JPS5733497A - Memory testing system - Google Patents
Memory testing systemInfo
- Publication number
- JPS5733497A JPS5733497A JP10719680A JP10719680A JPS5733497A JP S5733497 A JPS5733497 A JP S5733497A JP 10719680 A JP10719680 A JP 10719680A JP 10719680 A JP10719680 A JP 10719680A JP S5733497 A JPS5733497 A JP S5733497A
- Authority
- JP
- Japan
- Prior art keywords
- memories
- data
- bit
- parts
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
Landscapes
- Detection And Correction Of Errors (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
PURPOSE:To perform a test for a memory including an address system test with a low cost, by dividing a memory into >=2pts. and supplying the same address signal from the adress selecting circuits corresponding to each of the divided two memories. CONSTITUTION:Address distributing parts 5 and 6 correspond to 4-bit memories 1-0 and 1-1 obtained by dividing an 8-bit memory into two parts, and the same address data ADD1 or ADDn is supplied to the parts 5 and 6 respectively. The upper 4 bits and the lower 4 bits of an 8-bit writing data WD are written into the designated addresses of the memories 1-0 and 1-1 respectively. At the same time, a check bit formed after being supplied to a parity generating circuit 3 is written into an area 17. The data RD read out of the memories 1-0 and 1-1 are transmitted to a parity checking circuit 19 to check wheter the correct writing and reading is carried out for the data.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55107196A JPS6035695B2 (en) | 1980-08-06 | 1980-08-06 | Memory test method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55107196A JPS6035695B2 (en) | 1980-08-06 | 1980-08-06 | Memory test method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5733497A true JPS5733497A (en) | 1982-02-23 |
JPS6035695B2 JPS6035695B2 (en) | 1985-08-16 |
Family
ID=14452907
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55107196A Expired JPS6035695B2 (en) | 1980-08-06 | 1980-08-06 | Memory test method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6035695B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008046979A (en) * | 2006-08-18 | 2008-02-28 | Fujitsu Ltd | Memory controller and control method |
-
1980
- 1980-08-06 JP JP55107196A patent/JPS6035695B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008046979A (en) * | 2006-08-18 | 2008-02-28 | Fujitsu Ltd | Memory controller and control method |
Also Published As
Publication number | Publication date |
---|---|
JPS6035695B2 (en) | 1985-08-16 |
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