JPS5559330A - Simultaneous measuring method for refractive index and its dispersion - Google Patents

Simultaneous measuring method for refractive index and its dispersion

Info

Publication number
JPS5559330A
JPS5559330A JP13271478A JP13271478A JPS5559330A JP S5559330 A JPS5559330 A JP S5559330A JP 13271478 A JP13271478 A JP 13271478A JP 13271478 A JP13271478 A JP 13271478A JP S5559330 A JPS5559330 A JP S5559330A
Authority
JP
Japan
Prior art keywords
angle
wavelength
light
phi1b
phi1a
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13271478A
Other languages
Japanese (ja)
Other versions
JPS6054617B2 (en
Inventor
Nobuyuki Imoto
Akira Sugimura
Kazuhiro Oguro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP13271478A priority Critical patent/JPS6054617B2/en
Publication of JPS5559330A publication Critical patent/JPS5559330A/en
Publication of JPS6054617B2 publication Critical patent/JPS6054617B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To ensure the simultaneous performance of two measurement with one turntable device by measuring the light whose wavelength is slightly longer than the central wavelength of the light and the incident angle with which the short light shows a constant and equal deviation angle through the prism. CONSTITUTION:The area where the light given from wavelength variable light source 1 enters vertically to the face of orism 5 is defined as the zero degree of the revolving angle of sample stage 6. Then light position detector 4 is fixed at a proper position, and the wavelength of source 1 is set to lambda-DELTAlambda/2 to turn stage 6 and then stop the stage before several degrees to incident angle phi10 which gives the minimum deviation angle. The revolving angle of that moment is set to phi1a. After this, angle phi1b which is positioned at the area larger than incident angle phi10 and gives the same deviation angle is read. Then the wavelength of source 1 is set to lambda+DELTAlambda/2 to obtain the similar angles phi1a' and phi1b'. Based on the mean value of these angles, phi10 is obtained, and refractive index n is obtained from phi10 and through calculation. Then change DELTAn caused by angles phi1a and phi1a' plus phi1b and phi1b' are divided by change DELTAlambda of the wavelength to obtain refractive index dispersion dn/dlambda.
JP13271478A 1978-10-30 1978-10-30 Simultaneous measurement method of refractive index and refractive index dispersion Expired JPS6054617B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13271478A JPS6054617B2 (en) 1978-10-30 1978-10-30 Simultaneous measurement method of refractive index and refractive index dispersion

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13271478A JPS6054617B2 (en) 1978-10-30 1978-10-30 Simultaneous measurement method of refractive index and refractive index dispersion

Publications (2)

Publication Number Publication Date
JPS5559330A true JPS5559330A (en) 1980-05-02
JPS6054617B2 JPS6054617B2 (en) 1985-11-30

Family

ID=15087851

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13271478A Expired JPS6054617B2 (en) 1978-10-30 1978-10-30 Simultaneous measurement method of refractive index and refractive index dispersion

Country Status (1)

Country Link
JP (1) JPS6054617B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103048118A (en) * 2012-08-24 2013-04-17 王艳文 Method for quickly positioning minimum deviation angle of triple prism
CN106290255A (en) * 2016-10-26 2017-01-04 成都光明光电股份有限公司 The method of testing of infrarefraction rate in the middle part of 1700nm～2500nm

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110749423B (en) * 2019-09-23 2021-08-20 商丘师范学院 Method and system for measuring refractive index of prism

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103048118A (en) * 2012-08-24 2013-04-17 王艳文 Method for quickly positioning minimum deviation angle of triple prism
CN106290255A (en) * 2016-10-26 2017-01-04 成都光明光电股份有限公司 The method of testing of infrarefraction rate in the middle part of 1700nm～2500nm

Also Published As

Publication number Publication date
JPS6054617B2 (en) 1985-11-30

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