SG11201603018PA - System and method for inspecting opthalmic lenses - Google Patents
System and method for inspecting opthalmic lensesInfo
- Publication number
- SG11201603018PA SG11201603018PA SG11201603018PA SG11201603018PA SG11201603018PA SG 11201603018P A SG11201603018P A SG 11201603018PA SG 11201603018P A SG11201603018P A SG 11201603018PA SG 11201603018P A SG11201603018P A SG 11201603018PA SG 11201603018P A SG11201603018P A SG 11201603018PA
- Authority
- SG
- Singapore
- Prior art keywords
- inspecting
- opthalmic lenses
- opthalmic
- lenses
- inspecting opthalmic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
- G01M11/0214—Details of devices holding the object to be tested
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9583—Lenses
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Geometry (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Quality & Reliability (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Eyeglasses (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG11201603018PA SG11201603018PA (en) | 2014-05-15 | 2015-05-12 | System and method for inspecting opthalmic lenses |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG10201402344P | 2014-05-15 | ||
PCT/SG2015/050108 WO2015174927A1 (en) | 2014-05-15 | 2015-05-12 | System and method for inspecting opthalmic lenses |
SG11201603018PA SG11201603018PA (en) | 2014-05-15 | 2015-05-12 | System and method for inspecting opthalmic lenses |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201603018PA true SG11201603018PA (en) | 2016-05-30 |
Family
ID=54480321
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201603018PA SG11201603018PA (en) | 2014-05-15 | 2015-05-12 | System and method for inspecting opthalmic lenses |
Country Status (9)
Country | Link |
---|---|
US (1) | US10788393B2 (en) |
JP (1) | JP6701177B2 (en) |
KR (1) | KR102226634B1 (en) |
CN (1) | CN106537110A (en) |
DE (1) | DE112015002287T5 (en) |
MY (1) | MY192899A (en) |
SG (1) | SG11201603018PA (en) |
TW (1) | TWI682163B (en) |
WO (1) | WO2015174927A1 (en) |
Families Citing this family (23)
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US11308601B2 (en) * | 2015-04-29 | 2022-04-19 | Emhart Glass S.A. | Container inspection system with individual light control |
SG10201509497VA (en) * | 2015-11-18 | 2017-06-29 | Emage Vision Pte Ltd | Contact lens defect inspection using uv illumination |
US10402958B2 (en) * | 2016-09-22 | 2019-09-03 | Current Lighting Solutions, Llc | Systems and methods for window contamination detection |
US10267750B2 (en) * | 2017-02-09 | 2019-04-23 | Glasstech, Inc. | System and associated method for online detection of small defects on/in a glass sheet |
SG10201701099XA (en) * | 2017-02-10 | 2018-09-27 | Emage Vision Pte Ltd | Contact lens inspection in a plastic shell |
SG10201703345RA (en) * | 2017-04-25 | 2018-11-29 | Emage Vision Pte Ltd | Intraocular lens inspection |
US9970884B1 (en) * | 2017-04-28 | 2018-05-15 | Hong Kong Applied Science and Technology Research Institute Company Limited | Apparatus and a method for inspecting a light transmissive optical component |
CN110997494A (en) * | 2017-06-08 | 2020-04-10 | 爱尔康公司 | Method for detecting the presence or absence of an ophthalmic lens in a receptacle |
HUE065823T2 (en) * | 2017-09-07 | 2024-06-28 | Alcon Inc | Contact lens inspection system and method |
US10634618B2 (en) * | 2018-01-23 | 2020-04-28 | Hong Kong Applied Science and Technology Research Institute Company Limited | Apparatus and a method for inspecting a light transmissible optical component |
CN109030495A (en) * | 2018-06-26 | 2018-12-18 | 大连鉴影光学科技有限公司 | A kind of optical element defect inspection method based on machine vision technique |
CN109682329B (en) * | 2019-02-27 | 2020-12-22 | Oppo广东移动通信有限公司 | Cover plate flatness detection method and device, detection equipment and storage medium |
KR102181704B1 (en) * | 2019-03-15 | 2020-11-24 | 한국세라믹기술원 | Failure detection method of lens module using bubble |
WO2021008876A1 (en) * | 2019-07-18 | 2021-01-21 | Essilor International | System and method for determining at least one feature of at least one lens mounted in a spectacle frame |
CN110672638B (en) * | 2019-11-15 | 2020-07-07 | 江西特莱斯光学有限公司 | Optics-based lens surface scratch detection device |
CN113311006A (en) * | 2020-02-26 | 2021-08-27 | 乐达创意科技股份有限公司 | Automatic optical detection system and method for detecting edge defects of contact lens |
JP7309225B2 (en) * | 2020-10-14 | 2023-07-18 | イーメージ ヴィジョン ピーティーイー. エルティーディー. | Contact lens defect analysis and tracking system |
CN112529876B (en) * | 2020-12-15 | 2023-03-14 | 天津大学 | Method for detecting edge defects of contact lenses |
CN112782196A (en) * | 2020-12-25 | 2021-05-11 | 京旭企业有限公司 | Method and device for detecting optical lens |
CN113203708A (en) * | 2021-04-22 | 2021-08-03 | 平方和(北京)科技有限公司 | Optical device |
US11861823B2 (en) * | 2021-04-27 | 2024-01-02 | Johnson & Johnson Vision Care, Inc. | Microfluidic device and method for quantifying contact lens deposition |
WO2024197444A1 (en) * | 2023-03-24 | 2024-10-03 | 晶硕光学股份有限公司 | Multi-focus optical detection device |
CN117233173B (en) * | 2023-09-19 | 2024-04-12 | 广州市博泰光学科技有限公司 | Lens surface detection processing system and detection processing method thereof |
Family Cites Families (34)
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US3988068A (en) * | 1974-05-09 | 1976-10-26 | Itek Corporation | Method and apparatus for detecting cosmetic defects in opthalmic lenses |
NZ250042A (en) | 1992-12-21 | 1997-01-29 | Johnson & Johnson Vision Prod | Robotic inspection of ophthalmic lenses |
IL107603A (en) | 1992-12-21 | 1997-01-10 | Johnson & Johnson Vision Prod | Ophthalmic lens inspection method and apparatus |
IL107605A (en) | 1992-12-21 | 1998-01-04 | Johnson & Johnson Vision Prod | Lens inspection system |
ES2127935T3 (en) * | 1993-07-29 | 1999-05-01 | Jessen Wesley Corp | OPTICAL COMPONENT INSPECTION SYSTEM. |
US5500732A (en) | 1994-06-10 | 1996-03-19 | Johnson & Johnson Vision Products, Inc. | Lens inspection system and method |
JP3471436B2 (en) * | 1994-08-19 | 2003-12-02 | 株式会社アドバンテスト | Image quality inspection apparatus and image synthesizing method thereof |
JPH08201750A (en) * | 1995-01-24 | 1996-08-09 | Advantest Corp | Camera apparatus for lcd panel picture quality inspecting device |
US5633504A (en) * | 1995-03-30 | 1997-05-27 | Wesley-Jessen Corporation | Inspection of optical components |
DE69636183T2 (en) * | 1995-03-31 | 2007-03-29 | Lintec Corp. | Device for testing semiconductor substrates |
TW357262B (en) | 1996-12-19 | 1999-05-01 | Nikon Corp | Method for the measurement of aberration of optical projection system, a mask and a exposure device for optical project system |
US6047082A (en) * | 1997-11-14 | 2000-04-04 | Wesley Jessen Corporation | Automatic lens inspection system |
JP4145012B2 (en) * | 2000-12-11 | 2008-09-03 | Hoya株式会社 | Glasses lens processing method and lens meter |
US6765661B2 (en) | 2001-03-09 | 2004-07-20 | Novartis Ag | Lens inspection |
JP4711570B2 (en) * | 2001-09-14 | 2011-06-29 | 株式会社東京精密 | Pattern inspection method and inspection apparatus |
US7256881B2 (en) * | 2002-02-15 | 2007-08-14 | Coopervision, Inc. | Systems and methods for inspection of ophthalmic lenses |
CN101793595B (en) | 2002-02-21 | 2012-05-16 | 庄臣及庄臣视力保护公司 | Apparatus for inspecting optical devices |
US7830522B2 (en) | 2002-09-25 | 2010-11-09 | New York University | Method and apparatus for determining reflectance data of a subject |
US7525659B2 (en) | 2003-01-15 | 2009-04-28 | Negevtech Ltd. | System for detection of water defects |
US20050122508A1 (en) * | 2003-10-31 | 2005-06-09 | Sachio Uto | Method and apparatus for reviewing defects |
US20070121109A1 (en) | 2003-12-04 | 2007-05-31 | Roger Biel | Lens inspection |
US7105834B2 (en) * | 2005-01-21 | 2006-09-12 | Innovative Productivity, Inc. | Fluorescent coating void detection system and method |
JP2007078581A (en) | 2005-09-15 | 2007-03-29 | Shinko Seiki Co Ltd | Illumination device for visual inspection |
JP4701948B2 (en) * | 2005-09-21 | 2011-06-15 | オムロン株式会社 | Pattern light irradiation device, three-dimensional shape measurement device, and pattern light irradiation method |
US7663742B2 (en) * | 2005-11-24 | 2010-02-16 | Novartis Ag | Lens inspection system using phase contrast imaging |
CN1987528A (en) | 2005-12-23 | 2007-06-27 | 鸿富锦精密工业(深圳)有限公司 | Optical path difference lens and variable focus optical device with said lens |
JP2008261790A (en) | 2007-04-13 | 2008-10-30 | Hitachi High-Technologies Corp | Flaw inspection device |
CN101308241A (en) | 2007-05-14 | 2008-11-19 | 华晶科技股份有限公司 | Zoom lens control mechanism |
CN100582718C (en) * | 2007-05-24 | 2010-01-20 | 上海交通大学 | Optical quality measuring device for glasses |
WO2009004695A1 (en) | 2007-06-29 | 2009-01-08 | Mitsubishi Electric Corporation | Total heat exchanger element and process for manufacturing the same |
JP2010048587A (en) * | 2008-08-20 | 2010-03-04 | Hitachi High-Technologies Corp | Pattern defect inspecting device and method |
JP2012073073A (en) | 2010-09-28 | 2012-04-12 | Hitachi High-Technologies Corp | Method and apparatus for inspecting defect of pattern shape |
US9506749B2 (en) * | 2010-11-15 | 2016-11-29 | Seikowave, Inc. | Structured light 3-D measurement module and system for illuminating an area-under-test using a fixed-pattern optic |
KR102166189B1 (en) | 2013-10-08 | 2020-10-15 | 이미지 비전 피티이. 리미티드 | System and method for inspection of wet ophthalmic lens |
-
2015
- 2015-05-12 SG SG11201603018PA patent/SG11201603018PA/en unknown
- 2015-05-12 WO PCT/SG2015/050108 patent/WO2015174927A1/en active Application Filing
- 2015-05-12 CN CN201580038118.6A patent/CN106537110A/en active Pending
- 2015-05-12 JP JP2017512627A patent/JP6701177B2/en active Active
- 2015-05-12 DE DE112015002287.2T patent/DE112015002287T5/en not_active Ceased
- 2015-05-12 MY MYPI2016002019A patent/MY192899A/en unknown
- 2015-05-12 KR KR1020167035209A patent/KR102226634B1/en active IP Right Grant
- 2015-05-12 US US15/311,370 patent/US10788393B2/en active Active
- 2015-05-15 TW TW104115637A patent/TWI682163B/en active
Also Published As
Publication number | Publication date |
---|---|
DE112015002287T5 (en) | 2017-02-16 |
WO2015174927A1 (en) | 2015-11-19 |
CN106537110A (en) | 2017-03-22 |
TW201602566A (en) | 2016-01-16 |
US10788393B2 (en) | 2020-09-29 |
US20170082522A1 (en) | 2017-03-23 |
MY192899A (en) | 2022-09-14 |
KR102226634B1 (en) | 2021-03-10 |
TWI682163B (en) | 2020-01-11 |
JP2017519224A (en) | 2017-07-13 |
KR20170009918A (en) | 2017-01-25 |
JP6701177B2 (en) | 2020-05-27 |
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