JPH1054849A - Optical voltage/electric field measuring sensor - Google Patents
Optical voltage/electric field measuring sensorInfo
- Publication number
- JPH1054849A JPH1054849A JP8229324A JP22932496A JPH1054849A JP H1054849 A JPH1054849 A JP H1054849A JP 8229324 A JP8229324 A JP 8229324A JP 22932496 A JP22932496 A JP 22932496A JP H1054849 A JPH1054849 A JP H1054849A
- Authority
- JP
- Japan
- Prior art keywords
- light
- voltage
- optical
- electro
- electric field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は光学式電圧・電界測
定センサーに関し、特に光学系の部品点数を削減しポッ
ケルス効果の感度をあげた光学式電圧・電界測定センサ
ーに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical voltage / electric field measuring sensor, and more particularly to an optical voltage / electric field measuring sensor with a reduced number of components in an optical system and increased sensitivity to the Pockels effect.
【0002】[0002]
【従来の技術】近年、電力系統の大規模化、高度化に伴
ってその系統の計測制御システムの重要性が増し、特に
系の電圧・電流機器が従来の電磁センサから、小型軽量
で絶縁性、無誘導性に優れた光応用の電圧・電流センサ
に切り替えられている。電圧・電界を光学的に測定する
方法としては、ZnTe、GaP、LiNbO3等の光
学結晶(以下電気光学素子と云う)を用い、電圧の強さ
(電界強度)に比例して電気光学素子の屈折率が変化す
る所謂1次電気光学効果(ポッケルス効果とも云う)を
利用するものが知られている。2. Description of the Related Art In recent years, as power systems have become larger and more sophisticated, the importance of measurement and control systems in the system has increased. It has been switched to voltage and current sensors for optical applications that have excellent non-inductive properties. As a method for optically measuring a voltage and an electric field, an optical crystal (hereinafter, referred to as an electro-optical element) such as ZnTe, GaP, or LiNbO 3 is used, and the refraction of the electro-optical element is proportional to the intensity of the voltage (electric field intensity). A device utilizing a so-called primary electro-optic effect (also called Pockels effect) in which the rate changes is known.
【0003】上記の原理を用いる光−電気センサーとし
ては、図5に示すように測定光が電気光学素子中を一度
だけ通過する1パス法を用いたセンサーが一搬的であ
り、レーザ光源21より出射した測定光は入射側マルチ
モードファイバ22を介して偏光子23に入射し、該偏
光子23の作用により直線偏光のみが出射される。偏光
子23より出射した測定光はλ/4板24に入射し、該
λ/4板24の作用によって円偏光に変換されて、電気
光学素子25に入射する。該電気光学素子25は図に示
すようにその両端に電極26、26(透明導電膜)が設
けられており、電圧源27より前記電極26、26に電
圧を印加すると測定光の伝搬方向に対し平行に電界が印
加され、所謂ポッケルス効果により印加電圧に比例して
測定光の偏光成分が変化し楕円偏光になる。前記電気光
学素子25より出射した測定光は検光子28に入射し、
前記電気光学素子25において電圧に比例して強度変調
された偏光成分が抽出される。抽出された測定光は出射
側マルチモードファイバ29を通り、受光部30で光−
電気変換された信号を測定することによって、電気光学
素子25(ポッケルス素子)に印加されている電圧また
は電界を測定することができる。As a photo-electric sensor using the above principle, a sensor using a one-pass method in which measurement light passes through an electro-optical element only once as shown in FIG. The emitted measurement light is incident on the polarizer 23 via the incident side multimode fiber 22, and only linearly polarized light is emitted by the action of the polarizer 23. The measurement light emitted from the polarizer 23 enters the λ / 4 plate 24, is converted into circularly polarized light by the action of the λ / 4 plate 24, and enters the electro-optical element 25. The electro-optical element 25 is provided with electrodes 26, 26 (transparent conductive film) at both ends as shown in the figure, and when a voltage is applied to the electrodes 26, 26 from a voltage source 27, the electro-optical element 25 moves in the propagation direction of the measurement light. An electric field is applied in parallel, and the polarization component of the measurement light changes in proportion to the applied voltage due to the so-called Pockels effect, resulting in elliptically polarized light. The measurement light emitted from the electro-optical element 25 enters the analyzer 28,
In the electro-optical element 25, a polarization component whose intensity is modulated in proportion to the voltage is extracted. The extracted measuring light passes through the multimode fiber 29 on the emission side, and the light is
The voltage or electric field applied to the electro-optical element 25 (Pockels element) can be measured by measuring the electrical-converted signal.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、従来の
光−電気センサでは電気光学素子のポッケルス効果が小
さい結晶を用いると、測定感度が低く、且つ部品点数が
多いという欠点があった。本発明は上記欠点を解決する
ためになされたものであり、電気光学素子の同じポッケ
ルス効果に対し光学式電圧・電界センサーの感度を2倍
に上げ、また部品点数を削減することよりコストダウン
を図った光学式電圧・電界測定センサーを提供すること
にある。However, in the conventional optical-electric sensor, when a crystal having a small Pockels effect of the electro-optical element is used, there are disadvantages that the measurement sensitivity is low and the number of parts is large. The present invention has been made in order to solve the above-mentioned drawbacks. The sensitivity of the optical voltage / electric field sensor is doubled for the same Pockels effect of the electro-optical element, and the cost is reduced by reducing the number of parts. An object of the present invention is to provide an optical voltage / electric field measurement sensor.
【0005】[0005]
【課題を解決するための手段】上記目的を達成するため
に本発明に係る請求項1記載の発明は、偏光プリズム
と、λ/8板と、電気光学素子と、ミラーとを光源から
みて光軸上に順に配置し、前記電気光学素子を出射した
光源からの測定光をミラーにて反射せしめ、再び前記電
気光学素子を透過させることにより偏光感度を高めたこ
とを特徴とする。本発明に係る請求項2記載の発明は、
偏光プリズムと、λ/8板と、電気光学素子とを光源か
らみて光軸上に順に配置し、且つ前記電気光学素子にお
いて前記光源から出射した測定光の伝搬方向に垂直な側
面にミラー膜を付着せしめることにより前記前記電気光
学素子に入射した光源からの測定光をミラー膜にて反射
せしめ、前記電気光学素子内を往復せしめることにより
偏光感度を高めたことを特徴とする。According to a first aspect of the present invention, there is provided an image forming apparatus, comprising: a polarizing prism, a λ / 8 plate, an electro-optical element, and a mirror. The polarization sensitivity is increased by sequentially arranging on the axis, reflecting the measurement light from the light source emitted from the electro-optical element by a mirror, and transmitting the measurement light again through the electro-optical element. The invention according to claim 2 of the present invention is
A polarizing prism, a λ / 8 plate, and an electro-optical element are sequentially arranged on the optical axis as viewed from a light source, and a mirror film is provided on a side surface of the electro-optical element that is perpendicular to a propagation direction of measurement light emitted from the light source. The measurement light from the light source incident on the electro-optical element is reflected by a mirror film by being attached, and the polarization sensitivity is increased by reciprocating in the electro-optical element.
【0006】[0006]
【発明の実施の形態】以下本発明を図面に示した実施の
形態に基づいて詳細に説明する。図1は本発明に係る光
学式電圧・電界測定センサーにおける光学部の一実施例
を示す模式図である。測定光1は偏光プリズム2に入射
し該偏光プリズムの作用により直線偏光のみを透過す
る。該偏光プリズム2を出射した直線偏光はλ/8板3
に入射し、該λ/8板3に入射した直線偏光はλ/8板
3の作用により楕円偏光に変換され、電気光学素子4に
入射する。該電気光学素子4を透過した測定光1はミラ
ー5に入射し、該ミラー5で反射されて再び電気光学素
子4に入射する。電気光学素子4に電圧もしくは電界が
印加されていると、その電圧に比例して測定光1の偏波
面が変化を受けるが、本発明に係るセンサー光学部で
は、測定光が電気光学素子4内を往復することで光路長
は2倍となり、偏波面の変化を2倍、すなわち測定感度
を2倍にすることができる。偏波面が変化した測定光は
再びλ/8板3に入射し、惰円の膨らむ方向に偏波面が
変化し、その後、偏光プリズム2に入射する。したがっ
て、偏光プリズム2の作用により電圧あるいは電界で変
化した偏光成分のみが抽出され、その光強度で電気光学
素子4に印加した電圧もしくは電界を測定することがで
きる。なお、図中に示す二重丸及び矢印は測定光の偏光
成分の方向を表している。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail based on an embodiment shown in the drawings. FIG. 1 is a schematic diagram showing one embodiment of an optical unit in an optical voltage / electric field measurement sensor according to the present invention. The measuring light 1 enters the polarizing prism 2 and transmits only linearly polarized light by the action of the polarizing prism. The linearly polarized light emitted from the polarizing prism 2 is a λ / 8 plate 3
And the linearly polarized light incident on the λ / 8 plate 3 is converted into elliptically polarized light by the action of the λ / 8 plate 3 and is incident on the electro-optical element 4. The measurement light 1 transmitted through the electro-optical element 4 enters a mirror 5, is reflected by the mirror 5, and enters the electro-optical element 4 again. When a voltage or an electric field is applied to the electro-optical element 4, the polarization plane of the measurement light 1 changes in proportion to the voltage. However, in the sensor optical unit according to the present invention, the measurement light is , The optical path length is doubled, and the change in the polarization plane can be doubled, that is, the measurement sensitivity can be doubled. The measuring light whose polarization plane has changed again enters the λ / 8 plate 3, changes its polarization plane in the direction in which the coast expands, and thereafter enters the polarizing prism 2. Therefore, only the polarization component changed by the voltage or the electric field by the action of the polarizing prism 2 is extracted, and the voltage or the electric field applied to the electro-optical element 4 can be measured by the light intensity. Note that the double circles and arrows shown in the figure indicate the directions of the polarization components of the measurement light.
【0007】また、光−電気センサーの光学部の他の実
施例として、図2に示すように電気光学素子4の一方の
側面(図の右の側面)を鏡面研磨し蒸着等の手段でミラ
ー膜6を付加すことで、図1のミラー5と同様の機能を
果たし、更に部品点数を削減することもできる。なお、
図中の二重丸及び矢印は上記と同様である。As another embodiment of the optical portion of the optical-electric sensor, as shown in FIG. 2, one side (the right side in the figure) of the electro-optical element 4 is mirror-polished and mirrored by means such as evaporation. By adding the film 6, the same function as the mirror 5 of FIG. 1 can be performed, and the number of components can be further reduced. In addition,
Double circles and arrows in the figure are the same as above.
【0008】図3は図1に示したセンサー光学部を用い
て光−電気センサーを構成した一実施例であり、図1の
センサー光学部の電気光学素子4に電極6、6を付加し
て電圧源7より電圧を印加するようにし、また測定光1
の光源としてのレーザ光源8と、該レーザ光源8からの
光をセンサー光学部に導くための入射側光ファイバ9
と、光強度測定用の受光部11及び測定光を受光部11
に導くための出射側光ファイバ10とを備えている。上
述の如く構成した光−電気センサーに於いて、レーザ光
源8より出射した測定光は、入射側光ファイバ9に入射
し、該入射側ファイバ9を伝搬して偏光プリズム2に入
射する。該偏光プリズム2を透過することにより直線偏
光に変換にされた測定光はλ/8板3に入射し、該λ/
8板3で測定光は楕円偏光に変換される。その後、λ/
8板3を出射した測定光は電気光学素子4に入射し、該
電気光学素子4を伝搬した測定光はミラー5で反射さ
れ、再び電気光学素子4に入射し該電気光学素子4の光
路を伝搬する。この時、電気光学素子4に電圧源7の電
圧を電極6、6に印加してあると、測定光の偏波面は電
極6、6に印加した電圧に比例して前記偏波面が変化す
る。FIG. 3 shows an embodiment in which a photo-electric sensor is constructed using the sensor optical section shown in FIG. 1. Electrodes 6 and 6 are added to the electro-optical element 4 of the sensor optical section shown in FIG. A voltage is applied from the voltage source 7 and the measurement light 1
A laser light source 8 as a light source, and an incident side optical fiber 9 for guiding light from the laser light source 8 to a sensor optical unit.
And a light receiving unit 11 for measuring light intensity and the measuring light
And an outgoing side optical fiber 10 for guiding the light. In the photo-electric sensor configured as described above, the measurement light emitted from the laser light source 8 is incident on the incident side optical fiber 9, propagates through the incident side fiber 9 and is incident on the polarizing prism 2. The measuring light converted to linearly polarized light by passing through the polarizing prism 2 enters the λ / 8 plate 3 and
The measurement light is converted into elliptically polarized light by the eight plates 3. Then, λ /
The measuring light emitted from the eight plates 3 enters the electro-optical element 4, and the measuring light having propagated through the electro-optical element 4 is reflected by the mirror 5, re-enters the electro-optical element 4 and passes through the optical path of the electro-optical element 4. Propagate. At this time, if the voltage of the voltage source 7 is applied to the electrodes 6, 6 to the electro-optical element 4, the polarization plane of the measurement light changes in proportion to the voltage applied to the electrodes 6, 6.
【0009】偏波面が変化した測定光が再びλ/8板3
に入射すると、該λ/8板3の作用により偏波面を惰円
の膨らむ方向に変化させ、測定光は偏光プリズム2に入
射する。偏光プリズム2の作用により、電極6、6に印
加した電圧よって変化した偏光成分のみが抽出され、出
射側光ファイバ10に入射し、このファイバ10を伝搬
した測定光を受光部11で電圧として読みとり、光強度
の変化量で電圧あるいは電界を測定することができる。The measurement light whose polarization plane has changed is again transmitted to the λ / 8 plate 3.
, The polarization plane is changed in the direction in which the coast expands by the action of the λ / 8 plate 3, and the measurement light is incident on the polarizing prism 2. By the action of the polarizing prism 2, only the polarization component changed by the voltage applied to the electrodes 6, 6 is extracted, enters the emission-side optical fiber 10, and the measurement light transmitted through the fiber 10 is read as a voltage by the light receiving unit 11. The voltage or the electric field can be measured based on the amount of change in light intensity.
【0010】図4は光−電気センサー構成の他の実施例
であり、本発明に係る図2に示した部品点数を減らした
センサー光学部を用い、測定光1の光源としてのレーザ
光源8と、入射側光ファイバ9と、出射側光ファイバ1
0と、受光部11とを付加して構成した光学式電圧・電
界測定センサーである。その作用は図3で説明したもの
と同様である。FIG. 4 shows another embodiment of the configuration of the optical-electrical sensor, which uses the sensor optical unit shown in FIG. , The input side optical fiber 9 and the output side optical fiber 1
This is an optical voltage / electric field measurement sensor configured by adding 0 and a light receiving unit 11. The operation is the same as that described with reference to FIG.
【0011】[0011]
【発明の効果】本発明は、以上説明したように構成した
ので、電気光学素子のポッケルス効果が小さい結晶でも
感度が良く測定できると共に、部品点数を削減すること
ができ、光学式電圧・電界センサーを構成する上で小型
化、低コスト化を実現する上で著しい効果を奏す。According to the present invention, as described above, it is possible to measure even a crystal having a small Pockels effect of an electro-optical element with good sensitivity, to reduce the number of parts, and to provide an optical voltage / electric field sensor. Has a remarkable effect in realizing size reduction and cost reduction in the configuration.
【図1】本発明に係る光学式電圧・電界測定センサーの
光学部の構成を示す図である。FIG. 1 is a diagram showing a configuration of an optical unit of an optical voltage / electric field measurement sensor according to the present invention.
【図2】本発明に係る他の光学式電圧・電界測定センサ
ーの光学部の構成を示す図である。FIG. 2 is a diagram showing a configuration of an optical unit of another optical voltage / electric field measurement sensor according to the present invention.
【図3】本発明に係る光学式電圧・電界測定センサーの
一実施例の構成を示す図である。FIG. 3 is a diagram showing a configuration of an embodiment of an optical voltage / electric field measurement sensor according to the present invention.
【図4】本発明に係る光学式電圧・電界測定センサーの
他の実施例の構成を示す図である。FIG. 4 is a diagram showing a configuration of another embodiment of the optical voltage / electric field measurement sensor according to the present invention.
【図5】従来の光学式電圧・電界測定センサーの構成を
示す図である。FIG. 5 is a diagram showing a configuration of a conventional optical voltage / electric field measurement sensor.
1 測定光 2 偏光プリズム 3 λ/8板 4 電気光学素子 5 ミラー 6 ミラー膜 7 電圧源 8 レザー光源 9 入射側ファイバー 10 出射側ファイバー 11 受光部 REFERENCE SIGNS LIST 1 measurement light 2 polarizing prism 3 λ / 8 plate 4 electro-optic element 5 mirror 6 mirror film 7 voltage source 8 laser light source 9 incident fiber 10 emission fiber 11 light receiving unit
Claims (2)
素子と、ミラーとを光源からみて光軸上に順に配置し、
前記電気光学素子を出射した光源からの測定光をミラー
にて反射せしめ、再び前記電気光学素子を透過させるこ
とにより偏光感度を高めたことを特徴とする光学式電圧
・電界測定センサー光学部。1. A polarizing prism, a λ / 8 plate, an electro-optical element, and a mirror are sequentially arranged on an optical axis as viewed from a light source,
An optical voltage / electric field measurement sensor optical section, wherein a measurement light from a light source emitted from the electro-optical element is reflected by a mirror and transmitted through the electro-optical element again to increase polarization sensitivity.
素子とを光源からみて光軸上に順に配置し、且つ前記電
気光学素子において前記光源から出射した測定光の伝搬
方向に垂直な側面にミラー膜を付着せしめることにより
前記前記電気光学素子に入射した光源からの測定光をミ
ラー膜にて反射せしめ、前記電気光学素子内を往復せし
めることにより偏光感度を高めたことを特徴とする光学
式電圧・電界測定センサー光学部。2. A polarizing prism, a λ / 8 plate, and an electro-optical element are sequentially arranged on an optical axis as viewed from a light source, and the electro-optical element is perpendicular to a propagation direction of measurement light emitted from the light source from the light source. By attaching a mirror film to the side surface, measurement light from the light source incident on the electro-optical element is reflected by the mirror film, and the polarization sensitivity is increased by reciprocating in the electro-optical element. Optical voltage and electric field measurement sensor optical unit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8229324A JPH1054849A (en) | 1996-08-12 | 1996-08-12 | Optical voltage/electric field measuring sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8229324A JPH1054849A (en) | 1996-08-12 | 1996-08-12 | Optical voltage/electric field measuring sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH1054849A true JPH1054849A (en) | 1998-02-24 |
Family
ID=16890373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8229324A Pending JPH1054849A (en) | 1996-08-12 | 1996-08-12 | Optical voltage/electric field measuring sensor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH1054849A (en) |
-
1996
- 1996-08-12 JP JP8229324A patent/JPH1054849A/en active Pending
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