TW202241713A - Method for manufacturing support sheet, composite sheet for forming resin film, kit, and wafer with resin film wherein the support sheet is used for heating workpieces or wafers obtained by dividing workpieces - Google Patents

Method for manufacturing support sheet, composite sheet for forming resin film, kit, and wafer with resin film wherein the support sheet is used for heating workpieces or wafers obtained by dividing workpieces Download PDF

Info

Publication number
TW202241713A
TW202241713A TW111102125A TW111102125A TW202241713A TW 202241713 A TW202241713 A TW 202241713A TW 111102125 A TW111102125 A TW 111102125A TW 111102125 A TW111102125 A TW 111102125A TW 202241713 A TW202241713 A TW 202241713A
Authority
TW
Taiwan
Prior art keywords
resin film
aforementioned
sheet
composite sheet
support sheet
Prior art date
Application number
TW111102125A
Other languages
Chinese (zh)
Inventor
田中佑耶
山下茂之
Original Assignee
日商琳得科股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商琳得科股份有限公司 filed Critical 日商琳得科股份有限公司
Publication of TW202241713A publication Critical patent/TW202241713A/en

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J133/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
    • C09J133/04Homopolymers or copolymers of esters
    • C09J133/06Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
    • C09J133/062Copolymers with monomers not covered by C09J133/06
    • C09J133/068Copolymers with monomers not covered by C09J133/06 containing glycidyl groups
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/22Plastics; Metallised plastics
    • C09J7/24Plastics; Metallised plastics based on macromolecular compounds obtained by reactions involving only carbon-to-carbon unsaturated bonds
    • C09J7/241Polyolefin, e.g.rubber
    • C09J7/243Ethylene or propylene polymers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • C09J7/38Pressure-sensitive adhesives [PSA]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B37/00Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
    • B32B37/14Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the properties of the layers
    • B32B37/26Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the properties of the layers with at least one layer which influences the bonding during the lamination process, e.g. release layers or pressure equalising layers
    • B32B2037/268Release layers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/70Other properties
    • B32B2307/748Releasability
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/10Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet
    • C09J2301/12Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers
    • C09J2301/122Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers the adhesive layer being present only on one side of the carrier, e.g. single-sided adhesive tape
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2423/00Presence of polyolefin
    • C09J2423/10Presence of homo or copolymers of propene
    • C09J2423/106Presence of homo or copolymers of propene in the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68377Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support with parts of the auxiliary support remaining in the finished device

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Adhesive Tapes (AREA)
  • Manufacture Of Macromolecular Shaped Articles (AREA)
  • Laminated Bodies (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Dicing (AREA)

Abstract

The present invention relates to a support sheet (10) which is used for heating workpieces or wafers obtained by dividing workpieces. Moreover, when the support sheet (10) with a sample size of 20 mm in length and 5 mm in width is subjected to the thermomechanical analysis (TMA) in either the traveling direction (MD) or the vertical direction (CD) tensile mode, the displacement (A 130) at 130 DEG C is 500 [mu]m or less, and the average displacement per 1 DEG C when the temperature rises from 23 DEG C to 130 DEG C (A 23 → 130) is less than the absolute value of the average displacement per 1 DEG C when slowly cooling from 130 DEG C to 50 DEG C (|B 130 → 50|).

Description

支撐片、樹脂膜形成用複合片、套件、以及具樹脂膜之晶片的製造方法Method for manufacturing support sheet, composite sheet for forming resin film, kit, and wafer with resin film

本發明係關於一種支撐片、具備前述支撐片及樹脂膜形成層之樹脂膜形成用複合片及套件、以及具樹脂膜之晶片的製造方法。 本申請案係基於2021年3月31日於日本提出申請之日本特願2021-062255號而主張優先權,將該申請案之內容援用於此。 The present invention relates to a method for manufacturing a support sheet, a composite sheet for forming a resin film and a kit including the support sheet and a resin film forming layer, and a wafer with a resin film. This application claims priority based on Japanese Patent Application No. 2021-062255 filed in Japan on March 31, 2021, and the contents of the application are incorporated herein.

於半導體晶圓、絕緣體晶圓、半導體裝置面板等工件中,有下述工件:於該工件的一面(電路面)形成有電路,進而於該面(電路面)上具有凸塊等突狀電極。有時將前述工件貼附於支撐片(例如切割片)而獲得積層體。以將前述支撐片的周緣部貼附於環形框架等固定用夾具之狀態將前述積層體加熱,繼而冷卻。將貼附於前述支撐片之工件加以分割而獲得晶片。然後,自前述支撐片拾取前述晶片(參照專利文獻1)。Among workpieces such as semiconductor wafers, insulator wafers, and semiconductor device panels, there are workpieces in which a circuit is formed on one side (circuit surface) of the workpiece, and protruding electrodes such as bumps are further formed on the surface (circuit surface) . A laminate may be obtained by attaching the aforementioned workpiece to a support sheet (for example, a dicing sheet). The laminated body is heated and then cooled in a state where the peripheral portion of the support sheet is attached to a fixing jig such as a ring frame. Wafers are obtained by dividing the workpiece attached to the support sheet. Then, the wafer is picked up from the support sheet (see Patent Document 1).

於使用被稱為所謂面朝下(face down)方式之封裝法的半導體裝置之製造製程中,為了保護切割前述工件而形成之晶片的內面,使用保護膜形成膜,且使用將保護膜形成膜與支撐片組合而成之保護膜形成用複合片。而且,為了將晶片的內面接合於引線框架或有機基板等,使用膜狀接著劑,於切割前述工件時,亦使用將膜狀接著劑與支撐片組合而成之切割黏晶片。保護膜形成膜及膜狀接著劑係貼附於前述工件的內面而使用。In the manufacturing process of semiconductor devices using the so-called face-down packaging method, in order to protect the inner surface of the wafer formed by dicing the aforementioned workpiece, a protective film is used to form a film, and the protective film is used to form a A composite sheet for forming a protective film, which is a combination of a film and a support sheet. Furthermore, in order to bond the inner surface of the chip to a lead frame or an organic substrate, etc., a film-like adhesive is used. When dicing the above-mentioned workpiece, a dicing bond chip that combines a film-like adhesive and a support sheet is also used. The protective film forming film and the film-like adhesive are used by sticking to the inner surface of the aforementioned workpiece.

以下,於本說明書中,將保護膜形成膜或膜狀接著劑稱為樹脂膜形成層,將保護膜形成用複合片或切割黏晶片稱為樹脂膜形成用複合片。將由保護膜形成膜所形成之保護膜、或由膜狀接著劑所形成之接合膜稱為樹脂膜。Hereinafter, in this specification, a protective film-forming film or a film-like adhesive is called a resin film-forming layer, and a composite sheet for protective film formation or a dicing bond wafer is called a composite sheet for resin film formation. A protective film formed of a protective film forming film or a bonding film formed of a film-like adhesive is called a resin film.

於具樹脂膜之晶片之製造加工中,於工件的內面貼附用以形成保護膜或接合膜之樹脂膜形成層。樹脂膜形成層亦有時以前述樹脂膜形成層積層於支撐片上的樹脂膜形成用複合片之狀態貼附於工件的內面。樹脂膜形成層亦有時不積層於支撐片上而貼附於工件的內面,然後貼附於支撐片。In the manufacturing process of a wafer with a resin film, a resin film forming layer for forming a protective film or a bonding film is attached to the inner surface of a workpiece. The resin film-forming layer may be attached to the inner surface of the workpiece in a state where the aforementioned resin film-forming composite sheet for resin film formation is laminated on the support sheet. The resin film forming layer may be attached to the inner surface of the workpiece without being laminated on the support sheet, and then attached to the support sheet.

對於貼附於工件的內面之樹脂膜形成層,根據需要於支撐片上加以熱硬化而製成樹脂膜。於支撐片上使貼附於前述工件的內面之樹脂膜形成層進行熱硬化之情形時,有時將支撐片、樹脂膜形成層及工件依序於這些之厚度方向積層而構成之第一積層複合片以將該片的周緣部貼附於環形框架之狀態加熱,繼而冷卻。然後,藉由支撐片上之切割步驟將工件加以分割,切斷樹脂膜,以具樹脂膜之晶片之形式拾取(參照專利文獻2)。The resin film forming layer attached to the inner surface of the workpiece is thermally cured on the support sheet as necessary to form a resin film. When the resin film-forming layer attached to the inner surface of the workpiece is thermally cured on the support sheet, the first laminate may be formed by laminating the support sheet, the resin film-forming layer, and the workpiece sequentially in the thickness direction. The composite sheet is heated in a state where the periphery of the sheet is attached to the ring frame, and then cooled. Then, the workpiece is divided by the cutting step on the support sheet, the resin film is cut off, and it is picked up in the form of a wafer with the resin film (refer to Patent Document 2).

或者,關於貼附於工件的內面之樹脂膜形成層,藉由支撐片上之切割步驟將工件加以分割,切斷樹脂膜,製成具樹脂膜形成層之晶片後,於支撐片上使樹脂膜形成層進行熱硬化,製成具樹脂膜之晶片。於支撐片上使貼附於前述晶片的內面之樹脂膜形成層進行熱硬化之情形時,將支撐片、樹脂膜形成層及晶片依序於這些之厚度方向積層而構成之第四積層複合片以將該片的周緣部貼附於環形框架之狀態加熱,繼而冷卻。然後,拾取具樹脂膜之晶片。 [先前技術文獻] [專利文獻] Or, regarding the resin film forming layer attached to the inner surface of the workpiece, the workpiece is divided by the cutting step on the support sheet, the resin film is cut off, and after the wafer with the resin film forming layer is made, the resin film is formed on the support sheet. The formation layer is thermally cured to produce a wafer with a resin film. When the resin film-forming layer attached to the inner surface of the wafer is thermally cured on the support sheet, the fourth laminated composite sheet is formed by laminating the support sheet, the resin film-forming layer, and the wafer sequentially in the thickness direction of these The sheet was heated in a state where the periphery of the sheet was attached to the ring frame, and then cooled. Then, pick up the wafer with the resin film. [Prior Art Literature] [Patent Document]

[專利文獻1]國際公開第2015/190230號。 [專利文獻2]國際公開第2015/178346號。 [Patent Document 1] International Publication No. 2015/190230. [Patent Document 2] International Publication No. 2015/178346.

[發明所欲解決之課題][Problem to be Solved by the Invention]

例如,專利文獻1、專利文獻2所說明之半導體晶圓之直徑為8吋,厚度為100μm,質量為約7.4g。說明了將前述半導體晶圓切割為9mm×9mm之晶片尺寸而製成晶片。For example, the semiconductor wafers described in Patent Document 1 and Patent Document 2 have a diameter of 8 inches, a thickness of 100 μm, and a mass of about 7.4 g. It is described that the aforementioned semiconductor wafer is diced into wafers having a wafer size of 9 mm×9 mm to form wafers.

於具樹脂膜之晶片之製造加工中,採用直徑更大之半導體晶圓,半導體晶圓上的突狀電極之個數及大小增大,故而周緣部由環形框架支撐之支撐片所承受之荷重有變得更大之傾向,且晶片尺寸反而有變得更小之傾向。In the manufacture and processing of wafers with resin films, semiconductor wafers with larger diameters are used, and the number and size of protruding electrodes on the semiconductor wafers increase, so the load on the support piece supported by the ring frame at the peripheral part There is a tendency to become larger, and the chip size tends to become smaller.

於使用先前之樹脂膜形成用複合片或支撐片之情形時,於以將第一積層複合片或第四積層複合片等之製造加工用片的周緣部貼附於環形框架之狀態將前述製造加工用片加熱時,有時半導體晶圓等工件之荷重或多個晶片之荷重導致前述製造加工用片鬆弛,具樹脂膜之晶片之位置偏離。而且,於將前述製造加工用片加熱之後之切割步驟中,有時具樹脂膜之晶片之位置偏離。結果,於晶片尺寸更小之情形時,有時產生拾取時之具樹脂膜之晶片的辨識不良之問題。In the case of using the previous composite sheet or support sheet for forming a resin film, the above-mentioned manufacturing process is carried out in a state where the peripheral edge of the sheet for manufacturing and processing such as the first laminated composite sheet or the fourth laminated composite sheet is attached to the ring frame. When the processing sheet is heated, the load of workpieces such as semiconductor wafers or the load of multiple chips may cause the aforementioned manufacturing processing sheet to loosen, and the position of the wafer with the resin film may be displaced. In addition, in the dicing step after heating the sheet for manufacturing and processing, the position of the wafer with the resin film may be shifted. As a result, when the size of the wafer is smaller, the problem of poor recognition of the wafer with the resin film at the time of picking up may arise.

本發明之目的在於提供一種能夠消除由加熱及冷卻所致之製造加工用片之鬆弛之影響而提高拾取裝置之晶片之辨識性的支撐片、具備前述支撐片及樹脂膜形成層之樹脂膜形成用複合片及套件、以及具樹脂膜之晶片的製造方法。 [用以解決課題之手段] The object of the present invention is to provide a support sheet capable of eliminating the influence of the slack of the manufacturing processing sheet caused by heating and cooling and improving the visibility of the wafer in the pick-up device, and a resin film forming layer comprising the support sheet and a resin film forming layer. A method for manufacturing composite sheets and kits, and wafers with resin films. [Means to solve the problem]

本發明提供以下之支撐片、樹脂膜形成用複合片及套件、以及具樹脂膜之晶片的製造方法。The present invention provides the following support sheet, composite sheet and kit for forming a resin film, and a method for manufacturing a wafer with a resin film.

[1]一種支撐片,用於工件或將工件加以分割而成之晶片之加熱;並且,於將前述支撐片以下述條件藉由行進方向(MD)或垂直方向(CD)的任一個之拉伸模式進行熱機械分析(TMA)時,130℃時之位移量(A 130)為500μm以下;自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)小於自130℃緩冷卻至50℃為止時之每1℃之平均位移量之絕對值(|B 130→50|)。 [1] A support sheet used for heating a workpiece or a wafer obtained by dividing a workpiece; When conducting thermomechanical analysis (TMA) in tensile mode, the displacement (A 130 ) at 130°C is less than 500μm; the average displacement per 1°C (A 23→130 ) when the temperature rises from 23°C to 130°C is less than that of The absolute value of the average displacement per 1°C when slowly cooling from 130°C to 50°C (|B 130→50 |).

[熱機械分析(TMA)之條件] 樣本尺寸:長度20mm、寬度5mm;夾頭間隔:15mm;以荷重0.8g、升溫速度10℃/min自23℃升溫至130℃為止,保持30分鐘。然後,以荷重0.8g、冷卻速度1℃/min自130℃冷卻至50℃。測定該期間之位移量[μm]。 [Conditions of thermomechanical analysis (TMA)] Sample size: length 20mm, width 5mm; chuck interval: 15mm; with a load of 0.8g and a heating rate of 10°C/min, the temperature is raised from 23°C to 130°C and kept for 30 minutes. Then, it cooled from 130°C to 50°C with a load of 0.8 g and a cooling rate of 1°C/min. The amount of displacement [μm] during this period was measured.

[2]如[1]所記載之支撐片,其中於將前述支撐片以前述條件藉由行進方向(MD)之拉伸模式、及垂直方向(CD)之拉伸模式進行熱機械分析(TMA)時,130℃時之位移量(A 130)均為500μm以下;自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)均小於自130℃緩冷卻至50℃為止時之每1℃之平均位移量之絕對值(|B 130→50|)。 [2] The support sheet as described in [1], wherein the above-mentioned support sheet is subjected to thermomechanical analysis (TMA) in the tensile mode in the direction of travel (MD) and in the tensile mode in the vertical direction (CD) under the aforementioned conditions. ), the displacement (A 130 ) at 130°C is less than 500μm; the average displacement (A 23→130 ) per 1°C when the temperature rises from 23°C to 130°C is less than that of slow cooling from 130°C to 50°C The absolute value of the average displacement per 1°C up to °C (|B 130→50 |).

[3]如[1]或[2]所記載之支撐片,其中於將前述支撐片以前述條件藉由行進方向(MD)或垂直方向(CD)的任一個之拉伸模式進行熱機械分析(TMA)時,自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)為正值。 [4]如[3]所記載之支撐片,其中於將前述支撐片以前述條件藉由行進方向(MD)之拉伸模式、及垂直方向(CD)之拉伸模式進行熱機械分析(TMA)時,自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)均為正值。 [3] The support sheet as described in [1] or [2], wherein the thermomechanical analysis is performed on the support sheet under the aforementioned conditions by stretching in any one of the traveling direction (MD) or the vertical direction (CD) (TMA), the average displacement (A 23→130 ) per 1°C when the temperature rises from 23°C to 130°C is a positive value. [4] The support sheet as described in [3], wherein the above-mentioned support sheet is subjected to thermomechanical analysis (TMA) in the tensile mode in the direction of travel (MD) and in the tensile mode in the vertical direction (CD) under the aforementioned conditions. ), the average displacement per 1°C (A 23→130 ) when the temperature rises from 23°C to 130°C is positive.

[5]如[3]或[4]所記載之支撐片,其中於將前述支撐片以前述條件藉由行進方向(MD)或垂直方向(CD)的任一個之拉伸模式進行熱機械分析(TMA)時,自60℃升溫至130℃為止時之每1℃之平均位移量(A 60→130)相對於自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)之比未達1。 [6]如[5]所記載之支撐片,其中於將前述支撐片以前述條件藉由行進方向(MD)之拉伸模式、及垂直方向(CD)之拉伸模式進行熱機械分析(TMA)時,自60℃升溫至130℃為止時之每1℃之平均位移量(A 60→130)相對於自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)之比均未達1。 [5] The supporting sheet as described in [3] or [4], wherein thermomechanical analysis is performed on the supporting sheet under the aforementioned conditions by stretching in any one of the traveling direction (MD) or the vertical direction (CD) (TMA), the average displacement per 1°C (A 60→130 ) from 60°C to 130°C is relative to the average displacement per 1°C when the temperature is raised from 23°C to 130°C (A 23 →130 ) ratio does not reach 1. [6] The support sheet as described in [5], wherein the above-mentioned support sheet is subjected to thermomechanical analysis (TMA) in the tensile mode in the direction of travel (MD) and in the tensile mode in the vertical direction (CD) under the aforementioned conditions. ), the average displacement per 1°C (A 60→130 ) from 60°C to 130°C is relative to the average displacement per 1°C from 23°C to 130°C (A 23→130 ) ratio did not reach 1.

[7]如[1]至[6]中任一項所記載之支撐片,其中前述支撐片係由基材所構成,或者具備基材及設置於前述基材的一面上之黏著劑層,並且,前述基材之構成材料含有聚烯烴樹脂。 [8]如[1]至[7]中任一項所記載之支撐片,其中前述支撐片係僅由基材構成,或者具備基材及設置於前述基材的一面上之黏著劑層,並且,前述基材為延伸膜。 [9]如[1]至[8]中任一項所記載之支撐片,其中前述支撐片為輥狀。 [7] The support sheet according to any one of [1] to [6], wherein the support sheet is composed of a base material, or has a base material and an adhesive layer provided on one side of the base material, Moreover, the constituent material of the said base material contains polyolefin resin. [8] The support sheet according to any one of [1] to [7], wherein the support sheet is composed of only the base material, or has a base material and an adhesive layer provided on one side of the base material, In addition, the aforementioned base material is a stretched film. [9] The support sheet according to any one of [1] to [8], wherein the support sheet is in a roll shape.

[10]一種樹脂膜形成用複合片,係具備如[1]至[8]中任一項所記載之支撐片、及設置於前述支撐片的一面上之樹脂膜形成層。 [11]如[10]所記載之樹脂膜形成用複合片,其中前述樹脂膜形成層為保護膜形成膜。 [12]如[10]或[11]所記載之樹脂膜形成用複合片,其中前述樹脂膜形成用複合片為輥狀。 [10] A composite sheet for forming a resin film, comprising the support sheet according to any one of [1] to [8], and a resin film forming layer provided on one side of the support sheet. [11] The composite sheet for forming a resin film according to [10], wherein the resin film forming layer is a protective film forming film. [12] The composite sheet for forming a resin film according to [10] or [11], wherein the composite sheet for forming a resin film is in a roll shape.

[13]一種套件,係具備:第一積層體,由第一剝離膜、樹脂膜形成層及第二剝離膜所依序積層而成;以及如[1]至[9]中任一項所記載之支撐片,用於支撐成為前述樹脂膜形成層之貼附對象的工件及前述樹脂膜形成層。 [14]如[13]所記載之套件,其中前述樹脂膜形成層為保護膜形成膜。 [15]如[13]或[14]所記載之套件,其中前述第一積層體為輥狀。 [13] A kit comprising: a first laminate formed by sequentially laminating a first release film, a resin film forming layer, and a second release film; and as described in any one of [1] to [9] The support sheet described is used for supporting a work to be attached to the resin film forming layer and the resin film forming layer. [14] The kit according to [13], wherein the resin film forming layer is a protective film forming film. [15] The kit according to [13] or [14], wherein the first laminate is in the shape of a roll.

[16]一種具樹脂膜之晶片的製造方法,前述具樹脂膜之晶片係具備晶片、及設置於前述晶片的內面之樹脂膜;並且,前述具樹脂膜之晶片的製造方法係具有下述步驟:於工件的內面貼附如[10]至[12]中任一項所記載之樹脂膜形成用複合片中的樹脂膜形成層、或者於工件的內面貼附如[13]至[15]中任一項所記載之套件中的樹脂膜形成層,以製作使得前述樹脂膜形成層及工件於這些之厚度方向積層而構成之第一積層膜,進而於前述第一積層膜中的前述樹脂膜形成層貼附前述套件中的支撐片,藉此製作於前述支撐片上使得前述樹脂膜形成層及前述工件依序於這些之厚度方向積層而構成之第一積層複合片之步驟;以將前述第一積層複合片的周緣部貼附於固定用夾具之狀態,將前述第一積層複合片加熱,使前述樹脂膜形成層硬化形成前述樹脂膜,藉此製作於前述支撐片上使得前述樹脂膜及前述工件依序於這些之厚度方向積層而構成之第二積層複合片之步驟;將前述第二積層複合片冷卻,然後於前述支撐片上將前述第二積層複合片中的前述工件加以分割,切斷前述樹脂膜,藉此製作於前述支撐片上固定有多個具樹脂膜之晶片的第三積層複合片之步驟;以及,將前述第三積層複合片中的前述具樹脂膜之晶片自前述支撐片扯離,藉此拾取前述具樹脂膜之晶片之步驟。[16] A method of manufacturing a wafer with a resin film, wherein the wafer with a resin film comprises a wafer and a resin film provided on an inner surface of the wafer; and, the method of manufacturing a wafer with a resin film has the following steps: Step: attaching the resin film forming layer in the resin film forming composite sheet as described in any one of [10] to [12] on the inner surface of the workpiece, or attaching the resin film forming layer as described in [13] to the inner surface of the workpiece. The resin film-forming layer in the kit described in any one of [15] is to produce a first laminated film formed by laminating the aforementioned resin film-forming layer and the workpiece in the thickness direction of these, and further in the aforementioned first laminated film The step of attaching the above-mentioned resin film-forming layer to the support sheet in the above-mentioned kit, thereby making the first laminated composite sheet formed on the above-mentioned support sheet so that the above-mentioned resin film-forming layer and the above-mentioned workpiece are sequentially laminated in the thickness direction of these; In the state where the peripheral portion of the first laminated composite sheet is attached to a jig for fixing, the first laminated composite sheet is heated to harden the resin film forming layer to form the resin film, thereby forming the above-mentioned supporting sheet so that the The second laminated composite sheet formed by laminating the resin film and the aforementioned workpieces sequentially in the thickness direction; cooling the aforementioned second laminated composite sheet, and then placing the aforementioned workpieces in the aforementioned second laminated composite sheet on the aforementioned support sheet Dividing, the step of cutting the aforementioned resin film, thereby manufacturing a third laminated composite sheet in which a plurality of wafers with resin films are fixed on the aforementioned supporting sheet; The step of picking up the aforementioned wafer with the resin film by tearing it off from the aforementioned supporting sheet.

[17]一種具樹脂膜之晶片的製造方法,前述具樹脂膜之晶片係具備晶片、及設置於前述晶片的內面之樹脂膜;並且,前述具樹脂膜之晶片的製造方法係具備下述步驟:於工件的內面貼附如[10]至[12]中任一項所記載之樹脂膜形成用複合片中的樹脂膜形成層、或者於工件的內面貼附如[13]至[15]中任一項所記載之套件中的樹脂膜形成層,以製作使得前述樹脂膜形成層及工件於這些之厚度方向積層而構成之第一積層膜,進而於前述第一積層膜中的前述樹脂膜形成層貼附前述套件中的支撐片,藉此製作於前述支撐片上使得前述樹脂膜形成層及前述工件依序於這些之厚度方向積層而構成之第一積層複合片之步驟;於前述支撐片上,將前述第一積層複合片中的前述工件加以分割,將前述樹脂膜形成層加以切斷,藉此製作於前述支撐片上固定有多個具樹脂膜形成層之晶片的第四積層複合片之步驟;以將前述第四積層複合片的周緣部貼附於固定用夾具之狀態,將前述第四積層複合片加熱並冷卻,使前述第四積層複合片中的前述樹脂膜形成層硬化而形成前述樹脂膜,藉此製作於前述支撐片上固定有多個具樹脂膜之晶片的第三積層複合片之步驟;以及,將第三積層複合片中的前述具樹脂膜之晶片自前述支撐片扯離,藉此拾取前述具樹脂膜之晶片之步驟。 [發明功效] [17] A method of manufacturing a wafer with a resin film, wherein the wafer with a resin film comprises a wafer and a resin film provided on an inner surface of the wafer; and, the method of manufacturing a wafer with a resin film comprises the following steps: Step: attaching the resin film forming layer in the resin film forming composite sheet as described in any one of [10] to [12] on the inner surface of the workpiece, or attaching the resin film forming layer as described in [13] to the inner surface of the workpiece. The resin film-forming layer in the kit described in any one of [15] is to produce a first laminated film formed by laminating the aforementioned resin film-forming layer and the workpiece in the thickness direction of these, and further in the aforementioned first laminated film The step of attaching the above-mentioned resin film-forming layer to the support sheet in the above-mentioned kit, thereby making the first laminated composite sheet formed on the above-mentioned support sheet so that the above-mentioned resin film-forming layer and the above-mentioned workpiece are sequentially laminated in the thickness direction of these; On the aforementioned support sheet, the aforementioned workpiece in the aforementioned first laminated composite sheet is divided, and the aforementioned resin film forming layer is cut, thereby manufacturing a fourth wafer having a plurality of wafers having resin film forming layers fixed on the aforementioned supporting sheet. The step of the laminated composite sheet: heating and cooling the fourth laminated composite sheet in a state where the periphery of the fourth laminated composite sheet is attached to the jig for fixing, so that the resin film in the fourth laminated composite sheet is formed Layer hardening to form the aforementioned resin film, thereby making a third laminated composite sheet in which a plurality of wafers with resin films are fixed on the aforementioned supporting sheet; The aforementioned supporting sheet is torn off, whereby the step of picking up the aforementioned wafer with the resin film. [Efficacy of the invention]

根據本發明,提供一種能夠消除由加熱及冷卻所致之製造加工用片之鬆弛之影響而消除拾取裝置之晶片之辨識不良的支撐片、具備前述支撐片及樹脂膜形成層之樹脂膜形成用複合片及套件、以及具樹脂膜之晶片的製造方法。According to the present invention, there are provided a support sheet capable of eliminating the influence of the slack of the manufacturing processing sheet caused by heating and cooling and eliminating the recognition failure of the wafer in the pick-up device, and a resin film forming resin film comprising the above support sheet and a resin film forming layer. A method for manufacturing a composite sheet, a package, and a chip with a resin film.

[支撐片] 本發明之實施形態之支撐片係用於工件或將工件加以分割而成之晶片之加熱;並且,於將前述支撐片以下述條件藉由行進方向(MD)或垂直方向(CD)的任一個之拉伸模式進行熱機械分析(TMA)時,130℃時之位移量(A 130)為500μm以下;自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)小於自130℃緩冷卻至50℃為止時之每1℃之平均位移量之絕對值(|B 130→50|)。 [Support sheet] The support sheet of the embodiment of the present invention is used for heating the workpiece or the wafers obtained by dividing the workpiece; ) in any one of the tensile modes for thermomechanical analysis (TMA), the displacement (A 130 ) at 130°C is less than 500μm; the average displacement per 1°C when the temperature rises from 23°C to 130°C (A 23→130 ) is smaller than the absolute value of the average displacement per 1°C (|B 130→50 |) when slowly cooling from 130°C to 50°C.

[熱機械分析(TMA)之條件] 樣本尺寸:長度20mm、寬度5mm;夾頭間隔:15mm;以荷重0.8g、升溫速度10℃/min自23℃升溫至130℃為止,保持30分鐘。然後,以荷重0.8g、冷卻速度1℃/min自130℃冷卻至50℃為止。測定該期間之位移量[μm]。 [Conditions of thermomechanical analysis (TMA)] Sample size: length 20mm, width 5mm; chuck interval: 15mm; with a load of 0.8g and a heating rate of 10°C/min, the temperature is raised from 23°C to 130°C and kept for 30 minutes. Thereafter, it was cooled from 130°C to 50°C with a load of 0.8 g and a cooling rate of 1°C/min. The amount of displacement [μm] during this period was measured.

於進行前述熱機械分析(TMA)時之位移量為正值時意指支撐片伸長,於位移量為負值時意指支撐片收縮。When the displacement in the aforementioned thermomechanical analysis (TMA) is a positive value, it means that the supporting sheet is elongated, and when the displacement is negative, it means that the supporting sheet is shrinking.

本實施形態之支撐片係130℃時之位移量(A 130)為500μm以下。此處,130℃時之位移量(A 130)係自23℃升溫至130℃為止並於達到130℃之時間點測定。 藉由130℃時之位移量(A 130)為500μm以下,而能夠減少加熱時之支撐片之鬆弛。130℃時之位移量(A 130)較佳為450μm以下,更佳為400μm以下,進而佳為360μm以下。130℃時之位移量(A 130)較佳為大於-50μm,更佳為大於0μm,進而佳為大於21μm,進而更佳為大於43μm,尤佳為大於64μm。 The displacement amount (A 130 ) of the supporting sheet of this embodiment at 130°C is 500 μm or less. Here, the displacement amount (A 130 ) at 130°C was measured at the time point when the temperature reached 130°C after the temperature was raised from 23°C to 130°C. When the displacement (A 130 ) at 130°C is 500 μm or less, the slack of the support sheet during heating can be reduced. The displacement amount (A 130 ) at 130°C is preferably at most 450 μm, more preferably at most 400 μm, and still more preferably at most 360 μm. The displacement at 130°C (A 130 ) is preferably greater than -50 μm, more preferably greater than 0 μm, further preferably greater than 21 μm, still more preferably greater than 43 μm, and most preferably greater than 64 μm.

例如,於前述位移量(A 130)為負值且具有大幅度地收縮之性質的支撐片之情形時,於高溫時有夾具用黏著劑層等的與固定用夾具之黏著力變弱,因工件之重量而支撐片自固定用夾具剝離脫落之虞。然而,若成為低溫,則夾具用黏著劑層等的與固定用夾具之黏著力恢復,故而自130℃緩冷卻至50℃為止時之每1℃之平均位移量之絕對值(|B 130→50|)亦可大。因此,較佳為自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)小於自130℃緩冷卻至50℃為止時之每1℃之平均位移量之絕對值(|B 130→50|)。 For example, in the case of the support sheet having a negative value of displacement (A 130 ) and a large shrinkage property, the adhesive force with the fixing jig such as the adhesive layer for the jig becomes weak at high temperature, so The weight of the workpiece and the risk of the support piece peeling off from the fixing jig. However, when the temperature is lowered, the adhesive force of the jig adhesive layer and the like to the fixing jig recovers, so the absolute value of the average displacement per 1°C when slowly cooling from 130°C to 50°C (|B 130→ 50 |) can also be large. Therefore, it is preferable that the average displacement per 1°C (A 23 → 130 ) from 23°C to 130°C is smaller than the absolute value of the average displacement per 1°C when slowly cooling from 130°C to 50°C (|B 130→50 |).

此處,自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)可藉由下式求出。 A 23→130=(A 130-A 23)/107=A 130/107[μm/℃]。 Here, the average displacement per 1°C (A 23→130 ) when the temperature is raised from 23°C to 130°C can be obtained by the following formula. A 23 → 130 = (A 130 - A 23 )/107 = A 130 /107 [μm/°C].

23℃時之位移量(A 23)=0μm;130℃時之位移量(A 130)[μm]。 Displacement (A 23 ) at 23°C = 0 μm; displacement at 130°C (A 130 ) [μm].

此處,自130℃緩冷卻至50℃為止時之每1℃之平均位移量(B 130→50)可由下式求出。 B 130→50=(B 50-B 130)/80[μm/℃]。 再者,未設想緩冷卻時支撐片伸長,故而通常B 130→50為負值。 Here, the average displacement per 1°C (B 130→50 ) when slowly cooling from 130°C to 50°C can be obtained from the following formula. B 130→50 = (B 50 -B 130 )/80 [μm/°C]. Furthermore, it is not assumed that the support sheet is elongated during slow cooling, so usually B 130→50 is a negative value.

此處,自130℃緩冷卻至50℃為止時之每1℃之平均位移量之絕對值(|B 130→50|)可藉由下式求出。 |B 130→50|=|B 50-B 130|/80[μm/℃]。 Here, the absolute value of the average displacement per 1°C (|B 130→50 |) when slowly cooling from 130°C to 50°C can be obtained by the following formula. |B 130 → 50 |=|B 50 -B 130 |/80 [μm/°C].

於130℃保持30分鐘後之位移量(B 130)[μm];緩冷卻後之50℃時之位移量(B 50)[μm]。 Displacement (B 130 ) [μm] after holding at 130°C for 30 minutes; displacement (B 50 ) [μm] at 50°C after slow cooling.

藉由前述平均位移量(A 23→130)小於前述平均位移量之絕對值(|B 130→50|),而能夠減少由加熱及冷卻所致之晶片於支撐片上之位置變化,能夠消除拾取裝置對於晶片之辨識不良。 Since the above-mentioned average displacement (A 23→130 ) is smaller than the absolute value of the above-mentioned average displacement (|B 130→50 |), the position change of the wafer on the support sheet caused by heating and cooling can be reduced, and pick-up can be eliminated. The device does not recognize the chip properly.

於將前述支撐片以下述條件藉由行進方向(MD)或垂直方向(CD)的任一個之拉伸模式進行熱機械分析(TMA)時,由前述平均位移量(A 23→130)減去前述平均位移量之絕對值(|B 130→50|)所得之值[(A 23→130)-|B 130→50|]為負值,較佳為-0.10μm/℃至-5μm/℃,更佳為-0.40μm/℃至-4μm/℃,進而佳為-0.75μm/℃至-3μm/℃。 When performing thermomechanical analysis (TMA) on the aforementioned supporting sheet under the following conditions by tensile mode in either the traveling direction (MD) or the vertical direction (CD), subtract from the aforementioned average displacement (A 23→130 ) The value [(A 23→130 )-|B 130 →50 |) obtained from the absolute value of the aforementioned average displacement (|B 130→50 |) is a negative value, preferably -0.10μm/℃ to -5μm/℃ , more preferably -0.40 μm/°C to -4 μm/°C, further preferably -0.75 μm/°C to -3 μm/°C.

相較於升溫達到130℃後保持在並無溫度變化之狀態時,對支撐片之基材長時間施加相同荷重(工件之荷重)所致的支撐片緩緩伸長之現象,因升溫及緩冷卻而溫度變化時的由前述平均位移量(A 23→130)減去前述平均位移量之絕對值(|B 130→50|)所得之值[(A 23→130)-|B 130→50|]更重要。原因在於,於實際將第一積層複合片或第四積層複合片保持於130℃時,第一積層複合片或第四積層複合片中的樹脂膜形成層、黏著劑層及夾具用黏著劑層於高溫具有黏性,故而支撐片緩緩伸長之現象於第一積層複合片或第四積層複合片總體中應力緩和,不易影響鬆弛。 Compared with when the temperature rises to 130°C and remains in a state where there is no temperature change, the slow elongation of the support sheet caused by applying the same load (the load of the workpiece) to the base material of the support sheet for a long time is due to the temperature rise and slow cooling And the value obtained by subtracting the absolute value of the above-mentioned average displacement (|B 130→50 |) from the above-mentioned average displacement (A 23→130 ) when the temperature changes [(A 23→130 )-|B 130→50 | ]more important. The reason is that when the first laminated composite sheet or the fourth laminated composite sheet is actually kept at 130°C, the resin film forming layer, the adhesive layer, and the adhesive layer for jigs in the first laminated composite sheet or the fourth laminated composite sheet It is viscous at high temperature, so the phenomenon of slow elongation of the support sheet eases the stress in the first laminated composite sheet or the fourth laminated composite sheet as a whole, and is not easy to affect relaxation.

此處,可求出由「行進方向(MD)之[(A 23→130)-|B 130→50|]之值」減去「垂直方向(CD)之[(A 23→130)-|B 130→50|]之值」所得的值之絕對值作為「MD與CD之平衡評價值」。 MD與CD之平衡評價值較佳為3.0以下,更佳為2.5以下,進而佳為2.0以下,尤佳為1.8以下。於MD與CD之平衡評價值大於前述上限值之情形時,於支撐片之收縮行為因環形框架等固定用夾具而受限制之狀況下,於加熱、冷卻之後,於支撐片產生欲僅於MD或CD的任一單方向過度收縮之力,於固定用夾具附近之支撐片容易形成皺褶(支撐片起伏之形狀)。於欲形成前述皺褶時,由於在支撐片或樹脂膜形成用複合片自固定用夾具剝離之方向(亦即,相對於環形框架等固定用夾具之平面而垂直的方向)產生力,故而支撐片或樹脂膜形成用複合片自固定用夾具剝離並以此為起點脫落之虞變高。然而可認為藉由MD與CD之平衡評價值為前述上限值以下,而能夠進一步降低該可能性。 Here, subtract the [(A 23 →130 ) -| The absolute value of the value obtained by B 130 → 50 |]" is used as the "balance evaluation value of MD and CD". The balance evaluation value of MD and CD is preferably at most 3.0, more preferably at most 2.5, still more preferably at most 2.0, and most preferably at most 1.8. When the balance evaluation value of MD and CD is greater than the above-mentioned upper limit, under the condition that the shrinkage behavior of the support sheet is restricted by the fixing fixture such as the ring frame, after heating and cooling, the support sheet will only appear in the Excessive contraction force in any one direction of MD or CD will easily form wrinkles (the undulating shape of the support sheet) on the support sheet near the fixing jig. When the aforementioned wrinkles are to be formed, since a force is generated in the direction in which the supporting sheet or the resin film forming composite sheet is peeled from the fixing jig (that is, the direction perpendicular to the plane of the fixing jig such as a ring frame), it is supported. The sheet or the composite sheet for resin film formation peels from the jig for fixation, and there exists a high possibility that it will fall off from this as a starting point. However, it is considered that this possibility can be further reduced by making the balance evaluation value of MD and CD below the said upper limit.

於將前述支撐片以前述條件藉由行進方向(MD)或垂直方向(CD)的任一個之拉伸模式進行熱機械分析(TMA)時,只要充分滿足上述要件即可。When thermomechanical analysis (TMA) is performed on the aforementioned supporting sheet under the aforementioned conditions by stretching mode in either the traveling direction (MD) or the vertical direction (CD), it is only necessary to fully satisfy the aforementioned requirements.

於將前述支撐片以前述條件藉由行進方向(MD)之拉伸模式、及垂直方向(CD)之拉伸模式進行熱機械分析(TMA)時,較佳為均充分滿足上述要件。When the support sheet is subjected to thermomechanical analysis (TMA) under the aforementioned conditions in the tensile mode in the traveling direction (MD) and in the tensile mode in the vertical direction (CD), it is preferable that all of the above requirements are fully satisfied.

亦即,較佳為於將前述支撐片以前述條件藉由行進方向(MD)之拉伸模式進行熱機械分析(TMA)時,130℃時之位移量(A 130)為500μm以下,並且,於藉由垂直方向(CD)之拉伸模式進行熱機械分析(TMA)時,130℃時之位移量(A 130)為500μm以下。 較佳為於將前述支撐片以前述條件藉由行進方向(MD)之拉伸模式進行熱機械分析(TMA)時,前述平均位移量(A 23→130)小於前述平均位移量之絕對值(|B 130→50|),並且,於藉由垂直方向(CD)之拉伸模式進行熱機械分析(TMA)時,前述平均位移量(A 23→130)小於前述平均位移量之絕對值(|B 130→50|)。 That is, it is preferable that the displacement (A 130 ) at 130°C is 500 μm or less when the support sheet is subjected to thermomechanical analysis (TMA) in the tensile mode in the traveling direction (MD) under the aforementioned conditions, and, When performing thermomechanical analysis (TMA) in the tensile mode in the vertical direction (CD), the displacement (A 130 ) at 130°C is 500 μm or less. Preferably, when the above-mentioned supporting sheet is subjected to thermomechanical analysis (TMA) by the tensile mode of the traveling direction (MD) under the above-mentioned conditions, the above-mentioned average displacement (A 23 → 130 ) is smaller than the absolute value of the above-mentioned average displacement ( |B 130→50 |), and, when thermomechanical analysis (TMA) is carried out by tensile mode in the vertical direction (CD), the above-mentioned average displacement (A 23→130 ) is smaller than the absolute value of the above-mentioned average displacement ( |B 130→50 |).

通常,所謂支撐片之行進方向(MD),係指成形出支撐片時之樹脂之行進方向。所謂支撐片之垂直方向(CD),係指與支撐片之行進方向(MD)正交之方向。於支撐片為輥狀之情形時,無論支撐片有無延伸,均設支撐片之長條方向為行進方向(MD),支撐片之寬度方向為垂直方向(CD)。 即便於支撐片為單片狀之情形時,樹脂之行進方向例如亦能夠藉由X射線二維繞射圖像之分析等光學分析而互相區分。 Usually, the traveling direction (MD) of the support sheet refers to the traveling direction of the resin when the support sheet is formed. The so-called vertical direction (CD) of the supporting sheet refers to the direction perpendicular to the traveling direction (MD) of the supporting sheet. When the support sheet is in the shape of a roll, regardless of whether the support sheet is extended or not, the long direction of the support sheet is the traveling direction (MD), and the width direction of the support sheet is the vertical direction (CD). Even when the support sheet is in a single sheet shape, the traveling directions of the resins can be distinguished from each other by optical analysis such as analysis of X-ray two-dimensional diffraction images, for example.

於支撐片具備基材及黏著劑層之情形時,對支撐片進行熱機械分析(TMA)時之位移量受到基材之特性所致之影響大,故而設支撐片之行進方向(MD)為基材之行進方向(MD),支撐片之垂直方向(CD)為基材之垂直方向(CD)。When the supporting sheet has a substrate and an adhesive layer, the displacement of the supporting sheet during thermomechanical analysis (TMA) is greatly affected by the characteristics of the substrate, so the traveling direction (MD) of the supporting sheet is set as The traveling direction (MD) of the substrate, the vertical direction (CD) of the support sheet is the vertical direction (CD) of the substrate.

本實施形態之支撐片較佳為:於將前述支撐片以前述條件藉由行進方向(MD)或垂直方向(CD)的任一個之拉伸模式進行熱機械分析(TMA)時,自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)為正值。 相對於固定用夾具之黏著力於高溫時弱。若平均位移量(A 23→130)為負值,則有支撐片收縮,於高溫時因工件或晶片之重量造成支撐片自固定用夾具剝離脫落之虞。藉由平均位移量(A 23→130)為正值,而能夠消除支撐片自固定用夾具剝離脫落之虞。 The support sheet of this embodiment is preferably: when the above-mentioned support sheet is subjected to thermomechanical analysis (TMA) in the tensile mode of either the traveling direction (MD) or the vertical direction (CD) under the aforementioned conditions, from 23°C The average displacement per 1°C (A 23 → 130 ) when the temperature rises to 130°C is a positive value. The adhesion to the fixing fixture is weak at high temperature. If the average displacement (A 23→130 ) is a negative value, the support sheet may shrink, and the support sheet may peel off from the fixing jig due to the weight of the workpiece or wafer at high temperature. Since the average displacement amount (A 23→130 ) is a positive value, it is possible to eliminate the possibility that the support sheet will peel off from the fixing jig.

此處,自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)可由前述式(A 23→130=A 13/107[μm/℃])求出。 Here, the average displacement per 1°C (A 23→130 ) when the temperature is raised from 23°C to 130°C can be obtained from the above formula (A 23→130 =A 13 /107 [μm/°C]).

前述平均位移量(A 23→130)更佳為0.20μm/℃以上,進而佳為0.40μm/℃以上,尤佳為0.60μm/℃以上。 The aforementioned average displacement (A 23→130 ) is more preferably at least 0.20 μm/°C, still more preferably at least 0.40 μm/°C, and most preferably at least 0.60 μm/°C.

於將前述支撐片以前述條件藉由行進方向(MD)或垂直方向(CD)的任一個之拉伸模式進行熱機械分析(TMA)時,只要前述平均位移量(A 23→130)為正值即可。 When thermal mechanical analysis (TMA) is carried out on the aforementioned supporting sheet under the aforementioned conditions by stretching in either the traveling direction (MD) or the vertical direction (CD), as long as the aforementioned average displacement (A 23→130 ) is positive value.

較佳為於將前述支撐片以前述條件藉由行進方向(MD)之拉伸模式、及垂直方向(CD)之拉伸模式進行熱機械分析(TMA)時,前述平均位移量(A 23→130)均為正值。 Preferably, when the above-mentioned supporting sheet is subjected to thermomechanical analysis (TMA) through the tensile mode of the traveling direction (MD) and the tensile mode of the vertical direction (CD) under the aforementioned conditions, the aforementioned average displacement (A 23→ 130 ) are all positive values.

於將前述支撐片以前述條件藉由行進方向(MD)之拉伸模式、及垂直方向(CD)之拉伸模式進行熱機械分析(TMA)時,前述平均位移量(A 23→130)均更佳為0.20μm/℃以上,進而佳為0.40μm/℃以上,尤佳為0.60μm/℃以上。 When the above-mentioned supporting sheet is subjected to thermomechanical analysis (TMA) under the above-mentioned conditions through the tensile mode in the traveling direction (MD) and the tensile mode in the vertical direction (CD), the above-mentioned average displacement (A 23→130 ) is More preferably, it is at least 0.20 μm/°C, still more preferably at least 0.40 μm/°C, and most preferably at least 0.60 μm/°C.

較佳為於將前述支撐片以前述條件藉由行進方向(MD)或垂直方向(CD)的任一個之拉伸模式進行熱機械分析(TMA)時,自60℃升溫至130℃為止時之每1℃之平均位移量(A 60→130)相對於自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)之比為未達1。 升溫中之60℃以後,支撐片有作為材料而變柔軟之傾向。 藉由前述平均位移量(A 60→130)相對於前述平均位移量(A 23→130)之比為未達1,而於升溫中之60℃以後,支撐片之伸長行為受到抑制,藉此容易抑制最終冷卻後之鬆弛。 Preferably, when the above-mentioned support sheet is subjected to thermomechanical analysis (TMA) under the above-mentioned conditions by stretching mode in either the traveling direction (MD) or the vertical direction (CD), when the temperature is raised from 60°C to 130°C The ratio of the average displacement per 1°C (A 60→130 ) to the average displacement per 1°C (A 23→130 ) from 23°C to 130°C was less than 1. After 60°C during heating, the support sheet tends to become soft as a material. Since the ratio of the above-mentioned average displacement (A 60→130 ) to the above-mentioned average displacement (A 23→130 ) is less than 1, the elongation behavior of the supporting sheet is suppressed after 60°C during heating, thereby Easy to suppress relaxation after final cooling.

自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)可藉由下式求出。 A 23→130=(A 130-A 23)/107=A 130/107[μm/℃]。 The average displacement per 1°C (A 23 → 130 ) when the temperature is raised from 23°C to 130°C can be obtained by the following formula. A 23 → 130 = (A 130 - A 23 )/107 = A 130 /107 [μm/°C].

23℃時之位移量(A 23)=0μm;130℃時之位移量(A 130)[μm]。 Displacement (A 23 ) at 23°C = 0 μm; displacement at 130°C (A 130 ) [μm].

此處,自60℃升溫至130℃為止時之每1℃之平均位移量(A 60→130)可藉由下式求出。 A 60→130=(A 130-A 60)/70[μm/℃] Here, the average displacement per 1°C (A 60→130 ) when the temperature is raised from 60°C to 130°C can be obtained by the following formula. A 60→130 =(A 130 -A 60 )/70[μm/℃]

60℃時之位移量(A 60)[μm];130℃時之位移量(A 130)[μm]。 Displacement (A 60 ) [μm] at 60°C; displacement (A 130 ) [μm] at 130°C.

因此,自60℃升溫至130℃為止時之每1℃之平均位移量(A 60→130)相對於自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)之比[(A 60→130)/(A 23→130)]可由這些式求出。 Therefore, the average displacement per 1°C (A 60→130 ) when the temperature is raised from 60°C to 130°C is relative to the average displacement per 1°C (A 23→130 ) when the temperature is raised from 23°C to 130°C The ratio [(A 60→130 )/(A 23→130 )] can be obtained from these formulas.

前述平均位移量(A 60→130)相對於前述平均位移量(A 23→130)之比[(A 60→130)/(A 23→130)]較佳為未達1,更佳為0.99以下,進而佳為0.98以下。前述平均位移量(A 60→130)相對於前述平均位移量(A 23→130)之比[(A 60→130)/(A 23→130)]較佳為0.10以上,更佳為0.20以上,進而佳為0.30以上,尤佳為0.90以上。 The ratio [(A 60→130 )/(A 23→130 )] of the aforementioned average displacement (A 60→130 ) to the aforementioned average displacement (A 23 →130 )] is preferably less than 1, more preferably 0.99 or less, more preferably 0.98 or less. The ratio [(A 60→130 )/(A 23→130 )] of the above average displacement (A 60→130 ) to the above average displacement (A 23 →130 )] is preferably 0.10 or more, more preferably 0.20 or more , more preferably not less than 0.30, especially preferably not less than 0.90.

相較於升溫達到130℃後保持在無溫度變化之狀態時,對支撐片之基材長時間施加相同荷重(工件之荷重)所致的支撐片緩緩伸長之現象,因升溫及緩冷卻而溫度變化時的前述平均位移量(A 60→130)相對於前述平均位移量(A 23→130)之比[(A 60→130)/(A 23→130)]更為重要。原因在於,於實際將第一積層複合片或第四積層複合片於130℃保持時,第一積層複合片或第四積層複合片中的樹脂膜形成層、黏著劑層、夾具用黏著劑層於高溫具有黏性,故而支撐片緩緩伸長之現象於第一積層複合片或第四積層複合片總體中應力緩和,不易影響鬆弛。 Compared with the state where there is no temperature change after the temperature rises to 130°C, the slow elongation of the support sheet caused by applying the same load (the load of the workpiece) to the base material of the support sheet for a long time is caused by the temperature rise and slow cooling. The ratio [(A 60→130 )/(A 23→130 )] of the above average displacement (A 60→130 ) to the above average displacement (A 23→130 ) at the time of temperature change is more important. The reason is that when the first laminated composite sheet or the fourth laminated composite sheet is actually held at 130°C, the resin film forming layer, the adhesive layer, and the adhesive layer for jigs in the first laminated composite sheet or the fourth laminated composite sheet It is viscous at high temperature, so the phenomenon of slow elongation of the support sheet eases the stress in the first laminated composite sheet or the fourth laminated composite sheet as a whole, and is not easy to affect relaxation.

較佳為於將前述支撐片以前述條件藉由行進方向(MD)之拉伸模式、及垂直方向(CD)之拉伸模式進行熱機械分析(TMA)時,前述平均位移量(A 60→130)相對於前述平均位移量(A 23→130)之比均未達1。 Preferably, when the above-mentioned supporting sheet is subjected to thermomechanical analysis (TMA) through the tensile mode of the traveling direction (MD) and the tensile mode of the vertical direction (CD) under the aforementioned conditions, the aforementioned average displacement (A 60→ 130 ) to the aforementioned average displacement (A 23→130 ) did not reach 1.

於將前述支撐片以前述條件藉由行進方向(MD)之拉伸模式、及垂直方向(CD)之拉伸模式進行熱機械分析(TMA)時,前述平均位移量(A 60→130)相對於前述平均位移量(A 23→130)之比[(A 60→130)/(A 23→130)]較佳為均未達1,更佳為均為0.99以下,進而佳為均為0.98以下。前述平均位移量(A 60→130)相對於前述平均位移量(A 23→130)之比[(A 60→130)/(A 23→130)]較佳為均為0.10以上,更佳為均為0.20以上,進而佳為均為0.30以上。 When the above-mentioned supporting sheet is subjected to thermomechanical analysis (TMA) under the above-mentioned conditions through the tensile mode in the traveling direction (MD) and the tensile mode in the vertical direction (CD), the above-mentioned average displacement (A 60→130 ) is relatively The above average displacement (A 23→130 ) ratio [(A 60→130 )/(A 23→130 )] is preferably less than 1, more preferably 0.99 or less, and even more preferably 0.98 the following. The ratio [(A 60→130 )/(A 23→130 )] of the above average displacement (A 60→130 ) to the above average displacement (A 23 →130 )] is preferably 0.10 or more, more preferably All are at least 0.20, and more preferably all are at least 0.30.

本實施形態之支撐片可合適地用於下述具樹脂膜之晶片的製造方法:於工件的內面貼附樹脂膜形成層,對於在前述支撐片上使得前述樹脂膜形成層及前述工件依序於這些之厚度方向積層而構成之第一積層複合片,以將前述第一積層複合片的周緣部貼附於固定用夾具之狀態,將前述第一積層複合片加熱,形成於前述支撐片上使得樹脂膜及前述工件依序於這些之厚度方向積層而構成之第二積層複合片,將前述第二積層複合片冷卻,然後於前述支撐片上將前述工件加以分割,切斷前述樹脂膜,形成於前述支撐片上固定有多個具樹脂膜之晶片的第三積層複合片,拾取前述第三積層複合片中的前述具樹脂膜之晶片。本發明之實施形態之支撐片具有上述構成,故而即便以將第一積層複合片的周緣部貼附於固定用夾具之狀態來將前述第一積層複合片加熱,然後將第二積層複合片冷卻,亦能夠消除第三積層複合片之鬆弛之影響而提高拾取裝置之晶片之辨識性。The support sheet of this embodiment can be suitably used in the following method of manufacturing a wafer with a resin film: attaching a resin film forming layer to the inner surface of a workpiece, and making the aforementioned resin film forming layer and the aforementioned workpiece sequentially on the support sheet The first laminated composite sheet formed by laminating these layers in the thickness direction is formed on the support sheet by heating the first laminated composite sheet in a state where the peripheral portion of the first laminated composite sheet is attached to a jig for fixing. The second laminated composite sheet formed by laminating the resin film and the aforementioned workpiece sequentially in the thickness direction thereof, cooling the aforementioned second laminated composite sheet, and then dividing the aforementioned workpiece on the aforementioned support sheet, cutting the aforementioned resin film, and forming in A third laminated composite sheet on which a plurality of chips with resin films are fixed on the support sheet, picks up the aforementioned wafers with resin films in the third laminated composite sheet. The support sheet according to the embodiment of the present invention has the above-mentioned structure, so even if the peripheral portion of the first laminated composite sheet is attached to the jig for fixing, the first laminated composite sheet is heated and then the second laminated composite sheet is cooled. , It is also possible to eliminate the influence of the slack of the third laminated composite sheet and improve the recognition of the chip of the pick-up device.

而且,本實施形態之支撐片可合適地用於下述具樹脂膜之晶片的製造方法:於工件的內面貼附樹脂膜形成層,將於前述支撐片上使得前述樹脂膜形成層及前述工件依序於這些之厚度方向積層而構成之第一積層複合片中的前述工件加以分割,切斷前述樹脂膜形成層,形成於前述支撐片上固定有多個具樹脂膜形成層之晶片的第四積層複合片,對於前述第四積層複合片,以將前述第四積層複合片的周緣部貼附於固定用夾具之狀態,將前述第四積層複合片加熱,形成於前述支撐片上固定有多個具樹脂膜之晶片的第三積層複合片,將前述第三積層複合片冷卻,然後拾取前述第三積層複合片中的前述具樹脂膜之晶片。本發明之實施形態之支撐片具有上述構成,故而即便以將第四積層複合片的周緣部貼附於固定用夾具之狀態將前述第四積層複合片加熱,然後將第三積層複合片冷卻,亦能夠消除第三積層複合片之鬆弛之影響,提高拾取裝置之晶片之辨識性。Furthermore, the support sheet of this embodiment can be suitably used in a method of manufacturing a wafer with a resin film as follows: affixing a resin film-forming layer to the inner surface of a work, placing the resin film-forming layer and the work on the support sheet The above-mentioned work in the first laminated composite sheet formed by sequentially laminating these layers in the thickness direction is divided, the above-mentioned resin film-forming layer is cut off, and a fourth wafer in which a plurality of wafers with resin film-forming layers are fixed on the above-mentioned supporting sheet is formed. As for the laminated composite sheet, for the aforementioned fourth laminated composite sheet, in a state where the periphery of the aforementioned fourth laminated composite sheet is attached to a jig for fixing, the aforementioned fourth laminated composite sheet is heated to form a plurality of For the third laminated composite sheet of wafers with resin film, the aforementioned third laminated composite sheet is cooled, and then the aforementioned wafer with resin film in the aforementioned third laminated composite sheet is picked up. The support sheet according to the embodiment of the present invention has the above-mentioned structure, so even if the fourth laminated composite sheet is heated with the peripheral portion of the fourth laminated composite sheet attached to the jig for fixing, and then the third laminated composite sheet is cooled, Also, the influence of the slack of the third laminated composite sheet can be eliminated, and the visibility of the chip of the pick-up device can be improved.

本發明之實施形態之支撐片具有上述構成,故而即便於工件之質量為20g以上之情形時,亦能夠提高拾取裝置之晶片之辨識性,於工件之質量為30g以上之情形時,亦能夠提高拾取裝置之晶片之辨識性,於工件之質量為40g以上之情形時,亦能夠提高拾取裝置之晶片之辨識性。The support sheet according to the embodiment of the present invention has the above structure, so even when the mass of the workpiece is 20g or more, the visibility of the wafer of the pick-up device can be improved, and when the mass of the workpiece is 30g or more, it can also be improved. The discriminability of the pick-up device can also improve the discriminability of the pick-up device when the mass of the workpiece is 40 g or more.

於本說明書中,所謂「工件」,係指晶圓或半導體裝置面板。 作為「晶圓」,可列舉:由矽、鍺、硒等之元素半導體或GaAs、GaP、InP、CdTe、ZnSe、SiC等之化合物半導體所構成之半導體晶圓;由藍寶石、玻璃、鈮酸鋰、鉭酸鋰等絕緣體所構成之絕緣體晶圓。 所謂「半導體裝置面板」,係指使得至少一個電子零件經密封樹脂層密封之多個半導體裝置以平面方式排列配置而成的集合體。 於這些工件的一面上形成有電路,於本說明書中,將如此形成有電路之側的工件的面稱為「電路面」。另外,將工件中的與電路面為相反側之面稱為「內面」。 工件係藉由切割等手段加以分割而成為晶片。於本說明書中,與工件之情形同樣地,將形成有電路之側的晶片的面稱為「電路面」,將晶片中的與電路面為相反側之面稱為「內面」。 於工件的電路面及晶片的電路面均設有凸塊、支柱等突狀電極。突狀電極較佳為由焊料所構成。 In this specification, the so-called "workpiece" refers to a wafer or a semiconductor device panel. Examples of "wafers" include: semiconductor wafers made of elemental semiconductors such as silicon, germanium, and selenium, or compound semiconductors such as GaAs, GaP, InP, CdTe, ZnSe, and SiC; , lithium tantalate and other insulators composed of insulator wafers. The so-called "semiconductor device panel" refers to an aggregate in which a plurality of semiconductor devices are arranged in a planar manner and at least one electronic component is sealed with a sealing resin layer. A circuit is formed on one surface of these works, and in this specification, the surface of the work on which the circuit is formed in this way is called a "circuit surface". In addition, the surface on the opposite side to the circuit surface in the workpiece is referred to as an "inner surface". The workpiece is divided into wafers by means of dicing or the like. In this specification, as in the case of the workpiece, the surface of the wafer on which the circuit is formed is referred to as a "circuit surface", and the surface of the wafer opposite to the circuit surface is referred to as an "inner surface". Protruding electrodes such as bumps and pillars are arranged on the circuit surface of the workpiece and the circuit surface of the chip. The protruding electrodes are preferably made of solder.

前述支撐片可由一層(單層)所構成,亦可由兩層以上之多層所構成。於支撐片由多層所構成之情形時,這些多層之構成材料及厚度可彼此相同亦可不同,這些多層之組合只要不損及本發明功效,則並無特別限定。The above-mentioned supporting sheet may be composed of one layer (single layer), or may be composed of two or more layers. When the supporting sheet is composed of multiple layers, the constituent materials and thicknesses of these layers may be the same or different, and the combination of these layers is not particularly limited as long as it does not impair the effect of the present invention.

支撐片較佳為透明,亦可根據目的而著色。 於樹脂膜形成層具有能量線硬化性時,支撐片較佳為使能量線穿透。 The support sheet is preferably transparent, and may be colored according to the purpose. When the resin film forming layer has energy ray curability, it is preferable that the support sheet allows energy ray to pass through.

作為支撐片,例如可列舉:具備基材、及設置於前述基材的一面上之黏著劑層的支撐片;僅由基材所構成之支撐片等。於支撐片具備黏著劑層之情形時,黏著劑層於樹脂膜形成用複合片中,配置於基材與樹脂膜形成層之間。As a support sheet, the support sheet which has a base material and the adhesive layer provided on one side of the said base material, the support sheet which consists only of a base material, etc. are mentioned, for example. When the support sheet has an adhesive layer, the adhesive layer is arranged between the base material and the resin film forming layer in the composite sheet for resin film formation.

於使用具備基材及黏著劑層之支撐片之情形時,於樹脂膜形成用複合片中,可容易地調節支撐片與樹脂膜形成層之間的密接性及剝離性。 於使用僅由基材所構成之支撐片之情形時,能夠以低成本製造樹脂膜形成用複合片。 When using the support sheet provided with a base material and an adhesive layer, in the composite sheet for resin film formation, the adhesiveness and peelability between a support sheet and a resin film formation layer can be adjusted easily. When using the support sheet which consists only of a base material, the composite sheet for resin film formation can be manufactured at low cost.

以下,一邊參照圖式一邊對本實施形態之支撐片之例加以說明。Hereinafter, an example of the supporting sheet of this embodiment will be described with reference to the drawings.

圖1係示意性地表示本實施形態之支撐片之一例的剖面圖。再者,以下之說明所用之圖有時為了容易理解本發明之特徵,為方便起見而將成為要部之部分放大表示,各構成要素之尺寸比率等未必與實際相同。Fig. 1 is a cross-sectional view schematically showing an example of a support sheet according to this embodiment. In addition, in the drawings used in the following description, in order to facilitate understanding of the features of the present invention, the main parts may be enlarged and shown for convenience, and the dimensional ratio of each component may not necessarily be the same as the actual one.

圖1所示之支撐片10係於基材11的一面11a(於本說明書中,有時稱為「第一面11a」)上設有黏著劑層12。The support sheet 10 shown in FIG. 1 is provided with an adhesive layer 12 on one side 11 a of the substrate 11 (in this specification, sometimes referred to as “the first side 11 a ”).

繼而,對構成支撐片10之各層加以更詳細說明。Next, each layer constituting the support sheet 10 will be described in more detail.

○基材 前述基材為片狀或膜狀,作為該基材之構成材料,例如可列舉各種樹脂。 作為前述樹脂,例如可列舉:低密度聚乙烯(LDPE)、直鏈低密度聚乙烯(LLDPE)、高密度聚乙烯(HDPE)等聚乙烯;聚丙烯、聚丁烯、聚丁二烯、聚甲基戊烯、降冰片烯樹脂等聚乙烯以外之聚烯烴;乙烯-乙酸乙烯酯共聚物、乙烯-(甲基)丙烯酸共聚物、乙烯-(甲基)丙烯酸酯共聚物、乙烯-降冰片烯共聚物等乙烯系共聚物(使用乙烯作為單體而得之共聚物);聚氯乙烯、氯乙烯共聚物等氯乙烯系樹脂(使用氯乙烯作為單體而得之樹脂);聚苯乙烯;聚環烯烴;聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯、聚對苯二甲酸丁二酯、聚間苯二甲酸乙二酯、聚2,6-萘二甲酸乙二酯、所有構成單元具有芳香族環式基之全芳香族聚酯等聚酯;兩種以上之前述聚酯之共聚物;聚(甲基)丙烯酸酯;聚胺基甲酸酯;聚丙烯酸胺基甲酸酯;聚醯亞胺;聚醯胺;聚碳酸酯;氟樹脂;聚縮醛;改質聚苯醚;聚苯硫醚;聚碸;聚醚酮等。 ○Substrate The above-mentioned base material is in the form of a sheet or a film, and examples of the constituent material of the base material include various resins. Examples of the aforementioned resins include polyethylene such as low-density polyethylene (LDPE), linear low-density polyethylene (LLDPE), and high-density polyethylene (HDPE); polypropylene, polybutene, polybutadiene, poly Polyolefins other than polyethylene such as methylpentene and norbornene resin; ethylene-vinyl acetate copolymer, ethylene-(meth)acrylic acid copolymer, ethylene-(meth)acrylate copolymer, ethylene-norbornene Vinyl copolymers such as ethylene copolymers (copolymers obtained by using ethylene as a monomer); vinyl chloride resins such as polyvinyl chloride and vinyl chloride copolymers (resins obtained by using vinyl chloride as a monomer); polystyrene ; Polycycloolefin; Polyethylene terephthalate, Polyethylene naphthalate, Polybutylene terephthalate, Polyethylene isophthalate, Polyethylene 2,6-naphthalate Esters, polyesters such as wholly aromatic polyesters having aromatic ring groups in all their constituent units; copolymers of two or more of the aforementioned polyesters; poly(meth)acrylates; polyurethanes; polyacrylamines Acrylic acid ester; polyimide; polyamide; polycarbonate; fluororesin; polyacetal; modified polyphenylene ether; polyphenylene sulfide;

前述基材之構成材料較佳為含有聚烯烴樹脂,這些當中,較佳為聚乙烯以外之聚烯烴,更佳為聚丙烯。The constituent material of the aforementioned base material preferably contains polyolefin resin, and among these, polyolefin other than polyethylene is preferable, and polypropylene is more preferable.

而且,作為前述樹脂,例如亦可列舉前述聚酯與該聚酯以外之樹脂的混合物等聚合物合金。前述聚酯與該聚酯以外之樹脂的聚合物合金較佳為聚酯以外之樹脂之量為相對較少量。 而且,作為前述樹脂,例如亦可列舉:至此為止所例示之前述樹脂的一種或兩種以上進行交聯而成之交聯樹脂;使用至此為止所例示之前述樹脂之一種或兩種以上的離子聚合物等改質樹脂。 Moreover, as said resin, polymer alloys, such as a mixture of the said polyester and resin other than this polyester, are also mentioned, for example. In the polymer alloy of the aforementioned polyester and a resin other than the polyester, it is preferable that the amount of the resin other than the polyester is relatively small. Furthermore, examples of the above-mentioned resins include: cross-linked resins obtained by cross-linking one or two or more of the above-mentioned resins exemplified so far; Modified resins such as polymers.

構成基材之樹脂可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些樹脂之組合及比率可任意地選擇。The resin constituting the base material may be only one kind, or two or more kinds. In the case of two or more kinds, the combination and ratio of these resins can be selected arbitrarily.

基材可由一層(單層)所構成,亦可由兩層以上之多層所構成,於由多層所構成之情形時,這些多層可彼此相同亦可不同,這些多層之組合並無特別限定。The base material may consist of one layer (single layer), or may consist of two or more layers. When composed of multiple layers, these layers may be the same or different from each other, and the combination of these layers is not particularly limited.

基材之厚度較佳為50μm至300μm,更佳為60μm至100μm。藉由基材之厚度為此種範圍,支撐片及樹脂膜形成用複合片之可撓性、及對工件之貼附適性進一步提高。 此處,所謂「基材之厚度」,意指基材總體之厚度,例如所謂由多層所構成之基材之厚度,意指構成基材之所有層之合計厚度。 於本說明書中,「厚度」只要無特別說明,則意指於對象物中隨機選出之5處測定的厚度之平均值,可依據JIS K7130(Japanese Industrial Standards;日本工業標準)使用定壓厚度測定器獲取。 The thickness of the substrate is preferably from 50 μm to 300 μm, more preferably from 60 μm to 100 μm. When the thickness of the base material is in such a range, the flexibility of the support sheet and the composite sheet for forming a resin film, and the sticking suitability to workpieces are further improved. Here, the "thickness of the substrate" refers to the thickness of the entire substrate, for example, the thickness of a substrate composed of multiple layers refers to the total thickness of all the layers constituting the substrate. In this specification, unless otherwise specified, "thickness" means the average value of the thickness measured at 5 randomly selected places in the object, which can be measured using constant pressure thickness in accordance with JIS K7130 (Japanese Industrial Standards; Japanese Industrial Standards) device to obtain.

基材亦可除了前述樹脂等主要之構成材料以外,進而含有填充材、著色劑、抗氧化劑、有機滑劑、觸媒、軟化劑(塑化劑)等公知之各種添加劑。The base material may further contain various well-known additives such as fillers, colorants, antioxidants, organic lubricants, catalysts, and softeners (plasticizers) in addition to the main constituent materials such as the aforementioned resins.

基材較佳為透明,亦可根據目的而著色,亦可蒸鍍有其他層。The base material is preferably transparent, but it may be colored according to the purpose, and another layer may be vapor-deposited.

對於基材,亦可為了調節與設置於該基材上之黏著劑層或樹脂膜形成層的密接性,而對表面實施有下述處理:利用噴砂處理、溶劑處理等之凹凸化處理;電暈放電處理、電子束照射處理、電漿處理、臭氧-紫外線照射處理、火焰處理、鉻酸處理、熱風處理等氧化處理;親油處理;親水處理等。而且,基材亦可表面經底塗處理。For the base material, in order to adjust the adhesion with the adhesive layer or resin film forming layer provided on the base material, the following treatments may be performed on the surface: roughening treatment by sandblasting, solvent treatment, etc.; Corona discharge treatment, electron beam irradiation treatment, plasma treatment, ozone-ultraviolet irradiation treatment, flame treatment, chromic acid treatment, hot air treatment and other oxidation treatments; lipophilic treatment; hydrophilic treatment, etc. Moreover, the surface of the substrate may also be treated with a primer.

基材亦可藉由含有特定範圍之成分(例如樹脂等),而於至少一面具有黏著性。The substrate can also have adhesiveness on at least one side by containing a specific range of components (such as resin, etc.).

○基材的製造方法 基材可藉由公知之方法製造。例如,含有樹脂之基材可藉由將含有前述樹脂之樹脂組成物加以成形而製造。 ○ Manufacturing method of base material The substrate can be produced by a known method. For example, a base material containing a resin can be produced by molding a resin composition containing the aforementioned resin.

前述基材較佳為延伸膜。基材之延伸方向可僅為基材之行進方向(MD),亦可僅為基材之垂直方向(CD),更佳為行進方向(MD)及垂直方向(CD)之雙軸延伸。The aforementioned substrate is preferably a stretched film. The extending direction of the substrate can be only the traveling direction (MD) of the substrate, or only the vertical direction (CD) of the substrate, more preferably biaxial extension of the traveling direction (MD) and the vertical direction (CD).

藉由前述基材為延伸膜,延伸膜之殘留應力能夠減小支撐片之前述平均位移量(A 23→130)及前述平均位移量(A 60→130)。尤其延伸膜之殘留應力在減小前述平均位移量(A 60→130)之效果大,故而能夠減小130℃時之位移量(A 130)及前述比[(A 60→130)/(A 23→130)]。 Since the base material is a stretched film, the residual stress of the stretched film can reduce the aforementioned average displacement (A 23→130 ) and the aforementioned average displacement (A 60→130 ) of the supporting sheet. In particular, the residual stress of the stretched film has a great effect on reducing the average displacement (A 60→130 ), so it can reduce the displacement (A 130 ) at 130°C and the ratio [(A 60→130 )/(A 23 → 130 )].

基材之延伸較佳為加熱條件下。加熱之溫度條件係根據基材之構成材料而調整。例如,於基材之構成材料為聚丙烯時,加熱之溫度條件較佳為100℃至140℃,更佳為105℃至135℃,進而佳為110℃至130℃。The stretching of the substrate is preferably under heating. The heating temperature conditions are adjusted according to the constituent materials of the substrate. For example, when the constituent material of the substrate is polypropylene, the heating temperature condition is preferably from 100°C to 140°C, more preferably from 105°C to 135°C, and still more preferably from 110°C to 130°C.

加熱之時間條件較佳為15s至120s,更佳為30s至100s,進而佳為45s至80s。The heating time condition is preferably from 15s to 120s, more preferably from 30s to 100s, and still more preferably from 45s to 80s.

延伸之張力較佳為1.0N/m至6.0N/m,更佳為1.3N/m至5.0N/m,進而佳為1.6N/m至4.0N/m。The stretching tension is preferably from 1.0N/m to 6.0N/m, more preferably from 1.3N/m to 5.0N/m, and still more preferably from 1.6N/m to 4.0N/m.

○黏著劑層 前述黏著劑層為片狀或膜狀,含有黏著性樹脂。 作為前述黏著性樹脂,例如可列舉:丙烯酸樹脂、胺基甲酸酯樹脂、橡膠系樹脂、聚矽氧樹脂、環氧系樹脂、聚乙烯醚、聚碳酸酯、酯系樹脂等。其中,就調整相對於樹脂膜形成層及樹脂膜之密接性之觀點而言,較佳為丙烯酸樹脂。 ○Adhesive layer The aforementioned adhesive layer is in the form of a sheet or a film, and contains an adhesive resin. Examples of the adhesive resin include acrylic resins, urethane resins, rubber-based resins, silicone resins, epoxy-based resins, polyvinyl ethers, polycarbonate, and ester-based resins. Among them, an acrylic resin is preferable from the viewpoint of adjusting the adhesiveness with respect to the resin film forming layer and the resin film.

黏著劑層可由一層(單層)所構成,亦可由兩層以上之多層所構成,於由多層所構成之情形時,這些多層可彼此相同亦可不同,這些多層之組合並無特別限定。The adhesive layer may be composed of one layer (single layer), or may be composed of two or more layers. When composed of multiple layers, these layers may be the same or different from each other, and the combination of these layers is not particularly limited.

黏著劑層之厚度並無特別限定,就更容易調整相對於樹脂膜形成層及樹脂膜之密接性之方面而言,較佳為1μm至100μm,更佳為1μm至60μm,進而佳為1μm至30μm,進而更佳為1μm至15μm,尤佳為1μm至9μm。 此處,所謂「黏著劑層之厚度」,意指黏著劑層總體之厚度,例如所謂由多層所構成之黏著劑層之厚度,意指構成黏著劑層之所有層之合計厚度。 The thickness of the adhesive layer is not particularly limited, but it is preferably from 1 μm to 100 μm, more preferably from 1 μm to 60 μm, and still more preferably from 1 μm to 30 μm, more preferably 1 μm to 15 μm, especially preferably 1 μm to 9 μm. Here, the "thickness of the adhesive layer" means the thickness of the entire adhesive layer, for example, the thickness of the adhesive layer composed of multiple layers means the total thickness of all the layers constituting the adhesive layer.

黏著劑層較佳為透明,亦可根據目的而著色。 於樹脂膜形成層具有能量線硬化性時,黏著劑層較佳為使能量線穿透。 The adhesive layer is preferably transparent, and may be colored according to purposes. When the resin film forming layer has energy ray curability, it is preferable that the pressure-sensitive adhesive layer transmits energy ray.

黏著劑層可為能量線硬化性及非能量線硬化性的任一種。能量線硬化性之黏著劑層係能夠調節硬化前及硬化後之物性。例如,藉由在後述的具樹脂膜之晶片之拾取前,使能量線硬化性之黏著劑層硬化,而能夠更容易地拾取該具樹脂膜之晶片。The adhesive layer may be either energy ray curable or non-energy ray curable. The energy ray hardening adhesive layer can adjust the physical properties before and after hardening. For example, by hardening the energy ray curable adhesive layer before picking up the wafer with a resin film mentioned later, it becomes possible to pick up the wafer with a resin film more easily.

於本說明書中,所謂「能量線」,意指電磁波或帶電粒子束中具有能量量子者。作為能量線之例,可列舉紫外線、放射線、電子束等。紫外線例如可藉由使用高壓水銀燈、熔合燈(fusion lamp)、氙氣燈、黑光或LED(Light Emitting Diode,發光二極體)燈等作為紫外線源而照射。關於電子束,可照射藉由電子束加速器等而產生者。 於本說明書中,所謂「能量線硬化性」,意指藉由照射能量線而硬化之性質,所謂「非能量線硬化性」,意指即便照射能量線亦不硬化之性質。 而且,所謂「非硬化性」,意指不因加熱或能量線之照射等任何手段而硬化之性質。 In this specification, the term "energy ray" refers to those having energy quanta in electromagnetic waves or charged particle beams. Examples of energy rays include ultraviolet rays, radiation, electron beams, and the like. Ultraviolet rays can be irradiated by using, for example, a high-pressure mercury lamp, a fusion lamp, a xenon lamp, a black light, or an LED (Light Emitting Diode, Light Emitting Diode) lamp as an ultraviolet source. Regarding electron beams, those generated by an electron beam accelerator or the like can be irradiated. In this specification, "energy ray curability" means the property of being cured by irradiation of energy ray, and "non-energy ray curability" means the property of not being cured even when irradiated with energy ray. In addition, "non-curable" means the property of not being cured by any means such as heating or irradiation of energy rays.

於黏著劑層為能量線硬化性之情形時,作為能量線硬化性之黏著劑組成物,例如可列舉下述黏著劑組成物等:黏著劑組成物(I-1),含有具有羥基等官能基並且為非能量線硬化性且黏著性之丙烯酸樹脂(I-1a)(以下,有時簡稱為「黏著性樹脂(I-1a)」)、及能量線硬化性化合物;黏著劑組成物(I-2),含有於非能量線硬化性之前述黏著性樹脂(I-1a)之側鏈導入有不飽和基的能量線硬化性之黏著性樹脂(I-2a)(以下,有時簡稱為「黏著性樹脂(I-2a)」);以及黏著劑組成物(I-3),含有前述黏著性樹脂(I-2a)及能量線硬化性化合物。In the case where the adhesive layer is energy ray curable, examples of the energy ray curable adhesive composition include the following adhesive composition, etc.: Adhesive composition (I-1) contains Non-energy ray-curable and adhesive acrylic resin (I-1a) (hereinafter, sometimes simply referred to as "adhesive resin (I-1a)"), and an energy ray-curable compound; adhesive composition ( I-2), the energy-ray-curable adhesive resin (I-2a) (hereinafter, sometimes referred to as is "adhesive resin (I-2a)"); and an adhesive composition (I-3) containing the aforementioned adhesive resin (I-2a) and an energy ray-curable compound.

於黏著劑層為非能量線硬化性之情形時,作為非能量線硬化性之黏著劑組成物,例如可列舉:含有非能量線硬化性之前述黏著性樹脂(I-1a)的黏著劑組成物(I-4)等。When the adhesive layer is non-energy ray-curable, the non-energy ray-curable adhesive composition includes, for example, an adhesive composition containing the aforementioned non-energy ray-curable adhesive resin (I-1a) Object (I-4) and so on.

[非能量線硬化性之黏著性樹脂(I-1a)] 前述黏著性樹脂(I-1a)為具有羥基等官能基之黏著性之丙烯酸樹脂。 作為前述丙烯酸樹脂,例如可列舉:具有源自含羥基單體之構成單元、及源自(甲基)丙烯酸烷基酯之構成單元的丙烯酸聚合物。 作為前述(甲基)丙烯酸烷基酯,例如可列舉構成烷基酯之烷基之碳數為1至20的(甲基)丙烯酸烷基酯,前述烷基較佳為直鏈狀或分支鏈狀。 [Non-energy ray-curable adhesive resin (I-1a)] The aforementioned adhesive resin (I-1a) is an adhesive acrylic resin having functional groups such as hydroxyl groups. As said acrylic resin, the acrylic polymer which has a structural unit derived from a hydroxyl group-containing monomer, and a structural unit derived from an alkyl (meth)acrylate is mentioned, for example. Examples of the aforementioned alkyl (meth)acrylate include alkyl (meth)acrylates in which the alkyl group constituting the alkyl ester has 1 to 20 carbon atoms, and the aforementioned alkyl group is preferably linear or branched. shape.

前述丙烯酸系樹脂為含有源自作為單體之(甲基)丙烯酸酯之構成單元的樹脂。所謂此處提及之「源自」,意指前述單體受到進行聚合所必需之結構變化。 再者,於本說明書中,所謂「(甲基)丙烯酸」,設為包含「丙烯酸」及「甲基丙烯酸」兩者之概念。關於與(甲基)丙烯酸類似之用語亦同樣。 The said acrylic resin is resin containing the structural unit derived from the (meth)acrylate which is a monomer. The so-called "derived from" mentioned here means that the aforementioned monomers are subjected to structural changes necessary for polymerization. In addition, in this specification, "(meth)acrylic acid" is taken as the concept including both "acrylic acid" and "methacrylic acid". The same applies to terms similar to (meth)acrylic acid.

前述丙烯酸聚合物亦可除了源自含羥基單體之構成單元、源自(甲基)丙烯酸烷基酯之構成單元以外,進而具有源自含羥基單體以外之含官能基單體的構成單元。 作為前述含官能基單體,例如可列舉:藉由前述官能基與後述之交聯劑反應而成為交聯之起點,或者前述官能基與後述之含不飽和基化合物中的異氰酸酯基、縮水甘油基等官能基反應以於丙烯酸聚合物之側鏈導入不飽和基的單體。 The above-mentioned acrylic polymer may have structural units derived from functional group-containing monomers other than hydroxyl-containing monomers in addition to structural units derived from hydroxyl-containing monomers and alkyl (meth)acrylates. . Examples of the functional group-containing monomer include: starting point of crosslinking by reacting the functional group with a cross-linking agent described later, or an isocyanate group and glycidyl group in an unsaturated group-containing compound described below with the functional group A monomer that introduces unsaturated groups into the side chains of acrylic polymers by reacting functional groups such as groups.

作為前述含官能基單體,除了含羥基單體以外,例如可列舉:含羧基單體、含胺基單體、含環氧基單體等。As said functional group containing monomer, a carboxyl group containing monomer, an amino group containing monomer, an epoxy group containing monomer etc. are mentioned, for example other than a hydroxyl group containing monomer.

前述丙烯酸聚合物亦可除了源自(甲基)丙烯酸烷基酯之構成單元、及源自含官能基單體之構成單元以外,進而具有源自其他單體之構成單元。 前述其他單體只要能夠與(甲基)丙烯酸烷基酯等共聚,則並無特別限定。 作為前述其他單體,例如可列舉:苯乙烯、α-甲基苯乙烯、乙烯基甲苯、甲酸乙烯酯、乙酸乙烯酯、丙烯腈、丙烯醯胺等。 The said acrylic polymer may have the structural unit derived from another monomer other than the structural unit derived from the alkyl (meth)acrylate and the structural unit derived from the functional group containing monomer. The aforementioned other monomers are not particularly limited as long as they can be copolymerized with an alkyl (meth)acrylate or the like. Examples of the other monomers include styrene, α-methylstyrene, vinyltoluene, vinyl formate, vinyl acetate, acrylonitrile, acrylamide, and the like.

於前述黏著劑組成物(I-1)、黏著劑組成物(I-2)、黏著劑組成物(I-3)及黏著劑組成物(I-4)(以下,包括這些黏著劑組成物而簡稱為「黏著劑組成物(I-1)至黏著劑組成物(I-4)」)中,前述丙烯酸聚合物等前述丙烯酸樹脂所具有之構成單元可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些構成單元之組合及比率可任意地選擇。In the aforementioned adhesive composition (I-1), adhesive composition (I-2), adhesive composition (I-3) and adhesive composition (I-4) (hereinafter, these adhesive compositions are included In the abbreviated as "adhesive composition (I-1) to adhesive composition (I-4)"), the constituent units of the aforementioned acrylic resin such as the aforementioned acrylic polymer may be only one type or two types. In the case of two or more of the above, combinations and ratios of these constituent units can be selected arbitrarily.

於前述丙烯酸聚合物中,相對於構成單元之總量,源自含官能基單體之構成單元之量之比率較佳為1質量%至35質量%。In the aforementioned acrylic polymer, the ratio of the amount of the structural unit derived from the functional group-containing monomer to the total amount of the structural units is preferably 1% by mass to 35% by mass.

黏著劑組成物(I-1)或黏著劑組成物(I-4)所含有之黏著性樹脂(I-1a)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些黏著性樹脂(I-1a)之組合及比率可任意地選擇。Adhesive resin (I-1a) contained in adhesive composition (I-1) or adhesive composition (I-4) may be only one kind, or may be two or more kinds, and in the case of two or more kinds , the combination and ratio of these adhesive resins (I-1a) can be selected arbitrarily.

於由黏著劑組成物(I-1)或黏著劑組成物(I-4)所形成之黏著劑層中,相對於前述黏著劑層之總質量,黏著性樹脂(I-1a)之含量之比率較佳為5質量%至99質量%,例如亦可為25質量%至98質量%、45質量%至97質量%及65質量%至96質量%的任一個。In the adhesive layer formed by the adhesive composition (I-1) or the adhesive composition (I-4), relative to the total mass of the aforementioned adhesive layer, the content of the adhesive resin (I-1a) is The ratio is preferably 5% by mass to 99% by mass, and may be, for example, any of 25% by mass to 98% by mass, 45% by mass to 97% by mass, and 65% by mass to 96% by mass.

[能量線硬化性之黏著性樹脂(I-2a)] 前述黏著性樹脂(I-2a)例如係藉由使具有能量線聚合性不飽和基之含不飽和基化合物與前述黏著性樹脂(I-1a)中之官能基反應而獲得。 [Energy Ray Curing Adhesive Resin (I-2a)] The aforementioned adhesive resin (I-2a) is obtained, for example, by reacting an unsaturated group-containing compound having an energy ray polymerizable unsaturated group with a functional group in the aforementioned adhesive resin (I-1a).

前述含不飽和基化合物為除了前述能量線聚合性不飽和基以外,進而具有藉由與黏著性樹脂(I-1a)中之官能基反應而能夠與黏著性樹脂(I-1a)鍵結之基的化合物。 作為前述能量線聚合性不飽和基,例如可列舉(甲基)丙烯醯基、乙烯基(ethenyl)、烯丙基(2-丙烯基)等,較佳為(甲基)丙烯醯基。 作為能夠與黏著性樹脂(I-1a)中之官能基鍵結之基,例如可列舉:能夠與羥基或胺基鍵結之異氰酸酯基及縮水甘油基、以及能夠與羧基或環氧基鍵結之羥基及胺基等。 The aforementioned unsaturated group-containing compound has, in addition to the aforementioned energy ray polymerizable unsaturated group, a compound capable of bonding to the adhesive resin (I-1a) by reacting with a functional group in the adhesive resin (I-1a). base compound. As said energy ray polymerizable unsaturated group, a (meth)acryl group, vinyl (ethenyl), allyl (2-propenyl) etc. are mentioned, for example, Preferably it is a (meth)acryl group. Examples of groups capable of bonding to functional groups in the adhesive resin (I-1a) include isocyanate groups and glycidyl groups capable of bonding to hydroxyl groups or amine groups, and carboxyl groups or epoxy groups capable of bonding Hydroxyl and amino groups, etc.

作為前述含不飽和基化合物,例如可列舉:(甲基)丙烯醯氧基乙基異氰酸酯、(甲基)丙烯醯基異氰酸酯、(甲基)丙烯酸縮水甘油酯等。As said unsaturated group containing compound, (meth)acryloxyethyl isocyanate, (meth)acryl isocyanate, glycidyl (meth)acrylate, etc. are mentioned, for example.

黏著劑組成物(I-2)或黏著劑組成物(I-3)所含有之黏著性樹脂(I-2a)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些黏著性樹脂(I-2a)之組合及比率可任意地選擇。The adhesive resin (I-2a) contained in the adhesive composition (I-2) or adhesive composition (I-3) may be only one kind, or two or more kinds, and in the case of two or more kinds , the combination and ratio of these adhesive resins (I-2a) can be selected arbitrarily.

於由黏著劑組成物(I-2)或黏著劑組成物(I-3)所形成之黏著劑層中,相對於前述黏著劑層之總質量,黏著性樹脂(I-2a)之含量之比率較佳為5質量%至99質量%。In the adhesive layer formed by the adhesive composition (I-2) or the adhesive composition (I-3), relative to the total mass of the aforementioned adhesive layer, the content of the adhesive resin (I-2a) is The ratio is preferably from 5% by mass to 99% by mass.

[能量線硬化性化合物] 作為前述黏著劑組成物(I-1)或黏著劑組成物(I-3)所含有之前述能量線硬化性化合物,可列舉具有能量線聚合性不飽和基且能夠藉由能量線之照射而硬化之單體或寡聚物。 [Energy Beam Curing Compound] Examples of the energy ray-curable compound contained in the adhesive composition (I-1) or adhesive composition (I-3) include energy ray polymerizable unsaturated groups that can be cured by energy ray irradiation. Hardened monomer or oligomer.

能量線硬化性化合物中,作為單體,例如可列舉:三羥甲基丙烷三(甲基)丙烯酸酯、季戊四醇(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、1,4-丁二醇二(甲基)丙烯酸酯、1,6-己二醇(甲基)丙烯酸酯等多元(甲基)丙烯酸酯;(甲基)丙烯酸胺基甲酸酯;聚酯(甲基)丙烯酸酯;聚醚(甲基)丙烯酸酯;環氧(甲基)丙烯酸酯等。 能量線硬化性化合物中,作為寡聚物,例如可列舉作為上述所例示之單體之聚合物的寡聚物等。 Among the energy ray-curable compounds, examples of monomers include trimethylolpropane tri(meth)acrylate, pentaerythritol (meth)acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol hexa(meth)acrylate, and dipentaerythritol hexa(meth)acrylate. base) acrylate, 1,4-butanediol di(meth)acrylate, 1,6-hexanediol (meth)acrylate and other poly(meth)acrylates; (meth)acrylic acid aminomethyl Ester; Polyester (meth)acrylate; Polyether (meth)acrylate; Epoxy (meth)acrylate, etc. In the energy ray-curable compound, examples of the oligomer include oligomers that are polymers of the monomers exemplified above, and the like.

黏著劑組成物(I-1)或黏著劑組成物(I-3)所含有之前述能量線硬化性化合物可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些能量線硬化性化合物之組合及比率可任意地選擇。The aforementioned energy ray-curing compound contained in the adhesive composition (I-1) or adhesive composition (I-3) may be only one kind, or may be two or more kinds, and in the case of two or more kinds, these Combinations and ratios of energy ray-curing compounds can be selected arbitrarily.

於由黏著劑組成物(I-1)或黏著劑組成物(I-3)所形成之黏著劑層中,相對於前述黏著劑層之總質量,前述能量線硬化性化合物之含量之比率較佳為1質量%至95質量%。In the adhesive layer formed by the adhesive composition (I-1) or the adhesive composition (I-3), the ratio of the content of the energy ray-curable compound to the total mass of the adhesive layer is relatively Preferably, it is 1 mass % to 95 mass %.

[交聯劑] 黏著劑組成物(I-1)至黏著劑組成物(I-4)較佳為進而含有異氰酸酯系交聯劑。 [Crosslinking agent] It is preferable that the adhesive composition (I-1) to adhesive agent composition (I-4) further contain an isocyanate type crosslinking agent.

前述交聯劑係與前述羥基反應,將黏著性樹脂(I-1a)彼此或黏著性樹脂(I-2a)彼此加以交聯。The crosslinking agent reacts with the hydroxyl group to crosslink the adhesive resins (I-1a) or the adhesive resins (I-2a) together.

於前述黏著劑組成物(I-1)至黏著劑組成物(I-4)中,相對於黏著性樹脂(I-1a)之含量100質量份,交聯劑之含量較佳為0.01質量份至50質量份,例如亦可為1質量份至40質量份、5質量份至35質量份及10質量份至30質量份的任一個。 作為交聯劑,例如可列舉與後述之保護膜形成用組成物(III-1)中列舉之「(交聯劑)」同樣的交聯劑。 In the aforementioned adhesive composition (I-1) to adhesive composition (I-4), the content of the crosslinking agent is preferably 0.01 parts by mass relative to 100 parts by mass of the content of the adhesive resin (I-1a) to 50 parts by mass, for example, any one of 1 to 40 parts by mass, 5 to 35 parts by mass, and 10 to 30 parts by mass may be used. As a crosslinking agent, the thing similar to "(crosslinking agent)" mentioned in the composition (III-1) for protective film formation mentioned later is mentioned, for example.

[光聚合起始劑] 黏著劑組成物(I-1)、黏著劑組成物(I-2)及黏著劑組成物(I-3)(以下包括這些黏著劑組成物而簡稱為「黏著劑組成物(I-1)至黏著劑組成物(I-3)」)亦可進而含有光聚合起始劑。含有光聚合起始劑之黏著劑組成物(I-1)至黏著劑組成物(I-3)即便照射紫外線等能量相對較低之能量線,亦充分進行硬化反應。 [Photopolymerization Initiator] Adhesive composition (I-1), adhesive composition (I-2) and adhesive composition (I-3) (hereinafter including these adhesive compositions are referred to simply as "adhesive composition (I-1) Adhesive composition (I-3)") may further contain a photopolymerization initiator. Adhesive composition (I-1) to adhesive composition (I-3) containing a photopolymerization initiator fully progressed the curing reaction even when irradiated with relatively low-energy energy rays such as ultraviolet rays.

作為前述光聚合起始劑,例如可列舉與後述之保護膜形成用組成物(III-1)中列舉之「(光聚合起始劑)」同樣的光聚合起始劑。As said photoinitiator, the photoinitiator similar to "(photoinitiator)" mentioned in the composition (III-1) for protective film formation mentioned later is mentioned, for example.

黏著劑組成物(I-1)至黏著劑組成物(I-3)所含有之光聚合起始劑可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些光聚合起始劑之組合及比率可任意地選擇。The photopolymerization initiator contained in adhesive composition (I-1) to adhesive composition (I-3) may be only one kind, or may be two or more kinds, and in the case of two or more kinds, these photopolymerization initiators The combination and ratio of the polymerization initiators can be selected arbitrarily.

於黏著劑組成物(I-1)中,相對於前述能量線硬化性化合物之含量100質量份,光聚合起始劑之含量較佳為0.01質量份至20質量份。 於黏著劑組成物(I-2)中,相對於黏著性樹脂(I-2a)之含量100質量份,光聚合起始劑之含量較佳為0.01質量份至20質量份。 於黏著劑組成物(I-3)中,相對於黏著性樹脂(I-2a)及前述能量線硬化性化合物之總含量100質量份,光聚合起始劑之含量較佳為0.01質量份至20質量份。 In the adhesive composition (I-1), the content of the photopolymerization initiator is preferably 0.01 to 20 parts by mass relative to 100 parts by mass of the content of the aforementioned energy ray-curable compound. In the adhesive composition (I-2), the content of the photopolymerization initiator is preferably 0.01 to 20 parts by mass relative to 100 parts by mass of the content of the adhesive resin (I-2a). In the adhesive composition (I-3), the content of the photopolymerization initiator is preferably 0.01 parts by mass to 20 parts by mass.

[其他添加劑] 黏著劑組成物(I-1)至黏著劑組成物(I-4)亦可於不損及本發明功效之範圍內,含有亦不相當於上述任一成分的其他添加劑。 作為前述其他添加劑,例如可列舉:抗靜電劑、抗氧化劑、軟化劑(塑化劑)、填充材(填料)、防鏽劑、著色劑(顏料、染料)、增感劑、增黏劑、反應延遲劑、交聯促進劑(觸媒)等公知之添加劑。 再者,所謂反應延遲劑,例如為抑制因混入至黏著劑組成物(I-1)至黏著劑組成物(I-4)中的觸媒之作用而於保存中之黏著劑組成物(I-1)至黏著劑組成物(I-4)中進行非目標之交聯反應之成分。作為反應延遲劑,例如可列舉藉由對觸媒之螯合而形成螯合錯合物之化合物,更具體而言,可列舉於一分子中具有兩個以上之羰基(-C(=O)-)之化合物。 [Other additives] Adhesive composition (I-1) to adhesive composition (I-4) may also contain other additives that do not correspond to any of the above-mentioned components within the range that does not impair the efficacy of the present invention. Examples of the aforementioned other additives include: antistatic agents, antioxidants, softeners (plasticizers), fillers (fillers), rust inhibitors, colorants (pigments, dyes), sensitizers, tackifiers, Reaction delay agent, crosslinking accelerator (catalyst) and other known additives. Furthermore, the so-called reaction delaying agent is, for example, the adhesive composition (I-4) that suppresses the effect of the catalyst mixed in the adhesive composition (I-1) to the adhesive composition (I-4) during preservation. -1) A component that undergoes an unintended cross-linking reaction in the adhesive composition (I-4). As a reaction retarder, for example, a compound that forms a chelate complex by chelating a catalyst, more specifically, a compound having two or more carbonyl groups (-C(=O) in one molecule can be mentioned. -) compounds.

黏著劑組成物(I-1)至黏著劑組成物(I-4)所含有之其他添加劑可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些其他添加劑之組合及比率可任意地選擇。Adhesive composition (I-1) to adhesive composition (I-4) may contain only one kind of other additives, or two or more kinds. In the case of two or more kinds, the combination of these other additives And the ratio can be chosen arbitrarily.

黏著劑組成物(I-1)至黏著劑組成物(I-4)之其他添加劑之含量並無特別限定,只要根據種類而適當選擇即可。The content of other additives in the adhesive composition (I-1) to adhesive composition (I-4) is not particularly limited, and may be appropriately selected according to the type.

[溶媒] 黏著劑組成物(I-1)至黏著劑組成物(I-4)亦可含有溶媒。黏著劑組成物(I-1)至黏著劑組成物(I-4)藉由含有溶媒,而提高對塗敷對象面之塗敷適性。 [solvent] Adhesive composition (I-1) to adhesive composition (I-4) may also contain a solvent. Adhesive composition (I-1) to adhesive composition (I-4) improve the applicability to the surface to be coated by containing a solvent.

前述溶媒較佳為有機溶媒,作為前述有機溶媒,例如可列舉:甲基乙基酮、丙酮等酮;乙酸乙酯等酯(羧酸酯);四氫呋喃、二噁烷等醚;環己烷、正己烷等脂肪族烴;甲苯、二甲苯等芳香族烴;1-丙醇、2-丙醇等醇等。The aforementioned solvent is preferably an organic solvent, and examples of the aforementioned organic solvent include: ketones such as methyl ethyl ketone and acetone; esters (carboxylates) such as ethyl acetate; ethers such as tetrahydrofuran and dioxane; cyclohexane, Aliphatic hydrocarbons such as n-hexane; aromatic hydrocarbons such as toluene and xylene; alcohols such as 1-propanol and 2-propanol, etc.

黏著劑組成物(I-1)至黏著劑組成物(I-4)所含有之溶媒可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些溶媒之組合及比率可任意地選擇。The solvents contained in adhesive composition (I-1) to adhesive composition (I-4) may be only one type, or two or more types. In the case of two or more types, the combination and ratio of these solvents Can be selected arbitrarily.

黏著劑組成物(I-1)至黏著劑組成物(I-4)之溶媒之含量並無特別限定,只要適當調節即可。The content of the solvent in the adhesive composition (I-1) to adhesive composition (I-4) is not particularly limited, as long as it is properly adjusted.

○黏著劑組成物的製造方法 黏著劑組成物(I-1)至黏著劑組成物(I-4)等黏著劑組成物係藉由將前述黏著性樹脂、及根據需要的前述黏著性樹脂以外之成分等用以構成黏著劑組成物之各成分加以調配而獲得。 各成分之調配時之添加順序並無特別限定,亦可同時添加兩種以上之成分。 於調配時混合各成分之方法並無特別限定,只要自下述方法等公知之方法中適當選擇即可:使攪拌子或攪拌翼等旋轉而進行混合之方法;使用混合機進行混合之方法;施加超音波進行混合之方法。 各成分之添加及混合時的溫度以及時間只要各調配成分不劣化,則並無特別限定,只要適當調節即可,溫度較佳為15℃至30℃。 ○Manufacturing method of adhesive composition Adhesive compositions such as adhesive composition (I-1) to adhesive composition (I-4) are made by using the above-mentioned adhesive resin and, if necessary, components other than the above-mentioned adhesive resin. It is obtained by blending the components of the composition. The order of addition of each component is not particularly limited, and two or more components may be added at the same time. The method of mixing the ingredients is not particularly limited, as long as it is properly selected from known methods such as the following methods: a method of mixing by rotating a stirring bar or a stirring blade; a method of mixing by using a mixer; A method of mixing by applying ultrasonic waves. The temperature and time for adding and mixing the ingredients are not particularly limited as long as the ingredients are not deteriorated, as long as they are properly adjusted, the temperature is preferably 15°C to 30°C.

○黏著劑層的製造方法 前述黏著劑層可使用含有黏著性樹脂之黏著劑組成物而形成。例如,於黏著劑層之形成對象面塗敷黏著劑組成物,根據需要加以乾燥,藉此可於目標部位形成黏著劑層。黏著劑組成物中的於常溫不氣化之成分彼此之含量之比率通常與黏著劑層中的前述成分彼此之含量之比率相同。 於黏著劑層中,相對於黏著劑層之總質量,黏著劑層的一種或兩種以上之後述之含有成分之合計含量之比率不超過100質量%。 同樣地,於黏著劑組成物中,相對於黏著劑組成物之總質量,黏著劑組成物的一種或兩種以上之後述之含有成分之合計含量之比率不超過100質量%。 ○Adhesive layer manufacturing method The aforementioned adhesive layer can be formed using an adhesive composition containing an adhesive resin. For example, the adhesive layer can be formed on the target site by applying an adhesive composition to the surface to be formed of the adhesive layer and drying it as necessary. The content ratio of the components that do not vaporize at room temperature in the adhesive composition is usually the same as the content ratio of the aforementioned components in the adhesive layer. In the adhesive layer, the ratio of the total content of one or two or more of the following components in the adhesive layer to the total mass of the adhesive layer does not exceed 100% by mass. Similarly, in the adhesive composition, the ratio of the total content of one or two or more of the following components of the adhesive composition to the total mass of the adhesive composition does not exceed 100% by mass.

黏著劑組成物之塗敷只要藉由公知之方法進行即可,例如可列舉:使用氣刀塗佈機、刀片塗佈機、棒塗機、凹版塗佈機、輥式塗佈機、輥刀塗佈機、簾幕式塗佈機、模塗機、刀式塗佈機、網版塗佈機、邁耶棒塗佈機、吻合式塗佈機等各種塗佈機之方法。The application of the adhesive composition may be performed by a known method, for example, use of an air knife coater, blade coater, bar coater, gravure coater, roll coater, roll knife Coater, curtain coater, die coater, knife coater, screen coater, Meyer rod coater, kiss coater and other coating methods.

黏著劑組成物之乾燥條件並無特別限定。然而,黏著劑組成物於含有溶媒之情形時,較佳為進行加熱乾燥。另外,含有溶媒之黏著劑組成物例如較佳為以70℃至130℃且10秒鐘至5分鐘之條件進行加熱乾燥。The drying conditions of the adhesive composition are not particularly limited. However, when the adhesive composition contains a solvent, it is preferable to heat and dry it. In addition, the adhesive composition containing a solvent, for example, is preferably heated and dried at 70° C. to 130° C. for 10 seconds to 5 minutes.

◇支撐片的製造方法 於基材上設置黏著劑層時,例如只要於基材上塗敷黏著劑組成物,根據需要加以乾燥即可。而且,例如亦可於剝離膜上塗敷黏著劑組成物,根據需要加以乾燥,藉此於剝離膜上預先形成黏著劑層,將該黏著劑層的露出面與基材的一表面貼合,藉此於基材上積層黏著劑層。該情形之剝離膜只要於樹脂膜形成用複合片之製造過程或使用過程之任一時機去掉即可。 ◇Manufacturing method of support sheet When providing an adhesive layer on a base material, for example, it is only necessary to apply an adhesive composition on a base material, and to dry it as needed. In addition, for example, an adhesive composition may be applied on a release film and dried as necessary to form an adhesive layer on the release film in advance, and the exposed surface of the adhesive layer may be bonded to one surface of the substrate. In this way, an adhesive layer is laminated on the base material. The release film in this case may be removed at any timing during the production process or use process of the composite sheet for resin film formation.

支撐片10較佳為輥狀。 於支撐片10為輥狀時,無論支撐片10有無延伸,支撐片10之長條方向均為行進方向(MD),支撐片10之寬度方向均為垂直方向(CD)。 The support sheet 10 is preferably in the shape of a roll. When the support sheet 10 is in the shape of a roll, regardless of whether the support sheet 10 is extended or not, the longitudinal direction of the support sheet 10 is the traveling direction (MD), and the width direction of the support sheet 10 is the vertical direction (CD).

[樹脂膜形成用複合片] 本發明之實施形態之樹脂膜形成用複合片係具備上述本發明之實施形態之支撐片10、及設置於前述支撐片10的一面上之樹脂膜形成層。 以下,一邊參照圖式一邊對本實施形態之樹脂膜形成用複合片之例加以說明。 [Composite sheet for resin film formation] The composite sheet for resin film formation of embodiment of this invention is equipped with the support sheet 10 of embodiment of this invention mentioned above, and the resin film formation layer provided on one surface of the said support sheet 10. Hereinafter, an example of the composite sheet for resin film formation of this embodiment is demonstrated, referring drawings.

圖2係示意性地表示本實施形態之樹脂膜形成用複合片之一例的剖面圖。 再者,於圖2以後之圖中,對於與已說明之圖中所示相同之構成要素,標註與該已說明之圖之情形相同的符號,省略詳細說明。 Fig. 2 is a cross-sectional view schematically showing an example of the composite sheet for forming a resin film according to the present embodiment. In addition, in the figures after FIG. 2, the same code|symbol as the case of the figure which was demonstrated is attached|subjected to the component element shown in the figure which was already explained, and detailed description is abbreviate|omitted.

此處所示之樹脂膜形成用複合片101係具備支撐片10、及設置於支撐片10的一面(於本說明書中,有時稱為「第一面」)10a上之樹脂膜形成層13而構成。 支撐片10係具備基材11、及設置於基材11的一面(第一面)11a上之黏著劑層12而構成。樹脂膜形成用複合片101中,黏著劑層12係配置於基材11與樹脂膜形成層13之間。 The resin film-forming composite sheet 101 shown here includes a support sheet 10 and a resin film-forming layer 13 provided on one side (in this specification, sometimes referred to as "first surface") 10a of the support sheet 10 And constitute. The support sheet 10 is constituted by including a base material 11 and an adhesive layer 12 provided on one surface (first surface) 11 a of the base material 11 . In the composite sheet 101 for resin film formation, the adhesive layer 12 is arrange|positioned between the base material 11 and the resin film formation layer 13.

亦即,樹脂膜形成用複合片101係將基材11、黏著劑層12及樹脂膜形成層13依序於這些之厚度方向積層而構成。 支撐片10之第一面10a係相同於黏著劑層12中的與基材11側為相反側之面(於本說明書中,有時稱為「第一面」)12a。 That is, the composite sheet 101 for resin film formation is comprised by laminating|stacking the base material 11, the adhesive agent layer 12, and the resin film formation layer 13 sequentially in the thickness direction of these. The first surface 10a of the support sheet 10 is the same as the surface (in this specification, sometimes referred to as “first surface”) 12a on the side opposite to the substrate 11 side in the adhesive layer 12 .

樹脂膜形成用複合片101進而於樹脂膜形成層13上具備夾具用黏著劑層16及剝離膜15。 於樹脂膜形成用複合片101中,於黏著劑層12的第一面12a之全面或大致全面,積層有樹脂膜形成層13,於樹脂膜形成層13中的與黏著劑層12側為相反側之面(於本說明書中,有時稱為「第一面」)13a的一部分、亦即周緣部附近之區域,積層有夾具用黏著劑層16。進而,於樹脂膜形成層13的第一面13a中未積層有夾具用黏著劑層16之區域、及夾具用黏著劑層16中的與樹脂膜形成層13側為相反側之面(於本說明書中,有時稱為「第一面」)16a,積層有剝離膜15。於樹脂膜形成層13中的與第一面13a為相反側之面(於本說明書中,有時稱為「第二面」)13b,設有支撐片10。 The composite sheet 101 for resin film formation is further equipped with the adhesive agent layer 16 for clips, and the peeling film 15 on the resin film formation layer 13. In the resin film forming composite sheet 101, the resin film forming layer 13 is laminated on the entire or substantially entire surface of the first surface 12a of the adhesive layer 12, and the side of the resin film forming layer 13 opposite to the adhesive layer 12 is A part of the side surface (in this specification, sometimes referred to as "first surface") 13a, that is, a region near the peripheral portion, is laminated with an adhesive layer 16 for jigs. Furthermore, in the first surface 13a of the resin film forming layer 13, the area where the adhesive layer 16 for jigs is not laminated, and the surface of the adhesive layer 16 for jigs that is on the opposite side to the side of the resin film forming layer 13 (in this paper) In the specification, sometimes referred to as "the first surface") 16a, the release film 15 is laminated. The support sheet 10 is provided on a surface (in this specification, sometimes referred to as a "second surface") 13b of the resin film forming layer 13 on the opposite side to the first surface 13a.

不限於樹脂膜形成用複合片101之情形,於本實施形態之樹脂膜形成用複合片中,剝離膜為任意之構成,本實施形態之樹脂膜形成用複合片可具備剝離膜,亦可不具備。It is not limited to the composite sheet 101 for forming a resin film. In the composite sheet for forming a resin film of this embodiment, the release film may have any configuration. The composite sheet for forming a resin film of this embodiment may or may not have a release film. .

夾具用黏著劑層16係用於將樹脂膜形成用複合片101固定於環形框架等固定用夾具18。 夾具用黏著劑層16例如可具有含黏著劑成分之單層結構,亦可具有多層結構,該多層結構係具備成為芯材之片材、及設置於前述片材的兩面之含有黏著劑成分之層。 The adhesive layer 16 for jigs is for fixing the composite sheet 101 for resin film formation to the jig 18 for fixation, such as a ring frame. The adhesive layer 16 for jigs may have, for example, a single-layer structure containing an adhesive component, or may have a multi-layer structure comprising a sheet as a core material and adhesive components provided on both sides of the aforementioned sheet. Floor.

作為構成夾具用黏著劑層16之黏著劑,較佳為具有所需之黏著力及再剝離性,例如可使用:丙烯酸系黏著劑、橡膠系黏著劑、聚矽氧系黏著劑、胺基甲酸酯系黏著劑、聚酯系黏著劑、聚乙烯醚系黏著劑等。這些當中,較佳為相對於環形框架等固定用夾具18之黏著性高,能夠於切割步驟等中有效地抑制環形框架等固定用夾具18自保護膜形成用複合片剝離之丙烯酸系黏著劑。再者,於夾具用黏著劑層之厚度方向的中途,亦可插入有作為芯材之基材。As the adhesive constituting the adhesive layer 16 for the jig, it is preferable to have the required adhesive force and re-peelability. For example, acrylic adhesives, rubber adhesives, polysiloxane adhesives, and urethane adhesives can be used. Ester-based adhesives, polyester-based adhesives, polyvinyl ether-based adhesives, etc. Among these, an acrylic adhesive having high adhesiveness to the fixing jig 18 such as a ring frame and capable of effectively suppressing peeling of the fixing jig 18 such as a ring frame from the composite sheet for forming a protective film in a cutting step or the like is preferable. In addition, the base material which is a core material may be inserted in the middle of the thickness direction of the adhesive agent layer for jigs.

夾具用黏著劑層可使用含有黏著性樹脂之夾具用黏著劑組成物而形成。例如,藉由在夾具用黏著劑層之形成對象面塗敷夾具用黏著劑組成物,加以乾燥,而可於目標部位形成夾具用黏著劑層。作為夾具用黏著劑組成物,可列舉與前述黏著劑組成物(I-1)至黏著劑組成物(I-4)同樣之組成物。夾具用黏著劑組成物中的於常溫不氣化之成分彼此之含量之比率通常與夾具用黏著劑層中的前述成分彼此之含量之比率相同。The adhesive layer for the jig can be formed using an adhesive composition for the jig containing an adhesive resin. For example, the adhesive layer for the jig can be formed on the target site by applying the adhesive composition for the jig on the surface to be formed of the adhesive layer for the jig and drying it. Examples of the adhesive composition for jigs include the same compositions as the aforementioned adhesive composition (I-1) to adhesive composition (I-4). The content ratio of the components that do not vaporize at room temperature in the adhesive composition for jigs is usually the same as the content ratio of the above-mentioned components in the adhesive layer for jigs.

另一方面,就對環形框架等固定用夾具18之黏著性之觀點而言,夾具用黏著劑層之厚度較佳為5μm至200μm,尤佳為10μm至100μm。On the other hand, from the viewpoint of adhesiveness to the fixing jig 18 such as a ring frame, the thickness of the adhesive layer for the jig is preferably 5 μm to 200 μm, particularly preferably 10 μm to 100 μm.

樹脂膜形成用複合片101係以去掉剝離膜15之狀態於樹脂膜形成層13的第一面13a貼附工件的內面,進而將夾具用黏著劑層16的第一面16a貼附於環形框架等固定用夾具18而使用。The composite sheet 101 for forming a resin film is attached to the inner surface of the workpiece on the first surface 13a of the resin film forming layer 13 with the peeling film 15 removed, and then the first surface 16a of the adhesive layer 16 for the jig is attached to the ring. Use the jig 18 for fixing a frame or the like.

圖3係示意性地表示本實施形態之樹脂膜形成用複合片之另一例的剖面圖。 此處所示之樹脂膜形成用複合片102除了樹脂膜形成層之形狀及大小不同,且夾具用黏著劑層積層於黏著劑層的第一面而非樹脂膜形成層的第一面之方面以外,與圖2所示之樹脂膜形成用複合片101相同。 Fig. 3 is a cross-sectional view schematically showing another example of the composite sheet for forming a resin film according to this embodiment. In the resin film forming composite sheet 102 shown here, the shape and size of the resin film forming layer are different, and the adhesive for jigs is laminated on the first surface of the adhesive layer instead of the first surface of the resin film forming layer. Other than that, it is the same as the composite sheet 101 for resin film formation shown in FIG. 2 .

更具體而言,於樹脂膜形成用複合片102中,樹脂膜形成層23係積層於黏著劑層12的第一面12a的一部分區域、亦即黏著劑層12之寬度方向(圖3中之左右方向)的中央側之區域。進而,於黏著劑層12的第一面12a中未積層有樹脂膜形成層23之區域,以將樹脂膜形成層23自寬度方向之外側非接觸地包圍之方式積層有夾具用黏著劑層16。另外,於樹脂膜形成層23的與黏著劑層12側為相反側之面(於本說明書中,有時稱為「第一面」)23a、及夾具用黏著劑層16的第一面16a積層有剝離膜15。於樹脂膜形成層23的與第一面23a為相反側之面(於本說明書中,有時稱為「第二面」)23b設有支撐片10。More specifically, in the composite sheet 102 for forming a resin film, the resin film forming layer 23 is laminated on a part of the first surface 12a of the adhesive layer 12, that is, in the width direction of the adhesive layer 12 (in FIG. The area on the central side of the left-right direction). Furthermore, on the first surface 12a of the adhesive layer 12, the adhesive layer 16 for the jig is laminated so as to surround the resin film forming layer 23 from the outside in the width direction in a non-contact manner in a region where the resin film forming layer 23 is not laminated. . In addition, on the side opposite to the side of the adhesive layer 12 of the resin film forming layer 23 (in this specification, sometimes referred to as "the first side") 23a, and the first side 16a of the adhesive layer 16 for jigs A release film 15 is laminated. The support sheet 10 is provided on the surface (in this specification, it may be called a "2nd surface") 23b on the opposite side to the 1st surface 23a of the resin film formation layer 23. As shown in FIG.

圖4係示意性地表示本實施形態之樹脂膜形成用複合片之進而另一例的剖面圖。 此處所示之樹脂膜形成用複合片103除了不具備夾具用黏著劑層16之方面以外,與圖3所示之樹脂膜形成用複合片102相同。 Fig. 4 is a cross-sectional view schematically showing still another example of the composite sheet for forming a resin film according to the present embodiment. The composite sheet 103 for resin film formation shown here is the same as the composite sheet 102 for resin film formation shown in FIG. 3 except the point which does not have the adhesive agent layer 16 for jigs.

圖5係示意性地表示本實施形態之樹脂膜形成用複合片之進而另一例的剖面圖。 此處所示之樹脂膜形成用複合片104除了具備支撐片20代替支撐片10而構成之方面以外,與圖2所示之樹脂膜形成用複合片101相同。 Fig. 5 is a cross-sectional view schematically showing still another example of the composite sheet for forming a resin film according to the present embodiment. The composite sheet 104 for resin film formation shown here is the same as the composite sheet 101 for resin film formation shown in FIG. 2 except the point comprised with the support sheet 20 instead of the support sheet 10.

支撐片20係僅由基材11所構成。 亦即,樹脂膜形成用複合片104係將基材11及樹脂膜形成層13於這些之厚度方向積層而構成。 支撐片20的樹脂膜形成層13側之面(第一面)20a係與基材11之第一面11a相同。 基材11至少於該第一面11a中具有黏著性。 The supporting sheet 20 is only composed of the base material 11 . That is, the composite sheet 104 for resin film formation is comprised by laminating|stacking the base material 11 and the resin film formation layer 13 in the thickness direction of these. The surface (first surface) 20 a of the support sheet 20 on the side of the resin film forming layer 13 is the same as the first surface 11 a of the base material 11 . The substrate 11 has adhesiveness at least in the first surface 11a.

本實施形態之樹脂膜形成用複合片不限定於圖2至圖5所示,亦可於不損及本發明功效之範圍內,將圖2至圖5所示之樹脂膜形成用複合片的一部分構成變更或刪除,或對至此為止所說明之樹脂膜形成用複合片進一步追加其他構成。The composite sheet for forming a resin film in this embodiment is not limited to those shown in FIGS. 2 to 5 , and the composite sheet for forming a resin film shown in FIGS. Some configurations may be changed or deleted, or other configurations may be further added to the composite sheet for resin film formation described so far.

○樹脂膜形成層 前述樹脂膜形成層係於具樹脂膜之晶片的製造方法中貼附於工件的內面而使用。樹脂膜形成層較佳為用於保護工件或將前述工件加以分割所得之晶片的內面之保護膜形成膜。 ○Resin film forming layer The aforementioned resin film-forming layer is used by being attached to the inner surface of a workpiece in a method of manufacturing a wafer with a resin film. The resin film forming layer is preferably a protective film forming film for protecting the inner surface of a wafer obtained by dividing the workpiece or the workpiece.

藉由使用具備前述支撐片及前述樹脂膜形成層之前述樹脂膜形成用複合片或前述套件,而可藉由後述之具樹脂膜之晶片的製造方法來製造具備晶片及設置於前述晶片的內面之樹脂膜的具樹脂膜之晶片。By using the above-mentioned resin film-forming composite sheet or the above-mentioned set provided with the above-mentioned supporting sheet and the above-mentioned resin film forming layer, it is possible to manufacture a chip having a chip and an inner chip provided on the chip by the method of manufacturing a chip with a resin film described later. Wafer with resin film on the surface of the resin film.

於前述樹脂膜形成層為保護膜形成膜時,藉由使用具備前述支撐片及前述保護膜形成膜之前述保護膜形成用複合片或前述套件,而可藉由後述之具樹脂膜之晶片的製造方法來製造具備晶片及設置於前述晶片的內面之保護膜的具保護膜之晶片。When the aforementioned resin film-forming layer is a protective film-forming film, by using the aforementioned protective-film-forming composite sheet or the aforementioned set provided with the aforementioned support sheet and the aforementioned protective film-forming film, the wafer with the resin film described later can be formed. A manufacturing method for manufacturing a wafer with a protective film comprising a wafer and a protective film provided on the inner surface of the wafer.

進而,藉由使用前述具樹脂膜之晶片,可製造基板裝置。 於本說明書中,所謂「基板裝置」,意指將具樹脂膜之晶片於該晶片之電路面上的突狀電極中覆晶連接於電路基板上之連接墊而構成的裝置。例如,若為使用半導體晶圓作為晶圓之情形,則作為基板裝置可列舉半導體裝置。 Furthermore, by using the aforementioned wafer with a resin film, a substrate device can be manufactured. In this specification, the term "substrate device" refers to a device configured by flip-chip connection of a chip with a resin film on the protruding electrodes on the circuit surface of the chip to the connection pads on the circuit board. For example, when a semiconductor wafer is used as the wafer, a semiconductor device may be cited as the substrate device.

前述樹脂膜形成層較佳為熱硬化性。樹脂膜形成層可使用樹脂膜形成用組成物而形成,尤其於樹脂膜形成層為熱硬化性之保護膜形成膜之情形時,保護膜形成膜可使用以下將說明之保護膜形成用組成物(III-1)而形成。The aforementioned resin film forming layer is preferably thermosetting. The resin film-forming layer can be formed using a composition for forming a resin film. In particular, when the resin film-forming layer is a thermosetting protective film-forming film, the composition for forming a protective film described below can be used for the protective film-forming film. (III-1) and formed.

[保護膜形成用組成物(III-1)] 作為樹脂膜形成用組成物,例如可列舉含有聚合物成分(A)及熱硬化性成分(B)之保護膜形成用組成物(III-1)(於本說明書中,有時簡稱為「保護膜形成用組成物(III-1)」)等。 [Protective film forming composition (III-1)] Examples of the composition for forming a resin film include composition (III-1) for forming a protective film containing a polymer component (A) and a thermosetting component (B). Composition for film formation (III-1)") and the like.

[聚合物成分(A)] 聚合物成分(A)為用以對熱硬化性保護膜形成膜賦予造膜性或可撓性等之聚合物化合物。 保護膜形成用組成物(III-1)及熱硬化性保護膜形成膜所含有之聚合物成分(A)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些聚合物成分(A)之組合及比率可任意地選擇。 [Polymer component (A)] The polymer component (A) is a polymer compound for imparting film-forming properties, flexibility, etc. to a thermosetting protective film-forming film. The polymer component (A) contained in the protective film-forming composition (III-1) and the thermosetting protective film-forming film may be only one kind, or may be two or more kinds, and in the case of two or more kinds, these The combination and ratio of the polymer component (A) can be selected arbitrarily.

聚合物成分有時亦相當於硬化性成分。於本說明書中,於保護膜形成組成物含有此種相當於聚合物成分及硬化性成分兩者之成分之情形時,視為保護膜形成組成物含有聚合物成分及硬化性成分。A polymer component may also correspond to a hardening component. In this specification, when the protective film forming composition contains such components corresponding to both the polymer component and the curable component, it is considered that the protective film forming composition contains the polymer component and the curable component.

作為聚合物成分,可使用丙烯酸樹脂、胺基甲酸酯樹脂、苯氧樹脂、聚矽氧樹脂、飽和聚酯樹脂等。作為聚合物成分,可較佳地使用丙烯酸樹脂。As the polymer component, acrylic resins, urethane resins, phenoxy resins, silicone resins, saturated polyester resins, and the like can be used. As the polymer component, an acrylic resin can be preferably used.

聚合物成分之重量平均分子量(Mw)較佳為1萬至200萬,更佳為10萬至120萬。若聚合物成分之重量平均分子量為上述下限值以上,則有相對於支撐片10之密接性容易下降之傾向,能夠降低支撐片與保護膜之密接性。若聚合物成分之重量平均分子量為上述上限值以下,則能夠提高支撐片與保護膜形成膜之密接性。The weight average molecular weight (Mw) of the polymer component is preferably from 10,000 to 2 million, more preferably from 100,000 to 1.2 million. When the weight average molecular weight of a polymer component is more than the said lower limit, it exists in the tendency for the adhesiveness with respect to the support sheet 10 to fall easily, and the adhesiveness of a support sheet and a protective film can be reduced. The adhesiveness of a support sheet and a protective film forming film can be improved that the weight average molecular weight of a polymer component is below the said upper limit.

聚合物成分之玻璃轉移溫度(Tg)較佳為處於-60℃至50℃之範圍,進而佳為處於-50℃至40℃之範圍,尤佳為處於-40至30℃之範圍。 若聚合物成分之玻璃轉移溫度為上述下限值以上,則能夠降低支撐片與保護膜之密接性。若聚合物成分之玻璃轉移溫度為上述上限值以下,則能夠提高支撐片與保護膜形成膜之密接性,而且,可降低製成輥體而保護膜形成膜撓曲時產生破裂(裂縫)之風險。 The glass transition temperature (Tg) of the polymer component is preferably in the range of -60°C to 50°C, more preferably in the range of -50°C to 40°C, particularly preferably in the range of -40 to 30°C. When the glass transition temperature of a polymer component is more than the said lower limit, the adhesiveness of a support sheet and a protective film can be reduced. When the glass transition temperature of the polymer component is below the above-mentioned upper limit, the adhesion between the support sheet and the protective film forming film can be improved, and the occurrence of cracks (cracks) when the protective film forming film is bent when it is formed into a roll body can be reduced. risk.

就黏著性、接著性及造膜性之觀點而言,相對於保護膜形成膜總重量100質量份,聚合物成分之較佳含量為5質量份至50質量份、10質量份至45質量份、14質量份至40質量份、18質量份至35質量份。From the viewpoint of adhesiveness, adhesion and film-forming properties, the preferred content of the polymer component is 5 to 50 parts by mass, 10 to 45 parts by mass relative to 100 parts by mass of the total weight of the protective film forming film , 14 to 40 parts by mass, and 18 to 35 parts by mass.

構成聚合物成分之樹脂之玻璃轉移溫度(Tg)可使用以下所示之Fox式進行計算而求出。 1/Tg=(W1/Tg1)+(W2/Tg2)+…+(Wm/Tgm)(式中,Tg為構成聚合物成分之樹脂之玻璃轉移溫度,Tg1、Tg2、…Tgm為成為構成聚合物成分之樹脂之原料的各單體之均聚物之玻璃轉移溫度,W1、W2、…Wm為各單體之質量分率。其中,W1+W2+…+Wm=1)。 前述Fox之式中的各單體之均聚物之玻璃轉移溫度可使用高分子資料-手冊、黏著手冊或聚合物手冊(Polymer Handbook)等所記載之值。例如,關於均聚物之玻璃轉移溫度,丙烯酸甲酯為10℃,甲基丙烯酸甲酯為105℃,丙烯酸正丁酯為-54℃,丙烯酸2-乙基己酯為-70℃,甲基丙烯酸縮水甘油酯為41℃,丙烯酸2-羥基乙酯為-15℃。 The glass transition temperature (Tg) of the resin constituting the polymer component can be calculated using the Fox formula shown below. 1/Tg=(W1/Tg1)+(W2/Tg2)+...+(Wm/Tgm) (In the formula, Tg is the glass transition temperature of the resin that constitutes the polymer component, and Tg1, Tg2,...Tgm are the constituent polymers The glass transition temperature of the homopolymer of each monomer of the raw material of the resin, W1, W2, ... Wm is the mass fraction of each monomer. Among them, W1 + W2 + ... + Wm = 1). The glass transition temperature of the homopolymer of each monomer in the aforementioned Fox's formula can use the value described in Polymer Data-Handbook, Adhesive Handbook, or Polymer Handbook. For example, regarding the glass transition temperature of homopolymer, methyl acrylate is 10°C, methyl methacrylate is 105°C, n-butyl acrylate is -54°C, 2-ethylhexyl acrylate is -70°C, methyl Glycidyl acrylate is 41°C, and 2-hydroxyethyl acrylate is -15°C.

作為構成上述丙烯酸樹脂之單體,可列舉(甲基)丙烯酸酯單體或其衍生物。例如,可列舉烷基之碳數為1至18的(甲基)丙烯酸烷基酯,具體可列舉:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸2-乙基己酯等。而且,可列舉具有環狀骨架之(甲基)丙烯酸酯,具體可列舉:(甲基)丙烯酸環己酯、(甲基)丙烯酸苄酯、(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊酯、(甲基)丙烯酸二環戊烯酯、(甲基)丙烯酸二環戊烯氧基乙酯、醯亞胺(甲基)丙烯酸酯等。進而,作為含官能基單體,可列舉具有羥基之(甲基)丙烯酸羥基甲酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸2-羥基丙酯等;此外,可列舉具有環氧基之(甲基)丙烯酸縮水甘油酯等。關於丙烯酸樹脂,含有具羥基之構成單元之丙烯酸聚合物係與後述之硬化性成分之互溶性良好,故而較佳。而且,上述丙烯酸聚合物亦可共聚有丙烯酸、甲基丙烯酸、伊康酸、乙酸乙烯酯、丙烯腈、苯乙烯等。As a monomer which comprises the said acrylic resin, (meth)acrylate monomer or its derivative(s) are mentioned. For example, alkyl (meth)acrylates having an alkyl group having 1 to 18 carbon atoms, specifically methyl (meth)acrylate, ethyl (meth)acrylate, propyl (meth)acrylate , Butyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, etc. In addition, examples include (meth)acrylates having a cyclic skeleton, specifically cyclohexyl (meth)acrylate, benzyl (meth)acrylate, isobornyl (meth)acrylate, (meth) Dicyclopentyl acrylate, dicyclopentenyl (meth)acrylate, dicyclopentenyloxyethyl (meth)acrylate, imide (meth)acrylate, and the like. Furthermore, examples of functional group-containing monomers include hydroxymethyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, and 2-hydroxypropyl (meth)acrylate having a hydroxyl group; Glycidyl (meth)acrylate having an epoxy group, etc. As for the acrylic resin, an acrylic polymer containing a structural unit having a hydroxyl group has good compatibility with a curable component described later, and is therefore preferable. Furthermore, the above-mentioned acrylic polymer may be copolymerized with acrylic acid, methacrylic acid, itaconic acid, vinyl acetate, acrylonitrile, styrene, and the like.

[硬化性成分] 硬化性成分例如可使用熱硬化性成分(B)。藉此,可將保護膜形成膜設為熱硬化性。 [hardening ingredients] As the curable component, for example, a thermosetting component (B) can be used. Thereby, the protective film forming film can be made thermosetting.

藉由使用熱硬化性之保護膜形成膜,即便使保護膜形成膜厚膜化亦能夠容易地進行熱硬化,故而可實現保護性能良好之保護膜形成膜之厚膜化。於加熱硬化步驟中,能夠實現多數個工件之一次性硬化。By using a thermosetting protective film forming film, even if the protective film forming film is thickened, thermosetting can be easily performed, so that a protective film forming film having good protective performance can be thickened. In the heat hardening step, one-time hardening of multiple workpieces can be achieved.

作為熱硬化性成分,可使用熱硬化樹脂及熱硬化劑。作為熱硬化樹脂,例如較佳為環氧樹脂。As the thermosetting component, a thermosetting resin and a thermosetting agent can be used. As the thermosetting resin, for example, epoxy resin is preferable.

作為環氧樹脂,可使用先前公知之環氧樹脂。作為環氧樹脂,具體可列舉:多官能環氧樹脂或聯苯化合物、雙酚A二縮水甘油醚或其氫化物、鄰甲酚酚醛清漆環氧樹脂、二環戊二烯型環氧樹脂、聯苯型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、伸苯基骨架型環氧樹脂等之於分子中具有二官能以上之環氧化合物。這些可單獨使用一種或組合使用兩種以上。As the epoxy resin, previously known epoxy resins can be used. Specific examples of the epoxy resin include polyfunctional epoxy resins or biphenyl compounds, bisphenol A diglycidyl ether or hydrogenated products thereof, o-cresol novolac epoxy resins, dicyclopentadiene epoxy resins, Biphenyl type epoxy resin, bisphenol A type epoxy resin, bisphenol F type epoxy resin, phenylene skeleton type epoxy resin, etc. have more than two functional epoxy compounds in the molecule. These can be used alone or in combination of two or more.

相對於保護膜形成膜總重量100質量份,熱硬化性成分之較佳含量較佳為1質量份至75質量份,更佳為2質量份至60質量份,進而佳為3質量份至50質量份,例如亦可為4質量份至40質量份,亦可為5質量份至35質量份,亦可為6質量份至30質量份。 若熱硬化樹脂之含量為上述下限值以上,則保護膜可獲得與工件之充分之接著性,保護膜保護工件之性能優異,若為上述上限值以下,則以輥體之形式保管時之保管穩定性優異。 The preferred content of the thermosetting component is preferably 1 to 75 parts by mass, more preferably 2 to 60 parts by mass, and still more preferably 3 to 50 parts by mass relative to 100 parts by mass of the total weight of the protective film forming film. Parts by mass may be, for example, 4 to 40 parts by mass, 5 to 35 parts by mass, or 6 to 30 parts by mass. If the content of the thermosetting resin is more than the above lower limit, the protective film can obtain sufficient adhesion with the workpiece, and the protective film can protect the workpiece excellently. If it is below the above upper limit, it can be stored in the form of a roll The storage stability is excellent.

熱硬化劑作為對熱硬化樹脂、尤其是環氧樹脂之硬化劑發揮功能。作為較佳之熱硬化劑,可舉出於一分子中具有兩個以上之可與環氧基反應之官能基的化合物。作為該官能基,可列舉酚性羥基、醇性羥基、胺基、羧基及酸酐等。這些當中,較佳可列舉酚性羥基、胺基、酸酐等,進而佳可列舉酚性羥基、胺基。The thermosetting agent functions as a curing agent for thermosetting resins, especially epoxy resins. As a preferable thermosetting agent, the compound which has two or more functional groups which can react with an epoxy group in one molecule is mentioned. As this functional group, a phenolic hydroxyl group, an alcoholic hydroxyl group, an amino group, a carboxyl group, an acid anhydride, etc. are mentioned. Among these, preferable examples include phenolic hydroxyl groups, amino groups, acid anhydrides, and the like, and more preferable examples include phenolic hydroxyl groups and amino groups.

作為酚系硬化劑之具體例,可列舉多官能酚樹脂、聯苯酚、酚醛清漆型酚樹脂、二環戊二烯系酚樹脂、Xyloc型酚樹脂、芳烷基酚樹脂。作為胺系硬化劑之具體例,可列舉DICY(Dicyandiamide;二氰二胺)。這些可單獨使用一種,或混合使用兩種以上。Specific examples of the phenolic curing agent include polyfunctional phenolic resins, biphenols, novolak-type phenolic resins, dicyclopentadiene-based phenolic resins, Xyloc-type phenolic resins, and aralkylphenolic resins. As a specific example of the amine-based curing agent, DICY (Dicyandiamide; dicyandiamide) is mentioned. These may be used alone or in combination of two or more.

相對於熱硬化樹脂100質量份,熱硬化劑之含量較佳為0.1質量份至500質量份,更佳為1質量份至200質量份。若熱硬化劑之含量為上述下限值以上則充分硬化而可獲得接著性,若為上述上限值以下則保護膜之吸濕率得到抑制,工件與保護膜之接著可靠性提高。The content of the thermosetting agent is preferably from 0.1 to 500 parts by mass, more preferably from 1 to 200 parts by mass, relative to 100 parts by mass of the thermosetting resin. If the content of the thermosetting agent is more than the above lower limit, it will be sufficiently hardened to obtain adhesiveness, and if it is below the above upper limit, the moisture absorption rate of the protective film will be suppressed, and the adhesion reliability between the workpiece and the protective film will be improved.

保護膜形成用組成物(III-1)亦可含有能量線硬化性成分。作為能量線硬化性成分,可使用包含能量線聚合性基且若受到紫外線、電子束等能量線之照射則聚合硬化之低分子化合物(能量線聚合性化合物)。作為此種能量線硬化性成分,具體可列舉:三羥甲基丙烷三丙烯酸酯、季戊四醇三丙烯酸酯、季戊四醇四丙烯酸酯、二季戊四醇單羥基五丙烯酸酯、二季戊四醇六丙烯酸酯或1,4-丁二醇二丙烯酸酯、1,6-己二醇二丙烯酸酯、聚乙二醇二丙烯酸酯、寡聚酯丙烯酸酯、丙烯酸胺基甲酸酯系寡聚物、環氧改質丙烯酸酯、聚醚丙烯酸酯及伊康酸寡聚物等之丙烯酸酯系化合物。此種化合物於分子內具有至少一個聚合性雙鍵,通常重量平均分子量為100至30000,較佳為300至10000左右。相對於保護膜形成膜總重量100質量份,能量線硬化性成分之較佳含量較佳為1質量份至30質量份,更佳為5質量份至25質量份。The composition (III-1) for forming a protective film may contain an energy ray curable component. As the energy ray curable component, a low molecular weight compound (energy ray polymerizable compound) that contains an energy ray polymerizable group and is polymerized and hardened upon irradiation with energy rays such as ultraviolet rays and electron beams can be used. Specific examples of such energy ray-curing components include trimethylolpropane triacrylate, pentaerythritol triacrylate, pentaerythritol tetraacrylate, dipentaerythritol monohydroxypentaacrylate, dipentaerythritol hexaacrylate, or 1,4- Butylene glycol diacrylate, 1,6-hexanediol diacrylate, polyethylene glycol diacrylate, oligoester acrylate, urethane acrylate oligomer, epoxy modified acrylate, Acrylate compounds such as polyether acrylate and itaconic acid oligomers. Such compounds have at least one polymerizable double bond in the molecule, and usually have a weight average molecular weight of 100 to 30,000, preferably about 300 to 10,000. The preferred content of the energy ray curable component is preferably from 1 to 30 parts by mass, more preferably from 5 to 25 parts by mass, based on 100 parts by mass of the total weight of the protective film forming film.

而且,亦可使用於聚合物成分之主鏈或側鏈鍵結有能量線聚合性基而成之能量線硬化型聚合物作為能量線硬化性成分。此種能量線硬化型聚合物兼具作為聚合物成分之功能、與作為硬化性成分之功能。Furthermore, an energy ray-curable polymer in which energy ray-polymerizable groups are bonded to the main chain or side chain of the polymer component can also be used as the energy ray-curable component. Such an energy ray-curable polymer has both a function as a polymer component and a function as a curable component.

能量線硬化型聚合物之主骨架並無特別限定,亦可為作為聚合物成分而通用之丙烯酸聚合物,而且亦可為聚酯、聚醚等,就合成及物性之控制容易之方面而言,尤佳為以丙烯酸聚合物作為主骨架。The main skeleton of the energy ray curable polymer is not particularly limited, and it may be an acrylic polymer commonly used as a polymer component, and may also be polyester, polyether, etc., in terms of ease of synthesis and control of physical properties , especially preferably acrylic polymer as the main skeleton.

鍵結於能量線硬化型聚合物之主鏈或側鏈的能量線聚合性基例如為能量線聚合性之包含碳-碳雙鍵的基,具體可例示(甲基)丙烯醯基等。能量線聚合性基亦可經由伸烷基、伸烷氧基、聚伸烷氧基而鍵結於能量線硬化型聚合物。The energy ray polymerizable group bonded to the main chain or side chain of the energy ray curable polymer is, for example, an energy ray polymerizable group containing a carbon-carbon double bond, specifically a (meth)acryl group and the like can be exemplified. The energy ray polymerizable group may also be bonded to the energy ray curable polymer via an alkylene group, an alkyleneoxy group, or a polyalkylene group.

能量線硬化型聚合物之重量平均分子量(Mw)較佳為1萬至200萬,更佳為10萬至150萬。而且,能量線硬化型聚合物之玻璃轉移溫度(Tg)較佳為處於-60℃至50℃之範圍,進而佳為處於-50℃至40℃之範圍,尤佳為處於-40℃至30℃之範圍。The weight average molecular weight (Mw) of the energy ray curable polymer is preferably from 10,000 to 2 million, more preferably from 100,000 to 1.5 million. Moreover, the glass transition temperature (Tg) of the energy ray curable polymer is preferably in the range of -60°C to 50°C, more preferably in the range of -50°C to 40°C, and especially preferably in the range of -40°C to 30°C. ℃ range.

能量線硬化型聚合物例如係使含有羥基、羧基、胺基、經取代之胺基、環氧基等官能基之丙烯酸樹脂與含聚合性基之化合物反應而獲得,該含聚合性基之化合物係於每一分子具有1個至5個與該官能基反應之取代基及能量線聚合性碳-碳雙鍵。作為與該官能基反應之取代基,可列舉異氰酸酯基、縮水甘油基、羧基等。Energy ray-curable polymers are obtained, for example, by reacting acrylic resins containing functional groups such as hydroxyl groups, carboxyl groups, amino groups, substituted amino groups, and epoxy groups with polymerizable group-containing compounds. Each molecule has 1 to 5 substituents reactive with the functional group and energy ray polymerizable carbon-carbon double bonds. As a substituent which reacts with this functional group, an isocyanate group, a glycidyl group, a carboxyl group etc. are mentioned.

作為含聚合性基之化合物,可列舉:(甲基)丙烯醯氧基乙基異氰酸酯、間-異丙烯基-α,α-二甲基苄基異氰酸酯、(甲基)丙烯醯基異氰酸酯、烯丙基異氰酸酯、(甲基)丙烯酸縮水甘油酯;(甲基)丙烯酸等。Examples of polymerizable group-containing compounds include: (meth)acryloxyethyl isocyanate, m-isopropenyl-α,α-dimethylbenzyl isocyanate, (meth)acryl isocyanate, alkene Propyl isocyanate, glycidyl (meth)acrylate; (meth)acrylic acid, etc.

丙烯酸樹脂較佳為由具有羥基、羧基、胺基、經取代之胺基、環氧基等官能基之(甲基)丙烯酸單體或其衍生物與能夠和其共聚之其他(甲基)丙烯酸酯單體或其衍生物所構成之共聚物。The acrylic resin is preferably composed of (meth)acrylic monomers or their derivatives with functional groups such as hydroxyl, carboxyl, amino, substituted amino, and epoxy groups and other (meth)acrylic acid that can be copolymerized with it A copolymer composed of ester monomers or their derivatives.

作為具有羥基、羧基、胺基、經取代之胺基、環氧基等官能基之(甲基)丙烯酸單體或其衍生物,例如可列舉:具有羥基之(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸2-羥基丙酯;具有羧基之丙烯酸、甲基丙烯酸、伊康酸;具有環氧基之甲基丙烯酸縮水甘油酯、丙烯酸縮水甘油酯等。Examples of (meth)acrylic monomers or derivatives thereof having functional groups such as hydroxyl groups, carboxyl groups, amino groups, substituted amino groups, and epoxy groups include 2-hydroxyethyl (meth)acrylates having hydroxyl groups. Esters, 2-hydroxypropyl (meth)acrylate; acrylic acid, methacrylic acid, and itaconic acid with carboxyl groups; glycidyl methacrylate and glycidyl acrylate with epoxy groups, etc.

作為能夠和上述單體共聚之其他(甲基)丙烯酸酯單體或其衍生物,例如可列舉:烷基之碳數為1至18的(甲基)丙烯酸烷基酯,具體而言可舉出(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸2-乙基己酯等;具有環狀骨架之(甲基)丙烯酸酯,具體而言可舉出(甲基)丙烯酸環己酯、(甲基)丙烯酸苄酯、丙烯酸異冰片酯、丙烯酸二環戊酯、丙烯酸二環戊烯酯、丙烯酸二環戊烯氧基乙酯、醯亞胺丙烯酸酯等。而且,於上述丙烯酸樹脂,亦可共聚有乙酸乙烯酯、丙烯腈、苯乙烯等。Examples of other (meth)acrylate monomers or derivatives thereof that can be copolymerized with the above-mentioned monomers include: alkyl (meth)acrylates having an alkyl group having 1 to 18 carbon atoms, specifically, Methyl (meth)acrylate, ethyl (meth)acrylate, propyl (meth)acrylate, butyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, etc.; have a ring skeleton The (meth)acrylates specifically include cyclohexyl (meth)acrylate, benzyl (meth)acrylate, isobornyl acrylate, dicyclopentanyl acrylate, dicyclopentenyl acrylate, acrylic acid Dicyclopentenyloxyethyl ester, imide acrylate, etc. Furthermore, vinyl acetate, acrylonitrile, styrene, etc. may be copolymerized with the said acrylic resin.

即便於使用能量線硬化型聚合物之情形時,亦可併用前述能量線聚合性化合物,另外亦可併用聚合物成分。Even when an energy ray-curable polymer is used, the aforementioned energy ray polymerizable compound may be used in combination, and a polymer component may also be used in combination.

保護膜形成膜可除了上述聚合物成分及硬化性成分以外,可包含下述成分。The protective film forming film may contain the following components in addition to the above-mentioned polymer component and curable component.

[著色劑] 保護膜形成膜較佳為含有著色劑。藉由將著色劑調配於保護膜形成膜,而能夠於將半導體裝置組入至機器時,遮蔽自周圍之裝置產生之紅外線等,防止由這些所致的半導體裝置之誤動作。形成有保護膜之半導體裝置或半導體晶片中,通常藉由雷射標記法於保護膜的表面進行產品編號等之印字,而藉由保護膜含有著色劑,可充分獲得保護膜的經雷射光標記之部分與並未標記之部分之對比度差,辨識性提高。作為著色劑,可使用有機或無機之顏料及染料。就耐熱性等觀點而言較佳為顏料。作為顏料,可使用碳黑、氧化鐵、二氧化錳、苯胺黑、活性炭等,但不限定於這些。其中,就操作性或分散性之觀點而言,尤佳為碳黑。著色劑可單獨使用一種,亦可組合使用兩種以上。 [Colorant] It is preferable that a protective film forming film contains a coloring agent. By mixing the coloring agent in the protective film forming film, it is possible to shield infrared rays and the like generated from surrounding devices when the semiconductor device is incorporated into equipment, and to prevent malfunction of the semiconductor device caused by these. In semiconductor devices or semiconductor wafers on which a protective film is formed, the product number and the like are usually printed on the surface of the protective film by a laser marking method, and the protective film can be sufficiently marked by laser light by containing a colorant in the protective film The contrast between the marked part and the unmarked part is poor, and the visibility is improved. As colorants, organic or inorganic pigments and dyes can be used. From the viewpoint of heat resistance and the like, a pigment is preferable. As the pigment, carbon black, iron oxide, manganese dioxide, nigrosine, activated carbon, etc. can be used, but not limited to these. Among them, carbon black is particularly preferable from the viewpoint of handleability and dispersibility. A coloring agent may be used individually by 1 type, and may use it in combination of 2 or more types.

相對於構成保護膜形成膜之總固形物100質量份,著色劑之含量較佳為0.05質量份至35質量份,進而佳為0.1質量份至25質量份,尤佳為0.2質量份至15質量份。The content of the coloring agent is preferably 0.05 to 35 parts by mass, more preferably 0.1 to 25 parts by mass, and most preferably 0.2 to 15 parts by mass relative to 100 parts by mass of the total solids constituting the protective film forming film share.

[硬化促進劑] 硬化促進劑係用於調整保護膜形成膜之硬化速度。硬化促進劑尤其可較佳地用於在熱硬化性成分(B)中併用環氧樹脂與熱硬化劑之情形。 [hardening accelerator] The hardening accelerator is used to adjust the hardening speed of the protective film forming film. In particular, a curing accelerator can be preferably used when an epoxy resin and a thermosetting agent are used in combination for the thermosetting component (B).

作為較佳之硬化促進劑,可列舉:三乙二胺、苄基二甲基胺、三乙醇胺、二甲基胺基乙醇、三(二甲基胺基甲基)苯酚等三級胺類;2-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑等咪唑類;三丁基膦、二苯基膦、三苯基膦等有機膦類;四苯基鏻四苯基硼酸鹽、三苯基膦四苯基硼酸鹽等四苯基硼鹽等。這些可單獨使用一種,或混合使用兩種以上。As preferred hardening accelerators, tertiary amines such as triethylenediamine, benzyldimethylamine, triethanolamine, dimethylaminoethanol, and tris(dimethylaminomethyl)phenol can be enumerated; 2 -Methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxy Imidazoles such as methylimidazole; organic phosphines such as tributylphosphine, diphenylphosphine, and triphenylphosphine; tetraphenylboron such as tetraphenylphosphonium tetraphenyl borate and triphenylphosphine tetraphenyl borate salt etc. These may be used alone or in combination of two or more.

相對於硬化性成分100質量份,以較佳為0.01質量份至10質量份、進而佳為0.1質量份至5質量份之量包含硬化促進劑。藉由以上述範圍之量含有硬化促進劑,即便暴露於高溫度高濕度下亦具有優異之接著特性,即便於暴露於嚴酷之回流條件之情形時,亦能夠達成高的接著可靠性。The curing accelerator is contained in an amount of preferably 0.01 to 10 parts by mass, more preferably 0.1 to 5 parts by mass, relative to 100 parts by mass of the curable component. By containing the hardening accelerator in the amount within the above range, it has excellent adhesive properties even when exposed to high temperature and high humidity, and high adhesive reliability can be achieved even when exposed to severe reflow conditions.

[偶合劑] 偶合劑亦可用於提高保護膜對工件之接著可靠性。而且,藉由使用偶合劑,可不損及使保護膜形成膜硬化而得之保護膜之耐熱性,而提高該保護膜之耐水性。 [Coupling agent] The coupling agent can also be used to improve the adhesion reliability of the protective film to the workpiece. Furthermore, by using a coupling agent, the water resistance of the protective film can be improved without impairing the heat resistance of the protective film obtained by curing the protective film forming film.

作為偶合劑,可較佳地使用具有與聚合物成分、硬化性成分等所具有之官能基反應之基的化合物。作為偶合劑,較理想為矽烷偶合劑。作為此種偶合劑,可列舉:γ-縮水甘油氧基丙基三甲氧基矽烷、γ-縮水甘油氧基丙基甲基二乙氧基矽烷、β-(3,4-環氧環己基)乙基三甲氧基矽烷、γ-(甲基丙烯醯氧基丙基)三甲氧基矽烷、γ-胺基丙基三甲氧基矽烷、N-6-(胺基乙基)-γ-胺基丙基三甲氧基矽烷、N-6-(胺基乙基)-γ-胺基丙基甲基二乙氧基矽烷、N-苯基-γ-胺基丙基三甲氧基矽烷、γ-脲基丙基三乙氧基矽烷、γ-巰基丙基三甲氧基矽烷、γ-巰基丙基甲基二甲氧基矽烷、雙(3-三乙氧基矽烷基丙基)四硫化物、甲基三甲氧基矽烷、甲基三乙氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙醯氧基矽烷、咪唑矽烷等。這些可單獨使用一種,或混合使用兩種以上。As the coupling agent, a compound having a group reactive with a functional group contained in a polymer component, a curable component, or the like can be preferably used. As the coupling agent, a silane coupling agent is preferable. Examples of such coupling agents include: γ-glycidoxypropyltrimethoxysilane, γ-glycidoxypropylmethyldiethoxysilane, β-(3,4-epoxycyclohexyl) Ethyltrimethoxysilane, γ-(methacryloxypropyl)trimethoxysilane, γ-aminopropyltrimethoxysilane, N-6-(aminoethyl)-γ-amino Propyltrimethoxysilane, N-6-(aminoethyl)-γ-aminopropylmethyldiethoxysilane, N-phenyl-γ-aminopropyltrimethoxysilane, γ- Ureidopropyltriethoxysilane, γ-mercaptopropyltrimethoxysilane, γ-mercaptopropylmethyldimethoxysilane, bis(3-triethoxysilylpropyl)tetrasulfide, Methyltrimethoxysilane, methyltriethoxysilane, vinyltrimethoxysilane, vinyltriacetyloxysilane, imidazole silane, etc. These may be used alone or in combination of two or more.

相對於聚合物成分及硬化性成分之合計100質量份,通常以0.1質量份至20質量份、較佳為0.2質量份至10質量份、更佳為0.3質量份至5質量份之比率包含偶合劑。若偶合劑之含量未達0.1質量份,則有可能無法獲得上述效果,若超過20質量份,則有可能成為逸氣之原因。With respect to the total of 100 parts by mass of the polymer component and the curable component, it is usually contained in a ratio of 0.1 to 20 parts by mass, preferably 0.2 to 10 parts by mass, more preferably 0.3 to 5 parts by mass. mixture. If the content of the coupling agent is less than 0.1 parts by mass, the above effects may not be obtained, and if it exceeds 20 parts by mass, it may cause outgassing.

[填充材] 藉由將填充材調配於保護膜形成膜,而能夠調整硬化後之保護膜之熱膨脹係數,藉由相對於半導體晶片使硬化後之保護膜之熱膨脹係數最適化,而能夠提高工件與保護膜之接著可靠性。作為填充材,較佳為無機填充材。而且,亦能夠降低硬化後之保護膜之吸濕率。 [Filler] The thermal expansion coefficient of the cured protective film can be adjusted by mixing the filler in the protective film forming film, and the thermal expansion coefficient of the cured protective film can be optimized with respect to the semiconductor wafer, and the workpiece and the protective film can be improved. Then reliability. As a filler, an inorganic filler is preferable. Moreover, the moisture absorption rate of the cured protective film can also be reduced.

作為較佳之無機填充材,可列舉:二氧化矽、氧化鋁、滑石、碳酸鈣、氧化鈦、氧化鐵、碳化矽、氮化硼等之粉末;將這些球形化而得之珠粒;單晶纖維及玻璃纖維等。這些當中,較佳為二氧化矽填料及氧化鋁填料。上述無機填充材可單獨使用或混合使用兩種以上。相對於構成保護膜形成膜之總固形物100質量份,無機填充材之含量亦可設為1質量份至85質量份,亦可設為5質量份至80質量份,亦可設為10質量份至75質量份,亦可設為20質量份至70質量份,亦可設為30質量份至66質量份。 藉由將無機填充材之含量設為上述上限值以下,而能夠降低製成輥體而使保護膜形成膜撓曲時產生破裂(裂縫)之風險,藉由設為上述下限值以上,而能夠提高保護膜之耐熱性。 Examples of preferable inorganic fillers include: powders of silicon dioxide, alumina, talc, calcium carbonate, titanium oxide, iron oxide, silicon carbide, boron nitride, etc.; beads obtained by spheroidizing these; single crystal fiber and glass fiber etc. Among these, silica fillers and alumina fillers are preferable. These inorganic fillers may be used alone or in combination of two or more. The content of the inorganic filler may be 1 to 85 parts by mass, 5 to 80 parts by mass, or 10 parts by mass relative to 100 parts by mass of the total solids constituting the protective film forming film. Parts to 75 parts by mass, may also be set to 20 parts by mass to 70 parts by mass, or may be set to 30 parts by mass to 66 parts by mass. By setting the content of the inorganic filler below the above-mentioned upper limit, the risk of cracks (cracks) occurring when the protective film-forming film is deflected by forming a roll body can be reduced, and by setting it above the above-mentioned lower limit, And can improve the heat resistance of the protective film.

[光聚合起始劑] 於保護膜形成膜含有能量線硬化性成分之情形時,於使用該保護膜形成膜時,照射紫外線等能量線,使能量線硬化性成分硬化。此時,藉由使該組成物中含有光聚合起始劑,而能夠減少聚合硬化時間及光線照射量。 [Photopolymerization Initiator] When the protective film-forming film contains an energy ray-curable component, when the protective film is used to form a film, energy rays such as ultraviolet rays are irradiated to cure the energy ray-curable component. At this time, by including a photopolymerization initiator in the composition, it is possible to reduce the polymerization hardening time and the amount of light exposure.

作為此種光聚合起始劑,具體可列舉:二苯甲酮、苯乙酮、安息香、安息香甲醚、安息香乙醚、安息香異丙醚、安息香異丁醚、安息香苯甲酸、安息香苯甲酸甲酯、安息香二甲基縮酮、2,4-二乙基噻噸酮、α-羥基環己基苯基酮、苄基二苯基硫醚、一硫化四甲基秋蘭姆、偶氮雙異丁腈、苯偶醯、二苯偶醯、二乙醯、1,2-二苯基甲烷、2-羥基-2-甲基-1-[4-(1-甲基乙烯基)苯基]丙酮、2,4,6-三甲基苯甲醯基二苯基氧化膦及β-氯蒽醌等。光聚合起始劑可單獨使用一種或組合使用兩種以上。Specific examples of such photopolymerization initiators include benzophenone, acetophenone, benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzoin benzoic acid, and benzoin methyl benzoate. , benzoin dimethyl ketal, 2,4-diethylthioxanthone, α-hydroxycyclohexyl phenyl ketone, benzyl diphenyl sulfide, tetramethylthiuram monosulfide, azobisisobutyl Nitrile, benzoyl, dibenzoyl, diacetyl, 1,2-diphenylmethane, 2-hydroxy-2-methyl-1-[4-(1-methylvinyl)phenyl]acetone , 2,4,6-trimethylbenzoyldiphenylphosphine oxide and β-chloroanthraquinone, etc. A photopolymerization initiator can be used individually by 1 type or in combination of 2 or more types.

關於光聚合起始劑之調配比率,相對於能量線硬化性成分100質量份,較佳為包含0.1質量份至10質量份之光聚合起始劑,更佳為包含1質量份至5質量份之光聚合起始劑。若為上述下限值以上,則能夠進行光聚合而獲得令人滿意之保護性能,若為上述上限值以下,則能夠抑制無助於光聚合之殘留物之生成而使保護膜形成膜之硬化性充分。The compounding ratio of the photopolymerization initiator is preferably 0.1 to 10 parts by mass of the photopolymerization initiator, more preferably 1 to 5 parts by mass, with respect to 100 parts by mass of the energy ray curable component. The photopolymerization initiator. If it is more than the above lower limit, photopolymerization can be carried out to obtain satisfactory protective performance, and if it is below the above upper limit, the generation of residues that do not contribute to photopolymerization can be suppressed and the protective film can be formed into a film. Fully hardened.

[交聯劑] 為了調節保護膜形成膜相對於工件之黏著力及凝聚性,亦可添加交聯劑。作為交聯劑,可列舉有機多元異氰酸酯化合物、有機多元亞胺化合物等。 [Crosslinking agent] In order to adjust the adhesion and cohesion of the protective film forming film relative to the workpiece, a crosslinking agent can also be added. As a crosslinking agent, an organic polyvalent isocyanate compound, an organic polyvalent imine compound, etc. are mentioned.

作為上述有機多元異氰酸酯化合物,可列舉:芳香族多元異氰酸酯化合物、脂肪族多元異氰酸酯化合物、脂環族多元異氰酸酯化合物及這些有機多元異氰酸酯化合物之三聚物、以及使這些有機多元異氰酸酯化合物與多元醇化合物反應而得之末端異氰酸酯胺基甲酸酯預聚物等。Examples of the organic polyisocyanate compound include aromatic polyisocyanate compounds, aliphatic polyisocyanate compounds, alicyclic polypolyisocyanate compounds, trimers of these organic polyisocyanate compounds, and combinations of these organic polyisocyanate compounds and polyol compounds. The terminal isocyanate urethane prepolymer obtained by reaction, etc.

作為有機多元異氰酸酯化合物,例如可列舉:2,4-甲苯二異氰酸酯、2,6-甲苯二異氰酸酯、1,3-二甲苯二異氰酸酯、1,4-二甲苯二異氰酸酯、二苯基甲烷-4,4’-二異氰酸酯、二苯基甲烷-2,4’-二異氰酸酯、3-甲基二苯基甲烷二異氰酸酯、六亞甲基二異氰酸酯、異佛爾酮二異氰酸酯、二環己基甲烷-4,4’-二異氰酸酯、二環己基甲烷-2,4’-二異氰酸酯、三羥甲基丙烷加合甲苯二異氰酸酯及離胺酸異氰酸酯。Examples of organic polyvalent isocyanate compounds include: 2,4-toluene diisocyanate, 2,6-toluene diisocyanate, 1,3-xylene diisocyanate, 1,4-xylene diisocyanate, diphenylmethane-4 ,4'-diisocyanate, diphenylmethane-2,4'-diisocyanate, 3-methyldiphenylmethane diisocyanate, hexamethylene diisocyanate, isophorone diisocyanate, dicyclohexylmethane- 4,4'-diisocyanate, dicyclohexylmethane-2,4'-diisocyanate, trimethylolpropane adducted toluene diisocyanate and lysine isocyanate.

作為上述有機多元亞胺化合物,可列舉:N,N’-二苯基甲烷-4,4’-雙(1-氮丙啶甲醯胺)、三羥甲基丙烷-三-β-氮丙啶基丙酸酯、四羥甲基甲烷-三-β-氮丙啶基丙酸酯及N,N’-甲苯-2,4-雙(1-氮丙啶甲醯胺)三伸乙基三聚氰胺等。Examples of the above-mentioned organic polyimine compounds include N,N'-diphenylmethane-4,4'-bis(1-aziridinecarboxamide), trimethylolpropane-tri-β-aziridine Pyridyl propionate, tetramethylolmethane-tri-β-aziridinyl propionate and N,N'-toluene-2,4-bis(1-aziridinecarboxamide) triethylene Melamine etc.

相對於聚合物成分及能量線硬化型聚合物之合計量100質量份,交聯劑通常係以0.01質量份至20質量份、較佳為0.1質量份至10質量份、更佳為0.5質量份至5質量份之比率使用。The amount of the crosslinking agent is usually 0.01 to 20 parts by mass, preferably 0.1 to 10 parts by mass, more preferably 0.5 parts by mass relative to 100 parts by mass of the total amount of the polymer component and the energy ray-curable polymer. Use at a ratio of up to 5 parts by mass.

[通用添加劑] 於保護膜形成膜中,亦可除了上述成分以外,根據需要調配有各種添加劑。 作為各種添加劑,可列舉:增黏劑、調平劑、塑化劑、抗靜電劑、抗氧化劑、離子捕捉劑、吸氣劑、鏈轉移劑等。 [General Additives] In addition to the above-mentioned components, various additives may be mix|blended as needed in a protective film forming film. Examples of various additives include thickeners, leveling agents, plasticizers, antistatic agents, antioxidants, ion scavengers, getters, chain transfer agents, and the like.

[溶媒] 保護膜形成組成物較佳為進而含有溶媒。含有溶媒之保護膜形成組成物係操作性變良好。 前述溶媒並無特別限定,作為較佳之溶媒,例如可列舉:甲苯、二甲苯等烴;甲醇、乙醇、2-丙醇、異丁基醇(2-甲基丙烷-1-醇)、1-丁醇等醇;乙酸乙酯等酯;丙酮、甲基乙基酮等酮;四氫呋喃等醚;二甲基甲醯胺、N-甲基吡咯啶酮等醯胺(具有醯胺鍵之化合物)等。 保護膜形成組成物所含有之溶媒可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些溶媒之組合及比率可任意地選擇。 [solvent] The protective film forming composition preferably further contains a solvent. The protective film-forming composition containing a solvent has better workability. The aforementioned solvents are not particularly limited, and as preferred solvents, for example, hydrocarbons such as toluene and xylene; methanol, ethanol, 2-propanol, isobutyl alcohol (2-methylpropan-1-ol), 1- Alcohols such as butanol; Esters such as ethyl acetate; Ketones such as acetone and methyl ethyl ketone; Ethers such as tetrahydrofuran; Amides such as dimethylformamide and N-methylpyrrolidone (compounds with amide bonds) Wait. The solvent contained in the protective film forming composition may be only one kind, or may be two or more kinds, and in the case of two or more kinds, the combination and ratio of these solvents can be selected arbitrarily.

保護膜形成組成物所含有之溶媒就能夠將組成物中之含有成分更均勻地混合之方面而言,較佳為甲基乙基酮等。The solvent contained in the protective film forming composition is preferably methyl ethyl ketone or the like at the point that the components contained in the composition can be more uniformly mixed.

塗佈由上述般之各成分所構成之保護膜形成組成物並加以乾燥而得之保護膜形成膜係具有黏著性及硬化性,以未硬化狀態壓接於工件。於壓接時,亦可將保護膜形成膜加熱。可繼而經過硬化而最終形成耐衝擊性高之保護膜,接著性亦優異,於嚴酷之高溫度高濕度條件下亦能夠保持充分之保護功能。再者,保護膜形成膜可為單層結構,另外只要包含一層以上的含有上述成分之層,則亦可為多層結構。The protective film-forming film obtained by applying the protective film-forming composition composed of the above-mentioned components and drying it has adhesiveness and curability, and is pressure-bonded to the workpiece in an uncured state. At the time of crimping, the protective film forming film may be heated. It can then be hardened to form a protective film with high impact resistance, excellent adhesiveness, and can maintain sufficient protection function under severe high temperature and high humidity conditions. In addition, the film for forming a protective film may have a single-layer structure, and may also have a multi-layer structure as long as it includes one or more layers containing the above-mentioned components.

保護膜形成膜之厚度並無特別限定,亦可設為3μm至300μm,亦可設為3μm至200μm,亦可設為5μm至100μm,亦可設為7μm至80μm,亦可設為10μm至70μm,亦可設為12μm至60μm,亦可設為15μm至50μm,亦可設為18μm至40μm,亦可設為20μm至30μm。 若保護膜形成膜之厚度為上述下限值以上,則能夠使保護膜之保護性能充分,若為上述上限值以下則能夠降低費用。 The thickness of the protective film forming film is not particularly limited, and may be 3 μm to 300 μm, 3 μm to 200 μm, 5 μm to 100 μm, 7 μm to 80 μm, or 10 μm to 70 μm , can also be set to 12 μm to 60 μm, can also be set to 15 μm to 50 μm, can also be set to 18 μm to 40 μm, and can also be set to 20 μm to 30 μm. When the thickness of the protective film formation film is more than the said lower limit, the protective performance of a protective film can be made sufficient, and when it is below the said upper limit, cost can be reduced.

○樹脂膜形成用組成物的製造方法 保護膜形成用組成物(III-1)等樹脂膜形成用組成物係藉由調配用以構成該組成物之各成分而獲得。 各成分之調配時之添加順序並無特別限定,亦可同時添加兩種以上之成分。 於使用溶媒之情形時,可藉由將溶媒與溶媒以外之任一調配成分混合而將該調配成分預先稀釋而使用,亦可不將溶媒以外之任一調配成分預先稀釋,而藉由將溶媒與這些調配成分混合而使用。 於調配時混合各成分之方法並無特別限定,只要自下述方法等公知之方法中適當選擇:使攪拌子或攪拌翼等旋轉而進行混合之方法;使用混合機進行混合之方法;施加超音波進行混合之方法。 各成分之添加及混合時之溫度及時間只要考慮各調配成分不易劣化之條件適當調節即可,溫度較佳為15℃至30℃。 ○Method for producing resin film-forming composition The composition for resin film formation, such as the composition for protective film formation (III-1), is obtained by preparing each component which comprises this composition. The order of addition of each component is not particularly limited, and two or more components may be added at the same time. In the case of using a solvent, it may be used by mixing the solvent with any formulation component other than the solvent and then diluting the formulation component beforehand, or by diluting any formulation component other than the solvent in advance. These preparation components are mixed and used. The method of mixing the ingredients during preparation is not particularly limited, as long as it is appropriately selected from known methods such as the following methods: a method of mixing by rotating a stirring bar or a stirring blade; a method of mixing by using a mixer; A method of mixing sound waves. The temperature and time during the addition and mixing of each component can be adjusted appropriately considering the conditions that the components are not easy to deteriorate. The temperature is preferably 15°C to 30°C.

◇樹脂膜形成用複合片的製造方法 前述樹脂膜形成用複合片可藉由下述方式製造:將上述各層以成為對應之位置關係之方式積層,根據需要調節一部分或所有層之形狀。各層之形成方法如上文所說明。 ◇Manufacturing method of composite sheet for resin film formation The above-mentioned composite sheet for forming a resin film can be produced by laminating the above-mentioned layers in a corresponding positional relationship, and adjusting the shape of some or all of the layers as necessary. The formation method of each layer is as described above.

可於已積層於基材上之黏著劑層之上,進而塗敷樹脂膜形成用組成物,直接形成樹脂膜形成層。如此,於已積層於基材上之任一層(以下有時簡稱為「第一層」)上形成新的層(以下簡稱為「第二層」)而形成連續兩層之積層結構(換言之,第一層及第二層之積層結構)之情形時,可應用下述方法:於前述第一層上塗敷用以形成前述第二層之組成物,根據需要加以乾燥。 然而,第二層較佳為使用用以形成該第二層之組成物而預先形成於剝離膜上,將該已形成之第二層中的與接觸於前述剝離膜之側為相反側之露出面來與第一層的露出面貼合,藉此形成連續兩層之積層結構。此時,前述組成物較佳為塗敷於剝離膜之剝離處理面。剝離膜只要於形成積層結構後,根據需要而去掉即可。 此處,列舉於黏著劑層上積層樹脂膜形成層之情形為例,但例如於黏著劑層上積層樹脂膜形成層以外之層(膜)之情形等時,成為對象之積層結構可任意選擇。 The resin film-forming composition can be further coated on the adhesive layer that has been laminated on the base material to directly form the resin film-forming layer. In this way, a new layer (hereinafter referred to as "second layer") is formed on any layer that has been laminated on the substrate (hereinafter referred to as "first layer") to form a continuous two-layer laminated structure (in other words, In the case of the laminated structure of the first layer and the second layer), the following method can be applied: the composition for forming the second layer is applied on the first layer, and dried as necessary. However, the second layer is preferably formed in advance on the release film using a composition for forming the second layer, and the side opposite to the side contacting the release film in the formed second layer is exposed. The surface is attached to the exposed surface of the first layer, thereby forming a laminated structure of two consecutive layers. In this case, the aforementioned composition is preferably applied to the release-treated surface of the release film. What is necessary is just to remove a peeling film as needed after forming a laminated structure. Here, the case where a resin film-forming layer is laminated on an adhesive layer is exemplified, but for example, when a layer (film) other than a resin film-forming layer is laminated on an adhesive layer, the target laminated structure can be selected arbitrarily. .

如此,構成樹脂膜形成用複合片之基材以外之層均能夠藉由預先形成於剝離膜上並貼合於目標層的表面之方法來積層,故而只要根據需要適當選擇採用此種步驟之層而製造樹脂膜形成用複合片即可。In this way, the layers other than the base material constituting the composite sheet for forming a resin film can be laminated by forming in advance on the release film and sticking to the surface of the target layer. What is necessary is just to manufacture the composite sheet for resin film formation.

再者,樹脂膜形成用複合片通常係以於該樹脂膜形成用複合片的與支撐片為相反側之最表層(例如樹脂膜形成層)的表面貼合有剝離膜之狀態保管。因此,於該剝離膜(較佳為該剝離膜之剝離處理面)上塗敷樹脂膜形成用組成物,根據需要加以乾燥,藉此於剝離膜上預先形成樹脂膜形成層,於該樹脂膜形成層的與接觸於剝離膜之側為相反側的露出面上,藉由上述任一方法積層其餘各層,不將剝離膜去掉而保持貼合之狀態,藉此可獲得具剝離膜之樹脂膜形成用複合片。In addition, the composite sheet for resin film formation is normally stored with the peeling film attached to the surface of the outermost layer (for example, resin film formation layer) of the composite sheet for resin film formation on the side opposite to a support sheet. Therefore, a resin film-forming composition is applied on the release film (preferably, the release-treated surface of the release film) and dried if necessary, thereby forming a resin film-forming layer on the release film in advance, and forming a resin film on the release film. On the exposed surface of the layer opposite to the side that is in contact with the release film, the remaining layers are laminated by any of the above methods, and the release film is not removed and kept in a bonded state, thereby obtaining a resin film with a release film. Use composite sheets.

於前述樹脂膜形成層為保護膜形成膜時,可獲得具備前述支撐片及前述保護膜形成膜之前述保護膜形成用複合片。When the said resin film forming layer is a protective film forming film, the said composite sheet for protective film formation provided with the said support sheet and the said protective film forming film can be obtained.

前述樹脂膜形成用複合片亦可為單片狀,較佳為輥狀。The aforementioned composite sheet for forming a resin film may be in the form of a single sheet, preferably in the form of a roll.

[套件] 本發明之實施形態之套件係具備:第一積層體,由第一剝離膜、樹脂膜形成層及第二剝離膜所依序積層而成;以及前述支撐片,用於支撐成為前述樹脂膜形成層之貼附對象的工件及前述樹脂膜形成層。 以下,一邊參照圖式一邊對本實施形態之套件1之例加以說明。 [kit] The kit according to the embodiment of the present invention is provided with: a first laminate formed by sequentially laminating a first release film, a resin film forming layer, and a second release film; The workpiece to which the layer is attached and the aforementioned resin film form a layer. Hereinafter, an example of the kit 1 of this embodiment will be described with reference to the drawings.

圖6係示意性地表示本實施形態之套件1之一例的剖面圖。 本實施形態之套件1係具備:第一積層體5,由第一剝離膜151、樹脂膜形成層13及第二剝離膜152所依序積層而成;以及支撐片10,用於支撐成為樹脂膜形成層13之貼附對象的工件及樹脂膜形成層13,支撐片10為上述本發明之實施形態之支撐片。 Fig. 6 is a cross-sectional view schematically showing an example of the kit 1 of this embodiment. The set 1 of this embodiment is provided with: a first laminated body 5, which is sequentially laminated by a first release film 151, a resin film forming layer 13, and a second release film 152; The work to which the film-forming layer 13 is attached, the resin film-forming layer 13, and the support sheet 10 are the above-mentioned support sheets in the embodiment of the present invention.

此處所示之樹脂膜形成層13於一面(本說明書中,有時稱為「第一面」)13a上具備第一剝離膜151,於與前述第一面13a為相反側之另一面(本說明書中,有時稱為「第二面」)13b上具備第二剝離膜152。The resin film-forming layer 13 shown here has a first release film 151 on one side (in this specification, sometimes referred to as "first side") 13a, and on the other side opposite to the first side 13a ( In this specification, it may be referred to as "the second surface") 13b is equipped with the second release film 152 .

於前述樹脂膜形成層為保護膜形成膜時,藉由使用具備前述支撐片10及前述保護膜形成膜之套件1,而能夠藉由後述之具樹脂膜之晶片的製造方法來製造具備晶片及設置於前述晶片的內面之保護膜的具保護膜之晶片。When the aforementioned resin film forming layer is a protective film forming film, by using the kit 1 provided with the aforementioned support sheet 10 and the aforementioned protective film forming film, a wafer having a wafer and A wafer with a protective film provided on the protective film on the inner surface of the aforementioned wafer.

此種樹脂膜形成層13例如適合以輥狀之形式保存。亦即,前述第一積層體較佳為輥狀。Such a resin film forming layer 13 is preferably stored in a roll form, for example. That is, the aforementioned first laminate is preferably in the shape of a roll.

樹脂膜形成層13可使用上述樹脂膜形成用組成物而形成。The resin film forming layer 13 can be formed using the composition for resin film formation mentioned above.

第一剝離膜151及第二剝離膜152均可為公知之剝離膜。 第一剝離膜151及第二剝離膜152可彼此相同,例如亦可為自樹脂膜形成層13剝離時所需要之剝離力互不相同等而互不相同。 Both the first release film 151 and the second release film 152 can be known release films. The 1st peeling film 151 and the 2nd peeling film 152 may mutually be the same, for example, the peeling force required when peeling from the resin film formation layer 13 may differ from each other, etc. and may be mutually different.

圖6所示之樹脂膜形成層13係將第一剝離膜151及第二剝離膜152的任一者去掉,所生成之露出面成為對工件(圖示省略)的內面之貼附面。另外,將第一剝離膜151及第二剝離膜152的剩餘的另一者去掉,所生成之露出面成為支撐片之貼附面。In the resin film forming layer 13 shown in FIG. 6 , either one of the first release film 151 and the second release film 152 is removed, and the resulting exposed surface becomes the sticking surface to the inner surface of the workpiece (not shown). In addition, the remaining one of the first release film 151 and the second release film 152 is removed, and the resulting exposed surface becomes the sticking surface of the support sheet.

圖6表示剝離膜設置於樹脂膜形成層13的兩面(第一面13a、第二面13b)之例,但剝離膜亦可僅設置於樹脂膜形成層13的任一面,亦即僅設置於第一面13a或僅設置於第二面13b。6 shows an example in which the release film is provided on both sides (first surface 13a, second surface 13b) of the resin film forming layer 13, but the release film may also be provided only on either side of the resin film forming layer 13, that is, only on the The first surface 13a is only provided on the second surface 13b.

本實施形態之套件1藉由併用樹脂膜形成層13及支撐片10,而能夠以線內製程一併進行樹脂膜形成層對工件之貼附、與此後之支撐片之貼附。此處,所謂「線內製程」,係指「於將進行一個或多個步驟之裝置連結多個(多台)而成之裝置內、或同一裝置內進行之製程,包含多個步驟及將該步驟與步驟相連之搬送,於一個步驟與後續之步驟之間一片一片地搬送工件」之製程。The kit 1 of the present embodiment uses the resin film forming layer 13 and the support sheet 10 together, so that the attachment of the resin film forming layer to the workpiece and the subsequent attachment of the support sheet can be carried out in an in-line process. Here, the so-called "in-line process" refers to "a process performed in a device formed by connecting multiple (multiple) devices that will perform one or more steps, or in the same device, including multiple steps and will The step-by-step transfer is the process of transferring workpieces one by one between one step and the subsequent step.

[具樹脂膜之晶片的製造方法] 上述本發明之實施形態之支撐片、具備前述支撐片之樹脂膜形成用複合片、及具備前述支撐片之套件1可用於具樹脂膜之晶片的製造方法,該具樹脂膜之晶片具備晶片、及設置於前述晶片的內面之樹脂膜。 [Manufacturing method of wafer with resin film] The support sheet according to the embodiment of the present invention described above, the composite sheet for forming a resin film provided with the support sheet, and the set 1 provided with the support sheet can be used in a method of manufacturing a wafer with a resin film comprising a wafer, And the resin film provided on the inner surface of the aforementioned wafer.

[製造方法1] 第一實施形態之製造方法係一種具樹脂膜之晶片的製造方法,前述具樹脂膜之晶片係具備晶片、及設置於前述晶片的內面之樹脂膜;並且,前述具樹脂膜之晶片的製造方法係具有下述步驟:於工件的內面貼附上述本發明之實施形態之樹脂膜形成用複合片中的樹脂膜形成層,藉此製作於前述支撐片上使得前述樹脂膜形成層及前述工件依序於這些之厚度方向積層而構成之第一積層複合片之步驟;以將前述第一積層複合片的周緣部貼附於固定用夾具之狀態,將前述第一積層複合片加熱,使前述樹脂膜形成層硬化形成前述樹脂膜,藉此製作於前述支撐片上使得前述樹脂膜及前述工件依序於這些之厚度方向積層而構成之第二積層複合片之步驟;將前述第二積層複合片冷卻,然後於前述支撐片上將前述第二積層複合片中的前述工件加以分割,切斷前述樹脂膜,藉此製作於前述支撐片上固定有多個具樹脂膜之晶片的第三積層複合片之步驟;以及,將前述第三積層複合片中的前述具樹脂膜之晶片自前述支撐片扯離,藉此拾取前述具樹脂膜之晶片之步驟。 以下,於本說明書中,有時將第一實施形態之製造方法稱為「製造方法1」。 [manufacturing method 1] The manufacturing method of the first embodiment is a method of manufacturing a wafer with a resin film, wherein the wafer with a resin film includes a wafer and a resin film provided on the inner surface of the wafer; and the manufacturing of the wafer with a resin film The method has the following steps: affixing the resin film forming layer in the resin film forming composite sheet according to the embodiment of the present invention to the inner surface of the workpiece, thereby manufacturing the resin film forming layer and the workpiece on the supporting sheet. The step of laminating the first laminated composite sheet sequentially in the thickness direction of these sheets; heating the first laminated composite sheet in a state where the peripheral portion of the first laminated composite sheet is attached to the jig for fixing, so that the The resin film forming layer is hardened to form the aforementioned resin film, thereby manufacturing a second laminated composite sheet formed by laminating the aforementioned resin film and the aforementioned workpiece sequentially in the thickness direction on the aforementioned support sheet; forming the aforementioned second laminated composite sheet After cooling, the aforementioned workpiece in the aforementioned second laminated composite sheet is divided on the aforementioned supporting sheet, and the aforementioned resin film is cut off, thereby making a third laminated composite sheet in which a plurality of wafers with resin films are fixed on the aforementioned supporting sheet. steps; and, a step of tearing the aforementioned wafer with the resin film in the aforementioned third laminated composite sheet from the aforementioned support sheet, thereby picking up the aforementioned wafer with the resin film. Hereinafter, in this specification, the manufacturing method of 1st Embodiment may be called "manufacturing method 1."

圖7A至圖7E係用以示意性地說明製造方法1的剖面圖。此處,列舉使用具備圖1所示之支撐片10的圖2之樹脂膜形成用複合片101之情形為例,對製造方法1加以說明。7A to 7E are cross-sectional views for schematically illustrating the manufacturing method 1 . Here, the case where the composite sheet 101 for resin film formation of FIG. 2 provided with the support sheet 10 shown in FIG. 1 is used is taken as an example, and manufacturing method 1 is demonstrated.

於製造方法1的製作前述第一積層複合片之步驟中,如圖7A所示,於工件9的內面9b貼附樹脂膜形成用複合片101中之樹脂膜形成層13,藉此製作於支撐片10上使得樹脂膜形成層13及工件9依序於這些之厚度方向積層而構成之第一積層複合片501。於工件9的內面9b貼附有樹脂膜形成用複合片101中的樹脂膜形成層13的第一面13a。In the step of producing the aforementioned first laminated composite sheet in the manufacturing method 1, as shown in FIG. On the supporting sheet 10, the resin film formation layer 13 and the workpiece|work 9 are laminated|stacked sequentially in the thickness direction of these and the 1st laminated composite sheet 501 which consists. The 1st surface 13a of the resin film formation layer 13 in the composite sheet 101 for resin film formation is stuck to the inner surface 9b of the work 9.

樹脂膜形成用複合片101中的樹脂膜形成層13向工件9之貼附可藉由公知之方法進行。例如,樹脂膜形成層13亦可一邊加熱一邊向工件9貼附。The resin film forming layer 13 in the resin film forming composite sheet 101 can be attached to the work 9 by a known method. For example, the resin film forming layer 13 may be attached to the workpiece 9 while heating.

繼而,於製造方法1的製作前述第二積層複合片之步驟中,以將第一積層複合片501的周緣部經由夾具用黏著劑層16貼附於環形框架等固定用夾具18之狀態,將第一積層複合片501加熱(圖7B)。藉此,使樹脂膜形成層13硬化形成樹脂膜13’,藉此如圖7C所示,製作由支撐片10、樹脂膜13’及工件9依序於這些之厚度方向所積層而構成之第二積層複合片502。Next, in the step of producing the aforementioned second laminated composite sheet in Manufacturing Method 1, the peripheral portion of the first laminated composite sheet 501 is attached to a fixing jig 18 such as a ring frame through the adhesive layer 16 for the jig. The first laminated composite sheet 501 is heated (FIG. 7B). In this way, the resin film forming layer 13 is hardened to form a resin film 13', and as shown in FIG. Two laminated composite sheet 502.

符號13a’表示樹脂膜13’中作為樹脂膜形成層13的第一面13a之面(於本說明書中,有時稱為「第一面」)。符號13b’表示樹脂膜13’中作為樹脂膜形成層13之第二面13b的面(於本說明書中,有時稱為「第二面」)。Reference numeral 13a' denotes a surface (in this specification, sometimes referred to as "the first surface") that is the first surface 13a of the resin film forming layer 13 in the resin film 13'. Reference numeral 13b' denotes a surface (in this specification, sometimes referred to as "the second surface") that is the second surface 13b of the resin film forming layer 13 in the resin film 13'.

關於樹脂膜形成層13之硬化,若係樹脂膜形成層13為熱硬化性之情形,則可藉由將樹脂膜形成層13加熱而硬化。The curing of the resin film forming layer 13 can be cured by heating the resin film forming layer 13 if the resin film forming layer 13 is thermosetting.

於樹脂膜形成層13為保護膜形成膜之情形時,可對圖7A所示之樹脂膜形成層13穿過支撐片10(穿透支撐片10)進行雷射照射而進行雷射標記,或者亦可對圖7C所示之樹脂膜13’穿過支撐片10(穿透支撐片10)進行雷射照射而進行雷射標記。In the case where the resin film-forming layer 13 is a protective film-forming film, laser marking can be performed by irradiating the resin film-forming layer 13 shown in FIG. Laser marking can also be performed by irradiating the resin film 13' shown in FIG. 7C through the support sheet 10 (penetrating the support sheet 10).

繼而,於製造方法1的製作前述第三積層複合片之步驟中,將第二積層複合片502冷卻,然後如圖7D所示,於支撐片10上將第二積層複合片502中的工件9加以分割,切斷樹脂膜13’。工件9係藉由分割而單片化,成為多個晶片90。Then, in the step of making the aforementioned third laminated composite sheet in Manufacturing Method 1, the second laminated composite sheet 502 is cooled, and then, as shown in FIG. 7D , the workpiece 9 in the second laminated composite sheet 502 is It is divided and the resin film 13' is cut. The workpiece 9 is divided into individual pieces to form a plurality of wafers 90 .

工件9之分割及樹脂膜13’之切斷只要藉由公知之方法進行即可。例如,可藉由刀片切割、利用雷射照射之雷射切割、或藉由噴附包含研磨劑之水而進行之水切割等各切割,而連續地進行工件9之分割及樹脂膜13’之切斷。 樹脂膜13’係不受切斷方法影響而沿著晶片90的外周切斷。 The division of the workpiece 9 and the cutting of the resin film 13' may be performed by known methods. For example, the division of the workpiece 9 and the separation of the resin film 13' can be continuously performed by blade cutting, laser cutting by laser irradiation, or water cutting by spraying water containing abrasives. cut off. The resin film 13' is cut along the outer periphery of the wafer 90 regardless of the cutting method.

如此,藉由分割工件9並切斷樹脂膜13’,而獲得具備晶片90及設置於晶片90的內面90b之切斷後之樹脂膜(於本說明書中,有時簡稱為「樹脂膜」)130’的多個具樹脂膜之晶片901。符號130b’表示切斷後之樹脂膜130’中作為樹脂膜13’的第二面13b’之面(於本說明書中,有時稱為「第二面」)。In this way, by dividing the workpiece 9 and cutting the resin film 13', a cut resin film including the wafer 90 and the inner surface 90b of the wafer 90 (in this specification, sometimes simply referred to as "resin film") is obtained. 130' a plurality of wafers 901 with resin film. Reference numeral 130b' denotes a surface (in this specification, sometimes referred to as "the second surface") that is the second surface 13b' of the resin film 13' in the cut resin film 130'.

於製造方法1的製作前述第三積層複合片之步驟中,藉由以上操作而製作於支撐片10上固定有這些多個具樹脂膜之晶片901的第三積層複合片503。In the step of manufacturing the aforementioned third laminated composite sheet in Manufacturing Method 1, the third laminated composite sheet 503 in which the plurality of chips 901 with resin films are fixed on the support sheet 10 is manufactured through the above operations.

繼而,於製造方法1的前述拾取之步驟中,如圖7E所示,將第三積層複合片503中的具樹脂膜之晶片901自支撐片10扯離,藉此拾取該具樹脂膜之晶片901。Then, in the aforementioned picking-up step of manufacturing method 1, as shown in FIG. 7E , the wafer 901 with the resin film in the third laminated composite sheet 503 is torn off from the supporting sheet 10, thereby picking up the wafer with the resin film 901.

本發明之實施形態之製造方法1由於支撐片10具有上述構成,故而即便以將第一積層複合片501的周緣部貼附於固定用夾具之狀態加熱,然後將第二積層複合片502冷卻,亦能夠消除第三積層複合片503之鬆弛之影響,提高拾取裝置之晶片之辨識性。Manufacturing method 1 according to the embodiment of the present invention, since the support sheet 10 has the above-mentioned structure, even if the peripheral portion of the first laminated composite sheet 501 is attached to the fixing jig and heated, and then the second laminated composite sheet 502 is cooled, Also, the influence of the slack of the third laminated composite sheet 503 can be eliminated, and the visibility of the chip of the pick-up device can be improved.

於前述拾取之步驟中,於具樹脂膜之晶片901中的樹脂膜130’的第二面130b’與支撐片10中的黏著劑層12的第一面12a之間產生剝離。In the aforementioned pick-up step, peeling occurs between the second surface 130b' of the resin film 130' in the wafer with resin film 901 and the first surface 12a of the adhesive layer 12 in the support sheet 10.

此處,表示使用真空筒夾等扯離機構7將具樹脂膜之晶片901沿箭頭P方向扯離之情形。再者,此處省略扯離機構7之剖面表示。 具樹脂膜之晶片901可藉由公知之方法拾取。 Here, a state in which the wafer 901 with the resin film is pulled off in the direction of the arrow P is shown using a pull-off mechanism 7 such as a vacuum collet. Furthermore, the sectional representation of the tear-off mechanism 7 is omitted here. The wafer 901 with the resin film can be picked up by a known method.

於黏著劑層12為能量線硬化性之情形時,於前述拾取之步驟中,亦可藉由對黏著劑層12照射能量線,而使黏著劑層12硬化形成硬化物(圖示省略)後,將具樹脂膜之晶片901自支撐片10扯離。於該情形時,於前述拾取之步驟中,於具樹脂膜之晶片901中的樹脂膜130’與支撐片10中的黏著劑層12之硬化物之間產生剝離。 於該情形時,黏著劑層12之硬化物與樹脂膜130’之間的黏著力小於黏著劑層12之硬化物與基材11之間的黏著力,故而能夠容易地拾取具樹脂膜之晶片901。 In the case where the adhesive layer 12 is energy ray curable, the adhesive layer 12 may be cured to form a hardened product (not shown) by irradiating the adhesive layer 12 with energy rays in the aforementioned picking-up step. , the wafer 901 with the resin film is pulled off from the supporting sheet 10 . In this case, peeling occurs between the resin film 130' in the wafer with resin film 901 and the cured product of the adhesive layer 12 in the support sheet 10 in the aforementioned pick-up step. In this case, the adhesive force between the cured product of the adhesive layer 12 and the resin film 130' is smaller than the adhesive force between the cured product of the adhesive layer 12 and the substrate 11, so the wafer with the resin film can be easily picked up. 901.

於本說明書中,即便於能量線硬化性黏著劑層進行能量線硬化之後,只要仍維持著基材與能量線硬化性黏著劑層之硬化物之積層結構,則將該積層結構體稱為「支撐片」。In this specification, even after energy ray curing of the energy ray-curable adhesive layer, as long as the laminated structure of the base material and the cured product of the energy ray-curable adhesive layer is maintained, the laminated structure is referred to as " support sheet".

另一方面,於黏著劑層12為非能量線硬化性之情形時,只要直接自黏著劑層12扯離具樹脂膜之晶片901即可,無需進行黏著劑層12之硬化,故而可藉由經簡化之步驟拾取具樹脂膜之晶片901。On the other hand, when the adhesive layer 12 is non-energy ray curable, the wafer 901 with the resin film can be directly pulled off from the adhesive layer 12 without hardening the adhesive layer 12. The wafer with resin film 901 is picked up in simplified steps.

前述拾取之步驟中,對作為目標之所有具樹脂膜之晶片901進行此種具樹脂膜之晶片901之拾取。In the aforementioned pick-up step, the pick-up of the wafers 901 with the resin film is carried out for all the wafers 901 with the resin film that are targeted.

於製造方法1中,藉由進行至前述拾取之步驟為止,而可獲得目標之具樹脂膜之晶片901。In Manufacturing Method 1, by proceeding up to the aforementioned pick-up step, the target wafer 901 with a resin film can be obtained.

至此為止之製造方法1之說明中,對使用圖2所示之具備支撐片10的樹脂膜形成用複合片101之情形的製造方法1進行了說明,但於製造方法1中,亦可使用圖3至圖5所示之樹脂膜形成用複合片102、樹脂膜形成用複合片103或樹脂膜形成用複合片104等樹脂膜形成用複合片101以外之本實施形態之樹脂膜形成用複合片。In the description of the production method 1 so far, the production method 1 in the case of using the resin film forming composite sheet 101 provided with the support sheet 10 shown in FIG. The resin film forming composite sheet of this embodiment other than the resin film forming composite sheet 101 such as the resin film forming composite sheet 102, the resin film forming composite sheet 103, or the resin film forming composite sheet 104 shown in FIG. 3 to FIG. .

[製造方法2] 第二實施形態之製造方法係一種具樹脂膜之晶片的製造方法,前述具樹脂膜之晶片係具備晶片、及設置於前述晶片的內面之樹脂膜;並且,前述具樹脂膜之晶片的製造方法係具有下述步驟:於工件的內面貼附上述本發明之實施形態之套件1中的樹脂膜形成層,製作使得前述樹脂膜形成層及工件於這些之厚度方向積層而構成之第一積層膜,進而於前述第一積層膜中的前述樹脂膜形成層貼附前述套件1中的支撐片之黏著劑層,藉此製作於前述支撐片上使得前述樹脂膜形成層及前述工件依序於這些之厚度方向積層而構成之第一積層複合片之步驟;以將前述第一積層複合片的周緣部貼附於固定用夾具之狀態,將前述第一積層複合片加熱,使前述樹脂膜形成層硬化形成前述樹脂膜,藉此製作於前述支撐片上使得前述樹脂膜及前述工件依序於這些之厚度方向積層而構成之第二積層複合片之步驟;將前述第二積層複合片冷卻,然後於前述支撐片上將前述第二積層複合片中的前述工件加以分割,切斷前述樹脂膜,藉此製作於前述支撐片上固定有多個具樹脂膜之晶片的第三積層複合片之步驟;以及,將前述第三積層複合片中的前述具樹脂膜之晶片自前述支撐片扯離,藉此拾取前述具樹脂膜之晶片之步驟。 以下,於本說明書中,有時將第二實施形態之製造方法稱為「製造方法2」。 [manufacturing method 2] The manufacturing method of the second embodiment is a method of manufacturing a wafer with a resin film, wherein the wafer with a resin film includes a wafer and a resin film provided on the inner surface of the wafer; and the manufacturing of the wafer with a resin film The method has the following steps: affix the resin film forming layer in the kit 1 of the embodiment of the present invention above to the inner surface of the workpiece, and manufacture the first resin film forming layer and the workpiece formed by laminating the above resin film forming layer and the workpiece in the thickness direction thereof. laminated film, and then attach the adhesive layer of the support sheet in the aforementioned kit 1 to the aforementioned resin film forming layer in the aforementioned first laminated film, thereby making the aforementioned resin film forming layer and the aforementioned workpiece sequentially on the aforementioned supporting sheet The step of forming the first laminated composite sheet formed by laminating these layers in the thickness direction: heating the first laminated composite sheet in a state where the peripheral portion of the first laminated composite sheet is attached to a fixing jig to form the resin film layer hardening to form the aforementioned resin film, thereby fabricating a second laminated composite sheet formed by laminating the aforementioned resin film and the aforementioned workpiece sequentially in the thickness direction on the aforementioned support sheet; cooling the aforementioned second laminated composite sheet, and then A step of dividing the aforementioned workpiece in the aforementioned second laminated composite sheet on the aforementioned supporting sheet, cutting the aforementioned resin film, thereby manufacturing a third laminated composite sheet having a plurality of wafers with resin films fixed on the aforementioned supporting sheet; and , a step of tearing off the aforementioned wafer with the resin film in the aforementioned third laminated composite sheet from the aforementioned support sheet, thereby picking up the aforementioned wafer with the resin film. Hereinafter, in this specification, the production method of the second embodiment may be referred to as "production method 2".

圖8及圖7A至圖7E係用以示意性地說明製造方法2的剖面圖。此處,列舉使用具備圖1所示之支撐片10的圖6之套件1之情形為例,對製造方法2加以說明。8 and 7A to 7E are cross-sectional views schematically illustrating the manufacturing method 2 . Here, the manufacturing method 2 will be described by taking, as an example, the case of using the kit 1 of FIG. 6 provided with the supporting sheet 10 shown in FIG. 1 .

於製造方法2的製作前述第一積層複合片之步驟中,首先於工件9的內面9b貼附前述套件1中的樹脂膜形成層13,藉此如圖8所示,製作使得樹脂膜形成層13及工件9於這些之厚度方向積層而構成之第一積層膜601。於該情形時,亦與製造方法1之情形同樣地,於工件9的內面9b貼附有第一積層體5中的樹脂膜形成層13的第一面13a。In the step of manufacturing the aforementioned first laminated composite sheet in the manufacturing method 2, first, the resin film forming layer 13 in the aforementioned kit 1 is pasted on the inner surface 9b of the workpiece 9, thereby as shown in FIG. The layer 13 and the workpiece 9 are laminated in the thickness direction of these first laminated films 601 . Also in this case, the first surface 13 a of the resin film forming layer 13 in the first laminate 5 is attached to the inner surface 9 b of the workpiece 9 in the same manner as in the case of the manufacturing method 1 .

此處,表示自圖6所示之套件1的第一積層體5去掉第一剝離膜151而將樹脂膜形成層13的第一面13a貼附於工件9的內面9b之情形,但亦可自圖6所示之套件1的樹脂膜形成層13去掉第二剝離膜152,將樹脂膜形成層13的第二面13b貼附於工件9的內面9b。亦可自第一剝離膜151之側將圓形之衝壓刀抵接於圖6所示之套件1的第一積層體5,使第一剝離膜151剝離,將樹脂膜形成層13的圓形之外側與第一剝離膜151一併去掉,將所得之圓形之樹脂膜形成層13的第一面13a貼附於工件9的內面9b。Here, the case where the first release film 151 is removed from the first laminated body 5 of the kit 1 shown in FIG. The second peeling film 152 can be removed from the resin film forming layer 13 of the kit 1 shown in FIG. It is also possible to abut a circular stamping knife against the first laminated body 5 of the kit 1 shown in FIG. The outer side is removed together with the first peeling film 151 , and the first surface 13 a of the obtained circular resin film forming layer 13 is attached to the inner surface 9 b of the workpiece 9 .

樹脂膜形成層13向工件9之貼附可藉由公知之方法進行。例如,樹脂膜形成層13亦可一邊加熱一邊向工件9貼附。The attachment of the resin film forming layer 13 to the workpiece 9 can be performed by a known method. For example, the resin film forming layer 13 may be attached to the workpiece 9 while heating.

繼而,於第一積層膜601中的樹脂膜形成層13貼附套件1中的支撐片10之黏著劑層12,藉此製作於支撐片10上使得樹脂膜形成層13及工件9依序於這些之厚度方向積層而構成之第一積層複合片501。Then, the adhesive layer 12 of the support sheet 10 in the kit 1 is attached to the resin film forming layer 13 in the first laminated film 601, thereby making the resin film forming layer 13 and the workpiece 9 on the support sheet 10 in sequence. The first laminated composite sheet 501 formed by laminating these in the thickness direction.

自第一積層膜601中的樹脂膜形成層13去掉第二剝離膜152。繼而,於藉此而新露出之樹脂膜形成層13的第二面13b,如圖7A所示,貼附支撐片10的一面10a。夾具用黏著劑層16亦可於此後設置。 此處所示之支撐片10係具備基材11、及設置於基材11的一面11a上之黏著劑層12而構成,將支撐片10中的黏著劑層12貼附於樹脂膜形成層13。黏著劑層12的樹脂膜形成層13側之第一面12a係與支撐片10的第一面10a相同。 The second release film 152 is removed from the resin film forming layer 13 in the first laminate film 601 . Next, on the second surface 13b of the resin film formation layer 13 newly exposed by this, as shown in FIG. 7A, the one surface 10a of the support sheet 10 is attached. The adhesive layer 16 for the jig can also be provided thereafter. The support sheet 10 shown here is composed of a base material 11 and an adhesive layer 12 provided on one side 11a of the base material 11, and the adhesive layer 12 in the support sheet 10 is attached to the resin film forming layer 13. . The first surface 12 a of the resin film forming layer 13 side of the adhesive layer 12 is the same as the first surface 10 a of the support sheet 10 .

於製造方法2中,第一積層複合片501係與製造方法1中之第一積層複合片501相同。In manufacturing method 2, the first laminated composite sheet 501 is the same as the first laminated composite sheet 501 in manufacturing method 1.

於製造方法2中,製作前述第二積層複合片之步驟可藉由與製造方法1中的製作第二積層複合片之步驟之情形相同的方法進行。In the production method 2, the step of producing the second laminated composite sheet can be performed by the same method as in the case of the step of producing the second laminated composite sheet in the production method 1.

於製造方法2中,製作前述第三積層複合片之步驟可藉由與製造方法1中的製作第三積層複合片之步驟之情形相同的方法進行。In Manufacturing Method 2, the step of producing the aforementioned third laminated composite sheet can be performed by the same method as in the case of the step of manufacturing the third laminated composite sheet in Manufacturing Method 1.

於製造方法2中,前述拾取之步驟可藉由與製造方法1的前述拾取之步驟相同的方法進行。In manufacturing method 2, the aforementioned picking-up step can be performed by the same method as the aforementioned picking-up step of manufacturing method 1.

於本發明之實施形態之製造方法2中,亦由於支撐片10具有上述構成,故而即便以將第一積層複合片501的周緣部貼附於固定用夾具之狀態來加熱,然後將第二積層複合片502冷卻,亦可消除第三積層複合片503之鬆弛之影響,提高拾取裝置之晶片之辨識性。In the manufacturing method 2 of the embodiment of the present invention, since the supporting sheet 10 has the above-mentioned structure, even if the peripheral portion of the first laminated composite sheet 501 is attached to the fixing jig and heated, the second laminated composite sheet 501 is then heated. The cooling of the composite sheet 502 can also eliminate the influence of the relaxation of the third laminated composite sheet 503 and improve the recognition of the chip in the pick-up device.

[製造方法3] 第三實施形態之製造方法係一種具樹脂膜之晶片的製造方法,前述具樹脂膜之晶片係具備晶片、及設置於前述晶片的內面之樹脂膜;並且,前述具樹脂膜之晶片的製造方法係具有下述步驟:於工件的內面貼附上述本發明之實施形態之樹脂膜形成用複合片中的樹脂膜形成層、或者於工件的內面貼附上述本發明之實施形態之套件1中的樹脂膜形成層,製作使得前述樹脂膜形成層及工件於這些之厚度方向積層而構成之第一積層膜,進而於前述第一積層膜中的前述樹脂膜形成層貼附前述套件1中的支撐片之黏著劑層,藉此製作於前述支撐片上使得前述樹脂膜形成層及前述工件依序於這些之厚度方向積層而構成之第一積層複合片之步驟;於前述支撐片上,將前述第一積層複合片中的前述工件加以分割,切斷前述樹脂膜形成層,藉此製作於前述支撐片上固定有多個具樹脂膜形成層之晶片的第四積層複合片之步驟;以將前述第四積層複合片的周緣部貼附於固定用夾具之狀態,將前述第四積層複合片加熱,進行冷卻,使前述第四積層複合片中的前述樹脂膜形成層硬化形成前述樹脂膜,藉此製作於前述支撐片上固定有多個具樹脂膜之晶片的第三積層複合片之步驟;以及,將第三積層複合片中的前述具樹脂膜之晶片自前述支撐片扯離,藉此拾取前述具樹脂膜之晶片之步驟。 以下,於本說明書中,有時將第三實施形態之製造方法稱為「製造方法3」。 [manufacturing method 3] The manufacturing method of the third embodiment is a manufacturing method of a wafer with a resin film, wherein the wafer with a resin film includes a wafer and a resin film provided on the inner surface of the wafer; and the manufacturing of the wafer with a resin film The method has the following steps: affixing the resin film forming layer of the resin film forming composite sheet according to the embodiment of the present invention to the inner surface of the workpiece, or affixing the kit according to the embodiment of the present invention to the inner surface of the workpiece. For the resin film forming layer in 1, a first laminated film formed by laminating the resin film forming layer and the workpiece in the thickness direction thereof is produced, and the kit 1 is attached to the resin film forming layer in the first laminated film The adhesive layer of the support sheet in the above-mentioned support sheet is made by making the first laminated composite sheet formed by laminating the aforementioned resin film forming layer and the aforementioned workpiece sequentially in the thickness direction of the aforementioned support sheet; on the aforementioned support sheet, The step of dividing the aforementioned workpiece in the aforementioned first laminated composite sheet, cutting the aforementioned resin film forming layer, thereby manufacturing a fourth laminated composite sheet in which a plurality of wafers having resin film forming layers are fixed on the aforementioned supporting sheet; The peripheral portion of the fourth laminated composite sheet is attached to the jig for fixing, and the fourth laminated composite sheet is heated and cooled to harden the resin film forming layer in the fourth laminated composite sheet to form the resin film, A step of manufacturing a third laminated composite sheet in which a plurality of chips with resin films are fixed on the aforementioned support sheet; and, tearing the aforementioned wafers with resin films in the third laminated composite sheet from the aforementioned support sheet, thereby The step of picking up the aforementioned wafer with resin film. Hereinafter, in this specification, the production method of the third embodiment may be referred to as "production method 3".

圖9A至圖9C及圖7D至圖7E係用以示意性地說明製造方法3的剖面圖。此處,列舉使用具備圖1所示之支撐片10的圖2之樹脂膜形成用複合片101之情形為例,對製造方法3加以說明。9A to 9C and 7D to 7E are cross-sectional views for schematically illustrating the manufacturing method 3 . Here, the manufacturing method 3 is demonstrated using the case where the composite sheet 101 for resin film formation of FIG. 2 provided with the support sheet 10 shown in FIG. 1 is used as an example.

於製造方法3的製作前述第一積層複合片之步驟中,如圖9A所示,於工件9的內面9b貼附樹脂膜形成用複合片101中的樹脂膜形成層13,藉此製作於支撐片10上使得樹脂膜形成層13及工件9依序於這些之厚度方向積層而構成之第一積層複合片501。 圖9A中之第一積層複合片501係與圖7A中之第一積層複合片501相同。 In the step of producing the aforementioned first laminated composite sheet in the manufacturing method 3, as shown in FIG. On the supporting sheet 10, the resin film formation layer 13 and the workpiece|work 9 are laminated|stacked sequentially in the thickness direction of these and the 1st laminated composite sheet 501 which consists. The first laminated composite sheet 501 in FIG. 9A is the same as the first laminated composite sheet 501 in FIG. 7A.

繼而,於製造方法3的製作前述第四積層複合片之步驟中,如圖9B所示,於支撐片10上將第一積層複合片501中的工件9加以分割,切斷樹脂膜形成層13。工件9係藉由分割而單片化,成為多個晶片90。Next, in the step of producing the aforementioned fourth laminated composite sheet in Manufacturing Method 3, as shown in FIG. . The workpiece 9 is divided into individual pieces to form a plurality of wafers 90 .

工件9之分割及樹脂膜形成層13之切斷只要藉由公知之方法進行即可。例如,藉由刀片切割、利用雷射照射之雷射切割、或藉由噴射含有研磨劑之水而進行之水切割等各切割,進行工件9之分割及樹脂膜形成層13之切斷,且樹脂膜形成層13之切斷係不受切斷方法影響而沿著晶片90的外周切斷。The division of the workpiece 9 and the cutting of the resin film forming layer 13 may be performed by known methods. For example, division of the workpiece 9 and cutting of the resin film formation layer 13 are performed by blade cutting, laser cutting using laser irradiation, or water cutting by spraying water containing abrasives, and the like, and The cutting of the resin film forming layer 13 is carried out along the outer periphery of the wafer 90 regardless of the cutting method.

如此,藉由分割工件9並切斷樹脂膜形成層13,而獲得具備晶片90及設置於晶片90的內面90b之切斷後之樹脂膜形成層(於本說明書中,有時簡稱為「樹脂膜形成層」)130的多個具樹脂膜形成層之晶片902。符號130b表示切斷後之樹脂膜形成層130中作為樹脂膜形成層13的第二面13b之面(於本說明書中,有時稱為「第二面」)。In this way, by dividing the workpiece 9 and cutting the resin film forming layer 13, the cut resin film forming layer (in this specification, sometimes simply referred to as "resin film forming layer" provided on the wafer 90 and the inner surface 90b of the wafer 90) is obtained. A plurality of wafers 902 having a resin film forming layer) 130. Reference numeral 130b represents a surface (in this specification, sometimes referred to as "the second surface") that is the second surface 13b of the resin film forming layer 13 in the resin film forming layer 130 after cutting.

於製造方法3的製作前述第四積層複合片之步驟中,藉由以上操作,而製作於支撐片10上固定有這些多個具樹脂膜形成層之晶片902的第四積層複合片504。In the step of producing the fourth laminated composite sheet in the manufacturing method 3, the fourth laminated composite sheet 504 in which the plurality of chips 902 having resin film forming layers are fixed on the support sheet 10 is produced through the above operations.

繼而,於製造方法3的製作前述第三積層複合片之步驟中,如圖9C所示,以將第四積層複合片504的周緣部貼附於環形框架等固定用夾具18之狀態,將第四積層複合片504加熱,進行冷卻,如圖7D所示,使第四積層複合片504中的樹脂膜形成層130硬化形成前述樹脂膜130'。Next, in the step of manufacturing the aforementioned third laminated composite sheet in Manufacturing Method 3, as shown in FIG. The four-laminated composite sheet 504 is heated and cooled, and as shown in FIG. 7D , the resin film forming layer 130 in the fourth laminated composite sheet 504 is cured to form the aforementioned resin film 130 ′.

於製造方法3中,第三積層複合片503係與製造方法1中的第三積層複合片503相同。In manufacturing method 3, the third laminated composite sheet 503 is the same as the third laminated composite sheet 503 in manufacturing method 1.

於製造方法3中,前述拾取之步驟可藉由與製造方法1的前述拾取之步驟相同的方法進行。In manufacturing method 3, the aforementioned picking-up step can be performed by the same method as the aforementioned picking-up step of manufacturing method 1.

於本發明之實施形態之製造方法3中,亦由於支撐片10具有上述構成,故而即便以將第四積層複合片504的周緣部貼附於環形框架等固定用夾具18之狀態加熱,然後將第三積層複合片503冷卻,亦能夠消除第三積層複合片503之鬆弛之影響,提高拾取裝置之晶片之辨識性。In the manufacturing method 3 of the embodiment of the present invention, since the supporting sheet 10 has the above-mentioned structure, even if the peripheral edge of the fourth laminated composite sheet 504 is attached to the fixing jig 18 such as a ring frame, it is heated, and then the The cooling of the third laminated composite sheet 503 can also eliminate the influence of the relaxation of the third laminated composite sheet 503, and improve the recognition of the chip of the pick-up device.

至此為止之製造方法3之說明中,對使用圖2所示之具備支撐片10之樹脂膜形成用複合片101之情形的製造方法3進行了說明,但於製造方法3中,亦可使用圖3至圖5所示之樹脂膜形成用複合片102、樹脂膜形成用複合片103或樹脂膜形成用複合片104等樹脂膜形成用複合片101以外之本實施形態之樹脂膜形成用複合片。In the description of the manufacturing method 3 so far, the manufacturing method 3 in the case of using the resin film forming composite sheet 101 provided with the support sheet 10 shown in FIG. The resin film forming composite sheet of this embodiment other than the resin film forming composite sheet 101 such as the resin film forming composite sheet 102, the resin film forming composite sheet 103, or the resin film forming composite sheet 104 shown in FIG. 3 to FIG. .

亦可於製造方法3的製作前述第一積層複合片之步驟中,使用圖6所示之套件1,於工件9的內面9b貼附前述套件1中的樹脂膜形成層13,藉此如圖8所示,製作使得樹脂膜形成層13及工件9於這些之厚度方向積層而構成之第一積層膜601,進而,於第一積層膜601中的樹脂膜形成層13貼附套件1中的支撐片10之黏著劑層12,藉此製作第一積層複合片501。It is also possible to use the kit 1 shown in FIG. 6 in the step of making the aforementioned first laminated composite sheet in the manufacturing method 3, and attach the resin film forming layer 13 in the aforementioned kit 1 to the inner surface 9b of the workpiece 9, thereby As shown in FIG. 8 , the first laminated film 601 formed by laminating the resin film forming layer 13 and the workpiece 9 in the thickness direction thereof is produced, and further, the resin film forming layer 13 in the first laminated film 601 is attached to the kit 1 Adhesive layer 12 of the support sheet 10, thereby making the first laminated composite sheet 501.

◇基板裝置的製造方法(具樹脂膜之晶片之使用方法) 藉由上述製造方法獲得具樹脂膜之晶片後,使用該具樹脂膜之晶片代替先前之具樹脂膜之晶片,除了該方面以外,可藉由與先前之基板裝置的製造方法相同之方法製造基板裝置。 ◇Manufacturing method of substrate device (method of using wafer with resin film) After obtaining a wafer with a resin film by the above-mentioned manufacturing method, the wafer with a resin film is used instead of the previous wafer with a resin film, except for this aspect, the substrate can be manufactured by the same method as the manufacturing method of the previous substrate device device.

例如,於前述樹脂膜形成層為保護膜形成膜、並且具樹脂膜之晶片為具保護膜之晶片之情形時,可列舉具有下述覆晶連接步驟之製造方法:將使用前述保護膜形成膜所得之具保護膜之晶片自支撐片拾取,使具樹脂膜之晶片上之突狀電極接觸於電路基板上之連接墊,藉此將前述突狀電極與前述電路基板上之連接墊加以電性連接。For example, when the aforementioned resin film-forming layer is a protective film-forming film, and the wafer with the resin film is a wafer with a protective film, a manufacturing method having the following step of flip-chip connection is enumerated: The resulting chip with protective film is picked up from the supporting sheet, so that the protruding electrodes on the chip with resin film contact the connection pads on the circuit substrate, thereby electrically connecting the protruding electrodes and the connection pads on the circuit substrate. connect.

於前述樹脂膜形成層為膜狀接著劑、且具樹脂膜之晶片為具膜狀接著劑之晶片之情形時,可列舉具有下述連接步驟之製造方法:將使用前述膜狀接著劑所得之具樹脂膜形成層之晶片自支撐片拾取,使所得之具樹脂膜之晶片經由前述膜狀接著劑接著於電路基板上。 [實施例] In the case where the aforementioned resin film forming layer is a film-like adhesive and the wafer with the resin film is a wafer with a film-like adhesive, a manufacturing method including the following steps of connecting: The wafer with the resin film forming layer is picked up from the supporting sheet, and the obtained wafer with the resin film is bonded on the circuit board through the aforementioned film-like adhesive. [Example]

以下,藉由具體實施例對本發明加以更詳細說明。然而,本發明不受以下所示之實施例之任何限定。Hereinafter, the present invention will be described in more detail by specific examples. However, this invention is not limited at all by the Example shown below.

[實施例1] 實施例1中,如以下般,製造圖1所示之支撐片10、及樹脂膜形成層為保護膜形成膜之圖2所示之樹脂膜形成用複合片101。 [Example 1] In Example 1, the support sheet 10 shown in FIG. 1 and the composite sheet 101 for resin film formation shown in FIG. 2 whose resin film formation layer is a protective film formation film were manufactured as follows.

(1)含有保護膜形成膜之第一積層體之製作 將以下之(a)至(g)之成分加以混合,以固形物濃度成為50質量%之方式以甲基乙基酮稀釋,製備保護膜形成用組成物。 (1) Fabrication of the first laminate including the protective film forming film The following components (a) to (g) were mixed, diluted with methyl ethyl ketone so that the solid content concentration became 50% by mass, and a composition for forming a protective film was prepared.

(a)聚合物成分:(甲基)丙烯酸酯共聚物(將丙烯酸正丁酯10質量份、丙烯酸甲酯70質量份、甲基丙烯酸縮水甘油酯5質量份及丙烯酸2-羥基乙酯15質量份加以共聚而得之共聚物,重量平均分子量:80萬,玻璃轉移溫度:-1℃)120質量份(固形物換算,以下相同) (b-1)熱硬化性成分:雙酚A型環氧樹脂(三菱化學股份有限公司製造,製品名「jER828」,環氧當量184g/eq至194g/eq)60質量份 (b-2)熱硬化性成分:雙酚A型環氧樹脂(三菱化學股份有限公司製造,製品名「jER1055」,環氧當量800g/eq至900g/eq)10質量份 (b-3)熱硬化性成分:二環戊二烯型環氧樹脂(大日本油墨化學工業股份有限公司製造,製品名「Epiclone HP-7200HH」,環氧當量255g/eq至260g/eq)30質量份 (c)熱活性潛伏性環氧樹脂硬化劑:二氰二胺(ADEKA股份有限公司製造,Adeka Hardener EH3636AS,活性氫量21g/eq)3質量份 (d)硬化促進劑:2-苯基-4,5-二羥基甲基咪唑(四國化成工業股份有限公司製造,製品名「Curezole 2PHZ」)3質量份 (e)填料:二氧化矽填料(雅都瑪(Admatechs)股份有限公司製造,製品名「SC2050MA」,平均粒徑:0.5μm)290質量份 (f)著色劑:碳黑(三菱化學股份有限公司製造,製品名「#MA650」,平均粒徑:28nm)1.2質量份 (g)矽烷偶合劑:(信越化學工業股份有限公司製造,製品名「KBM-403」)2質量份 (a) Polymer composition: (meth)acrylate copolymer (10 mass parts of n-butyl acrylate, 70 mass parts of methyl acrylate, 5 mass parts of glycidyl methacrylate and 15 mass parts of 2-hydroxyethyl acrylate 120 parts by mass (in terms of solid content, the same below) (b-1) Thermosetting component: 60 parts by mass of bisphenol A epoxy resin (manufactured by Mitsubishi Chemical Corporation, product name "jER828", epoxy equivalent 184g/eq to 194g/eq) (b-2) Thermosetting component: 10 parts by mass of bisphenol A epoxy resin (manufactured by Mitsubishi Chemical Corporation, product name "jER1055", epoxy equivalent 800g/eq to 900g/eq) (b-3) Thermosetting component: dicyclopentadiene type epoxy resin (manufactured by Dainippon Ink Chemical Industry Co., Ltd., product name "Epiclone HP-7200HH", epoxy equivalent 255g/eq to 260g/eq) 30 parts by mass (c) Thermally active latent epoxy resin hardener: 3 parts by mass of dicyandiamide (manufactured by ADEKA Co., Ltd., Adeka Hardener EH3636AS, active hydrogen content 21g/eq) (d) Hardening accelerator: 3 parts by mass of 2-phenyl-4,5-dihydroxymethylimidazole (manufactured by Shikoku Chemical Industry Co., Ltd., product name "Curezole 2PHZ") (e) Filler: Silica filler (manufactured by Admatechs Co., Ltd., product name "SC2050MA", average particle size: 0.5 μm) 290 parts by mass (f) Colorant: 1.2 parts by mass of carbon black (manufactured by Mitsubishi Chemical Co., Ltd., product name "#MA650", average particle diameter: 28 nm) (g) Silane coupling agent: (manufactured by Shin-Etsu Chemical Co., Ltd., product name "KBM-403") 2 parts by mass

準備於厚度38μm之聚對苯二甲酸乙二酯(PET)膜的單面形成有聚矽氧系之剝離劑層而成之第一剝離膜(琳得科(Lintec)股份有限公司製造,製品名「SP-PET381031」)、及於厚度38μm之PET膜的單面形成有聚矽氧系之剝離劑層而成之第二剝離膜(琳得科(Lintec)股份有限公司製造,製品名「SP-PET381130」)。The first release film (manufactured by Lintec Co., Ltd., manufactured by Lintec Co., Ltd.) was prepared by forming a polysiloxane-based release agent layer on one side of a polyethylene terephthalate (PET) film with a thickness of 38 μm. name "SP-PET381031"), and a second release film (manufactured by Lintec Co., Ltd., product name " SP-PET381130").

首先,於第一剝離膜的剝離面上利用刀式塗佈機塗佈前述保護膜形成用組成物,加以乾燥,形成厚度為25μm之保護膜形成膜。然後,於保護膜形成膜重疊第二剝離膜的剝離面而將兩者加以貼合,獲得由第一剝離膜、保護膜形成膜(厚度:25μm)及第二剝離膜所構成之積層體。該積層體為長條,捲取而製成輥狀之捲收體。First, the protective film-forming composition was coated on the peeling surface of the first peeling film with a knife coater, and dried to form a protective film-forming film with a thickness of 25 μm. Then, the peeling surface of the 2nd peeling film was laminated|stacked on the protective film forming film, and both were bonded, and the laminated body which consists of a 1st peeling film, a protective film forming film (thickness: 25 micrometers), and a 2nd peeling film was obtained. The laminated body is a long strip, which is rolled up to form a roll-shaped rolled-up body.

(2)包含支撐片之第二積層體之製作 將以下之(h)及(i)之成分加以混合,以固形物濃度成為25質量%之方式以甲基乙基酮稀釋,製備黏著劑組成物。 (2) Fabrication of the second laminate including the support sheet The following components (h) and (i) were mixed, and diluted with methyl ethyl ketone so that the solid content concentration became 25 mass %, and the adhesive agent composition was prepared.

(h)黏著主劑:(甲基)丙烯酸酯共聚物(將丙烯酸2-乙基己酯60質量份、甲基丙烯酸甲酯30質量份及丙烯酸2-羥基乙酯10質量份加以共聚而得之共聚物,重量平均分子量:60萬)100質量份 (i)交聯劑:三羥甲基丙烷之二甲苯二異氰酸酯加成物(三井武田化學股份有限公司製造,製品名「Takenate D110N」)20質量份 (h) Adhesive main agent: (meth)acrylate copolymer (obtained by copolymerizing 60 parts by mass of 2-ethylhexyl acrylate, 30 parts by mass of methyl methacrylate and 10 parts by mass of 2-hydroxyethyl acrylate Copolymer, weight average molecular weight: 600,000) 100 parts by mass (i) Crosslinking agent: xylene diisocyanate adduct of trimethylolpropane (manufactured by Mitsui Takeda Chemical Co., Ltd., product name "Takenate D110N") 20 parts by mass

作為剝離膜,準備於厚度38μm之PET膜的單面形成有聚矽氧系之剝離劑層而成之剝離膜(琳得科(Lintec)股份有限公司製造,製品名「SP-PET381031」)。As a release film, a release film (manufactured by Lintec Co., Ltd., product name "SP-PET381031") in which a silicone-based release agent layer was formed on one side of a PET film with a thickness of 38 μm was prepared.

作為支撐片之基材之材料,準備無荷重伸縮率為MD方向99%/CD方向99%、拉伸彈性模數為MD方向370MPa/CD方向350MPa、融點138℃之聚丙烯膜1(厚度:80μm)。針對前述聚丙烯膜1,僅於MD方向以溫度120℃、1分鐘、2N/m之張力進行延伸處理,製作基材。再者,無荷重伸縮率、拉伸彈性模數及融點之測定方法如後述之試驗例所示(以下相同)。As the material for the base material of the support sheet, prepare a polypropylene film 1 (thickness) with a no-load stretch rate of 99% in the MD direction/99% in the CD direction, a tensile modulus of 370 MPa in the MD direction/350 MPa in the CD direction, and a melting point of 138°C. : 80 μm). The aforementioned polypropylene film 1 was stretched only in the MD direction at a temperature of 120° C. for 1 minute and a tension of 2 N/m to produce a base material. In addition, the measuring methods of the no-load expansion rate, tensile elastic modulus, and melting point are as shown in the test example mentioned later (it is the same below).

首先,於剝離膜的剝離面上利用刀式塗佈機塗佈前述黏著劑組成物,於100℃乾燥1分鐘,形成厚度為5μm之黏著劑層。然後,於黏著劑層貼合上述基材,獲得由實施例1之支撐片及剝離膜所構成之第二積層體,前述實施例1之支撐片係由基材及黏著劑層所構成。該積層體為長條。然後,捲取積層體而製成輥狀之捲收體。First, the aforementioned adhesive composition was coated on the peeling surface of the release film with a knife coater, and dried at 100° C. for 1 minute to form an adhesive layer with a thickness of 5 μm. Then, the base material was pasted on the adhesive layer to obtain a second laminate composed of the support sheet and the release film of Example 1. The support sheet of Example 1 was composed of the base material and the adhesive layer. This laminate is a long strip. Then, the laminated body is wound up to form a roll-shaped wound body.

(3)包含夾具用黏著劑層16之第三積層體之製作 將以下之(j)及(k)之成分加以混合,以固形物濃度成為15質量%之方式以甲苯稀釋,製備夾具用黏著劑組成物。 (3) Fabrication of the third laminate including the adhesive layer 16 for jigs The following components (j) and (k) were mixed, diluted with toluene so that the solid content concentration became 15 mass %, and the adhesive composition for jigs was prepared.

(j)黏著主劑:(甲基)丙烯酸酯共聚物(將丙烯酸丁酯69.5質量份、丙烯酸甲酯30質量份、丙烯酸2-羥基乙酯0.5質量份加以共聚而得之共聚物,重量平均分子量:50萬)100質量份 (k)交聯劑:甲苯二異氰酸酯系交聯劑(東曹(Tosoh)股份有限公司製造,Coronate L)5質量份 (j) Adhesive main agent: (meth)acrylate copolymer (a copolymer obtained by copolymerizing 69.5 parts by mass of butyl acrylate, 30 parts by mass of methyl acrylate, and 0.5 parts by mass of 2-hydroxyethyl acrylate, weight average Molecular weight: 500,000) 100 parts by mass (k) Cross-linking agent: 5 parts by mass of toluene diisocyanate-based cross-linking agent (manufactured by Tosoh Co., Ltd., Coronate L)

準備於厚度38μm之PET膜的單面形成有聚矽氧系之剝離劑層而成之第一剝離膜及第二剝離膜(琳得科(Lintec)股份有限公司製造,製品名「SP-PET381031」)、及作為芯材之聚氯乙烯膜(岡本(Okamoto)股份有限公司製造,厚度:50μm)。Prepare the first release film and the second release film (manufactured by Lintec Co., Ltd., product name "SP-PET381031") formed by forming a polysiloxane-based release agent layer on one side of a PET film with a thickness of 38 μm. ”), and a polyvinyl chloride film (manufactured by Okamoto Co., Ltd., thickness: 50 μm) as a core material.

首先,於第一剝離膜的剝離面上利用刀式塗佈機塗佈前述夾具用黏著劑組成物,加以乾燥,形成厚度為5μm之第一黏著劑層。然後,於第一黏著劑層貼合上述芯材,獲得由芯材、第一黏著劑層及第一剝離膜所構成之積層體A。該積層體A為長條,捲取而製成輥狀之捲收體。First, the above-mentioned adhesive composition for jigs was coated with a knife coater on the peeling surface of the first release film, and dried to form a first adhesive layer with a thickness of 5 μm. Then, the above-mentioned core material was pasted on the first adhesive layer to obtain a laminate A composed of the core material, the first adhesive layer, and the first release film. This laminated body A is a long strip, and is wound up to form a roll-shaped rolled body.

繼而,於第二剝離膜的剝離面上,利用刀式塗佈機塗佈前述夾具用黏著劑組成物,加以乾燥,形成厚度為5μm之第二黏著劑層。然後,於第二黏著劑層貼合上述積層體A中之芯材露出之面,獲得由第一剝離膜/第一黏著劑層/芯材/第二黏著劑層/第二剝離膜所構成之第三積層體。該積層體為長條,捲取而製成輥狀之捲收體。Next, on the peeling surface of the second peeling film, the aforementioned adhesive composition for jigs was coated with a knife coater, and dried to form a second adhesive layer with a thickness of 5 μm. Then, attach the exposed surface of the core material in the above-mentioned laminate A to the second adhesive layer to obtain a composition consisting of the first release film/first adhesive layer/core material/second adhesive layer/second release film. The third layered body. The laminated body is a long strip, which is rolled up to form a roll-shaped rolled-up body.

(4)第四積層體之製作 自上述(1)所得之第一積層體剝離第二剝離膜,使保護膜形成膜露出。另一方面,自上述(2)所得之第二積層體將剝離膜加以剝離,使黏著劑層露出。以上述保護膜形成膜接觸該黏著劑層之方式,將第一積層體與第二積層體加以貼合,獲得由支撐片(由基材及黏著劑層所構成)、保護膜形成膜及第一剝離膜所積層而成之第四積層體。第四積層體為長條,捲取而製成輥狀之捲收體。 (4) Production of the fourth laminate The second release film was peeled off from the first laminate obtained in the above (1) to expose the protective film forming film. On the other hand, the release film was peeled off from the second laminate obtained in the above (2) to expose the adhesive layer. In such a manner that the above-mentioned protective film-forming film contacts the adhesive layer, the first laminate and the second laminate are bonded to obtain a support sheet (consisting of a base material and an adhesive layer), a protective film-forming film, and a second laminate. A fourth laminate formed by laminating a release film. The fourth laminate is a long strip, which is rolled up to form a roll-shaped roll-up body.

(5)保護膜形成用複合片之製作 自上述(3)所得之第三積層體剝離第二剝離膜,殘留第一剝離膜,將夾具用黏著劑層之內周緣加以半切(half cut),去除內側之圓形部分。此時,夾具用黏著劑層的內周緣之直徑設為345mm。 (5) Production of composite sheets for protective film formation The second release film was peeled off from the third laminate obtained in (3) above to leave the first release film, and the inner peripheral edge of the adhesive layer for jigs was half-cut to remove the inner circular portion. At this time, the diameter of the inner peripheral edge of the adhesive layer for jigs was set to 345 mm.

自上述(4)所得之第四積層體剝離第一剝離膜,將露出之保護膜形成膜與第三積層體中露出之夾具用黏著劑層加以重疊並壓接。然後,殘留第三積層體中之第一剝離膜,將保護膜形成用複合片的外周緣加以半切,去除外側之部分。此時,保護膜形成用複合片的外周緣之直徑設為370mm。The first release film was peeled off from the fourth laminate obtained in the above (4), and the exposed protective film forming film and the exposed clip adhesive layer in the third laminate were laminated and bonded under pressure. Then, the first release film in the third laminate was left, and the outer peripheral edge of the composite sheet for forming a protective film was half-cut to remove the outer part. At this time, the diameter of the outer peripheral edge of the composite sheet for protective film formation was 370 mm.

如此,獲得實施例1之保護膜形成用複合片,該實施例1之保護膜形成用複合片係由在基材之上積層有黏著劑層(厚度:5μm)而成之支撐片、積層於支撐片的黏著劑層側之保護膜形成膜、積層於保護膜形成膜中的與支撐片為相反側之周緣部的環狀之夾具用黏著劑層、及積層於夾具用黏著劑層中的與保護膜形成膜為相反側之剝離膜所構成。保護膜形成用複合片係保護膜形成用複合片中之剝離膜為一連串之長條,以剝離膜為支撐物捲取成輥狀而製成捲收體。In this way, the composite sheet for protective film formation of Example 1 was obtained. The composite sheet for protective film formation of Example 1 is a support sheet formed by laminating an adhesive layer (thickness: 5 μm) on a base material, laminated on The protective film forming film on the side of the adhesive layer of the support sheet, the ring-shaped adhesive layer for jigs laminated on the peripheral portion of the protective film forming film on the side opposite to the support sheet, and the adhesive layer for jigs laminated on the adhesive layer for jigs Consists of a release film on the opposite side to the protective film forming film. The composite sheet for forming a protective film is a composite sheet for forming a protective film. The peeling film in the composite sheet for forming a protective film is a series of long strips, and the peeling film is used as a support and wound into a roll to form a roll.

[實施例2至實施例6、比較例1] 作為支撐片的基材之材料,準備前述聚丙烯膜1(厚度:80μm)。然後,對前述聚丙烯膜1以表1所示之方向、溫度、時間、張力進行延伸處理,除此以外,與實施例1同樣地製作各基材,製造支撐片及保護膜形成用複合片。 [Example 2 to Example 6, Comparative Example 1] As a material of the base material of the support sheet, the aforementioned polypropylene film 1 (thickness: 80 μm) was prepared. Then, the above-mentioned polypropylene film 1 was stretched in the direction, temperature, time, and tension shown in Table 1, and each substrate was produced in the same manner as in Example 1, and a support sheet and a composite sheet for forming a protective film were produced. .

[比較例2] 作為支撐片的基材之材料,準備無荷重伸縮率為MD方向100%/CD方向100%、拉伸彈性模數為MD方向450MPa/CD方向440MPa、融點155℃之聚丙烯膜2(厚度:80μm)。對前述聚丙烯膜2僅於MD方向以溫度120℃、1分鐘、1N/m之張力進行延伸處理,除此以外,與實施例1同樣地製作基材,製造支撐片及保護膜形成用複合片。 [Comparative example 2] As the material for the base material of the support sheet, prepare a polypropylene film 2 (thickness) with a no-load stretch rate of 100% in the MD direction/100% in the CD direction, a tensile modulus of 450 MPa in the MD direction/440 MPa in the CD direction, and a melting point of 155°C. : 80 μm). The aforementioned polypropylene film 2 was stretched only in the MD direction at a temperature of 120° C., for 1 minute, and at a tension of 1 N/m. A substrate was prepared in the same manner as in Example 1, and a support sheet and a protective film-forming composite were produced. piece.

[試驗例1][無荷重伸縮率之測定] 針對實施例及比較例所用之前述聚丙烯膜1及前述聚丙烯膜2,分別以短邊成為CD方向且長邊成為MD方向之方式裁斷成短邊22mm、長邊110mm之尺寸,作為MD方向之試片。將長度110mm中的長度方向中央部之100mm作為測定間距離對試片進行標記,於該試片的長度方向之單端部(端部之5mm部分)安裝質量2.2g之夾子。 [Test example 1] [Measurement of no-load stretch rate] For the above-mentioned polypropylene film 1 and the above-mentioned polypropylene film 2 used in the examples and comparative examples, the short side becomes the CD direction and the long side becomes the MD direction, respectively, and is cut into a size of 22 mm on the short side and 110 mm on the long side, as the MD direction The test piece. Mark the test piece with 100mm in the central part of the longitudinal direction out of the length of 110mm as the distance between measurements, and attach a clip with a mass of 2.2g to one end of the test piece in the longitudinal direction (the 5mm portion of the end).

使用夾子將上述試片懸吊於烘箱內。於上述烘箱內以130℃、30%RH進行2小時加熱後,自烘箱取出試片,冷卻至23℃為止。然後,再次測定試片之經標記之測定間距離,基於下述式算出基材之無荷重伸縮率(%)。 無荷重伸縮率(%)=(加熱後之測定間距離/加熱前之測定間距離)×100 The above-mentioned test piece was suspended in the oven using clips. After heating in the above-mentioned oven at 130°C and 30%RH for 2 hours, the test piece was taken out from the oven and cooled to 23°C. Then, the distance between the marked measurements of the test piece was measured again, and the no-load expansion and contraction rate (%) of the substrate was calculated based on the following formula. No-load stretch rate (%)=(distance between measurements after heating/distance between measurements before heating)×100

而且,針對實施例及比較例所用之前述聚丙烯膜1及前述聚丙烯膜2,分別以短邊成為MD方向且長邊成為CD方向之方式裁斷成短邊22mm、長邊110mm之尺寸,作為CD方向之試片。針對該CD方向之試片,亦與上述同樣地算出無荷重伸縮率(%)。In addition, the aforementioned polypropylene film 1 and the aforementioned polypropylene film 2 used in Examples and Comparative Examples were cut into dimensions of 22 mm on the short side and 110 mm on the long side with the short sides in the MD direction and the long sides in the CD direction, respectively. CD orientation test piece. For the test piece in the CD direction, the no-load stretch rate (%) was calculated in the same manner as above.

[試驗例2][拉伸彈性模數測定] 針對實施例及比較例中所用之前述聚丙烯膜1及前述聚丙烯膜2,分別裁斷成15mm×140mm之試片,依據JIS K7127:1999測定23℃時之拉伸彈性模數(楊氏模數)。具體而言,對於上述試片,於拉伸試驗機(島津製作所股份有限公司製造,製品名「Autograph AG-IS 500N」)中設定為夾頭間距離100mm後,以200mm/min之速度進行拉伸試驗,測定拉伸彈性模數(MPa)。再者,拉伸彈性模數之測定係對基材之MD方向及CD方向兩者進行。 [Test Example 2] [Measurement of Tensile Elastic Modulus] For the above-mentioned polypropylene film 1 and the above-mentioned polypropylene film 2 used in the examples and comparative examples, they were respectively cut into test pieces of 15mm×140mm, and the tensile modulus of elasticity (Young's modulus) at 23°C was measured according to JIS K7127:1999 number). Specifically, the above-mentioned test piece was pulled at a speed of 200 mm/min after setting the distance between chucks to 100 mm in a tensile testing machine (manufactured by Shimadzu Corporation, product name "Autograph AG-IS 500N"). Tensile test to measure the tensile modulus of elasticity (MPa). In addition, the measurement of the tensile elastic modulus was performed on both the MD direction and the CD direction of the substrate.

[試驗例3][融點之測定] 使用熱重量測定裝置(珀金埃爾默(Perkin Elmer)公司製造,製品名「Pyris1」)測定實施例及比較例中所用之前述聚丙烯膜1及前述聚丙烯膜2之融點。具體而言,將基材自50℃以每分鐘10℃加熱至250℃,進行DSC(Differential Scanning Calorimetry,示差掃描熱量分析)測定,將觀測到吸熱波峰之溫度作為融點。 [Test Example 3] [Measurement of Melting Point] The melting points of the polypropylene film 1 and the polypropylene film 2 used in Examples and Comparative Examples were measured using a thermogravimetric measuring device (manufactured by Perkin Elmer, product name "Pyris 1"). Specifically, the substrate was heated from 50° C. to 250° C. at 10° C. per minute, and DSC (Differential Scanning Calorimetry, Differential Scanning Calorimetry) measurement was performed, and the temperature at which an endothermic peak was observed was taken as the melting point.

[試驗例4][鬆弛評價] 自實施例及比較例中製造之保護膜形成用複合片將剝離膜加以剝離,將所得之保護膜形成用複合片如圖7A所示般貼附於矽晶圓(#6000研磨,直徑:12吋,厚度:300μm,質量:50g)及環形框架(不鏽鋼製,內徑350mm)。於該狀態,以矽晶圓面成為水平之方式僅保持環形框架,於130℃之環境下加熱2小時使保護膜形成膜硬化製成保護膜後,冷卻至室溫為止。 [Test Example 4] [Slack Evaluation] The release film was peeled off from the composite sheets for protective film formation manufactured in Examples and Comparative Examples, and the obtained composite sheet for protective film formation was attached to a silicon wafer (#6000 grinding, diameter: 12 mm) as shown in FIG. 7A inches, thickness: 300 μm, mass: 50 g) and a ring frame (made of stainless steel, with an inner diameter of 350 mm). In this state, only the ring frame was held so that the surface of the silicon wafer was horizontal, and heated at 130°C for 2 hours to harden the protective film forming film to form a protective film, and then cooled to room temperature.

繼而,測定位於環形框架的下側之保護膜形成用複合片的下端面之高度、與位於矽晶圓的下側之保護膜形成用複合片的下端面之高度之差(下沈量;mm),將該差設為鬆弛進行評價。評價基準如下。結果示於表1。 A(優良):未達1.2mm。 B(良好):1.2mm以上至未達3.0mm。 C(不良):3.0mm以上。 Then, the difference between the height of the lower end surface of the protective film forming composite sheet located on the lower side of the ring frame and the lower end surface of the protective film forming composite sheet located on the lower side of the silicon wafer (amount of sinking; mm ), and evaluate this difference as slack. The evaluation criteria are as follows. The results are shown in Table 1. A (excellent): less than 1.2 mm. B (good): 1.2 mm or more to less than 3.0 mm. C (defective): 3.0 mm or more.

上述結果為,關於實施例1至實施例6之保護膜形成用複合片,評價為A(優良),關於比較例1至比較例2之保護膜形成用複合片,評價為B(良好)。The above results were evaluated as A (excellent) for the protective film-forming composite sheets of Examples 1 to 6, and B (good) for the protective film-forming composite sheets of Comparative Examples 1 to 2.

[試驗例5][熱機械分析(TMA)] 將實施例及比較例之支撐片之MD方向設為長邊方向,切出長度20mm、寬度5mm之短條狀試片。使用熱機械分析裝置(Bruker AXS股份有限公司製造之「TMA-4000SA」),以夾頭間隔15mm、荷重0.8g、升溫速度10℃/min自23℃升溫至130℃為止,保持30分鐘。然後,以荷重0.8g、冷卻速度1℃/min自130℃冷卻至50℃。以採樣頻率:1s -1測定該期間之位移量[μm]。 [Test Example 5] [Thermomechanical Analysis (TMA)] The MD direction of the support sheets of the examples and comparative examples was set as the long side direction, and a short strip-shaped test piece with a length of 20 mm and a width of 5 mm was cut out. Using a thermomechanical analysis device ("TMA-4000SA" manufactured by Bruker AXS Co., Ltd.), the temperature was raised from 23°C to 130°C at a chuck interval of 15mm, a load of 0.8g, and a heating rate of 10°C/min, and held for 30 minutes. Then, it cooled from 130°C to 50°C with a load of 0.8 g and a cooling rate of 1°C/min. Measure the displacement [μm] during this period with sampling frequency: 1s -1 .

將實施例及比較例之支撐片之CD方向設為長邊方向而切出長度20mm、寬度5mm之短條狀試片。同樣地,使用熱機械分析裝置(Bruker AXS股份有限公司製造之「TMA-4000SA」),以夾頭間隔15mm、荷重0.8g、升溫速度10℃/min自23℃升溫至130℃為止,保持30分鐘。然後,以荷重0.8g、冷卻速度1℃/min自130℃冷卻至50℃為止。以採樣頻率1s -1測定該期間之位移量[μm]。 The CD direction of the support sheets of the examples and comparative examples was set as the long side direction, and a short strip-shaped test piece with a length of 20 mm and a width of 5 mm was cut out. Similarly, using a thermomechanical analysis device ("TMA-4000SA" manufactured by Bruker AXS Co., Ltd.), the temperature was raised from 23°C to 130°C at a chuck interval of 15mm, a load of 0.8g, and a heating rate of 10°C/min. minute. Thereafter, it was cooled from 130°C to 50°C with a load of 0.8 g and a cooling rate of 1°C/min. The displacement [μm] during this period was measured at a sampling frequency of 1s -1 .

按以下順序求出自60℃升溫至130℃為止時之每1℃之平均位移量(A 60→130)相對於自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)之比[(A 60→130)/(A 23→130)]。 Calculate the average displacement per 1°C from 60°C to 130°C (A 60 → 130 ) relative to the average displacement per 1°C from 23°C to 130°C (A 23 →130 ) ratio [(A 60→130 )/(A 23→130 )].

藉由下述求出自23℃升溫至130℃為止時之每1℃之平均位移量(A 23→130)。 A 23→130=(A 130-A 23)/107=A 130/107[μm/℃]。 The average displacement (A 23 → 130 ) per 1°C when the temperature was raised from 23°C to 130°C was obtained as follows. A 23 → 130 = (A 130 - A 23 )/107 = A 130 /107 [μm/°C].

藉由下述求出自60℃升溫至130℃為止時之每1℃之平均位移量(A 60→130)。 A 60→130=(A 130-A 60)/70[μm/℃]。 The average displacement per 1°C (A 60→130 ) when the temperature was raised from 60°C to 130°C was obtained as follows. A 60 → 130 = (A 130 −A 60 )/70 [μm/°C].

23℃時之位移量(A 23)=0μm;60℃時之位移量(A 60)[μm];130℃時之位移量(A 130)[μm]。 Displacement at 23°C (A 23 ) = 0 μm; displacement at 60°C (A 60 ) [μm]; displacement at 130°C (A 130 ) [μm].

藉由下式求出自130℃緩冷卻至50℃為止時之每1℃之平均位移量(B 130→50)。 B 130→50=(B 50-B 130)/80[μm/℃]。 The average displacement per 1°C (B 130 → 50 ) when slowly cooling from 130°C to 50°C was obtained by the following formula. B 130→50 = (B 50 -B 130 )/80 [μm/°C].

藉由下式求出自130℃緩冷卻至50℃為止時之每1℃之平均位移量之絕對值(|B 130→50|)。 |B 130→50|=|B 50-B 130|/80[μm/℃]。 The absolute value (|B 130→50 |) of the average displacement per 1°C when slowly cooling from 130°C to 50°C was obtained by the following formula. |B 130 → 50 |=|B 50 -B 130 |/80 [μm/°C].

於130℃保持30分鐘後之位移量(B 130)[μm];緩冷卻後之50℃時之位移量(B 50)[μm]。 Displacement (B 130 ) [μm] after holding at 130°C for 30 minutes; displacement (B 50 ) [μm] at 50°C after slow cooling.

求出由前述平均位移量(A 23→130)減去前述平均位移量之絕對值(|B 130→50|)所得之值[(A 23→130)-|B 130→50|]。 Calculate the value [(A 23→130 )-|B 130→50 |] obtained by subtracting the absolute value of the average displacement (|B 130→50 |) from the above-mentioned average displacement (A 23→130 ).

將以上之熱機械分析(TMA)之評價結果示於表1。Table 1 shows the evaluation results of the above thermomechanical analysis (TMA).

此處,求出由「行進方向(MD)之[(A 23→130)-|B 130→50|]之值」減去「垂直方向(CD)之[(A 23→130)-|B 130→50|]之值」所得之值的絕對值作為「MD與CD之平衡評價值」。計算結果示於表1。 MD與CD之平衡評價值較佳為3.0以下,更佳為2.5以下,進而佳為2.0以下,尤佳為1.8以下。藉由MD與CD之平衡評價值小,而能夠減少下述可能性:於加熱、冷卻之後,支撐片或樹脂膜形成用複合片自固定用夾具剝離,並以此為起點而脫落。 Here, subtract the value of [(A 23→130 )-|B in the vertical direction (CD) from the value of [(A 23→130 )-|B 130→50 |] 130 → 50 |] The absolute value of the obtained value is used as the "balance evaluation value of MD and CD". The calculation results are shown in Table 1. The balance evaluation value of MD and CD is preferably at most 3.0, more preferably at most 2.5, still more preferably at most 2.0, and most preferably at most 1.8. Since the balance evaluation value of MD and CD is small, it is possible to reduce the possibility that the support sheet or the composite sheet for resin film formation peels from the jig for fixing after heating and cooling, and falls off from this as a starting point.

[試驗例6][晶片辨識性之評價] [具保護膜之半導體晶片之製造] 藉由貼片機(琳得科(Lintec)股份有限公司製造,製品名:Adwill(註冊商標)RAD2500)於矽晶圓(#6000研磨,直徑:12吋,厚度:300μm,質量:50g)的研磨面貼附保護膜形成用複合片的保護膜形成膜側之面,形成於支撐片上使得保護膜形成膜及矽晶圓依序於這些之厚度方向積層而構成之第一積層複合片,將前述第一積層複合片的周緣部固定於晶圓切割用環形框架(不鏽鋼製,內徑350mm)(圖7A)。繼而,以矽晶圓面成為水平之方式僅保持環形框架,利用愛斯佩克(Espec)公司製造之烘箱以130℃、2小時之條件加熱(圖7B),使保護膜形成膜硬化,形成於前述支撐片上使得保護膜及矽晶圓依序於這些之厚度方向積層而構成之第二積層複合片,將前述第二積層複合片冷卻至23℃為止(圖7C)。 [Test Example 6] [Evaluation of Wafer Visibility] [Manufacture of semiconductor wafer with protective film] Using a chip mounter (manufactured by Lintec Co., Ltd., product name: Adwill (registered trademark) RAD2500) on a silicon wafer (#6000 grinding, diameter: 12 inches, thickness: 300 μm, mass: 50g) The protective film forming film side surface of the protective film forming composite sheet attached to the polished surface is formed on the support sheet so that the protective film forming film and the silicon wafer are sequentially laminated in the thickness direction of these first laminated composite sheets. The peripheral portion of the first laminated composite sheet was fixed to a ring frame for wafer dicing (made of stainless steel, with an inner diameter of 350 mm) ( FIG. 7A ). Next, keep only the ring frame so that the surface of the silicon wafer becomes horizontal, and heat it in an oven manufactured by Espec at 130°C for 2 hours (Fig. 7B) to harden the protective film forming film and form For the second laminated composite sheet formed by laminating the protective film and the silicon wafer sequentially in the thickness direction on the support sheet, the second laminated composite sheet was cooled to 23° C. ( FIG. 7C ).

繼而,使用切割裝置(迪思科(Disco)股份有限公司製造,DFD6361),以截切速度30mm/s、轉速40000rpm之條件於支撐片上將矽晶圓及保護膜切割為3mm×3mm之晶片尺寸,形成於支撐片上固定有多個具保護膜之晶片的第三積層複合片(圖7D)。切割時之切入量係設為將支撐片切入20μm。切割刀片係使用迪思科(Disco)股份有限公司製造之ZH05-SD2000-D1-90 CC。 使用拾取-黏晶裝置(佳能機械(Canon Machinery)公司製造之「BESTEM D-510」),利用自動追蹤功能實施500晶片之晶片辨識,將500晶片全部能夠辨識之情況評價為A(優良),將可辨識晶片數未達500之情況評價為B(不良)。結果示於表1。 Then, use a cutting device (manufactured by Disco Co., Ltd., DFD6361) to cut the silicon wafer and protective film on the support sheet into a wafer size of 3mm×3mm at a cutting speed of 30mm/s and a rotation speed of 40,000rpm. A third laminated composite sheet with a plurality of wafers with protective films fixed on the support sheet was formed (FIG. 7D). The amount of incision during cutting is set to cut into the support sheet 20 μm. The cutting blade is ZH05-SD2000-D1-90 CC manufactured by Disco Co., Ltd. Using a pick-and-die device ("BESTEM D-510" manufactured by Canon Machinery Co., Ltd.), 500 wafers were identified using the automatic tracking function, and all 500 wafers could be identified as A (excellent). The case where the number of recognizable wafers was less than 500 was evaluated as B (defective). The results are shown in Table 1.

同樣地,使用切割裝置(迪思科(Disco)股份有限公司製造,DFD6361),以截切速度30mm/s、轉速40000rpm之條件於支撐片上將矽晶圓及保護膜切割為3mm×1.5mm之晶片尺寸,形成於支撐片上固定有多個具保護膜之晶片的第三積層複合片(圖7D)。切割時之切入量係設為將支撐片切入20μm。 同樣地,使用拾取-黏晶裝置(佳能機械(Canon Machinery)公司製造之「BESTEM D-510」),利用自動追蹤功能實施500晶片之晶片辨識,將500晶片全部能夠辨識之情況評價為A(優良),將可辨識晶片數未達500之情況評價為B(不良)。結果示於表1。 Similarly, use a cutting device (manufactured by Disco Co., Ltd., DFD6361) to cut the silicon wafer and protective film into 3mm×1.5mm wafers on the support sheet at a cutting speed of 30mm/s and a rotation speed of 40,000rpm. Size, formed on the support sheet with a plurality of wafers with a protective film fixed on the third laminated composite sheet (Figure 7D). The amount of incision during cutting is set to cut into the support sheet 20 μm. Similarly, using a pick-and-die device ("BESTEM D-510" manufactured by Canon Machinery Co., Ltd.), 500 wafers were identified using the automatic tracking function, and the case where all 500 wafers could be identified was evaluated as A ( Excellent), and the case where the number of recognizable wafers was less than 500 was evaluated as B (poor). The results are shown in Table 1.

[表1] 實施例1 實施例2 實施例3 實施例4 實施例5 實施例6 比較例1 比較例2 基材 聚丙烯膜1 聚丙烯膜1 聚丙烯膜1 聚丙烯膜1 聚丙烯膜1 聚丙烯膜1 聚丙烯膜1 聚丙烯膜2 對基材之追加 加熱延伸處理 延伸方向 僅MD 僅MD 僅CD 僅CD MD與CD兩者 MD與CD兩者 僅MD 僅MD 溫度、時間 120℃、 1分鐘 120℃、 1分鐘 120℃、 1分鐘 120℃、 1分鐘 120℃、 1分鐘 120℃、 1分鐘 120℃、 1分鐘 120℃、 1分鐘 張力 2N/m 3N/m 2N/m 3N/m 2N/m 3N/m 1N/m 1N/m 支撐片之TMA 評價 測定方向 MD CD MD CD MD CD MD CD MD CD MD CD MD CD MD CD 130℃之位移量(A 130) μm 208 390 92 360 302 226 281 186 130 209 110 138 520 635 380 480 平均位移量(A 23→130) μm/℃ 1.94 3.64 0.86 3.36 2.82 2.11 2.62 1.74 1.21 1.95 1.03 1.29 4.86 5.93 3.56 4.49 平均位移量(A 60→130) μm/℃ 1.54 3.69 0.39 3.29 2.37 1.75 2.16 1.31 0.58 1.61 0.42 0.85 5.43 7.80 3.23 5.55 (A 60→130/A 23→130) 0.79 1.01 0.45 0.98 0.84 0.83 0.82 0.75 0.48 0.83 0.41 0.66 1.12 1.32 0.91 1.24 平均位移量(B 130→50) μm/℃ -3.02 -4.38 -3.15 -4.13 -2.65 -3.53 -3.55 -3.33 -3.34 -3.43 -3.57 -3.62 -4.00 -3.18 -3.14 -3.75 絕對值|B 130→50 μm/℃ 3.02 4.38 3.15 4.13 2.65 3.53 3.55 3.33 3.34 3.43 3.57 3.62 4.00 3.18 3.14 3.75 (A 23→130)-|B 130→50 μm/℃ -1.08 -0.73 -2.29 -0.76 0.17 -1.42 -0.93 -1.59 -2.13 -1.48 -2.54 -2.33 0.86 2.75 0.41 0.74 MD與CD之平衡評價值 μm/℃ 0.35 1.53 1.59 0.66 0.65 0.21 1.89 0.32 鬆弛評價 A A A A A A B B 晶片辨識性[3mm×3mm] A A A A A A B B 晶片辨識性[3mm×1.5mm] B A B A A A B B [Table 1] Example 1 Example 2 Example 3 Example 4 Example 5 Example 6 Comparative example 1 Comparative example 2 Substrate Polypropylene film 1 Polypropylene film 1 Polypropylene film 1 Polypropylene film 1 Polypropylene film 1 Polypropylene film 1 Polypropylene film 1 Polypropylene film 2 Additional heating and stretching treatment on the base material Extension direction MD only MD only CD only CD only Both MD and CD Both MD and CD MD only MD only temperature, time 120°C, 1 minute 120°C, 1 minute 120°C, 1 minute 120°C, 1 minute 120°C, 1 minute 120°C, 1 minute 120°C, 1 minute 120°C, 1 minute tension 2N/m 3N/m 2N/m 3N/m 2N/m 3N/m 1N/m 1N/m TMA evaluation of support sheet Measurement direction MD cd MD cd MD cd MD cd MD cd MD cd MD cd MD cd Displacement at 130°C (A 130 ) μm 208 390 92 360 302 226 281 186 130 209 110 138 520 635 380 480 Average displacement (A 23→130 ) μm/℃ 1.94 3.64 0.86 3.36 2.82 2.11 2.62 1.74 1.21 1.95 1.03 1.29 4.86 5.93 3.56 4.49 Average displacement (A 60→130 ) μm/℃ 1.54 3.69 0.39 3.29 2.37 1.75 2.16 1.31 0.58 1.61 0.42 0.85 5.43 7.80 3.23 5.55 (A 60→130 /A 23→130 ) 0.79 1.01 0.45 0.98 0.84 0.83 0.82 0.75 0.48 0.83 0.41 0.66 1.12 1.32 0.91 1.24 Average displacement (B 130→50 ) μm/℃ -3.02 -4.38 -3.15 -4.13 -2.65 -3.53 -3.55 -3.33 -3.34 -3.43 -3.57 -3.62 -4.00 -3.18 -3.14 -3.75 Absolute value|B 130→50 μm/℃ 3.02 4.38 3.15 4.13 2.65 3.53 3.55 3.33 3.34 3.43 3.57 3.62 4.00 3.18 3.14 3.75 (A 23→130 )-|B 130→50 μm/℃ -1.08 -0.73 -2.29 -0.76 0.17 -1.42 -0.93 -1.59 -2.13 -1.48 -2.54 -2.33 0.86 2.75 0.41 0.74 Balance evaluation value of MD and CD μm/℃ 0.35 1.53 1.59 0.66 0.65 0.21 1.89 0.32 Slack evaluation A A A A A A B B Chip identification [3mm×3mm] A A A A A A B B Chip identification [3mm×1.5mm] B A B A A A B B

於切割為3mm×3mm之晶片尺寸而評價晶片辨識性時,比較例1至比較例2中均係可辨識晶片數未達500,為B(不良),相對於此,實施例1至實施例6中均係可辨識晶片數為500,為A(優良)。When evaluating wafer recognizability by cutting into a wafer size of 3mm×3mm, the number of identifiable wafers in Comparative Example 1 to Comparative Example 2 is less than 500, which is B (bad). In contrast, Embodiment 1 to Embodiment The number of identifiable wafers in all 6 is 500, which is A (excellent).

於切割為3mm×1.5mm之晶片尺寸而評價晶片辨識性時,比較例1至比較例2中均係可辨識晶片數未達500,為B(不良),相對於此,實施例2、實施例4至實施例6中均係可辨識晶片數為500,為A(優良)。 [產業可利用性] When evaluating wafer recognizability by cutting into a wafer size of 3mm×1.5mm, the number of identifiable wafers in Comparative Example 1 to Comparative Example 2 is less than 500, which is B (bad). In Example 4 to Example 6, the number of identifiable wafers is 500, which is A (excellent). [Industrial availability]

本發明能夠用於製造以半導體裝置為代表之各種基板裝置。The present invention can be used to manufacture various substrate devices represented by semiconductor devices.

1:套件 5:第一積層體 7:扯離機構 9:工件 9b:工件的內面 10,20:支撐片 10a:支撐片的一面(第一面) 11:基材 11a:基材的一面(第一面) 12:黏著劑層 12a:黏著劑層的第一面 13,23:樹脂膜形成層 13a,23a:樹脂膜形成層的第一面 13b,23b:樹脂膜形成層的第二面 13’:樹脂膜 13a’:樹脂膜的一面(第一面) 13b’:樹脂膜的另一面(第二面) 15:剝離膜 16:夾具用黏著劑層 16a:夾具用黏著劑的第一面 18:固定用夾具 90:晶片 90b:晶片的內面 101,102,103,104:樹脂膜形成用複合片 130:切斷後之樹脂膜形成層 130b:切斷後之樹脂膜形成層的第二面 130’:切斷後之樹脂膜 130b’:切斷後之樹脂膜的第二面 151:第一剝離膜 152:第二剝離膜 501:第一積層複合片 502:第二積層複合片 503:第三積層複合片 504:第四積層複合片 601:第一積層膜 901:具樹脂膜之晶片 902:具樹脂膜形成層之晶片 P:扯離方向 1: Kit 5: The first laminate 7: Pull away from the mechanism 9: Workpiece 9b: Inner surface of workpiece 10,20: support sheet 10a: One side of the support sheet (first side) 11: Substrate 11a: one side of the substrate (first side) 12: Adhesive layer 12a: the first side of the adhesive layer 13,23: Resin film forming layer 13a, 23a: the first surface of the resin film forming layer 13b, 23b: the second surface of the resin film forming layer 13': resin film 13a': One side of the resin film (the first side) 13b': the other side of the resin film (second side) 15: Peel off film 16: Adhesive layer for fixture 16a: The first side of the fixture with adhesive 18: Fixtures for fixing 90: Wafer 90b: Inner face of wafer 101, 102, 103, 104: Composite sheet for resin film formation 130: Resin film forming layer after cutting 130b: the second surface of the resin film forming layer after cutting 130': Resin film after cutting 130b': the second side of the resin film after cutting 151: The first release film 152: Second release film 501: The first laminated composite sheet 502: The second laminated composite sheet 503: The third laminated composite sheet 504: The fourth laminated composite sheet 601: The first laminated film 901: Wafer with resin film 902: Wafer with resin film forming layer P: pull away direction

[圖1]係示意性地表示本發明之實施形態之支撐片之一例的剖面圖。 [圖2]係示意性地表示本發明之實施形態之樹脂膜形成用複合片之一例的剖面圖。 [圖3]係示意性地表示本發明之實施形態之樹脂膜形成用複合片之另一例的剖面圖。 [圖4]係示意性地表示本發明之實施形態之樹脂膜形成用複合片之進而另一例的剖面圖。 [圖5]係示意性地表示本發明之實施形態之樹脂膜形成用複合片之進而另一例的剖面圖。 [圖6]係示意性地表示本發明之實施形態之套件之一例的剖面圖。 [圖7A]係用以示意性地說明本發明之實施形態之具樹脂膜之晶片的製造方法之一例之一部分的剖面圖。 [圖7B]係用以示意性地說明本發明之實施形態之具樹脂膜之晶片的製造方法之一例之一部分的剖面圖。 [圖7C]係用以示意性地說明本發明之實施形態之具樹脂膜之晶片的製造方法之一例之一部分的剖面圖。 [圖7D]係用以示意性地說明本發明之實施形態之具樹脂膜之晶片的製造方法之一例之一部分的剖面圖。 [圖7E]係用以示意性地說明本發明之實施形態之具樹脂膜之晶片的製造方法之一例之一部分的剖面圖。 [圖8]係用以示意性地說明本發明之實施形態之具樹脂膜之晶片的製造方法之另一例之一部分的剖面圖。 [圖9A]係用以示意性地說明本發明之實施形態之具樹脂膜之晶片的製造方法之另一例之一部分的剖面圖。 [圖9B]係用以示意性地說明本發明之實施形態之具樹脂膜之晶片的製造方法之另一例之一部分的剖面圖。 [圖9C]係用以示意性地說明本發明之實施形態之具樹脂膜之晶片的製造方法之另一例之一部分的剖面圖。 [ Fig. 1 ] is a cross-sectional view schematically showing an example of a support sheet according to an embodiment of the present invention. [ Fig. 2 ] is a cross-sectional view schematically showing an example of a composite sheet for forming a resin film according to an embodiment of the present invention. [ Fig. 3] Fig. 3 is a cross-sectional view schematically showing another example of the composite sheet for forming a resin film according to the embodiment of the present invention. [ Fig. 4] Fig. 4 is a cross-sectional view schematically showing still another example of the composite sheet for forming a resin film according to the embodiment of the present invention. [ Fig. 5] Fig. 5 is a cross-sectional view schematically showing still another example of the composite sheet for forming a resin film according to the embodiment of the present invention. [ Fig. 6 ] is a cross-sectional view schematically showing an example of a kit according to an embodiment of the present invention. [ Fig. 7A] Fig. 7A is a partial cross-sectional view schematically illustrating an example of a method of manufacturing a wafer with a resin film according to an embodiment of the present invention. [ Fig. 7B] Fig. 7B is a partial cross-sectional view schematically illustrating an example of a method of manufacturing a wafer with a resin film according to an embodiment of the present invention. [ Fig. 7C] Fig. 7C is a partial cross-sectional view schematically illustrating an example of a method for manufacturing a wafer with a resin film according to an embodiment of the present invention. [ Fig. 7D ] is a partial cross-sectional view schematically illustrating an example of a method of manufacturing a wafer with a resin film according to an embodiment of the present invention. [ Fig. 7E ] is a partial cross-sectional view schematically illustrating an example of a method for manufacturing a wafer with a resin film according to an embodiment of the present invention. [ Fig. 8] Fig. 8 is a partial cross-sectional view schematically illustrating another example of a method of manufacturing a wafer with a resin film according to an embodiment of the present invention. [ Fig. 9A] Fig. 9A is a partial cross-sectional view schematically illustrating another example of a method of manufacturing a wafer with a resin film according to an embodiment of the present invention. [ Fig. 9B] Fig. 9B is a partial cross-sectional view schematically illustrating another example of a method for manufacturing a wafer with a resin film according to an embodiment of the present invention. [ Fig. 9C ] is a partial cross-sectional view schematically illustrating another example of the method for manufacturing a wafer with a resin film according to the embodiment of the present invention.

10:支撐片 10: Support sheet

10a:支撐片的一面(第一面) 10a: One side of the support sheet (first side)

11:基材 11: Substrate

11a:基材的一面(第一面) 11a: one side of the substrate (first side)

12:黏著劑層 12: Adhesive layer

12a:黏著劑層的第一面 12a: the first side of the adhesive layer

Claims (17)

一種支撐片,係用於工件或將工件加以分割而得之晶片之加熱; 於將前述支撐片以下述條件藉由行進方向或垂直方向的任一個之拉伸模式進行熱機械分析時,130℃時之位移量A 130為500μm以下; 自23℃升溫至130℃為止時之每1℃之平均位移量A 23→130小於自130℃緩冷卻至50℃為止時之每1℃之平均位移量之絕對值|B 130→50|; 熱機械分析之條件如下: 樣本尺寸:長度20mm、寬度5mm 夾頭間隔:15mm 以荷重0.8g、升溫速度10℃/min自23℃升溫至130℃為止,保持30分鐘;然後,以荷重0.8g、冷卻速度1℃/min自130℃冷卻至50℃為止;測定前述期間之位移量[μm]。 A support sheet used for heating workpieces or wafers obtained by dividing the workpiece; when the above-mentioned support sheet is subjected to thermomechanical analysis by stretching mode in any one of the traveling direction or the vertical direction under the following conditions, 130°C The displacement A 130 is less than 500μm; the average displacement A 23→130 per 1°C when the temperature rises from 23°C to 130°C is less than the average displacement per 1°C when the temperature is slowly cooled from 130°C to 50°C Absolute value|B 130→50 |; The conditions of thermomechanical analysis are as follows: Sample size: length 20mm, width 5mm Interval between clamps: 15mm, with a load of 0.8g and a heating rate of 10℃/min from 23℃ to 130℃, Hold for 30 minutes; then, cool from 130°C to 50°C with a load of 0.8g and a cooling rate of 1°C/min; measure the displacement [μm] during the preceding period. 如請求項1所記載之支撐片,其中於將前述支撐片以前述條件藉由行進方向之拉伸模式、及垂直方向之拉伸模式進行熱機械分析時,130℃時之位移量A 130均為500μm以下; 自23℃升溫至130℃為止時之每1℃之平均位移量A 23→130均小於自130℃緩冷卻至50℃為止時之每1℃之平均位移量之絕對值|B 130→50|。 The support sheet as described in claim 1, wherein when the above-mentioned support sheet is subjected to thermomechanical analysis by the tensile mode in the traveling direction and the tensile mode in the vertical direction under the aforementioned conditions, the displacement A 130 at 130°C is equal to It is less than 500μm; the average displacement per 1°C from 23°C to 130°C A 23→130 is less than the absolute value of the average displacement per 1°C from 130°C to 50°C when it is slowly cooled to 50°C|B 130 → 50 |. 如請求項1或2所記載之支撐片,其中於將前述支撐片以前述條件藉由行進方向或垂直方向的任一個之拉伸模式進行熱機械分析時,自23℃升溫至130℃為止時之每1℃之平均位移量A 23→130為正值。 The support sheet as described in claim 1 or 2, wherein when the above-mentioned support sheet is subjected to thermomechanical analysis in the tensile mode in either the traveling direction or the vertical direction under the aforementioned conditions, when the temperature is raised from 23°C to 130°C The average displacement per 1°C A 23→130 is a positive value. 如請求項3所記載之支撐片,其中於將前述支撐片以前述條件藉由行進方向之拉伸模式、及垂直方向之拉伸模式進行熱機械分析時,自23℃升溫至130℃為止時之每1℃之平均位移量A 23→130均為正值。 The support sheet as described in claim 3, wherein when the above-mentioned support sheet is subjected to thermomechanical analysis under the aforementioned conditions through the tensile mode in the traveling direction and the tensile mode in the vertical direction, when the temperature is raised from 23°C to 130°C The average displacement A 23→130 per 1°C is positive. 如請求項3或4所記載之支撐片,其中於將前述支撐片以前述條件藉由行進方向或垂直方向的任一個之拉伸模式進行熱機械分析時,自60℃升溫至130℃為止時之每1℃之平均位移量A 60→130相對於自23℃升溫至130℃為止時之每1℃之平均位移量A 23→130之比未達1。 The support sheet as described in claim 3 or 4, wherein when the above-mentioned support sheet is subjected to thermomechanical analysis in the tensile mode in either the traveling direction or the vertical direction under the aforementioned conditions, when the temperature is raised from 60°C to 130°C The ratio of the average displacement A 60→130 per 1°C to the average displacement A 23→130 per 1°C when the temperature rises from 23°C to 130°C is less than 1. 如請求項5所記載之支撐片,其中於將前述支撐片以前述條件藉由行進方向之拉伸模式、及垂直方向之拉伸模式進行熱機械分析時,自60℃升溫至130℃為止時之每1℃之平均位移量A 60→130相對於自23℃升溫至130℃為止時之每1℃之平均位移量A 23→130之比均未達1。 The support sheet as described in claim 5, wherein when the above-mentioned support sheet is subjected to thermomechanical analysis by the tensile mode in the traveling direction and the tensile mode in the vertical direction under the aforementioned conditions, when the temperature is raised from 60°C to 130°C The ratio of the average displacement A 60→130 per 1°C to the average displacement A 23→130 per 1°C from 23°C to 130°C did not reach 1. 如請求項1至6中任一項所記載之支撐片,其中前述支撐片係僅由基材所構成,或者具備基材、及設置於前述基材的一面上之黏著劑層,並且,前述基材之構成材料含有聚烯烴樹脂。The supporting sheet as described in any one of Claims 1 to 6, wherein the aforementioned supporting sheet is composed of a base material only, or has a base material and an adhesive layer disposed on one side of the aforementioned base material, and the aforementioned The constituent material of the substrate contains polyolefin resin. 如請求項1至7中任一項所記載之支撐片,其中前述支撐片係僅由基材所構成,或者具備基材、及設置於前述基材的一面上之黏著劑層,並且,前述基材為延伸膜。The supporting sheet as described in any one of Claims 1 to 7, wherein the aforementioned supporting sheet is composed of a base material only, or has a base material and an adhesive layer disposed on one side of the aforementioned base material, and the aforementioned The substrate is a stretched film. 如請求項1至8中任一項所記載之支撐片,其中前述支撐片為輥狀。The support sheet according to any one of claims 1 to 8, wherein the support sheet is in the shape of a roll. 一種樹脂膜形成用複合片,係具備如請求項1至8中任一項所記載之支撐片、及設置於前述支撐片的一面上之樹脂膜形成層。A composite sheet for forming a resin film, comprising the support sheet according to any one of Claims 1 to 8, and a resin film forming layer provided on one side of the support sheet. 如請求項10所記載之樹脂膜形成用複合片,其中前述樹脂膜形成層為保護膜形成膜。The composite sheet for forming a resin film according to claim 10, wherein the resin film forming layer is a protective film forming film. 如請求項10或11所記載之樹脂膜形成用複合片,其中前述樹脂膜形成用複合片為輥狀。The composite sheet for forming a resin film according to Claim 10 or 11, wherein the composite sheet for forming a resin film is in the shape of a roll. 一種套件,係具備:第一積層體,由第一剝離膜、樹脂膜形成層及第二剝離膜所依序積層而成;以及如請求項1至9中任一項所記載之支撐片,係用於支撐成為前述樹脂膜形成層之貼附對象的工件及前述樹脂膜形成層。A kit comprising: a first laminate formed by sequentially laminating a first release film, a resin film forming layer, and a second release film; and a support sheet as described in any one of Claims 1 to 9, It is used to support the workpiece to be attached to the aforementioned resin film forming layer and the aforementioned resin film forming layer. 如請求項13所記載之套件,其中前述樹脂膜形成層為保護膜形成膜。The kit according to claim 13, wherein the resin film-forming layer is a protective film-forming film. 如請求項13或14所記載之套件,其中前述第一積層體為輥狀。The kit according to claim 13 or 14, wherein the first laminate is in the shape of a roll. 一種具樹脂膜之晶片的製造方法,前述具樹脂膜之晶片係具備晶片、及設置於前述晶片的內面之樹脂膜;前述具樹脂膜之晶片的製造方法係具備下述步驟: 於工件的內面貼附如請求項10至12中任一項所記載之樹脂膜形成用複合片中的樹脂膜形成層、或者於工件的內面貼附如請求項13至15中任一項所記載之套件中的樹脂膜形成層,以製作使得前述樹脂膜形成層及工件於厚度方向積層而構成之第一積層膜,進而於前述第一積層膜中的前述樹脂膜形成層貼附前述套件中的支撐片,藉此製作於前述支撐片上使得前述樹脂膜形成層及前述工件依序於厚度方向積層而構成之第一積層複合片之步驟; 以將前述第一積層複合片的周緣部貼附於固定用夾具之狀態,將前述第一積層複合片加熱,使前述樹脂膜形成層硬化形成前述樹脂膜,藉此製作於前述支撐片上使得前述樹脂膜及前述工件依序於厚度方向積層而構成之第二積層複合片之步驟; 將前述第二積層複合片冷卻,然後於前述支撐片上將前述第二積層複合片中的前述工件加以分割,切斷前述樹脂膜,藉此製作於前述支撐片上固定有多個具樹脂膜之晶片的第三積層複合片之步驟;以及 將前述第三積層複合片中的前述具樹脂膜之晶片自前述支撐片扯離,藉此拾取前述具樹脂膜之晶片之步驟。 A method for manufacturing a wafer with a resin film, the aforementioned wafer with a resin film comprises a wafer and a resin film disposed on the inner surface of the aforementioned wafer; the method for manufacturing the aforementioned wafer with a resin film comprises the following steps: Attaching the resin film forming layer in the resin film forming composite sheet as described in any one of Claims 10 to 12 on the inner surface of the workpiece, or attaching any one of Claims 13 to 15 on the inner surface of the workpiece. The resin film-forming layer in the kit described in item 1 is used to manufacture the first laminated film formed by laminating the aforementioned resin film-forming layer and the workpiece in the thickness direction, and then attach the aforementioned resin film-forming layer in the aforementioned first laminated film The supporting sheet in the aforementioned kit, whereby the first laminated composite sheet formed by laminating the aforementioned resin film forming layer and the aforementioned workpiece sequentially in the thickness direction on the aforementioned supporting sheet; In the state where the peripheral portion of the first laminated composite sheet is attached to a jig for fixing, the first laminated composite sheet is heated to harden the resin film forming layer to form the resin film, thereby forming the above-mentioned supporting sheet so that the The second laminated composite sheet formed by laminating the resin film and the aforementioned workpieces sequentially in the thickness direction; Cool the second laminated composite sheet, then divide the workpiece in the second laminated composite sheet on the support sheet, and cut the resin film, thereby manufacturing a plurality of wafers with resin films fixed on the support sheet the step of the third laminated composite sheet; and A step of pulling the aforementioned wafer with the resin film in the aforementioned third laminated composite sheet from the aforementioned support sheet, thereby picking up the aforementioned wafer with the resin film. 一種具樹脂膜之晶片的製造方法,前述具樹脂膜之晶片係具備晶片、及設置於前述晶片的內面之樹脂膜;前述具樹脂膜之晶片的製造方法係具有下述步驟: 於工件的內面貼附如請求項10至12中任一項所記載之樹脂膜形成用複合片中的樹脂膜形成層、或者於工件的內面貼附如請求項13至15中任一項所記載之套件中的樹脂膜形成層,以製作使得前述樹脂膜形成層及工件於厚度方向積層而構成之第一積層膜,進而於前述第一積層膜中的前述樹脂膜形成層貼附前述套件中的支撐片,藉此製作於前述支撐片上使得前述樹脂膜形成層及前述工件依序於厚度方向積層而構成之第一積層複合片之步驟; 於前述支撐片上將前述第一積層複合片中的前述工件加以分割,切斷前述樹脂膜形成層,藉此製作於前述支撐片上固定有多個具樹脂膜形成層之晶片的第四積層複合片之步驟; 以將前述第四積層複合片的周緣部貼附於固定用夾具之狀態,將前述第四積層複合片加熱,進行冷卻,使前述第四積層複合片中的前述樹脂膜形成層硬化形成前述樹脂膜,藉此製作於前述支撐片上固定有多個具樹脂膜之晶片的第三積層複合片之步驟;以及 將第三積層複合片中的前述具樹脂膜之晶片自前述支撐片扯離,藉此拾取前述具樹脂膜之晶片之步驟。 A method of manufacturing a wafer with a resin film, the aforementioned wafer with a resin film is equipped with a wafer and a resin film disposed on the inner surface of the aforementioned wafer; the manufacturing method of the aforementioned wafer with a resin film has the following steps: Attaching the resin film forming layer in the resin film forming composite sheet as described in any one of Claims 10 to 12 on the inner surface of the workpiece, or attaching any one of Claims 13 to 15 on the inner surface of the workpiece. The resin film-forming layer in the kit described in item 1 is used to manufacture the first laminated film formed by laminating the aforementioned resin film-forming layer and the workpiece in the thickness direction, and then attach the aforementioned resin film-forming layer in the aforementioned first laminated film The supporting sheet in the aforementioned kit, whereby the first laminated composite sheet formed by laminating the aforementioned resin film forming layer and the aforementioned workpiece sequentially in the thickness direction on the aforementioned supporting sheet; Dividing the aforementioned workpiece in the aforementioned first laminated composite sheet on the aforementioned support sheet, and cutting the aforementioned resin film forming layer, thereby manufacturing a fourth laminated composite sheet in which a plurality of wafers having resin film forming layers are fixed on the aforementioned supporting sheet the steps of In the state where the peripheral portion of the fourth laminated composite sheet is attached to a fixing jig, the fourth laminated composite sheet is heated and cooled to harden the resin film-forming layer in the fourth laminated composite sheet to form the resin film, whereby a step of manufacturing a third laminated composite sheet in which a plurality of wafers with resin films are fixed on the aforementioned supporting sheet; and The step of pulling the wafer with the resin film in the third laminated composite sheet from the support sheet, thereby picking up the wafer with the resin film.
TW111102125A 2021-03-31 2022-01-19 Method for manufacturing support sheet, composite sheet for forming resin film, kit, and wafer with resin film wherein the support sheet is used for heating workpieces or wafers obtained by dividing workpieces TW202241713A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021-062255 2021-03-31
JP2021062255A JP2022157810A (en) 2021-03-31 2021-03-31 Support sheet, composite sheet for resin film formation, kit, and manufacturing method of chip with resin film

Publications (1)

Publication Number Publication Date
TW202241713A true TW202241713A (en) 2022-11-01

Family

ID=83405009

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111102125A TW202241713A (en) 2021-03-31 2022-01-19 Method for manufacturing support sheet, composite sheet for forming resin film, kit, and wafer with resin film wherein the support sheet is used for heating workpieces or wafers obtained by dividing workpieces

Country Status (4)

Country Link
JP (1) JP2022157810A (en)
KR (1) KR20220136089A (en)
CN (1) CN115141571A (en)
TW (1) TW202241713A (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102378063B1 (en) 2014-05-23 2022-03-23 린텍 가부시키가이샤 Composite sheet for forming protective film
JP6319438B2 (en) 2014-06-10 2018-05-09 リンテック株式会社 Dicing sheet

Also Published As

Publication number Publication date
CN115141571A (en) 2022-10-04
JP2022157810A (en) 2022-10-14
KR20220136089A (en) 2022-10-07

Similar Documents

Publication Publication Date Title
US10030174B2 (en) Composite sheet for forming protective film
KR20220035981A (en) Protective film-forming film and protective film-forming composite sheet
JP2020017758A (en) Composite sheet for forming protective film
JPWO2014155756A1 (en) Adhesive sheet, composite sheet for forming protective film, and method for producing chip with protective film
JP6393449B2 (en) Adhesive composition, adhesive sheet, and method for manufacturing semiconductor device
JP2012167174A (en) Adhesive composition, adhesive sheet, and method of manufacturing semiconductor device
KR20210093229A (en) A film for forming a thermosetting protective film, a composite sheet for forming a protective film, and a method for manufacturing a chip
TW201900803A (en) Film adhesive composite sheet and method of manufacturing semiconductor device
WO2018212171A1 (en) Semiconductor device and mehtod for producing same
WO2016002080A1 (en) Protective membrane forming film
KR102224972B1 (en) Protective membrane forming film
JP2016058458A (en) Semiconductor processing tape and method of manufacturing semiconductor device manufactured using the same
TW202241713A (en) Method for manufacturing support sheet, composite sheet for forming resin film, kit, and wafer with resin film wherein the support sheet is used for heating workpieces or wafers obtained by dividing workpieces
JP6038919B2 (en) Protective film forming layer, protective film forming sheet, and method of manufacturing semiconductor device
JP7540884B2 (en) Kit and method for producing third laminate using said kit
JP7114013B1 (en) Adhesive sheet for fixing jig, composite sheet for forming protective film, and method for manufacturing chip with protective film
WO2022202502A1 (en) Adhesive sheet for jig fixation, composite sheet for protective film formation, and method for producing chip provided with protective film
JP7540885B2 (en) Kit and method for producing third laminate using said kit
WO2022210087A1 (en) Filmy adhesive, dicing/die bonding sheet, method for producing semiconductor device, use of filmy adhesive, use of dicing/die bonding sheet, and method for reworking semiconductor wafer
JP2023144842A (en) Composite sheet for resin film formation, kit, and method for manufacturing workpiece processed product with resin film
TW202238782A (en) Method for manufacturing workpiece with protective film and method for manufacturing workpiece with protective film-forming film
TW202239904A (en) Support sheet, composite sheet used for forming resin film, kit and manufacturing method of chip with resin film wherein an adhesive layer of the support sheet includes an acrylic resin with hydroxyl groups and an isocyanate-based crosslinking agent
TW202339960A (en) Protective film forming film, composite sheet for forming protective film, kit and use of protective film forming film having an indentation depth change rate measured by a specific indentation depth change rate measurement method of 60% or more
JP2016105456A (en) Film for forming protective film
KR20210117191A (en) Film adhesive and dicing die bonding sheet