JPS52110581A - Fault inspection equipment - Google Patents

Fault inspection equipment

Info

Publication number
JPS52110581A
JPS52110581A JP2675176A JP2675176A JPS52110581A JP S52110581 A JPS52110581 A JP S52110581A JP 2675176 A JP2675176 A JP 2675176A JP 2675176 A JP2675176 A JP 2675176A JP S52110581 A JPS52110581 A JP S52110581A
Authority
JP
Japan
Prior art keywords
fault
inspection equipment
area
information
photographed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2675176A
Other languages
Japanese (ja)
Other versions
JPS556381B2 (en
Inventor
Kiyoto Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP2675176A priority Critical patent/JPS52110581A/en
Publication of JPS52110581A publication Critical patent/JPS52110581A/en
Publication of JPS556381B2 publication Critical patent/JPS556381B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

PURPOSE: In the fault inspection equipment - in which in order to obtain the fault image of the area to be photographed, information is taken in that is concerned with the fault faces along many passages caused by transmission, radiation and reflection in many directions and this information is used as raw data for reconstructing the fault image by means of logic processing - particularly detailed information is obtained concerning the area of interest within the object area to be photographed.
COPYRIGHT: (C)1977,JPO&Japio
JP2675176A 1976-03-12 1976-03-12 Fault inspection equipment Granted JPS52110581A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2675176A JPS52110581A (en) 1976-03-12 1976-03-12 Fault inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2675176A JPS52110581A (en) 1976-03-12 1976-03-12 Fault inspection equipment

Publications (2)

Publication Number Publication Date
JPS52110581A true JPS52110581A (en) 1977-09-16
JPS556381B2 JPS556381B2 (en) 1980-02-15

Family

ID=12201983

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2675176A Granted JPS52110581A (en) 1976-03-12 1976-03-12 Fault inspection equipment

Country Status (1)

Country Link
JP (1) JPS52110581A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5397981U (en) * 1977-01-13 1978-08-09
JPS5465492A (en) * 1977-10-14 1979-05-26 Philips Nv Device for inspecting radiant ray
WO2018179905A1 (en) * 2017-03-27 2018-10-04 国立大学法人筑波大学 Interior ct image generation method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5076997A (en) * 1973-08-18 1975-06-24 Emi Ltd

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5076997A (en) * 1973-08-18 1975-06-24 Emi Ltd

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5397981U (en) * 1977-01-13 1978-08-09
JPS5465492A (en) * 1977-10-14 1979-05-26 Philips Nv Device for inspecting radiant ray
WO2018179905A1 (en) * 2017-03-27 2018-10-04 国立大学法人筑波大学 Interior ct image generation method
CN110520052A (en) * 2017-03-27 2019-11-29 国立大学法人筑波大学 Local C T image generating method
JPWO2018179905A1 (en) * 2017-03-27 2020-03-19 国立大学法人 筑波大学 Interior CT Image Generation Method
US11457878B2 (en) 2017-03-27 2022-10-04 University Of Tsukuba Interior CT image generation method

Also Published As

Publication number Publication date
JPS556381B2 (en) 1980-02-15

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