SG78307A1 - Ic test handler Ic test handler - Google Patents

Ic test handler Ic test handler

Info

Publication number
SG78307A1
SG78307A1 SG1998001751A SG1998001751A SG78307A1 SG 78307 A1 SG78307 A1 SG 78307A1 SG 1998001751 A SG1998001751 A SG 1998001751A SG 1998001751 A SG1998001751 A SG 1998001751A SG 78307 A1 SG78307 A1 SG 78307A1
Authority
SG
Singapore
Prior art keywords
test handler
handler
test
Prior art date
Application number
SG1998001751A
Inventor
Ikeda Hiroki Ikeda Hiroki
Original Assignee
Advantest Corp Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP20384497A external-priority patent/JPH1138084A/en
Priority claimed from JP9203843A external-priority patent/JPH1138083A/en
Application filed by Advantest Corp Advantest Corp filed Critical Advantest Corp Advantest Corp
Publication of SG78307A1 publication Critical patent/SG78307A1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/40—Arrangements for displaying electric variables or waveforms using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
    • G06F11/324—Display of status information
    • G06F11/327—Alarm or error message display
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56016—Apparatus features
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5604—Display of error information

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Human Computer Interaction (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Control Of Conveyors (AREA)
SG1998001751A 1997-07-14 1998-07-10 Ic test handler Ic test handler SG78307A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP20384497A JPH1138084A (en) 1997-07-14 1997-07-14 Ic test handler
JP9203843A JPH1138083A (en) 1997-07-14 1997-07-14 Ic test handler

Publications (1)

Publication Number Publication Date
SG78307A1 true SG78307A1 (en) 2001-02-20

Family

ID=26514140

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1998001751A SG78307A1 (en) 1997-07-14 1998-07-10 Ic test handler Ic test handler

Country Status (4)

Country Link
KR (1) KR19990013599A (en)
DE (1) DE19831573A1 (en)
SG (1) SG78307A1 (en)
TW (1) TW373076B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100825774B1 (en) 2006-03-22 2008-04-29 삼성전자주식회사 Handler for testing a semiconductor device having a single door type stocker
JP2018141699A (en) * 2017-02-28 2018-09-13 セイコーエプソン株式会社 Electronic component conveyance device and electronic component inspection device

Also Published As

Publication number Publication date
KR19990013599A (en) 1999-02-25
TW373076B (en) 1999-11-01
DE19831573A1 (en) 1999-01-21

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