JPS57157590A - Manufacture of semiconductor laser device - Google Patents
Manufacture of semiconductor laser deviceInfo
- Publication number
- JPS57157590A JPS57157590A JP4292281A JP4292281A JPS57157590A JP S57157590 A JPS57157590 A JP S57157590A JP 4292281 A JP4292281 A JP 4292281A JP 4292281 A JP4292281 A JP 4292281A JP S57157590 A JPS57157590 A JP S57157590A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- groove
- etched
- etching
- crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Weting (AREA)
- Semiconductor Lasers (AREA)
Abstract
PURPOSE:To effectively prevent the reflection of a laser light except the end face of a resonator in a semiconductor laser device by forming a deep etched groove in a wafer, then etching the top of the groove vertically in shallow, depth, and then isolating it along the groove. CONSTITUTION:Double hetero junctions made of an active layer 22 and clad layers 23, 24 are crystallized on a GaAs substrate 21, and an ohmic contacting crystal layer 25 is grown. Then, prescribed electrodes are formed. Subsequently, a mask 30 for isolating elements is formed on the wafer. With the mask 30, the elements are chemically etched. Thereafter, second etching for forming a crystalline surface becoming the reflecting surface is performed at the wafer. The depth of the etching may be the thickness corresponding to the epitaxial layer. The wafer thus formed is isolated into individual elements along the first etched groove. In the device thus formed, the end faces 31, 32 of the crystal vertically etched to the thickness corresponding to the epitaxial layer become reflecting surface. On the other hand, radiated laser light may not be reflected by the end face 33 of the crystal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4292281A JPS57157590A (en) | 1981-03-24 | 1981-03-24 | Manufacture of semiconductor laser device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4292281A JPS57157590A (en) | 1981-03-24 | 1981-03-24 | Manufacture of semiconductor laser device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57157590A true JPS57157590A (en) | 1982-09-29 |
Family
ID=12649508
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4292281A Pending JPS57157590A (en) | 1981-03-24 | 1981-03-24 | Manufacture of semiconductor laser device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57157590A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0276284A (en) * | 1988-09-12 | 1990-03-15 | Furukawa Electric Co Ltd:The | Manufacture of semiconductor laser |
JP2008108844A (en) * | 2006-10-24 | 2008-05-08 | Toyota Central R&D Labs Inc | Group iii nitride semiconductor device having trench or mesa-structure, and manufacturing method thereof |
WO2019186743A1 (en) * | 2018-03-28 | 2019-10-03 | 三菱電機株式会社 | Semiconductor laser element and production method therefor |
-
1981
- 1981-03-24 JP JP4292281A patent/JPS57157590A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0276284A (en) * | 1988-09-12 | 1990-03-15 | Furukawa Electric Co Ltd:The | Manufacture of semiconductor laser |
JP2008108844A (en) * | 2006-10-24 | 2008-05-08 | Toyota Central R&D Labs Inc | Group iii nitride semiconductor device having trench or mesa-structure, and manufacturing method thereof |
WO2019186743A1 (en) * | 2018-03-28 | 2019-10-03 | 三菱電機株式会社 | Semiconductor laser element and production method therefor |
JPWO2019186743A1 (en) * | 2018-03-28 | 2020-12-10 | 三菱電機株式会社 | Semiconductor laser device and its manufacturing method |
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