JPS6045044A - Ic package - Google Patents

Ic package

Info

Publication number
JPS6045044A
JPS6045044A JP58152702A JP15270283A JPS6045044A JP S6045044 A JPS6045044 A JP S6045044A JP 58152702 A JP58152702 A JP 58152702A JP 15270283 A JP15270283 A JP 15270283A JP S6045044 A JPS6045044 A JP S6045044A
Authority
JP
Japan
Prior art keywords
internal wiring
chip
conductor
package
strip line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58152702A
Other languages
Japanese (ja)
Inventor
Hiroichi Murase
村瀬 博一
Tamio Tomosugi
友杉 民夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP58152702A priority Critical patent/JPS6045044A/en
Publication of JPS6045044A publication Critical patent/JPS6045044A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/58Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/64Impedance arrangements
    • H01L23/66High-frequency adaptations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1517Multilayer substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3011Impedance

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To contrive the alleviation of the impedance unmatching in a high frequency range by internal wiring by a method wherein the internal wiring is put in the structure of strip line. CONSTITUTION:A conductor 7 is provided via dielectric 8 under the internal wiring 2 connecting bonding wires 5 to external leads 3, and the conductor 7 is grounded; thereby constructing the strip line by means of the internal wiring 2 and the conductor 7. The width of the internal wiring 2 and the thickness of the dielectric 8 are so determined as to fit to input-output impedances of the IC chip and an IC external circuit. Thus, the influence of the internal wiring 2 on the operating characteristic of the chip 4 is alleviated.

Description

【発明の詳細な説明】 本発明は、ICチップを収納するパッケージ、特に高周
波域で動作するICチ、プを収納するに適したICパッ
ケージに関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a package for housing an IC chip, and particularly to an IC package suitable for housing an IC chip that operates in a high frequency range.

一般のセラミックパッケージ集伊回路では、第1図に示
すように、ICチップ4は、IC,<ツケージのパッケ
ージ基板1の上面中央間みに固着され、凹み周辺の平坦
部にメタライズされた導体2の一端とポンディング線5
により接続され、導体2の他端は外部リード3に接続さ
れ、キャップ6で蓋をして気密封止されて−・る。この
ような集積回路において、従来は、ICチップ4と夕1
部リード3との間にある導体(以下内部配線と(・5)
2につ(・ては、高周波域におけるインピーダンス等を
特に考慮したものはitとんどη、かっ7こ。内部配線
2のメタライズパターンも、細(・もの、太(・もの、
また、テーバ状のものなど様々で、インピーダンスとし
ては全く不揃いであった。その結果、高周波域において
は、ICチップとTC夕4部回路間にお(・てインピー
ダンスの平爪−合を生じ、反射による損失が増加し、周
波数特性劣化の原因とムっていた。
In a general ceramic package integrated circuit, as shown in FIG. One end of and bonding wire 5
The other end of the conductor 2 is connected to an external lead 3 and hermetically sealed with a cap 6. In such an integrated circuit, conventionally, an IC chip 4 and an IC chip 1 are connected to each other.
Conductor between lead 3 (hereinafter referred to as internal wiring (・5))
Second, the metallization pattern of the internal wiring 2 is also thin(・), thick(・), etc.
In addition, there were various types such as tapered ones, and the impedance was completely uneven. As a result, in the high frequency range, impedance matching occurs between the IC chip and the TC circuit, increasing loss due to reflection and causing deterioration of frequency characteristics.

本発明の目的は、収納したICグツズとICクト部回路
間のインピーダンスの不整合をたくりことのできるIC
パッケージを提供するにある。
An object of the present invention is to create an IC that can eliminate impedance mismatch between the stored IC goods and the IC block circuit.
There is a package to offer.

本発明のICパッケージは、ICチップと夕1部リード
との間の内部配線を、収納するICヲソプと外部回路の
入出力インピーダンスに等しい特性インピーダンスをも
つストリップライン構造としている。よって、内部配線
のチップの動作特性に及ぼす影響が軽減される。
In the IC package of the present invention, the internal wiring between the IC chip and the first lead has a stripline structure having a characteristic impedance equal to the input/output impedance of the IC chip and the external circuit. Therefore, the influence of internal wiring on the operating characteristics of the chip is reduced.

つぎに本発明を実施例により説明する。Next, the present invention will be explained by examples.

第2図は本発明の一実施例のICパッケージを用いた集
積回路の断面図、第3図は、第2図に示す集積回路のキ
ャップを除いて示した平面図である。第2図において、
ポンディング線5と外部リード3間を接続する内部配線
2の下部に誘電体8を介して導電体7を設ける。導電体
7を接地することにより、内部配線2と導電体7とでス
トリップラインを構成する。内部配線2の巾(W)及び
誘電体8の厚さくh)は、ICチップ及びIC外部回路
の入出力インピーダンスに適合するよう決める。例えば
、誘電体8にアルミナセラミ、りを使用し、インピーダ
ンス50Ωのストリップラインとするためには、W/h
Thlとする。導電体7は、第3図のようにすべての内
部配線2の下部全面に設けられ、すべての内部配線がス
トリップラインとして構成される。
FIG. 2 is a sectional view of an integrated circuit using an IC package according to an embodiment of the present invention, and FIG. 3 is a plan view of the integrated circuit shown in FIG. 2 with the cap removed. In Figure 2,
A conductor 7 is provided below the internal wiring 2 that connects the bonding wire 5 and the external lead 3 with a dielectric 8 interposed therebetween. By grounding the conductor 7, the internal wiring 2 and the conductor 7 form a strip line. The width (W) of the internal wiring 2 and the thickness (h) of the dielectric 8 are determined to match the input/output impedance of the IC chip and the IC external circuit. For example, in order to use alumina ceramic or resin for the dielectric 8 and make a strip line with an impedance of 50Ω, W/h
Thl. The conductor 7 is provided on the entire lower surface of all the internal wirings 2 as shown in FIG. 3, and all the internal wirings are configured as strip lines.

第4図は、本発明の第2の実施例に係る集積回路のキャ
ップを取り除いた平面図であり、導電体9は内部配線2
のうち、一部の内部配線の下部に設けられ、特定の内部
配線がストリップラインとして構成されたものである。
FIG. 4 is a plan view of an integrated circuit according to a second embodiment of the present invention with the cap removed.
Among these, the line is provided below some of the internal wiring, and the specific internal wiring is configured as a strip line.

なお、上記実施例では、水平方向に外部リードを出した
パッケージについて示しているが、外部リードが下方に
出るパッケージにつ(・ても、本発明を実施できる。
Although the above-mentioned embodiment shows a package in which the external leads extend in the horizontal direction, the present invention can also be practiced in a package in which the external leads extend downward.

本発明は以上説明したように、内部配線をストリップラ
イン構造にすることにより、内部配線による高周波域で
のインピーダンス不整合が軽減され、内部配線がチップ
の特性に与える影響を軽減するという効果がある。
As explained above, the present invention has the effect of reducing the impedance mismatch in the high frequency range due to the internal wiring by forming the internal wiring into a stripline structure, and reducing the influence of the internal wiring on the characteristics of the chip. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のICパッケージにICチップを収納した
集積回路の断面図、第2図は本発明の一実施例にICチ
、プを収納した集積回路の断面図、第3図は第2図の集
積回路のキャップを取り除(・た状態の部分平面図、第
4図は本発明の第2の実施例に係る集積回路のキ1ヤッ
プをを除(・た状態の部分平面図である。 l、11・・・・・・パッケージ基板、2・・・・・・
内部配線、3・・・・・・外部リード、4・・・・・・
ICチップ、5・・・・・・ボンディング線、6・・・
・・・キャップ、7・・・・・・締型体層、8.9・・
・・・・ストリップライン接地導電体。 代理人 弁理士 内 原 晋
FIG. 1 is a cross-sectional view of an integrated circuit in which an IC chip is housed in a conventional IC package, FIG. 2 is a cross-sectional view of an integrated circuit in which an IC chip is housed in an embodiment of the present invention, and FIG. FIG. 4 is a partial plan view of the integrated circuit according to the second embodiment of the present invention with the cap removed. Yes. l, 11...Package board, 2...
Internal wiring, 3...External lead, 4...
IC chip, 5... Bonding wire, 6...
...Cap, 7... Clamping body layer, 8.9...
...Stripline grounding conductor. Agent Patent Attorney Susumu Uchihara

Claims (1)

【特許請求の範囲】[Claims] ICチップを固着するパッケージ基板と、前記ICチッ
プと導t1接続される外部リードとを備えたICパッケ
ージにおいて、前記ICグツズと外部リードとの間の配
線が所望する一定インピーダンスのストリップラインで
形成されて(・ることを特命とするICパッケージ。
In an IC package including a package substrate to which an IC chip is fixed and an external lead connected to the IC chip, the wiring between the IC goods and the external lead is formed of a strip line having a desired constant impedance. An IC package whose special mission is to
JP58152702A 1983-08-22 1983-08-22 Ic package Pending JPS6045044A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58152702A JPS6045044A (en) 1983-08-22 1983-08-22 Ic package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58152702A JPS6045044A (en) 1983-08-22 1983-08-22 Ic package

Publications (1)

Publication Number Publication Date
JPS6045044A true JPS6045044A (en) 1985-03-11

Family

ID=15546276

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58152702A Pending JPS6045044A (en) 1983-08-22 1983-08-22 Ic package

Country Status (1)

Country Link
JP (1) JPS6045044A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62128549A (en) * 1985-11-29 1987-06-10 Nec Corp Ic package
JPS62179135A (en) * 1986-01-31 1987-08-06 Mitsubishi Electric Corp Microwave device module
EP0524763A3 (en) * 1991-07-22 1994-02-16 Motorola Inc

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62128549A (en) * 1985-11-29 1987-06-10 Nec Corp Ic package
JPS62179135A (en) * 1986-01-31 1987-08-06 Mitsubishi Electric Corp Microwave device module
EP0524763A3 (en) * 1991-07-22 1994-02-16 Motorola Inc

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