JPS52130277A - Transparent type scanning electronic microscope - Google Patents
Transparent type scanning electronic microscopeInfo
- Publication number
- JPS52130277A JPS52130277A JP4657976A JP4657976A JPS52130277A JP S52130277 A JPS52130277 A JP S52130277A JP 4657976 A JP4657976 A JP 4657976A JP 4657976 A JP4657976 A JP 4657976A JP S52130277 A JPS52130277 A JP S52130277A
- Authority
- JP
- Japan
- Prior art keywords
- electronic microscope
- type scanning
- scanning electronic
- transparent type
- transparent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
PURPOSE: To enable the transparent type scanning electronic microscope, by providing the light shield substance which is constituted so that the light emitting output is partially selected and transparent at the input end surface of the detection means.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4657976A JPS5931174B2 (en) | 1976-04-26 | 1976-04-26 | Transmission scanning electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4657976A JPS5931174B2 (en) | 1976-04-26 | 1976-04-26 | Transmission scanning electron microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS52130277A true JPS52130277A (en) | 1977-11-01 |
JPS5931174B2 JPS5931174B2 (en) | 1984-07-31 |
Family
ID=12751202
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4657976A Expired JPS5931174B2 (en) | 1976-04-26 | 1976-04-26 | Transmission scanning electron microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5931174B2 (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6025242U (en) * | 1983-07-27 | 1985-02-20 | 横河電機株式会社 | Current/current isolator |
JPS60230346A (en) * | 1984-04-27 | 1985-11-15 | Hitachi Ltd | Scanning-type reflected-electron-diffracting microscope |
JP2008311214A (en) * | 2007-05-11 | 2008-12-25 | Hamamatsu Univ School Of Medicine | Sample holder for electron microscope, and electron microscope |
JP2009193968A (en) * | 2003-01-31 | 2009-08-27 | Hitachi High-Technologies Corp | Charged particle beam device |
US7964845B2 (en) | 2003-01-31 | 2011-06-21 | Hitachi High-Technologies Corporation | Charged particle beam device |
-
1976
- 1976-04-26 JP JP4657976A patent/JPS5931174B2/en not_active Expired
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6025242U (en) * | 1983-07-27 | 1985-02-20 | 横河電機株式会社 | Current/current isolator |
JPH048670Y2 (en) * | 1983-07-27 | 1992-03-04 | ||
JPS60230346A (en) * | 1984-04-27 | 1985-11-15 | Hitachi Ltd | Scanning-type reflected-electron-diffracting microscope |
JP2009193968A (en) * | 2003-01-31 | 2009-08-27 | Hitachi High-Technologies Corp | Charged particle beam device |
US7964845B2 (en) | 2003-01-31 | 2011-06-21 | Hitachi High-Technologies Corporation | Charged particle beam device |
JP2008311214A (en) * | 2007-05-11 | 2008-12-25 | Hamamatsu Univ School Of Medicine | Sample holder for electron microscope, and electron microscope |
Also Published As
Publication number | Publication date |
---|---|
JPS5931174B2 (en) | 1984-07-31 |
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