loaded thereon. Therefore, in this step, if the first sensor 123 does not sense the carrier 21, for example, the processor 13 does not receive the first signal within a preset time, the processor 13 can control the pick-up arm 121 to move or rotate in a direction other than D1 until the processor 13 receives the first signal returned by the first sensor 123.

請參考圖4、圖5與圖6B,步驟S105:透過第二感測器感測載板上的條碼。在此步驟中,載板21具有條碼211,當取物臂121勾取載板21至承載 平台122上第二感測器124的感測範圍內時,第二感測器124即可感測條碼211並傳送第二訊號至處理器,其中第二訊號包括此載板21上晶片放置資訊的資料庫40內的儲存路徑。 Please refer to FIG. 4 , FIG. 5 and FIG. 6B , step S105 : sensing the barcode on the carrier through the second sensor. In this step, the carrier board 21 has a barcode 211, when the pick-up arm 121 hooks the carrier board 21 to the carrier When the second sensor 124 on the platform 122 is within the sensing range, the second sensor 124 can sense the barcode 211 and send a second signal to the processor, wherein the second signal includes a storage path in the database 40 of chip placement information on the carrier 21 .

請參考圖4、圖5與圖6C。步驟S106:透過取物臂並通過出口勾取載板至晶片取放裝置。在此步驟中,當處理器13接收到第二訊號後,處理器13控制取物臂121並通過出口112以將載板21勾取至晶片取放裝置30。本實施例中,處理器13也同時傳送第二訊號至晶片取放裝置30,晶片取放裝置30電性連接於資料庫40,第二訊號中包含載板21上晶片放置資訊的資料庫40的儲存路徑。如此一來,晶片取放裝置30即可根據處理器13傳送的第二訊號自資料庫40下載對應此載板21的晶片放置資訊,並根據此晶片放置資訊對此載板21進行後續的晶片取放作業。 Please refer to FIG. 4 , FIG. 5 and FIG. 6C . Step S106 : Pick up the carrier board through the pick-up arm and through the outlet to the wafer pick-and-place device. In this step, when the processor 13 receives the second signal, the processor 13 controls the pick-up arm 121 to hook the carrier 21 to the wafer pick-and-place device 30 through the outlet 112 . In this embodiment, the processor 13 also transmits a second signal to the chip pick-and-place device 30 at the same time. The chip pick-and-place device 30 is electrically connected to the database 40 , and the second signal includes the storage path of the database 40 of the chip placement information on the carrier 21 . In this way, the chip pick-and-place device 30 can download the chip placement information corresponding to the carrier 21 from the database 40 according to the second signal sent by the processor 13 , and perform subsequent chip pick-and-place operations on the carrier 21 according to the chip placement information.

圖7是根據圖5的實施例,表示使用本發明載板供應設備的載板移動流程圖。請參考圖6C與圖7,步驟S201是接續於圖6的步驟S106。步驟S201:當晶片取放裝置對載板完成晶片放置作業時,通過出口勾取載板至承載平台。在此步驟中,當晶片取放裝置30根據載板21對應的晶片放置資訊完成晶片放置後,處理器13控制取物臂121通過出口112將載板21勾取至承載平台122。此時載板21已經完成晶片的放置,故此過程不再使用第二感測器124對載板21上的條碼211進行掃描。 FIG. 7 is a flow chart showing carrier movement using the carrier supply apparatus of the present invention according to the embodiment of FIG. 5 . Please refer to FIG. 6C and FIG. 7 , step S201 is continued from step S106 in FIG. 6 . Step S201: When the wafer pick-and-place device completes the wafer placement operation on the carrier board, hook the carrier board to the carrier platform through the exit. In this step, after the wafer pick-and-place device 30 completes the wafer placement according to the wafer placement information corresponding to the carrier 21 , the processor 13 controls the picking arm 121 to pick the carrier 21 to the carrier platform 122 through the outlet 112 . At this time, the carrier board 21 has finished placing the wafers, so the second sensor 124 is not used to scan the barcode 211 on the carrier board 21 in this process.

請參考圖6A、圖6B與圖7,步驟S202:通過入口勾取載板至運送裝置。在此步驟中,處理器13根據前述第一訊號的內容得到載板21在運送裝置20上的原始位置,因此處理器13可控制取物臂121將載板21通過入口111勾取至運送裝置20上的原始位置上。如此一來,載板供應裝置10即可移動下一片載 板21至晶片取放裝置30進行晶片放置作業,且由於載板供應設備10可將載板21歸位於運送裝置20上原始的放置位置,因此操作人員在晶片取放裝置30完成載板21的晶片放置作業後,不需要再以手動的方式將載板21歸位回運送裝置20,而且完成運送裝置20內所有載板21的晶片放置作業後,操作人員可直接移動運送裝置20至下一個製程站,故能大幅節省作業時間並增加載板供應與晶片取放的工作效率。 Please refer to FIG. 6A , FIG. 6B and FIG. 7 , step S202 : picking up the carrier board through the entrance to the delivery device. In this step, the processor 13 obtains the original position of the carrier 21 on the conveying device 20 according to the content of the aforementioned first signal, so the processor 13 can control the pick-up arm 121 to hook the carrier 21 to the original position on the conveying device 20 through the entrance 111 . In this way, the carrier board supply device 10 can move the next The wafer placement operation is carried out from the board 21 to the wafer pick-and-place device 30, and since the carrier board supply equipment 10 can return the carrier board 21 to the original placement position on the transport device 20, the operator does not need to manually return the carrier board 21 to the transport device 20 after the wafer pick-and-place device 30 completes the wafer placement operation on the carrier board 21, and after completing the wafer placement operation of all the carrier boards 21 in the transport device 20, the operator can directly move the transport device 20 to the next process station, which can greatly save operating time And increase the work efficiency of carrier board supply and chip pick-and-place.

綜上所述,本發明的實施例中,載板供應設備上具有第一感測器以感測運送裝置中載板的位置並傳送第一訊號給處理器,載板被勾取至承載平台上時由第二感測器感測載板上的條碼並傳送第二訊號至處理器,載板被勾取至晶片取放裝置時,處理器同時將第二訊號傳送至晶片取放裝置。如此一來,操作人員只需要將裝載多片空載板的運送裝置對接至載板供應設備的入口,載板的移動即可自動由載板供應設備完成,因此能減少人力消耗。此外,由於載板的移動由載板供應設備自動進行,因此也能夠避免操作人員造成的載板移動錯誤,並大幅提高晶片取放裝置的晶片取放精確度以提高作業效率。 To sum up, in the embodiment of the present invention, the carrier board supply device has a first sensor to sense the position of the carrier board in the transport device and send a first signal to the processor. When the carrier board is hooked onto the carrier platform, the second sensor senses the barcode on the carrier board and sends the second signal to the processor. When the carrier board is hooked to the wafer pick-and-place device, the processor simultaneously sends the second signal to the wafer pick-and-place device. In this way, the operator only needs to dock the conveying device loaded with multiple empty boards to the entrance of the board supply equipment, and the movement of the boards can be automatically completed by the board supply equipment, thus reducing manpower consumption. In addition, since the movement of the carrier is automatically performed by the carrier supply equipment, it is also possible to avoid carrier movement errors caused by operators, and greatly improve the accuracy of wafer pick-and-place of the wafer pick-and-place device to improve work efficiency.

惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及發明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。此外,本說明書或申請專利範圍中提及的「第一」、「第二」等用語僅用以命名元件的名稱或區別不同實施例或範圍,而並非用來限制元件數量上的上限或下限。 But the above is only a preferred embodiment of the present invention, and should not limit the scope of the present invention, that is, all simple equivalent changes and modifications made according to the scope of the patent application for the present invention and the content of the invention are still within the scope of the patent of the present invention. In addition, terms such as "first" and "second" mentioned in this specification or patent application are only used to name components or to distinguish different embodiments or ranges, and are not used to limit the upper limit or lower limit of the number of components.

10:載板供應設備 10: Carrier board supply equipment

11:設備本體 11: Equipment body

111:入口 111: Entrance

112:出口 112: export

113:容置空間 113:Accommodating space

12:載板移取裝置 12: Carrier removal device

121:取物臂 121: Retrieval arm

122:承載平台 122: Bearing platform

123:第一感測器 123: The first sensor

124:第二感測器 124: Second sensor

20:運送裝置 20: Transport device

21:載板 21: carrier board

30:晶片取放裝置 30: Wafer pick-and-place device

Claims (8)

一種載板供應設備,用以自一運送裝置移動一載板至一晶片取放裝置,該載板供應設備包括:一設備本體,包括一入口、一出口與一容置空間,該入口用以容置該運送裝置,該出口鄰接該晶片取放裝置,以及該容置空間位於該入口與該出口之間;以及一載板移取裝置,配置於該容置空間內,用以自該運送裝置通過該入口勾取該載板,並通過該出口勾取該載板至該晶片取放裝置,其中該載板移取裝置包括:一承載平台,固定於該容置空間內;一取物臂,設置於該承載平台上並可在該入口與該出口之間來回移動;一第一感測器,固設於該取物臂朝向該入口的一端,用以感測該載板於該運送裝置上的位置,其中該取物臂帶動該第一感測器於垂直於該承載平台的承載面的方向移動以感測該載板的位置;以及一第二感測器,固設於該承載平台上,用以感測該載板上的一條碼;其中該取物臂、該第一感測器與該第二感測器電性連接於一處理器,當該運送裝置容置於該入口時,該第一感測器感測該載板於該運送裝置的位置並傳送一第一訊號至該處理器,該處理器再根據該第一訊號控制該取物臂勾取該載板至該承載平台以供該第二感測器感測該載板上的該條碼,該第二感測器感測該條碼後傳送一第二訊號至該處理器,以及該處理器控制該取物臂並通過該出口勾取該載板至該晶片取放裝置,並同時傳送該第二訊號至該晶片取放裝置。 A carrier plate supply device is used to move a carrier plate from a conveying device to a wafer pick-and-place device. The carrier plate supply device includes: a device body, including an entrance, an exit, and a storage space, the entrance is used to accommodate the transport device, the exit is adjacent to the wafer pick-and-place device, and the storage space is located between the entrance and the exit; A wafer pick-and-place device, wherein the carrier plate removal device includes: a loading platform, fixed in the accommodating space; a pick-up arm, arranged on the loading platform and capable of moving back and forth between the entrance and the exit; a first sensor, fixed at an end of the pick-up arm facing the entrance, for sensing the position of the carrier board on the conveying device, wherein the pick-up arm drives the first sensor to move in a direction perpendicular to the loading surface of the loading platform to sense the position of the carrier board; and a second sensor. , fixed on the loading platform to sense a code on the loading plate; wherein the pick-up arm, the first sensor and the second sensor are electrically connected to a processor, when the delivery device is accommodated in the entrance, the first sensor senses the position of the loading plate on the delivery device and sends a first signal to the processor, and the processor controls the pick-up arm to hook the loading plate to the loading platform according to the first signal for the second sensor to sense the barcode on the loading board, the second sensing After sensing the barcode, the processor sends a second signal to the processor, and the processor controls the pick-up arm to hook the carrier to the chip pick-and-place device through the outlet, and simultaneously sends the second signal to the chip pick-and-place device. 如請求項1的載板供應設備,其中當該晶片取放裝置對該載板完成晶片取放作業後,該處理器控制該取物臂通過該出口勾取該載板至該承載平台,以及該處理器再根據該第一訊號控制該取物臂通過該入口勾取該載板至該運送裝置上該載板的原始位置。 The carrier plate supply device according to claim 1, wherein after the wafer pick-and-place device completes the wafer pick-and-place operation on the carrier plate, the processor controls the pick-up arm to hook the carrier plate to the loading platform through the outlet, and the processor controls the pick-up arm to pick the carrier plate through the inlet to the original position of the carrier plate on the transport device according to the first signal. 如請求項1的載板供應設備,其中該第一訊號包括該載板於該運送裝置上的位置資料,以及該第二訊號包括該載板上晶片排序資料的儲存路徑。 The carrier board supplying device according to claim 1, wherein the first signal includes the position data of the carrier board on the transport device, and the second signal includes the storage path of the chip sorting data on the carrier board. 一種使用如請求項1的載板供應設備的載板供應方法,包括以下步驟:提供具有至少一載板的一運送裝置並容置於該入口,以及設置該出口鄰近一晶片取放裝置;透過該第一感測器感測該運送裝置內的該載板;傳送該第一訊號至該處理器;通過該入口勾取該載板至該承載平台;透過該第二感測器感測該載板上的該條碼;以及通過該出口勾取該載板至該晶片取放裝置。 A carrier board supply method using the carrier board supply device as claimed in claim 1, comprising the following steps: providing a transport device having at least one carrier board and being accommodated in the inlet, and setting the outlet adjacent to a wafer pick-and-place device; sensing the carrier board in the transport device through the first sensor; sending the first signal to the processor; hooking the carrier board to the loading platform through the inlet; sensing the barcode on the carrier board through the second sensor; 如請求項4的載板供應方法,還包括以下步驟:當該晶片取放裝置對該載板完成晶片放置作業時,通過該出口勾取該載板至該承載平台;以及通過該入口勾取該載板至該運送裝置。 The method for supplying the carrier board according to claim 4, further comprising the following steps: when the wafer pick-and-place device completes the wafer placement operation on the carrier board, hook the carrier board to the loading platform through the outlet; and hook the carrier board to the transport device through the inlet. 如請求項5的載板供應方法,其中該第一訊號包括該載板於該運送裝置的位置資料,以及該第二訊號包括該載板上晶片排序資料的儲存路徑。 The carrier board supply method according to claim 5, wherein the first signal includes position data of the carrier board on the transport device, and the second signal includes storage paths of chip sorting data on the carrier board. 如請求項6的載板供應方法,其中該處理器根據該第一訊號控制該取物臂將該載板勾取至該運送裝置上該載板的原始位置。 The carrier plate supply method according to claim 6, wherein the processor controls the pick-up arm to pick up the carrier plate to the original position of the carrier plate on the transport device according to the first signal. 如請求項4的載板供應方法,其中透過該第一感測器以感測該運送裝置內的該載板的步驟中,如果沒有感測到該載板,則控制該取物臂帶動該第一感測器移動,以及實施透過該第一感測器以感測該運送裝置內的該載板的步驟直到該第一感測器感測到該載板。 The carrier board supply method as in claim 4, wherein in the step of sensing the carrier board in the transport device through the first sensor, if the carrier board is not sensed, then controlling the pick-up arm to drive the first sensor to move, and implementing the step of sensing the carrier board in the transport device through the first sensor until the first sensor senses the carrier board.
TW111114654A 2022-04-18 2022-04-18 Load board providing apparatus and load board providing method thereof TWI807784B (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4277216A (en) * 1978-04-03 1981-07-07 Lindberg Gunnar Vilhelm Transport arrangement for trays and the like
JP2000307290A (en) * 1999-04-22 2000-11-02 Matsushita Electric Ind Co Ltd Tray feeder for supplying electronic parts
US20140262979A1 (en) * 2013-03-14 2014-09-18 Anthony C. Bonora Tray Engine and Methods for Transferring Trays To and From Tools and in Sorters
TWM632181U (en) * 2022-04-18 2022-09-21 福懋科技股份有限公司 Load board providing apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4277216A (en) * 1978-04-03 1981-07-07 Lindberg Gunnar Vilhelm Transport arrangement for trays and the like
JP2000307290A (en) * 1999-04-22 2000-11-02 Matsushita Electric Ind Co Ltd Tray feeder for supplying electronic parts
US20140262979A1 (en) * 2013-03-14 2014-09-18 Anthony C. Bonora Tray Engine and Methods for Transferring Trays To and From Tools and in Sorters
TWM632181U (en) * 2022-04-18 2022-09-21 福懋科技股份有限公司 Load board providing apparatus

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