KR20210014992A - Electronic device for predicting faulty and method for controlling electronic device thereof - Google Patents

Abstract

Disclosed is an electronic device including: a power management circuit; a processor electrically connected to the power management circuit; and a memory electrically connected to the processor, and configured to store user data. The memory stores instructions that allow, when executed, the processor to: control the power management circuit to supply a test voltage, which is a voltage reduced from an operating voltage of the electronic device; execute a specified test scenario based on the test voltage; acquire device state data including reduced voltage test data acquired as a result of executing the test scenario; acquire a failure occurrence prediction result, which is a result of inputting the device state data into a prediction model; and change an operation setting of the electronic device or back up the user data based on the failure occurrence prediction result. Accordingly, the user data is protected. Various other embodiments identified through the specification are possible.

Description

An electronic device that predicts a defect and a control method of the electronic device {ELECTRONIC DEVICE FOR PREDICTING FAULTY AND METHOD FOR CONTROLLING ELECTRONIC DEVICE THEREOF}

The embodiments disclosed in this document relate to a technology for predicting a failure of an electronic device.

As technology advances, the processing performance of the electronic device is improved and the task to be processed by the electronic device becomes complicated, the complexity of the components constituting the electronic device increases. For example, a semiconductor device such as a processor or memory may have high integration and high complexity. In the process of manufacturing these devices, it is difficult to know whether the manufactured devices have good quality with the naked eye of a person. Therefore, devices for testing whether the electronic device operates normally are used.

One of several methods for determining whether a device is defective is a method using machine learning. The method of determining whether a device is defective using machine learning is to use machine learning to learn feature data related to whether the device is defective, and then use the features of the device to be tested based on the learning result. This is to predict whether the device is defective. There are several learning models for machine learning as well. As a self-learning model through errors developed in the field of machine learning, there are a wide variety of neural network models. For example, machine learning models used for prediction include a support vector machine (SVM) and a random forest. Recently, predictive models based on neural networks are gradually being introduced, and all of these machine learning models have been verified for performance in fields such as images and speech. The models also showed good classification performance in the field of failure prediction.

Since electronic devices deteriorate as time elapses or users use them, there are cases in which an electronic device that was operating normally at the time of manufacture is distributed in the market and reaches the purchaser, or a failure may occur when the purchaser has not been used. . Accordingly, a manufacturer of an electronic device needs a device capable of predicting whether an electronic device manufactured not only at the time of manufacture but also after a period of time has elapsed is a device with a high probability of causing a failure.

In addition, when an electronic device causes a failure, there may be a problem that user data generated or acquired by the electronic device is lost while the user uses the electronic device. Therefore, there is a need for a technology to prevent loss of user data.

An electronic device according to an embodiment disclosed in the present document may include a power management circuit, a processor electrically connected to the power management circuit, and a memory electrically connected to the processor and configured to store user data. The memory, when executed, controls the power management circuit so that the processor supplies a reduced test voltage from the operating voltage of the electronic device, executes a specified test scenario based on the test voltage, and executes the test scenario Acquire device state data including decompression test data obtained as a result of executing the device state data, obtain a failure prediction result, which is a result of inputting the device state data into a predictive model, and obtain the electronic device based on the failure prediction result. Instructions for changing an operation setting of a device or for backing up the user data may be stored.

In addition, the method according to an embodiment disclosed in this document includes an operation of executing a designated test scenario based on a test voltage reduced from an operating voltage of an electronic device, and decompression test data obtained as a result of executing the test scenario. An operation of acquiring the device state data to be included, an operation of obtaining a failure occurrence prediction result that is a result of inputting the device state data into a predictive model, and an operation of changing an operation setting of the power management circuit based on the failure occurrence prediction result Alternatively, the operation of backing up user data stored in the electronic device based on a result of the failure prediction may be included.

In addition, the storage medium according to an embodiment disclosed in this document includes an operation of executing a designated test scenario based on a test voltage reduced from an operating voltage of an electronic device, and decompression test data obtained as a result of executing the test scenario. Acquiring device state data, acquiring a failure prediction result that is a result of inputting the device state data into a prediction model, and changing an operation setting of the power management circuit based on the failure prediction result It may include a program to perform an operation or a process including an operation of backing up user data stored in the electronic device based on the prediction result of the failure occurrence.

According to embodiments disclosed in the present document, a method and apparatus for selecting a defective product by determining a product defect using a failure prediction technology are provided.

In addition, according to embodiments disclosed in the present document, a method and apparatus for protecting user data by predicting the occurrence of a product failure are provided.

In addition to this, various effects that are directly or indirectly identified through this document can be provided.

1 illustrates an electronic device in a network environment according to various embodiments of the present disclosure.
2 is a block diagram illustrating a structure for predicting a failure of an electronic device in a process of manufacturing an electronic device, according to an exemplary embodiment.
3 is a flowchart illustrating a process by which a test device predicts a failure of an electronic device, according to an exemplary embodiment.
4 illustrates an example of a prediction result output from a test apparatus, according to an embodiment.
5 illustrates a structure in which a processor performs a decompression test according to an embodiment.
6 is a block diagram illustrating a structure of an electronic device according to an exemplary embodiment.
7 is a flowchart illustrating a process performed by an electronic device to protect user data according to an embodiment.
8 is a flowchart illustrating a process performed by an electronic device to protect user data according to another exemplary embodiment.
9 illustrates an example of a message related to an automatic backup setting output from an electronic device according to an embodiment.
10 illustrates an example of a user interface that an electronic device outputs to select an improvement item according to an embodiment.
11 illustrates an example of a user interface that an electronic device outputs to select an improvement item according to another embodiment.
In connection with the description of the drawings, the same or similar reference numerals may be used for the same or similar components.

Hereinafter, various embodiments of the present invention will be described with reference to the accompanying drawings. However, this is not intended to limit the present invention to a specific embodiment, it should be understood to include various modifications, equivalents, and/or alternatives of the embodiments of the present invention.

1 is a block diagram of an electronic device 101 in a network environment 100 according to various embodiments. Referring to FIG. 1, in a network environment 100, the electronic device 101 communicates with the electronic device 102 through a first network 198 (for example, a short-range wireless communication network), or a second network 199 It is possible to communicate with the electronic device 104 or the server 108 through (eg, a long-distance wireless communication network). According to an embodiment, the electronic device 101 may communicate with the electronic device 104 through the server 108. According to an embodiment, the electronic device 101 includes a processor 120, a memory 130, an input device 150, an audio output device 155, a display device 160, an audio module 170, and a sensor module ( 176, interface 177, haptic module 179, camera module 180, power management module 188, battery 189, communication module 190, subscriber identification module 196, or antenna module 197 ) Can be included. In some embodiments, at least one of these components (eg, the display device 160 or the camera module 180) may be omitted or one or more other components may be added to the electronic device 101. In some embodiments, some of these components may be implemented as one integrated circuit. For example, the sensor module 176 (eg, a fingerprint sensor, an iris sensor, or an illuminance sensor) may be implemented while being embedded in the display device 160 (eg, a display).

The processor 120, for example, executes software (eg, a program 140) to implement at least one other component (eg, a hardware or software component) of the electronic device 101 connected to the processor 120. It can be controlled and can perform various data processing or operations. According to an embodiment, as at least part of data processing or operation, the processor 120 may store commands or data received from other components (eg, the sensor module 176 or the communication module 190) to the volatile memory 132. The command or data stored in the volatile memory 132 may be processed, and result data may be stored in the nonvolatile memory 134. According to an embodiment, the processor 120 includes a main processor 121 (eg, a central processing unit or an application processor), and a secondary processor 123 (eg, a graphic processing unit, an image signal processor) that can be operated independently or together , A sensor hub processor, or a communication processor). Additionally or alternatively, the coprocessor 123 may be set to use lower power than the main processor 121 or to be specialized for a designated function. The secondary processor 123 may be implemented separately from the main processor 121 or as a part thereof.

The coprocessor 123 is, for example, on behalf of the main processor 121 while the main processor 121 is in an inactive (eg, sleep) state, or the main processor 121 is active (eg, an application is executed). ) While in the state, together with the main processor 121, at least one of the components of the electronic device 101 (for example, the display device 160, the sensor module 176, or the communication module 190) It is possible to control at least some of the functions or states related to. According to an embodiment, the coprocessor 123 (eg, an image signal processor or a communication processor) may be implemented as part of another functionally related component (eg, the camera module 180 or the communication module 190). have.

The memory 130 may store various data used by at least one component of the electronic device 101 (eg, the processor 120 or the sensor module 176). The data may include, for example, software (eg, the program 140) and input data or output data for commands related thereto. The memory 130 may include a volatile memory 132 or a nonvolatile memory 134.

The program 140 may be stored as software in the memory 130, and may include, for example, an operating system 142, middleware 144, or an application 146.

The input device 150 may receive a command or data to be used for a component of the electronic device 101 (eg, the processor 120) from an outside (eg, a user) of the electronic device 101. The input device 150 may include, for example, a microphone, a mouse, a keyboard, or a digital pen (eg, a stylus pen).

The sound output device 155 may output an sound signal to the outside of the electronic device 101. The sound output device 155 may include, for example, a speaker or a receiver. The speaker can be used for general purposes such as multimedia playback or recording playback, and the receiver can be used to receive incoming calls. According to one embodiment, the receiver may be implemented separately from the speaker or as part of it.

The display device 160 may visually provide information to the outside of the electronic device 101 (eg, a user). The display device 160 may include, for example, a display, a hologram device, or a projector and a control circuit for controlling the device. According to an embodiment, the display device 160 may include a touch circuitry set to sense a touch, or a sensor circuit (eg, a pressure sensor) set to measure the strength of a force generated by the touch. have.

The audio module 170 may convert sound into an electric signal or, conversely, convert an electric signal into sound. According to an embodiment, the audio module 170 acquires sound through the input device 150, the sound output device 155, or an external electronic device (for example, an external electronic device directly or wirelessly connected to the electronic device 101). Sound may be output through the electronic device 102 (for example, a speaker or headphones).

The sensor module 176 detects an operating state (eg, power or temperature) of the electronic device 101, or an external environmental state (eg, a user state), and generates an electrical signal or data value corresponding to the detected state. can do. According to an embodiment, the sensor module 176 may include, for example, a gesture sensor, a gyro sensor, an atmospheric pressure sensor, a magnetic sensor, an acceleration sensor, a grip sensor, a proximity sensor, a color sensor, an IR (infrared) sensor, a biometric sensor, It may include a temperature sensor, a humidity sensor, or an illuminance sensor.

The interface 177 may support one or more designated protocols that may be used for the electronic device 101 to directly or wirelessly connect with an external electronic device (eg, the electronic device 102 ). According to an embodiment, the interface 177 may include, for example, a high definition multimedia interface (HDMI), a universal serial bus (USB) interface, an SD card interface, or an audio interface.

The connection terminal 178 may include a connector through which the electronic device 101 can be physically connected to an external electronic device (eg, the electronic device 102 ). According to an embodiment, the connection terminal 178 may include, for example, an HDMI connector, a USB connector, an SD card connector, or an audio connector (eg, a headphone connector).

The haptic module 179 may convert an electrical signal into a mechanical stimulus (eg, vibration or movement) or an electrical stimulus that a user can perceive through a tactile or motor sense. According to an embodiment, the haptic module 179 may include, for example, a motor, a piezoelectric element, or an electrical stimulation device.

The camera module 180 may capture a still image and a video. According to an embodiment, the camera module 180 may include one or more lenses, image sensors, image signal processors, or flashes.

The power management module 188 may manage power supplied to the electronic device 101. According to an embodiment, the power management module 188 may be implemented as, for example, at least a part of a power management integrated circuit (PMIC).

The battery 189 may supply power to at least one component of the electronic device 101. According to an embodiment, the battery 189 may include, for example, a non-rechargeable primary cell, a rechargeable secondary cell, or a fuel cell.

The communication module 190 is a direct (eg, wired) communication channel or a wireless communication channel between the electronic device 101 and an external electronic device (eg, electronic device 102, electronic device 104, or server 108). It is possible to support establishment and communication through the established communication channel. The communication module 190 operates independently of the processor 120 (eg, an application processor), and may include one or more communication processors that support direct (eg, wired) communication or wireless communication. According to an embodiment, the communication module 190 is a wireless communication module 192 (eg, a cellular communication module, a short-range wireless communication module, or a global navigation satellite system (GNSS) communication module) or a wired communication module 194 (eg : A LAN (local area network) communication module, or a power line communication module) may be included. Among these communication modules, a corresponding communication module is a first network 198 (for example, a short-range communication network such as Bluetooth, WiFi direct or IrDA (infrared data association)) or a second network 199 (for example, a cellular network, the Internet, Alternatively, it may communicate with the external electronic device 104 through a computer network (eg, a telecommunication network such as a LAN or WAN). These various types of communication modules may be integrated into one component (eg, a single chip), or may be implemented as a plurality of separate components (eg, multiple chips). The wireless communication module 192 uses subscriber information (e.g., International Mobile Subscriber Identifier (IMSI)) stored in the subscriber identification module 196 in a communication network such as the first network 198 or the second network 199. The electronic device 101 can be checked and authenticated.

The antenna module 197 may transmit a signal or power to the outside (eg, an external electronic device) or receive from the outside. According to an embodiment, the antenna module 197 may include one antenna including a conductor formed on a substrate (eg, a PCB) or a radiator formed of a conductive pattern. According to an embodiment, the antenna module 197 may include a plurality of antennas. In this case, at least one antenna suitable for a communication method used in a communication network such as the first network 198 or the second network 199 is, for example, provided by the communication module 190 from the plurality of antennas. Can be chosen. The signal or power may be transmitted or received between the communication module 190 and an external electronic device through the at least one selected antenna. According to some embodiments, other components (eg, RFIC) other than the radiator may be additionally formed as part of the antenna module 197.

At least some of the components are connected to each other through a communication method (e.g., bus, general purpose input and output (GPIO), serial peripheral interface (SPI), or mobile industry processor interface (MIPI))) between peripheral devices and signals ( E.g. commands or data) can be exchanged with each other.

According to an embodiment, commands or data may be transmitted or received between the electronic device 101 and the external electronic device 104 through the server 108 connected to the second network 199. Each of the external electronic devices 102 and 104 may be a device of the same or different type as the electronic device 101. According to an embodiment, all or part of the operations executed by the electronic device 101 may be executed by one or more of the external electronic devices 102, 104, or 108. For example, when the electronic device 101 needs to perform a function or service automatically or in response to a request from a user or another device, the electronic device 101 does not execute the function or service by itself. In addition or in addition, it is possible to request one or more external electronic devices to perform the function or at least part of the service. One or more external electronic devices receiving the request may execute at least a part of the requested function or service, or an additional function or service related to the request, and transmit the execution result to the electronic device 101. The electronic device 101 may process the result as it is or additionally and provide it as at least a part of a response to the request. To this end, for example, cloud computing, distributed computing, or client-server computing technology may be used.

FIG. 2 is a block diagram 200 illustrating a structure for predicting a defect of an electronic device in a process of manufacturing an electronic device (eg, the electronic device 101 of FIG. 1) according to an exemplary embodiment.

The training device 210 and the test device 230 may be computing devices including a processor and a memory. According to an embodiment, the training device 210 and the test device 230 may be physically implemented as one device. According to another embodiment, the training device 210 and the test device 230 may be implemented as separate physical devices.

According to an embodiment, the test device 230 may be implemented using a component included in the electronic device 101. That is, the test device 230 may be included in the electronic device 101. For example, after the firmware for obtaining the device status data 206 by testing the electronic device 101 is downloaded to the electronic device 101, the electronic device 101 performs the test by executing the downloaded firmware. And, the device state data 206 may be obtained.

According to another embodiment, the test device 230 may be a computing device having separate hardware from the electronic device 101.

According to an embodiment, the test device 230 may predict a failure of the electronic device using the prediction model 204. Depending on the embodiment, the prediction model 204 may be configured in various forms. According to an embodiment, the training device 210 may learn the training data 202 based on the machine learning model to construct the prediction model 204. The machine learning model may include, for example, a support vector machine, a random forest, or a deep neural network.

According to an embodiment, the training data 202 has data obtained as a result of testing various devices (eg, decompression test data, current value) and production data obtained in the process as a feature vector, It may be data having a label indicating whether or not a defect has occurred. Production data is, for example, temperature, time, and process test results measured during the production of the device (e.g., kernel panic count, watchdog reset count, or reset count value). It may include. Watchdog reset means that the device is reset by a watchdog timer (WDT) included in the device. At least one item included in the training data 202 may include at least one item included in the device state data 206. For example, if the device status data 206 includes decompression test data for the test object 201 and a value for the current measured during execution of the test scenario, the training data 202 may also be used for several devices. Decompression test data and current values may be included.

The test device 230 may test the test object 201 to obtain device state data 206 for the electronic device 101. Here, the device state data 206 may include feature data that can be input to the predictive model 204. The test object 201 may include an electronic device 101 that has been manufactured, a component (eg, a processor, a memory) to be included in the electronic device 101, or a board assembly (eg, a Printed Board Assembly) on which the component is mounted. .

According to an embodiment, the device state data 206 may include decompression test data obtained by performing a decompression test on the test object 201 by the test apparatus 230. As the circuit included in the electronic device 101 is deteriorated by the use of the electronic device 101, the voltage supplied to the configuration of the electronic device 101 may be lowered. Accordingly, components of the electronic device 101 such as a processor or a memory may be configured to have a voltage margin for normal operation even when the supplied voltage is lowered. Decompression testing the operation of the test object 201 using the reduced test voltage from the typical operating voltage of the electronic device in order to determine that the quality of the test object 201 that has not sufficiently secured the voltage margin is poor. Tests can be used. According to an embodiment, the test voltage may have a voltage value reduced to a range of -5% to -7% from the operating voltage. For example, when the operating voltage is 1 V, the test voltage may be a voltage within a range of 0.93 V to 0.95 V.

The test device 230 may cause the test object 201 to execute a specified test scenario based on the test voltage. The test device 230 may obtain decompression test data including information on whether the test object 201 normally executes the test scenario. For example, the decompression test data is performed through a process in which the test object 201 compresses and/or decompresses data, DIJKSTRA operation, CRYPTO operation, NENO operation, or MEMORY TEST operation based on the reduced test voltage. It may include vector data composed of information on the magnitude of the voltage margin of the test object 201 or information on a kernel panic, a watchdog reset, or lockup that occurs with respect to the test object 201.

According to an embodiment, a decompression test may be performed for each domain on the test object 201 to obtain decompression test data. That is, the test target 201 may execute a test scenario designated for each domain based on the test voltage. For example, test scenarios including Unzip, C2, Cache, and Crypto may be executed for a large core (BIG core), and test scenarios including Memtest may be executed for a memory interface. The decompression test data may include vector data obtained for each domain. The test scenario may mean a set of instructions for causing the electronic device to perform at least one operation in order to determine whether the electronic device operates normally.

According to an embodiment, the device state data 206 may include information on a current value measured while the test object 201 is executing a test scenario. When the current value supplied to the domain is collected while the test scenario for the designated domain is being executed, the test device 230 may obtain the device status data 206 including the average value of the collected current values. When a device corresponding to the designated domain has a problem, it consumes more current than a normal device, and thus an average value of the current value can be used to determine whether the device is defective.

According to an embodiment, the device state data 206 may include production data obtained during the manufacturing process of the test object 201. For example, the device status data 206 may include temperature, time, and process test results (eg, kernel panic count, watchdog reset count, or reset count value) measured in the manufacturing process of the device.

The test device 230 may input device state data 206 into the predictive model 204. According to an embodiment, when the test device 230 is configured as a separate device from the training device 210, the test device 230 downloads the prediction model 204, and the device state data in the downloaded prediction model 204 You can enter (206). According to another embodiment, the test device 230 may transmit the device state data 206 to a device (eg, an external server) having the predictive model 204. According to another embodiment, the test device 230 may directly input the execution result data 206 into the prediction model. For example, the training device 210 and the test device 230 are configured as one device, and the device configures the prediction model 204, and the execution result data 206 is input to the configured prediction model 204. can do.

The test device 230 may receive a prediction score from the prediction model 204 into which the device state data 206 is input. The test device 230 may output the prediction result through the output device. The output device may be a device included in the test device 230, or may be an external device connected to the test device 230 to enable communication. The output device may be, for example, a display device, an audio output device, or a communication module. The test device 230 may determine the test pass or fail for the test object 201 according to the predicted score. The test device 230 may output a prediction result including a message according to the determined test pass or failure. The manufacturer of the electronic device may determine whether to actually produce and sell the test object 201 using the prediction result. According to an embodiment, if the test object 201 is the completed electronic device 101, the electronic device 101 determines that the test for the electronic device 101 has failed according to the predicted score, the electronic device 101 May execute a process of backing up data stored in the electronic device 101.

According to an embodiment, the test device 230 may update the prediction model 204 based on the acquired device state data 206. For example, the test device 230 uses a reinforcement learning algorithm to update the predictive model 204 based on the predicted result of the predictive model 204 from the device state data 206. It may include an agent that does.

FIG. 3 is a flowchart 300 illustrating a process of predicting a defect of an electronic device (eg, the electronic device 101 of FIG. 1) by a test device (eg, the test device 230 of FIG. 3 ), according to an exemplary embodiment. to be.

According to an embodiment, in operation 310, the test device may acquire device state data on the electronic device to be tested. The device status data may include at least one of decompression test data, average current value, and production data.

In operation 320, the test device may input the acquired device state data into the prediction model. The test device may receive a prediction score from a prediction model inputting device state data.

In operation 330, the test device may output a prediction result based on the prediction score. For example, the test device may output a message indicating information on the test pass or fail of the electronic device using a display device, an audio output device, or a communication module.

4 illustrates an example of a prediction result output from a test device (eg, the test device 230 of FIG. 2) according to an embodiment.

According to an embodiment, the test device 230 may output a prediction result including a failure message 410 indicating that the test target device failed the test when the prediction score is expected to cause a defect. have.

Conversely, when the prediction score is included in a range in which defects are not expected to occur, the test device 230 may output a prediction result including a pass message 420 indicating that the device to be tested is a normal device.

5 illustrates a structure in which a processor (eg, the processor 120 of FIG. 1) performs a decompression test according to an embodiment.

According to an embodiment, an electronic device (eg, the electronic device 101 of FIG. 1) may include a processor 120 and a power management circuit 520. According to an embodiment, the processor 120 may be an application processor (AP). In order to perform the decompression test, the power management circuit 520 may provide a test voltage to the domain to be subjected to the decompression test. Here, the test voltage may be a voltage reduced by a specified ratio from the general operating voltage of the electronic device. According to an embodiment, the test voltage may have a voltage value reduced to a range of -5% to -7% from the operating voltage.

The processor 120 may execute at least one test scenario based on the test voltage. According to an embodiment, the processor 120 may execute a test scenario according to the domain in which the decompression test is performed. For example, the processor 120 may execute an Unzip scenario, a c2 scenario, a cache scenario, and a crypto scenario to perform a pressure test on the large core domain 511. The processor 120 may also execute an Unzip scenario, a c2 scenario, a cache scenario, and a crypto scenario for the middle core domain 512 and the small core domain 513. The processor 120 may execute a memtest scenario for testing a memory operation on the memory interface domain 514.

The power management circuit 520 may include a current monitoring logic 521 for monitoring current supplied to the electronic device and an analog digital converter 522. The analog-to-digital converter 522 may acquire a current value supplied to a domain of an electronic device designated as a target for executing the test scenario while the processor 120 executes the test scenario. The current value obtained through the analog-to-digital converter 522 may be collected by the current monitoring logic 521 and transmitted to the processor 120. Alternatively, the current value may be used as input data of the prediction model.

6 is a block diagram 600 illustrating a structure of an electronic device 610 (eg, the electronic device 101 of FIG. 1) according to an exemplary embodiment.

According to an embodiment, the electronic device 610 includes a processor 611 (eg, the processor 120 of FIG. 1 ), a memory 613 (eg, the memory 130 of FIG. 1), and a power management circuit 615. (Example: the power management circuit 520 of FIG. 5), a communication circuit 617 (eg, the communication module 190 of FIG. 1) and an output device 619 (eg, the display device 160 of FIG. 1, sound) It may include an output device 155 and a connection terminal 178. However, FIG. 6 is for explaining an exemplary embodiment, and some components may be omitted or changed.

The memory 613 may store instructions for causing the processor 611 to process data or control the electronic device 610. In this specification, the operation of the processor 611 or the electronic device 610 may be understood as being performed by the processor 611 executing instructions stored in the memory 613.

According to an embodiment, when a trigger event occurs in the electronic device 610, the processor 611 may test the operation state of the electronic device 610. The trigger event may mean that the electronic device 610 is abnormally reset. For example, if the electronic device 610 is turned on again after the power is turned off without an input of a power button provided in the electronic device 610, the processor 611 may determine that a trigger event has occurred. have. For another example, the processor 611 may include a watchdog timer (not shown), and when it is recorded in the registry that the operation of the processor 611 is stopped by the watchdog timer, the processor 611 It may be determined that the electronic device 610 has been abnormally reset. The processor 611 may obtain device state data as a result of testing the operating state of the electronic device 610. The device status data may include decompression test data, current values, and device usage data.

According to an embodiment, the processor 611 may perform a decompression test to test the operating state of the electronic device 610. The processor 611 may control the power management circuit 615 to supply a test voltage having a voltage value lower than the general operating voltage, and execute a test scenario based on the test voltage. The processor 611 may obtain decompression test data based on a result of executing the test scenario. When a failure such as lockup occurs while the processor 611 executes the test scenario, a watchdog timer (not shown) included in the processor 611 may reset the operating state of the processor 611. have. Therefore, outside of the electronic device 610, it is not possible to know whether a failure occurs in the process of executing the test scenario.

According to an embodiment, the processor 611 may obtain information on a current value measured while a test scenario is being executed from the power management circuit 615.

The processor 611 may store device use data in the memory 613 while the electronic device 610 operates. The device use data may include information on a use environment of the electronic device or information on an operation history according to the use of the electronic device 610. Information on the use environment of the electronic device 610 may include information measured using, for example, a sensor module (eg, the sensor module 176 of FIG. 1 ). The information on the operation history may include, for example, a history in which the electronic device 610 has been reset, a history in which a watchdog has occurred, or a history related to the battery operation of the electronic device 610.

The processor 611 may obtain a failure prediction result, which is a result of inputting device state data into the prediction model. According to an embodiment, the processor 611 may transmit device state data to the external server 620 having the prediction model through the communication circuit 617 in order to obtain a failure prediction result. The processor 611 may obtain a failure prediction result from the external server 620 through the communication circuit 617. According to another embodiment, the memory 613 may store a prediction model. For example, the processor 611 may download the prediction model from the external server 620 that provides the prediction model through the communication circuit 617. The processor 611 may acquire a failure prediction result by using the prediction model stored in the memory 613.

According to an embodiment, the processor 611 may change an operation setting of the electronic device 610 based on a result of predicting a failure occurrence. The processor 611 may determine an improvement item for changing the operation setting of the electronic device 610 based on the predicted failure occurrence result, and may change the operation setting of the electronic device 610 based on the determined improvement item. For example, a failure occurs during operation by some DVFS level among a plurality of dynamic voltage and frequency scaling (DVFS) levels in which the failure prediction result is a voltage supplied by the power management circuit 615 In the case of indicating that this is to be performed, the processor 611 may exclude the DVFS level, which is a problem, from the operation scenarios of the power management circuit 615 to the processor 611.

According to an embodiment, the processor 611 may control the output device 619 to output a message including information on an improvement item for changing an operation setting of the electronic device 610. Further, the processor 611 may receive a user response to a message output through an input device (not shown) (eg, the input device 150 of FIG. 1 ). For example, the processor 611 may receive a user input for selecting an improvement item. The processor 611 may change the operation setting of the electronic device 610 based on the improvement item in response to a user input.

According to an embodiment, the processor 611 may perform an operation for backing up user data stored in the memory 613 based on a result of predicting a failure occurrence. User data refers to data generated while a user uses the electronic device 610. For example, the user data may be a file generated by a user using an application installed in the electronic device 610.

According to an embodiment, the processor 611 may output a user interface for checking whether the backup operation is executed through the output device 619. According to another embodiment, the processor 611 may automatically back up user data stored in the memory 613. When the processor 611 wants to perform an operation of automatically backing up user data, the processor 611 may check whether an automatic backup function is set in the electronic device 610. When an automatic backup function is set in the electronic device 610, the processor 611 may execute a process for backing up user data. When the automatic backup function is not set in the electronic device 610, the processor 611 outputs a message inducing the automatic backup function to be set through the output device 619 or a message for confirming whether the backup operation is executed. You may. When the backup process is executed, the processor 611 may transmit user data to an external storage medium or an external server (eg, a cloud server) through the communication circuit 617 to back up the user data.

According to an embodiment, the failure prediction result obtained through the prediction model may include a prediction score indicating a probability of failure. The processor 611 may execute a process for backing up user data when the prediction score is equal to or greater than a specified threshold value. For example, the processor 611 may check the automatic backup setting of the electronic device 611 and, if the automatic backup function is not set, may output a message related to the automatic backup setting through the output device 619.

7 is a flowchart 700 illustrating a process performed by an electronic device (eg, the electronic device 101 of FIG. 1) to protect user data according to an exemplary embodiment.

In operation 710, the electronic device may determine whether a trigger event has occurred. For example, when the electronic device checks information indicating that the electronic device is abnormally terminated during the booting process, it may determine that a trigger event has occurred.

When it is determined that the trigger event has occurred, in operation 720, the electronic device may execute a test scenario based on a test voltage having a voltage value lower than that of a general operation voltage. In operation 730, the electronic device may acquire device state data including decompression test data based on a result of executing the test scenario.

According to an embodiment, the electronic device may check information on a voltage value while executing a test scenario, and the device state data may include information on the voltage value. Also, according to an embodiment, the device state data may further include device usage data.

In operation 740, the electronic device may input device state data into the prediction model. When a failure prediction result is obtained as a result of inputting the device status data into the prediction model, the electronic device can determine whether there is an improvement item that can improve the failure expected to occur in operation 750 based on the failure prediction result. have. If there is an improvement item, in operation 760, the electronic device may select the improvement item. For example, the electronic device may output a user interface through which a user can select an improvement item, and select an improvement item based on a user input input using the user interface. In operation 770, the electronic device may apply the selected improvement item to the operation setting of the electronic device. According to an embodiment, operations 760 and 770 may be automatically performed by the electronic device without user intervention.

If there is no improvement, in operation 752, the electronic device may determine whether an automatic backup function is set in the electronic device. When the automatic backup function is set, the electronic device may perform an operation 754 of backing up user data stored in the electronic device. For example, the electronic device may transmit user data to the backup server.

If the automatic backup function is not set, the electronic device may perform operation 756 of outputting a message related to automatic backup setting. The electronic device may determine whether to set the automatic backup function according to a user input for the message output in operation 756. When the automatic backup function is set in operation 758, the electronic device may perform operation 754.

FIG. 8 is a flowchart illustrating a process performed by the electronic device 610 (eg, the electronic device 101 of FIG. 1) to protect user data according to another embodiment.

In operation 801, the electronic device 610 may determine whether a trigger event has occurred. For example, when the electronic device 610 checks information indicating that the electronic device 610 is abnormally terminated during the booting process, it may determine that a trigger event has occurred.

When it is determined that the trigger event has occurred, in operation 803, the electronic device 610 may execute a test scenario based on a test voltage having a voltage value lower than that of a general operation voltage. In operation 805, the electronic device 610 may collect device state data including decompression test data based on a result of executing the test scenario.

According to an embodiment, the electronic device 610 may check information on a voltage value while executing a test scenario, and the device state data may include information on the voltage value. Also, according to an embodiment, the device state data may further include device usage data.

In operation 807, the electronic device 610 may transmit the collected device state data to the external server 620.

In operation 809, the external server 620 may input device state data into the predictive model. In operation 811, the external server 620 may obtain a failure prediction result as a result of inputting device state data into the prediction model. The external server 620 that has obtained the failure prediction result may transmit the failure prediction result obtained in operation 813 to the electronic device 610. In operation 815, the electronic device 610 may perform an operation according to the received prediction result of failure. For example, the electronic device 610 may perform operations corresponding to operations 750 to 770 of FIG. 7.

9 illustrates an example of a message 910 related to automatic backup setting output by the electronic device 900 (eg, the electronic device 101 of FIG. 1) according to an embodiment.

According to an embodiment, when a failure prediction result indicates that a failure will occur, but the automatic backup function is not set, the electronic device 900 may display a message 910 related to automatic backup setting. Also, the electronic device 900 may display a user interface 920 for receiving a user input instructing to set the automatic backup function. The electronic device 900 may set an automatic backup function for user data stored in the electronic device 900 in response to a user input for selecting the user interface 920.

10 illustrates an example of a user interface that the electronic device 1000 (eg, the electronic device 101 of FIG. 1) outputs to select an improvement item according to an embodiment.

Referring to FIG. 10, when a DVFS level is L11 based on a prediction result of a failure, when a failure occurs in the electronic device 1000, the electronic device 1000 according to an embodiment sets L11 in an operation scenario of the electronic device. A message 1010 that induces to be excluded may be output. When a user input for selecting the button 1020 for moving to the DVFS level setting screen is received, the electronic device 1000 may output a screen for selecting the DVFS level. When a user input for selecting the setting button 1030 is received while the DVFS level is selected, the electronic device 1000 may apply the selected DVFS level to the operation scenario of the electronic device 1000.

11 illustrates an example of a user interface that is output by the electronic device 1100 (eg, the electronic device 101 of FIG. 1) according to another embodiment to select an improvement item.

Referring to FIG. 11, when a DVFS level is L11 based on a failure prediction result, when a failure occurs in the electronic device 1100, the electronic device 1100 according to an embodiment sets L11 in an operation scenario of the electronic device. A message 1110 confirming whether to set to be excluded may be output. When the electronic device 1100 receives a user input for selecting the setting button 1120, the electronic device 1100 may set the DVFS level selected from the operation scenario of the electronic device 1100 to be excluded.

Electronic devices according to various embodiments disclosed in this document may be devices of various types. The electronic device may include, for example, a portable communication device (eg, a smart phone), a computer device, a portable multimedia device, a portable medical device, a camera, a wearable device, or a home appliance. The electronic device according to the embodiment of the present document is not limited to the above-described devices.

Various embodiments of this document and terms used therein are not intended to limit the technical features described in this document to specific embodiments, and should be understood to include various modifications, equivalents, or substitutes of the corresponding embodiments. In connection with the description of the drawings, similar reference numerals may be used for similar or related components. The singular form of a noun corresponding to an item may include one or a plurality of the items unless clearly indicated otherwise in a related context. In this document, “A or B”, “at least one of A and B”, “at least one of A or B”, “A, B or C”, “at least one of A, B and C” and “A, Each of phrases such as "at least one of B or C" may include any one of the items listed together in the corresponding one of the phrases, or all possible combinations thereof. Terms such as "first", "second", or "first" or "second" may be used simply to distinguish the component from other corresponding components, and the components may be referred to in other aspects (eg, importance or Order) is not limited. Some (eg, first) component is referred to as “coupled” or “connected” to another (eg, second) component, with or without the terms “functionally” or “communicatively”. When mentioned, it means that any of the above components can be connected to the other components directly (eg by wire), wirelessly, or via a third component.

The term "module" used in this document may include a unit implemented in hardware, software, or firmware, and may be used interchangeably with terms such as logic, logic blocks, parts, or circuits. The module may be an integrally configured component or a minimum unit of the component or a part thereof that performs one or more functions. For example, according to an embodiment, the module may be implemented in the form of an application-specific integrated circuit (ASIC).

Various embodiments of the present document include one or more instructions stored in a storage medium (eg, internal memory 136 or external memory 138) readable by a machine (eg, electronic device 101). It may be implemented as software (for example, the program 140) including them. For example, the processor (eg, the processor 120) of the device (eg, the electronic device 101) may call and execute at least one command among one or more commands stored from a storage medium. This makes it possible for the device to be operated to perform at least one function according to the at least one command invoked. The one or more instructions may include code generated by a compiler or code executable by an interpreter. The device-readable storage medium may be provided in the form of a non-transitory storage medium. Here,'non-transient' only means that the storage medium is a tangible device and does not contain a signal (e.g., electromagnetic waves), and this term refers to the case where data is semi-permanently stored in the storage medium. It does not distinguish between temporary storage cases.

According to an embodiment, a method according to various embodiments disclosed in the present document may be provided by being included in a computer program product. Computer program products can be traded between sellers and buyers as commodities. The computer program product is distributed in the form of a device-readable storage medium (e.g. compact disc read only memory (CD-ROM)), or through an application store (e.g. Play Store™) or two user devices (e.g. It can be distributed (e.g., downloaded or uploaded) directly between, e.g. smartphones) In the case of online distribution, at least a portion of the computer program product may be temporarily stored or temporarily generated in a storage medium that can be read by a device such as a server of a manufacturer, a server of an application store, or a memory of a relay server.

According to various embodiments, each component (eg, module or program) of the above-described components may include a singular number or a plurality of entities. According to various embodiments, one or more components or operations among the above-described corresponding components may be omitted, or one or more other components or operations may be added. Alternatively or additionally, a plurality of components (eg, a module or a program) may be integrated into one component. In this case, the integrated component may perform one or more functions of each component of the plurality of components in the same or similar to that performed by the corresponding component among the plurality of components prior to the integration. . According to various embodiments, operations performed by a module, program, or other component are sequentially, parallel, repeatedly, or heuristically executed, or one or more of the above operations are executed in a different order or omitted. Or one or more other actions may be added.

Claims (20)

In the electronic device,
Power management circuit;
A processor electrically connected to the power management circuit; And
A memory electrically connected to the processor and configured to store user data,
The memory, when executed, the processor,
Controlling the power management circuit to supply a reduced test voltage from the operating voltage of the electronic device,
Execute a specified test scenario based on the test voltage,
Acquiring device state data including decompression test data obtained as a result of executing the test scenario,
Obtaining a failure occurrence prediction result, which is a result of inputting the device state data into a prediction model,
An electronic device that stores instructions for changing an operation setting of the electronic device or backing up the user data based on a result of the failure prediction. The method according to claim 1,
The instructions are the processor,
Configured to obtain a current value supplied to the domain of the electronic device designated in the test scenario through the power management circuit while executing the test scenario,
The electronic device, wherein the device state data includes the current value. The method according to claim 2,
The power management circuit includes an analog to digital converter corresponding to the domain,
The instructions are the processor,
The electronic device configured to obtain the current value through the analog to digital converter. The method according to claim 1,
The processor,
An electronic device comprising a watchdog timer that resets an operating state of the processor when a failure occurs during the execution of the test scenario. The method according to claim 1,
The electronic device, wherein the prediction model is a prediction model generated as a result of performing machine learning on training data related to the device state data. The method according to claim 1,
The device status data includes device usage data including information on an operation environment measured when the electronic device is used by a user or an operation history of the electronic device. The method according to claim 1,
The memory is configured to store at least one test scenario each corresponding to at least one domain,
The instructions are the processor,
The electronic device, configured to obtain the decompression test data including vector data consisting of vector data obtained as a result of executing a test scenario for each of the at least one domain. The method according to claim 1,
The instructions are the processor,
The electronic device, configured to execute the test scenario when an abnormal reset of the electronic device occurs. The method according to claim 1,
The instructions are the processor,
Determine an improvement item for changing the operation setting of the electronic device based on the failure prediction result,
The electronic device, configured to change an operation setting of the electronic device based on the improvement item. The method of claim 9,
The above improvement items are:
The electronic device comprising a level to be excluded from among a plurality of dynamic voltage and frequency scaling levels used for operation of the processor. The method of claim 9,
The electronic device,
display; And
Further comprising an input device,
The instructions are the processor,
A message including information on the improvement item is output through the display,
Receiving a user input for the message through the input device,
The electronic device, configured to change an operation setting of the electronic device based on the improvement item in response to the user input. The method according to claim 1,
The electronic device further includes a display,
The instructions are the processor,
If the failure prediction result indicates that the probability of failure is greater than or equal to a specified value, check the automatic backup setting of the electronic device, and
The electronic device, configured to output a message related to the automatic backup setting through the display when the automatic backup of the electronic device is not set. The method according to claim 1,
The electronic device further comprises a communication circuit,
The instructions are the processor,
Through the communication circuit, transmitting the device state data to an external server equipped with the prediction model,
In response to the transmission of the device status data, the electronic device, configured to receive the failure prediction result from the external server through the communication circuit. In the method of controlling an electronic device,
Executing a specified test scenario based on a test voltage reduced from an operating voltage of the electronic device;
Acquiring device status data including decompression test data obtained as a result of executing the test scenario;
Obtaining a prediction result of failure occurrence, which is a result of inputting the device state data into a prediction model; And
And changing an operation setting of the power management circuit based on the predicted failure result, or backing up user data stored in the electronic device based on the predicted failure occurrence. The method of claim 14,
And obtaining a current value supplied to a domain of an electronic device designated in the test scenario through the power management circuit while executing the test scenario, and
Wherein the device state data includes the current value. The method of claim 14,
The predictive model is a predictive model generated as a result of machine learning on training data related to the device state data. The method of claim 14,
The device state data includes operation state data including information on an operation environment measured when the electronic device is used by a user or an operation history of the electronic device. The method of claim 14,
The operation of changing the operation setting of the power management circuit,
Determining an improvement item for changing an operation setting of the electronic device based on the predicted failure occurrence result, and
And changing an operation setting of the electronic device based on the improvement item. The method of claim 18,
The above improvement items are:
A level to be excluded from among a plurality of dynamic voltage and frequency scaling levels used for operation of a processor of the electronic device. In the method of predicting the failure of an electronic device,
Acquiring device state data including decompression test data obtained as a result of executing a specified test scenario based on the reduced test voltage from the operating voltage of the electronic device;
Inputting the device state data into a predictive model; And
And controlling an output device of the electronic device to output a prediction result of the prediction model.

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